DE69026928D1 - Schaltungsprüfsystem mit einer Schnittstelle von N-bit pro Stift - Google Patents

Schaltungsprüfsystem mit einer Schnittstelle von N-bit pro Stift

Info

Publication number
DE69026928D1
DE69026928D1 DE69026928T DE69026928T DE69026928D1 DE 69026928 D1 DE69026928 D1 DE 69026928D1 DE 69026928 T DE69026928 T DE 69026928T DE 69026928 T DE69026928 T DE 69026928T DE 69026928 D1 DE69026928 D1 DE 69026928D1
Authority
DE
Germany
Prior art keywords
test
pin
cycles
test pin
words
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69026928T
Other languages
English (en)
Other versions
DE69026928T2 (de
Inventor
Michael Lee Combs
Algirdas Joseph Gruodis
Dale Eugene Hoffman
Charles Albert Puntar
Kurt Paul Szabo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE69026928D1 publication Critical patent/DE69026928D1/de
Application granted granted Critical
Publication of DE69026928T2 publication Critical patent/DE69026928T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69026928T 1990-01-12 1990-11-27 Schaltungsprüfsystem mit einer Schnittstelle von N-bit pro Stift Expired - Fee Related DE69026928T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/464,473 US5127011A (en) 1990-01-12 1990-01-12 Per-pin integrated circuit test system having n-bit interface

Publications (2)

Publication Number Publication Date
DE69026928D1 true DE69026928D1 (de) 1996-06-13
DE69026928T2 DE69026928T2 (de) 1996-11-21

Family

ID=23844077

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69026928T Expired - Fee Related DE69026928T2 (de) 1990-01-12 1990-11-27 Schaltungsprüfsystem mit einer Schnittstelle von N-bit pro Stift

Country Status (4)

Country Link
US (2) US5127011A (de)
EP (1) EP0446550B1 (de)
JP (1) JP2650203B2 (de)
DE (1) DE69026928T2 (de)

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DE4305442C2 (de) * 1993-02-23 1999-08-05 Hewlett Packard Gmbh Verfahren und Vorrichtung zum Erzeugen eines Testvektors
JP3212423B2 (ja) * 1993-09-30 2001-09-25 富士通株式会社 テストパターン作成装置
JPH07280883A (ja) * 1994-04-04 1995-10-27 Advantest Corp 半導体試験装置
US5544107A (en) * 1994-08-22 1996-08-06 Adaptec, Inc. Diagnostic data port for a LSI or VLSI integrated circuit
FR2733323B1 (fr) * 1995-04-19 1997-05-30 Schlumberger Ind Sa Procede et equipement de test automatique en parallele de composants electroniques
US5748642A (en) * 1995-09-25 1998-05-05 Credence Systems Corporation Parallel processing integrated circuit tester
US5717695A (en) * 1995-12-04 1998-02-10 Silicon Graphics, Inc. Output pin for selectively outputting one of a plurality of signals internal to a semiconductor chip according to a programmable register for diagnostics
US5621739A (en) * 1996-05-07 1997-04-15 Intel Corporation Method and apparatus for buffer self-test and characterization
US5737512A (en) * 1996-05-22 1998-04-07 Teradyne, Inc. Fast vector loading for automatic test equipment
FR2753274B1 (fr) * 1996-09-10 1998-11-27 Sgs Thomson Microelectronics Circuit comprenant des moyens de test structurel sans plot de test dedie au test
JP3313591B2 (ja) * 1996-10-02 2002-08-12 株式会社東芝 半導体装置、半導体装置の検査方法及び半導体装置の検査装置
US5828985A (en) * 1996-11-20 1998-10-27 Advantest Corp. Semiconductor test system
US5978942A (en) * 1996-12-19 1999-11-02 Simd Solutions, Inc. STAR-I: scalable tester architecture with I-cached SIMD technology
US6018814A (en) * 1997-03-26 2000-01-25 Simd Solutions, Inc. Star-I: scalable tester architecture with I-cached SIMD technology
US5835506A (en) * 1997-04-29 1998-11-10 Credence Systems Corporation Single pass doublet mode integrated circuit tester
US5905748A (en) * 1997-05-27 1999-05-18 Uniphase Corporation Single mode laser and method suitable for use in frequency multiplied
JP3833341B2 (ja) * 1997-05-29 2006-10-11 株式会社アドバンテスト Ｉｃ試験装置のテストパターン発生回路
US5919270A (en) * 1997-08-29 1999-07-06 Credence Systems Corporation Programmable formatter circuit for integrated circuit tester
US5951705A (en) * 1997-10-31 1999-09-14 Credence Systems Corporation Integrated circuit tester having pattern generator controlled data bus
KR100322525B1 (ko) * 1998-03-23 2002-06-22 윤종용 출력드라이버를공유하는병렬비트테스트회로및이를이용한병렬비트테스트방법
US6324485B1 (en) * 1999-01-26 2001-11-27 Newmillennia Solutions, Inc. Application specific automated test equipment system for testing integrated circuit devices in a native environment
JP4425367B2 (ja) * 1999-03-15 2010-03-03 株式会社アドバンテスト 遅延デバイス
US6377065B1 (en) * 2000-04-13 2002-04-23 Advantest Corp. Glitch detection for semiconductor test system
JP2001319500A (ja) * 2000-05-10 2001-11-16 Mitsubishi Electric Corp 半導体集積回路装置
GB2362473B (en) * 2000-05-18 2002-08-21 3Com Corp On-chip detector of clock glitches
AU6964301A (en) * 2000-06-06 2001-12-17 Igor Anatolievich Abrosimov High speed protocol memory test head for a memory tester
JP2002048844A (ja) * 2000-07-31 2002-02-15 Ando Electric Co Ltd 半導体試験装置
US7019511B1 (en) * 2001-01-05 2006-03-28 Advanced Micro Devices, Inc. Optical analysis of integrated circuits
AU2002255823A1 (en) * 2001-03-19 2002-10-03 Nptest, Inc. Test system formatters
US7765443B1 (en) 2001-03-19 2010-07-27 Credence Systems Corporation Test systems and methods for integrated circuit devices
US6865704B2 (en) 2001-11-09 2005-03-08 Agilent Technologies, Inc. Scan multiplexing for increasing the effective scan data exchange rate
US6708139B2 (en) * 2002-04-30 2004-03-16 Agilent Technologies, Inc. Method and apparatus for measuring the quality of delay test patterns
US6822486B1 (en) * 2003-08-07 2004-11-23 International Business Machines Corporation Multiplexer methods and apparatus
US7130231B2 (en) * 2004-11-19 2006-10-31 International Business Machines Corporation Method, apparatus, and computer program product for implementing enhanced DRAM interface checking
US7840862B2 (en) * 2006-02-17 2010-11-23 Mentor Graphics Corporation Enhanced diagnosis with limited failure cycles
US7925949B2 (en) * 2008-10-15 2011-04-12 Micron Technology, Inc. Embedded processor
JP2010281797A (ja) * 2009-06-08 2010-12-16 Toshiba Corp 半導体試験装置およびそれを用いた試験方法
SG184455A1 (en) * 2010-04-14 2012-11-29 Advantest Singapore Pte Ltd Apparatus and method for testing a plurality of devices under test
US10451653B2 (en) * 2014-12-19 2019-10-22 Teradyne, Inc. Controlling a per-pin measurement unit
US10473717B2 (en) * 2016-11-09 2019-11-12 Texas Instruments Incorporated Methods and apparatus for test insertion points
CN109839548A (zh) * 2017-11-24 2019-06-04 深圳市科比特航空科技有限公司 接口测试方法、装置及***
CN112086124B (zh) * 2020-08-31 2023-03-31 澜智集成电路(苏州)有限公司 双倍速率测试模式参数配置方法及存储介质

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US4517661A (en) * 1981-07-16 1985-05-14 International Business Machines Corporation Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices
US4608706A (en) * 1983-07-11 1986-08-26 International Business Machines Corporation High-speed programmable timing generator
US4656632A (en) * 1983-11-25 1987-04-07 Giordano Associates, Inc. System for automatic testing of circuits and systems
US4639919A (en) * 1983-12-19 1987-01-27 International Business Machines Corporation Distributed pattern generator
US4806852A (en) * 1984-09-07 1989-02-21 Megatest Corporation Automatic test system with enhanced performance of timing generators
US4688233A (en) * 1984-11-10 1987-08-18 Nec Corporation Digital data transmitting device for communication paths of restricted and unrestricted transmission characteristics
US4696005A (en) * 1985-06-03 1987-09-22 International Business Machines Corporation Apparatus for reducing test data storage requirements for high speed VLSI circuit testing
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US4698800A (en) * 1985-10-28 1987-10-06 International Business Machines Corporation Bi-directional transceiver circuit
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US4931723A (en) * 1985-12-18 1990-06-05 Schlumberger Technologies, Inc. Automatic test system having a "true tester-per-pin" architecture
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US4855681A (en) * 1987-06-08 1989-08-08 International Business Machines Corporation Timing generator for generating a multiplicty of timing signals having selectable pulse positions
US4928278A (en) * 1987-08-10 1990-05-22 Nippon Telegraph And Telephone Corporation IC test system
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JP2609284B2 (ja) * 1988-05-10 1997-05-14 株式会社日立製作所 分散形タイミング信号発生装置
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Also Published As

Publication number Publication date
DE69026928T2 (de) 1996-11-21
US5127011A (en) 1992-06-30
JPH03221882A (ja) 1991-09-30
EP0446550A2 (de) 1991-09-18
EP0446550A3 (en) 1992-08-05
US5381421A (en) 1995-01-10
EP0446550B1 (de) 1996-05-08
JP2650203B2 (ja) 1997-09-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee