DE19882290T1 - Optischer Treiber, Spannungssensor mit optischem Ausgangssignal und unter Verwendung dieser Komponenten areitendes IC-Testgerät - Google Patents
Optischer Treiber, Spannungssensor mit optischem Ausgangssignal und unter Verwendung dieser Komponenten areitendes IC-TestgerätInfo
- Publication number
- DE19882290T1 DE19882290T1 DE19882290T DE19882290T DE19882290T1 DE 19882290 T1 DE19882290 T1 DE 19882290T1 DE 19882290 T DE19882290 T DE 19882290T DE 19882290 T DE19882290 T DE 19882290T DE 19882290 T1 DE19882290 T1 DE 19882290T1
- Authority
- DE
- Germany
- Prior art keywords
- optical
- components
- output signal
- test device
- voltage sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31728—Optical aspects, e.g. opto-electronics used for testing, optical signal transmission for testing electronic circuits, electro-optic components to be tested in combination with electronic circuits, measuring light emission of digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Computer Hardware Design (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP1998/000478 WO1999040449A1 (fr) | 1998-02-05 | 1998-02-05 | Circuit d'attaque excite optiquement, detecteur de tension de type a sortie optique et materiel de test de circuits integres utilisant ces dispositifs |
Publications (2)
Publication Number | Publication Date |
---|---|
DE19882290T1 true DE19882290T1 (de) | 2000-02-24 |
DE19882290B4 DE19882290B4 (de) | 2005-12-22 |
Family
ID=14207549
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19861240A Expired - Fee Related DE19861240B4 (de) | 1998-02-05 | 1998-02-05 | IC-Testgerät |
DE19882290T Expired - Fee Related DE19882290B4 (de) | 1998-02-05 | 1998-02-05 | Optischer Treiber und diesen verwendendes IC-Testgerät |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19861240A Expired - Fee Related DE19861240B4 (de) | 1998-02-05 | 1998-02-05 | IC-Testgerät |
Country Status (8)
Country | Link |
---|---|
US (1) | US6586953B1 (de) |
JP (1) | JP3403739B2 (de) |
KR (2) | KR100420726B1 (de) |
CN (1) | CN1129798C (de) |
DE (2) | DE19861240B4 (de) |
GB (1) | GB2339918B (de) |
TW (1) | TW360793B (de) |
WO (1) | WO1999040449A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10106557A1 (de) * | 2001-02-13 | 2002-09-12 | Infineon Technologies Ag | Testanordnung zum parallelen Hochfrequenztest einer Mehrzahl von Halbleiterbausteinen |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040145381A1 (en) * | 2001-12-28 | 2004-07-29 | Jun Su | Test fixture for die-level testing of planar lightwave circuits |
US6765396B2 (en) * | 2002-04-04 | 2004-07-20 | Freescale Semiconductor, Inc. | Method, apparatus and software for testing a device including both electrical and optical portions |
US6815973B1 (en) * | 2003-06-13 | 2004-11-09 | Xilinx, Inc. | Optical testing port and wafer level testing without probe cards |
CN100526898C (zh) * | 2003-11-05 | 2009-08-12 | 爱德万测试株式会社 | 测试装置以及电缆导引单元 |
US7673292B2 (en) * | 2005-01-11 | 2010-03-02 | International Business Machines Corporation | Auto conversion of tests between different functional testing tools |
US20060284631A1 (en) * | 2005-05-31 | 2006-12-21 | Hamren Steven L | Imaging test socket, system, and method of testing an image sensor device |
KR20100067487A (ko) | 2008-12-11 | 2010-06-21 | 삼성전자주식회사 | 테스트 인터페이스 장치, 테스트 시스템 및 광 인터페이스 메모리 장치 |
KR101548176B1 (ko) * | 2009-02-02 | 2015-08-31 | 삼성전자주식회사 | 메모리 시스템, 메모리 테스트 시스템 및 이의 테스트 방법 |
US9236958B2 (en) * | 2012-08-10 | 2016-01-12 | Skorpios Technologies, Inc. | Method and system for performing testing of photonic devices |
CN104345291A (zh) * | 2013-08-06 | 2015-02-11 | 鸿富锦精密工业(深圳)有限公司 | 静电测试仪检测***及方法 |
US9476960B2 (en) * | 2013-12-18 | 2016-10-25 | Tektronix, Inc. | Measurement system including accessory with internal calibration signal |
US9331776B2 (en) * | 2013-12-18 | 2016-05-03 | Tektronix, Inc. | Extended range electro-optic voltage accessory |
US9209593B2 (en) * | 2013-12-18 | 2015-12-08 | Tektronix, Inc. | Method of controlling electro-optical probe gain and sensitivity |
US10707050B2 (en) * | 2018-07-26 | 2020-07-07 | Varian Semiconductor Equipment Associates, Inc. | System and method to detect glitches |
WO2020104015A1 (de) * | 2018-11-20 | 2020-05-28 | Lisa Dräxlmaier GmbH | Prüfvorrichtung, prüfsystem und prüfverfahren |
JP6813763B1 (ja) * | 2020-04-07 | 2021-01-13 | 株式会社精工技研 | 光電圧プローブ |
Family Cites Families (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58216969A (ja) * | 1982-06-11 | 1983-12-16 | Toshiba Corp | Lsi試験装置 |
JPS59155764A (ja) * | 1983-02-24 | 1984-09-04 | Yokogawa Hokushin Electric Corp | 光電圧計 |
JPS59218915A (ja) * | 1983-05-27 | 1984-12-10 | Yokogawa Hokushin Electric Corp | 光導波路形センサ |
JPS61117472A (ja) * | 1984-11-13 | 1986-06-04 | Yokogawa Electric Corp | テストシステム |
JPS6237940A (ja) * | 1985-08-12 | 1987-02-18 | Nippon Denshi Zairyo Kk | プロ−ブカ−ド |
JPH07104365B2 (ja) * | 1987-09-19 | 1995-11-13 | 株式会社安川電機 | 光センサ装置 |
US4870295A (en) * | 1987-12-07 | 1989-09-26 | The United States Of America As Represented By The United States Department Of Energy | Photoconductive circuit element pulse generator |
JPH0266476A (ja) | 1988-08-31 | 1990-03-06 | Nec Kyushu Ltd | 半導体回路試験装置 |
CA2011954C (en) * | 1989-03-14 | 1994-02-22 | Hiroshi Hamano | Optical modulator |
JPH02249977A (ja) * | 1989-03-24 | 1990-10-05 | Fujitsu Ltd | 信号波形検出装置 |
US5153442A (en) * | 1989-06-12 | 1992-10-06 | The United States Of America As Represented By The Secretary Of The Army | High power, solid state RF pulse generators |
JPH0365987A (ja) | 1989-08-04 | 1991-03-20 | Fujitsu Ltd | ダブルフレームバッファ使用時のウィンド管理方式 |
JP3006082B2 (ja) * | 1990-11-22 | 2000-02-07 | 株式会社アドバンテスト | 三値駆動回路 |
US5137359A (en) * | 1991-03-18 | 1992-08-11 | Litton Systems, Inc. | Digital phase modulator for fiber optic sagnac interferometer |
JPH05273315A (ja) * | 1992-03-26 | 1993-10-22 | Fujitsu Ltd | 半導体試験方法および装置 |
US5347601A (en) * | 1993-03-29 | 1994-09-13 | United Technologies Corporation | Integrated optical receiver/transmitter |
CN1052070C (zh) * | 1993-07-07 | 2000-05-03 | 株式会社东金 | 电场传感器 |
DE69431513T2 (de) * | 1993-07-07 | 2003-08-07 | Nec Tokin Corp., Sendai | Fühler für elektrische felder |
US5654812A (en) * | 1994-09-17 | 1997-08-05 | Kabushiki Kaisha Toshiba | Light-receiving device, optoelectronic transmission apparatus, and optical demultiplexing method |
US5767955A (en) * | 1995-02-23 | 1998-06-16 | Advantest Corporation | Short-width pulse generating apparatus for measurement of reflection point, sampling apparatus for measurement of reflection point and reflection point measuring apparatus |
WO1996035972A1 (en) * | 1995-05-08 | 1996-11-14 | Testdesign Corporation | Optical fiber interface for integrated circuit test system |
JP3411947B2 (ja) * | 1995-08-08 | 2003-06-03 | シャープ株式会社 | 電波−光変換変調装置及びそれを用いた通信システム |
JPH0989961A (ja) * | 1995-09-26 | 1997-04-04 | Tokin Corp | 電界検出装置 |
JP3591673B2 (ja) | 1996-03-22 | 2004-11-24 | 株式会社アドバンテスト | Ic試験装置のドライバ |
JPH09281182A (ja) | 1996-04-10 | 1997-10-31 | Advantest Corp | 測定ボードおよびその測定ボードを用いたi/o端子試験システム |
DE19629260C1 (de) * | 1996-07-19 | 1998-02-26 | Litef Gmbh | Elektrooptischer Phasenmodulator mit richtungsunabhängiger Impulsantwort, Anordnung von elektrooptischen Phasenmodulatoren und Verwendung eines elektrooptischen Phasenmodulators |
JPH10115644A (ja) * | 1996-10-11 | 1998-05-06 | Toyota Central Res & Dev Lab Inc | 光集積化電圧センサ |
US6285182B1 (en) * | 1998-12-08 | 2001-09-04 | Nxtphase Technologies Srl | Electro-optic voltage sensor |
-
1998
- 1998-02-05 US US09/402,207 patent/US6586953B1/en not_active Expired - Fee Related
- 1998-02-05 GB GB9922292A patent/GB2339918B/en not_active Expired - Fee Related
- 1998-02-05 CN CN98803957A patent/CN1129798C/zh not_active Expired - Fee Related
- 1998-02-05 DE DE19861240A patent/DE19861240B4/de not_active Expired - Fee Related
- 1998-02-05 JP JP54022699A patent/JP3403739B2/ja not_active Expired - Fee Related
- 1998-02-05 KR KR10-1999-7009087A patent/KR100420726B1/ko not_active IP Right Cessation
- 1998-02-05 KR KR10-2002-7009768A patent/KR100401347B1/ko not_active IP Right Cessation
- 1998-02-05 WO PCT/JP1998/000478 patent/WO1999040449A1/ja not_active Application Discontinuation
- 1998-02-05 DE DE19882290T patent/DE19882290B4/de not_active Expired - Fee Related
- 1998-03-03 TW TW087103065A patent/TW360793B/zh not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10106557A1 (de) * | 2001-02-13 | 2002-09-12 | Infineon Technologies Ag | Testanordnung zum parallelen Hochfrequenztest einer Mehrzahl von Halbleiterbausteinen |
DE10106557B4 (de) * | 2001-02-13 | 2004-08-19 | Infineon Technologies Ag | Testanordnung zum parallelen Hochfrequenztest einer Mehrzahl von Halbleiterbausteinen |
Also Published As
Publication number | Publication date |
---|---|
CN1129798C (zh) | 2003-12-03 |
CN1252131A (zh) | 2000-05-03 |
GB9922292D0 (en) | 1999-11-17 |
US6586953B1 (en) | 2003-07-01 |
DE19861240B4 (de) | 2006-05-24 |
DE19882290B4 (de) | 2005-12-22 |
KR20020084840A (ko) | 2002-11-11 |
WO1999040449A1 (fr) | 1999-08-12 |
KR100401347B1 (ko) | 2003-10-17 |
KR20010006009A (ko) | 2001-01-15 |
KR100420726B1 (ko) | 2004-03-02 |
GB2339918A (en) | 2000-02-09 |
TW360793B (en) | 1999-06-11 |
GB2339918B (en) | 2002-11-27 |
JP3403739B2 (ja) | 2003-05-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8125 | Change of the main classification |
Ipc: G01R 31/308 |
|
8607 | Notification of search results after publication | ||
Q172 | Divided out of (supplement): |
Ref document number: 19861240 Country of ref document: DE |
|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |