FR2448724A1 - Circuit integre obtenu par la mise en oeuvre de la technique mos et muni de transistors a effet de champ - Google Patents
Circuit integre obtenu par la mise en oeuvre de la technique mos et muni de transistors a effet de champInfo
- Publication number
- FR2448724A1 FR2448724A1 FR8002981A FR8002981A FR2448724A1 FR 2448724 A1 FR2448724 A1 FR 2448724A1 FR 8002981 A FR8002981 A FR 8002981A FR 8002981 A FR8002981 A FR 8002981A FR 2448724 A1 FR2448724 A1 FR 2448724A1
- Authority
- FR
- France
- Prior art keywords
- integrated circuit
- implementation
- field
- effect transistors
- circuit obtained
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
DANS LE BUT DE POUVOIR LOCALISER DES ERREURS, IL EST INDISPENSABLE DE CONTROLER LER CIRCUITS INTEGRES AU COURS DE LEUR FABRICATION. JUSQU'A PRESENT, ON APPLIQUE A CET EFFET AUXDITS CIRCUITS DES SIGNAUX DE CONTROLE A TRAVERS UNE BORNE SPECIALE, LA POLARITE DE CEUX-CI ETANT LA MEME QUE CELLE DE LA TENSION D'ALIMENTATION ASSURANT LE FONCTIONNEMENT NORMAL DU CIRCUIT INTEGRE. GRACE A L'INVENTION, LADITE BORNE SPECIALE N'EST PAS NECESSAIRE SI L'ON MET EN JEU UNE TENSION DE CONTROLE DONT LA POLARITE EST OPPOSEE A CELLE DE LADITE TENSION ALIMENTANT NORMALEMENT LE CIRCUIT INTEGRE. APPLICATION: FABRICATION ET CONTROLE DE CIRCUITS INTEGRES.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19792905294 DE2905294A1 (de) | 1979-02-12 | 1979-02-12 | Integrierte schaltungsanordnung in mos-technik mit feldeffekttransistoren |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2448724A1 true FR2448724A1 (fr) | 1980-09-05 |
FR2448724B1 FR2448724B1 (fr) | 1983-04-29 |
Family
ID=6062746
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8002981A Granted FR2448724A1 (fr) | 1979-02-12 | 1980-02-11 | Circuit integre obtenu par la mise en oeuvre de la technique mos et muni de transistors a effet de champ |
Country Status (6)
Country | Link |
---|---|
US (1) | US4336495A (fr) |
JP (1) | JPS55110067A (fr) |
CA (1) | CA1138124A (fr) |
DE (1) | DE2905294A1 (fr) |
FR (1) | FR2448724A1 (fr) |
GB (1) | GB2042741B (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0084260A1 (fr) * | 1981-12-29 | 1983-07-27 | Fujitsu Limited | Circuit intégré à semiconducteur avec circuit de test |
EP0227491A2 (fr) * | 1985-10-16 | 1987-07-01 | Siemens Aktiengesellschaft | Interface de test pour circuit intégré en technologie MOS |
Families Citing this family (44)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2944149C2 (de) * | 1979-11-02 | 1985-02-21 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Integrierte Schaltungsanordnung in MOS-Technik |
JPS5928986B2 (ja) * | 1980-02-13 | 1984-07-17 | 日本電気株式会社 | 半導体集積回路 |
US4409676A (en) * | 1981-02-19 | 1983-10-11 | Fairchild Camera & Instrument Corporation | Method and means for diagnostic testing of CCD memories |
US4450402A (en) * | 1981-04-08 | 1984-05-22 | Xicor, Inc. | Integrated circuit testing apparatus |
US4612499A (en) * | 1983-11-07 | 1986-09-16 | Texas Instruments Incorporated | Test input demultiplexing circuit |
US4638341A (en) * | 1984-09-06 | 1987-01-20 | Honeywell Inc. | Gated transmission line model structure for characterization of field-effect transistors |
US4687989A (en) * | 1984-11-01 | 1987-08-18 | Thomson Components-Mostek Corp. | CMOS powerless rom code mask option select |
JPS61265829A (ja) * | 1985-05-20 | 1986-11-25 | Fujitsu Ltd | 半導体集積回路 |
JPS61287315A (ja) * | 1985-06-13 | 1986-12-17 | Mitsubishi Electric Corp | 半導体集積回路 |
US4733168A (en) * | 1986-03-21 | 1988-03-22 | Harris Corporation | Test enabling circuit for enabling overhead test circuitry in programmable devices |
US4970454A (en) * | 1986-12-09 | 1990-11-13 | Texas Instruments Incorporated | Packaged semiconductor device with test circuits for determining fabrication parameters |
US4918385A (en) * | 1987-05-18 | 1990-04-17 | Hewlett-Packard Company | Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same |
JPH01106670U (fr) * | 1988-01-08 | 1989-07-18 | ||
US5153509A (en) * | 1988-05-17 | 1992-10-06 | Zilog, Inc. | System for testing internal nodes in receive and transmit FIFO's |
US4918377A (en) * | 1988-12-05 | 1990-04-17 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Integrated circuit reliability testing |
KR910006241B1 (ko) * | 1988-12-14 | 1991-08-17 | 삼성전자 주식회사 | 복수 테스트모드 선택회로 |
US5019772A (en) * | 1989-05-23 | 1991-05-28 | International Business Machines Corporation | Test selection techniques |
NL8902964A (nl) * | 1989-12-01 | 1991-07-01 | Philips Nv | Op substraat geintegreerd teststelsel. |
US5636226A (en) * | 1989-12-14 | 1997-06-03 | Texas Instruments Incorporated | Fault sensing circuit and method |
JP2556916B2 (ja) * | 1990-01-12 | 1996-11-27 | 三菱電機株式会社 | 故障診断装置 |
US5030904A (en) * | 1990-02-13 | 1991-07-09 | Hewlett-Packard Company | Diagnostic system for integrated circuits using existing pads |
US5126659A (en) * | 1990-07-13 | 1992-06-30 | Motorola, Inc. | Enablement of a test mode in an electronic module with limited pin-outs |
US5130645A (en) * | 1990-08-13 | 1992-07-14 | Vlsi Technology, Inc. | Integrated circuit built-in self-test structure |
JP3381929B2 (ja) * | 1990-12-27 | 2003-03-04 | 株式会社東芝 | 半導体装置 |
US5146161A (en) * | 1991-04-05 | 1992-09-08 | Vlsi Technology, Inc. | Integrated circuit test system |
KR930009490B1 (ko) * | 1991-07-15 | 1993-10-04 | 금성일렉트론 주식회사 | 순간 테스트 모드 지정회로 |
US5432440A (en) * | 1991-11-25 | 1995-07-11 | At&T Global Information Solutions Company | Detection of tri-state logic signals |
US5315167A (en) * | 1992-04-09 | 1994-05-24 | International Business Machines Corporation | Voltage burn-in scheme for BICMOS circuits |
US5294882A (en) * | 1992-07-28 | 1994-03-15 | Sharp Kabushiki Kaisha | Integrated circuit capable of testing reliability |
US5294883A (en) * | 1992-08-04 | 1994-03-15 | International Business Machines Corporation | Test detector/shutoff and method for BiCMOS integrated circuit |
US5982188A (en) * | 1994-07-29 | 1999-11-09 | Stmicroelectronics, Inc. | Test mode control circuit of an integrated circuit device |
US5517515A (en) * | 1994-08-17 | 1996-05-14 | International Business Machines Corporation | Multichip module with integrated test circuitry disposed within interposer substrate |
US5627478A (en) * | 1995-07-06 | 1997-05-06 | Micron Technology, Inc. | Apparatus for disabling and re-enabling access to IC test functions |
US6005406A (en) * | 1995-12-07 | 1999-12-21 | International Business Machines Corporation | Test device and method facilitating aggressive circuit design |
US5796266A (en) | 1996-03-18 | 1998-08-18 | Micron Technology, Inc. | Circuit and a method for configuring pad connections in an integrated device |
DE19735406A1 (de) * | 1997-08-14 | 1999-02-18 | Siemens Ag | Halbleiterbauelement und Verfahren zum Testen und Betreiben eines Halbleiterbauelementes |
JP2000012639A (ja) * | 1998-06-24 | 2000-01-14 | Toshiba Corp | モニターtegのテスト回路 |
JP2001228219A (ja) * | 2000-02-17 | 2001-08-24 | Mitsubishi Electric Corp | 半導体装置およびその耐圧不良自己検出システム |
DE10248753B4 (de) * | 2002-10-18 | 2005-09-15 | Infineon Technologies Ag | Halbleiterbaustein sowie Verfahren zum Funktionstest und zur Konfiguration eines Halbleiterbausteins |
US7034593B1 (en) * | 2003-11-13 | 2006-04-25 | Cirrus Logic, Inc. | Reset mode indication for an integrated circuit using a non-dedicated pin |
US7138814B2 (en) * | 2003-11-21 | 2006-11-21 | Agere Systems Inc. | Integrated circuit with controllable test access to internal analog signal pads of an area array |
US10966916B2 (en) | 2014-11-10 | 2021-04-06 | The Procter And Gamble Company | Personal care compositions |
EP3405168A1 (fr) | 2016-01-20 | 2018-11-28 | The Procter and Gamble Company | Composition de conditionnement capillaire comprenant un monoalkyl glycéryl éther |
EP3697375B1 (fr) | 2017-10-20 | 2021-12-01 | The Procter & Gamble Company | Nettoyant pour la peau en mousse aérosol |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2534502A1 (de) * | 1975-08-01 | 1977-02-10 | Siemens Ag | Individuell pruefbarer, integrierter baustein |
FR2330014A1 (fr) * | 1973-05-11 | 1977-05-27 | Ibm France | Procede de test de bloc de circuits logiques integres et blocs en faisant application |
US4055802A (en) * | 1976-08-12 | 1977-10-25 | Bell Telephone Laboratories, Incorporated | Electrical identification of multiply configurable circuit array |
GB2010497A (en) * | 1977-12-23 | 1979-06-27 | Burroughs Corp | In-situ test and diagnostic circuitry and method for cml chips |
FR2427611A1 (fr) * | 1978-06-02 | 1979-12-28 | Itt | Circuit a integration a tres grande echelle |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3507036A (en) * | 1968-01-15 | 1970-04-21 | Ibm | Test sites for monolithic circuits |
US3815025A (en) * | 1971-10-18 | 1974-06-04 | Ibm | Large-scale integrated circuit testing structure |
DE2824224A1 (de) * | 1978-06-02 | 1979-12-20 | Standard Elektrik Lorenz Ag | Monolithisch integrierte grosschaltung |
US4253059A (en) * | 1979-05-14 | 1981-02-24 | Fairchild Camera & Instrument Corp. | EPROM Reliability test circuit |
-
1979
- 1979-02-12 DE DE19792905294 patent/DE2905294A1/de active Granted
-
1980
- 1980-02-01 US US06/117,884 patent/US4336495A/en not_active Expired - Lifetime
- 1980-02-07 CA CA000345243A patent/CA1138124A/fr not_active Expired
- 1980-02-08 GB GB8004277A patent/GB2042741B/en not_active Expired
- 1980-02-09 JP JP1430380A patent/JPS55110067A/ja active Granted
- 1980-02-11 FR FR8002981A patent/FR2448724A1/fr active Granted
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2330014A1 (fr) * | 1973-05-11 | 1977-05-27 | Ibm France | Procede de test de bloc de circuits logiques integres et blocs en faisant application |
DE2534502A1 (de) * | 1975-08-01 | 1977-02-10 | Siemens Ag | Individuell pruefbarer, integrierter baustein |
US4055802A (en) * | 1976-08-12 | 1977-10-25 | Bell Telephone Laboratories, Incorporated | Electrical identification of multiply configurable circuit array |
GB2010497A (en) * | 1977-12-23 | 1979-06-27 | Burroughs Corp | In-situ test and diagnostic circuitry and method for cml chips |
FR2427611A1 (fr) * | 1978-06-02 | 1979-12-28 | Itt | Circuit a integration a tres grande echelle |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0084260A1 (fr) * | 1981-12-29 | 1983-07-27 | Fujitsu Limited | Circuit intégré à semiconducteur avec circuit de test |
US4550289A (en) * | 1981-12-29 | 1985-10-29 | Fujitsu Limited | Semiconductor integrated circuit device |
EP0227491A2 (fr) * | 1985-10-16 | 1987-07-01 | Siemens Aktiengesellschaft | Interface de test pour circuit intégré en technologie MOS |
EP0227491A3 (en) * | 1985-10-16 | 1987-07-29 | Bendix Electronics S.A. | Test interface for a mos technique integrated circuit |
FR2594553A1 (fr) * | 1985-10-16 | 1987-08-21 | Bendix Electronics Sa | Interface de test pour circuit integre en technologie mos |
Also Published As
Publication number | Publication date |
---|---|
GB2042741A (en) | 1980-09-24 |
JPS55110067A (en) | 1980-08-25 |
GB2042741B (en) | 1983-04-13 |
JPS6262060B2 (fr) | 1987-12-24 |
FR2448724B1 (fr) | 1983-04-29 |
CA1138124A (fr) | 1982-12-21 |
DE2905294C2 (fr) | 1989-07-27 |
DE2905294A1 (de) | 1980-08-21 |
US4336495A (en) | 1982-06-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |