FR2385148A1 - Systeme testeur portable pour unites electroniques - Google Patents
Systeme testeur portable pour unites electroniquesInfo
- Publication number
- FR2385148A1 FR2385148A1 FR7806344A FR7806344A FR2385148A1 FR 2385148 A1 FR2385148 A1 FR 2385148A1 FR 7806344 A FR7806344 A FR 7806344A FR 7806344 A FR7806344 A FR 7806344A FR 2385148 A1 FR2385148 A1 FR 2385148A1
- Authority
- FR
- France
- Prior art keywords
- unit
- test
- central processing
- processing unit
- memories
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31914—Portable Testers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Système de test pour unités électroniques permettant la vérification et l'identification de défauts. Système comprenant une mémoire programmable extérieure au système et emmagasinant un programme de test visant une unité particulière à tester, une mémoire de supervision intérieure au système et emmagasinant un programme de test superviseur, une unité de traitement centrale connectée aux mémoires, un moyen connecté à l'unité de traitement centrale et aux mémoires et commandé par l'unité de traitement centrale pour appliquer le programme exécuté à l'unité à tester, et un indicateur connecté aux mémoires, à l'unité de traitement centrale et audit moyen d'application du programme exécuté à l'unité à tester et actionné par tous ces éléments pour indiquer les instructions de mise en oeuvre de test et l'état de test de l'unité examinée Système applicable, notamment, à la vérification de cartes de circuits numériques.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/779,978 US4108358A (en) | 1977-03-22 | 1977-03-22 | Portable circuit tester |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2385148A1 true FR2385148A1 (fr) | 1978-10-20 |
FR2385148B1 FR2385148B1 (fr) | 1982-06-25 |
Family
ID=25118182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7806344A Granted FR2385148A1 (fr) | 1977-03-22 | 1978-03-06 | Systeme testeur portable pour unites electroniques |
Country Status (5)
Country | Link |
---|---|
US (1) | US4108358A (fr) |
JP (1) | JPS53116749A (fr) |
DE (1) | DE2812396A1 (fr) |
FR (1) | FR2385148A1 (fr) |
GB (1) | GB1582927A (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2495350A1 (fr) * | 1980-12-03 | 1982-06-04 | Lazare Rene | Testeur specifique a modules, automatise et portable |
EP0262559A1 (fr) * | 1986-10-01 | 1988-04-06 | Siemens Aktiengesellschaft | Système de test pour circuits numériques |
Families Citing this family (55)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4194113A (en) * | 1978-04-13 | 1980-03-18 | Ncr Corporation | Method and apparatus for isolating faults in a logic circuit |
GB1599069A (en) * | 1978-05-31 | 1981-09-30 | Ferranti Ltd | Testing of circuit arrangements |
US4211917A (en) * | 1978-07-17 | 1980-07-08 | The Boeing Company | Circuit board testing apparatus and method |
GB2029032B (en) * | 1978-08-25 | 1982-12-22 | Racal Automation Ltd | Circuit testing apparatus |
US4212075A (en) * | 1978-10-10 | 1980-07-08 | Usm Corporation | Electrical component testing system for component insertion machine |
JPS5562585A (en) * | 1978-11-01 | 1980-05-12 | Hitachi Ltd | Bubble memory tester |
US4236246A (en) * | 1978-11-03 | 1980-11-25 | Genrad, Inc. | Method of and apparatus for testing electronic circuit assemblies and the like |
JPS55128641A (en) * | 1979-03-23 | 1980-10-04 | Nissan Motor Co Ltd | Controlling system for vehicle |
USRE31582E (en) * | 1979-03-23 | 1984-05-08 | Nissan Motor Company, Limited | Automatic control system for method and apparatus for checking devices of an automotive vehicle in use with a microcomputer |
US4291404A (en) * | 1979-11-20 | 1981-09-22 | Lockheed Corporation | Automatic circuit tester with improved voltage regulator |
US4380070A (en) * | 1979-11-20 | 1983-04-12 | Lockheed Corporation | Automatic circuit identifier |
US4335457A (en) * | 1980-08-08 | 1982-06-15 | Fairchild Camera & Instrument Corp. | Method for semiconductor memory testing |
GB2086103B (en) * | 1980-10-27 | 1985-01-30 | Hal Computers Ltd | Computer peripheral test equipment |
US4403297A (en) * | 1981-01-02 | 1983-09-06 | Loveland Controls Company | Process control system prover |
GB2099618B (en) * | 1981-06-02 | 1985-07-03 | Tektronix Inc | Algorithmic word generator |
US4517661A (en) * | 1981-07-16 | 1985-05-14 | International Business Machines Corporation | Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit |
US4489414A (en) * | 1981-10-28 | 1984-12-18 | Hal Computers Limited | Computer peripheral testing equipment |
US4472679A (en) * | 1981-11-25 | 1984-09-18 | The United States Of America As Represented By The Secretary Of The Air Force | Diagnostic apparatus for radar pulse repetition frequency control circuit card |
US4441183A (en) * | 1982-03-22 | 1984-04-03 | Western Electric Company, Inc. | Apparatus for testing digital and analog circuits |
WO1983003488A1 (fr) * | 1982-03-30 | 1983-10-13 | Lockheed Corp | Identificateur automatique de circuit |
US4502127A (en) * | 1982-05-17 | 1985-02-26 | Fairchild Camera And Instrument Corporation | Test system memory architecture for passing parameters and testing dynamic components |
FR2531230A1 (fr) * | 1982-07-27 | 1984-02-03 | Rank Xerox Sa | Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble |
US4493079A (en) * | 1982-08-18 | 1985-01-08 | Fairchild Camera & Instrument Corp. | Method and system for selectively loading test data into test data storage means of automatic digital test equipment |
US4506305A (en) * | 1982-10-06 | 1985-03-19 | International Business Machines Corporation | Method for detecting a fault in a data recording system read channel |
US4561093A (en) * | 1983-02-22 | 1985-12-24 | Otis Elevator Company | Servicing a software-controlled elevator |
FR2549256B1 (fr) * | 1983-06-22 | 1985-11-29 | Philips Ind Commerciale | Procede et machine automatiques pour tester simultanement des systemes informatiques |
US4606025A (en) * | 1983-09-28 | 1986-08-12 | International Business Machines Corp. | Automatically testing a plurality of memory arrays on selected memory array testers |
US4646298A (en) * | 1984-05-01 | 1987-02-24 | Texas Instruments Incorporated | Self testing data processing system with system test master arbitration |
US4633466A (en) * | 1984-05-01 | 1986-12-30 | Texas Instruments Incorporated | Self testing data processing system with processor independent test program |
US4625313A (en) * | 1984-07-06 | 1986-11-25 | Tektronix, Inc. | Method and apparatus for testing electronic equipment |
US4937827A (en) * | 1985-03-01 | 1990-06-26 | Mentor Graphics Corporation | Circuit verification accessory |
US4700293A (en) * | 1985-05-14 | 1987-10-13 | The United States Of America As Represented By The Secretary Of The Air Force | Maintenance port system incorporating software development package |
DE3531129A1 (de) * | 1985-08-30 | 1987-03-12 | Siemens Ag | Verfahren und anordnung zum betrieb eines rastermikroskopes |
US4775930A (en) * | 1985-11-12 | 1988-10-04 | Westinghouse Electric Corp. | Electronic key check for ensuring proper cradles insertion by respective processing board |
US4694408A (en) * | 1986-01-15 | 1987-09-15 | Zaleski James V | Apparatus for testing auto electronics systems |
US4713815A (en) * | 1986-03-12 | 1987-12-15 | International Business Machines Corp. | Automatic fault location system for electronic devices |
US4771428A (en) * | 1986-04-10 | 1988-09-13 | Cadic Inc. | Circuit testing system |
US4736374A (en) * | 1986-05-14 | 1988-04-05 | Grumman Aerospace Corporation | Automated test apparatus for use with multiple equipment |
US4760329A (en) * | 1987-04-23 | 1988-07-26 | Grumman Aerospace Corporation | Programmable tester with bubble memory |
EP0293260A3 (fr) * | 1987-05-29 | 1990-08-08 | Zehntel, Inc. | Testeur "en circuit" numérique à inhibiteur de circuit d'attaque de canal |
JPH0827221B2 (ja) * | 1987-09-22 | 1996-03-21 | 富士重工業株式会社 | 車輌診断装置 |
DE3832123A1 (de) * | 1987-10-09 | 1989-04-27 | Fuji Heavy Ind Ltd | Diagnosesystem fuer ein kraftfahrzeug |
JPH02502944A (ja) * | 1988-01-15 | 1990-09-13 | マイクロ プロセッサー システムズ,インコーポレーテッド | 交換可能な診断装置 |
US5206582A (en) * | 1988-05-18 | 1993-04-27 | Hewlett-Packard Company | Control system for automated parametric test equipment |
US4958347A (en) * | 1988-11-23 | 1990-09-18 | John Fluke Mfg. Co., Inc. | Apparatus, method and data structure for validation of kernel data bus |
CN1045655A (zh) * | 1988-11-23 | 1990-09-26 | 约翰弗兰克制造公司 | ***自动诊断的内核测试接口和方法 |
US4989207A (en) * | 1988-11-23 | 1991-01-29 | John Fluke Mfg. Co., Inc. | Automatic verification of kernel circuitry based on analysis of memory accesses |
US5068852A (en) * | 1989-11-23 | 1991-11-26 | John Fluke Mfg. Co., Inc. | Hardware enhancements for improved performance of memory emulation method |
US5228045A (en) * | 1990-08-06 | 1993-07-13 | Ncr Corporation | Test driver for connecting a standard test port integrated circuit chip to a controlling computer |
US5321701A (en) * | 1990-12-06 | 1994-06-14 | Teradyne, Inc. | Method and apparatus for a minimal memory in-circuit digital tester |
US5311486A (en) * | 1992-09-11 | 1994-05-10 | Ltx Corporation | Timing generation in an automatic electrical test system |
US5732047A (en) * | 1995-12-12 | 1998-03-24 | Advantest Corporation | Timing comparator circuit for use in device testing apparatus |
US6188340B1 (en) * | 1997-08-10 | 2001-02-13 | Hitachi, Ltd. | Sensor adjusting circuit |
US6714887B1 (en) * | 1998-09-29 | 2004-03-30 | Seagate Technology Llc | Portable disc drive testing apparatus |
US20080088325A1 (en) * | 2006-09-01 | 2008-04-17 | Murray David W | Method and system for performing embedded diagnostic application at subassembly and component level |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1951861A1 (de) * | 1968-10-17 | 1970-08-06 | Gen Electric Information Syste | Verfahren und Anordnung zur automatischen UEberpruefung von Karten mit gedruckten Schaltungen |
US3761695A (en) * | 1972-10-16 | 1973-09-25 | Ibm | Method of level sensitive testing a functional logic system |
US4000460A (en) * | 1974-07-01 | 1976-12-28 | Xerox Corporation | Digital circuit module test system |
US3924109A (en) * | 1974-07-22 | 1975-12-02 | Technology Marketing Inc | Automatic circuit card testing system |
US3931506A (en) * | 1974-12-30 | 1976-01-06 | Zehntel, Inc. | Programmable tester |
-
1977
- 1977-03-22 US US05/779,978 patent/US4108358A/en not_active Expired - Lifetime
-
1978
- 1978-02-24 GB GB7531/78A patent/GB1582927A/en not_active Expired
- 1978-03-06 FR FR7806344A patent/FR2385148A1/fr active Granted
- 1978-03-21 DE DE19782812396 patent/DE2812396A1/de active Granted
- 1978-03-22 JP JP3181878A patent/JPS53116749A/ja active Granted
Non-Patent Citations (2)
Title |
---|
EXRV/74 * |
NV700/77 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2495350A1 (fr) * | 1980-12-03 | 1982-06-04 | Lazare Rene | Testeur specifique a modules, automatise et portable |
EP0053561A2 (fr) * | 1980-12-03 | 1982-06-09 | René Lazare | Testeur spécifique modulaire, automatisé et portable |
EP0053561A3 (fr) * | 1980-12-03 | 1984-07-18 | René Lazare | Testeur spécifique modulaire, automatisé et portable |
EP0262559A1 (fr) * | 1986-10-01 | 1988-04-06 | Siemens Aktiengesellschaft | Système de test pour circuits numériques |
Also Published As
Publication number | Publication date |
---|---|
JPS53116749A (en) | 1978-10-12 |
JPS6126097B2 (fr) | 1986-06-19 |
DE2812396A1 (de) | 1978-09-28 |
FR2385148B1 (fr) | 1982-06-25 |
US4108358A (en) | 1978-08-22 |
GB1582927A (en) | 1981-01-14 |
DE2812396C2 (fr) | 1991-03-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |