FR2425065A1 - Dispositif pour mesurer les caracteristiques determinant le brillant de surfaces - Google Patents
Dispositif pour mesurer les caracteristiques determinant le brillant de surfacesInfo
- Publication number
- FR2425065A1 FR2425065A1 FR7911074A FR7911074A FR2425065A1 FR 2425065 A1 FR2425065 A1 FR 2425065A1 FR 7911074 A FR7911074 A FR 7911074A FR 7911074 A FR7911074 A FR 7911074A FR 2425065 A1 FR2425065 A1 FR 2425065A1
- Authority
- FR
- France
- Prior art keywords
- optical system
- reflectance properties
- elements aligned
- optical elements
- aligned close
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
DISPOSITIF POUR MESURER LES CARACTERISTIQUES OPTIQUES DETERMINANT LE BRILLANT DE SURFACES COMPORTANT UN SYSTEME OPTIQUE FIXE ET UN DIAPHRAGME DE MESURE MOBILE. SELON UN MODE DE REALISATION, IL COMPORTE UNE SOURCE LUMINEUSE 1, UN DIAPHRAGME 2 D'ECLAIRAGE ET DE MESURE COMMUN, MOBILE, EN FORME DE FENTE, UN DIVISEUR DE FAISCEAU 3, SITUE DEVANT LE DIAPHRAGME 2 ET DESTINE A DEVIER LE FAISCEAU DE MESURE SUR UN DETECTEUR DE MESURE 7, UN AUTRE DIVISEUR DE FAISCEAU 4, DISPOSE A LA SUITE DE CE DIAPHRAGME POUR UN DETECTEUR DE REFERENCE 8 ET UN OBJECTIF 5 DONT LES PLANS FOCAUX ARRIERE ET AVANT COICIDENT RESPECTIVEMENT AVEC LE DIAPHRAGME 2 ET LA SURFACE DE MESURE 6, L'AXE OPTIQUE DE L'ENSEMBLE ETANT NORMAL A LA SURFACE DE MESURE. APPLICATION: CONTROLE OPTIQUE DU BRILLANT DE REVETEMENTS ORGANIQUES.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT313478A AT356935B (de) | 1978-05-02 | 1978-05-02 | Anordnung zur messung der das glanzvermoegen von oberflaechen bestimmenden eigenschaften |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2425065A1 true FR2425065A1 (fr) | 1979-11-30 |
Family
ID=3545828
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7911074A Withdrawn FR2425065A1 (fr) | 1978-05-02 | 1979-05-02 | Dispositif pour mesurer les caracteristiques determinant le brillant de surfaces |
Country Status (3)
Country | Link |
---|---|
AT (1) | AT356935B (fr) |
DE (1) | DE2905727A1 (fr) |
FR (1) | FR2425065A1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109060730A (zh) * | 2018-09-21 | 2018-12-21 | 深圳市林上科技有限公司 | 一种光泽度仪 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4368982A (en) * | 1980-06-09 | 1983-01-18 | Avery International Corporation | Retroreflectometer |
DE3305284A1 (de) * | 1983-02-16 | 1984-08-23 | Siemens AG, 1000 Berlin und 8000 München | Beruehrungslose glanzmessung von oberflaechen und beschichtungen |
DE4138679C2 (de) * | 1991-11-25 | 1998-07-23 | Helmut Dipl Ing Reiser | Gerät zur Bestimmung visueller Oberflächeneigenschaften |
US5747813A (en) * | 1992-06-16 | 1998-05-05 | Kla-Tencop. Corporation | Broadband microspectro-reflectometer |
FI111757B (fi) | 1999-05-10 | 2003-09-15 | Metso Automation Oy | Menetelmä ja mittausjärjestely mitata paperin pintaa |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2451501A (en) * | 1944-09-21 | 1948-10-19 | Liben William | Specular reflectometer |
US3461856A (en) * | 1965-10-23 | 1969-08-19 | American Optical Corp | Oximeters |
DE1548263C3 (de) * | 1966-11-10 | 1975-05-22 | Ernst Leitz Gmbh, 6330 Wetzlar | Verfahren zur Bestimmung der Größe geometrischer Veränderungen oder Abweichungen einer reflektierenden Oberfläche von einer Solloberfläche mittels optischer Mittel |
GB1214148A (en) * | 1967-12-12 | 1970-12-02 | Mining & Chemical Products Ltd | Device for detecting variations in the surface reflectance of objects |
DE2011597A1 (de) * | 1970-03-11 | 1971-09-30 | Ts B Technizne Przemysllu Masz | Photooptisches System zur beruhrungs losen Messung |
DE2122655A1 (de) * | 1971-05-07 | 1972-11-30 | Max Planck Gesellschaft | Absorptionsoptische Einrichtung zum Bestimmen der Konzentration eines Bestandteils einer Substanzmischung |
AT334657B (de) * | 1975-01-24 | 1976-01-25 | Vianova Kunstharz Ag | Verbesserung zur messung des glanzvermogens von ebenen oberflachen |
US3972619A (en) * | 1975-08-11 | 1976-08-03 | General Atomic Company | Method and apparatus for surface analysis |
-
1978
- 1978-05-02 AT AT313478A patent/AT356935B/de not_active IP Right Cessation
-
1979
- 1979-02-15 DE DE19792905727 patent/DE2905727A1/de not_active Ceased
- 1979-05-02 FR FR7911074A patent/FR2425065A1/fr not_active Withdrawn
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109060730A (zh) * | 2018-09-21 | 2018-12-21 | 深圳市林上科技有限公司 | 一种光泽度仪 |
CN109060730B (zh) * | 2018-09-21 | 2024-04-30 | 深圳市林上科技有限公司 | 一种光泽度仪 |
Also Published As
Publication number | Publication date |
---|---|
ATA313478A (de) | 1979-10-15 |
DE2905727A1 (de) | 1979-11-15 |
AT356935B (de) | 1980-06-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |