DE60309931D1 - Verbindung mehrerer testzugriffsportsteuerungsvorrichtungen durch ein einzeltestzugriffsport - Google Patents

Verbindung mehrerer testzugriffsportsteuerungsvorrichtungen durch ein einzeltestzugriffsport

Info

Publication number
DE60309931D1
DE60309931D1 DE60309931T DE60309931T DE60309931D1 DE 60309931 D1 DE60309931 D1 DE 60309931D1 DE 60309931 T DE60309931 T DE 60309931T DE 60309931 T DE60309931 T DE 60309931T DE 60309931 D1 DE60309931 D1 DE 60309931D1
Authority
DE
Germany
Prior art keywords
tap
controllers
access port
multiple test
test access
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60309931T
Other languages
English (en)
Other versions
DE60309931T2 (de
Inventor
Otto Steinbusch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Application granted granted Critical
Publication of DE60309931D1 publication Critical patent/DE60309931D1/de
Publication of DE60309931T2 publication Critical patent/DE60309931T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G01R31/318563—Multiple simultaneous testing of subparts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Sink And Installation For Waste Water (AREA)
  • Fire-Detection Mechanisms (AREA)
  • Burglar Alarm Systems (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
DE60309931T 2002-12-20 2003-12-15 Verbindung mehrerer testzugriffsportsteuerungsvorrichtungen durch ein einzeltestzugriffsport Expired - Lifetime DE60309931T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US43539502P 2002-12-20 2002-12-20
US435395P 2002-12-20
PCT/IB2003/005950 WO2004057357A1 (en) 2002-12-20 2003-12-15 Connecting multiple test access port controllers through a single test access port

Publications (2)

Publication Number Publication Date
DE60309931D1 true DE60309931D1 (de) 2007-01-04
DE60309931T2 DE60309931T2 (de) 2007-09-13

Family

ID=32682232

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60309931T Expired - Lifetime DE60309931T2 (de) 2002-12-20 2003-12-15 Verbindung mehrerer testzugriffsportsteuerungsvorrichtungen durch ein einzeltestzugriffsport

Country Status (10)

Country Link
US (1) US7426670B2 (de)
EP (1) EP1579229B1 (de)
JP (1) JP2006510980A (de)
KR (1) KR20050084395A (de)
CN (1) CN100442074C (de)
AT (1) ATE346309T1 (de)
AU (1) AU2003288584A1 (de)
DE (1) DE60309931T2 (de)
TW (1) TWI298099B (de)
WO (1) WO2004057357A1 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7417450B2 (en) 2005-12-02 2008-08-26 Texas Instruments Incorporated Testing combinational logic die with bidirectional TDI-TMS/TDO chanel circuit
US7346821B2 (en) 2003-08-28 2008-03-18 Texas Instrument Incorporated IC with JTAG port, linking module, and off-chip TAP interface
GB0526448D0 (en) * 2005-12-23 2006-02-08 Advanced Risc Mach Ltd Diagnostic mode switching
KR100809259B1 (ko) * 2006-10-04 2008-03-03 삼성전기주식회사 통신모듈 인터페이스 장치
JP2008310792A (ja) * 2007-05-11 2008-12-25 Nec Electronics Corp テスト回路
JP5022110B2 (ja) * 2007-06-05 2012-09-12 ルネサスエレクトロニクス株式会社 半導体集積回路
US8037355B2 (en) * 2007-06-07 2011-10-11 Texas Instruments Incorporated Powering up adapter and scan test logic TAP controllers
US8046650B2 (en) * 2008-03-14 2011-10-25 Texas Instruments Incorporated TAP with control circuitry connected to device address port
US7783819B2 (en) 2008-03-31 2010-08-24 Intel Corporation Integrating non-peripheral component interconnect (PCI) resources into a personal computer system
EP2331979B1 (de) * 2008-09-26 2012-07-04 Nxp B.V. Verfahren zur prüfung einer teilweise zusammengebauten mehrchipanordnung, integrierter schaltungschip und mehrchipanordnung
US8694844B2 (en) 2010-07-29 2014-04-08 Texas Instruments Incorporated AT speed TAP with dual port router and command circuit
US9015542B2 (en) * 2011-10-01 2015-04-21 Intel Corporation Packetizing JTAG across industry standard interfaces
US9323633B2 (en) * 2013-03-28 2016-04-26 Stmicroelectronics, Inc. Dual master JTAG method, circuit, and system
KR101725755B1 (ko) * 2013-06-28 2017-04-11 인텔 코포레이션 적응형 라우팅을 이용하여 자원 활용도를 제어하기 위한 메커니즘
US20150046763A1 (en) * 2013-08-12 2015-02-12 Apple Inc. Apparatus and Method for Controlling Internal Test Controllers
US9810739B2 (en) 2015-10-27 2017-11-07 Andes Technology Corporation Electronic system, system diagnostic circuit and operation method thereof
KR102474620B1 (ko) * 2016-01-25 2022-12-05 삼성전자주식회사 반도체 장치, 반도체 시스템 및 반도체 장치의 동작 방법
CN108226740B (zh) * 2016-12-09 2020-06-02 英业达科技有限公司 提供扩充联合测试工作组接口的扩充电路板
US10386411B2 (en) * 2017-08-23 2019-08-20 Stmicroelectronics International N.V. Sequential test access port selection in a JTAG interface
CN108829547B (zh) * 2018-05-15 2021-11-16 中国船舶重工集团公司第七一九研究所 一种海洋平台的计算机控制器及其实现方法
US10571518B1 (en) * 2018-09-26 2020-02-25 Nxp B.V. Limited pin test interface with analog test bus
CN109406902B (zh) * 2018-11-28 2021-03-19 中科曙光信息产业成都有限公司 逻辑扫描老化测试***
CN113627106B (zh) * 2021-08-04 2022-02-15 北京华大九天科技股份有限公司 多比特寄存器的仿真方法、装置和电子设备
CN116774018B (zh) * 2023-08-22 2023-11-28 北京芯驰半导体科技有限公司 一种芯片测试方法、装置及电子设备
CN117741411A (zh) * 2024-02-19 2024-03-22 西安简矽技术有限公司 一种芯片的调校***和方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5132635A (en) * 1991-03-05 1992-07-21 Ast Research, Inc. Serial testing of removable circuit boards on a backplane bus
US5627842A (en) * 1993-01-21 1997-05-06 Digital Equipment Corporation Architecture for system-wide standardized intra-module and inter-module fault testing
FI100136B (fi) * 1993-10-01 1997-09-30 Nokia Telecommunications Oy Menetelmä integroidun piirin testaamiseksi sekä integroitu piiri
US6804725B1 (en) * 1996-08-30 2004-10-12 Texas Instruments Incorporated IC with state machine controlled linking module
DE69734379T2 (de) * 1996-08-30 2006-07-06 Texas Instruments Inc., Dallas Vorrichtung zur Prüfung von integrierten Schaltungen
US6032279A (en) * 1997-11-07 2000-02-29 Atmel Corporation Boundary scan system with address dependent instructions
US6385749B1 (en) * 1999-04-01 2002-05-07 Koninklijke Philips Electronics N.V. (Kpenv) Method and arrangement for controlling multiple test access port control modules
US6311302B1 (en) * 1999-04-01 2001-10-30 Philips Semiconductor, Inc. Method and arrangement for hierarchical control of multiple test access port control modules
JP2004500712A (ja) * 2000-01-18 2004-01-08 ケイデンス・デザイン・システムズ・インコーポレーテッド 多数の回路ブロックを有するチップ用階層試験回路構造
US6961884B1 (en) * 2000-06-12 2005-11-01 Altera Corporation JTAG mirroring circuitry and methods
US6829730B2 (en) * 2001-04-27 2004-12-07 Logicvision, Inc. Method of designing circuit having multiple test access ports, circuit produced thereby and method of using same
US6968408B2 (en) * 2002-08-08 2005-11-22 Texas Instruments Incorporated Linking addressable shadow port and protocol for serial bus networks

Also Published As

Publication number Publication date
EP1579229B1 (de) 2006-11-22
KR20050084395A (ko) 2005-08-26
TWI298099B (en) 2008-06-21
EP1579229A1 (de) 2005-09-28
ATE346309T1 (de) 2006-12-15
CN1729401A (zh) 2006-02-01
AU2003288584A1 (en) 2004-07-14
US7426670B2 (en) 2008-09-16
DE60309931T2 (de) 2007-09-13
WO2004057357A1 (en) 2004-07-08
JP2006510980A (ja) 2006-03-30
US20060090110A1 (en) 2006-04-27
CN100442074C (zh) 2008-12-10
TW200500620A (en) 2005-01-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NXP B.V., EINDHOVEN, NL

8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN