FI20125014A - Arrangemang och motsvarande förfarande för optiska mätningar - Google Patents

Arrangemang och motsvarande förfarande för optiska mätningar Download PDF

Info

Publication number
FI20125014A
FI20125014A FI20125014A FI20125014A FI20125014A FI 20125014 A FI20125014 A FI 20125014A FI 20125014 A FI20125014 A FI 20125014A FI 20125014 A FI20125014 A FI 20125014A FI 20125014 A FI20125014 A FI 20125014A
Authority
FI
Finland
Prior art keywords
organization
similar method
optical measurements
measurements
optical
Prior art date
Application number
FI20125014A
Other languages
English (en)
Finnish (fi)
Other versions
FI125320B (sv
Inventor
Heimo Keraenen
Petri Lehtonen
Original Assignee
Teknologian Tutkimuskeskus Vtt Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teknologian Tutkimuskeskus Vtt Oy filed Critical Teknologian Tutkimuskeskus Vtt Oy
Priority to FI20125014A priority Critical patent/FI125320B/sv
Priority to US14/370,547 priority patent/US9423245B2/en
Priority to CN201280066177.0A priority patent/CN104040287B/zh
Priority to ES12813838T priority patent/ES2875052T3/es
Priority to PCT/EP2012/076345 priority patent/WO2013102572A1/en
Priority to PL12813838T priority patent/PL2800946T3/pl
Priority to EP12813838.5A priority patent/EP2800946B1/en
Priority to JP2014550675A priority patent/JP6291418B2/ja
Publication of FI20125014A publication Critical patent/FI20125014A/sv
Application granted granted Critical
Publication of FI125320B publication Critical patent/FI125320B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/04—Interpretation of pictures
    • G01C11/06—Interpretation of pictures by comparison of two or more pictures of the same area
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
FI20125014A 2012-01-05 2012-01-05 Arrangemang och motsvarande förfarande för optiska mätningar FI125320B (sv)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FI20125014A FI125320B (sv) 2012-01-05 2012-01-05 Arrangemang och motsvarande förfarande för optiska mätningar
US14/370,547 US9423245B2 (en) 2012-01-05 2012-12-20 Arrangement for optical measurements and related method
CN201280066177.0A CN104040287B (zh) 2012-01-05 2012-12-20 用于光学测量的设备及相关方法
ES12813838T ES2875052T3 (es) 2012-01-05 2012-12-20 Disposición para mediciones ópticas y método relacionado
PCT/EP2012/076345 WO2013102572A1 (en) 2012-01-05 2012-12-20 Arrangement for optical measurements and related method
PL12813838T PL2800946T3 (pl) 2012-01-05 2012-12-20 Układ do pomiarów optycznych i powiązany sposób
EP12813838.5A EP2800946B1 (en) 2012-01-05 2012-12-20 Arrangement for optical measurements and related method
JP2014550675A JP6291418B2 (ja) 2012-01-05 2012-12-20 光学測定用配置および関連方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20125014 2012-01-05
FI20125014A FI125320B (sv) 2012-01-05 2012-01-05 Arrangemang och motsvarande förfarande för optiska mätningar

Publications (2)

Publication Number Publication Date
FI20125014A true FI20125014A (sv) 2013-07-06
FI125320B FI125320B (sv) 2015-08-31

Family

ID=47557081

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20125014A FI125320B (sv) 2012-01-05 2012-01-05 Arrangemang och motsvarande förfarande för optiska mätningar

Country Status (8)

Country Link
US (1) US9423245B2 (sv)
EP (1) EP2800946B1 (sv)
JP (1) JP6291418B2 (sv)
CN (1) CN104040287B (sv)
ES (1) ES2875052T3 (sv)
FI (1) FI125320B (sv)
PL (1) PL2800946T3 (sv)
WO (1) WO2013102572A1 (sv)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113383207A (zh) * 2018-10-04 2021-09-10 杜·普雷兹·伊萨克 光学表面编码器

Families Citing this family (48)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6738730B2 (ja) * 2013-10-24 2020-08-12 シグニファイ ホールディング ビー ヴィＳｉｇｎｉｆｙ Ｈｏｌｄｉｎｇ Ｂ．Ｖ． 欠陥検査システム及び方法
EP3140639A4 (en) * 2014-05-05 2018-01-31 Arconic Inc. Apparatus and methods for weld measurement
CN104236480B (zh) * 2014-09-22 2017-06-27 电子科技大学 一种线结构光机器视觉六角钢坯轮廓测量装置及方法
US9885563B2 (en) * 2014-10-10 2018-02-06 Georgia Tech Research Corporation Dynamic digital fringe projection techniques for measuring warpage
US9885561B2 (en) * 2014-12-15 2018-02-06 Test Research, Inc. Optical inspection system
FI126498B (sv) 2014-12-29 2017-01-13 Helmee Imaging Oy Optiskt mätningssystem
EP3070641B1 (en) * 2015-03-11 2021-11-24 Ricoh Company, Ltd. Vehicle body with imaging system and object detection method
CN106296798A (zh) * 2015-06-10 2017-01-04 西安蒜泥电子科技有限责任公司 基于特征点补充的低成本高清晰度人体三维扫描成像***
CN106296643A (zh) * 2015-06-10 2017-01-04 西安蒜泥电子科技有限责任公司 用于多视图几何三维重建的特征点补充***
CN108401414B (zh) 2015-06-19 2020-12-11 雅马哈发动机株式会社 元件安装装置和元件安装方法
US9470641B1 (en) * 2015-06-26 2016-10-18 Glasstech, Inc. System and method for measuring reflected optical distortion in contoured glass sheets
DE112015006596T5 (de) 2015-08-17 2018-05-24 Yamaha Hatsudoki Kabushiki Kaisha Komponentenbefestigungsvorrichtung
KR102319841B1 (ko) 2015-09-16 2021-10-29 하우매트 에어로스페이스 인코포레이티드 리벳 공급 장치
TWI583932B (zh) * 2015-12-09 2017-05-21 財團法人國家實驗研究院 量測鏡頭光學品質的裝置
JP2017120232A (ja) * 2015-12-28 2017-07-06 キヤノン株式会社 検査装置
US10593034B2 (en) 2016-03-25 2020-03-17 Arconic Inc. Resistance welding fasteners, apparatus and methods for joining dissimilar materials and assessing joints made thereby
FR3049709B1 (fr) * 2016-04-05 2019-08-30 Areva Np Procede de detection d'un defaut sur une surface par eclairage multidirectionnel et dispositif associe
CN107869957B (zh) * 2016-09-27 2020-09-25 宝山钢铁股份有限公司 一种基于成像***的圆柱截面尺寸测量装置和方法
JP6499139B2 (ja) * 2016-10-14 2019-04-10 矢崎総業株式会社 検査装置
KR102339677B1 (ko) * 2016-11-09 2021-12-14 브이 테크놀로지 씨오. 엘티디 광학 검사 장치
DE102017207071A1 (de) 2017-04-27 2018-10-31 Robert Bosch Gmbh Prüfvorrichtung zur optischen Prüfung eines Objekts und Objektprüfungsanordnung
GB201721451D0 (en) * 2017-12-20 2018-01-31 Univ Manchester Apparatus and method for determining spectral information
US10527557B2 (en) * 2017-12-29 2020-01-07 Radiant Vision Systems, LLC Adaptive diffuse illumination systems and methods
US10628646B1 (en) * 2017-12-29 2020-04-21 Cognex Corporation Off-axis dual-sensor vision system camera and method for using the same
US11481568B1 (en) 2017-12-29 2022-10-25 Cognex Corporation Dome illuminator for vision system camera and method for using the same
US11073380B2 (en) * 2018-01-24 2021-07-27 Cyberoptics Corporation Structured light projection for specular surfaces
WO2019170591A1 (de) * 2018-03-04 2019-09-12 Vision Tools Hard- Und Software Entwicklungs-Gmbh Erstellung eines abstandsbildes
JP6994165B2 (ja) * 2018-03-16 2022-01-14 日本電気株式会社 ３次元形状計測装置、３次元形状計測方法及びプログラム
CN108445615A (zh) * 2018-03-29 2018-08-24 中国工程物理研究院激光聚变研究中心 一种光学元件面散射缺陷探测装置
DE102018213740A1 (de) 2018-08-15 2020-02-20 Robert Bosch Gmbh Messvorrichtung und Verfahren zur Bestimmung einer Oberfläche
US20210314477A1 (en) * 2018-08-17 2021-10-07 Hewlett-Packard Development Company, L.P. Exposure control of captured images
CN109443199B (zh) * 2018-10-18 2019-10-22 天目爱视（北京）科技有限公司 基于智能光源的3d信息测量***
CN109883443B (zh) * 2019-02-19 2021-06-18 北京工业大学 一种线结构光传感器空间姿态标定方法
CN110017792A (zh) * 2019-04-10 2019-07-16 中山大学 一种新型光学曲面二维测量方法及其测量***
CN111006615A (zh) * 2019-10-30 2020-04-14 浙江大学 一种平坦表面特征扫描成像装置和方法
CN110702699B (zh) * 2019-11-15 2024-03-08 湖南讯目科技有限公司 一种压延玻璃缺陷检测装置和方法
JP7411928B2 (ja) 2019-12-26 2024-01-12 株式会社Rutilea 物品撮影装置
JP2021117114A (ja) * 2020-01-27 2021-08-10 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置、検査装置および検査方法
EP3910314B1 (de) * 2020-05-14 2022-07-20 KRÜSS GmbH, Wissenschaftliche Laborgeräte Verfahren und vorrichtung zur analyse der wechselwirkung zwischen einer oberfläche einer probe und einer flüssigkeit
CN112908126B (zh) * 2021-01-21 2022-07-08 潍坊学院 一种具有对焦状态数字化显示的透镜成像实验装置
CN112923877B (zh) * 2021-01-27 2023-08-11 荆门宏图特种飞行器制造有限公司 球壳板曲率偏差检测装置及方法
CN113218961B (zh) * 2021-04-21 2023-08-11 中国科学院光电技术研究所 一种基片缺陷检测装置与方法
CN114354607B (zh) * 2021-10-09 2023-10-31 七海测量技术（深圳）有限公司 一种基于螺旋相衬滤波算法的光度立体瑕疵检测方法
CN114113136A (zh) * 2021-11-09 2022-03-01 慧三维智能科技(苏州)有限公司 一种用于检测高亮面表面缺陷的装置
EP4184145B1 (de) 2021-11-17 2023-08-30 KRÜSS GmbH, Wissenschaftliche Laborgeräte Vorrichtung zur erfassung einer geometrie eines auf einer probenoberfläche angeordneten tropfens
FI130408B (sv) 2022-01-18 2023-08-17 Helmee Imaging Oy Arrangemang och motsvarande förfarande för optiska mätningar
WO2023191791A1 (en) * 2022-03-31 2023-10-05 Hewlett-Packard Development Company, L.P. Three-dimensional topographical surface capture device
TWI797039B (zh) * 2022-07-21 2023-03-21 中國鋼鐵股份有限公司 測量系統

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4427880A (en) 1981-06-29 1984-01-24 Westinghouse Electric Corp. Non-contact visual proximity sensing apparatus
US5060065A (en) * 1990-02-23 1991-10-22 Cimflex Teknowledge Corporation Apparatus and method for illuminating a printed circuit board for inspection
US5245421A (en) 1990-09-19 1993-09-14 Control Automation, Incorporated Apparatus for inspecting printed circuit boards with surface mounted components
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
JPH05231837A (ja) * 1991-12-25 1993-09-07 Toshiba Corp 形状測定方法及び装置
US5461417A (en) * 1993-02-16 1995-10-24 Northeast Robotics, Inc. Continuous diffuse illumination method and apparatus
DE4413832C2 (de) * 1994-04-20 2000-05-31 Siemens Ag Vorrichtungen zur Kontrolle von Halbleiterscheiben
US6222630B1 (en) * 1998-08-26 2001-04-24 Teradyne, Inc. Measuring and compensating for warp in the inspection of printed circuit board assemblies
US6788411B1 (en) * 1999-07-08 2004-09-07 Ppt Vision, Inc. Method and apparatus for adjusting illumination angle
FR2806478B1 (fr) 2000-03-14 2002-05-10 Optomachines Dispositif et procede de controle optique de pieces de vaisselle comme des assiettes emaillees ou tout produit ceramique emaille
US7075565B1 (en) * 2000-06-14 2006-07-11 Landrex Technologies Co., Ltd. Optical inspection system
US6618123B2 (en) * 2000-10-20 2003-09-09 Matsushita Electric Industrial Co., Ltd. Range-finder, three-dimensional measuring method and light source apparatus
US7113313B2 (en) * 2001-06-04 2006-09-26 Agilent Technologies, Inc. Dome-shaped apparatus for inspecting a component or a printed circuit board device
US6730926B2 (en) * 2001-09-05 2004-05-04 Servo-Robot Inc. Sensing head and apparatus for determining the position and orientation of a target object
US7256895B2 (en) * 2003-02-26 2007-08-14 Castonguay Raymond J Spherical scattering-light device for simultaneous phase and intensity measurements
EP1611430B1 (en) * 2003-02-28 2010-04-21 Koninklijke Philips Electronics N.V. A scatterometer and a method for observing a surface
US7145125B2 (en) * 2003-06-23 2006-12-05 Advanced Optical Technologies, Llc Integrating chamber cone light using LED sources
DE102004056698B3 (de) * 2004-11-24 2006-08-17 Stratus Vision Gmbh Inspektionsvorrichtung für ein Substrat, das mindestens eine aufgedruckte Schicht aufweist
EP1864081B1 (de) 2005-03-24 2014-05-07 SAC Sirius Advanced Cybernetics GmbH Vorrichtung zur optischen formerfassung von gegenständen und oberflächen
US8032017B2 (en) * 2006-09-29 2011-10-04 Microscan Systems, Inc. Methods for providing diffuse light
WO2010090604A1 (en) 2009-02-06 2010-08-12 Agency For Science, Technology And Research A light detection arrangement and a method for detecting light in a light detection arrangement
US8717578B2 (en) * 2009-04-10 2014-05-06 Omron Corporation Profilometer, measuring apparatus, and observing apparatus
US20100259746A1 (en) * 2009-04-10 2010-10-14 Omron Corporation Profilometer
JP5170154B2 (ja) * 2010-04-26 2013-03-27 オムロン株式会社 形状計測装置およびキャリブレーション方法
US8334985B2 (en) * 2010-10-08 2012-12-18 Omron Corporation Shape measuring apparatus and shape measuring method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113383207A (zh) * 2018-10-04 2021-09-10 杜·普雷兹·伊萨克 光学表面编码器

Also Published As

Publication number Publication date
CN104040287B (zh) 2017-11-24
WO2013102572A1 (en) 2013-07-11
EP2800946B1 (en) 2021-03-24
PL2800946T3 (pl) 2021-10-25
EP2800946A1 (en) 2014-11-12
CN104040287A (zh) 2014-09-10
ES2875052T3 (es) 2021-11-08
FI125320B (sv) 2015-08-31
JP6291418B2 (ja) 2018-03-14
JP2015508499A (ja) 2015-03-19
US9423245B2 (en) 2016-08-23
US20140376003A1 (en) 2014-12-25

Similar Documents

Publication Publication Date Title
FI20125014A (sv) Arrangemang och motsvarande förfarande för optiska mätningar
FI20126186A (sv) Arrangemang och förfarande för utförande av elektrodmätningar
BR112014030410A2 (pt) inibidores de pirazolopirimidona e pirazolopiridona de tanquirase
DK2917763T3 (da) Lidar-målesystem og lidar-målefremgangsmåde
DE112012005650T8 (de) Risikomesssystem
DK2867626T3 (da) Fiberoptisk detektion
BR112015007125A2 (pt) aparelho e método
DK2650413T3 (da) Hydrogelerende fibermateriale
EP2893310A4 (en) DEVICES AND METHOD FOR LIGHT MEASUREMENT
DK2821824T3 (da) Optisk multikernefiber
FI20125045L (sv) Förfarande och hissarrangemang
FI20116089L (sv) Arrangemang och apparat
FI20126266A (sv) Mätning av mjukpapper
DK2894498T3 (da) Optisk fiber
BR112014025875A2 (pt) Método de medição
EP2803973A4 (en) OPTICAL PROBE AND OPTICAL MEASUREMENT PROCESS
FI20126288A (sv) Fiberoptisk modblandare och förfarande för tillverkning därav
FI20125280L (sv) Förfarande och arrangemang för analys av beteendet av ett rörligt objekt
FI20125937A (sv) Arrangemang och förfarande för stöd av byggnadsdel
DK2910987T3 (da) Optisk fiber og fiberlaserapparat til anvendelse deraf
FI20135347A (sv) Spång och förfarande för framställning därav
FI20126126L (sv) Förfarande och anordning för att mäta glans
DK2841457T3 (da) Antistof imod ROBO4
DK2831963T3 (da) Fiberlaser
EP2829863A4 (en) OPTICAL PROBE AND OPTICAL MEASUREMENT METHOD

Legal Events

Date Code Title Description
PC Transfer of assignment of patent

Owner name: HELMEE IMAGING OY

FG Patent granted

Ref document number: 125320

Country of ref document: FI

Kind code of ref document: B