FR2526957B1 - Memoire pour systeme de test - Google Patents
Memoire pour systeme de testInfo
- Publication number
- FR2526957B1 FR2526957B1 FR8308129A FR8308129A FR2526957B1 FR 2526957 B1 FR2526957 B1 FR 2526957B1 FR 8308129 A FR8308129 A FR 8308129A FR 8308129 A FR8308129 A FR 8308129A FR 2526957 B1 FR2526957 B1 FR 2526957B1
- Authority
- FR
- France
- Prior art keywords
- memory
- test system
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31928—Formatter
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/378,937 US4502127A (en) | 1982-05-17 | 1982-05-17 | Test system memory architecture for passing parameters and testing dynamic components |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2526957A1 FR2526957A1 (fr) | 1983-11-18 |
FR2526957B1 true FR2526957B1 (fr) | 1986-08-08 |
Family
ID=23495149
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8308129A Expired FR2526957B1 (fr) | 1982-05-17 | 1983-05-17 | Memoire pour systeme de test |
Country Status (5)
Country | Link |
---|---|
US (1) | US4502127A (fr) |
JP (1) | JPS58208859A (fr) |
DE (1) | DE3317593C2 (fr) |
FR (1) | FR2526957B1 (fr) |
GB (1) | GB2121550B (fr) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4617642A (en) * | 1982-05-06 | 1986-10-14 | Data General Corporation | Select switch responsive to a break code |
US4633410A (en) * | 1982-06-28 | 1986-12-30 | Hewlett-Packard Company | Method and apparatus for determining if a digital value lies within a range |
US4644486A (en) * | 1984-01-09 | 1987-02-17 | Hewlett-Packard Company | Vector network analyzer with integral processor |
US4768195A (en) * | 1985-07-03 | 1988-08-30 | Stoner Donald W | Chip tester |
US4799220A (en) * | 1987-02-19 | 1989-01-17 | Grumman Aerospace Corporation | Dynamic system for testing an equipment |
US4879661A (en) * | 1987-10-02 | 1989-11-07 | International Business Machines Corporation | Bi-directional circuit to interface between a low current device and high current tester |
JP2986104B2 (ja) * | 1988-03-15 | 1999-12-06 | 株式会社東芝 | 情報処理装置の自己試験回路 |
US6286120B1 (en) | 1994-09-01 | 2001-09-04 | Teradyne, Inc. | Memory architecture for automatic test equipment using vector module table |
US5673275A (en) * | 1995-09-12 | 1997-09-30 | Schlumberger Technology, Inc. | Accelerated mode tester timing |
US6014764A (en) * | 1997-05-20 | 2000-01-11 | Schlumberger Technologies Inc. | Providing test vectors with pattern chaining definition |
US6671845B1 (en) | 1999-10-19 | 2003-12-30 | Schlumberger Technologies, Inc. | Packet-based device test system |
US6598112B1 (en) * | 2000-09-11 | 2003-07-22 | Agilent Technologies, Inc. | Method and apparatus for executing a program using primary, secondary and tertiary memories |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3927371A (en) * | 1974-02-19 | 1975-12-16 | Ibm | Test system for large scale integrated circuits |
US4070565A (en) * | 1976-08-18 | 1978-01-24 | Zehntel, Inc. | Programmable tester method and apparatus |
US4108358A (en) * | 1977-03-22 | 1978-08-22 | The Bendix Corporation | Portable circuit tester |
JPS5476041A (en) * | 1977-11-30 | 1979-06-18 | Nec Corp | Test pattern generator for logic circuit |
US4167779A (en) * | 1978-03-10 | 1979-09-11 | Digital Equipment Corporation | Diagnostic apparatus in a data processing system |
FR2432175A1 (fr) * | 1978-07-27 | 1980-02-22 | Cii Honeywell Bull | Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede |
JPS55135762A (en) * | 1979-04-11 | 1980-10-22 | Advantest Corp | Ic test unit |
US4313200A (en) * | 1978-08-28 | 1982-01-26 | Takeda Riken Kogyo Kabushikikaisha | Logic test system permitting test pattern changes without dummy cycles |
US4204633A (en) * | 1978-11-20 | 1980-05-27 | International Business Machines Corporation | Logic chip test system with path oriented decision making test pattern generator |
JPS5585264A (en) * | 1978-12-23 | 1980-06-27 | Toshiba Corp | Function test evaluation device for integrated circuit |
JPS5585265A (en) * | 1978-12-23 | 1980-06-27 | Toshiba Corp | Function test evaluation device for integrated circuit |
DE2917126C2 (de) * | 1979-04-27 | 1983-01-27 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Verfahren zum Prüfen einer integrierten Schaltung und Anordnung zur Durchführung des Verfahrens |
GB2070300B (en) * | 1980-02-27 | 1984-01-25 | Racal Automation Ltd | Electrical testing apparatus and methods |
US4335457A (en) * | 1980-08-08 | 1982-06-15 | Fairchild Camera & Instrument Corp. | Method for semiconductor memory testing |
US4404519A (en) * | 1980-12-10 | 1983-09-13 | International Business Machine Company | Testing embedded arrays in large scale integrated circuits |
US4451918A (en) * | 1981-10-09 | 1984-05-29 | Teradyne, Inc. | Test signal reloader |
-
1982
- 1982-05-17 US US06/378,937 patent/US4502127A/en not_active Expired - Lifetime
-
1983
- 1983-05-14 DE DE3317593A patent/DE3317593C2/de not_active Expired - Lifetime
- 1983-05-16 GB GB08313448A patent/GB2121550B/en not_active Expired
- 1983-05-17 JP JP58085145A patent/JPS58208859A/ja active Granted
- 1983-05-17 FR FR8308129A patent/FR2526957B1/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
DE3317593C2 (de) | 1998-05-20 |
GB2121550A (en) | 1983-12-21 |
US4502127A (en) | 1985-02-26 |
JPH0354370B2 (fr) | 1991-08-20 |
JPS58208859A (ja) | 1983-12-05 |
FR2526957A1 (fr) | 1983-11-18 |
DE3317593A1 (de) | 1983-11-17 |
GB8313448D0 (en) | 1983-06-22 |
GB2121550B (en) | 1985-12-18 |
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