DE3888301D1 - Digitalschaltungsprüfgerät. - Google Patents
Digitalschaltungsprüfgerät.Info
- Publication number
- DE3888301D1 DE3888301D1 DE88119504T DE3888301T DE3888301D1 DE 3888301 D1 DE3888301 D1 DE 3888301D1 DE 88119504 T DE88119504 T DE 88119504T DE 3888301 T DE3888301 T DE 3888301T DE 3888301 D1 DE3888301 D1 DE 3888301D1
- Authority
- DE
- Germany
- Prior art keywords
- signal
- expected value
- logical
- test channel
- comparators
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62296995A JP2604606B2 (ja) | 1987-11-24 | 1987-11-24 | 回路試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3888301D1 true DE3888301D1 (de) | 1994-04-14 |
DE3888301T2 DE3888301T2 (de) | 1994-07-28 |
Family
ID=17840890
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3888301T Expired - Lifetime DE3888301T2 (de) | 1987-11-24 | 1988-11-23 | Digitalschaltungsprüfgerät. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4862071A (de) |
EP (1) | EP0318814B1 (de) |
JP (1) | JP2604606B2 (de) |
DE (1) | DE3888301T2 (de) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5107501A (en) * | 1990-04-02 | 1992-04-21 | At&T Bell Laboratories | Built-in self-test technique for content-addressable memories |
JP2803311B2 (ja) * | 1990-04-09 | 1998-09-24 | 住友化学工業株式会社 | 熱可塑性エラストマー組成物 |
JP2608168B2 (ja) * | 1990-08-31 | 1997-05-07 | 三菱電機株式会社 | 半導体試験装置 |
JP2760157B2 (ja) * | 1991-01-23 | 1998-05-28 | 日本電気株式会社 | Lsiテスト方法 |
JPH04118678U (ja) * | 1991-04-03 | 1992-10-23 | 株式会社アドバンテスト | Ic試験装置の論理比較装置 |
US5471153A (en) * | 1991-04-26 | 1995-11-28 | Vlsi Technologies, Inc. | Methods and circuits for testing open collectors and open drains |
DE4128301A1 (de) * | 1991-08-27 | 1993-03-11 | Kirk Gustav | Elektrische beleuchtung |
WO1993020457A1 (en) * | 1992-03-31 | 1993-10-14 | Advantest Corporation | Ic testing device |
US5486753A (en) * | 1993-07-30 | 1996-01-23 | Genrad, Inc. | Simultaneous capacitive open-circuit testing |
JPH0764817A (ja) * | 1993-08-30 | 1995-03-10 | Mitsubishi Electric Corp | 故障検出システム |
CA2159036C (en) * | 1994-12-29 | 1999-01-26 | Miron Abramovici | Method for identifying untestable & redundant faults in sequential logic circuits |
JP2953975B2 (ja) * | 1995-02-09 | 1999-09-27 | 日本電気アイシーマイコンシステム株式会社 | テストパタン生成装置およびテストパタン生成方法 |
SE504455C2 (sv) | 1995-07-10 | 1997-02-17 | Borealis Polymers Oy | Kabelmantlingskomposition, dess användning samt sätt för dess framställning |
US5969538A (en) | 1996-10-31 | 1999-10-19 | Texas Instruments Incorporated | Semiconductor wafer with interconnect between dies for testing and a process of testing |
US5732047A (en) * | 1995-12-12 | 1998-03-24 | Advantest Corporation | Timing comparator circuit for use in device testing apparatus |
JPH11101850A (ja) * | 1997-09-26 | 1999-04-13 | Ando Electric Co Ltd | Ic試験装置 |
US6405335B1 (en) | 1998-02-25 | 2002-06-11 | Texas Instruments Incorporated | Position independent testing of circuits |
US6329833B1 (en) * | 1999-02-24 | 2001-12-11 | Xilinx, Inc. | System and method for automatically measuring input voltage levels for integrated circuits |
US6693436B1 (en) * | 1999-12-23 | 2004-02-17 | Intel Corporation | Method and apparatus for testing an integrated circuit having an output-to-output relative signal |
US6728915B2 (en) | 2000-01-10 | 2004-04-27 | Texas Instruments Incorporated | IC with shared scan cells selectively connected in scan path |
US6769080B2 (en) | 2000-03-09 | 2004-07-27 | Texas Instruments Incorporated | Scan circuit low power adapter with counter |
EP1241483B1 (de) * | 2001-03-16 | 2004-05-19 | Agilent Technologies, Inc. (a Delaware corporation) | Bitfehlerratenmessung |
JP4839638B2 (ja) * | 2005-03-07 | 2011-12-21 | 横河電機株式会社 | テスタシミュレーション装置及びテストシミュレーション方法 |
US9401222B1 (en) * | 2015-11-23 | 2016-07-26 | International Business Machines Corporation | Determining categories for memory fail conditions |
US11695283B2 (en) * | 2018-05-11 | 2023-07-04 | Texas Instruments Incorporated | Shoot-through current limiting circuit |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3541441A (en) * | 1969-02-17 | 1970-11-17 | Ibm | Test system for evaluating amplitude and response characteristics of logic circuits |
GB1278694A (en) * | 1969-07-04 | 1972-06-21 | Sperry Rand Corp | Improvements in or relating to apparatus for testing electronic circuits |
US4414665A (en) * | 1979-11-21 | 1983-11-08 | Nippon Telegraph & Telephone Public Corp. | Semiconductor memory device test apparatus |
US4510603A (en) * | 1981-05-26 | 1985-04-09 | Burroughs Corporation | Testing system for reliable access times in ROM semiconductor memories |
JPS58773A (ja) * | 1981-06-25 | 1983-01-05 | Nec Corp | 集積回路検査装置 |
JPS59152598A (ja) * | 1983-02-21 | 1984-08-31 | Hitachi Ltd | 試験結果の取込み装置 |
JPS61284676A (ja) * | 1985-06-12 | 1986-12-15 | Hitachi Ltd | 論理値比較判定回路 |
DE3685078D1 (de) * | 1985-09-09 | 1992-06-04 | Hitachi Ltd | Speicherpruefgeraet. |
-
1987
- 1987-11-24 JP JP62296995A patent/JP2604606B2/ja not_active Expired - Lifetime
-
1988
- 1988-11-18 US US07/273,347 patent/US4862071A/en not_active Expired - Lifetime
- 1988-11-23 EP EP88119504A patent/EP0318814B1/de not_active Expired - Lifetime
- 1988-11-23 DE DE3888301T patent/DE3888301T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4862071A (en) | 1989-08-29 |
DE3888301T2 (de) | 1994-07-28 |
EP0318814A3 (en) | 1990-10-31 |
EP0318814A2 (de) | 1989-06-07 |
JPH01138477A (ja) | 1989-05-31 |
JP2604606B2 (ja) | 1997-04-30 |
EP0318814B1 (de) | 1994-03-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Free format text: HOFFMANN, E., DIPL.-ING., PAT.-ANW., 82166 GRAEFELFING |