FI20125014A - Järjestely ja vastaava menetelmä optisia mittauksia varten - Google Patents
Järjestely ja vastaava menetelmä optisia mittauksia varten Download PDFInfo
- Publication number
- FI20125014A FI20125014A FI20125014A FI20125014A FI20125014A FI 20125014 A FI20125014 A FI 20125014A FI 20125014 A FI20125014 A FI 20125014A FI 20125014 A FI20125014 A FI 20125014A FI 20125014 A FI20125014 A FI 20125014A
- Authority
- FI
- Finland
- Prior art keywords
- organization
- similar method
- optical measurements
- measurements
- optical
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
- G01C11/04—Interpretation of pictures
- G01C11/06—Interpretation of pictures by comparison of two or more pictures of the same area
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20125014A FI125320B (fi) | 2012-01-05 | 2012-01-05 | Järjestely ja vastaava menetelmä optisia mittauksia varten |
EP12813838.5A EP2800946B1 (en) | 2012-01-05 | 2012-12-20 | Arrangement for optical measurements and related method |
ES12813838T ES2875052T3 (es) | 2012-01-05 | 2012-12-20 | Disposición para mediciones ópticas y método relacionado |
PCT/EP2012/076345 WO2013102572A1 (en) | 2012-01-05 | 2012-12-20 | Arrangement for optical measurements and related method |
US14/370,547 US9423245B2 (en) | 2012-01-05 | 2012-12-20 | Arrangement for optical measurements and related method |
PL12813838T PL2800946T3 (pl) | 2012-01-05 | 2012-12-20 | Układ do pomiarów optycznych i powiązany sposób |
JP2014550675A JP6291418B2 (ja) | 2012-01-05 | 2012-12-20 | 光学測定用配置および関連方法 |
CN201280066177.0A CN104040287B (zh) | 2012-01-05 | 2012-12-20 | 用于光学测量的设备及相关方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20125014 | 2012-01-05 | ||
FI20125014A FI125320B (fi) | 2012-01-05 | 2012-01-05 | Järjestely ja vastaava menetelmä optisia mittauksia varten |
Publications (2)
Publication Number | Publication Date |
---|---|
FI20125014A true FI20125014A (fi) | 2013-07-06 |
FI125320B FI125320B (fi) | 2015-08-31 |
Family
ID=47557081
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20125014A FI125320B (fi) | 2012-01-05 | 2012-01-05 | Järjestely ja vastaava menetelmä optisia mittauksia varten |
Country Status (8)
Country | Link |
---|---|
US (1) | US9423245B2 (fi) |
EP (1) | EP2800946B1 (fi) |
JP (1) | JP6291418B2 (fi) |
CN (1) | CN104040287B (fi) |
ES (1) | ES2875052T3 (fi) |
FI (1) | FI125320B (fi) |
PL (1) | PL2800946T3 (fi) |
WO (1) | WO2013102572A1 (fi) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113383207A (zh) * | 2018-10-04 | 2021-09-10 | 杜·普雷兹·伊萨克 | 光学表面编码器 |
Families Citing this family (48)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3060902B1 (en) * | 2013-10-24 | 2021-12-08 | Signify Holding B.V. | Defect inspection system and method |
EP3140639A4 (en) * | 2014-05-05 | 2018-01-31 | Arconic Inc. | Apparatus and methods for weld measurement |
CN104236480B (zh) * | 2014-09-22 | 2017-06-27 | 电子科技大学 | 一种线结构光机器视觉六角钢坯轮廓测量装置及方法 |
US9885563B2 (en) * | 2014-10-10 | 2018-02-06 | Georgia Tech Research Corporation | Dynamic digital fringe projection techniques for measuring warpage |
US9885561B2 (en) * | 2014-12-15 | 2018-02-06 | Test Research, Inc. | Optical inspection system |
FI126498B (fi) * | 2014-12-29 | 2017-01-13 | Helmee Imaging Oy | Optinen mittausjärjestelmä |
EP3070641B1 (en) * | 2015-03-11 | 2021-11-24 | Ricoh Company, Ltd. | Vehicle body with imaging system and object detection method |
CN106296798A (zh) * | 2015-06-10 | 2017-01-04 | 西安蒜泥电子科技有限责任公司 | 基于特征点补充的低成本高清晰度人体三维扫描成像*** |
CN106296643A (zh) * | 2015-06-10 | 2017-01-04 | 西安蒜泥电子科技有限责任公司 | 用于多视图几何三维重建的特征点补充*** |
DE112015006636T5 (de) * | 2015-06-19 | 2018-03-01 | Yamaha Hatsudoki Kabushiki Kaisha | Bauteilmontagevorrichtung und Verfahren zur Bauteilmontage |
US9470641B1 (en) * | 2015-06-26 | 2016-10-18 | Glasstech, Inc. | System and method for measuring reflected optical distortion in contoured glass sheets |
JP6411663B2 (ja) | 2015-08-17 | 2018-10-24 | ヤマハ発動機株式会社 | 部品実装装置 |
KR102319841B1 (ko) | 2015-09-16 | 2021-10-29 | 하우매트 에어로스페이스 인코포레이티드 | 리벳 공급 장치 |
TWI583932B (zh) * | 2015-12-09 | 2017-05-21 | 財團法人國家實驗研究院 | 量測鏡頭光學品質的裝置 |
JP2017120232A (ja) * | 2015-12-28 | 2017-07-06 | キヤノン株式会社 | 検査装置 |
US10593034B2 (en) | 2016-03-25 | 2020-03-17 | Arconic Inc. | Resistance welding fasteners, apparatus and methods for joining dissimilar materials and assessing joints made thereby |
FR3049709B1 (fr) * | 2016-04-05 | 2019-08-30 | Areva Np | Procede de detection d'un defaut sur une surface par eclairage multidirectionnel et dispositif associe |
CN107869957B (zh) * | 2016-09-27 | 2020-09-25 | 宝山钢铁股份有限公司 | 一种基于成像***的圆柱截面尺寸测量装置和方法 |
JP6499139B2 (ja) * | 2016-10-14 | 2019-04-10 | 矢崎総業株式会社 | 検査装置 |
JP6912824B2 (ja) * | 2016-11-09 | 2021-08-04 | 株式会社ブイ・テクノロジー | 光学検査装置 |
DE102017207071A1 (de) * | 2017-04-27 | 2018-10-31 | Robert Bosch Gmbh | Prüfvorrichtung zur optischen Prüfung eines Objekts und Objektprüfungsanordnung |
GB201721451D0 (en) * | 2017-12-20 | 2018-01-31 | Univ Manchester | Apparatus and method for determining spectral information |
US11481568B1 (en) | 2017-12-29 | 2022-10-25 | Cognex Corporation | Dome illuminator for vision system camera and method for using the same |
US10527557B2 (en) * | 2017-12-29 | 2020-01-07 | Radiant Vision Systems, LLC | Adaptive diffuse illumination systems and methods |
US10628646B1 (en) * | 2017-12-29 | 2020-04-21 | Cognex Corporation | Off-axis dual-sensor vision system camera and method for using the same |
WO2019147829A2 (en) * | 2018-01-24 | 2019-08-01 | Cyberoptics Corporation | Structured light projection for specular surfaces |
DE102019105358B4 (de) * | 2018-03-04 | 2020-03-26 | Vision Tools Hard- Und Software Entwicklungs Gmbh | Erstellung eines Abstandsbildes |
