CN1338626A - 图像扫描仪中灰尘和划痕的检测 - Google Patents
图像扫描仪中灰尘和划痕的检测 Download PDFInfo
- Publication number
- CN1338626A CN1338626A CN01120845A CN01120845A CN1338626A CN 1338626 A CN1338626 A CN 1338626A CN 01120845 A CN01120845 A CN 01120845A CN 01120845 A CN01120845 A CN 01120845A CN 1338626 A CN1338626 A CN 1338626A
- Authority
- CN
- China
- Prior art keywords
- shade
- photosensitive device
- row
- different
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
- H04N1/40—Picture signal circuits
- H04N1/409—Edge or detail enhancement; Noise or error suppression
- H04N1/4097—Removing errors due external factors, e.g. dust, scratches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8841—Illumination and detection on two sides of object
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Facsimile Scanning Arrangements (AREA)
- Image Input (AREA)
- Image Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims (5)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/629495 | 2000-07-31 | ||
US09/629,495 US6465801B1 (en) | 2000-07-31 | 2000-07-31 | Dust and scratch detection for an image scanner |
US09/629,495 | 2000-07-31 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNA2004100351659A Division CN1542436A (zh) | 2000-07-31 | 2001-05-31 | 图像扫描仪中灰尘和划痕的检测 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1338626A true CN1338626A (zh) | 2002-03-06 |
CN1174241C CN1174241C (zh) | 2004-11-03 |
Family
ID=24523218
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB011208457A Expired - Fee Related CN1174241C (zh) | 2000-07-31 | 2001-05-31 | 图像扫描仪中灰尘和划痕的检测 |
CNA2004100351659A Pending CN1542436A (zh) | 2000-07-31 | 2001-05-31 | 图像扫描仪中灰尘和划痕的检测 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNA2004100351659A Pending CN1542436A (zh) | 2000-07-31 | 2001-05-31 | 图像扫描仪中灰尘和划痕的检测 |
Country Status (5)
Country | Link |
---|---|
US (3) | US6465801B1 (zh) |
CN (2) | CN1174241C (zh) |
DE (1) | DE10121545A1 (zh) |
SG (1) | SG94785A1 (zh) |
TW (1) | TW502110B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110440853A (zh) * | 2019-07-24 | 2019-11-12 | 沈阳工程学院 | 一种监控除尘*** |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10029826C1 (de) * | 2000-06-16 | 2001-08-02 | Agfa Gevaert Ag | Verfahren und Vorrichtung zur Defekterkennung und/oder -korrektur bei der digitalen Bildverarbeitung |
US7242797B2 (en) * | 2003-06-05 | 2007-07-10 | Seiko Epson Corporation | Method and apparatus for mapping defects on the light transmissive support surface of a document scanning or photocopying device |
US7369712B2 (en) * | 2003-09-30 | 2008-05-06 | Fotonation Vision Limited | Automated statistical self-calibrating detection and removal of blemishes in digital images based on multiple occurrences of dust in images |
US7340109B2 (en) * | 2003-09-30 | 2008-03-04 | Fotonation Vision Limited | Automated statistical self-calibrating detection and removal of blemishes in digital images dependent upon changes in extracted parameter values |
US7206461B2 (en) * | 2003-09-30 | 2007-04-17 | Fotonation Vision Limited | Digital image acquisition and processing system |
US7315658B2 (en) * | 2003-09-30 | 2008-01-01 | Fotonation Vision Limited | Digital camera |
US7295233B2 (en) | 2003-09-30 | 2007-11-13 | Fotonation Vision Limited | Detection and removal of blemishes in digital images utilizing original images of defocused scenes |
US7590305B2 (en) * | 2003-09-30 | 2009-09-15 | Fotonation Vision Limited | Digital camera with built-in lens calibration table |
US7676110B2 (en) * | 2003-09-30 | 2010-03-09 | Fotonation Vision Limited | Determination of need to service a camera based on detection of blemishes in digital images |
US7308156B2 (en) * | 2003-09-30 | 2007-12-11 | Fotonation Vision Limited | Automated statistical self-calibrating detection and removal of blemishes in digital images based on a dust map developed from actual image data |
US7310450B2 (en) * | 2003-09-30 | 2007-12-18 | Fotonation Vision Limited | Method of detecting and correcting dust in digital images based on aura and shadow region analysis |
US7424170B2 (en) * | 2003-09-30 | 2008-09-09 | Fotonation Vision Limited | Automated statistical self-calibrating detection and removal of blemishes in digital images based on determining probabilities based on image analysis of single images |
US8369650B2 (en) | 2003-09-30 | 2013-02-05 | DigitalOptics Corporation Europe Limited | Image defect map creation using batches of digital images |
US7528997B2 (en) * | 2003-12-22 | 2009-05-05 | Xerox Corporation | Systems and methods for streak detection in image array scanning |
US7122819B2 (en) * | 2004-05-06 | 2006-10-17 | Micron Technology, Inc. | Method and apparatus for imager die package quality testing |
US7605958B2 (en) * | 2004-06-02 | 2009-10-20 | Xerox Corporation | Design parameters for a multi-row linear photosensor array |
JP4498149B2 (ja) * | 2005-01-17 | 2010-07-07 | キヤノン株式会社 | 画像読み取り装置 |
FR2892815B1 (fr) * | 2005-10-28 | 2008-02-01 | Turbomeca | Diagnostic ou parametrage d'une installation de detection par ressuage de defauts debouchants a la surface de pieces |
US7391510B2 (en) * | 2006-01-26 | 2008-06-24 | Orbotech Ltd | System and method for inspecting patterned devices having microscopic conductors |
WO2007095556A2 (en) | 2006-02-14 | 2007-08-23 | Fotonation Vision Limited | Digital image acquisition device with built in dust and sensor mapping capability |
US7817874B2 (en) | 2006-12-06 | 2010-10-19 | Micron Technology, Inc. | Image sensor occlusion localization and correction apparatus, systems, and methods |
JP4913075B2 (ja) * | 2008-01-16 | 2012-04-11 | 京セラミタ株式会社 | 画像読取装置 |
CN201765193U (zh) * | 2008-11-26 | 2011-03-16 | 康代有限公司 | 用于检查物体的*** |
US8565508B2 (en) * | 2009-11-26 | 2013-10-22 | Camtek Ltd. | System and a method for insepcting an object using a hybrid sensor |
DE102011004584A1 (de) * | 2011-02-23 | 2012-08-23 | Krones Aktiengesellschaft | Verfahren und Vorrichtung zum Erkennen von Blasen und/oder Falten auf etikettierten Behältern |
US8894280B2 (en) | 2011-12-31 | 2014-11-25 | Carestream Health, Inc. | Calibration and correction procedures for digital radiography detectors supporting multiple capture modes, methods and systems for same |
US8901514B2 (en) * | 2012-06-28 | 2014-12-02 | Molecular Devices, Llc | Sample analysis system with spotlight illumination |
CN102830123B (zh) * | 2012-08-16 | 2014-07-02 | 北京科技大学 | 一种金属板带表面微小缺陷的在线检测方法 |
EP3016368A1 (en) * | 2014-10-27 | 2016-05-04 | Thomson Licensing | Method and apparatus for handling a defect object in an image |
CN109961455B (zh) * | 2017-12-22 | 2022-03-04 | 杭州萤石软件有限公司 | 一种目标检测方法及装置 |
US11340845B1 (en) | 2021-03-12 | 2022-05-24 | Hewlett-Packard Development Company, L.P. | Determination of predicted failure modes based on properties of dust in printing devices |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5266805A (en) | 1992-05-05 | 1993-11-30 | International Business Machines Corporation | System and method for image recovery |
US5663569A (en) * | 1993-10-14 | 1997-09-02 | Nikon Corporation | Defect inspection method and apparatus, and defect display method |
DE69514874T2 (de) | 1994-08-23 | 2000-07-20 | Hewlett-Packard Co., Palo Alto | Sensoranordnung für einen optischen Bildabtaster die Grauwert- und Farbsignale liefert |
DE19511534C2 (de) * | 1995-03-29 | 1998-01-22 | Fraunhofer Ges Forschung | Verfahren und Vorrichtung zur Erfassung von 3D-Fehlstellen bei der automatischen Inspektion von Oberflächen mit Hilfe farbtüchtiger Bildauswertungssysteme |
US5969372A (en) | 1997-10-14 | 1999-10-19 | Hewlett-Packard Company | Film scanner with dust and scratch correction by use of dark-field illumination |
US6177682B1 (en) * | 1998-10-21 | 2001-01-23 | Novacam Tyechnologies Inc. | Inspection of ball grid arrays (BGA) by using shadow images of the solder balls |
TW475330B (en) * | 1999-10-29 | 2002-02-01 | Hewlett Packard Co | Photosensor array with multiple different sensor areas |
-
2000
- 2000-07-31 US US09/629,495 patent/US6465801B1/en not_active Expired - Fee Related
-
2001
- 2001-02-16 TW TW090103635A patent/TW502110B/zh not_active IP Right Cessation
- 2001-03-13 SG SG200101506A patent/SG94785A1/en unknown
- 2001-05-03 DE DE10121545A patent/DE10121545A1/de not_active Withdrawn
- 2001-05-31 CN CNB011208457A patent/CN1174241C/zh not_active Expired - Fee Related
- 2001-05-31 CN CNA2004100351659A patent/CN1542436A/zh active Pending
-
2002
- 2002-08-22 US US10/226,859 patent/US20020195577A1/en not_active Abandoned
-
2004
- 2004-08-31 US US10/931,317 patent/US7355193B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110440853A (zh) * | 2019-07-24 | 2019-11-12 | 沈阳工程学院 | 一种监控除尘*** |
CN110440853B (zh) * | 2019-07-24 | 2024-05-17 | 沈阳工程学院 | 一种监控除尘*** |
Also Published As
Publication number | Publication date |
---|---|
CN1542436A (zh) | 2004-11-03 |
US6465801B1 (en) | 2002-10-15 |
US20020195577A1 (en) | 2002-12-26 |
CN1174241C (zh) | 2004-11-03 |
US7355193B2 (en) | 2008-04-08 |
US20050023492A1 (en) | 2005-02-03 |
SG94785A1 (en) | 2003-03-18 |
DE10121545A1 (de) | 2002-02-21 |
TW502110B (en) | 2002-09-11 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. Free format text: FORMER OWNER: HEWLETT-PACKARD CO. (US) P.O. BOX 10301, PALO ALTO CALIFORNIA U.S.A. Effective date: 20120423 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20120423 Address after: Texas, USA Patentee after: HEWLETT-PACKARD DEVELOPMENT Co.,L.P. Address before: California, USA Patentee before: Hewlett-Packard Co. |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20041103 Termination date: 20140531 |