ES2005966A6 - Dispositivo para la verificacion de piezas de trabajo simetricas rotativas. - Google Patents

Dispositivo para la verificacion de piezas de trabajo simetricas rotativas.

Info

Publication number
ES2005966A6
ES2005966A6 ES8703495A ES8703495A ES2005966A6 ES 2005966 A6 ES2005966 A6 ES 2005966A6 ES 8703495 A ES8703495 A ES 8703495A ES 8703495 A ES8703495 A ES 8703495A ES 2005966 A6 ES2005966 A6 ES 2005966A6
Authority
ES
Spain
Prior art keywords
radiation
sensors
sensor
frequency
modulated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES8703495A
Other languages
English (en)
Inventor
Gunter Hege
Michael Struck
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Robert Bosch GmbH
Original Assignee
Robert Bosch GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Robert Bosch GmbH filed Critical Robert Bosch GmbH
Publication of ES2005966A6 publication Critical patent/ES2005966A6/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M13/00—Testing of machine parts
    • G01M13/005—Sealing rings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

DISPOSITIVO PARA LA VERIFICACION AUTOMATICA DE PIEZAS DE TRABAJO SIMETRICAS ROTATIVAS, ESPECIALMENTE ANILLOS OBTURADORES CON SECCION TRANSVERSAL CIRCULAR, DENOMINADOS ANILLOS TORICOS. SE HAN PREVISTO DOS FUENTES DE RADIACION (10, 11) QUE EVITEN UNA RADIACION (12, 15) CON FRECUENCIA PREDETERMINADA. EL RAYO LUMINOSO (16) COMUN SE DIRIGE A LA SUPERFICIE (29) A VERIFICAR DEL ANILLO TORICO (24) A TRAVES DE UNA INSTALACION (20) FORMADORA DE HAZ Y A TRAVES DE UN PRIMER ESPEJO (21) GIRATORIO, ASI COMO A TRAVES DE UNA LENTE DE REPRODUCCION (22). LA RADIACION (30) REFLEJADA POR LA SUPERFICIE (29) LLEGA A UNA DISPOSICION SENSORIAL (33) UNA VEZ QUE HA PASADO POR OTRA LENTE COLECTORA (31) Y SE HA DESVIADO EN UN SEGUNDO ESPEJO (32) GIRATORIO. LA DISPOSICION SENSORIAL (33) COMPRENDE UN PRIMER SENSOR DE RADIACION (34) QUE ENTREGA A UNA INSTALACION ANALIZADORA (35) UNA SEÑAL DE SALIDA QUE DEPENDE DEL PUNTO DE INCIDENCIA DE LA RADIACION (30), SOBRE LA SUPERFICIE (36) ACTIVA DEL PRIMER SENSOR (34). SE HAN PREVISTO OTROS DOS SENSORES DE RADIACION (44, 49) QUE ENTREGAN A LA INSTALACION ANALIZADORA UNA SEÑAL DE SALIDA QUE DEPENDE DE LA INTENSIDAD DE RADIACION DE LOS SENSORES (44, 49). DELANTE DE AMBOS SENSORES (44, 49) SE HAN DISPUESTO FILTROS DE PASO DE COLOR (42, 47), ESTANDO ADECUADO EL CAMPO DE PASO DEL PRIMER FILTRO DE PASO DE COLOR (42) A LA FRECUENCIA DE LA RADIACION (15) DE LA PRIMERA FUENTE DE RADIACION (10) Y EL DEL OTRO FILTRO DE PASO DE COLOR A LA OTRA FRECUENCIA DE LA RADIACION (12) DE LA SEGUNDA FUENTE DE RADIACION (11).
ES8703495A 1986-12-08 1987-12-04 Dispositivo para la verificacion de piezas de trabajo simetricas rotativas. Expired ES2005966A6 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19863641862 DE3641862A1 (de) 1986-12-08 1986-12-08 Vorrichtung zur pruefung rotationssymmetrischer werkstuecke

Publications (1)

Publication Number Publication Date
ES2005966A6 true ES2005966A6 (es) 1989-04-01

Family

ID=6315698

Family Applications (1)

Application Number Title Priority Date Filing Date
ES8703495A Expired ES2005966A6 (es) 1986-12-08 1987-12-04 Dispositivo para la verificacion de piezas de trabajo simetricas rotativas.

Country Status (3)

Country Link
DE (1) DE3641862A1 (es)
ES (1) ES2005966A6 (es)
WO (1) WO1988004416A1 (es)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3917076A1 (de) * 1989-05-26 1990-11-29 Klaue Hermann Pruefeinrichtung fuer gummi-rundschnur-dichtringe
DE4000121C1 (en) * 1990-01-04 1991-07-18 Fa. Carl Freudenberg, 6940 Weinheim, De Photoelectric quality control for sealing rings - has carrier for light source slidable and pivotable about axis in parallel with its length axis
BR9403734A (pt) * 1994-10-20 1997-02-25 Samapre Ind De Maquinas Ltda Aperfeiçoamento em equipamento para aferiçao de qualidade
IT1395116B1 (it) * 2009-07-29 2012-09-05 Utpvision S R L Sistema di rilevamento ottico di difetti superficiali

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3917414A (en) * 1973-10-11 1975-11-04 Geisco Associates Optical inspection system
DE2433682C3 (de) * 1974-07-12 1979-02-15 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur Überwachung einer Materialbahn oder einer sonstigen Abtastebene
DE2535686A1 (de) * 1975-08-09 1977-02-10 Freudenberg Carl Fa Verfahren zur lichtspaltpruefung von lippendichtungen aus elastomeren
US4265545A (en) * 1979-07-27 1981-05-05 Intec Corporation Multiple source laser scanning inspection system
JPS576307A (en) * 1980-06-13 1982-01-13 Toyota Central Res & Dev Lab Inc Method and apparatus of surface failure inspection of circular member
US4352017A (en) * 1980-09-22 1982-09-28 Rca Corporation Apparatus for determining the quality of a semiconductor surface
JPS5766345A (en) * 1980-10-09 1982-04-22 Hitachi Ltd Inspection device for defect
US4532723A (en) * 1982-03-25 1985-08-06 General Electric Company Optical inspection system
US4520388A (en) * 1982-11-01 1985-05-28 General Electric Company Optical signal projector
GB2173294B (en) * 1985-04-02 1988-10-12 Glaverbel Method of and apparatus for determining the location of defects present in flat glass

Also Published As

Publication number Publication date
WO1988004416A1 (en) 1988-06-16
DE3641862A1 (de) 1988-06-09

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