EP3767227B1 (en) | 2018-03-16 | 2022-05-04 | NEC Corporation | Three-dimensional shape measuring device, three-dimensional shape measuring method, program, and recording medium |
CN108445615A (zh) * | 2018-03-29 | 2018-08-24 | 中国工程物理研究院激光聚变研究中心 | 一种光学元件面散射缺陷探测装置 |
DE102018213740A1 (de) | 2018-08-15 | 2020-02-20 | Robert Bosch Gmbh | Messvorrichtung und Verfahren zur Bestimmung einer Oberfläche |
WO2020036603A1 (en) * | 2018-08-17 | 2020-02-20 | Hewlett-Packard Development Company, L.P. | Exposure control of captured images |
CN109443199B (zh) * | 2018-10-18 | 2019-10-22 | 天目爱视(北京)科技有限公司 | 基于智能光源的3d信息测量*** |
CN109883443B (zh) * | 2019-02-19 | 2021-06-18 | 北京工业大学 | 一种线结构光传感器空间姿态标定方法 |
CN110017792A (zh) * | 2019-04-10 | 2019-07-16 | 中山大学 | 一种新型光学曲面二维测量方法及其测量*** |
CN111006615A (zh) * | 2019-10-30 | 2020-04-14 | 浙江大学 | 一种平坦表面特征扫描成像装置和方法 |
CN110702699B (zh) * | 2019-11-15 | 2024-03-08 | 湖南讯目科技有限公司 | 一种压延玻璃缺陷检测装置和方法 |
JP7411928B2 (ja) | 2019-12-26 | 2024-01-12 | 株式会社Rutilea | 物品撮影装置 |
JP2021117114A (ja) * | 2020-01-27 | 2021-08-10 | 株式会社Screenホールディングス | 撮像装置、検査装置および検査方法 |
EP3910314B1 (de) | 2020-05-14 | 2022-07-20 | KRÜSS GmbH, Wissenschaftliche Laborgeräte | Verfahren und vorrichtung zur analyse der wechselwirkung zwischen einer oberfläche einer probe und einer flüssigkeit |
CN112908126B (zh) * | 2021-01-21 | 2022-07-08 | 潍坊学院 | 一种具有对焦状态数字化显示的透镜成像实验装置 |
CN112923877B (zh) * | 2021-01-27 | 2023-08-11 | 荆门宏图特种飞行器制造有限公司 | 球壳板曲率偏差检测装置及方法 |
CN113218961B (zh) * | 2021-04-21 | 2023-08-11 | 中国科学院光电技术研究所 | 一种基片缺陷检测装置与方法 |
CN114354607B (zh) * | 2021-10-09 | 2023-10-31 | 七海测量技术(深圳)有限公司 | 一种基于螺旋相衬滤波算法的光度立体瑕疵检测方法 |
CN114113136A (zh) * | 2021-11-09 | 2022-03-01 | 慧三维智能科技(苏州)有限公司 | 一种用于检测高亮面表面缺陷的装置 |
EP4184145B1 (de) | 2021-11-17 | 2023-08-30 | KRÜSS GmbH, Wissenschaftliche Laborgeräte | Vorrichtung zur erfassung einer geometrie eines auf einer probenoberfläche angeordneten tropfens |
FI130408B (fi) | 2022-01-18 | 2023-08-17 | Helmee Imaging Oy | Järjestely ja vastaava menetelmä optisia mittauksia varten |
WO2023191791A1 (en) * | 2022-03-31 | 2023-10-05 | Hewlett-Packard Development Company, L.P. | Three-dimensional topographical surface capture device |
TWI797039B (zh) * | 2022-07-21 | 2023-03-21 | 中國鋼鐵股份有限公司 | 測量系統 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4427880A (en) | 1981-06-29 | 1984-01-24 | Westinghouse Electric Corp. | Non-contact visual proximity sensing apparatus |
US5060065A (en) * | 1990-02-23 | 1991-10-22 | Cimflex Teknowledge Corporation | Apparatus and method for illuminating a printed circuit board for inspection |
US5245421A (en) | 1990-09-19 | 1993-09-14 | Control Automation, Incorporated | Apparatus for inspecting printed circuit boards with surface mounted components |
US5365084A (en) * | 1991-02-20 | 1994-11-15 | Pressco Technology, Inc. | Video inspection system employing multiple spectrum LED illumination |
JPH05231837A (ja) * | 1991-12-25 | 1993-09-07 | Toshiba Corp | 形状測定方法及び装置 |
US5461417A (en) * | 1993-02-16 | 1995-10-24 | Northeast Robotics, Inc. | Continuous diffuse illumination method and apparatus |
DE4413832C2 (de) * | 1994-04-20 | 2000-05-31 | Siemens Ag | Vorrichtungen zur Kontrolle von Halbleiterscheiben |
US6222630B1 (en) | 1998-08-26 | 2001-04-24 | Teradyne, Inc. | Measuring and compensating for warp in the inspection of printed circuit board assemblies |
US6788411B1 (en) * | 1999-07-08 | 2004-09-07 | Ppt Vision, Inc. | Method and apparatus for adjusting illumination angle |
FR2806478B1 (fr) | 2000-03-14 | 2002-05-10 | Optomachines | Dispositif et procede de controle optique de pieces de vaisselle comme des assiettes emaillees ou tout produit ceramique emaille |
US7075565B1 (en) * | 2000-06-14 | 2006-07-11 | Landrex Technologies Co., Ltd. | Optical inspection system |
US6618123B2 (en) * | 2000-10-20 | 2003-09-09 | Matsushita Electric Industrial Co., Ltd. | Range-finder, three-dimensional measuring method and light source apparatus |
US7113313B2 (en) * | 2001-06-04 | 2006-09-26 | Agilent Technologies, Inc. | Dome-shaped apparatus for inspecting a component or a printed circuit board device |
US6730926B2 (en) * | 2001-09-05 | 2004-05-04 | Servo-Robot Inc. | Sensing head and apparatus for determining the position and orientation of a target object |
US7256895B2 (en) * | 2003-02-26 | 2007-08-14 | Castonguay Raymond J | Spherical scattering-light device for simultaneous phase and intensity measurements |
ATE465402T1 (de) * | 2003-02-28 | 2010-05-15 | Koninkl Philips Electronics Nv | Streumesser und verfahren zur beobachtung einer oberfläche |
US7145125B2 (en) * | 2003-06-23 | 2006-12-05 | Advanced Optical Technologies, Llc | Integrating chamber cone light using LED sources |
DE102004056698B3 (de) * | 2004-11-24 | 2006-08-17 | Stratus Vision Gmbh | Inspektionsvorrichtung für ein Substrat, das mindestens eine aufgedruckte Schicht aufweist |
US7808644B2 (en) | 2005-03-24 | 2010-10-05 | Obe Ohnmacht & Baumgartner Gmbh & Co. Kg | Device for optically measuring the shapes of objects and surfaces |
US8032017B2 (en) * | 2006-09-29 | 2011-10-04 | Microscan Systems, Inc. | Methods for providing diffuse light |
WO2010090604A1 (en) | 2009-02-06 | 2010-08-12 | Agency For Science, Technology And Research | A light detection arrangement and a method for detecting light in a light detection arrangement |
US20100259746A1 (en) * | 2009-04-10 | 2010-10-14 | Omron Corporation | Profilometer |
US8717578B2 (en) * | 2009-04-10 | 2014-05-06 | Omron Corporation | Profilometer, measuring apparatus, and observing apparatus |
JP5170154B2 (ja) * | 2010-04-26 | 2013-03-27 | オムロン株式会社 | 形状計測装置およびキャリブレーション方法 |
US8334985B2 (en) * | 2010-10-08 | 2012-12-18 | Omron Corporation | Shape measuring apparatus and shape measuring method |
-
2012
- 2012-01-05 FI FI20125014A patent/FI125320B/fi active IP Right Grant
- 2012-12-20 WO PCT/EP2012/076345 patent/WO2013102572A1/en active Application Filing
- 2012-12-20 US US14/370,547 patent/US9423245B2/en active Active
- 2012-12-20 EP EP12813838.5A patent/EP2800946B1/en active Active
- 2012-12-20 PL PL12813838T patent/PL2800946T3/pl unknown
- 2012-12-20 CN CN201280066177.0A patent/CN104040287B/zh active Active
- 2012-12-20 JP JP2014550675A patent/JP6291418B2/ja active Active
- 2012-12-20 ES ES12813838T patent/ES2875052T3/es active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113383207A (zh) * | 2018-10-04 | 2021-09-10 | 杜·普雷兹·伊萨克 | 光学表面编码器 |
Also Published As
Publication number | Publication date |
---|---|
US20140376003A1 (en) | 2014-12-25 |
EP2800946B1 (en) | 2021-03-24 |
ES2875052T3 (es) | 2021-11-08 |
FI125320B (fi) | 2015-08-31 |
CN104040287B (zh) | 2017-11-24 |
US9423245B2 (en) | 2016-08-23 |
PL2800946T3 (pl) | 2021-10-25 |
CN104040287A (zh) | 2014-09-10 |
JP2015508499A (ja) | 2015-03-19 |
WO2013102572A1 (en) | 2013-07-11 |
JP6291418B2 (ja) | 2018-03-14 |
EP2800946A1 (en) | 2014-11-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
FI20125014A (fi) | Järjestely ja vastaava menetelmä optisia mittauksia varten | |
FI20126186A (fi) | Järjestely ja menetelmä elektrodimittausten suorittamiseksi | |
BR112014030410A2 (pt) | inibidores de pirazolopirimidona e pirazolopiridona de tanquirase | |
DK2917763T3 (da) | Lidar-målesystem og lidar-målefremgangsmåde | |
DE112012005650T8 (de) | Risikomesssystem | |
DK2867626T3 (da) | Fiberoptisk detektion | |
BR112015007125A2 (pt) | aparelho e método | |
DK2650413T3 (da) | Hydrogelerende fibermateriale | |
EP2893310A4 (en) | DEVICES AND METHOD FOR LIGHT MEASUREMENT | |
FI20125045L (fi) | Menetelmä ja hissijärjestely | |
FI20126266A (fi) | Pehmopaperin mittaus | |
DK2821824T3 (da) | Optisk multikernefiber | |
DK2894498T3 (da) | Optisk fiber | |
EP2803973A4 (en) | OPTICAL PROBE AND OPTICAL MEASUREMENT PROCESS | |
BR112014025875A2 (pt) | Método de medição | |
FI20126288A (fi) | Kuituoptinen muotosekoitin ja menetelmä tämän valmistamiseksi | |
FI20125280L (fi) | Menetelmä ja järjestely liikkuvan kohteen käyttäytymisen erittelemiseksi | |
FI20125937A (fi) | Järjestely ja menetelmä rakenneosan kannattamiseksi | |
DK2910987T3 (da) | Optisk fiber og fiberlaserapparat til anvendelse deraf | |
FI20135347A (fi) | Kulkutie ja menetelmä sen valmistamiseksi | |
FI20126126L (fi) | Menetelmä ja laite kiillon mittaamiseksi | |
DK2841457T3 (da) | Antistof imod ROBO4 | |
EP2829863A4 (en) | OPTICAL PROBE AND OPTICAL MEASUREMENT METHOD | |
DK2831963T3 (da) | Fiberlaser | |
FI20126139A (fi) | Hissin vetohihnan kiristysjärjestelmä ja hissi |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Transfer of assignment of patent |
Owner name: HELMEE IMAGING OY |
|
FG | Patent granted |
Ref document number: 125320 Country of ref document: FI Kind code of ref document: B |