CN218938344U - 检查用连接器以及检查用单元 - Google Patents

检查用连接器以及检查用单元 Download PDF

Info

Publication number
CN218938344U
CN218938344U CN202190000326.8U CN202190000326U CN218938344U CN 218938344 U CN218938344 U CN 218938344U CN 202190000326 U CN202190000326 U CN 202190000326U CN 218938344 U CN218938344 U CN 218938344U
Authority
CN
China
Prior art keywords
pin
ground
signal pin
electrically connected
sleeve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202190000326.8U
Other languages
English (en)
Chinese (zh)
Inventor
小出知明
田中达也
山口亨
山河寿
阿部学
中谷康祐
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Application granted granted Critical
Publication of CN218938344U publication Critical patent/CN218938344U/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
CN202190000326.8U 2020-04-22 2021-04-14 检查用连接器以及检查用单元 Active CN218938344U (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020075912 2020-04-22
JP2020-075912 2020-04-22
PCT/JP2021/015483 WO2021215334A1 (ja) 2020-04-22 2021-04-14 検査用コネクタ及び検査用ユニット

Publications (1)

Publication Number Publication Date
CN218938344U true CN218938344U (zh) 2023-04-28

Family

ID=78269296

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202190000326.8U Active CN218938344U (zh) 2020-04-22 2021-04-14 检查用连接器以及检查用单元

Country Status (4)

Country Link
JP (1) JP7327659B2 (ja)
CN (1) CN218938344U (ja)
TW (1) TWI778588B (ja)
WO (1) WO2021215334A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022106991A1 (de) 2022-03-24 2023-09-28 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstiftvorrichtung

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001042002A (ja) * 1999-07-30 2001-02-16 Advantest Corp 半導体デバイス試験装置のタイミング校正用コンタクトボード・このコンタクトボードに接触するプローブ
US6515499B1 (en) * 2000-09-28 2003-02-04 Teradyne, Inc. Modular semiconductor tester interface assembly for high performance coaxial connections
US6447328B1 (en) * 2001-03-13 2002-09-10 3M Innovative Properties Company Method and apparatus for retaining a spring probe
US20030062914A1 (en) 2001-09-28 2003-04-03 Cosmin Iorga Surface mating compliant contact assembly with fixed signal path length
JP2008070146A (ja) * 2006-09-12 2008-03-27 Yokowo Co Ltd 検査用ソケット
CN101939659A (zh) 2008-02-07 2011-01-05 爱德万测试株式会社 种类更换单元及其制造方法
JP2010133763A (ja) 2008-12-03 2010-06-17 Yokogawa Electric Corp 同軸プローブ構造
JP2014123482A (ja) * 2012-12-21 2014-07-03 Murata Mfg Co Ltd 検査用同軸コネクタ
US9645172B2 (en) * 2014-10-10 2017-05-09 Samtec, Inc. Cable assembly
CN107148575B (zh) 2014-11-07 2021-03-12 株式会社村田制作所 探针
KR101882209B1 (ko) 2016-03-23 2018-07-27 리노공업주식회사 동축 테스트소켓 조립체
JP6711469B2 (ja) 2017-10-06 2020-06-17 株式会社村田製作所 プローブ

Also Published As

Publication number Publication date
WO2021215334A1 (ja) 2021-10-28
JPWO2021215334A1 (ja) 2021-10-28
TW202210841A (zh) 2022-03-16
TWI778588B (zh) 2022-09-21
JP7327659B2 (ja) 2023-08-16

Similar Documents

Publication Publication Date Title
KR101897996B1 (ko) 프로브
US7656175B2 (en) Inspection unit
EP1471358A2 (en) Coaxial probe interface
KR101938985B1 (ko) 동축 케이블 커넥터 및 동축 케이블 접속 방법
JP5225997B2 (ja) コネクタ、導電部材、パフォーマンスボードおよび試験装置
KR20180018309A (ko) 동축 커넥터
US11320461B2 (en) Probe unit
JP2004510164A (ja) 高性能テスターインタフェースモジュール
JP7226520B2 (ja) プローブ素子およびプローブユニット
CN218938344U (zh) 检查用连接器以及检查用单元
WO2008123652A1 (en) Coaxial connecting system and coaxial connecting device
JP7334791B2 (ja) 検査用コネクタ及び検査用ユニット
TWI761964B (zh) 連接器測定用探針及連接器之測定方法
CN215340281U (zh) 用于校准探测器的校准适配器、探测器组件以及适配器
KR20100095142A (ko) 검사용 소켓
WO2022201846A1 (ja) 検査用コネクタ
CN219163833U (zh) 检查用连接器
JP7243860B2 (ja) 検査用プローブ装置及びコネクタ検査方法
WO2023047618A1 (ja) 検査用コネクタ
TWI785933B (zh) 測量單元
KR100921223B1 (ko) 전선 연결 장치
JP2022116470A (ja) プローブ装置
JP2024008591A (ja) 検査用コネクタ
JP2022189133A (ja) コネクタセット、及び同軸コネクタ

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant