ATE60442T1 - Reflektometrische methode der messung und vorrichtung zur durchfuehrung dieser methode. - Google Patents
Reflektometrische methode der messung und vorrichtung zur durchfuehrung dieser methode.Info
- Publication number
- ATE60442T1 ATE60442T1 AT86850409T AT86850409T ATE60442T1 AT E60442 T1 ATE60442 T1 AT E60442T1 AT 86850409 T AT86850409 T AT 86850409T AT 86850409 T AT86850409 T AT 86850409T AT E60442 T1 ATE60442 T1 AT E60442T1
- Authority
- AT
- Austria
- Prior art keywords
- measuring
- measurement
- channel
- aid
- sample
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title abstract 5
- 238000000034 method Methods 0.000 title abstract 3
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/22—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
- G01J1/24—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
- G01N2021/4752—Geometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/065—Integrating spheres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/127—Calibration; base line adjustment; drift compensation
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Fats And Perfumes (AREA)
- Medicines Containing Plant Substances (AREA)
- Saccharide Compounds (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Spinning Or Twisting Of Yarns (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI854700A FI78563C (fi) | 1985-11-27 | 1985-11-27 | Reflektometriskt maetningsfoerfarande och maetningsanordning foer genomfoerande av foerfarandet. |
EP86850409A EP0229602B1 (de) | 1985-11-27 | 1986-11-26 | Reflektometrische Methode der Messung und Vorrichtung zur Durchführung dieser Methode |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE60442T1 true ATE60442T1 (de) | 1991-02-15 |
Family
ID=8521753
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT86850409T ATE60442T1 (de) | 1985-11-27 | 1986-11-26 | Reflektometrische methode der messung und vorrichtung zur durchfuehrung dieser methode. |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP0229602B1 (de) |
JP (1) | JPH0643958B2 (de) |
AT (1) | ATE60442T1 (de) |
CA (1) | CA1299386C (de) |
DE (1) | DE3677176D1 (de) |
FI (1) | FI78563C (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5825945A (en) * | 1992-05-15 | 1998-10-20 | Unisys Corp | Document imaging with illumination from lambertian surfaces |
FI98761C (fi) * | 1994-01-28 | 1997-08-11 | Conrex Automation Oy | Mittauslaite reflektometrisiä mittauksia varten |
US7663757B2 (en) * | 2006-09-27 | 2010-02-16 | Alberta Research Council Inc. | Apparatus and method for obtaining a reflectance property indication of a sample |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AT351295B (de) * | 1977-12-09 | 1979-07-10 | Vianova Kunstharz Ag | Anordnung zur messung des glanzvermoegens von oberflaechen, insbesondere organischer ueberzuege |
JPS591977B2 (ja) * | 1978-01-25 | 1984-01-14 | 株式会社京都第一科学 | 呈色試験紙を用いた分析方法 |
HU190892B (en) * | 1983-04-13 | 1986-12-28 | Mta Mueszaki Fizikai Kutato Intezete,Hu | Aparatus for measuring reflection of the planar surfaces, in particular fluckering meter |
-
1985
- 1985-11-27 FI FI854700A patent/FI78563C/fi not_active IP Right Cessation
-
1986
- 1986-11-26 DE DE8686850409T patent/DE3677176D1/de not_active Expired - Lifetime
- 1986-11-26 CA CA000523862A patent/CA1299386C/en not_active Expired - Lifetime
- 1986-11-26 AT AT86850409T patent/ATE60442T1/de not_active IP Right Cessation
- 1986-11-26 EP EP86850409A patent/EP0229602B1/de not_active Expired - Lifetime
- 1986-11-27 JP JP61283020A patent/JPH0643958B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0229602A1 (de) | 1987-07-22 |
FI854700A0 (fi) | 1985-11-27 |
FI854700A (fi) | 1987-05-28 |
EP0229602B1 (de) | 1991-01-23 |
CA1299386C (en) | 1992-04-28 |
JPS62188940A (ja) | 1987-08-18 |
FI78563C (fi) | 1989-08-10 |
DE3677176D1 (de) | 1991-02-28 |
JPH0643958B2 (ja) | 1994-06-08 |
FI78563B (fi) | 1989-04-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
UEP | Publication of translation of european patent specification | ||
REN | Ceased due to non-payment of the annual fee |