DE69518684T2 - Herstellungsverfahren für ein Feldeffekt-Halbleiterbauelement - Google Patents

Herstellungsverfahren für ein Feldeffekt-Halbleiterbauelement

Info

Publication number
DE69518684T2
DE69518684T2 DE69518684T DE69518684T DE69518684T2 DE 69518684 T2 DE69518684 T2 DE 69518684T2 DE 69518684 T DE69518684 T DE 69518684T DE 69518684 T DE69518684 T DE 69518684T DE 69518684 T2 DE69518684 T2 DE 69518684T2
Authority
DE
Germany
Prior art keywords
manufacturing
semiconductor device
field effect
effect semiconductor
field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69518684T
Other languages
English (en)
Other versions
DE69518684D1 (de
Inventor
Shigeki Takahashi
Mitsuhiro Kataoka
Tsuyoshi Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Corp
Original Assignee
Denso Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denso Corp filed Critical Denso Corp
Application granted granted Critical
Publication of DE69518684D1 publication Critical patent/DE69518684D1/de
Publication of DE69518684T2 publication Critical patent/DE69518684T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
    • H01L29/7813—Vertical DMOS transistors, i.e. VDMOS transistors with trench gate electrode, e.g. UMOS transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
    • H01L21/0223—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate
    • H01L21/02233—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer
    • H01L21/02236—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer group IV semiconductor
    • H01L21/02238—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer group IV semiconductor silicon in uncombined form, i.e. pure silicon
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
    • H01L21/02255—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by thermal treatment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/314—Inorganic layers
    • H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
    • H01L21/3165—Inorganic layers composed of oxides or glassy oxides or oxide based glass formed by oxidation
    • H01L21/31654—Inorganic layers composed of oxides or glassy oxides or oxide based glass formed by oxidation of semiconductor materials, e.g. the body itself
    • H01L21/31658—Inorganic layers composed of oxides or glassy oxides or oxide based glass formed by oxidation of semiconductor materials, e.g. the body itself by thermal oxidation, e.g. of SiGe
    • H01L21/31662—Inorganic layers composed of oxides or glassy oxides or oxide based glass formed by oxidation of semiconductor materials, e.g. the body itself by thermal oxidation, e.g. of SiGe of silicon in uncombined form
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/126—Power FETs

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Element Separation (AREA)
DE69518684T 1994-03-31 1995-03-30 Herstellungsverfahren für ein Feldeffekt-Halbleiterbauelement Expired - Lifetime DE69518684T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6244794 1994-03-31

Publications (2)

Publication Number Publication Date
DE69518684D1 DE69518684D1 (de) 2000-10-12
DE69518684T2 true DE69518684T2 (de) 2001-05-03

Family

ID=13200481

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69518684T Expired - Lifetime DE69518684T2 (de) 1994-03-31 1995-03-30 Herstellungsverfahren für ein Feldeffekt-Halbleiterbauelement

Country Status (4)

Country Link
US (1) US5470770A (de)
EP (1) EP0675530B1 (de)
KR (1) KR100246975B1 (de)
DE (1) DE69518684T2 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6015737A (en) * 1991-07-26 2000-01-18 Denso Corporation Production method of a vertical type MOSFET
US6603173B1 (en) 1991-07-26 2003-08-05 Denso Corporation Vertical type MOSFET
EP0675529A3 (de) * 1994-03-30 1998-06-03 Denso Corporation Verfahren zur Herstellung von vertikalen MOS-Transistoren
JP3412332B2 (ja) * 1995-04-26 2003-06-03 株式会社デンソー 半導体装置
JPH08306914A (ja) * 1995-04-27 1996-11-22 Nippondenso Co Ltd 半導体装置およびその製造方法
JP3498431B2 (ja) * 1995-07-04 2004-02-16 株式会社デンソー 半導体装置の製造方法
JP3493903B2 (ja) * 1995-09-29 2004-02-03 株式会社デンソー 半導体装置
JP3528420B2 (ja) * 1996-04-26 2004-05-17 株式会社デンソー 半導体装置およびその製造方法
US5808340A (en) * 1996-09-18 1998-09-15 Advanced Micro Devices, Inc. Short channel self aligned VMOS field effect transistor
JP3521648B2 (ja) * 1996-09-30 2004-04-19 株式会社デンソー 半導体装置の製造方法
US6399462B1 (en) * 1997-06-30 2002-06-04 Cypress Semiconductor Corporation Method and structure for isolating integrated circuit components and/or semiconductor active devices
KR100341058B1 (ko) * 1997-11-18 2002-08-22 주식회사 포스코 모니터의자기장차폐쉴드및그제작방법
US5998835A (en) * 1998-02-17 1999-12-07 International Business Machines Corporation High performance MOSFET device with raised source and drain
JP3237829B2 (ja) * 1998-08-26 2001-12-10 日本電気株式会社 クロック識別再生回路
JP3514178B2 (ja) 1998-09-16 2004-03-31 株式会社デンソー 半導体装置の製造方法
US6130133A (en) * 1998-12-02 2000-10-10 United Microelectronics Corp. Fabricating method of high-voltage device
KR100869845B1 (ko) * 2006-12-04 2008-11-21 주식회사 하이닉스반도체 산화막 패턴의 형성 방법 및 이를 이용한 반도체 소자의패터닝 방법

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5696865A (en) * 1979-12-30 1981-08-05 Fujitsu Ltd Manufacture of semiconductor device
JPS58147042A (ja) * 1982-02-25 1983-09-01 Nec Corp 半導体装置の製造方法
JPS6028271A (ja) * 1983-07-26 1985-02-13 Nissan Motor Co Ltd 縦型ｍｏｓｆｅｔ
US4735824A (en) * 1985-05-31 1988-04-05 Kabushiki Kaisha Toshiba Method of manufacturing an MOS capacitor
JPS6212167A (ja) * 1985-07-10 1987-01-21 Tdk Corp 溝部を有する縦形半導体装置の製造方法
JPS6246569A (ja) * 1985-08-23 1987-02-28 Tdk Corp 縦形半導体装置及びその製造方法
JPS63250852A (ja) * 1987-04-08 1988-10-18 Sony Corp 半導体装置
JPS63266882A (ja) * 1987-04-24 1988-11-02 Hitachi Ltd 縦型絶縁ゲ−ト電界効果トランジスタ
JPH0286136A (ja) * 1988-09-22 1990-03-27 Hitachi Ltd 半導体素子およびその製造方法
JPH0294477A (ja) * 1988-09-30 1990-04-05 Toshiba Corp 半導体装置及びその製造方法
JPH02100370A (ja) * 1988-10-07 1990-04-12 Fuji Electric Co Ltd 竪型ｍｏｓｆｅｔ装置の製造方法
US4965221A (en) * 1989-03-15 1990-10-23 Micron Technology, Inc. Spacer isolation method for minimizing parasitic sidewall capacitance and creating fully recessed field oxide regions
WO1993003502A1 (en) * 1991-07-26 1993-02-18 Nippondenso Co., Ltd. Method of producing vertical mosfet
US5316959A (en) * 1992-08-12 1994-05-31 Siliconix, Incorporated Trenched DMOS transistor fabrication using six masks
KR960005553B1 (ko) * 1993-03-31 1996-04-26 현대전자산업주식회사 필드산화막 형성 방법

Also Published As

Publication number Publication date
KR100246975B1 (ko) 2000-03-15
US5470770A (en) 1995-11-28
EP0675530B1 (de) 2000-09-06
EP0675530A3 (de) 1997-10-08
EP0675530A2 (de) 1995-10-04
KR950034621A (ko) 1995-12-28
DE69518684D1 (de) 2000-10-12

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