DE60200050D1 - Schaltung zur Detektion von Störungen der Periodendauer in einem Taktsignal - Google Patents
Schaltung zur Detektion von Störungen der Periodendauer in einem TaktsignalInfo
- Publication number
- DE60200050D1 DE60200050D1 DE60200050T DE60200050T DE60200050D1 DE 60200050 D1 DE60200050 D1 DE 60200050D1 DE 60200050 T DE60200050 T DE 60200050T DE 60200050 T DE60200050 T DE 60200050T DE 60200050 D1 DE60200050 D1 DE 60200050D1
- Authority
- DE
- Germany
- Prior art keywords
- disturbances
- period
- detection
- circuit
- clock signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
- G06F1/14—Time supervision arrangements, e.g. real time clock
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/159—Applications of delay lines not covered by the preceding subgroups
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/19—Monitoring patterns of pulse trains
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Manipulation Of Pulses (AREA)
- Pulse Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001048354A JP2002251227A (ja) | 2001-02-23 | 2001-02-23 | クロック監視回路、データ処理装置、データ処理システム |
JP2001048354 | 2001-02-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60200050D1 true DE60200050D1 (de) | 2003-11-13 |
DE60200050T2 DE60200050T2 (de) | 2004-09-16 |
Family
ID=18909635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60200050T Expired - Fee Related DE60200050T2 (de) | 2001-02-23 | 2002-01-31 | Schaltung zur Detektion von Störungen der Periodendauer in einem Taktsignal |
Country Status (7)
Country | Link |
---|---|
US (1) | US6545508B2 (de) |
EP (1) | EP1237282B1 (de) |
JP (1) | JP2002251227A (de) |
KR (1) | KR20020069143A (de) |
DE (1) | DE60200050T2 (de) |
HK (1) | HK1047356A1 (de) |
SG (1) | SG96682A1 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3476448B2 (ja) * | 2001-12-12 | 2003-12-10 | 沖電気工業株式会社 | 信号同期回路 |
JP3848152B2 (ja) * | 2001-12-20 | 2006-11-22 | 株式会社東芝 | 多機能icカード |
FR2875311A1 (fr) * | 2004-09-14 | 2006-03-17 | St Microelectronics Sa | Procede de detection du positionnement relatif de deux signaux et dispositif correspondant |
US20060193417A1 (en) * | 2005-02-25 | 2006-08-31 | Tellabs Operations, Inc. | Systems and methods for switching between redundant clock signals |
US7622961B2 (en) * | 2005-09-23 | 2009-11-24 | Intel Corporation | Method and apparatus for late timing transition detection |
JP2007121114A (ja) * | 2005-10-28 | 2007-05-17 | Elpida Memory Inc | デューティ検知回路、これらを備えたdll回路及び半導体装置 |
DE102005060394B4 (de) * | 2005-12-16 | 2012-10-11 | Infineon Technologies Ag | Schaltungsanordnung und Verfahren zum Betreiben einer Schaltungsanordnung |
US7480838B1 (en) * | 2006-03-23 | 2009-01-20 | Intel Corporation | Method, system and apparatus for detecting and recovering from timing errors |
US7679404B2 (en) * | 2006-06-23 | 2010-03-16 | Intel Corporation | Missing clock pulse detector |
US7498848B2 (en) * | 2006-10-03 | 2009-03-03 | Freescale Semiconductor, Inc. | System and method for monitoring clock signal in an integrated circuit |
DE602008003051D1 (de) * | 2007-05-18 | 2010-12-02 | St Microelectronics Rousset | Erkennung einer Zustandsstörung eines bistabilen Kippschalters eines elektronischen Schaltkreises |
JP2009248502A (ja) * | 2008-04-09 | 2009-10-29 | Seiko Epson Corp | パルス信号生成装置、搬送装置、画像形成装置及びパルス生成方法 |
US7710161B1 (en) * | 2009-01-13 | 2010-05-04 | Atmel Corporation | Digital low frequency detector |
JP2013077921A (ja) * | 2011-09-29 | 2013-04-25 | Toshiba Corp | クロック診断回路 |
CN107872208B (zh) * | 2016-09-28 | 2020-04-03 | 深圳市中兴微电子技术有限公司 | 一种时钟信号丢失检测的装置 |
US11635465B2 (en) * | 2020-10-29 | 2023-04-25 | Stmicroelectronics International N.V. | Device and method for monitoring data and timing signals in integrated circuits |
CN114070767B (zh) * | 2021-11-15 | 2024-03-19 | 国网黑龙江省电力有限公司信息通信公司 | 一种信息通信设备的智能检修方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU817717A1 (ru) | 1979-05-07 | 1981-03-30 | Dzhagarov Yulius A | Устройство дл контрол после-дОВАТЕльНОСТи иМпульСОВ |
US4864574A (en) * | 1988-02-04 | 1989-09-05 | Rockwell International Corporation | Injection lock clock detection apparatus |
JPH0469720A (ja) * | 1990-07-10 | 1992-03-04 | Nec Corp | クロック異常検出装置 |
JPH04160918A (ja) * | 1990-10-25 | 1992-06-04 | Nec Commun Syst Ltd | クロック障害検出回路 |
JPH06101243A (ja) * | 1992-09-16 | 1994-04-12 | Tsutsunaka Plast Ind Co Ltd | 土留め擁壁における水抜き方法 |
JPH06218618A (ja) * | 1993-01-21 | 1994-08-09 | Mitsubishi Materials Corp | スローアウェイチップ |
US5463655A (en) * | 1993-02-17 | 1995-10-31 | National Semiconductor Corporation | Single-ended pulse gating circuit |
US5619155A (en) * | 1995-06-02 | 1997-04-08 | United Microelectronics Corporation | IC-chip operation inhibitor |
US5761446A (en) * | 1995-06-14 | 1998-06-02 | Unisys Corp | Livelock avoidance |
RU2105411C1 (ru) | 1995-08-16 | 1998-02-20 | Российский Федеральный Ядерный Центр - Всероссийский Научно-Исследовательский Институт Экспериментальной Физики | Кольцевой счетчик |
KR100208292B1 (ko) * | 1996-12-31 | 1999-07-15 | 유기범 | Ipc의 이중화 버스 클럭 감시 회로 |
CA2201695C (en) * | 1997-04-03 | 2004-08-10 | Gennum Corporation | Phase detector for high speed clock recovery from random binary signals |
US6324652B1 (en) * | 1999-01-15 | 2001-11-27 | 3Com Corporation | Asynchronous switching circuit for multiple indeterminate bursting clocks |
US6469549B2 (en) * | 2000-11-30 | 2002-10-22 | Infineon Technologies Ag | Apparatus and method for odd integer signal division |
-
2001
- 2001-02-23 JP JP2001048354A patent/JP2002251227A/ja active Pending
-
2002
- 2002-01-31 EP EP02250671A patent/EP1237282B1/de not_active Expired - Fee Related
- 2002-01-31 DE DE60200050T patent/DE60200050T2/de not_active Expired - Fee Related
- 2002-01-31 US US10/066,508 patent/US6545508B2/en not_active Expired - Fee Related
- 2002-02-06 SG SG200200729A patent/SG96682A1/en unknown
- 2002-02-22 KR KR1020020009427A patent/KR20020069143A/ko not_active Application Discontinuation
- 2002-11-29 HK HK02108693.1A patent/HK1047356A1/zh unknown
Also Published As
Publication number | Publication date |
---|---|
JP2002251227A (ja) | 2002-09-06 |
US6545508B2 (en) | 2003-04-08 |
DE60200050T2 (de) | 2004-09-16 |
HK1047356A1 (zh) | 2003-02-14 |
EP1237282B1 (de) | 2003-10-08 |
KR20020069143A (ko) | 2002-08-29 |
SG96682A1 (en) | 2003-06-16 |
EP1237282A1 (de) | 2002-09-04 |
US20020118046A1 (en) | 2002-08-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de | ||
8370 | Indication of lapse of patent is to be deleted | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |