DK0392830T3 - Fremgangsmåde og apparat til detektering af spænding - Google Patents
Fremgangsmåde og apparat til detektering af spændingInfo
- Publication number
- DK0392830T3 DK0392830T3 DK90303924.6T DK90303924T DK0392830T3 DK 0392830 T3 DK0392830 T3 DK 0392830T3 DK 90303924 T DK90303924 T DK 90303924T DK 0392830 T3 DK0392830 T3 DK 0392830T3
- Authority
- DK
- Denmark
- Prior art keywords
- measured
- electrooptic material
- voltage
- light beam
- detecting voltage
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
- G01R1/071—Non contact-making probes containing electro-optic elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
- G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9215389 | 1989-04-12 |
Publications (1)
Publication Number | Publication Date |
---|---|
DK0392830T3 true DK0392830T3 (da) | 1994-10-24 |
Family
ID=14046476
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK90303924.6T DK0392830T3 (da) | 1989-04-12 | 1990-04-11 | Fremgangsmåde og apparat til detektering af spænding |
Country Status (5)
Country | Link |
---|---|
US (1) | US5055770A (da) |
EP (1) | EP0392830B1 (da) |
AT (1) | ATE107778T1 (da) |
DE (1) | DE69010053T2 (da) |
DK (1) | DK0392830T3 (da) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2676543B1 (fr) * | 1991-05-14 | 1998-03-06 | Thomson Csf | Dispositif pour tests hyperfrequences a large bande realises in situ. |
EP0541139B1 (en) * | 1991-08-05 | 2003-01-22 | Koninklijke Philips Electronics N.V. | Electro-optic measurement device for the measurement of an electrical signal in an electronic component |
US5635831A (en) * | 1991-12-11 | 1997-06-03 | Imatran Voima Oy | Optical voltage and electric field sensor based on the pockels effect |
JPH06265574A (ja) * | 1993-03-15 | 1994-09-22 | Hamamatsu Photonics Kk | E−oプローブ |
US5808473A (en) * | 1994-08-04 | 1998-09-15 | Nippon Telegraph & Telephone Corp. | Electric signal measurement apparatus using electro-optic sampling by one point contact |
US6034883A (en) * | 1998-01-29 | 2000-03-07 | Tinney; Charles E. | Solid state director for beams |
US6567206B1 (en) * | 2001-12-20 | 2003-05-20 | St. Clair Intellectual Property Consultants, Inc. | Multi-stage optical switching device |
EP1462810B1 (de) * | 2003-03-28 | 2015-09-09 | ABB Research Ltd. | Temperaturkompensierter elektrooptischer Spannungssensor |
EP1462811A1 (de) * | 2003-03-28 | 2004-09-29 | Abb Research Ltd. | Elektrooptischer Spannungssensor für hohe Spannungen |
US7177494B1 (en) | 2005-01-14 | 2007-02-13 | St. Clair Intellectual Property Consultants, Inc. | Optical control device and method |
JP6192890B2 (ja) * | 2011-11-25 | 2017-09-06 | 東芝三菱電機産業システム株式会社 | 表面電位分布計測装置および表面電位分布計測方法 |
CA2907558C (en) | 2013-03-19 | 2018-05-01 | Toshiba Mitsubishi-Electric Industrial Systems Corporation | Surface potential distribution measuring device |
JP6642154B2 (ja) | 2016-03-17 | 2020-02-05 | 富士通株式会社 | 光送信器および光信号を送信する方法 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5327938B2 (da) * | 1971-12-17 | 1978-08-11 | ||
JPS4881554A (da) * | 1972-02-01 | 1973-10-31 | ||
DE2845625A1 (de) * | 1978-10-19 | 1980-04-30 | Siemens Ag | Anordnung zur elektrooptischen spannungsmessung |
US4298794A (en) * | 1979-08-30 | 1981-11-03 | United Technologies Corporation | Fiber optic hot spot detector |
JPS5832171A (ja) * | 1981-07-27 | 1983-02-25 | Sumitomo Electric Ind Ltd | 光応用電圧電界センサ |
US4422035A (en) * | 1981-12-11 | 1983-12-20 | Extrude Hone Corporation | Capacitance measurement probe |
JPS58113764A (ja) * | 1981-12-26 | 1983-07-06 | Mitsubishi Electric Corp | 交流電界測定装置 |
US4446425A (en) * | 1982-02-12 | 1984-05-01 | The University Of Rochester | Measurement of electrical signals with picosecond resolution |
DE3301939A1 (de) * | 1983-01-21 | 1984-07-26 | Max Planck Gesellschaft, 3400 Göttingen | Anordnung zur messung von potentialdifferenzen |
JPS59147274A (ja) * | 1983-02-10 | 1984-08-23 | Hitachi Ltd | 光方式電界測定装置 |
US4618819A (en) * | 1984-03-27 | 1986-10-21 | The University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
US4603293A (en) * | 1984-03-27 | 1986-07-29 | University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
US4681449A (en) * | 1984-09-07 | 1987-07-21 | Stanford University | High speed testing of electronic circuits by electro-optic sampling |
EP0197196A1 (en) * | 1985-03-08 | 1986-10-15 | The University Of Rochester | Electro-electron optical oscilloscope system for time-resolving picosecond electrical waveforms |
JPH0695108B2 (ja) * | 1986-11-25 | 1994-11-24 | 浜松ホトニクス株式会社 | 回路電圧検出装置 |
US4910458A (en) * | 1987-03-24 | 1990-03-20 | Princeton Applied Research Corp. | Electro-optic sampling system with dedicated electro-optic crystal and removable sample carrier |
US4926043A (en) * | 1987-03-31 | 1990-05-15 | Siemens Aktiengesellschaft | Apparatus and method for optical measuring and imaging of electrical potentials |
JPH0695109B2 (ja) * | 1987-05-30 | 1994-11-24 | 浜松ホトニクス株式会社 | 電圧検出装置 |
US4996475A (en) * | 1987-05-31 | 1991-02-26 | Hamamatsu Photonics Kabushiki Kaisha | Electro-optic voltage detector having a transparent electrode |
JPH0695112B2 (ja) * | 1987-06-10 | 1994-11-24 | 浜松ホトニクス株式会社 | 電圧検出装置 |
FR2633055B2 (fr) * | 1987-07-31 | 1991-01-04 | Schlumberger Ind Sa | Perfectionnements aux testeurs de circuits |
EP0299432B1 (en) * | 1987-07-13 | 1994-06-08 | Hamamatsu Photonics K.K. | A voltage detecting device |
DE3740468A1 (de) * | 1987-11-28 | 1989-06-08 | Kernforschungsz Karlsruhe | Vorrichtung zur beruehrungslosen messung statischer und/oder zeitlich veraenderlicher elektrischer felder |
JP2665231B2 (ja) * | 1988-05-13 | 1997-10-22 | 浜松ホトニクス株式会社 | 光波形測定装置 |
-
1990
- 1990-04-11 US US07/507,514 patent/US5055770A/en not_active Expired - Lifetime
- 1990-04-11 AT AT90303924T patent/ATE107778T1/de not_active IP Right Cessation
- 1990-04-11 DK DK90303924.6T patent/DK0392830T3/da active
- 1990-04-11 EP EP90303924A patent/EP0392830B1/en not_active Expired - Lifetime
- 1990-04-11 DE DE69010053T patent/DE69010053T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69010053T2 (de) | 1994-10-13 |
US5055770A (en) | 1991-10-08 |
EP0392830B1 (en) | 1994-06-22 |
DE69010053D1 (de) | 1994-07-28 |
EP0392830A2 (en) | 1990-10-17 |
EP0392830A3 (en) | 1991-07-03 |
ATE107778T1 (de) | 1994-07-15 |
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