DE3685759D1 - Integrierte halbleiterschaltung. - Google Patents
Integrierte halbleiterschaltung.Info
- Publication number
- DE3685759D1 DE3685759D1 DE8686301107T DE3685759T DE3685759D1 DE 3685759 D1 DE3685759 D1 DE 3685759D1 DE 8686301107 T DE8686301107 T DE 8686301107T DE 3685759 T DE3685759 T DE 3685759T DE 3685759 D1 DE3685759 D1 DE 3685759D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor circuit
- integrated semiconductor
- integrated
- circuit
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/24—Arrangements for testing
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/26—Devices for calling a subscriber
- H04M1/30—Devices which can set up and transmit only one digit at a time
- H04M1/31—Devices which can set up and transmit only one digit at a time by interrupting current to generate trains of pulses; by periodically opening and closing contacts to generate trains of pulses
- H04M1/312—Devices which can set up and transmit only one digit at a time by interrupting current to generate trains of pulses; by periodically opening and closing contacts to generate trains of pulses pulses produced by electronic circuits
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/26—Devices for calling a subscriber
- H04M1/30—Devices which can set up and transmit only one digit at a time
- H04M1/50—Devices which can set up and transmit only one digit at a time by generating or selecting currents of predetermined frequencies or combinations of frequencies
Landscapes
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60030190A JPS61191973A (ja) | 1985-02-20 | 1985-02-20 | 試験回路をそなえた半導体集積回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3685759D1 true DE3685759D1 (de) | 1992-07-30 |
DE3685759T2 DE3685759T2 (de) | 1993-02-04 |
Family
ID=12296832
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686301107T Expired - Fee Related DE3685759T2 (de) | 1985-02-20 | 1986-02-18 | Integrierte halbleiterschaltung. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4697140A (de) |
EP (1) | EP0192456B1 (de) |
JP (1) | JPS61191973A (de) |
KR (1) | KR900001242B1 (de) |
DE (1) | DE3685759T2 (de) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6337270A (ja) * | 1986-07-31 | 1988-02-17 | Fujitsu Ltd | 半導体装置 |
US4777619A (en) * | 1987-03-30 | 1988-10-11 | Honeywell Bull, Inc. | Method of assuring a proper computer subsystem configuration |
US4975641A (en) * | 1988-07-14 | 1990-12-04 | Sharp Kabushiki Kaisha | Integrated circuit and method for testing the integrated circuit |
JPH02181677A (ja) * | 1989-01-06 | 1990-07-16 | Sharp Corp | Lsiのテストモード切替方式 |
US5019772A (en) * | 1989-05-23 | 1991-05-28 | International Business Machines Corporation | Test selection techniques |
JPH02309818A (ja) * | 1989-05-25 | 1990-12-25 | Yokogawa Electric Corp | A/d変換装置 |
US5299203A (en) * | 1990-08-17 | 1994-03-29 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with a flag for indicating test mode |
JP2803499B2 (ja) * | 1992-11-26 | 1998-09-24 | 日本電気株式会社 | アナログ・デジタルcmos集積回路 |
JP3193810B2 (ja) * | 1993-08-31 | 2001-07-30 | 富士通株式会社 | 不揮発性半導体記憶装置及びその試験方法 |
US5623687A (en) * | 1995-06-26 | 1997-04-22 | Motorola | Reset configuration in a data processing system and method therefor |
US5606715A (en) * | 1995-06-26 | 1997-02-25 | Motorola Inc. | Flexible reset configuration of a data processing system and method therefor |
US5818250A (en) * | 1996-07-03 | 1998-10-06 | Silicon Graphics, Inc. | Apparatus and method for determining the speed of a semiconductor chip |
US6076175A (en) * | 1997-03-31 | 2000-06-13 | Sun Microsystems, Inc. | Controlled phase noise generation method for enhanced testability of clock and data generator and recovery circuits |
US6657504B1 (en) * | 2002-04-30 | 2003-12-02 | Unisys Corporation | System and method of determining ring oscillator speed |
US6815971B2 (en) * | 2002-11-06 | 2004-11-09 | Taiwan Semiconductor Manufacturing Co., Ltd | Method and apparatus for stress testing integrated circuits using an adjustable AC hot carrier injection source |
US20060248417A1 (en) * | 2005-04-28 | 2006-11-02 | International Business Machines Corporation | Clock control circuit for test that facilitates an at speed structural test |
US7187599B2 (en) * | 2005-05-25 | 2007-03-06 | Infineon Technologies North America Corp. | Integrated circuit chip having a first delay circuit trimmed via a second delay circuit |
JP2007157944A (ja) * | 2005-12-02 | 2007-06-21 | Matsushita Electric Ind Co Ltd | 半導体集積回路装置 |
JP4940798B2 (ja) * | 2006-07-11 | 2012-05-30 | トヨタ自動車株式会社 | 衝撃吸収構造 |
JP6358840B2 (ja) * | 2014-04-24 | 2018-07-18 | シャープ株式会社 | 電動粉挽き機 |
CN113533942B (zh) * | 2021-09-15 | 2021-11-30 | 上海矽久微电子有限公司 | 芯片测试***及方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2156863A1 (de) * | 1971-11-16 | 1973-05-24 | Heinz Schwerdtfeger | Pruefgeraet |
US3979681A (en) * | 1974-11-27 | 1976-09-07 | Solid State Scientific, Inc. | System and method for decoding reset signals of a timepiece for providing internal control |
AU530415B2 (en) * | 1978-06-02 | 1983-07-14 | International Standard Electric Corp. | Integrated circuits |
JPS561624A (en) * | 1979-06-19 | 1981-01-09 | Fujitsu Ltd | Integrated circuit incorporating multistep dividing circuit |
DE2943552A1 (de) * | 1979-10-27 | 1981-05-21 | Deutsche Itt Industries Gmbh, 7800 Freiburg | Monolithisch integrierte schaltung |
JPS58196469A (ja) * | 1982-05-12 | 1983-11-15 | Toshiba Corp | 集積回路のテスト方法 |
JPS58215047A (ja) * | 1982-06-07 | 1983-12-14 | Toshiba Corp | 集積回路装置 |
JPS58222534A (ja) * | 1982-06-18 | 1983-12-24 | Toshiba Corp | 集積回路 |
JPS6012843A (ja) * | 1983-07-02 | 1985-01-23 | Rohm Co Ltd | 加入者電話機におけるダイヤル確認音発生回路 |
-
1985
- 1985-02-20 JP JP60030190A patent/JPS61191973A/ja active Granted
-
1986
- 1986-02-11 US US06/828,188 patent/US4697140A/en not_active Expired - Lifetime
- 1986-02-17 KR KR1019860001083A patent/KR900001242B1/ko not_active IP Right Cessation
- 1986-02-18 DE DE8686301107T patent/DE3685759T2/de not_active Expired - Fee Related
- 1986-02-18 EP EP86301107A patent/EP0192456B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE3685759T2 (de) | 1993-02-04 |
KR860006837A (ko) | 1986-09-15 |
EP0192456A2 (de) | 1986-08-27 |
US4697140A (en) | 1987-09-29 |
EP0192456B1 (de) | 1992-06-24 |
EP0192456A3 (en) | 1989-04-05 |
JPS61191973A (ja) | 1986-08-26 |
JPH0562705B2 (de) | 1993-09-09 |
KR900001242B1 (ko) | 1990-03-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |