CN115338132B - Desktop-level small-sized chip test sorting equipment - Google Patents
Desktop-level small-sized chip test sorting equipment Download PDFInfo
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- CN115338132B CN115338132B CN202211049685.XA CN202211049685A CN115338132B CN 115338132 B CN115338132 B CN 115338132B CN 202211049685 A CN202211049685 A CN 202211049685A CN 115338132 B CN115338132 B CN 115338132B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
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Abstract
The invention relates to the technical field of chip testing, and provides desktop-level small-sized chip testing and sorting equipment which comprises a bottom plate, a shell, a material taking mechanism, a testing assembly, a sorting mechanism and a controller, wherein the bottom plate and the shell form a containing cavity, the material taking mechanism and the sorting mechanism are arranged in the containing cavity and are electrically connected with the controller, the material taking mechanism comprises a first ejector, a first support, a vacuum chuck, a transmission piece, a feeding disc and an attitude adjusting rod, the first support is arranged on the bottom plate, the first ejector is arranged on the first support, the vacuum chuck is arranged on the pushing top end of the first ejector, the first ejector pushes the feeding disc to swing back and forth by virtue of the transmission piece, the feeding disc is connected with the transmission piece in a rotating way, the attitude adjusting rod is arranged on the bottom plate, and the attitude of the feeding disc is adjusted by the attitude adjusting rod in the swinging of the feeding disc so as to realize blanking or material containing. Through the technical scheme, the problems of high manufacturing cost and large occupied area of the conventional chip testing device are solved.
Description
Technical Field
The invention relates to the technical field of chip testing, in particular to a desktop-level small chip testing and sorting device.
Background
The chip, also called microcircuit, refers to a silicon chip containing an integrated circuit, has small volume, and is an important component of electronic equipment such as a computer. Because the chip has a fine structure, a complex manufacturing process and a complicated flow, potential defects are inevitably left in the production process, so that the manufactured chip cannot meet the standard requirement, and faults can occur due to various reasons at any time. Therefore, in order to ensure the quality of the chip, the chip is generally tested so as to distinguish between a good product and a bad product.
In some chip design factories, since the latest chips are often produced in small batches, the purpose of optimizing the final chips is achieved through verification of the small batches of chips. However, the existing chip testing device in the market has the disadvantages of complex structure, high manufacturing cost and large occupied area, and is suitable for the testing requirement of chips produced in a large scale. Therefore, there is a need for a compact chip test sorting apparatus that is specifically directed to the test requirements of small-volume production chips.
Disclosure of Invention
The invention provides a desktop-level small chip testing and sorting device which can meet the requirements of chips produced in small batches on testing and automatic sorting and solve the problems of high manufacturing cost and large occupied area of the traditional chip testing device.
The technical scheme of the invention is as follows: the utility model provides a small chip test sorting equipment of desktop level, includes bottom plate, casing, feeding mechanism, test module, sorting mechanism and controller, the bottom plate with the casing forms and holds the chamber, feeding mechanism with sorting mechanism all locates hold the intracavity, feeding mechanism the test module with sorting mechanism all electricity is connected the controller, feeding mechanism includes first ejector, first support, vacuum chuck, driving medium, feeding tray and accent appearance pole, first support is located on the bottom plate, first ejector is located on the first support, vacuum chuck locates the top of pushing of first ejector, the top of pushing of first ejector is along vertical direction removal, first ejector promotes with the help of the driving medium with self compact connection the reciprocal swing in the horizontal plane of feeding tray, the feeding tray with the driving medium rotates to be connected, accent appearance pole is two and all sets up on the bottom plate, accent pole is in the swing of feeding tray in order to realize that the feeding tray is in order to realize down the chip or hold the attitude under the test module when the feeding tray is held to the self.
As a further technical scheme, the driving medium includes steering column, torsional spring, transfer line and push pedal, the bottom rotation of steering column is located on the bottom plate, the axis perpendicular to horizontal plane of steering column, the top of steering column is provided with first driven lever and second driven lever, the axis of first driven lever with the axis plane of second driven lever is perpendicular, the second driven lever with the charging tray rotates to be connected, transfer line one end with the ejector pin fixed connection of first ejector part, the push pedal is connected to the other end, the push pedal has the inclined plane just the inclined plane with first driven lever remains throughout the contact, the transfer line is located the top of charging tray, the torsional spring cover is established the outside of steering column, the one end of torsional spring is connected the bottom plate, the other end is connected the second driven lever.
As a further technical scheme, the material taking mechanism further comprises a driving piece, a screw rod and a sliding plate, wherein the driving piece is arranged on the bottom plate, the power output end of the driving piece is connected with the screw rod, the sliding plate is slidably arranged on the bottom plate and provided with a threaded hole, the screw rod penetrates through the threaded hole, the shell is provided with a material inlet, and the sliding plate slides to the material inlet to receive a chip.
As a further technical scheme, the material taking mechanism further comprises a sliding block and a supporting plate, wherein the sliding block is arranged on the bottom plate in a sliding manner, the supporting plate is arranged on the sliding block, the gesture adjusting rods are arranged on the supporting plate, the gesture adjusting rods are arranged in parallel, the feeding tray is connected with a traction rod, and the feeding tray is in contact with the gesture adjusting rods by means of the traction rod and the gesture adjusting rods to achieve self gesture adjustment.
As a further technical scheme, the test assembly comprises a transition channel, supporting legs, a detector and a second support, wherein the transition channel is obliquely arranged, the feeding end faces the discharging hole of the feeding disc in the feeding gesture, one end of each supporting leg is arranged on the bottom plate, the other end of each supporting leg is connected with the transition channel, the second support is arranged on the bottom plate, the detector is arranged on the second support and is electrically connected with the controller, and the detector is used for detecting a chip and transmitting signals to the controller.
As a further technical scheme, the transition channel and the feeding tray of the blanking gesture are arranged at intervals.
As a further technical scheme, sorting mechanism includes sorting channel, brace table, first ejection of compact passageway, second ejection of compact passageway and second ejection of compact spare, the brace table is located on the bottom plate, sorting channel slides and locates on the brace table, sorting channel's slip direction and the direction of movement mutually perpendicular of chip, sorting channel has two sub-channels, two have connecting portion between the sub-channel, connecting portion be used for locating the chip and with the ejection end hinge of second ejection of compact spare, second ejection of compact spare electricity is connected the controller, second ejection of compact spare ejection of compact passageway reciprocating motion, two sub-channels with respectively with first ejection of compact passageway with second ejection of compact passageway intercommunication, first discharge gate and second discharge gate have been seted up to the casing, first ejection of compact passageway intercommunication first discharge gate, second ejection of compact passageway intercommunication the second discharge gate.
As a further technical scheme, the sorting channel is obliquely arranged, the first discharging channel and the second discharging channel are all bent, the tail ends of the first discharging channel and the second discharging channel are all horizontally arranged, and the front ends of the first discharging channel and the second discharging channel are all arranged flush with the sorting channel after sliding.
As a further technical scheme, the sub-channels are arranged in an S-bend mode.
As a further technical scheme, be connected with operating panel on the casing, operating panel has the display screen and the electricity is connected the controller, the top of casing still is provided with the observation window.
The working principle and the beneficial effects of the invention are as follows: compared with the prior art, the shell is arranged on the bottom plate, the shell and the bottom plate are combined to form the accommodating cavity, the taking mechanism is used for transferring the chip to the testing assembly after taking, and the testing assembly is used for testing the function of the chip so as to judge whether the chip is a qualified product or not; the sorting mechanism is arranged at the logic rear of the testing component, namely, chips passing through the testing component enter the sorting mechanism, and the sorting mechanism is used for screening out qualified products and defective products; the material taking mechanism, the testing assembly and the sorting mechanism are all electrically connected with the controller, so that a small number of placed chips can be automatically distinguished into qualified products and defective products only by placing the chips into the material taking mechanism; the material taking mechanism comprises a first ejection piece, a first bracket, a vacuum chuck, a transmission piece, a feeding disc and a gesture adjusting rod, wherein the first ejection piece is arranged at the top end of the first bracket, the bottom end of the first bracket is arranged on a bottom plate, the ejection end of the first ejection piece can be lifted along the vertical direction, the vacuum chuck is arranged at the ejection end of the first ejection piece, a power source of the vacuum chuck is electrically connected with a controller, and when the first ejection piece is close to a chip through descending, the vacuum chuck acts and attracts the chip; the first ejector piece is compactly connected with the transmission piece, namely the space occupied by the first ejector piece and the transmission piece after being combined together is smaller, the feeding disc is rotationally arranged on the transmission piece, the first ejector piece can swing the feeding disc by means of the transmission piece and is matched with the chip to be grabbed, so that the feeding disc swings to one side when the chip is grabbed, after the chip is grabbed, the feeding disc is positioned below the vacuum chuck, the chip can enter the feeding disc after the chip is loosened by the vacuum chuck, and the feeding disc can take a blanking gesture by the gesture adjusting rod along with the swinging action of the feeding disc, and the chip in the feeding disc can slide into the test assembly by taking the gravity of the chip in the feeding disc into the blanking gesture; when the feeding tray is in the swing process of resetting, the posture of the feeding tray can be adjusted again due to the existence of the other posture adjusting rod, the feeding tray enters the posture of material containing, the feeding tray in the posture of material containing is horizontal, and the feeding tray in the discharging state is inclined. Because there is compact relation of connection in the extracting mechanism to extracting mechanism logical back is testing mechanism and sorting mechanism, greatly reduced the complexity of equipment, because whole equipment relates to higher automation again, consequently, to the chip of small batch production, the test is simpler convenient.
Drawings
The invention will be described in further detail with reference to the drawings and the detailed description.
FIG. 1 is a schematic isometric view of the overall exterior provided by the present invention;
FIG. 2 is a schematic view of the structure of FIG. 1 at another angle;
FIG. 3 is a schematic view of the structure of FIG. 1 with the housing hidden;
FIG. 4 is a schematic view of the structure of FIG. 3 at another angle;
FIG. 5 is a top view of FIG. 1;
FIG. 6 is a schematic view of a portion of the structure of the take off mechanism provided by the present invention;
FIG. 7 is a front view of FIG. 6;
FIG. 8 is a schematic view of a part of a material taking mechanism of the feeding tray in a material containing posture in the invention;
FIG. 9 is a schematic diagram of a connection positioning chip of a sorting channel according to the present invention;
FIG. 10 is a schematic diagram of a feeding tray according to the present invention;
in the figure:
1. the device comprises a bottom plate, 2, a shell, 3, a material taking mechanism, 4, a testing component, 5, a sorting mechanism, 6, a first ejector, 7, a first support, 8, a vacuum chuck, 9, a feeding disc, 10, a posture adjusting rod, 11, a rotating column, 12, a torsion spring, 13, a transmission rod, 14, a push plate, 15, a first driven rod, 16, a second driven rod, 17, a driving piece, 18, a screw rod, 19, a slide plate, 20, a slide block, 21, a support plate, 22, a traction rod, 23, a transition channel, 24, a supporting leg, 25, a detector, 26, a second support, 27, a sorting channel, 28, a supporting table, 29, a first discharging channel, 30, a second discharging channel, 31, a second ejector, 32, an operation panel, 33 and an observation window.
Detailed Description
The technical solutions of the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
As shown in fig. 1 to 5, this embodiment provides a small-sized chip test and sorting device for a desktop stage, including a base plate 1, a housing 2, a material taking mechanism 3, a test assembly 4, a sorting mechanism 5 and a controller, the base plate 1 and the housing 2 form a receiving cavity, the material taking mechanism 3 and the sorting mechanism 5 are all disposed in the receiving cavity, the material taking mechanism 3, the test assembly 4 and the sorting mechanism 5 are all electrically connected with the controller, the material taking mechanism 3 includes a first ejector 6, a first bracket 7, a vacuum chuck 8, a transmission member, a feeding tray 9 and an attitude adjusting rod 10, the first bracket 7 is disposed on the base plate 1, the first ejector 6 is disposed on the first bracket 7, the vacuum chuck 8 is disposed at the ejecting end of the first ejector 6, the ejecting end of the first ejector 6 moves along the vertical direction, the first ejector 6 pushes the feeding tray 9 to reciprocate in the horizontal plane by means of the transmission member in compact connection with itself, the feeding tray 9 is rotationally connected with the transmission member, the attitude adjusting rod 10 is two and is disposed on the base plate 1, the attitude adjusting rod 10 adjusts the attitude of the feeding tray 9 in the swing of the feeding tray 9 in order to enable the chip to slide down or to slide in the feeding assembly 4 when the chip is loaded in the test assembly.
In this embodiment, the housing 2 is disposed on the bottom plate 1, and the housing 2 and the bottom plate 1 are combined to form a containing cavity, the material taking mechanism 3 is used for transferring the chip to the testing component 4 after taking, and the testing component 4 is used for testing the function of the chip to determine whether the chip is a qualified product; the sorting mechanism 5 is arranged behind the logic of the testing component 4, namely, chips passing through the testing component 4 enter the sorting mechanism 5, and the sorting mechanism 5 is used for sorting out qualified products and defective products; the material taking mechanism 3, the testing component 4 and the sorting mechanism 5 are all electrically connected with the controller, so that a small number of chips can be automatically distinguished into qualified products and defective products only by putting the chips into the material taking mechanism 3; the material taking mechanism 3 comprises a first ejector 6, a first bracket 7, a vacuum chuck 8, a transmission part, a feeding disc 9 and a posture adjusting rod 10, wherein the first ejector 6 is arranged at the top end of the first bracket 7, the bottom end of the first bracket 7 is arranged on the bottom plate 1, the pushing top end of the first ejector 6 can be lifted along the vertical direction, the vacuum chuck 8 is arranged at the pushing top end of the first ejector 6, and a power source of the vacuum chuck 8 is electrically connected with a controller, when the first ejector 6 is close to a chip through descending, the vacuum chuck 8 acts and sucks the chip, and the material taking mode of the first ejector is adopted, so that the surface of the chip is prevented from being damaged; the first ejector member 6 is compactly connected with the transmission member, namely the space occupied by the first ejector member 6 and the transmission member after being combined together is relatively small, the feeding tray 9 is rotatably arranged on the transmission member, the first ejector member 6 can swing the feeding tray 9 by means of the transmission member and is matched with the chip grabbing of the first ejector member, so that the feeding tray 9 swings to one side when the chip grabbing is realized, the feeding tray 9 is positioned below the vacuum chuck 8 after the chip grabbing is finished, the chip can enter the feeding tray 9 after the chip is loosened by the vacuum chuck 8, and the feeding tray 9 can take a blanking posture by adding the posture adjusting rod 10 to the posture adjustment of the feeding tray 9 in the swinging process, and the chip in the feeding tray 9 can slide into the test assembly 4 by taking the own gravity as a self-body when the feeding tray 9 takes a blanking posture; when the feeding tray 9 swings in the resetting process, the posture of the feeding tray 9 can be adjusted again due to the existence of the other posture adjusting rod 10, the feeding tray 9 enters the posture of containing materials, the feeding tray 9 in the posture of containing materials is horizontal, and the feeding tray 9 in the discharging state is inclined. Because there is compact relation of connection in the extracting mechanism 3 to extracting mechanism 3 logical back is testing mechanism and sorting mechanism 5, greatly reduced the complexity of equipment, because whole equipment relates to higher automation again, consequently, to the chip of small batch production, the test is simpler convenient.
In this embodiment, in order to avoid the feeding disc 9 from rotating randomly, the rotation between the feeding disc 9 and the transmission member can be set to be in a damping rotation mode, that is, the feeding disc 9 cannot rotate relative to the transmission member under the action of no external force, and only under the intervention of the gesture adjusting rod 10, the feeding disc 9 can overcome the damping force, rotate, and finally the gesture adjustment is realized.
The table top-level small-sized chip test sorting equipment provided by the invention has the advantages of simple structure, convenience in manufacturing, small occupied area and low manufacturing cost because of adopting a compact connection mode between internal mechanisms.
In the invention, in order to avoid the chip from being damaged in the sliding process, corner protectors can be arranged on four corners of the chip. The corner protector is made of a material with a small surface friction coefficient.
It should be noted that, the testing of the chip is prior art, and since the testing component 4 is not a core concept of the present invention, the testing component 4 is merely used for the principle thereof in the present invention, and no excessive discussion of the principle and structure is made.
As shown in fig. 3 to 8, the transmission member further comprises a rotating column 11, a torsion spring 12, a transmission rod 13 and a push plate 14, wherein the bottom end of the rotating column 11 is rotationally arranged on the bottom plate 1, the axis of the rotating column 11 is perpendicular to the horizontal plane, a first driven rod 15 and a second driven rod 16 are arranged at the top end of the rotating column 11, the axis of the first driven rod 15 is perpendicular to the axis plane of the second driven rod 16, the second driven rod 16 is rotationally connected with the feeding disc 9, one end of the transmission rod 13 is fixedly connected with the ejection shaft of the first ejection member 6, the other end of the transmission rod is connected with the push plate 14, the push plate 14 is provided with an inclined surface, the inclined surface is always in contact with the first driven rod 15, the transmission rod 13 is positioned above the feeding disc 9, the torsion spring 12 is sleeved outside the rotating column 11, one end of the torsion spring 12 is connected with the bottom plate 1, and the other end of the torsion spring 12 is connected with the second driven rod 16.
In this embodiment, in order to reduce the complexity of the whole and further improve the miniaturization of the whole, the transmission member includes a rotary column 11, a torsion spring 12, a transmission rod 13 and a push plate 14, the bottom end of the rotary column 11 is rotatably disposed on the bottom plate 1, the top end of the rotary column 11 is provided with a first driven rod 15 and a second driven rod 16, the first driven rod 15 and the second driven rod 16 are both cylindrical rods, the axes of the first driven rod 15 and the second driven rod 16 are perpendicular to each other, the height of the second driven rod 16 is lower than that of the first driven rod 15, the end of the second driven rod 16 is rotatably connected with the feed plate 9, i.e. a rotary hole is formed in the feed plate 9, the second driven rod 16 is inserted into the rotary hole, in order to realize the damping rotation between the second driven rod 16 and the feed plate 9, a rotary damper may be disposed between the second driven rod 16 and the feed plate 9, one end of the transmission rod 13 is connected with the push shaft of the first push member 6, the other end of the transmission rod 16 is connected with the push plate 14, the push plate 14 has an inclined surface, the outer edge of the first driven rod 15 is always kept in contact with the inclined surface; as shown in fig. 6, when the transmission rod 13 moves downward along with the pushing of the first pushing element 6, the push plate 14 moves downward, the push plate 14 pushes the first driven rod 15 to rotate by means of the inclined plane, so that the rotary column 11 generates a counterclockwise rotary rod, the feeding tray 9 swings counterclockwise along with the rotary rod, during the swinging process, the feeding tray 9 contacts the gesture adjusting rod 10, and the gesture adjusting rod 10 adjusts the gesture of the feeding tray 9 until the final manuscript presents the feeding gesture, and at the moment, the torsion spring 12 is stressed; when the transmission rod 13 moves upwards, as shown in fig. 8, the push plate 14 moves upwards, the inclined plane avoids the first driven rod 15, the first driven rod 15 is always in contact with the inclined plane under the driving of the reset of the torsion spring 12, at this time, the rotary column 11 rotates clockwise in the drawing, the feeding disc 9 swings clockwise, and in the process, the feeding disc 9 contacts with the other gesture adjusting rod 10 until the gesture adjusting rod 10 enables the feeding disc 9 to take a gesture of containing materials. When the feeding disc 9 is in a blanking gesture, the transmission rod 13 is at the lowest position, as shown in fig. 6, and the vacuum chuck 8 takes materials at the moment; on the contrary, when the feeding tray 9 is in a material containing posture, the transmission rod 13 is at the highest position, as shown in fig. 8, and the vacuum chuck 8 is used for discharging materials; the material taking and discharging actions of the vacuum chuck 8 are associated with the material discharging and containing actions of the feeding disk 9, so that linkage is realized structurally, the number of induction devices and power transposition is reduced, the compactness of the whole structure is improved, and the failure rate caused by an electric device is greatly reduced.
As shown in fig. 3 to 5, the material taking mechanism 3 further comprises a driving piece 17, a screw rod 18 and a sliding plate 19, wherein the driving piece 17 is arranged on the bottom plate 1, the power output end is connected with the screw rod 18, the sliding plate 19 is slidably arranged on the bottom plate 1 and provided with a threaded hole, the screw rod 18 is arranged in the threaded hole in a penetrating manner, the shell 2 is provided with a material inlet, and the sliding plate 19 slides to the material inlet to receive chips.
In this embodiment, in order to further improve automation of the whole equipment, the material taking mechanism 3 further includes a driving member 17, a screw rod 18 and a sliding plate 19, the driving member 17 is disposed on the bottom plate 1, a power output end of the driving member 17 is connected with the screw rod 18, a groove for guiding is disposed on the bottom plate 1, the sliding plate 19 is slidably disposed on the bottom plate 1 by means of the groove, the screw rod 18 is located in the groove, the highest position of the outer edge of the screw rod 18 is guaranteed to be lower than the plane of the bottom plate 1, interference between the screw rod 18 and other parts is avoided, a threaded hole is formed in the sliding plate 19, the screw rod 18 is arranged in the threaded hole in a penetrating manner, the screw rod 18 is in threaded connection with the sliding plate 19 by means of the threaded hole, so that the driving member 17 can drive the screw rod 18 to rotate and simultaneously realize movement of the sliding plate 19, and the driving member 17 is electrically connected with the controller, and thus automatic control can be realized by the controller. The operator only needs to stack the chip to be tested on the slide 19, and then through the controller, the chip on the slide 19 can be moved to a designated position.
As shown in fig. 3 to 5 and 10, the material taking mechanism 3 further comprises a sliding block 20 and a supporting plate 21, the sliding block 20 is slidably arranged on the bottom plate 1, the supporting plate 21 is arranged on the sliding block 20, the gesture adjusting rod 10 is arranged on the supporting plate 21, the two gesture adjusting rods 10 are arranged in parallel, the feeding tray 9 is connected with a traction rod 22, and the feeding tray 9 realizes self gesture adjustment by means of contact of the traction rod 22 and the two gesture adjusting rods 10.
In this embodiment, for different chips, it is sometimes necessary to make the angle of inclination of the tray under the blanking posture be larger to enable the tray to slide into the testing component 4 smoothly, so that the posture of the tray needs to be adjusted, and the posture inclination of the tray needs to be adjusted, so that the feeding mechanism 3 is further provided with a slide block 20 and a support plate 21, the slide block 20 is slidably arranged on the bottom plate 1, the position of the slide block 20 on the bottom plate 1 can be fixed, and the support plate 21 is arranged on the slide block 20, so that the position of the posture adjustment rod 10 can be adjusted by setting the position of the adjustment slide block 20.
In this embodiment, in order to prevent the gesture adjusting rod 10 from interfering with the material taking action of the vacuum chuck 8, a traction rod 22 may be disposed on the feeding tray 9, and the traction rod 22 extends between the two gesture adjusting rods 10, so that the gesture adjusting rod 10 can be ensured to be of a smaller size, and the feeding tray 9 is easier to avoid interference due to the linkage of the feeding tray 9 and the material taking action of the vacuum chuck 8.
As shown in fig. 3 to 5 and 9, the test assembly 4 further includes a transition channel 23, a supporting leg 24, a detector 25 and a second bracket 26, the transition channel 23 is obliquely arranged, a feeding end faces to a discharging hole of the feeding tray 9 in a feeding posture, one end of the supporting leg 24 is arranged on the bottom plate 1, the other end of the supporting leg is connected with the transition channel 23, the second bracket 26 is arranged on the bottom plate 1, the detector 25 is arranged on the second bracket 26 and is electrically connected with the controller, the detector 25 is used for detecting a chip, and a signal is transmitted to the controller.
In this embodiment, the test assembly 4 includes a transition channel 23, a leg 24, a detector 25, and a second support 26; in order to ensure that the chip can stably slide into the transition channel 23 from the feeding tray 9, the transition channel 23 can be obliquely arranged, and the feeding end of the transition channel 23 faces the discharging port of the feeding tray 9 in the discharging posture, namely, the plane contacted by the chip in the transition channel 23 and the plane contacted by the chip in the feeding tray 9 are in the same plane; legs 24 are provided on base plate 1, and the tops of legs 24 are connected to transition channel 23, legs 24 serving to provide support to transition channel 23; the second support 26 is provided on the base plate 1, the detector 25 is provided on the second support 26, and the detector 25 is electrically connected to the controller, the detector 25 is used for detecting the chip in the transition channel 23, and the detection result is transmitted to the controller. When the detector 25 senses a chip in normal operation, the detector 25 gives a signal to the controller firstly, the controller pauses the action of the first ejector 6 after receiving the signal, and after the detector 25 detects the chip, the detector transmits another signal to the controller, after receiving the signal, the controller enables the sorting mechanism 5 to work to receive the chip, and the controller sends a signal to the first ejector 6 to enable the first ejector 6 to act, thus completing the new material taking, material discharging and new detection of a round.
As shown in fig. 5, further, the transition channel 23 is spaced from the feeding tray 9 in the blanking posture.
In this embodiment, since the feeding tray 9 needs to rotate, in order to avoid interference between the transition channel 23 and the feeding tray 9, a gap needs to be set between the transition channel 23 and the feeding tray 9 in the blanking posture, and the width of the gap is 0.5-0.85 times the thickness of the feeding tray 9.
As shown in fig. 3 to 5 and 9, the sorting mechanism 5 further comprises a sorting channel 27, a supporting table 28, a first ejection channel 29, a second ejection channel 30 and a second ejection member 31, wherein the supporting table 28 is arranged on the bottom plate 1, the sorting channel 27 is arranged on the supporting table 28 in a sliding manner, the sliding direction of the sorting channel 27 is mutually perpendicular to the moving direction of the chip, the sorting channel 27 is provided with two sub-channels, a connecting part is arranged between the two sub-channels and used for positioning the chip and hinged with the ejection end of the second ejection member 31, the second ejection member 31 is electrically connected with a controller, the second ejection member 31 ejects the sorting channel 27 to reciprocate, the two sub-channels can be respectively communicated with the first ejection channel 29 and the second ejection channel 30 by means of sliding, the first ejection channel 29 is communicated with the first ejection channel, and the second ejection channel 30 is communicated with the second ejection channel.
In this embodiment, sorting mechanism 5 includes sorting channel 27, supporting bench 28, first ejection of compact passageway 29, second ejection of compact passageway 30 and second ejection of compact piece 31, supporting bench 28 sets up on bottom plate 1, sorting channel 27 sets up the top at supporting bench 28, sorting channel 27 can slide on supporting bench 28, sorting channel 27 has two sub-channels, two sub-channels are used for carrying conforming article and defective products respectively, be connecting portion between two sub-channels, the ejection of compact end and the connecting portion of second ejection of compact piece 31 are connected, second ejection of compact piece 31 provides the power of sliding on supporting bench 28 for sorting channel 27, second ejection of compact piece 31 electricity connection director, consequently, the controller can realize that two sub-channels communicate with transition passageway 23 respectively, sorting channel 27 is through the slip to two directions, can realize the intercommunication of sub-channel and first ejection of compact passageway 29 and second ejection of compact passageway 30 respectively, first ejection of compact passageway 29 and second ejection of compact passageway 30 all set up on bottom plate 1, set up first discharge gate and second ejection of compact mouth between two sub-channels, the second ejection of compact piece 31 provides the power of sliding on the support bench 28 on the second housing 2, the second ejection of compact piece is provided with the second ejection of compact piece 30, the second ejection of compact piece is in order to paste on the second housing 2 top of the second end and second nameplate, the second nameplate has the second nameplate on the second nameplate of the top of the first nameplate.
During normal operation, the connecting portion of sorting channel 27 keeps off at sorting channel 27's discharge end, the chip enters into in the transition passageway 23 and contacts with connecting portion, connecting portion is used for playing the effect of location for the chip, detector 25 detects the chip, only when the chip is for the signal that the controller transmitted is feedback chip is the conforming product or defective products, the controller just can give second ejector 31 signal, and second ejector 31 selects the ejector according to the signal that comes to withdraw, and then realize that the chip enters into first discharging channel 29 or second discharging channel 30, this kind of structure has realized the automatic separation of chip, and the operating personnel is outside at the device, just can judge whether the chip is the conforming product according to the discharge gate of difference, can not cause the confusion.
As shown in fig. 9, further, the sorting channel 27 is obliquely arranged, the first discharging channel 29 and the second discharging channel 30 are both bent and arranged, the tail ends of the first discharging channel 29 and the second discharging channel 30 are both horizontally arranged, and the front ends of the first discharging channel 29 and the second discharging channel 30 are both flush with the sorting channel 27 after sliding.
In this embodiment, since the transition channel 23 is obliquely disposed, in order to ensure that the chips stably enter the sorting channel 27, the sorting channel 27 may be disposed in an oblique manner, and the first discharging channel 29 and the second discharging channel 30 may be disposed in a bent manner, that is, the first discharging channel 29 has an oblique portion for abutting against the sorting channel 27 and a horizontal portion for abutting against the first discharging port, and the second discharging channel 30 has a structure and a disposition.
Further, as shown in fig. 9, the sub-channels are arranged in an S-bend.
In this embodiment, since the transition channel 23 and the sorting channel 27 are aligned, in order to reduce the speed of the chip entering the first discharging channel 29 or the second discharging channel 30, the sub-channels in the sorting channel 27 may be set to be in an S-bend form, so that the sliding speed of the chip can be reduced, and the S-bend form is provided with a rounded corner at the corner, so that the chip can smoothly pass through.
As shown in fig. 1, further, an operation panel 32 is connected to the housing 2, the operation panel 32 has a display screen and is electrically connected to the controller, and an observation window 33 is further provided at the top of the housing 2.
In this embodiment, in order to facilitate the setting of the operation and parameters and the monitoring of the result, the operation panel 32 is connected to the outside of the housing 2, the operation panel 32 is electrically connected to the controller, and a display screen is further provided on the operation panel 32. In order for the operator to observe the working condition inside the housing 2, an observation window 33 may be provided at the top of the housing 2.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, alternatives, and improvements that fall within the spirit and scope of the invention.
Claims (9)
1. The utility model provides a small chip test sorting equipment of desktop level, includes bottom plate (1), casing (2), feeding mechanism (3), test module (4), sorting mechanism (5) and controller, bottom plate (1) with casing (2) form and hold the chamber, feeding mechanism (3) with sorting mechanism (5) all are located hold the intracavity, feeding mechanism (3), test module (4) with sorting mechanism (5) all are electrically connected the controller, feeding mechanism (3) include first ejector (6), first support (7), vacuum chuck (8), driving medium, feeding plate (9) and profile control pole (10), first support (7) are located on bottom plate (1), first ejector (6) are located on first support (7), vacuum chuck (8) are located the ejector tip of first ejector (6), the ejector tip of first ejector (6) is along vertical direction removal, its characteristics are that first ejector (6) are in the rotation profile control pole (9) are in the horizontal plane with the feeding plate (9) is connected with the feeding plate (10) by means of rotation, the gesture adjusting rod (10) adjusts the gesture of the feeding disc (9) in the swinging of the feeding disc (9) so as to realize blanking or material containing, and when the feeding disc (9) is in a blanking state, a chip slides into the testing assembly (4) under the gravity of the chip;
the transmission piece comprises a rotating column (11), a torsion spring (12), a transmission rod (13) and a push plate (14), wherein the bottom end of the rotating column (11) is rotationally arranged on the bottom plate (1), the axis of the rotating column (11) is perpendicular to the horizontal plane, a first driven rod (15) and a second driven rod (16) are arranged at the top end of the rotating column (11), the axis of the first driven rod (15) is perpendicular to the axis plane of the second driven rod (16), the second driven rod (16) is rotationally connected with the feeding plate (9), one end of the transmission rod (13) is fixedly connected with the push shaft of the first push piece (6), the other end of the transmission rod (13) is connected with the push plate (14), the push plate (14) is provided with an inclined plane, the inclined plane is always kept in contact with the first driven rod (15), the transmission rod (13) is located above the feeding plate (9), the torsion spring (12) is sleeved outside the rotating column (11), one end of the bottom plate (12) is connected with the second driven rod (16).
2. The desktop-level small-sized chip test sorting equipment according to claim 1, wherein the material taking mechanism (3) further comprises a driving piece (17), a lead screw (18) and a sliding plate (19), the driving piece (17) is arranged on the bottom plate (1) and a power output end is connected with the lead screw (18), the sliding plate (19) is slidably arranged on the bottom plate (1) and provided with a threaded hole, the lead screw (18) is arranged in the threaded hole in a penetrating mode, the shell (2) is provided with a feeding hole, and the sliding plate (19) is slidably arranged to the feeding hole to receive chips.
3. The desktop-level small-sized chip test sorting equipment according to claim 2, wherein the material taking mechanism (3) further comprises a sliding block (20) and a supporting plate (21), the sliding block (20) is slidably arranged on the bottom plate (1), the supporting plate (21) is arranged on the sliding block (20), the gesture adjusting rods (10) are arranged on the supporting plate (21), two gesture adjusting rods (10) are arranged in parallel, the feeding tray (9) is connected with a traction rod (22), and the feeding tray (9) is contacted with the two gesture adjusting rods (10) by means of the traction rod (22) to achieve self gesture adjustment.
4. A desktop-level small-sized chip test and sorting apparatus according to claim 3, characterized in that the test assembly (4) comprises a transition channel (23), a supporting leg (24), a detector (25) and a second support (26), the transition channel (23) is obliquely arranged and the feeding end faces the discharging port of the feeding tray (9) in the feeding posture, one end of the supporting leg (24) is arranged on the bottom plate (1), the other end of the supporting leg is connected with the transition channel (23), the second support (26) is arranged on the bottom plate (1), the detector (25) is arranged on the second support (26) and is electrically connected with the controller, and the detector (25) is used for detecting chips and transmitting signals to the controller.
5. A small chip test and sorting apparatus as claimed in claim 4, characterized in that the transition channel (23) is spaced from the feed tray (9) in the blanking position.
6. The small-sized chip test and sorting equipment for a desktop stage according to claim 4, wherein the sorting mechanism (5) comprises a sorting channel (27), a supporting table (28), a first ejection channel (29), a second ejection channel (30) and a second ejection member (31), the supporting table (28) is arranged on the bottom plate (1), the sorting channel (27) is slidably arranged on the supporting table (28), the sliding direction of the sorting channel (27) is mutually perpendicular to the moving direction of the chip, the sorting channel (27) is provided with two sub-channels, a connecting part is arranged between the two sub-channels and is used for positioning the chip and is hinged with the ejection ends of the second ejection member (31), the second ejection member (31) is electrically connected with the controller, the second ejection member (31) ejects the sorting channel (27) to reciprocate, the two sub-channels are respectively communicated with the first ejection channel (29) and the second ejection channel (30) by sliding, the first ejection channel (29) is communicated with the second ejection channel (30), and the second ejection channel (30) is provided with the first ejection channel (30) is communicated with the second ejection channel (30).
7. The small-sized chip test and sorting equipment for the desktop level according to claim 6, wherein the sorting channels (27) are obliquely arranged, the first discharging channels (29) and the second discharging channels (30) are all bent and arranged, the tail ends of the first discharging channels (29) and the second discharging channels (30) are all horizontally arranged, and the front ends of the first discharging channels (29) and the second discharging channels (30) are all arranged flush with the sorting channels (27) after sliding.
8. A desktop-level small-sized chip test and sorting apparatus according to claim 7, wherein the sub-channels are arranged in an S-bend.
9. A desktop-level small-sized chip test and sorting apparatus according to any one of claims 1-8, characterized in that an operation panel (32) is connected to the housing (2), the operation panel (32) is provided with a display screen and is electrically connected to the controller, and an observation window (33) is further provided at the top of the housing (2).
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| CN108358058A (en) * | 2018-05-11 | 2018-08-03 | 天津航天机电设备研究所 | A kind of intelligent suspender of posture adjustment |
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| CN110125037A (en) * | 2019-04-28 | 2019-08-16 | 上海欧唯斯工具制造有限公司 | Screwdriver knife bar curvature automatic tester |
| CN215005766U (en) * | 2021-06-18 | 2021-12-03 | 武汉广能电力工程有限公司 | High-voltage switch speed measuring device |
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