DE3878939D1 - Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer. - Google Patents

Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer.

Info

Publication number
DE3878939D1
DE3878939D1 DE8888100724T DE3878939T DE3878939D1 DE 3878939 D1 DE3878939 D1 DE 3878939D1 DE 8888100724 T DE8888100724 T DE 8888100724T DE 3878939 T DE3878939 T DE 3878939T DE 3878939 D1 DE3878939 D1 DE 3878939D1
Authority
DE
Germany
Prior art keywords
electron
dispersive system
dispersive
energy
focussing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8888100724T
Other languages
English (en)
Inventor
Harald Ibach
Heinz-Dieter Bruchmann
Sieghart Lehwald
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Forschungszentrum Juelich GmbH
Original Assignee
Forschungszentrum Juelich GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Forschungszentrum Juelich GmbH filed Critical Forschungszentrum Juelich GmbH
Priority to DE8888100724T priority Critical patent/DE3878939D1/de
Application granted granted Critical
Publication of DE3878939D1 publication Critical patent/DE3878939D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/44Energy spectrometers, e.g. alpha-, beta-spectrometers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
DE8888100724T 1987-01-30 1988-01-20 Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer. Expired - Lifetime DE3878939D1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8888100724T DE3878939D1 (de) 1987-01-30 1988-01-20 Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19873702696 DE3702696A1 (de) 1987-01-30 1987-01-30 Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer
DE8888100724T DE3878939D1 (de) 1987-01-30 1988-01-20 Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer.

Publications (1)

Publication Number Publication Date
DE3878939D1 true DE3878939D1 (de) 1993-04-15

Family

ID=6319818

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19873702696 Withdrawn DE3702696A1 (de) 1987-01-30 1987-01-30 Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer
DE8888100724T Expired - Lifetime DE3878939D1 (de) 1987-01-30 1988-01-20 Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19873702696 Withdrawn DE3702696A1 (de) 1987-01-30 1987-01-30 Verfahren zur elektronenstrahl-fuehrung mit energieselektion und elektronenspektrometer

Country Status (4)

Country Link
US (1) US4845361A (de)
EP (1) EP0276731B1 (de)
JP (1) JP2529712B2 (de)
DE (2) DE3702696A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69027602T2 (de) * 1990-08-08 1997-01-23 Philips Electronics Nv Energiefilter für Ladungsträgervorrichtung
JP2636113B2 (ja) * 1992-03-26 1997-07-30 広島大学長 帯域フィルター型逆光電子分光検出装置
US5466933A (en) * 1992-11-23 1995-11-14 Surface Interface, Inc. Dual electron analyzer
DE19633496B4 (de) * 1996-08-20 2006-06-08 Ceos Corrected Electron Optical Systems Gmbh Monchromator für die Elektronenoptik, insbesondere Elketronenmikroskopie
DE50015720D1 (de) * 2000-03-27 2009-10-01 Ellcie Maintenance Gmbh Elektronenspektrometer mit Ablenkeinheit
KR20060088272A (ko) * 2005-02-01 2006-08-04 삼성전자주식회사 X-선 광전자 분광분석장치

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2856244A1 (de) * 1978-12-27 1980-07-03 Kernforschungsanlage Juelich Elektronenstosspektrometer
US4742223A (en) * 1984-05-23 1988-05-03 Indiana University Foundation High resolution particle spectrometer
US4559449A (en) * 1984-05-23 1985-12-17 Indiana University Foundation High resolution particle spectrometer

Also Published As

Publication number Publication date
DE3702696A1 (de) 1988-08-11
EP0276731A3 (en) 1990-01-24
EP0276731B1 (de) 1993-03-10
US4845361A (en) 1989-07-04
JPS63276861A (ja) 1988-11-15
JP2529712B2 (ja) 1996-09-04
EP0276731A2 (de) 1988-08-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition