DE3878939D1 - Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer. - Google Patents
Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer.Info
- Publication number
- DE3878939D1 DE3878939D1 DE8888100724T DE3878939T DE3878939D1 DE 3878939 D1 DE3878939 D1 DE 3878939D1 DE 8888100724 T DE8888100724 T DE 8888100724T DE 3878939 T DE3878939 T DE 3878939T DE 3878939 D1 DE3878939 D1 DE 3878939D1
- Authority
- DE
- Germany
- Prior art keywords
- electron
- dispersive system
- dispersive
- energy
- focussing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE8888100724T DE3878939D1 (de) | 1987-01-30 | 1988-01-20 | Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer. |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19873702696 DE3702696A1 (de) | 1987-01-30 | 1987-01-30 | Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer |
DE8888100724T DE3878939D1 (de) | 1987-01-30 | 1988-01-20 | Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer. |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3878939D1 true DE3878939D1 (de) | 1993-04-15 |
Family
ID=6319818
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19873702696 Withdrawn DE3702696A1 (de) | 1987-01-30 | 1987-01-30 | Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer |
DE8888100724T Expired - Lifetime DE3878939D1 (de) | 1987-01-30 | 1988-01-20 | Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer. |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19873702696 Withdrawn DE3702696A1 (de) | 1987-01-30 | 1987-01-30 | Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer |
Country Status (4)
Country | Link |
---|---|
US (1) | US4845361A (de) |
EP (1) | EP0276731B1 (de) |
JP (1) | JP2529712B2 (de) |
DE (2) | DE3702696A1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69027602T2 (de) * | 1990-08-08 | 1997-01-23 | Philips Electronics Nv | Energiefilter für Ladungsträgervorrichtung |
JP2636113B2 (ja) * | 1992-03-26 | 1997-07-30 | 広島大学長 | 帯域フィルター型逆光電子分光検出装置 |
US5466933A (en) * | 1992-11-23 | 1995-11-14 | Surface Interface, Inc. | Dual electron analyzer |
DE19633496B4 (de) * | 1996-08-20 | 2006-06-08 | Ceos Corrected Electron Optical Systems Gmbh | Monchromator für die Elektronenoptik, insbesondere Elketronenmikroskopie |
DE50015720D1 (de) * | 2000-03-27 | 2009-10-01 | Ellcie Maintenance Gmbh | Elektronenspektrometer mit Ablenkeinheit |
KR20060088272A (ko) * | 2005-02-01 | 2006-08-04 | 삼성전자주식회사 | X-선 광전자 분광분석장치 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2856244A1 (de) * | 1978-12-27 | 1980-07-03 | Kernforschungsanlage Juelich | Elektronenstosspektrometer |
US4742223A (en) * | 1984-05-23 | 1988-05-03 | Indiana University Foundation | High resolution particle spectrometer |
US4559449A (en) * | 1984-05-23 | 1985-12-17 | Indiana University Foundation | High resolution particle spectrometer |
-
1987
- 1987-01-30 DE DE19873702696 patent/DE3702696A1/de not_active Withdrawn
-
1988
- 1988-01-20 EP EP88100724A patent/EP0276731B1/de not_active Expired - Lifetime
- 1988-01-20 DE DE8888100724T patent/DE3878939D1/de not_active Expired - Lifetime
- 1988-01-27 JP JP63014812A patent/JP2529712B2/ja not_active Expired - Lifetime
- 1988-01-28 US US07/149,596 patent/US4845361A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE3702696A1 (de) | 1988-08-11 |
EP0276731A3 (en) | 1990-01-24 |
EP0276731B1 (de) | 1993-03-10 |
US4845361A (en) | 1989-07-04 |
JPS63276861A (ja) | 1988-11-15 |
JP2529712B2 (ja) | 1996-09-04 |
EP0276731A2 (de) | 1988-08-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |