FI945364A0 - Method and apparatus for determining the content of an element - Google Patents

Method and apparatus for determining the content of an element

Info

Publication number
FI945364A0
FI945364A0 FI945364A FI945364A FI945364A0 FI 945364 A0 FI945364 A0 FI 945364A0 FI 945364 A FI945364 A FI 945364A FI 945364 A FI945364 A FI 945364A FI 945364 A0 FI945364 A0 FI 945364A0
Authority
FI
Finland
Prior art keywords
radiation
sample mass
pct
determined
content
Prior art date
Application number
FI945364A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI97647C (en
FI945364A (en
FI97647B (en
Inventor
Jukka Raatikainen
Original Assignee
Ima Engineering Ltd Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ima Engineering Ltd Oy filed Critical Ima Engineering Ltd Oy
Publication of FI945364A0 publication Critical patent/FI945364A0/en
Priority to FI945364A priority Critical patent/FI97647C/en
Priority to CA002204848A priority patent/CA2204848C/en
Priority to US08/817,883 priority patent/US5721759A/en
Priority to AT95937904T priority patent/ATE241136T1/en
Priority to AU38730/95A priority patent/AU693950B2/en
Priority to KR1019970703202A priority patent/KR100385375B1/en
Priority to CN95196218A priority patent/CN1098457C/en
Priority to ES95937904T priority patent/ES2200007T3/en
Priority to DE69530858T priority patent/DE69530858T2/en
Priority to PCT/FI1995/000621 priority patent/WO1996015442A1/en
Priority to EP95937904A priority patent/EP0792453B1/en
Publication of FI945364A publication Critical patent/FI945364A/en
Application granted granted Critical
Publication of FI97647B publication Critical patent/FI97647B/en
Publication of FI97647C publication Critical patent/FI97647C/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/12Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Networks Using Active Elements (AREA)
  • Bipolar Transistors (AREA)

Abstract

PCT No. PCT/FI95/00621 Sec. 371 Date May 1, 1997 Sec. 102(e) Date May 1, 1997 PCT Filed Nov. 13, 1995 PCT Pub. No. WO96/15442 PCT Pub. Date May 23, 1996The invention relates to a method and an equipment for determining the content of an element from a flowing sample mass (1) by utilizing x-ray fluorescence, in which method the sample mass (1) is irradiated with x-ray or gamma radiation; the radiation emitted by the sample mass is detected; an energy-dispersive radiation spectrum of the radiation emitted by the sample mass is determined; and the content of the element is determined from the measured radiation spectrum on the basis of the intensity of the radiation spectrum window characteristic of this element. In order that the method and equipment would also be applicable in field conditions, the method farther comprises steps in which air temperature is measured in the air space between the sample mass (1) and a radiation detector or detectors (5); the first correction coefficient dependent on the measured air temperature is determined; and the determined content of the element is corrected by said first correction coefficient in order to compensate the attenuation of the characteristic radiation in the air between the sample mass (1) and the radiation detector or detectors (5).
FI945364A 1994-11-14 1994-11-14 Method and apparatus for determining the content of an element FI97647C (en)

Priority Applications (11)

Application Number Priority Date Filing Date Title
FI945364A FI97647C (en) 1994-11-14 1994-11-14 Method and apparatus for determining the content of an element
CN95196218A CN1098457C (en) 1994-11-14 1995-11-13 Method and equipment for determining content of element
DE69530858T DE69530858T2 (en) 1994-11-14 1995-11-13 METHOD AND DEVICE FOR DETERMINING THE CONTENT OF AN ELEMENT
AT95937904T ATE241136T1 (en) 1994-11-14 1995-11-13 METHOD AND DEVICE FOR DETERMINING THE CONTENT OF AN ELEMENT
AU38730/95A AU693950B2 (en) 1994-11-14 1995-11-13 Method and equipment for determining the content of an element
KR1019970703202A KR100385375B1 (en) 1994-11-14 1995-11-13 Method and equipment for determining the content of an element
CA002204848A CA2204848C (en) 1994-11-14 1995-11-13 Method and equipment for determining the content of an element
ES95937904T ES2200007T3 (en) 1994-11-14 1995-11-13 PROCEDURE AND DEVICE FOR DETERMINING THE CONTENT OF AN ELEMENT.
US08/817,883 US5721759A (en) 1994-11-14 1995-11-13 Method and equipment for determining the content of an element
PCT/FI1995/000621 WO1996015442A1 (en) 1994-11-14 1995-11-13 Method and equipment for determining the content of an element
EP95937904A EP0792453B1 (en) 1994-11-14 1995-11-13 Method and equipment for determining the content of an element

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI945364A FI97647C (en) 1994-11-14 1994-11-14 Method and apparatus for determining the content of an element
FI945364 1994-11-14

Publications (4)

Publication Number Publication Date
FI945364A0 true FI945364A0 (en) 1994-11-14
FI945364A FI945364A (en) 1996-05-15
FI97647B FI97647B (en) 1996-10-15
FI97647C FI97647C (en) 1997-01-27

Family

ID=8541801

Family Applications (1)

Application Number Title Priority Date Filing Date
FI945364A FI97647C (en) 1994-11-14 1994-11-14 Method and apparatus for determining the content of an element

Country Status (11)

Country Link
US (1) US5721759A (en)
EP (1) EP0792453B1 (en)
KR (1) KR100385375B1 (en)
CN (1) CN1098457C (en)
AT (1) ATE241136T1 (en)
AU (1) AU693950B2 (en)
CA (1) CA2204848C (en)
DE (1) DE69530858T2 (en)
ES (1) ES2200007T3 (en)
FI (1) FI97647C (en)
WO (1) WO1996015442A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
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CN110427705A (en) * 2019-08-05 2019-11-08 核工业航测遥感中心 The design method of aeroradiometric survey Main Regulator unit prime model

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DE19710420C2 (en) * 1997-03-13 2001-07-12 Helmut Fischer Gmbh & Co Method and device for measuring the thicknesses of thin layers by means of X-ray fluorescence
DE19810306A1 (en) * 1998-03-10 1999-10-14 Aumund Foerdererbau Process for the continuous determination of the composition of a material flow and device suitable therefor
JP3062685B2 (en) * 1998-07-23 2000-07-12 セイコーインスツルメンツ株式会社 X-ray fluorescence analyzer
FR2785052B1 (en) * 1998-10-27 2000-12-01 Commissariat Energie Atomique DEVICE FOR DETERMINING THE CONCENTRATION OF A SUBSTANCE MIXED WITH A FLUOROPHORE AND METHOD OF IMPLEMENTING THE DEVICE
EP1097373A2 (en) 1998-10-29 2001-05-09 PANalytical B.V. X-ray diffraction apparatus with an x-ray optical reference channel
AUPQ109499A0 (en) * 1999-06-21 1999-07-15 Adelaide Brighton Management Limited Sample presentation for x-ray diffraction
JP2003534528A (en) 1999-11-19 2003-11-18 バッテル・メモリアル・インスティチュート Mechanical fluid analyzer
JP2002031522A (en) * 2000-07-18 2002-01-31 Seiko Instruments Inc Fluorescent x-ray film thickness gauge
US6662091B2 (en) * 2001-06-29 2003-12-09 Battelle Memorial Institute Diagnostics/prognostics using wireless links
US6668039B2 (en) 2002-01-07 2003-12-23 Battelle Memorial Institute Compact X-ray fluorescence spectrometer and method for fluid analysis
DE10230990A1 (en) * 2002-07-10 2004-02-05 Elisabeth Katz Device for performing an online element analysis
US7064337B2 (en) * 2002-11-19 2006-06-20 The Regents Of The University Of California Radiation detection system for portable gamma-ray spectroscopy
US6859517B2 (en) * 2003-04-22 2005-02-22 Battelle Memorial Institute Dual x-ray fluorescence spectrometer and method for fluid analysis
DE102004012704B4 (en) * 2004-03-16 2008-01-03 Katz, Elisabeth Device for online analysis and use of such a device
DE102004019030A1 (en) * 2004-04-17 2005-11-03 Katz, Elisabeth Device for elemental analysis
US8173970B2 (en) * 2005-02-04 2012-05-08 Dan Inbar Detection of nuclear materials
US7820977B2 (en) * 2005-02-04 2010-10-26 Steve Beer Methods and apparatus for improved gamma spectra generation
US7847260B2 (en) 2005-02-04 2010-12-07 Dan Inbar Nuclear threat detection
DE102005020567A1 (en) * 2005-04-30 2006-11-09 Katz, Elisabeth Method and apparatus for the on-line determination of the ash content of a substance promoted on a bait and apparatus for conducting an on-line analysis
JP4247559B2 (en) * 2005-06-07 2009-04-02 株式会社リガク X-ray fluorescence analyzer and program used therefor
US7409037B2 (en) * 2006-05-05 2008-08-05 Oxford Instruments Analytical Oy X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure
EP2096431A1 (en) * 2008-02-27 2009-09-02 Oxford Instruments Analytical Oy Portable X-ray fluorescence analyzer
US8338356B2 (en) 2008-12-25 2012-12-25 Dow Global Technologies Llc Surfactant compositions with wide pH stability
US20120236989A1 (en) * 2011-03-16 2012-09-20 Peter John Hardman Portable XRF analyzer for low atomic number elements
DE102012021709B4 (en) * 2011-11-22 2014-09-11 Technische Universität Dresden Method for the qualitative and quantitative determination of aggregates in paper and paper-like materials with cellulosic material
JP6026936B2 (en) * 2013-03-28 2016-11-16 株式会社日立ハイテクサイエンス Foreign object detection device
US20140301531A1 (en) * 2013-04-08 2014-10-09 James L. Failla, JR. Protective shield for x-ray fluorescence (xrf) system
US20140301530A1 (en) * 2013-04-08 2014-10-09 James L. Failla, JR. Protective shield for x-ray fluorescence (xrf) system
CN103278485A (en) * 2013-05-16 2013-09-04 清华大学 Quick detection method of sulphur component in solid material, and detecting device for same
JP6325338B2 (en) * 2014-05-20 2018-05-16 株式会社堀場製作所 Analysis apparatus and calibration method
JP6412340B2 (en) * 2014-05-20 2018-10-24 株式会社堀場製作所 Analysis apparatus and calibration method
CN105092624B (en) * 2014-05-20 2019-08-27 株式会社堀场制作所 Analytical equipment and bearing calibration
JP6528279B2 (en) * 2015-09-25 2019-06-12 清水建設株式会社 Method and apparatus for analyzing trace elements in concrete
EP3249394B1 (en) * 2016-05-26 2018-09-12 Malvern Panalytical B.V. X-ray analysis of drilling fluid
JP6423048B1 (en) * 2017-06-16 2018-11-14 マルバーン パナリティカル ビー ヴィ X-ray analysis of drilling fluid
CN111093502B (en) * 2017-07-26 2023-09-22 深圳帧观德芯科技有限公司 Integrated X-ray source
CN110082816B (en) * 2018-01-25 2022-12-09 中国辐射防护研究院 POE-based temperature compensation device and method for underwater gamma spectrometer
KR102039137B1 (en) * 2018-03-13 2019-11-26 한국원자력연구원 Method of evaluating self-treatment of construction waste of neutron generating facility and method of certifying construction material of neutron generating facility
WO2019218051A1 (en) * 2018-05-18 2019-11-21 Enersoft Inc. Systems, devices, and methods for analysis of geological samples
CN108680592B (en) * 2018-06-11 2019-09-27 南京航空航天大学 A kind of sylvite ingredient online test method
CN109580326A (en) * 2018-12-05 2019-04-05 西王金属科技有限公司 The measuring method of zinc oxide and alkali metal in a kind of dedusting ash
CN109632854B (en) * 2019-01-14 2022-10-11 东华理工大学 Massive uranium ore multi-element online X fluorescence analyzer with double detection structures
CN113640859A (en) * 2021-07-22 2021-11-12 中国原子能科学研究院 Multi-parameter measuring system for testing environmental adaptability of radiation dosimeter
GB2617858A (en) * 2022-04-22 2023-10-25 Anglo American Technical & Sustainability Services Ltd System and method for treating mined material

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GB1494549A (en) * 1975-03-14 1977-12-07 Coal Ind Determining the concentration of sulphur in coal
FI51872C (en) * 1975-08-12 1977-04-12 Outokumpu Oy Apparatus for analyzing a moving solid or powder on an X-ray fluorescence principle.
SU823993A1 (en) * 1979-07-02 1981-04-23 Предприятие П/Я А-7629 X-ray fluorescent pickup
JPS58204357A (en) * 1982-05-24 1983-11-29 Idemitsu Kosan Co Ltd Method and apparatus of fluorescence x-ray analysis
JPS6061649A (en) * 1983-09-16 1985-04-09 Rigaku Denki Kogyo Kk Correction of x-ray fluorescence analysis

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110427705A (en) * 2019-08-05 2019-11-08 核工业航测遥感中心 The design method of aeroradiometric survey Main Regulator unit prime model
CN110427705B (en) * 2019-08-05 2023-04-07 核工业航测遥感中心 Design method of unit element model of main standard device for aviation radioactivity measurement

Also Published As

Publication number Publication date
FI97647C (en) 1997-01-27
KR100385375B1 (en) 2003-08-19
ES2200007T3 (en) 2004-03-01
FI945364A (en) 1996-05-15
CN1163663A (en) 1997-10-29
WO1996015442A1 (en) 1996-05-23
CA2204848A1 (en) 1996-05-23
EP0792453B1 (en) 2003-05-21
DE69530858D1 (en) 2003-06-26
ATE241136T1 (en) 2003-06-15
US5721759A (en) 1998-02-24
AU3873095A (en) 1996-06-06
FI97647B (en) 1996-10-15
AU693950B2 (en) 1998-07-09
DE69530858T2 (en) 2004-03-11
EP0792453A1 (en) 1997-09-03
CA2204848C (en) 2008-01-29
KR970707435A (en) 1997-12-01
CN1098457C (en) 2003-01-08

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