FI854700A0 - Reflektometriskt maetningsfoerfarande och maetningsanordning foer genomfoerande av foerfarandet. - Google Patents

Reflektometriskt maetningsfoerfarande och maetningsanordning foer genomfoerande av foerfarandet.

Info

Publication number
FI854700A0
FI854700A0 FI854700A FI854700A FI854700A0 FI 854700 A0 FI854700 A0 FI 854700A0 FI 854700 A FI854700 A FI 854700A FI 854700 A FI854700 A FI 854700A FI 854700 A0 FI854700 A0 FI 854700A0
Authority
FI
Finland
Prior art keywords
measuring
channel
reflektometriskt
maetningsfoerfarande
maetningsanordning
Prior art date
Application number
FI854700A
Other languages
English (en)
Other versions
FI854700A (fi
FI78563C (fi
FI78563B (fi
Inventor
Aimo Heinonen
Original Assignee
Aimo Heinonen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aimo Heinonen filed Critical Aimo Heinonen
Publication of FI854700A0 publication Critical patent/FI854700A0/fi
Priority to FI854700A priority Critical patent/FI78563C/fi
Priority to DE8686850409T priority patent/DE3677176D1/de
Priority to AT86850409T priority patent/ATE60442T1/de
Priority to EP86850409A priority patent/EP0229602B1/en
Priority to CA000523862A priority patent/CA1299386C/en
Priority to JP61283020A priority patent/JPH0643958B2/ja
Publication of FI854700A publication Critical patent/FI854700A/fi
Application granted granted Critical
Publication of FI78563B publication Critical patent/FI78563B/fi
Publication of FI78563C publication Critical patent/FI78563C/fi
Priority to US07/793,261 priority patent/US5182618A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/22—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
    • G01J1/24—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4752—Geometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Fats And Perfumes (AREA)
  • Medicines Containing Plant Substances (AREA)
  • Saccharide Compounds (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spinning Or Twisting Of Yarns (AREA)
FI854700A 1985-11-27 1985-11-27 Reflektometriskt maetningsfoerfarande och maetningsanordning foer genomfoerande av foerfarandet. FI78563C (fi)

Priority Applications (7)

Application Number Priority Date Filing Date Title
FI854700A FI78563C (fi) 1985-11-27 1985-11-27 Reflektometriskt maetningsfoerfarande och maetningsanordning foer genomfoerande av foerfarandet.
DE8686850409T DE3677176D1 (de) 1985-11-27 1986-11-26 Reflektometrische methode der messung und vorrichtung zur durchfuehrung dieser methode.
AT86850409T ATE60442T1 (de) 1985-11-27 1986-11-26 Reflektometrische methode der messung und vorrichtung zur durchfuehrung dieser methode.
EP86850409A EP0229602B1 (en) 1985-11-27 1986-11-26 Reflectometric method of measurement and apparatus for realizing the method
CA000523862A CA1299386C (en) 1985-11-27 1986-11-26 Reflectometric method of measurement and apparatus for realizing the method
JP61283020A JPH0643958B2 (ja) 1985-11-27 1986-11-27 反射率測定方法及び装置
US07/793,261 US5182618A (en) 1985-11-27 1991-11-13 Reflectometric method of measurement and apparatus for realizing the method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI854700 1985-11-27
FI854700A FI78563C (fi) 1985-11-27 1985-11-27 Reflektometriskt maetningsfoerfarande och maetningsanordning foer genomfoerande av foerfarandet.

Publications (4)

Publication Number Publication Date
FI854700A0 true FI854700A0 (fi) 1985-11-27
FI854700A FI854700A (fi) 1987-05-28
FI78563B FI78563B (fi) 1989-04-28
FI78563C FI78563C (fi) 1989-08-10

Family

ID=8521753

Family Applications (1)

Application Number Title Priority Date Filing Date
FI854700A FI78563C (fi) 1985-11-27 1985-11-27 Reflektometriskt maetningsfoerfarande och maetningsanordning foer genomfoerande av foerfarandet.

Country Status (6)

Country Link
EP (1) EP0229602B1 (fi)
JP (1) JPH0643958B2 (fi)
AT (1) ATE60442T1 (fi)
CA (1) CA1299386C (fi)
DE (1) DE3677176D1 (fi)
FI (1) FI78563C (fi)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5825945A (en) * 1992-05-15 1998-10-20 Unisys Corp Document imaging with illumination from lambertian surfaces
FI98761C (fi) * 1994-01-28 1997-08-11 Conrex Automation Oy Mittauslaite reflektometrisiä mittauksia varten
US7663757B2 (en) * 2006-09-27 2010-02-16 Alberta Research Council Inc. Apparatus and method for obtaining a reflectance property indication of a sample

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT351295B (de) * 1977-12-09 1979-07-10 Vianova Kunstharz Ag Anordnung zur messung des glanzvermoegens von oberflaechen, insbesondere organischer ueberzuege
JPS591977B2 (ja) * 1978-01-25 1984-01-14 株式会社京都第一科学 呈色試験紙を用いた分析方法
HU190892B (en) * 1983-04-13 1986-12-28 Mta Mueszaki Fizikai Kutato Intezete,Hu Aparatus for measuring reflection of the planar surfaces, in particular fluckering meter

Also Published As

Publication number Publication date
EP0229602A1 (en) 1987-07-22
FI854700A (fi) 1987-05-28
EP0229602B1 (en) 1991-01-23
CA1299386C (en) 1992-04-28
JPS62188940A (ja) 1987-08-18
FI78563C (fi) 1989-08-10
DE3677176D1 (de) 1991-02-28
JPH0643958B2 (ja) 1994-06-08
ATE60442T1 (de) 1991-02-15
FI78563B (fi) 1989-04-28

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Legal Events

Date Code Title Description
MM Patent lapsed

Owner name: HEINONEN, AIMO