CN115808611B - Integrated circuit test system - Google Patents
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Abstract
The invention relates to the technical field of integrated circuit testing, and provides an integrated circuit testing system, which comprises: the device comprises a main control module, a signal generation module, an output signal detection module, a man-machine interaction module and a storage module, wherein a controlled end of the signal generation module is connected with the main control module, an output end of the signal generation module is suitable for being connected with an input end of an object to be detected and used for sending a test input signal to the object to be detected, an output end of the output signal detection module is connected with the main control module, an input end of the output signal detection module is suitable for being connected with the object to be detected and used for detecting a signal state of the object to be detected and transmitting the signal state to the main control module, the man-machine interaction module is connected with the main control module, and the storage module is connected with the main control module and used for storing detection information of the object to be detected and corresponding signal state information; the invention can realize the automatic detection and statistics of integrated circuits in different types of objects to be detected.
Description
Technical Field
The invention relates to the technical field of integrated circuit testing, in particular to an integrated circuit testing system.
Background
With the development of society, the variety of chip is more and more, the detection of integrated circuit in the chip plays the vital role to guarantee chip performance, operational amplifier is as one kind of chip of ordinary use, most producer all can test its internal integrated circuit, in order to judge the qualification rate, in traditional testing mode, the staff can regard operational amplifier as the thing that awaits measuring, one end ground connection of its two input terminals, the other end is connected signal generating equipment, such as waveform generator, and according to the model of thing that awaits measuring, set up corresponding parameter on signal generating equipment, test, and connect the output of thing that awaits measuring with detection device such as waveform, electric current, observe the output condition, with the record qualification state of it, this kind of manual operation mode step is many, each time need manual configuration parameter and record its qualification condition when the integrated circuit of the thing that awaits measuring of different models, degree of automation is poor, and efficiency is low, and statistics easily appears in the manual statistics.
Disclosure of Invention
The invention solves the problem of realizing the automatic detection and statistics of integrated circuits in objects to be detected of different types.
In order to solve the above-mentioned problems, the present invention provides an integrated circuit testing system, comprising: an integrated circuit testing system, comprising: the system comprises a main control module, and a signal generation module, an output signal detection module, a man-machine interaction module and a storage module which are connected with the main control module, wherein:
the controlled end of the signal generation module is connected with the main control module, and the output end of the signal generation module is suitable for being connected with the input end of an object to be tested and is used for sending a test input signal to the object to be tested;
the output signal detection module includes:
the input end of the counting detection circuit is suitable for being connected with the object to be detected, and the output end of the counting detection circuit is connected with the main control module and is used for detecting and counting waveforms output by the object to be detected and then transmitting the waveforms to the main control module;
the input end of the peak detection circuit is suitable for being connected with the object to be detected, and the output end of the peak detection circuit is connected with the main control module and is used for detecting the peak voltage of the output end of the object to be detected and then transmitting the peak voltage to the main control module;
the current detection circuit is connected with the main control module and used for transmitting the acquired current information of the two ends of the object to be detected to the main control module;
the man-machine interaction module is used for a worker to select detection information of the object to be detected and display a test result of the object to be detected;
the storage module is used for storing detection information of the object to be detected and corresponding signal state information.
Further, the signal generating module is a sine signal generating module, a controlled end of the sine signal generating module is connected with the main control module, and an output end of the sine signal generating module is suitable for being connected with an input end of an object to be detected and is used for sending sine wave signals to the object to be detected.
Further, the counting detection circuit comprises an amplifying isolation circuit and a counting conversion circuit, wherein a first input end of the amplifying isolation circuit is connected with an output end of the signal generation module, a first output end of the amplifying isolation circuit is suitable for being connected with an input end of an object to be detected, a second input end of the amplifying isolation circuit is suitable for being connected with an output end of the object to be detected, a second output end of the amplifying isolation circuit is connected with an input end of the counting conversion circuit, and an output end of the counting conversion circuit is connected with the main control module and is used for converting sine wave signals acquired by the amplifying isolation circuit and outputting the converted sine wave signals to the main control module.
Further, the peak detection circuit comprises a peak voltage acquisition circuit and a sampling circuit, the peak voltage acquisition circuit comprises a first comparator, a first diode, a first capacitor and a first voltage follower, the input end of the first comparator is connected with the output end of the object to be detected, the output end of the first comparator is connected with the first capacitor through the first diode, the input end of the first voltage follower is connected with the first capacitor, and the output end of the first voltage follower is connected with the main control module through the sampling circuit.
Further, the current detection circuit comprises two paths of Hall sensor circuits, each Hall sensor circuit comprises a Hall sensor and a first triode, the base electrode of each first triode is connected with the signal end of each Hall sensor, the collector electrode of each first triode is grounded, the emitter electrode of each first triode is connected with the power end of each Hall sensor and the input end of the main control module, and the Hall sensors in the two paths of Hall sensor circuits are respectively arranged at connecting lines at two ends of an object to be detected.
Further, the integrated circuit test system further includes a communication module, where the communication module includes:
the network port circuit is connected with the main control module and used for wired communication between the main control module and the control center;
and the WIFI circuit is connected with the main control module and used for wireless communication between the main control module and the control center.
Further, the integrated circuit test system further comprises an alarm circuit, the alarm circuit comprises a loudspeaker, a protection diode and a second triode, the base electrode of the second triode is connected with the main control module, the collector electrode of the second triode is connected with the ground, the emitter electrode of the second triode is connected with the loudspeaker, and the protection diode is connected with two ends of the loudspeaker in parallel.
Further, the integrated circuit testing system further comprises a temperature detection circuit and a fan driving circuit, wherein the temperature detection circuit is connected with the main control module and is used for transmitting detected ambient temperature information to the main control module; the controlled end of the fan driving circuit is connected with the main control module, and the output end of the fan driving circuit is suitable for being connected with a fan and used for being controlled by the main control module to drive the fan.
Further, the temperature detection circuit comprises a temperature sensor interface circuit, a voltage division circuit, an adjusting circuit, a filtering circuit and a differential amplifying circuit, wherein the temperature sensor interface circuit is suitable for being connected with a temperature sensor, a first end of the temperature sensor interface circuit is connected with a first input end of the differential amplifying circuit, a second end of the temperature sensor interface circuit is connected with a first output end of the voltage division circuit, a second output end of the voltage division circuit is connected with a second input end of the differential amplifying circuit, an input end of the voltage division circuit is connected with an output end of the adjusting circuit, an input end of the adjusting circuit is connected with a power supply, an output end of the differential amplifying circuit is connected with the main control module, and the filtering circuit is connected between the first input end and the second input end of the differential amplifying circuit in parallel.
Further, the fan driving circuit comprises a first MOS tube and a fan interface, wherein a grid electrode of the first MOS tube is connected with the main control module, a source electrode of the first MOS tube is grounded, a drain electrode of the first MOS tube is connected with the fan interface, and the fan interface is used for being connected with the fan.
Compared with the prior art, the invention has the beneficial effects that:
the storage module of the system records detection information, the detection information comprises corresponding setting parameters and qualified standard parameters of different types of objects to be detected, the human-computer interaction module can be a combination of keys and a display screen, a touch screen can also be adopted, a worker can select the detection information corresponding to the objects to be detected through the human-computer interaction module and confirm to start detection, when an integrated circuit in the objects to be detected is detected, the worker selects the detection information through the human-computer interaction module, the main control module can call the corresponding setting parameters from the storage module to prepare for detection, then the worker connects the input end of the objects to be detected with the output end of the signal generation module, the output end is connected with the output signal detection module, the main control module confirms to start detection according to the adjusted setting parameters, and sends control signals to the signal generation module, the signal generating module sends out corresponding detection signals to the object to be detected according to the control signals, the output signal detection module comprises a counting detection circuit, a peak detection circuit and a current detection circuit, the output signal detection module can acquire acquisition information such as signal output, current state and the like of the object to be detected under the detection signals and transmit the acquisition information to the main control module, the main control module invokes qualified standard parameters from the storage module and judges by combining the acquisition information, the test result of the integrated circuit in the object to be detected is determined, the test result is transmitted to the man-machine interaction module by the main control module, a worker can conveniently check the test result through the man-machine interaction module, when the next object to be detected is tested, the two ends of the object to be detected can be directly connected with the system for testing in the same model, the test information can be reselected in different models for testing, meanwhile, the main control module counts the number of qualified and unqualified objects to be measured of the type, the count is displayed through the man-machine interaction module, the qualification rate of the objects to be measured of the type is calculated intelligently, and the objects to be measured of the type are stored through the storage module, so that the automatic detection and statistics of integrated circuits in the objects to be measured of different types are realized, the labor cost is saved, and the generation of manual recording errors is prevented.
Drawings
FIG. 1 is a schematic diagram of the overall principle of the present invention;
FIG. 2 is a schematic diagram of the principle structure of the main control module of the present invention;
FIG. 3 is a schematic diagram of a signal generating module according to the present invention;
FIG. 4 is a schematic diagram of the amplifying isolation circuit according to the present invention;
FIG. 5 is a schematic diagram of the counter switching circuit according to the present invention;
FIG. 6 is a schematic diagram of the principle structure of the Hall sensor circuit of the present invention;
FIG. 7 is a schematic diagram of the peak detection circuit according to the present invention;
FIG. 8 is a schematic diagram of the principle structure of the alarm circuit of the present invention;
FIG. 9 is a schematic diagram of a temperature detection circuit according to the present invention;
fig. 10 is a schematic diagram of a fan driving circuit according to the present invention.
Reference numerals illustrate:
1-a main control module; a 2-signal generation module; 3-an output signal detection module; 31-a count detection circuit; a 32-peak detection circuit; 33-a current detection circuit; 4-a man-machine interaction module; a 5-memory module; 6-an object to be detected; 321-a peak voltage acquisition circuit; 322-sampling circuitry; 71-a temperature sensor interface circuit; 72-a voltage dividing circuit; 73-a regulating circuit; a 74-filter circuit; 75-differential amplifying circuit.
Detailed Description
In order that the above objects, features and advantages of the invention will be readily understood, a more particular description of the invention will be rendered by reference to specific embodiments thereof which are illustrated in the appended drawings.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present invention and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the invention described herein may be implemented in sequences other than those illustrated or otherwise described herein.
In the description of the present invention, it should be noted that, unless explicitly stated and limited otherwise, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; may be a mechanical connection; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
In the description of the present specification, the descriptions of the terms "embodiment," "one embodiment," and the like mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or embodiment is included in at least one embodiment or illustrated embodiment of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same examples or implementations. Furthermore, the particular features, structures, materials, or characteristics may be combined in any suitable manner in any one or more embodiments or implementations.
As shown in fig. 1, an embodiment of the present invention provides an integrated circuit testing system, including: the invention provides an integrated circuit testing system, comprising: an integrated circuit testing system, comprising: the system comprises a main control module 1, and a signal generation module 2, an output signal detection module 3, a man-machine interaction module 4 and a storage module 5 which are connected with the main control module 1, wherein:
the controlled end of the signal generation module 2 is connected with the main control module 1, and the output end of the signal generation module is suitable for being connected with the input end of the object to be detected 6 and is used for sending a test input signal to the object to be detected 6;
the output signal detection module 3 includes:
the counting detection circuit 31 has an input end suitable for being connected with the object to be detected 6, and an output end connected with the main control module 1, and is used for detecting and counting waveforms output by the object to be detected 6 and then transmitting the waveforms to the main control module 1;
the peak detection circuit 32 has an input end adapted to be connected with the object to be detected 6, and an output end connected with the main control module 1, and is configured to detect a peak voltage of the output end of the object to be detected 6 and transmit the detected peak voltage to the main control module 1;
the current detection circuit 33 is connected with the main control module 1 and is used for transmitting the acquired current information of the two ends of the object to be detected 6 to the main control module 1;
the man-machine interaction module 4 is used for a worker to select detection information of the object to be detected 6 and display a test result of the object to be detected 6;
the storage module 5 is configured to store detection information of the object to be detected 6 and corresponding signal state information.
It should be noted that, the storage module 5 records detection information, the detection information includes setting parameters and qualified standard parameters corresponding to the objects 6 to be detected in different types, the man-machine interaction module 4 may be a combination of keys and a display screen, or may also be a touch screen, a worker may select the detection information corresponding to the objects 6 to be detected through the man-machine interaction module 4 and confirm to start detection, when detecting the integrated circuit in the objects 6 to be detected, the worker selects the detection information through the man-machine interaction module 4, the main control module 1 may retrieve the corresponding setting parameters from the storage module 5 to prepare for detection, then the worker connects the input end of the objects 6 to be detected with the output end of the signal generation module 2, the output end is connected with the output signal detection module 3, the man-machine interaction module 4 confirms to start detection, the main control module 1 determines to start detection according to the retrieved setting parameters, the signal generation module 2 sends out control signals, the signal generation module 2 sends out corresponding detection signals to the object 6 to be detected according to the control signals, the output signal detection module 3 comprises a counting detection circuit 31, a peak detection circuit 32 and a current detection circuit 33, the output signal detection module 3 can collect signal output, current state and other collection information of the object 6 to be detected under the detection signals and transmit the collection information to the main control module 1, the main control module 1 retrieves qualified standard parameters from the storage module 5 and judges by combining the collection information to determine a test result of an integrated circuit in the object 6 to be detected, the test result is transmitted to the human-computer interaction module 4 by the main control module 1, a worker can conveniently check the test result through the human-computer interaction module 4, and when the next object 6 to be detected is tested, the two ends of the object 6 to be detected can be directly connected with the system for testing in the same model, the model is different and can reselect the detection information and then test, meanwhile, the main control module 1 counts the number of qualified and unqualified objects 6 to be tested of the type, the count is also displayed through the man-machine interaction module 4, the qualification rate of the objects 6 to be tested of the model is intelligently calculated, and the objects 6 to be tested of the model are stored through the storage module 5, so that the automatic detection and statistics of integrated circuits in the objects 6 to be tested of different models are realized, the labor cost is saved, and the generation of manual recording errors is prevented.
The main control module 1 compares the counting information of the waveform output by the object to be tested 6 with the set frequency of the signal generating module 2 to determine whether the frequency and the like of the integrated circuit in the object to be tested 6 are subjected to disturbance mutation when the signal to be tested is amplified and output, and the main control module 1 determines whether the amplification output multiple of the integrated circuit in the object to be tested 6 is in a qualified range according to the detected peak voltage and current information.
In this embodiment, as shown in fig. 2, the master control module 1 may select a chip U19 with a model number STM32F103ZET6, and the chip U19 may also be connected with a clock chip U21 with a model number DS1302ZM to provide a clock model number for the chip U19, and other chips capable of implementing the functions of the master control module 1 of the system should also be in the protection scope of the present invention.
In one embodiment of the present invention, as shown in fig. 3, the signal generating module 2 is a sinusoidal signal generating module 2, a controlled end of the sinusoidal signal generating module 2 is connected to the main control module 1, and an output end is adapted to be connected to an input end of the object to be measured 6, so as to send a sinusoidal signal to the object to be measured 6.
It should be noted that, due to the curve variation characteristic of the sinusoidal signal, the sinusoidal signal is used as the test signal, and compared with the current-voltage output of different values at intervals, the output signal of the output end of the operational amplifier of the object 6 to be tested is also continuously varied and output, so that the amplified output state of the object 6 to be tested can be better observed, and the state of the integrated circuit in the object 6 to be tested can be more accurately judged, please refer to fig. 3, the signal generating module 2 adopts the sinusoidal signal generating module 2SK1 with the model number 8038, the controlled end thereof is connected with the main control module 1, the main control module 1 sends different signals to the signal generating module 2 according to the setting parameters corresponding to the object 6 to be tested, so as to drive the signal generating module 2 to send out sinusoidal wave signals with different frequencies, pulse widths, current sizes and the like to the object 6 to be tested, at this time, due to the characteristics of the amplifier, the to-be-detected object 6 amplifies and outputs the sine wave signal, the output end of the to-be-detected object 6 outputs a complete sine wave band, the count detection circuit 31 collects the sine wave and counts the sine wave, and then the sine wave is uploaded to the main control module 1, and compared with the set frequency, pulse width and the like of the signal generation module 2, whether the frequency and the like of the integrated circuit in the to-be-detected object 6 are subjected to disturbance mutation or not is confirmed when the sine wave signal is amplified and output, the peak detection circuit 32 can collect the peak voltage of the output end of the to-be-detected object 6, the current detection circuit 33 collects the current information of the two ends of the to-be-detected object 6, and the main control module 1 confirms whether the amplification output multiple of the integrated circuit in the to-be-detected object 6 is in a qualified range or not according to the detected peak voltage and current information.
In one embodiment of the present invention, the count detecting circuit 31 includes an amplifying isolation circuit and a count converting circuit, where a first input end of the amplifying isolation circuit is connected to an output end of the signal generating module 2, a first output end is adapted to be connected to an input end of the object to be detected 6, a second input end is adapted to be connected to an output end of the object to be detected 6, a second output end is connected to an input end of the count converting circuit, and an output end of the count converting circuit is connected to the main control module 1, and is used for converting a sine wave signal collected by the amplifying isolation circuit and outputting the converted sine wave signal to the main control module 1.
It should be noted that, in this embodiment, as shown in fig. 4, the amplifying isolation circuit may amplify and isolate the sine wave signal by using a chip U4 with the model MC33072ADR2G, the sine wave signal generated by the signal generating module 2 enters the chip U10 through the 2 pin of the chip U4 and is output to the input end of the object to be tested 6 through the 1 pin of the chip U4 after being isolated and amplified, the output sine wave signal at the output end of the object to be tested 6 enters the chip U10 through the 6 pin of the chip U4 and is output to the counting conversion circuit through the 7 pin of the chip U4 after being isolated and amplified, and the sine wave signals at both ends of the object to be tested 6 are all isolated and amplified, so that the interference signals in the sine wave signals can be effectively filtered, so that the detection result is more accurate, as shown in fig. 5, the sine wave signal output to the counting conversion circuit detects one sine wave band and counts, and the digital signal of the counting result is transmitted to the main control module 1, the counting result is compared with the set frequency of the object to be tested 6, and the integrated signal in the object to be tested 6 is amplified when the frequency is disturbed by the amplifying circuit.
In one embodiment of the present invention, as shown in fig. 7, the peak detection circuit 32 includes a peak voltage acquisition circuit 321 and a sampling circuit 322, where the peak voltage acquisition circuit 321 includes a first comparator, a first diode, a first capacitor and a first voltage follower, the input end of the first comparator is connected to the output end of the object to be detected 6, the output end of the first comparator is connected to the first capacitor through the first diode, the input end of the first voltage follower is connected to the first capacitor, and the output end of the first voltage follower is connected to the main control module 1 through the sampling circuit 322.
It should be noted that, as shown in fig. 7, J7 is a port connected to the object 6 to be measured, and is used for connecting to an output end of the object 6 to be measured, receiving a sine wave signal amplified by an integrated circuit in the object 6 to be measured, outputting the output signal of the object 6 to be measured to the first capacitor C57 via the first diode D6, charging the first capacitor C57, in order to reduce the influence of the voltage drop of the first diode D6, the peak voltage acquisition circuit 321 further includes a first comparator U12, where the first comparator U12 is connected to the first diode D6, and the circuit is regarded as an ideal diode, so that the charging of the first capacitor C57 can be accelerated, the stability of the peak voltage acquisition circuit 321 is ensured, when the output signal voltage of the object 6 to be measured is greater than the voltage of the end of the first capacitor C57, the first diode D6 is continuously turned on, charging the first capacitor C57 to reach the peak value of the output signal of the object 6 to be measured, at this time, the voltage at the end of the first capacitor C57 is the peak voltage of the output signal of the object to be detected 6, in order to avoid the influence of the latter circuit on the peak voltage, a first voltage follower U11 is used as the isolation of the front and rear two-stage circuits, because the output voltage of the voltage follower follows the change of the input voltage, the input end of the first voltage follower U11 is connected with the first capacitor C57, therefore, the voltage at the output end of the first voltage follower U11 is the end voltage of the first capacitor C57 at this time, namely the peak voltage, the peak voltage is transmitted to the main control module 1 through the sampling circuit 322, the main control module 1 combines the peak voltage with the qualification standard parameters of the object to be detected 6 to confirm whether the object to be detected 6 is qualified, then, when the output signal voltage of the object to be detected 6 is smaller than the voltage at the end of the first capacitor C57, the first diode D6 is cut off until the next peak value at the output end of the object to be detected 6, the output end voltage of the object to be detected 6 is larger than the first capacitor C57 again, the first capacitor C57 is charged again, and peak voltage collection is performed.
In one embodiment of the present invention, as shown in fig. 6, the current detection circuit 33 includes two hall sensor circuits, where the hall sensor circuits include a hall sensor and a first triode, the base electrode of the first triode is connected to the signal end of the hall sensor, the collector electrode of the first triode is grounded, the emitter electrode of the first triode is connected to the power end of the hall sensor and the input end of the main control module 1, and the hall sensors in the two hall sensor circuits are respectively disposed at connection lines at two ends of the object to be measured 6.
It should be noted that, in this embodiment, the type of the hall sensor U17 may be FS177LF-B, the signal end of the hall sensor U17 outputs a detection signal to the base electrode of the first triode Q5, the collector electrode of the first triode Q5 is connected to the power end of the hall sensor, the emitter electrode is connected to ground, the collector electrode outputs the detection signal to the main control module 1, so as to effectively invert the detection signal of the hall sensor, increase the anti-interference capability, make the detection result more accurate, and the hall sensors in the two hall sensor circuits are respectively disposed at the connection lines at two ends of the object 6 to be detected, so that real-time detection of the current at the input end and the output end of the object 6 to be detected is realized, and the main control module 1 determines the amplifying performance of the integrated circuit in the object 6 to be detected according to the current at two ends of the object 6 to be detected, so as to compare with the qualified standard parameters, and accurately determine whether the object 6 to be detected is qualified.
In one embodiment of the present invention, the integrated circuit testing system further comprises a communication module, the communication module comprising:
the network port circuit is connected with the main control module 1 and is used for wired communication between the main control module 1 and a control center;
and the WIFI circuit is connected with the main control module 1 and is used for wireless communication between the main control module 1 and a control center.
It should be noted that, adopting communication module, main control module 1 can uploading the testing result to the control center to the thing 6 that awaits measuring, makes things convenient for control center personnel to grasp in time the testing result, and simultaneously, but when needs increase new type thing 6 that awaits measuring or have thing 6 that awaits measuring to detect information to change, control center can send the information through communication module long-range, carries out data modification, and communication module adopts wired communication and wireless communication to combine, guarantees that the communication is stable.
In one embodiment of the present invention, as shown in fig. 8, the integrated circuit testing system further includes an alarm circuit, where the alarm circuit includes a speaker, a protection diode, and a second triode, the base of the second triode is connected to the main control module 1, the collector of the second triode is grounded, the emitter of the second triode is connected to the speaker, and the protection diode is connected in parallel to two ends of the speaker.
It should be noted that, when the main control module 1 judges that the object 6 to be detected is unqualified according to the information collected by the output signal detection module 3, an alarm signal can be sent to the base electrode of the second triode Q7, the second triode Q7 is conducted, two ends of the loudspeaker BUZZER2 are electrified to send out an alarm sound to remind a worker to pay attention to timely place the unqualified object 6 to be detected independently, the situation that the unqualified object 6 is mixed into the qualified object 6 caused by artificial carelessness is avoided, and the protection diode D8 is connected to two ends of the loudspeaker BUZER 2 in parallel and used for protecting the loudspeaker BUZER 2 so as to stably send out alarm information.
In one embodiment of the present invention, the integrated circuit testing system further includes a temperature detection circuit and a fan driving circuit, where the temperature detection circuit is connected to the main control module 1 and is used to transmit detected ambient temperature information to the main control module 1; the controlled end of the fan driving circuit is connected with the main control module 1, and the output end is suitable for being connected with a fan and used for being controlled by the main control module 1 to drive the fan.
It should be noted that, because this integrated circuit test system needs to send sine wave signal and detect when using, the condition of generating heat appears, and the high temperature can influence the steady operation of system, consequently, has adopted temperature detection circuit to detect ambient temperature information and transmit for main control module 1, and when main control module 1 judges that the temperature is too high, can drive the fan through fan drive circuit, cools down to guarantee the steady operation of integrated circuit test system.
In one embodiment of the present invention, the temperature detection circuit includes a temperature sensor interface circuit 71, a voltage division circuit 72, a regulating circuit 73, a filter circuit 74 and a differential amplifying circuit 75, where the temperature 5 sensor interface circuit 71 is adapted to be connected to a temperature sensor, a first end of the temperature sensor interface circuit 71 is connected to a first input end of the differential amplifying circuit 75, a second end of the temperature sensor interface circuit is connected to a first output end of the voltage division circuit 72, a second output end of the voltage division circuit 72 is connected to a second input end of the differential amplifying circuit 75, an input end of the voltage division circuit is connected to an output end of the regulating circuit 73, an input end of the regulating circuit 73 is connected to a power supply, an output end of the differential amplifying circuit 75 is connected to the master control module 1, and 0 the filter circuit 74 is connected in parallel between the first input end and the second input end of the differential amplifying circuit 75.
It should be noted that, as shown in fig. 9, the temperature sensor interface circuit 71 includes an interface BJ1 for connecting a temperature sensor, and the temperature sensor may be disposed on a circuit board of the system for detecting the system
The temperature sensor detection signal is output to the first input end of the differential amplifying circuit 75 through the interface BJ1, the differential amplifying circuit 75 can adopt a differential amplifying chip U8 with the model of AD623ARZ-R7, the common mode model in the circuit can be effectively filtered, the anti-interference capability of the temperature detection signal is improved, the temperature detection is more accurate, the second input end of the differential amplifying circuit 75 is connected with the output end of the voltage dividing circuit 72, the input end of the voltage dividing circuit 72 is connected with a 5V power supply through the regulating circuit 73, the regulating circuit 73 adopts an adjustable resistor R39, the resistance value of the adjustable resistor R39 can be changed, the voltage division of the voltage dividing circuit 72 can be changed, the voltage output of the voltage dividing circuit 72 to the second input end of the differential amplifying circuit 75 is changed,
because the first input end and the second input end of the differential amplifying circuit 75 are subtracted and then output, the voltage output of the second input end of the differential amplifying circuit 75 is changed by the voltage dividing circuit 72, the threshold value of the temperature output can be adjusted, when the ambient temperature does not reach the threshold value, the main control module 1 does not receive the temperature output signal, when the ambient temperature is
When the temperature exceeds the threshold value, the differential amplification circuit 75 outputs 5 temperature output signals with different voltages to the main control module 1 according to the ambient temperature, and the main control module 1 can accurately acquire the temperature according to the temperature output signals to control the fan control signals of the fan driving circuit so as to adjust the ambient temperature.
In one embodiment of the present invention, as shown in fig. 10, the fan driving circuit includes a first MOS transistor and a fan interface, where a gate of the first MOS transistor is connected to the main control module 1, a source is grounded, a drain is connected to the fan interface, and the fan interface is used to connect to the fan.
It should be noted that, the main control module 1 sends out fan drive signal to the grid of first MOS pipe Q6, first MOS pipe Q6 switches on, fan interface F1's both ends are on electricity, fan interface F1 connects the fan, the fan is electrified to cool down the circuit board that this system is located, adopt the control mode of MOS pipe simple and convenient, simultaneously, if need control fan rotational speed, the fan drive signal that main control module 1 sent can be PWM signal, pass through PWM signal adjustment first MOS pipe Q6's conduction angle, realize according to the temperature difference, the adjustment passes through the fan current, realize fan wind-force size adjustment.
Although the present disclosure is described above, the scope of protection of the present disclosure is not limited thereto. Various changes and modifications may be made by one skilled in the art without departing from the spirit and scope of the disclosure, and these changes and modifications will fall within the scope of the invention.
Claims (9)
1. An integrated circuit testing system, comprising: the device comprises a main control module (1), and a signal generation module (2), an output signal detection module (3), a man-machine interaction module (4) and a storage module (5) which are connected with the main control module (1);
the controlled end of the signal generation module (2) is connected with the main control module (1), and the output end of the signal generation module is suitable for being connected with the input end of an object to be tested (6) and is used for sending a test input signal to the object to be tested (6);
the object to be detected (6) is an amplifier;
the output signal detection module (3) includes:
the input end of the counting detection circuit (31) is suitable for being connected with the object to be detected (6), and the output end of the counting detection circuit is connected with the main control module (1) and is used for detecting and counting waveforms output by the object to be detected (6) and then transmitting the waveforms to the main control module (1);
the input end of the peak detection circuit (32) is suitable for being connected with the object to be detected (6), and the output end of the peak detection circuit is connected with the main control module (1) and is used for detecting the peak voltage of the output end of the object to be detected (6) and then transmitting the peak voltage to the main control module (1);
the current detection circuit (33) is connected with the main control module (1) and is used for transmitting the acquired current information of the two ends of the object to be detected (6) to the main control module (1);
the signal generation module (2) is a sine signal generation module (2), the controlled end of the sine signal generation module (2) is connected with the main control module (1), and the output end of the sine signal generation module is suitable for being connected with the input end of an object to be detected (6) and is used for sending sine wave signals to the object to be detected (6);
the driving signal generating module (2) sends sine wave signals with different frequencies, pulse widths and current sizes to the to-be-detected object (6), the to-be-detected object (6) can amplify and output the sine wave signals, the output end of the to-be-detected object (6) outputs a complete sine wave band, the counting detection circuit (31) can collect sine waves and count and upload the sine waves to the main control module (1), the frequency and the pulse widths of the integrated circuits in the to-be-detected object (6) are compared with the set frequency and the pulse widths of the signal generating module (2) to confirm whether the frequency of the integrated circuits in the to-be-detected object (6) is subjected to disturbance mutation when the sine wave signals are amplified and output, the peak detection circuit (32) collects peak voltages of the output ends of the to-be-detected object (6), and the current detection circuit (33) collects current information of the two ends of the to-be-detected object (6), and the main control module (1) confirms whether the amplification output multiple of the integrated circuits in the to be-detected object (6) is within a qualified range or not according to the detected peak voltages and the current information.
2. The integrated circuit test system according to claim 1, wherein the count detection circuit (31) comprises an amplifying isolation circuit and a count conversion circuit, a first input end of the amplifying isolation circuit is connected with an output end of the signal generation module (2), a first output end is suitable for being connected with an input end of the object to be tested (6), a second input end is suitable for being connected with an output end of the object to be tested (6), a second output end is connected with an input end of the count conversion circuit, and an output end of the count conversion circuit is connected with the main control module (1) and is used for converting a sine wave signal collected by the amplifying isolation circuit and outputting the sine wave signal to the main control module (1).
3. The integrated circuit test system according to claim 1, wherein the peak detection circuit (32) comprises a peak voltage acquisition circuit (321) and a sampling circuit (322), the peak voltage acquisition circuit (321) comprises a first comparator, a first diode, a first capacitor and a first voltage follower, the input end of the first comparator is connected with the output end of the object to be tested (6), the output end of the first comparator is connected with the first capacitor through the first diode, the input end of the first voltage follower is connected with the first capacitor, and the output end of the first voltage follower is connected with the main control module (1) through the sampling circuit (322).
4. The integrated circuit test system according to claim 1, wherein the current detection circuit (33) comprises two paths of hall sensor circuits, the hall sensor circuits comprise hall sensors and a first triode, the base electrode of the first triode is connected with the signal end of the hall sensors, the collector electrode of the first triode is grounded, the emitter electrode of the first triode is respectively connected with the power end of the hall sensors and the input end of the main control module (1), and the hall sensors in the two paths of hall sensor circuits are respectively arranged at connecting lines at two ends of an object (6) to be tested.
5. The integrated circuit testing system of claim 1, further comprising a communication module, the communication module comprising:
the network port circuit is connected with the main control module (1) and is used for wired communication between the main control module (1) and the control center;
and the WIFI circuit is connected with the main control module (1) and is used for wireless communication between the main control module (1) and the control center.
6. The integrated circuit test system according to claim 1, further comprising an alarm circuit, wherein the alarm circuit comprises a speaker, a protection diode and a second triode, the base of the second triode is connected with the main control module (1), the collector of the second triode is grounded, the emitter of the second triode is connected with the speaker, and the protection diode is connected in parallel with two ends of the speaker.
7. The integrated circuit test system of claim 1, further comprising a temperature detection circuit and a fan drive circuit, the temperature detection circuit being connected to the main control module (1) for communicating detected ambient temperature information to the main control module (1); the controlled end of the fan driving circuit is connected with the main control module (1), and the output end of the fan driving circuit is suitable for being connected with a fan and is used for being controlled by the main control module (1) to drive the fan.
8. The integrated circuit test system according to claim 7, wherein the temperature detection circuit comprises a temperature sensor interface circuit (71), a voltage division circuit (72), a regulating circuit (73), a filter circuit (74) and a differential amplification circuit (75), the temperature sensor interface circuit (71) is adapted to be connected to a temperature sensor, a first end of the temperature sensor interface circuit (71) is connected to a first input of the differential amplification circuit (75), a second end is connected to a first output of the voltage division circuit (72), a second output of the voltage division circuit (72) is connected to a second input of the differential amplification circuit (75), an input of the regulating circuit (73) is connected to an output of the regulating circuit (73), an output of the differential amplification circuit (75) is connected to the master module (1), and the filter circuit (74) is connected in parallel between the first input and the second input of the differential amplification circuit (75).
9. The integrated circuit test system of claim 8, wherein the fan drive circuit comprises a first MOS transistor and a fan interface, the gate of the first MOS transistor is connected to the main control module (1), the source is grounded, the drain is connected to the fan interface, and the fan interface is used for connecting the fan.
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