DE3827959C2 - - Google Patents
Info
- Publication number
- DE3827959C2 DE3827959C2 DE19883827959 DE3827959A DE3827959C2 DE 3827959 C2 DE3827959 C2 DE 3827959C2 DE 19883827959 DE19883827959 DE 19883827959 DE 3827959 A DE3827959 A DE 3827959A DE 3827959 C2 DE3827959 C2 DE 3827959C2
- Authority
- DE
- Germany
- Prior art keywords
- test
- pin
- commands
- test device
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31724—Test controller, e.g. BIST state machine
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19883827959 DE3827959A1 (de) | 1988-08-17 | 1988-08-17 | Testgeraet zur funktionspruefung von elektroischen bausteinen |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19883827959 DE3827959A1 (de) | 1988-08-17 | 1988-08-17 | Testgeraet zur funktionspruefung von elektroischen bausteinen |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3827959A1 DE3827959A1 (de) | 1990-02-22 |
DE3827959C2 true DE3827959C2 (fr) | 1991-10-24 |
Family
ID=6361063
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19883827959 Granted DE3827959A1 (de) | 1988-08-17 | 1988-08-17 | Testgeraet zur funktionspruefung von elektroischen bausteinen |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE3827959A1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4442636A1 (de) * | 1994-02-14 | 1995-08-24 | Hewlett Packard Co | Bezahlung-pro-Anwendung-Zugriff auf vielfache elektronische Testfähigkeiten und Testbetriebsmittel |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2038295A1 (fr) * | 1990-03-16 | 1991-09-17 | Brian Jerrold Arkin | Processeur rapide d'information sur les defaillances |
DE4101950C2 (de) * | 1991-01-21 | 1998-07-09 | Bally Wulff Automaten Gmbh | Anordnung zur Pfadansteuerung in einem Service-Baum bei Münzspielautomaten |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4639919A (en) * | 1983-12-19 | 1987-01-27 | International Business Machines Corporation | Distributed pattern generator |
-
1988
- 1988-08-17 DE DE19883827959 patent/DE3827959A1/de active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4442636A1 (de) * | 1994-02-14 | 1995-08-24 | Hewlett Packard Co | Bezahlung-pro-Anwendung-Zugriff auf vielfache elektronische Testfähigkeiten und Testbetriebsmittel |
Also Published As
Publication number | Publication date |
---|---|
DE3827959A1 (de) | 1990-02-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8110 | Request for examination paragraph 44 | ||
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |