IT1395116B1 - Sistema di rilevamento ottico di difetti superficiali - Google Patents

Sistema di rilevamento ottico di difetti superficiali

Info

Publication number
IT1395116B1
IT1395116B1 ITMI2009A001351A ITMI20091351A IT1395116B1 IT 1395116 B1 IT1395116 B1 IT 1395116B1 IT MI2009A001351 A ITMI2009A001351 A IT MI2009A001351A IT MI20091351 A ITMI20091351 A IT MI20091351A IT 1395116 B1 IT1395116 B1 IT 1395116B1
Authority
IT
Italy
Prior art keywords
detection system
optical surface
surface detection
optical
detection
Prior art date
Application number
ITMI2009A001351A
Other languages
English (en)
Inventor
Roberto Finazzi
Original Assignee
Utpvision S R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Utpvision S R L filed Critical Utpvision S R L
Priority to ITMI2009A001351A priority Critical patent/IT1395116B1/it
Priority to ES10171195.0T priority patent/ES2554559T3/es
Priority to EP10171195.0A priority patent/EP2280270B1/en
Publication of ITMI20091351A1 publication Critical patent/ITMI20091351A1/it
Application granted granted Critical
Publication of IT1395116B1 publication Critical patent/IT1395116B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8812—Diffuse illumination, e.g. "sky"
    • G01N2021/8816—Diffuse illumination, e.g. "sky" by using multiple sources, e.g. LEDs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G01N2201/0626—Use of several LED's for spatial resolution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G01N2201/0627—Use of several LED's for spectral resolution

Landscapes

  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
ITMI2009A001351A 2009-07-29 2009-07-29 Sistema di rilevamento ottico di difetti superficiali IT1395116B1 (it)

Priority Applications (3)

Application Number Priority Date Filing Date Title
ITMI2009A001351A IT1395116B1 (it) 2009-07-29 2009-07-29 Sistema di rilevamento ottico di difetti superficiali
ES10171195.0T ES2554559T3 (es) 2009-07-29 2010-07-29 Sistema de detección óptica de defectos superficiales de una junta tórica.
EP10171195.0A EP2280270B1 (en) 2009-07-29 2010-07-29 Optical detection system of surface defects of an O-ring.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITMI2009A001351A IT1395116B1 (it) 2009-07-29 2009-07-29 Sistema di rilevamento ottico di difetti superficiali

Publications (2)

Publication Number Publication Date
ITMI20091351A1 ITMI20091351A1 (it) 2011-01-30
IT1395116B1 true IT1395116B1 (it) 2012-09-05

Family

ID=41785870

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI2009A001351A IT1395116B1 (it) 2009-07-29 2009-07-29 Sistema di rilevamento ottico di difetti superficiali

Country Status (3)

Country Link
EP (1) EP2280270B1 (it)
ES (1) ES2554559T3 (it)
IT (1) IT1395116B1 (it)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ITMN20130003A1 (it) * 2013-03-05 2014-09-06 Doss Visual Solution S R L Dispositivo di controllo tagli in una macchina di controllo visivo e selezione automatica.
CN105510343A (zh) * 2015-11-05 2016-04-20 苏州威盛视信息科技有限公司 一种表面检测装置
CN109671082B (zh) * 2018-12-26 2023-06-23 广东嘉铭智能科技有限公司 一种密封圈检测方法、装置、设备及计算机可读存储介质
JP6864709B2 (ja) * 2019-03-28 2021-04-28 三菱電線工業株式会社 シール外観検査方法
IT201900005534A1 (it) * 2019-04-10 2020-10-10 Doss Visual Solution S R L Illuminatore per un gruppo di visione di una macchina di ispezione ottica per il controllo qualità di pezzi
IT201900005536A1 (it) * 2019-04-10 2020-10-10 Doss Visual Solution S R L Metodo di acquisizione immagini per una macchina di ispezione ottica
JP7307520B2 (ja) * 2019-09-26 2023-07-12 第一実業ビスウィル株式会社 環状製品の外観検査装置
CN112683493A (zh) * 2019-10-18 2021-04-20 江西晶润光学有限公司 透光性器件检测***
IT202000002656A1 (it) 2020-02-11 2021-08-11 Utpvision S R L Dispositivo per la rilevazione di difetti superficiali in un oggetto
IT202100001754U1 (it) 2021-04-07 2022-10-07 Utpvision S R L Dispositivo per la rilevazione di difetti superficiali su un oggetto.

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634273A (en) * 1984-06-08 1987-01-06 Trw Inc. O-ring inspection method
DE3641862A1 (de) * 1986-12-08 1988-06-09 Bosch Gmbh Robert Vorrichtung zur pruefung rotationssymmetrischer werkstuecke
DE68929481T2 (de) * 1988-05-09 2004-06-09 Omron Corp. Vorrichtung und Verfahren zur Anzeige der Ergebnisse einer Leiterplattenprüfung
FR2675903A1 (fr) * 1991-04-26 1992-10-30 Dicom Dispositif de detection des defauts d'un joint d'etancheite annulaire, et procede de controle d'un tel joint a l'aide de ce dispositif.
US5461417A (en) * 1993-02-16 1995-10-24 Northeast Robotics, Inc. Continuous diffuse illumination method and apparatus
JP2985160B2 (ja) * 1995-03-01 1999-11-29 三菱電線工業株式会社 Ｏリング検査装置
DE19726967C1 (de) * 1997-06-25 1999-06-02 Basler Gmbh Vorrichtung zum optischen Abbilden der umlaufenden Seitenfläche eines Gegenstandes, insbesondere eines 0-Rings
US6675120B2 (en) * 2000-06-27 2004-01-06 Photon Dynamics, Inc. Color optical inspection system
JP3551188B2 (ja) * 2002-01-10 2004-08-04 オムロン株式会社 表面状態検査方法および基板検査装置
EP1455179A1 (en) * 2003-03-07 2004-09-08 MV Research Limited A machine vision inspection system and method
CA2601842C (en) * 2005-04-21 2011-03-15 Sumitomo Electric Industries, Ltd. Superconducting wire inspection apparatus and method
GB0606217D0 (en) * 2006-03-29 2006-05-10 Pilkington Plc Glazing inspection

Also Published As

Publication number Publication date
EP2280270A1 (en) 2011-02-02
ITMI20091351A1 (it) 2011-01-30
ES2554559T3 (es) 2015-12-21
EP2280270B1 (en) 2015-09-02

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