DE69026928D1 - Schaltungsprüfsystem mit einer Schnittstelle von N-bit pro Stift - Google Patents
Schaltungsprüfsystem mit einer Schnittstelle von N-bit pro StiftInfo
- Publication number
- DE69026928D1 DE69026928D1 DE69026928T DE69026928T DE69026928D1 DE 69026928 D1 DE69026928 D1 DE 69026928D1 DE 69026928 T DE69026928 T DE 69026928T DE 69026928 T DE69026928 T DE 69026928T DE 69026928 D1 DE69026928 D1 DE 69026928D1
- Authority
- DE
- Germany
- Prior art keywords
- test
- pin
- cycles
- test pin
- words
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/464,473 US5127011A (en) | 1990-01-12 | 1990-01-12 | Per-pin integrated circuit test system having n-bit interface |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69026928D1 true DE69026928D1 (de) | 1996-06-13 |
DE69026928T2 DE69026928T2 (de) | 1996-11-21 |
Family
ID=23844077
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69026928T Expired - Fee Related DE69026928T2 (de) | 1990-01-12 | 1990-11-27 | Schaltungsprüfsystem mit einer Schnittstelle von N-bit pro Stift |
Country Status (4)
Country | Link |
---|---|
US (2) | US5127011A (de) |
EP (1) | EP0446550B1 (de) |
JP (1) | JP2650203B2 (de) |
DE (1) | DE69026928T2 (de) |
Families Citing this family (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5321701A (en) * | 1990-12-06 | 1994-06-14 | Teradyne, Inc. | Method and apparatus for a minimal memory in-circuit digital tester |
JPH04218785A (ja) * | 1990-12-19 | 1992-08-10 | Advantest Corp | Ic試験装置 |
US5285453A (en) * | 1990-12-28 | 1994-02-08 | International Business Machines Corporation | Test pattern generator for testing embedded arrays |
US5243274A (en) * | 1992-08-07 | 1993-09-07 | Westinghouse Electric Corp. | Asic tester |
DE4305442C2 (de) * | 1993-02-23 | 1999-08-05 | Hewlett Packard Gmbh | Verfahren und Vorrichtung zum Erzeugen eines Testvektors |
JP3212423B2 (ja) * | 1993-09-30 | 2001-09-25 | 富士通株式会社 | テストパターン作成装置 |
JPH07280883A (ja) * | 1994-04-04 | 1995-10-27 | Advantest Corp | 半導体試験装置 |
US5544107A (en) * | 1994-08-22 | 1996-08-06 | Adaptec, Inc. | Diagnostic data port for a LSI or VLSI integrated circuit |
FR2733323B1 (fr) * | 1995-04-19 | 1997-05-30 | Schlumberger Ind Sa | Procede et equipement de test automatique en parallele de composants electroniques |
US5748642A (en) * | 1995-09-25 | 1998-05-05 | Credence Systems Corporation | Parallel processing integrated circuit tester |
US5717695A (en) * | 1995-12-04 | 1998-02-10 | Silicon Graphics, Inc. | Output pin for selectively outputting one of a plurality of signals internal to a semiconductor chip according to a programmable register for diagnostics |
US5621739A (en) * | 1996-05-07 | 1997-04-15 | Intel Corporation | Method and apparatus for buffer self-test and characterization |
US5737512A (en) * | 1996-05-22 | 1998-04-07 | Teradyne, Inc. | Fast vector loading for automatic test equipment |
FR2753274B1 (fr) * | 1996-09-10 | 1998-11-27 | Sgs Thomson Microelectronics | Circuit comprenant des moyens de test structurel sans plot de test dedie au test |
JP3313591B2 (ja) * | 1996-10-02 | 2002-08-12 | 株式会社東芝 | 半導体装置、半導体装置の検査方法及び半導体装置の検査装置 |
US5828985A (en) * | 1996-11-20 | 1998-10-27 | Advantest Corp. | Semiconductor test system |
US5978942A (en) * | 1996-12-19 | 1999-11-02 | Simd Solutions, Inc. | STAR-I: scalable tester architecture with I-cached SIMD technology |
US6018814A (en) * | 1997-03-26 | 2000-01-25 | Simd Solutions, Inc. | Star-I: scalable tester architecture with I-cached SIMD technology |
US5835506A (en) * | 1997-04-29 | 1998-11-10 | Credence Systems Corporation | Single pass doublet mode integrated circuit tester |
US5905748A (en) * | 1997-05-27 | 1999-05-18 | Uniphase Corporation | Single mode laser and method suitable for use in frequency multiplied |
JP3833341B2 (ja) * | 1997-05-29 | 2006-10-11 | 株式会社アドバンテスト | Ic試験装置のテストパターン発生回路 |
US5919270A (en) * | 1997-08-29 | 1999-07-06 | Credence Systems Corporation | Programmable formatter circuit for integrated circuit tester |
US5951705A (en) * | 1997-10-31 | 1999-09-14 | Credence Systems Corporation | Integrated circuit tester having pattern generator controlled data bus |
KR100322525B1 (ko) * | 1998-03-23 | 2002-06-22 | 윤종용 | 출력드라이버를공유하는병렬비트테스트회로및이를이용한병렬비트테스트방법 |
US6324485B1 (en) * | 1999-01-26 | 2001-11-27 | Newmillennia Solutions, Inc. | Application specific automated test equipment system for testing integrated circuit devices in a native environment |
JP4425367B2 (ja) * | 1999-03-15 | 2010-03-03 | 株式会社アドバンテスト | 遅延デバイス |
US6377065B1 (en) * | 2000-04-13 | 2002-04-23 | Advantest Corp. | Glitch detection for semiconductor test system |
JP2001319500A (ja) * | 2000-05-10 | 2001-11-16 | Mitsubishi Electric Corp | 半導体集積回路装置 |
GB2362473B (en) * | 2000-05-18 | 2002-08-21 | 3Com Corp | On-chip detector of clock glitches |
AU6964301A (en) * | 2000-06-06 | 2001-12-17 | Igor Anatolievich Abrosimov | High speed protocol memory test head for a memory tester |
JP2002048844A (ja) * | 2000-07-31 | 2002-02-15 | Ando Electric Co Ltd | 半導体試験装置 |
US7019511B1 (en) * | 2001-01-05 | 2006-03-28 | Advanced Micro Devices, Inc. | Optical analysis of integrated circuits |
AU2002255823A1 (en) * | 2001-03-19 | 2002-10-03 | Nptest, Inc. | Test system formatters |
US7765443B1 (en) | 2001-03-19 | 2010-07-27 | Credence Systems Corporation | Test systems and methods for integrated circuit devices |
US6865704B2 (en) | 2001-11-09 | 2005-03-08 | Agilent Technologies, Inc. | Scan multiplexing for increasing the effective scan data exchange rate |
US6708139B2 (en) * | 2002-04-30 | 2004-03-16 | Agilent Technologies, Inc. | Method and apparatus for measuring the quality of delay test patterns |
US6822486B1 (en) * | 2003-08-07 | 2004-11-23 | International Business Machines Corporation | Multiplexer methods and apparatus |
US7130231B2 (en) * | 2004-11-19 | 2006-10-31 | International Business Machines Corporation | Method, apparatus, and computer program product for implementing enhanced DRAM interface checking |
US7840862B2 (en) * | 2006-02-17 | 2010-11-23 | Mentor Graphics Corporation | Enhanced diagnosis with limited failure cycles |
US7925949B2 (en) * | 2008-10-15 | 2011-04-12 | Micron Technology, Inc. | Embedded processor |
JP2010281797A (ja) * | 2009-06-08 | 2010-12-16 | Toshiba Corp | 半導体試験装置およびそれを用いた試験方法 |
SG184455A1 (en) * | 2010-04-14 | 2012-11-29 | Advantest Singapore Pte Ltd | Apparatus and method for testing a plurality of devices under test |
US10451653B2 (en) * | 2014-12-19 | 2019-10-22 | Teradyne, Inc. | Controlling a per-pin measurement unit |
US10473717B2 (en) * | 2016-11-09 | 2019-11-12 | Texas Instruments Incorporated | Methods and apparatus for test insertion points |
CN109839548A (zh) * | 2017-11-24 | 2019-06-04 | 深圳市科比特航空科技有限公司 | 接口测试方法、装置及*** |
CN112086124B (zh) * | 2020-08-31 | 2023-03-31 | 澜智集成电路(苏州)有限公司 | 双倍速率测试模式参数配置方法及存储介质 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3873818A (en) * | 1973-10-29 | 1975-03-25 | Ibm | Electronic tester for testing devices having a high circuit density |
US4517661A (en) * | 1981-07-16 | 1985-05-14 | International Business Machines Corporation | Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit |
US4450560A (en) * | 1981-10-09 | 1984-05-22 | Teradyne, Inc. | Tester for LSI devices and memory devices |
US4608706A (en) * | 1983-07-11 | 1986-08-26 | International Business Machines Corporation | High-speed programmable timing generator |
US4656632A (en) * | 1983-11-25 | 1987-04-07 | Giordano Associates, Inc. | System for automatic testing of circuits and systems |
US4639919A (en) * | 1983-12-19 | 1987-01-27 | International Business Machines Corporation | Distributed pattern generator |
US4806852A (en) * | 1984-09-07 | 1989-02-21 | Megatest Corporation | Automatic test system with enhanced performance of timing generators |
US4688233A (en) * | 1984-11-10 | 1987-08-18 | Nec Corporation | Digital data transmitting device for communication paths of restricted and unrestricted transmission characteristics |
US4696005A (en) * | 1985-06-03 | 1987-09-22 | International Business Machines Corporation | Apparatus for reducing test data storage requirements for high speed VLSI circuit testing |
US4682330A (en) * | 1985-10-11 | 1987-07-21 | International Business Machines Corporation | Hierarchical test system architecture |
US4698800A (en) * | 1985-10-28 | 1987-10-06 | International Business Machines Corporation | Bi-directional transceiver circuit |
JPS62118272A (ja) * | 1985-11-19 | 1987-05-29 | Ando Electric Co Ltd | パタ−ン発生装置 |
CA1251575A (en) * | 1985-12-18 | 1989-03-21 | A. Keith Jeffrey | Automatic test system having a "true tester-per-pin" architecture |
US4931723A (en) * | 1985-12-18 | 1990-06-05 | Schlumberger Technologies, Inc. | Automatic test system having a "true tester-per-pin" architecture |
US4727312A (en) * | 1985-12-23 | 1988-02-23 | Genrad, Inc. | Circuit tester |
US4724378A (en) * | 1986-07-22 | 1988-02-09 | Tektronix, Inc. | Calibrated automatic test system |
US4855681A (en) * | 1987-06-08 | 1989-08-08 | International Business Machines Corporation | Timing generator for generating a multiplicty of timing signals having selectable pulse positions |
US4928278A (en) * | 1987-08-10 | 1990-05-22 | Nippon Telegraph And Telephone Corporation | IC test system |
US4875210A (en) * | 1988-01-06 | 1989-10-17 | Teradyne, Inc. | Automatic circuit tester control system |
JP2609284B2 (ja) * | 1988-05-10 | 1997-05-14 | 株式会社日立製作所 | 分散形タイミング信号発生装置 |
JP2591071B2 (ja) * | 1988-06-08 | 1997-03-19 | 横河電機株式会社 | Lsiテストシステム |
-
1990
- 1990-01-12 US US07/464,473 patent/US5127011A/en not_active Expired - Fee Related
- 1990-11-07 JP JP2299984A patent/JP2650203B2/ja not_active Expired - Lifetime
- 1990-11-27 EP EP90480190A patent/EP0446550B1/de not_active Expired - Lifetime
- 1990-11-27 DE DE69026928T patent/DE69026928T2/de not_active Expired - Fee Related
-
1992
- 1992-03-05 US US07/846,320 patent/US5381421A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69026928T2 (de) | 1996-11-21 |
US5127011A (en) | 1992-06-30 |
JPH03221882A (ja) | 1991-09-30 |
EP0446550A2 (de) | 1991-09-18 |
EP0446550A3 (en) | 1992-08-05 |
US5381421A (en) | 1995-01-10 |
EP0446550B1 (de) | 1996-05-08 |
JP2650203B2 (ja) | 1997-09-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |