DE602006010941D1 - Laserbasiertes Wartungsgerät - Google Patents

Laserbasiertes Wartungsgerät

Info

Publication number
DE602006010941D1
DE602006010941D1 DE602006010941T DE602006010941T DE602006010941D1 DE 602006010941 D1 DE602006010941 D1 DE 602006010941D1 DE 602006010941 T DE602006010941 T DE 602006010941T DE 602006010941 T DE602006010941 T DE 602006010941T DE 602006010941 D1 DE602006010941 D1 DE 602006010941D1
Authority
DE
Germany
Prior art keywords
laser
maintenance device
based maintenance
maintenance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006010941T
Other languages
English (en)
Inventor
Makoto Ochiai
Yoshiaki Ono
Takahiro Miura
Mitsuaki Shimamura
Masaki Yoda
Hidehiko Kuroda
Itaru Chida
Fukashi Osakata
Satoshi Yamamoto
Kentaro Tsuchihashi
Ryoichi Saeki
Masahiro Yoshida
Tetsuo Aikawa
Satoshi Okada
Toru Onodera
Akira Tsuyuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2005228801A external-priority patent/JP4664770B2/ja
Priority claimed from JP2005199472A external-priority patent/JP4649280B2/ja
Priority claimed from JP2005199466A external-priority patent/JP4673686B2/ja
Priority claimed from JP2005199469A external-priority patent/JP4746365B2/ja
Priority claimed from JP2005199467A external-priority patent/JP4643379B2/ja
Priority claimed from JP2005199465A external-priority patent/JP4728714B2/ja
Priority claimed from JP2006052255A external-priority patent/JP2007232462A/ja
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE602006010941D1 publication Critical patent/DE602006010941D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21C—NUCLEAR REACTORS
    • G21C17/00—Monitoring; Testing ; Maintaining
    • G21C17/017—Inspection or maintenance of pipe-lines or tubes in nuclear installations
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F22—STEAM GENERATION
    • F22B—METHODS OF STEAM GENERATION; STEAM BOILERS
    • F22B37/00—Component parts or details of steam boilers
    • F22B37/002—Component parts or details of steam boilers specially adapted for nuclear steam generators, e.g. maintenance, repairing or inspecting equipment not otherwise provided for
    • F22B37/003—Maintenance, repairing or inspecting equipment positioned in or via the headers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/043—Analysing solids in the interior, e.g. by shear waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0645—Display representation or displayed parameters, e.g. A-, B- or C-Scan
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/07—Analysing solids by measuring propagation velocity or propagation time of acoustic waves
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21C—NUCLEAR REACTORS
    • G21C17/00—Monitoring; Testing ; Maintaining
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21C—NUCLEAR REACTORS
    • G21C17/00—Monitoring; Testing ; Maintaining
    • G21C17/003—Remote inspection of vessels, e.g. pressure vessels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/25—Fabry-Perot in interferometer, e.g. etalon, cavity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0258—Structural degradation, e.g. fatigue of composites, ageing of oils
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0421—Longitudinal waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/263—Surfaces
    • G01N2291/2636—Surfaces cylindrical from inside
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00—Energy generation of nuclear origin
    • Y02E30/30—Nuclear fission reactors

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Acoustics & Sound (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Thermal Sciences (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Laser Surgery Devices (AREA)
DE602006010941T 2005-07-07 2006-07-06 Laserbasiertes Wartungsgerät Active DE602006010941D1 (de)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
JP2005228801A JP4664770B2 (ja) 2005-07-07 2005-07-07 レーザ保全装置
JP2005199472A JP4649280B2 (ja) 2005-07-07 2005-07-07 レーザ超音波受信装置およびレーザ超音波受信方法
JP2005199466A JP4673686B2 (ja) 2005-07-07 2005-07-07 表面検査方法およびその表面検査装置
JP2005199469A JP4746365B2 (ja) 2005-07-07 2005-07-07 表面検査方法
JP2005199467A JP4643379B2 (ja) 2005-07-07 2005-07-07 レーザ照射装置
JP2005199465A JP4728714B2 (ja) 2005-07-07 2005-07-07 レーザ超音波検査装置およびこれを備えたシステム
JP2006052255A JP2007232462A (ja) 2006-02-28 2006-02-28 超音波検査装置及び超音波検査方法

Publications (1)

Publication Number Publication Date
DE602006010941D1 true DE602006010941D1 (de) 2010-01-21

Family

ID=37156044

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006010941T Active DE602006010941D1 (de) 2005-07-07 2006-07-06 Laserbasiertes Wartungsgerät

Country Status (4)

Country Link
US (5) US7728967B2 (de)
EP (7) EP2148197B1 (de)
KR (6) KR100830107B1 (de)
DE (1) DE602006010941D1 (de)

Families Citing this family (118)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7361171B2 (en) 2003-05-20 2008-04-22 Raydiance, Inc. Man-portable optical ablation system
US9022037B2 (en) 2003-08-11 2015-05-05 Raydiance, Inc. Laser ablation method and apparatus having a feedback loop and control unit
US8135050B1 (en) 2005-07-19 2012-03-13 Raydiance, Inc. Automated polarization correction
US20070073610A1 (en) * 2005-09-07 2007-03-29 Prasad Marugabandhu Job auction method and system
US7444049B1 (en) 2006-01-23 2008-10-28 Raydiance, Inc. Pulse stretcher and compressor including a multi-pass Bragg grating
US9130344B2 (en) 2006-01-23 2015-09-08 Raydiance, Inc. Automated laser tuning
US8232687B2 (en) * 2006-04-26 2012-07-31 Raydiance, Inc. Intelligent laser interlock system
US7822347B1 (en) 2006-03-28 2010-10-26 Raydiance, Inc. Active tuning of temporal dispersion in an ultrashort pulse laser system
US7612894B2 (en) 2006-07-18 2009-11-03 Lockheed Martin Corporation Fiber laser for ultrasonic testing
US7583418B2 (en) * 2006-09-26 2009-09-01 Xerox Corporation Array based sensor to measure single separation or mixed color (or IOI) patches on the photoreceptor using MEMS based hyperspectral imaging technology
US7623278B2 (en) * 2006-09-26 2009-11-24 Xerox Corporation MEMS Fabry-Perot inline color scanner for printing applications using stationary membranes
US8554356B2 (en) * 2006-10-06 2013-10-08 Ebara Corporation Processing end point detection method, polishing method, and polishing apparatus
US20080201089A1 (en) * 2007-01-11 2008-08-21 Ensco, Inc. System and method for determining neutral temperature of a metal
JP2008216012A (ja) * 2007-03-02 2008-09-18 Toshiba Corp 原子炉内構造物の保全・補修装置
JP5027606B2 (ja) * 2007-09-26 2012-09-19 株式会社キーエンス レーザ加工装置、加工データ生成方法及びコンピュータプログラム
US8824731B2 (en) * 2007-10-31 2014-09-02 The Boeing Comapny Image processing of apparatus condition
US7903326B2 (en) 2007-11-30 2011-03-08 Radiance, Inc. Static phase mask for high-order spectral phase control in a hybrid chirped pulse amplifier system
KR101051601B1 (ko) * 2008-06-18 2011-07-22 삼성메디슨 주식회사 충격 패턴 인식 초음파 장치 및 방법
US8498538B2 (en) 2008-11-14 2013-07-30 Raydiance, Inc. Compact monolithic dispersion compensator
EP2472525B1 (de) 2009-08-25 2016-06-01 Kabushiki Kaisha Toshiba Laserbestrahlungsvorrichtung
KR101110741B1 (ko) * 2009-10-21 2012-02-24 한국표준과학연구원 원자로 결함 검출시스템 및 그 방법
JP5249975B2 (ja) * 2010-02-26 2013-07-31 三菱重工業株式会社 レーザ超音波探傷装置
US9217731B2 (en) 2010-05-21 2015-12-22 Kabushiki Kaisha Toshiba Welding inspection method and apparatus thereof
US20110284508A1 (en) * 2010-05-21 2011-11-24 Kabushiki Kaisha Toshiba Welding system and welding method
JP2012047607A (ja) * 2010-08-27 2012-03-08 Hitachi Ltd 内部欠陥検査方法及びその装置
US9114482B2 (en) 2010-09-16 2015-08-25 Raydiance, Inc. Laser based processing of layered materials
US20120140082A1 (en) * 2010-12-07 2012-06-07 National Institute of Biology System and method of submerged organism detection by rotational laser light
US9557303B2 (en) 2010-12-10 2017-01-31 Ihi Southwest Technologies, Inc. Visualization of tests on swing type check valves using phased array sequence scanning
US8453508B2 (en) 2010-12-10 2013-06-04 Ihi Southwest Technologies, Inc. Testing of swing type check valves using phased array sequence scanning
US10352477B2 (en) 2010-12-10 2019-07-16 Ihi Southwest Technologies, Inc. Visualization of tests on globe-type valves using phased array sequence scanning
US9952182B2 (en) 2010-12-10 2018-04-24 Ihi Southwest Technologies Visualization of tests on lift-type check valves using phased array sequence scanning
JP2012132791A (ja) * 2010-12-22 2012-07-12 Hitachi High-Technologies Corp 欠陥検査方法および欠陥検査装置
EP2479586B1 (de) * 2011-01-19 2014-03-19 Sick AG Verfahren zur Abschätzung eines Verunreinigungsgrads einer Frontscheibe einer optischen Erfassungsvorrichtung und optische Erfassungsvorrichtung
FR2974437B1 (fr) * 2011-04-21 2013-10-25 Eads Europ Aeronautic Defence Procede de simulation d'operations de controle non-destructif en conditions reelles utilisant des signaux synthetiques
US8675202B2 (en) 2011-05-06 2014-03-18 Harris Corporation Interferometric sensing apparatus including adjustable reference arm and associated methods
US8675203B2 (en) 2011-05-06 2014-03-18 Harris Corporation Interferometric biological sensing apparatus including adjustable reference arm and associated methods
US8665451B2 (en) 2011-05-06 2014-03-04 Harris Corporation Interferometric biometric sensing apparatus including adjustable coupling and associated methods
US8649022B2 (en) 2011-05-06 2014-02-11 Harris Corporation Interferometric material sensing apparatus including adjustable coupling and associated methods
US8649021B2 (en) 2011-05-06 2014-02-11 Harris Corporation Interferometric sensing apparatus including adjustable coupling and associated methods
US8675204B2 (en) 2011-05-06 2014-03-18 Harris Corporation Interferometric material sensing apparatus including adjustable reference arm and associated methods
US10846572B2 (en) * 2011-07-05 2020-11-24 Bernard Fryshman Induction system for product authentication
CN102411030A (zh) * 2011-07-29 2012-04-11 北京工业大学 非常规材料小尺寸试件弹性常数超声无损检测装置
US10239160B2 (en) 2011-09-21 2019-03-26 Coherent, Inc. Systems and processes that singulate materials
US20130088707A1 (en) * 2011-10-05 2013-04-11 Behzad Imani Method and system for crack detection
US10319484B1 (en) 2011-11-17 2019-06-11 Nuscale Power, Llc Method for imaging a nuclear reactor
CN102506777A (zh) * 2011-11-28 2012-06-20 成都飞机工业（集团）有限责任公司 一种超声波检测工装
US9255909B2 (en) * 2012-03-26 2016-02-09 The Boeing Company Surface visualization system for indicating inconsistencies
WO2013165569A1 (en) * 2012-05-03 2013-11-07 Los Alamos National Security, Llc Acoustic camera
JP5888427B2 (ja) * 2012-10-03 2016-03-22 三菱電機株式会社 電磁波送信装置及び電磁波送信システム
KR101429601B1 (ko) * 2012-10-05 2014-08-14 두산중공업 주식회사 원자로의 레이저 피닝 장치
DE102013201975A1 (de) 2013-02-07 2014-08-07 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Verbesserung der SAFT-Analyse bei unregelmäßiger Messung
KR101444078B1 (ko) * 2013-03-04 2014-09-26 전북대학교산학협력단 원자로 상부헤드 제어봉 구동장치 관통관 비파괴 검사장치 및 방법
US9267878B2 (en) * 2013-03-06 2016-02-23 Canon Kabushiki Kaisha Acoustic signal receiving apparatus and photo-acoustic tomography
US9927404B2 (en) 2013-03-11 2018-03-27 United Technologies Corporation Phased array billet data evaluation software
US9372173B2 (en) * 2013-03-14 2016-06-21 Orbital Atk, Inc. Ultrasonic testing phased array inspection fixture and related methods
WO2014201045A2 (en) * 2013-06-10 2014-12-18 Iphoton Solutions, Llc Laser ultrsound material testing
JP6223014B2 (ja) * 2013-06-26 2017-11-01 キヤノン株式会社 被検体情報取得装置
US9558547B2 (en) 2014-01-09 2017-01-31 The Boeing Company System and method for determining whether an apparatus or an assembly process is acceptable
JP2015172493A (ja) * 2014-03-11 2015-10-01 株式会社東芝 距離測定装置
US10444202B2 (en) 2014-04-16 2019-10-15 Triad National Security, Llc Nondestructive inspection using continuous ultrasonic wave generation
GB2540071B (en) * 2014-06-16 2020-12-16 Halliburton Energy Services Inc Distributed nondestructive structural defects detection in slickline cables
KR101648508B1 (ko) * 2014-10-23 2016-08-17 주식회사 이레테크 스캐닝 시스템 및 스캐닝 결과 처리 방법
EP3588698B1 (de) 2015-01-09 2023-09-06 LSP Technologies, Inc. Verfahren und vorrichtung zur verwendung in laserschockstrahlungsprozessen
US11858065B2 (en) 2015-01-09 2024-01-02 Lsp Technologies, Inc. Method and system for use in laser shock peening and laser bond inspection process
CN104759753B (zh) * 2015-03-30 2016-08-31 江苏大学 多***自动化协调工作提高激光诱导空化强化的方法
JP2018513976A (ja) * 2015-04-07 2018-05-31 エジソン・ウェルディング・インスティチュート，インコーポレーテッド レーザー溶接部の検査用のフェーズドアレイシステム
CN105203630B (zh) * 2015-09-29 2017-10-20 中车南京浦镇车辆有限公司 一种铝合金、碳钢薄板焊缝手动扫查器
US10073060B2 (en) 2015-11-19 2018-09-11 General Electric Company Non-contact acoustic inspection method for additive manufacturing processes
US9989495B2 (en) 2015-11-19 2018-06-05 General Electric Company Acoustic monitoring method for additive manufacturing processes
US10571390B2 (en) * 2015-12-21 2020-02-25 The Boeing Company Composite inspection
US10557833B2 (en) * 2015-12-31 2020-02-11 VeriPhase, Inc. Method for prioritizing data processing of a plurality of ultrasonic scan data files
US10324066B1 (en) * 2015-12-31 2019-06-18 VeriPhase, Inc. System and method for the improved analysis of ultrasonic weld data
WO2017149658A1 (ja) 2016-03-01 2017-09-08 三菱電機株式会社 超音波測定装置及び超音波測定方法
JP6758914B2 (ja) * 2016-05-24 2020-09-23 株式会社東芝 レーザーピーニング装置およびレーザーピーニング方法
JP6451695B2 (ja) 2016-06-02 2019-01-16 株式会社島津製作所 欠陥検査方法及び欠陥検査装置
KR101934704B1 (ko) 2016-07-21 2019-01-03 연세대학교 산학협력단 최적화된 콘크리트 균열깊이 측정용 초음파 장치
CN106350817B (zh) * 2016-11-11 2019-05-28 青岛理工大学 一种超声振动辅助激光熔覆制备无裂纹熔覆层的方法和装置
US10794836B1 (en) 2016-12-27 2020-10-06 Triad National Security, Llc System and method for in-process inspection within advanced manufacturing processes
CN108375581B (zh) * 2017-01-04 2020-08-04 中国航空制造技术研究院 基于声光信号监测的双光束激光焊接过程缺陷控制方法
US10060861B2 (en) * 2017-01-10 2018-08-28 Sunspring America, Inc. Technologies for identifying defects
US11380452B2 (en) * 2017-03-07 2022-07-05 Ge-Hitachi Nuclear Energy Americas Llc Systems and methods for position verification for inspection and repairs
JP6805930B2 (ja) 2017-03-29 2020-12-23 株式会社島津製作所 振動測定装置
KR101971229B1 (ko) * 2017-04-17 2019-04-22 한국원자력연구원 고 방사능 환경에서의 무 반점 및 고정밀도 형상 영상정보 계측 시스템
JP6791029B2 (ja) * 2017-06-12 2020-11-25 株式会社島津製作所 欠陥検出方法及び欠陥検出装置
US10811151B2 (en) * 2017-07-05 2020-10-20 Electric Power Research Institute, Inc. Apparatus and method for identifying cracks in a structure using a multi-stage classifier
JP6872450B2 (ja) * 2017-07-25 2021-05-19 株式会社日立製作所 レーザ変位計と、それを用いたレーザ超音波検査装置
US10613558B2 (en) * 2017-09-13 2020-04-07 Heatcraft Refrigeration Products Llc Malfunction lighting
CN109975421B (zh) * 2017-12-27 2024-02-09 核动力运行研究所 一种用于管道内壁超声检查的两侧探头同步张开结构
JP7058122B2 (ja) * 2017-12-28 2022-04-21 株式会社日立製作所 光走査装置及び映像装置
JP6852008B2 (ja) * 2018-03-19 2021-03-31 株式会社東芝 光学検査装置、半導体素子及び光学検査方法
WO2019189429A1 (ja) * 2018-03-27 2019-10-03 国立研究開発法人量子科学技術研究開発機構 計測装置、計測システム、移動体、および計測方法
US11287507B2 (en) * 2018-04-30 2022-03-29 The Boeing Company System and method for testing a structure using laser ultrasound
CN109031256B (zh) * 2018-07-03 2022-08-05 交通运输部天津水运工程科学研究所 多波束测深仪测深与扫宽性能校准方法
US11189982B2 (en) 2018-08-13 2021-11-30 The Boeing Company Pulse stretching technique for laser bond inspection, laser ultrasonic inspection, and laser peening
US11009485B2 (en) 2018-09-12 2021-05-18 Framatome Inc. Method of identifying and removing surface irregularities before ultrasonic inspection and device for identifying surface irregularities
US11644443B2 (en) * 2018-12-17 2023-05-09 The Boeing Company Laser ultrasound imaging
CN111347157B (zh) * 2018-12-21 2023-04-28 松下知识产权经营株式会社 激光焊接装置以及激光焊接方法
DE102018010192A1 (de) * 2018-12-22 2020-06-25 Hochschule Mittweida (Fh) Einrichtung und Verfahren zur berührungslosen Bestimmung des Zustandes der Asphaltbefestigung von Fahrbahnen
US11609149B2 (en) * 2019-01-28 2023-03-21 Nec Corporation State estimation apparatus, state estimation method, and computer-readable recording medium
KR102011962B1 (ko) * 2019-02-21 2019-08-19 엘아이지넥스원 주식회사 탐지성능 분석장치 및 방법
CN109828029B (zh) * 2019-03-28 2021-08-27 烟台中凯检测科技有限公司 一种基于原始数据的超声相控阵检测***和方法
CN110672718B (zh) * 2019-07-08 2022-05-24 南昌航空大学 用于钢轨踏面检测的电磁超声点聚焦/发散表面波方法及其装置
CN110568607B (zh) * 2019-08-02 2021-05-11 南京航空航天大学 一种压电驱动的一体式光阑
KR102241879B1 (ko) * 2019-12-03 2021-04-20 한국건설기술연구원 인공지능 학습 모델을 이용한 덕트 공동 탐지 모델 학습 장치 및 덕트 공동 탐지 시스템
TWI722716B (zh) * 2019-12-13 2021-03-21 南臺學校財團法人南臺科技大學 光罩之保護膜的全域動態檢測方法及全域動態檢測系統
CN111102923B (zh) * 2019-12-31 2021-08-17 核动力运行研究所 一种反应堆压力容器顶盖贯穿件定位方法
CN111366111B (zh) * 2020-03-30 2021-12-03 电子科技大学 一种利用三个lgs声表面波谐振器组成的应变传感器及测试方法
CA3105805C (en) * 2020-04-30 2024-01-16 TecScan Systems Inc. Time-corrected gain method implemented in an ultrasonic scanner
RU198709U1 (ru) * 2020-05-12 2020-07-23 Общество с ограниченной ответственностью "Газпром трансгаз Уфа" Устройство для измерения глубины поверхностных дефектов
CN111678467A (zh) * 2020-05-29 2020-09-18 浙江省工程勘察设计院集团有限公司 一种跨孔超声波法探测地下管道埋深的方法
CN111735774B (zh) * 2020-07-14 2021-11-19 西安交通大学 基于激光超声表面波时距曲线的裂纹缺陷尺寸定量方法
CN112378430B (zh) * 2020-10-29 2022-04-22 太原理工大学 基于混沌激光的分布式光纤拉曼传感装置和方法
US11639914B2 (en) 2020-12-16 2023-05-02 The Boeing Company Non-destructive test systems with infrared thermography assemblies and ultrasonic test assemblies, and associated methods
KR102398609B1 (ko) * 2021-06-14 2022-05-13 한국수력원자력 주식회사 배플 포머 볼트의 초음파 검사 장치 및 방법
CN114111592B (zh) * 2021-11-22 2022-08-09 深圳市勘察测绘院(集团)有限公司 用于锚杆拉拔试验的锚头位移测量装置
CN114858755B (zh) * 2022-07-05 2022-10-21 中国航发四川燃气涡轮研究院 一种航空发动机涂层变频原位激光检测***
CN116182919B (zh) * 2023-04-23 2023-09-12 西北工业大学 基于光纤f-p腔的三轴高温振动传感器及其制备方法
CN116593400B (zh) * 2023-07-17 2023-10-17 国家电投集团江西电力有限公司 一种太阳能板黑斑损伤检测方法及***

Family Cites Families (86)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS595861B2 (ja) * 1977-10-12 1984-02-07 株式会社日立製作所 管内插型探傷子用導線駆動装置
US4229796A (en) * 1979-02-15 1980-10-21 Westinghouse Electric Corp. Programmed controller for ultrasonic testing
US4428237A (en) * 1980-11-13 1984-01-31 Electric Power Research Institute, Inc. System and method for measuring ultrasonic return signals
DE3217947C2 (de) * 1982-05-13 1984-05-03 Krautkrämer GmbH, 5000 Köln Verfahren und Vorrichtung zur Bestimmung der Risstiefe von Oberflächenrissen
NL8302988A (nl) * 1983-08-26 1985-03-18 Dow Chemical Nederland Werkwijze en inrichting voor het niet-destructief keuren van vaste lichamen.
US4567747A (en) * 1984-01-16 1986-02-04 Trw Inc. Self-calibration system for ultrasonic inspection apparatus
DE3426182A1 (de) * 1984-07-16 1986-01-23 Horst-Artur Prof. Dr.-Ing. 5860 Iserlohn Crostack Verfahren und vorrichtung zur bestimmung von risstiefen mittels ultraschalles
JPS61122562A (ja) * 1984-11-20 1986-06-10 Mitsubishi Heavy Ind Ltd 亀裂深さの測定方法
CA1224935A (en) * 1984-11-28 1987-08-04 Her Majesty The Queen, In Right Of Canada, As Represented By The Ministe R Of The National Research Council And The Minister Of Energy, Mines And Resources Optical interferometric reception of ultrasonic energy
DE3504210A1 (de) 1985-02-07 1986-08-07 Kraftwerk Union AG, 4330 Mülheim Einrichtung zum bestimmen von oberflaechenrissen
US4696062A (en) * 1985-07-12 1987-09-22 Labudde Edward V Fiber optic switching system and method
JPS6222059A (ja) * 1985-07-22 1987-01-30 Mitsubishi Heavy Ind Ltd 円周溶接部の超音波探傷装置
US4724298A (en) * 1986-01-23 1988-02-09 Westinghouse Electric Corp. Laser beam alignment and transport system
JPH0631816B2 (ja) * 1986-10-03 1994-04-27 株式会社日立製作所 原子力プラントにおける冷却水中への放射性物質の溶出抑制方法及びその装置
EP0300458B1 (de) * 1987-07-21 1991-12-18 Mitsubishi Jukogyo Kabushiki Kaisha Laserstrahlschweissverfahren für eine Innenumfangsfläche eines Rohres
JPH01209358A (ja) * 1988-02-17 1989-08-23 Toa Nenryo Kogyo Kk 複合材料及び繊維状物質の物性値測定装置
US4928527A (en) * 1988-04-29 1990-05-29 At&T Bell Laboratories Method and device for nondestructive evaluation
CA1287388C (en) * 1988-04-29 1991-08-06 Jean-Pierre Monchalin Broadband optical detection of transient motion from a scattering surface
JPH02236159A (ja) * 1988-08-24 1990-09-19 Hitachi Constr Mach Co Ltd 超音波探傷器の波形表示装置
JPH03169494A (ja) * 1989-11-28 1991-07-23 Toshiba Corp 部材の溶接補修方法および部材の溶接補修装置
CA2007190C (en) * 1990-01-04 1998-11-24 National Research Council Of Canada Laser optical ultrasound detection
JP2590283B2 (ja) 1990-02-22 1997-03-12 沖電気工業株式会社 被覆層形成方法
JP2588050B2 (ja) * 1990-06-29 1997-03-05 日立建機株式会社 超音波映像検査装置
US5085082A (en) * 1990-10-24 1992-02-04 The Babcock & Wilcox Company Apparatus and method of discriminating flaw depths in the inspection of tubular products
JPH04348275A (ja) * 1990-11-14 1992-12-03 Nkk Corp 超音波探傷方法
FR2677567A1 (fr) * 1991-06-13 1992-12-18 Framatome Sa Procede et dispositif de controle du fonctionnement d'une chaine optique, pour faisceau laser, portee par un outil de soudage.
JPH056863U (ja) * 1991-07-08 1993-01-29 日新電機株式会社 エキシマレーザ装置
US5287291A (en) * 1991-09-03 1994-02-15 Krautkramer-Branson, Incorporated Quiet bus for the busing of analog and digital data
FR2683473B1 (fr) * 1991-11-13 1994-03-04 Framatome Dispositif de travail au laser a l'interieur d'un element tubulaire.
CA2123493C (en) * 1991-11-22 1999-09-21 Kazuteru Naruo Laser ultrasonic flaw detection apparatus
US5977513A (en) * 1993-02-17 1999-11-02 Electric Power Research Institute, Inc. Apparatus and method for centering a laser welding probe within a tube using gas pressure
US5653897A (en) * 1993-02-17 1997-08-05 Electric Power Research Institute Rotating fiber optic coupler for high power laser welding applications
DE4305064C1 (de) * 1993-02-19 1994-05-19 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur gleichzeitigen zerstörungsfreien Charakterisierung mehrerer Kennwerte oberflächenmodifizierter Werkstoffe
JPH06265372A (ja) 1993-03-12 1994-09-20 Nikki Plantec Kk 検査データの収録装置
JP2978370B2 (ja) * 1993-07-07 1999-11-15 株式会社日立製作所 電子走査式超音波探傷方法及びその装置
JP2590283Y2 (ja) 1993-07-13 1999-02-10 三菱重工業株式会社 炉内計装筒の非破壊検査装置
JPH0829579A (ja) * 1994-07-13 1996-02-02 Toshiba Corp 原子炉内点検・補修方法および装置
US5604592A (en) * 1994-09-19 1997-02-18 Textron Defense Systems, Division Of Avco Corporation Laser ultrasonics-based material analysis system and method using matched filter processing
DE69612411T2 (de) * 1995-01-31 2001-12-06 Toshiba Kawasaki Kk Unterwasserbehandlungsverfahren und -system
US5585921A (en) * 1995-03-15 1996-12-17 Hughes Aircraft Company Laser-ultrasonic non-destructive, non-contacting inspection system
JPH09292376A (ja) 1996-04-25 1997-11-11 Kyushu Electric Power Co Inc 携帯用超音波検査装置
US6769307B1 (en) * 1997-11-21 2004-08-03 Perceptron, Inc. Method and system for processing measurement signals to obtain a value for a physical parameter
JPH10213573A (ja) 1997-01-28 1998-08-11 Nkk Corp 表層傷の推定法
US6041020A (en) * 1997-04-21 2000-03-21 University Of Delaware Gas-coupled laser acoustic detection
JPH1194806A (ja) * 1997-09-22 1999-04-09 Nkk Corp 鋼材端部表面又は側面の超音波探傷方法
US6359446B1 (en) * 1997-09-25 2002-03-19 Jack R. Little, Jr. Apparatus and method for nondestructive testing of dielectric materials
JPH11142375A (ja) 1997-11-10 1999-05-28 Ishikawajima Harima Heavy Ind Co Ltd 突合せ溶接継手の微小欠陥検出方法
US6320705B1 (en) * 1998-01-15 2001-11-20 George Dube' Adjustable optical wedge
US7123364B2 (en) * 1998-02-25 2006-10-17 Battelle Energy Alliance, Llc Acoustic imaging microscope
US6057927A (en) * 1998-02-25 2000-05-02 American Iron And Steel Institute Laser-ultrasound spectroscopy apparatus and method with detection of shear resonances for measuring anisotropy, thickness, and other properties
US6008887A (en) * 1998-03-20 1999-12-28 Lasson Technologies, Inc. Single beam laser surface velocity and displacement measurement apparatus
JP3406511B2 (ja) 1998-04-09 2003-05-12 三菱電機株式会社 異常箇所検出装置
JPH11326580A (ja) * 1998-05-15 1999-11-26 Toshiba Corp シュラウド自動検査装置
US7561281B2 (en) * 1998-06-30 2009-07-14 Lockheed Martin Corporation System and method for controlling tube thickness
JP2000046987A (ja) * 1998-07-27 2000-02-18 Toshiba Corp 原子炉の炉心内配管部保全装置
JP3735650B2 (ja) 1998-12-10 2006-01-18 株式会社東芝 表面検査装置
JP2000241397A (ja) 1999-02-24 2000-09-08 Nkk Corp 表面欠陥検出方法および装置
US6078397A (en) * 1999-04-20 2000-06-20 National Research Council Method and apparatus for mapping the wall thickness of tubes during production
JP2001004599A (ja) 1999-06-17 2001-01-12 Nkk Corp 表面欠陥検出方法および探傷装置
JP3811936B2 (ja) 1999-06-17 2006-08-23 Ｊｆｅスチール株式会社 表面傷の検出方法及び表面傷探傷装置
JP2001012933A (ja) * 1999-06-29 2001-01-19 Central Giken:Kk 表面波による構造物のひび割れ深さ測定方法
JP2001255306A (ja) * 2000-03-09 2001-09-21 Natl Inst Of Advanced Industrial Science & Technology Meti レーザ超音波装置
DE60117964T2 (de) * 2000-03-31 2006-12-14 Kabushiki Kaisha Toshiba Einrichtung zum reparieren bzw.zur instandhaltung unter wasser
DE10018421A1 (de) * 2000-04-13 2001-10-25 Haas Laser Gmbh & Co Kg Diodenlasereinrichtung
JP4113654B2 (ja) * 2000-05-10 2008-07-09 株式会社東芝 レーザ超音波検査装置
US6833554B2 (en) * 2000-11-21 2004-12-21 Massachusetts Institute Of Technology Laser-induced defect detection system and method
KR100496827B1 (ko) * 2000-12-22 2005-06-22 주식회사 포스코 레이저 간섭법을 이용한 초음파 계측장치
JP2002257793A (ja) 2001-02-28 2002-09-11 Toshiba Corp レーザ超音波検査装置
JP2002296256A (ja) 2001-03-30 2002-10-09 Osaka Gas Co Ltd 検査判定システム
US7667851B2 (en) * 2001-07-24 2010-02-23 Lockheed Martin Corporation Method and apparatus for using a two-wave mixing ultrasonic detection in rapid scanning applications
KR20030017281A (ko) * 2001-09-21 2003-03-03 신구성 자동 못박음 장치
JP2003121423A (ja) * 2001-10-15 2003-04-23 Nippon Steel Corp レーザ超音波検査装置及びレーザ超音波検査方法
US6856918B2 (en) * 2001-11-26 2005-02-15 Lockheed Martin Corporation Method to characterize material using mathematical propagation models and ultrasonic signal
US7370532B2 (en) * 2002-01-11 2008-05-13 Lockheed Martin Corporation RF communications method and system for laser ultrasonic testing
US6891912B1 (en) * 2002-06-26 2005-05-10 Pinnacle West Capital Corporation Fuel assemblies in a reactor core and method of designing and arranging same
JP3745719B2 (ja) 2002-09-02 2006-02-15 京都パステック株式会社 微生物分析装置及び微生物分析方法
US6789427B2 (en) * 2002-09-16 2004-09-14 General Electric Company Phased array ultrasonic inspection method for industrial applications
DE10244554B4 (de) * 2002-09-25 2004-08-26 Sms Meer Gmbh Verfahren und Vorrichtung zur Messung der Wanddicke eines Rohres in einem Rohrwalzwerk
JP2004172230A (ja) * 2002-11-18 2004-06-17 Communication Research Laboratory 二つのレーザー媒体を用いたレーザー装置
JP4334290B2 (ja) 2003-07-24 2009-09-30 株式会社東芝 レーザー照射装置
JP4094503B2 (ja) * 2003-07-25 2008-06-04 株式会社東芝 レーザー超音波検査装置および検査方法
US7463364B2 (en) * 2003-07-31 2008-12-09 Ler Technologies, Inc. Electro-optic sensor
JP4317722B2 (ja) * 2003-08-28 2009-08-19 浜松ホトニクス株式会社 固体レーザ装置
RU2259598C1 (ru) * 2004-04-05 2005-08-27 Смолин Николай Михайлович Тренажер для обучения работе с молотком
JP2006014941A (ja) * 2004-07-01 2006-01-19 Shimizu Tekku:Kk 放射性微小球注入装置
WO2007082238A2 (en) * 2006-01-10 2007-07-19 Hard Hat Technology, Llc A functional polymer faced hammer for reduced vibration, noise, and improved ergonomics

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US20100199768A1 (en) 2010-08-12
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