CN201765193U - 用于检查物体的*** - Google Patents
用于检查物体的*** Download PDFInfo
- Publication number
- CN201765193U CN201765193U CN200920270543XU CN200920270543U CN201765193U CN 201765193 U CN201765193 U CN 201765193U CN 200920270543X U CN200920270543X U CN 200920270543XU CN 200920270543 U CN200920270543 U CN 200920270543U CN 201765193 U CN201765193 U CN 201765193U
- Authority
- CN
- China
- Prior art keywords
- sensor
- group
- detection signal
- light
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
- G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
- G06V10/147—Details of sensors, e.g. sensor lenses
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30141—Printed circuit board [PCB]
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Vascular Medicine (AREA)
- Multimedia (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11796308P | 2008-11-26 | 2008-11-26 | |
US61/117,963 | 2008-11-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN201765193U true CN201765193U (zh) | 2011-03-16 |
Family
ID=42196319
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200920270543XU Expired - Lifetime CN201765193U (zh) | 2008-11-26 | 2009-11-26 | 用于检查物体的*** |
Country Status (2)
Country | Link |
---|---|
US (1) | US8358829B2 (zh) |
CN (1) | CN201765193U (zh) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104937386A (zh) * | 2013-03-29 | 2015-09-23 | 松下电器(美国)知识产权公司 | 推断装置、推断方法、集成电路以及程序 |
US9645097B2 (en) | 2014-06-20 | 2017-05-09 | Kla-Tencor Corporation | In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning |
US9885671B2 (en) | 2014-06-09 | 2018-02-06 | Kla-Tencor Corporation | Miniaturized imaging apparatus for wafer edge |
CN110118737A (zh) * | 2018-02-05 | 2019-08-13 | 康代有限公司 | 检查包括光敏聚酰亚胺层的物体 |
CN110291359A (zh) * | 2017-03-02 | 2019-09-27 | Ckd株式会社 | 三维测量装置 |
CN110487813A (zh) * | 2018-05-15 | 2019-11-22 | 康代有限公司 | 串扰检测 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8565508B2 (en) * | 2009-11-26 | 2013-10-22 | Camtek Ltd. | System and a method for insepcting an object using a hybrid sensor |
US10890537B2 (en) * | 2017-02-20 | 2021-01-12 | Serendipity Co., Ltd | Appearance inspection device, lighting device, and imaging lighting device |
US10408764B2 (en) | 2017-09-13 | 2019-09-10 | Applied Materials Israel Ltd. | System, method and computer program product for object examination |
CN114279319B (zh) * | 2020-09-28 | 2024-04-12 | 深圳富联富桂精密工业有限公司 | 检测元件安装缺陷的设备及其方法 |
US20230171935A1 (en) * | 2021-11-29 | 2023-06-01 | Hewlett Packard Enterprise Development Lp | Identifications of deviations relating to assemblies of components |
CN117745716B (zh) * | 2024-02-07 | 2024-04-16 | 湖南仁盈科技有限公司 | 一种pcba板缺陷的可视化方法及*** |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6465801B1 (en) * | 2000-07-31 | 2002-10-15 | Hewlett-Packard Company | Dust and scratch detection for an image scanner |
US7113651B2 (en) * | 2002-11-20 | 2006-09-26 | Dmetrix, Inc. | Multi-spectral miniature microscope array |
EP2067003B1 (en) * | 2006-09-01 | 2020-04-29 | Agr International, Inc. | In-line inspection system for vertically profiling plastic containers using multiple wavelength discrete spectral light sources |
-
2009
- 2009-11-26 CN CN200920270543XU patent/CN201765193U/zh not_active Expired - Lifetime
- 2009-11-26 US US12/626,636 patent/US8358829B2/en active Active
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104937386A (zh) * | 2013-03-29 | 2015-09-23 | 松下电器(美国)知识产权公司 | 推断装置、推断方法、集成电路以及程序 |
CN104937386B (zh) * | 2013-03-29 | 2017-07-04 | 松下电器(美国)知识产权公司 | 推断装置、推断方法、集成电路以及程序 |
US9885671B2 (en) | 2014-06-09 | 2018-02-06 | Kla-Tencor Corporation | Miniaturized imaging apparatus for wafer edge |
US9645097B2 (en) | 2014-06-20 | 2017-05-09 | Kla-Tencor Corporation | In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning |
CN110291359A (zh) * | 2017-03-02 | 2019-09-27 | Ckd株式会社 | 三维测量装置 |
CN110118737A (zh) * | 2018-02-05 | 2019-08-13 | 康代有限公司 | 检查包括光敏聚酰亚胺层的物体 |
CN110487813A (zh) * | 2018-05-15 | 2019-11-22 | 康代有限公司 | 串扰检测 |
Also Published As
Publication number | Publication date |
---|---|
US20100128968A1 (en) | 2010-05-27 |
US8358829B2 (en) | 2013-01-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20180907 Address after: Hongkong, Tongluowan, China Patentee after: Kang Dai image technology program Limited Hong Kong Company Address before: Israel Haman Mead Patentee before: Camtek Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20180925 Address after: Hongkong, Tongluowan, China Patentee after: Kang Dai image technology program Limited Hong Kong Company Address before: Israel Haman Mead Patentee before: Camtek Ltd. |
|
TR01 | Transfer of patent right | ||
CX01 | Expiry of patent term |
Granted publication date: 20110316 |
|
CX01 | Expiry of patent term |