CN115808611A - Integrated circuit test system - Google Patents
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Abstract
The invention relates to the technical field of integrated circuit test, and provides an integrated circuit test system, which comprises: the device comprises a main control module, a signal generation module, an output signal detection module, a human-computer interaction module and a storage module, wherein a controlled end of the signal generation module is connected with the main control module, an output end of the signal generation module is suitable for being connected with an input end of an object to be detected and used for sending a test input signal to the object to be detected, an output end of the output signal detection module is connected with the main control module, an input end of the output signal detection module is suitable for being connected with the object to be detected and used for detecting the signal state of the object to be detected and transmitting the signal state to the main control module, the human-computer interaction module is connected with the main control module, and the storage module is connected with the main control module and used for storing detection information and corresponding signal state information of the object to be detected; the invention can realize automatic detection and statistics of integrated circuits in objects to be detected of different types.
Description
Technical Field
The invention relates to the technical field of integrated circuit testing, in particular to an integrated circuit testing system.
Background
Along with the development of the society, the types of chips are more and more, the detection of an integrated circuit in the chip plays a crucial role in ensuring the performance of the chip, an operational amplifier is used as one of commonly used chips, most manufacturers can test the integrated circuit in the chip to judge the qualification rate, in the traditional detection mode, a worker can use the operational amplifier as a to-be-detected object, one end of two input ends of the operational amplifier is grounded, the other end of the operational amplifier is connected with a signal generating device such as a waveform generator, corresponding parameters are set on the signal generating device according to the type of the to-be-detected object, the test is carried out, the output end of the to-be-detected object is connected with a detection device such as a waveform and a current, the output condition is observed to record the qualification state of the to-be-detected object, the manual operation mode has more steps, the parameters need to be manually configured and the qualification condition of the integrated circuit of the to-be-detected object with different types is recorded every time, the automation degree is poor, the efficiency is low, and the statistics easily causes statistical errors.
Disclosure of Invention
The invention solves the problem of how to realize automatic detection and statistics of integrated circuits in objects to be detected of different types.
To solve the above problems, the present invention provides an integrated circuit test system, comprising: an integrated circuit test system, comprising: the main control module, and with signal generation module, output signal detection module, man-machine interaction module and the storage module that main control module connects, wherein:
the controlled end of the signal generation module is connected with the main control module, and the output end of the signal generation module is suitable for being connected with the input end of an object to be tested and used for sending a test input signal to the object to be tested;
the output signal detection module includes:
the input end of the counting detection circuit is suitable for being connected with the object to be detected, and the output end of the counting detection circuit is connected with the main control module and used for detecting and counting the waveform output by the object to be detected and then transmitting the waveform to the main control module;
the input end of the peak value detection circuit is suitable for being connected with the object to be detected, and the output end of the peak value detection circuit is connected with the main control module and used for detecting the peak value voltage of the output end of the object to be detected and transmitting the detected peak value voltage to the main control module;
the current detection circuit is connected with the main control module and is used for transmitting the collected current information of the two ends of the object to be detected to the main control module;
the human-computer interaction module is used for selecting the detection information of the object to be detected by a worker and displaying the test result of the object to be detected;
the storage module is used for storing the detection information of the object to be detected and the corresponding signal state information.
Furthermore, the signal generation module is a sine signal generation module, the controlled end of the sine signal generation module is connected with the main control module, and the output end of the sine signal generation module is suitable for being connected with the input end of the object to be detected and used for sending a sine wave signal to the object to be detected.
Furthermore, the count detection circuitry is including enlargiing buffer circuit and count converting circuit, the first input of enlargiing buffer circuit is connected the output of signal generation module, first output is suitable for to be connected the input of determinand, the second input is suitable for to be connected the output of determinand, the second output with count converting circuit's input is connected, count converting circuit's output with host system connects for export to host system after the sine wave signal conversion that gathers it.
Furthermore, the peak detection circuit comprises a peak voltage acquisition circuit and a sampling circuit, the peak voltage acquisition circuit comprises a first comparator, a first diode, a first capacitor and a first voltage follower, the input end of the first comparator is connected with the output end of the object to be detected, the output end of the first comparator is connected with the first capacitor through the first diode, the input end of the first voltage follower is connected with the first capacitor, and the output end of the first voltage follower is connected with the main control module through the sampling circuit.
Furthermore, the current detection circuit comprises two hall sensor circuits, the hall sensor circuit comprises a hall sensor and a first triode, the base electrode of the first triode is connected with the signal end of the hall sensor, the collector electrode of the first triode is grounded, the emitter electrode of the first triode is respectively connected with the power end of the hall sensor and the input end of the main control module, and the hall sensors in the two hall sensor circuits are respectively arranged at the connecting lines at the two ends of the object to be detected.
Further, the integrated circuit test system further includes a communication module, and the communication module includes:
the network port circuit is connected with the main control module and is used for wired communication between the main control module and the control center;
and the WIFI circuit is connected with the main control module and is used for wireless communication between the main control module and the control center.
Furthermore, the integrated circuit test system also comprises an alarm circuit, wherein the alarm circuit comprises a loudspeaker, a protection diode and a second triode, the base electrode of the second triode is connected with the main control module, the collector electrode of the second triode is grounded, the emitter electrode of the second triode is connected with the loudspeaker, and the protection diode is connected with the two ends of the loudspeaker in parallel.
Furthermore, the integrated circuit test system also comprises a temperature detection circuit and a fan driving circuit, wherein the temperature detection circuit is connected with the main control module and is used for transmitting the detected environmental temperature information to the main control module; the controlled end of the fan driving circuit is connected with the main control module, and the output end of the fan driving circuit is suitable for being connected with a fan and is used for being controlled by the main control module to drive the fan.
Further, the temperature detection circuit includes temperature sensor interface circuit, bleeder circuit, regulating circuit, filter circuit and difference amplifier circuit, temperature sensor interface circuit is suitable for connecting temperature sensor, temperature sensor interface circuit's first end with difference amplifier circuit's first input is connected, the second end with bleeder circuit's first output is connected, bleeder circuit's second output with difference amplifier circuit's second input is connected, the input with regulating circuit's output is connected, regulating circuit's input power connection, difference amplifier circuit's output with host system connects, filter circuit connects in parallel between difference amplifier circuit's first input and the second input.
Furthermore, the fan driving circuit comprises a first MOS transistor and a fan interface, the gate of the first MOS transistor is connected to the main control module, the source is grounded, the drain is connected to the fan interface, and the fan interface is used for connecting the fan.
Compared with the prior art, the invention has the beneficial effects that:
the storage module of the system records detection information, the detection information comprises corresponding setting parameters and qualified standard parameters of objects to be detected of different types during detection, the man-machine interaction module can be a combination of a key and a display screen, and can also adopt a touch screen, a worker can select the detection information corresponding to the objects to be detected through the man-machine interaction module and confirm the start of detection, when detecting an integrated circuit in the objects to be detected, the worker selects the detection information through the man-machine interaction module, the main control module can call the corresponding setting parameters from the storage module to prepare the detection, then the worker connects the input end of the objects to be detected with the output end of the signal generation module, the output end is connected with the output signal detection module, when the man-machine interaction module confirms the start of detection, the main control module sends control signals to the signal generation module according to the called setting parameters, the signal generation module sends out corresponding detection signals to the object to be detected according to the control signals, the output signal detection module comprises a counting detection circuit, a peak value detection circuit and a current detection circuit, the output signal detection module can collect the signal output, the current state and other collection information of the object to be detected under the detection signals and transmit the collection information to the main control module, the main control module retrieves qualified standard parameters from the storage module and judges according to the collection information to determine the test result of the integrated circuit in the object to be detected, the test result is transmitted to the man-machine interaction module by the main control module, a worker can conveniently check the test result through the man-machine interaction module, when the next object to be detected is tested, the model is the same, the two ends of the object to be detected can be directly connected with the system for testing, the model is different, the test can be carried out after the detection information is reselected, and simultaneously the main control module counts the number of the qualified and unqualified objects to be detected, the counting is also displayed through the man-machine interaction module, the qualification rate of the model to-be-tested object is intelligently calculated, and the counting is stored through the storage module, so that the automatic detection and statistics of the integrated circuits in the to-be-tested objects of different models are realized, the labor cost is saved, and the generation of manual recording errors is prevented.
Drawings
FIG. 1 is a schematic view of the overall principle of the present invention;
FIG. 2 is a schematic diagram of a main control module according to the present invention;
FIG. 3 is a schematic structural diagram of a signal generating module according to the present invention;
FIG. 4 is a schematic diagram of the schematic structure of the amplifying and isolating circuit of the present invention;
FIG. 5 is a schematic diagram of a counting conversion circuit according to the present invention;
FIG. 6 is a schematic diagram of the Hall sensor circuit of the present invention;
FIG. 7 is a schematic diagram of a peak detection circuit according to the present invention;
FIG. 8 is a schematic diagram of the alarm circuit of the present invention;
FIG. 9 is a schematic diagram of the temperature detection circuit according to the present invention;
FIG. 10 is a schematic diagram of a fan driving circuit according to the present invention.
Description of reference numerals:
1-a main control module; 2-a signal generating module; 3-output signal detection module; 31-a count detection circuit; 32-peak detection circuit; 33-a current detection circuit; 4-a human-computer interaction module; 5-a storage module; 6-the substance to be detected; 321-a peak voltage acquisition circuit; 322-a sampling circuit; 71-temperature sensor interface circuit; 72-a voltage divider circuit; 73-a regulating circuit; 74-a filter circuit; 75-differential amplification circuit.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in detail below.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein.
In the description of the present invention, it should be noted that unless otherwise explicitly stated or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; may be a mechanical connection; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
In the description herein, references to the terms "an embodiment," "one embodiment," and "one implementation," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or implementation is included in at least one embodiment or example implementation of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or implementation. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or implementations.
As shown in fig. 1, an embodiment of the present invention provides an integrated circuit testing system, including: the invention provides an integrated circuit test system, comprising: an integrated circuit test system, comprising: the main control module 1, and with signal generation module 2, output signal detection module 3, human-computer interaction module 4 and storage module 5 that main control module 1 is connected, wherein:
the controlled end of the signal generating module 2 is connected with the main control module 1, and the output end of the signal generating module is suitable for being connected with the input end of an object to be tested 6 and used for sending a test input signal to the object to be tested 6;
the output signal detection module 3 includes:
the input end of the counting detection circuit 31 is suitable for being connected with the object to be detected 6, and the output end of the counting detection circuit is connected with the main control module 1, and the counting detection circuit is used for detecting and counting the waveform output by the object to be detected 6 and then transmitting the waveform to the main control module 1;
a peak detection circuit 32, an input end of which is adapted to be connected to the object 6 to be detected, and an output end of which is connected to the main control module 1, and which is used for detecting a peak voltage at the output end of the object 6 to be detected and transmitting the detected peak voltage to the main control module 1;
the current detection circuit 33 is connected with the main control module 1 and is used for transmitting the acquired current information at the two ends of the object to be detected 6 to the main control module 1;
the human-computer interaction module 4 is used for a worker to select the detection information of the object to be detected 6 and display the test result of the object to be detected 6;
the storage module 5 is used for storing the detection information of the object to be detected 6 and the corresponding signal state information.
It should be noted that, the storage module 5 records the detection information, the detection information includes the corresponding setting parameters and qualified standard parameters of the objects 6 to be tested of different types during the detection, the man-machine interaction module 4 can be the combination of a key and a display screen, or a touch screen can be adopted, the staff can select the detection information corresponding to the objects 6 to be tested through the man-machine interaction module 4 and confirm the start of the detection, when detecting the integrated circuit in the objects 6 to be tested, the staff selects the detection information through the man-machine interaction module 4, the main control module 1 calls the corresponding setting parameters from the storage module 5 to prepare the detection, then the staff connects the input end of the objects 6 to be tested with the output end of the signal generation module 2, the output end is connected with the output signal detection module 3, when the start of the detection is confirmed by the man-machine interaction module 4, the main control module 1 sends a control signal to the signal generation module 2 according to the control signal, the signal generation module 2 sends a corresponding detection signal to be tested 6 according to the control signal, the output signal detection module 3 includes the counting circuit 31, the peak detection circuit 32 and the current detection circuit 33, the output signal detection module 3 can directly check the detection result of the integrated circuit 6, the integrated circuit 6 to be tested, the integrated circuit can be tested, the integrated circuit 6, the master control module can directly check the state of the integrated circuit 6, the integrated circuit can check the integrated circuit under the state of the integrated circuit 6, the integrated circuit under the detection system, the detection result, the detection module 6, the detection module 4, the testing is carried out after the detection information can be reselected when the models are different, meanwhile, the main control module 1 counts the number of qualified and unqualified objects to be tested 6 of the types, the counting is also displayed through the human-computer interaction module 4, the qualification rate of the objects to be tested 6 of the models is intelligently calculated, and the objects to be tested are stored through the storage module 5, so that the automatic detection and statistics of integrated circuits in the objects to be tested 6 of different models are realized, the labor cost is saved, and the generation of manual recording errors is prevented.
The main control module 1 compares the counting information of the waveform output by the object to be tested 6 with the set frequency of the signal generation module 2 to determine whether the frequency and the like of the integrated circuit in the object to be tested 6 are disturbed and mutated when the signal to be tested is amplified and output, and the main control module 1 determines whether the amplification output multiple of the integrated circuit in the object to be tested 6 is in a qualified range according to the detected peak voltage and current information.
In this embodiment, as shown in fig. 2, the master control module 1 may select a chip U19 with a model of STM32F103ZET6, and the chip U19 may further be connected to a clock chip U21 with a model of DS1302ZM to provide a clock model for the chip U19, and other chips capable of implementing functions of the master control module 1 of the system should also be within the protection scope of the present invention.
In an embodiment of the present invention, as shown in fig. 3, the signal generating module 2 is a sine signal generating module 2, a controlled end of the sine signal generating module 2 is connected to the main control module 1, and an output end of the sine signal generating module 2 is suitable for being connected to an input end of an object to be measured 6, and is configured to send a sine wave signal to the object to be measured 6.
It should be noted that, because of the curve change characteristic of the sinusoidal signal, the sinusoidal signal is used as the test signal, and compared with the current and voltage output at different intervals and with different values, the output signal of the output end of the operational amplifier, that is, the object 6, is also output in a continuous change manner, the amplified output state of the object 6 can be better observed, and further, the state judgment of the integrated circuit in the object 6 is more accurate, please refer to fig. 3, the signal generation module 2 adopts the model 8038 sinusoidal signal generation module 2SK1, the controlled end of which is connected with the main control module 1, the main control module 1 sends different signals to the signal generation module 2 according to the setting parameters corresponding to the object 6, so as to drive the signal generation module 2 to send out different sinusoidal signals of frequency, pulse width, current magnitude, and the like to the object 6, at this time, due to the characteristic of the amplifier, the object 6 amplifies and outputs the sinusoidal wave signal, the output end of the object 6 outputs a complete sinusoidal wave, the counting detection circuit 31 collects and counts the sinusoidal waves, and then uploads the signals to the main control module 1, and compares the frequency, the peak value of the amplified and the peak value of the amplified current of the integrated circuit 6 in the frequency amplification circuit with the set frequency, and the peak value of the integrated circuit 32, and whether the peak value of the detected by the integrated circuit 6 is detected by the integrated circuit, and whether the peak value of the detected by the integrated circuit 6.
In an embodiment of the present invention, the count detection circuit 31 includes an amplifying and isolating circuit and a count conversion circuit, a first input end of the amplifying and isolating circuit is connected to an output end of the signal generation module 2, a first output end of the amplifying and isolating circuit is suitable for being connected to an input end of the object to be measured 6, a second input end of the amplifying and isolating circuit is suitable for being connected to an output end of the object to be measured 6, a second output end of the amplifying and isolating circuit is connected to an input end of the count conversion circuit, and an output end of the count conversion circuit is connected to the main control module 1, and is configured to convert the sine wave signal collected by the count conversion circuit and output the converted sine wave signal to the main control module 1.
It should be noted that, as shown in fig. 4, in this embodiment, the amplifying and isolating circuit may adopt a chip U4 with a model of MC33072ADR2G to amplify and isolate the sinusoidal wave signal, the sinusoidal wave signal generated by the signal generating module 2 enters a chip U10 through a pin 2 of the chip U4 to be isolated and amplified, and then is output to the input end of the object to be tested 6 through a pin 1 of the chip U4, the output sinusoidal wave signal at the output end of the object to be tested 6 enters a chip U10 to be isolated and amplified, and then is output to the counting and converting circuit through a pin 7 of the chip U4, the sinusoidal wave signals at both ends of the object to be tested 6 are both isolated and amplified, so as to effectively filter the interference signal in the sinusoidal wave signal, so that the detection result is more accurate, as shown in fig. 5, the output sinusoidal wave signal at the output end of the object to be tested 6 is isolated by the amplifying and then output to the counting and converting circuit, the counting circuit detects a sinusoidal wave segment, and transmits the digital signal of the counting result to the main control module 1, and the main control module 1 compares the counting result with the set frequency of the signal generating module 2, and determines whether the integrated circuit in the object to amplify and amplify the sinusoidal wave at the sinusoidal wave.
In an embodiment of the present invention, as shown in fig. 7, the peak detection circuit 32 includes a peak voltage acquisition circuit 321 and a sampling circuit 322, the peak voltage acquisition circuit 321 includes a first comparator, a first diode, a first capacitor, and a first voltage follower, an input end of the first comparator is connected to an output end of the object to be measured 6, an output end of the first comparator is connected to the first capacitor through the first diode, an input end of the first voltage follower is connected to the first capacitor, and an output end of the first voltage follower is connected to the main control module 1 through the sampling circuit 322.
It should be noted that, as shown in fig. 7, J7 is a port connected to the object 6 to be tested, and is used for connecting an output end of the object 6 to be tested and receiving the sine wave signal amplified by the integrated circuit in the object 6 to be tested, the output signal of the object 6 to be tested is output to the first capacitor C57 through the first diode D6, the first capacitor C57 is charged, in order to reduce the influence of the voltage drop of the first diode D6, the peak voltage collecting circuit 321 further includes the first comparator U12, the first comparator U12 is connected to the first diode D6, so as to form a circuit which can be regarded as an ideal diode, which can accelerate the charging of the first capacitor C57 and ensure the stability of the peak voltage collecting circuit 321, when the output signal voltage of the object 6 to be tested is greater than the voltage at the first capacitor C57, the first diode D6 is continuously conducted to charge the first capacitor C57 to reach the peak value of the output signal of the object 6 to be tested, at this time, the end voltage of the first capacitor C57 is the peak voltage of the output signal of the object 6 to be measured, in order to avoid the influence of the post-stage circuit on the peak voltage, the first voltage follower U11 is adopted as the isolation of the front stage circuit and the post-stage circuit, because the output voltage of the voltage follower changes along with the input voltage, the input end of the first voltage follower U11 is connected with the first capacitor C57, therefore, the output end voltage of the first voltage follower U11 is the end voltage of the first capacitor C57 at the moment, namely, the peak voltage is transmitted to the main control module 1 through the sampling circuit 322, the main control module 1 combines the peak voltage with the qualified standard parameters of the object 6 to be measured of the model, and confirms whether the object 6 to be measured is qualified, then, when the output signal voltage of the object 6 to be measured is smaller than the end voltage of the first capacitor C57, the first diode D6 is cut off until the next peak value of the output end of the object 6 to be measured, the output end voltage of the object 6 to be measured is larger than the first capacitor C57 again, and charging the first capacitor C57 again for peak voltage collection.
In an embodiment of the present invention, as shown in fig. 6, the current detection circuit 33 includes two hall sensor circuits, each hall sensor circuit includes a hall sensor and a first triode, a base of the first triode is connected to a signal terminal of the hall sensor, a collector of the first triode is grounded, an emitter of the first triode is connected to a power source terminal of the hall sensor and an input terminal of the main control module 1, and the hall sensors in the two hall sensor circuits are respectively disposed at connecting lines at two ends of the object to be measured 6.
It should be noted that, in this embodiment, the model of the hall sensor U17 may be FS177LF-B, the hall sensor U17 signal end outputs the detection signal to the base of the first triode Q5, the collector of the first triode Q5 is connected to the power end of the hall sensor, the emitter is connected to the ground, the collector outputs the detection signal to the main control module 1, the detection signal of the hall sensor can be effectively inverted, so as to increase the anti-interference capability, and the detection result is more accurate, the hall sensors in the two hall sensor circuits are respectively disposed at the connecting lines at the two ends of the object to be detected 6, so as to realize real-time detection of the input and output currents of the object to be detected 6, and the main control module 1 determines the amplification performance of the integrated circuit in the object to be detected 6 according to the currents at the two ends of the object to be detected 6, so as to compare with the qualified standard parameters, and accurately determine whether the object to be detected 6 is qualified.
In one embodiment of the present invention, the integrated circuit testing system further comprises a communication module, the communication module comprising:
the network port circuit is connected with the main control module 1 and is used for wired communication between the main control module 1 and a control center;
and the WIFI circuit is connected with the main control module 1 and is used for wireless communication between the main control module 1 and the control center.
It should be noted that, by adopting the communication module, the main control module 1 can upload the detection result of the object to be detected 6 to the control center, so that the control center can conveniently grasp the detection result in time, meanwhile, when a new type of object to be detected 6 needs to be added or the detection information of the object to be detected 6 is changed, the control center can remotely send information through the communication module to modify data, and the communication module adopts the combination of wired communication and wireless communication to ensure stable communication.
In an embodiment of the present invention, as shown in fig. 8, the integrated circuit testing system further includes an alarm circuit, where the alarm circuit includes a speaker, a protection diode, and a second triode, a base of the second triode is connected to the main control module 1, a collector of the second triode is grounded, an emitter of the second triode is connected to the speaker, and the protection diode is connected in parallel to two ends of the speaker.
It should be noted that, when the main control module 1 determines that the object 6 to be tested is unqualified according to the information collected by the output signal detection module 3, an alarm signal can be sent to the base of the second triode Q7, the second triode Q7 is turned on, the two ends of the loudspeaker BUZZER2 are powered on to send an alarm sound, so as to remind a worker to pay attention, so that the unqualified object 6 to be tested is placed alone in time, the situation that the unqualified object 6 to be tested is mixed into the qualified object 6 due to the fact that people do not pay attention to the unqualified object to be tested is avoided, the protection diode D8 is connected to the two ends of the loudspeaker BUZZER2 in parallel and used for protecting the loudspeaker BUZZER2, so as to send alarm information stably.
In an embodiment of the present invention, the integrated circuit testing system further includes a temperature detection circuit and a fan driving circuit, wherein the temperature detection circuit is connected to the main control module 1, and is configured to transmit the detected ambient temperature information to the main control module 1; the controlled end of the fan driving circuit is connected with the main control module 1, and the output end of the fan driving circuit is suitable for being connected with a fan and is used for being controlled by the main control module 1 to drive the fan.
It should be noted that, because this integrated circuit test system needs to send sine wave signal and detect when using, the condition that generates heat appears, and the steady operation of system can be influenced to the high temperature, consequently, has adopted temperature detection circuit to detect ambient temperature information and has given host system 1 to, when host system 1 judges the high temperature, can pass through fan drive circuit drive fan, cool down to guarantee integrated circuit test system's steady operation.
In an embodiment of the present invention, the temperature detection circuit includes a temperature sensor interface circuit 71, a voltage dividing circuit 72, a regulating circuit 73, a filter circuit 74 and a differential amplifier circuit 75, the temperature 5 sensor interface circuit 71 is adapted to connect to a temperature sensor, a first end of the temperature sensor interface circuit 71 is connected to a first input end of the differential amplifier circuit 75, a second end of the temperature sensor interface circuit is connected to a first output end of the voltage dividing circuit 72, a second output end of the voltage dividing circuit 72 is connected to a second input end of the differential amplifier circuit 75, an input end of the temperature sensor interface circuit is connected to an output end of the regulating circuit 73, an input end of the regulating circuit 73 is connected to a power supply, an output end of the differential amplifier circuit 75 is connected to the main control module 1, and 0 the filter circuit 74 is connected in parallel between the first input end and the second input end of the differential amplifier circuit 75.
It should be noted that, as shown in fig. 9, the temperature sensor interface circuit 71 includes an interface BJ1 for connecting a temperature sensor, and the temperature sensor can be disposed on a circuit board where the system is located to detect the system
The temperature sensor outputs the detection signal to the first input end of the differential amplification 5 amplifying circuit 75 through the interface BJ1, the differential amplification circuit 75 can adopt a differential amplification chip U8 with the model number AD623ARZ-R7, the common mode model in the circuit can be effectively filtered, the anti-jamming capability of the temperature detection signal is improved, the temperature detection is more accurate, the second input end of the differential amplification circuit 75 is connected with the output end of the voltage division circuit 72, the input end of the voltage division circuit 72 is connected with a 5V power supply through the adjusting circuit 73, the adjusting circuit 73 adopts the adjustable resistor R39, the resistance value of the adjustable resistor R39 is changed, the voltage division of the voltage division circuit 0 can be changed, the voltage output of the voltage division circuit 72 to the second input end of the differential amplification circuit 75 is changed,
because the first input terminal and the second input terminal of the differential amplifying circuit 75 are subtracted and then output, the voltage dividing circuit 72 changes the voltage output of the second input terminal of the differential amplifying circuit 75, so as to adjust the threshold value of the temperature output, when the ambient temperature does not reach the threshold value, the main control module 1 does not receive the temperature output signal, and when the ambient temperature does not reach the threshold value, the main control module 1 does not receive the temperature output signal
When the temperature exceeds the threshold, the differential amplifier circuit 75 outputs 5 temperature output signals with different voltages to the main control module 1 according to the ambient temperature, and the main control module 1 can accurately acquire the temperature according to the temperature output signals, so as to control the fan control signals of the fan drive circuit, and further adjust the ambient temperature.
In an embodiment of the present invention, as shown in fig. 10, the fan driving circuit includes a first MOS transistor and a fan interface, a gate of the first MOS transistor is connected to the main control module 1, a source of the first MOS transistor is grounded, a drain of the first MOS transistor is connected to the fan interface, and the fan interface is used for connecting the fan.
It should be noted that, the main control module 1 sends out a fan driving signal to the grid of the first MOS transistor Q6, the first MOS transistor Q6 is conducted, the two ends of the fan interface F1 are powered on, the fan interface F1 is connected with a fan, the circuit board where the system is located is cooled by the fan in a charged mode, the control mode adopting the MOS transistor is simple and convenient, and meanwhile, if the fan speed is controlled, the fan driving signal sent by the main control module 1 can be a PWM signal, the conduction angle of the first MOS transistor Q6 is adjusted through the PWM signal, the fan current is adjusted according to different temperatures, and the adjustment of the fan wind power is realized.
Although the present disclosure has been described above, the scope of the present disclosure is not limited thereto. Various changes and modifications may be made by those skilled in the art without departing from the spirit and scope of the disclosure, and these changes and modifications are intended to fall within the scope of the invention.
Claims (10)
1. An integrated circuit test system, comprising: the device comprises a main control module (1), and a signal generation module (2), an output signal detection module (3), a man-machine interaction module (4) and a storage module (5) which are connected with the main control module (1);
the controlled end of the signal generating module (2) is connected with the main control module (1), and the output end of the signal generating module is suitable for being connected with the input end of an object to be tested (6) and used for sending a test input signal to the object to be tested (6);
the output signal detection module (3) comprises:
the input end of the counting detection circuit (31) is suitable for being connected with the object to be detected (6), the output end of the counting detection circuit is connected with the main control module (1), and the counting detection circuit is used for detecting and counting the waveform output by the object to be detected (6) and then transmitting the waveform to the main control module (1);
the input end of the peak value detection circuit (32) is suitable for being connected with the object to be detected (6), the output end of the peak value detection circuit is connected with the main control module (1), and the peak value detection circuit is used for detecting the peak value voltage of the output end of the object to be detected (6) and then transmitting the detected peak value voltage to the main control module (1);
and the current detection circuit (33) is connected with the main control module (1) and is used for transmitting the acquired current information at the two ends of the object to be detected (6) to the main control module (1).
2. The integrated circuit test system according to claim 1, wherein the signal generating module (2) is a sine signal generating module (2), a controlled end of the sine signal generating module (2) is connected with the main control module (1), and an output end of the sine signal generating module is suitable for being connected with an input end of an object to be tested (6) and used for sending a sine wave signal to the object to be tested (6).
3. The integrated circuit test system according to claim 1, wherein the count detection circuit (31) comprises an amplifying and isolating circuit and a count conversion circuit, a first input end of the amplifying and isolating circuit is connected to an output end of the signal generation module (2), a first output end of the amplifying and isolating circuit is suitable for being connected to an input end of the object to be tested (6), a second input end of the amplifying and isolating circuit is suitable for being connected to an output end of the object to be tested (6), a second output end of the amplifying and isolating circuit is connected to an input end of the count conversion circuit, and an output end of the count conversion circuit is connected to the main control module (1) and is used for converting the sine wave signals collected by the count conversion circuit and outputting the converted sine wave signals to the main control module (1).
4. The integrated circuit test system according to claim 1, wherein the peak detection circuit (32) comprises a peak voltage acquisition circuit (321) and a sampling circuit (322), the peak voltage acquisition circuit (321) comprises a first comparator, a first diode, a first capacitor and a first voltage follower, an input end of the first comparator is connected to an output end of the object under test (6), an output end of the first comparator is connected to the first capacitor through the first diode, an input end of the first voltage follower is connected to the first capacitor, and an output end of the first voltage follower is connected to the main control module (1) through the sampling circuit (322).
5. The integrated circuit testing system according to claim 1, wherein the current detection circuit (33) comprises two hall sensor circuits, the hall sensor circuits comprise a hall sensor and a first triode, a base electrode of the first triode is connected with a signal end of the hall sensor, a collector electrode of the first triode is grounded, an emitter electrode of the first triode is respectively connected with a power supply end of the hall sensor and an input end of the main control module (1), and the hall sensors in the two hall sensor circuits are respectively arranged at connecting lines at two ends of an object to be tested (6).
6. The integrated circuit test system of claim 1, further comprising a communication module, the communication module comprising:
the network port circuit is connected with the main control module (1) and is used for wired communication between the main control module (1) and a control center;
and the WIFI circuit is connected with the main control module (1) and is used for wireless communication between the main control module (1) and the control center.
7. The integrated circuit test system according to claim 1, further comprising an alarm circuit, wherein the alarm circuit comprises a speaker, a protection diode and a second triode, a base of the second triode is connected to the main control module (1), a collector of the second triode is grounded, an emitter of the second triode is connected to the speaker, and the protection diode is connected in parallel to two ends of the speaker.
8. The integrated circuit test system according to claim 1, further comprising a temperature detection circuit and a fan driving circuit, wherein the temperature detection circuit is connected to the main control module (1) and is configured to transmit the detected ambient temperature information to the main control module (1); the controlled end of the fan driving circuit is connected with the main control module (1), and the output end of the fan driving circuit is suitable for being connected with a fan and is used for being controlled by the main control module (1) to drive the fan.
9. The integrated circuit test system of claim 8, wherein the temperature detection circuit comprises a temperature sensor interface circuit (71), a voltage divider circuit (72), a regulation circuit (73), a filter circuit (74) and a differential amplifier circuit (75), the temperature sensor interface circuit (71) is adapted to connect a temperature sensor, a first end of the temperature sensor interface circuit (71) is connected to a first input of the differential amplifier circuit (75), a second end of the temperature sensor interface circuit is connected to a first output of the voltage divider circuit (72), a second output of the voltage divider circuit (72) is connected to a second input of the differential amplifier circuit (75), an input of the temperature sensor interface circuit is connected to an output of the regulation circuit (73), an input of the regulation circuit (73) is connected to the power supply, an output of the differential amplifier circuit (75) is connected to the master control module (1), and the filter circuit (74) is connected in parallel between the first input and the second input of the differential amplifier circuit (75).
10. The integrated circuit test system according to claim 8, wherein the fan driving circuit comprises a first MOS transistor and a fan interface, the gate of the first MOS transistor is connected to the main control module (1), the source is grounded, the drain is connected to the fan interface, and the fan interface is used for connecting the fan.
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