CN115338132A - Desktop-level small chip testing and sorting equipment - Google Patents
Desktop-level small chip testing and sorting equipment Download PDFInfo
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- CN115338132A CN115338132A CN202211049685.XA CN202211049685A CN115338132A CN 115338132 A CN115338132 A CN 115338132A CN 202211049685 A CN202211049685 A CN 202211049685A CN 115338132 A CN115338132 A CN 115338132A
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- sorting
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- bottom plate
- discharging
- ejector
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
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Abstract
The invention relates to the technical field of chip testing, and provides a desktop-level small chip testing and sorting device which comprises a bottom plate, a shell, a material taking mechanism, a testing component, a sorting mechanism and a controller, wherein a containing cavity is formed by the bottom plate and the shell, the material taking mechanism and the sorting mechanism are both arranged in the containing cavity, the material taking mechanism, the testing component and the sorting mechanism are all electrically connected with the controller, the material taking mechanism comprises a first ejector piece, a first support, a vacuum chuck, a transmission piece, a feeding disc and a posture adjusting rod, the first support is arranged on the bottom plate, the first ejector piece is arranged on the first support, the vacuum chuck is arranged at the ejector end of the first ejector piece, the first ejector piece pushes the feeding disc to swing back and forth by means of the transmission piece, the feeding disc is rotatably connected with the transmission piece, the posture adjusting rod is arranged on the bottom plate, and the posture adjusting rod adjusts the posture of the feeding disc in the swinging of the feeding disc so as to realize blanking or material holding. Through above-mentioned technical scheme, solved current chip testing arrangement and had the problem that the cost is expensive and area is big.
Description
Technical Field
The invention relates to the technical field of chip testing, in particular to desktop-level small chip testing and sorting equipment.
Background
The chip, also called microcircuit, refers to a silicon chip containing integrated circuit, and has small volume, and is an important component of electronic equipment such as computers. Because the chip structure is fine, the manufacturing process is complex, the flow is tedious, potential defects are inevitably left in the production process, the manufactured chip cannot meet the standard requirements, and faults can occur due to various reasons at any time. Therefore, in order to ensure chip quality, the chips are usually tested to distinguish between good and bad products.
In some chip design factories, the latest chips are usually produced in small batches, and the aim of optimizing the final chips is fulfilled by verifying the small batches of chips. However, the existing chip testing device in the market has the advantages of complex structure, high manufacturing cost and large occupied area, and is suitable for the testing requirement of chips produced in large scale. Therefore, a small chip test handler is needed to meet the test requirements of small-scale production.
Disclosure of Invention
The invention provides a desktop-level small chip testing and sorting device which can meet the requirements of chips produced in small batches on testing and automatic sorting and solve the problems of high manufacturing cost and large occupied area of the conventional chip testing device.
The technical scheme of the invention is as follows: a desktop-level small chip testing and sorting device comprises a bottom plate, a shell, a material taking mechanism, a testing assembly, a sorting mechanism and a controller, wherein the bottom plate and the shell form a containing cavity, the material taking mechanism and the sorting mechanism are arranged in the containing cavity, the material taking mechanism, the testing assembly and the sorting mechanism are electrically connected with the controller, the material taking mechanism comprises a first ejector piece, a first support, a vacuum chuck, a transmission piece, a feeding disc and a posture adjusting rod, the first support is arranged on the bottom plate, the first ejector piece is arranged on the first support, the vacuum chuck is arranged at the ejector end of the first ejector piece, the ejector end of the first ejector piece moves along the vertical direction, the first ejector piece pushes the feeding disc to swing back and forth in a horizontal plane by means of the transmission piece which is compactly connected with the first ejector piece, the feeding disc is rotatably connected with the transmission piece, the posture adjusting rods are arranged on the bottom plate, the posture adjusting rod adjusts the posture of the feeding disc in the swing of the feeding disc so as to realize the posture of the feeding disc or the chip in the sliding state when the chip is fed under the gravity test.
As a further technical scheme, the driving medium includes rotary column, torsional spring, transfer line and push pedal, the bottom of rotary column is rotated and is located on the bottom plate, the axis perpendicular to horizontal plane of rotary column, the top of rotary column is provided with first driven lever and second driven lever, the axis of first driven lever with the axis plane of second driven lever is perpendicular, the second driven lever with the feed table rotates to be connected, transfer line one end with the ejector pin fixed connection of first ejector piece, the push pedal is connected to the other end, the push pedal has the inclined plane just the inclined plane with first driven lever remains the contact throughout, the transfer line is located the top of feed table, the torsional spring cover is established the outside of rotary column, the one end of torsional spring is connected the bottom plate, the other end is connected the second driven lever.
As a further technical scheme, the material taking mechanism further comprises a driving part, a screw rod and a sliding plate, wherein the driving part is arranged on the bottom plate, the power output end of the driving part is connected with the screw rod, the sliding plate is slidably arranged on the bottom plate and is provided with a threaded hole, the screw rod penetrates through the threaded hole, the shell is provided with a material inlet, and the sliding plate slides to the material inlet to receive the chip.
As a further technical scheme, the material taking mechanism further comprises a sliding block and a supporting plate, the sliding block is slidably arranged on the bottom plate, the supporting plate is arranged on the sliding block, the two attitude adjusting rods are arranged on the supporting plate in parallel, the feeding plate is connected with a traction rod, and the feeding plate is in contact with the two attitude adjusting rods by means of the traction rod to adjust the attitude of the feeding plate.
As a further technical scheme, the test assembly comprises a transition channel, support legs, a detector and a second support, the transition channel is obliquely arranged, the feeding end faces the discharging port of the feeding tray in the blanking posture, one end of each support leg is arranged on the bottom plate, the other end of each support leg is connected with the transition channel, the second support is arranged on the bottom plate, the detector is arranged on the second support and is electrically connected with the controller, the detector is used for detecting chips, and signals are transmitted to the controller.
As a further technical scheme, the transition channel and the feeding tray in the blanking posture are arranged at intervals.
As a further technical scheme, sorting mechanism includes sorting channel, brace table, first discharging channel, second discharging channel and second ejection piece, the brace table is located on the bottom plate, sorting channel slides and locates on the brace table, sorting channel's slip direction and chip's moving direction mutually perpendicular, sorting channel has two subchannels, two connecting portion have between the subchannel, connecting portion be used for fixing a position the chip and with the ejection end of second ejection piece is articulated, second ejection piece electricity is connected the controller, second ejection piece ejection sorting channel reciprocating motion, two the subchannel can respectively with first discharging channel with second discharging channel intercommunication with the help of sliding, first discharging port and second discharging port have been seted up to the casing, first discharging channel intercommunication first discharging port, second discharging channel intercommunication the second discharging port.
As a further technical scheme, the sorting channel is obliquely arranged, the first discharging channel and the second discharging channel are bent, the tail ends of the first discharging end and the second discharging end are horizontally arranged, and the front ends of the first discharging channel and the second discharging channel are flush with the sorting channel after sliding.
As a further technical scheme, the sub-channels are arranged in an S-shaped mode.
As a further technical scheme, an operation panel is connected to the shell, the operation panel is provided with a display screen and is electrically connected with the controller, and an observation window is further arranged at the top of the shell.
The working principle and the beneficial effects of the invention are as follows: compared with the prior art, the shell is arranged on the bottom plate, the shell and the bottom plate are combined to form the containing cavity, the material taking mechanism is used for taking the chip and then transmitting the chip to the testing assembly, and the testing assembly is used for testing the function of the chip so as to judge whether the chip is a qualified product; the sorting mechanism is arranged behind the logic of the testing assembly, namely chips passing through the testing assembly enter the sorting mechanism, and the sorting mechanism is used for screening out qualified products and defective products; the material taking mechanism, the testing assembly and the sorting mechanism are electrically connected with the controller, so that qualified products and defective products can be automatically distinguished from a small number of placed chips only by placing the chips into the material taking mechanism; the material taking mechanism comprises a first ejector piece, a first support, a vacuum chuck, a transmission part, a feeding plate and a posture adjusting rod, the first ejector piece is arranged at the top end of the first support, the bottom end of the first support is arranged on a bottom plate, the ejector end of the first ejector piece can lift in the vertical direction, the vacuum chuck is arranged on the ejector end of the first ejector piece, a power source of the vacuum chuck is electrically connected with a controller, and when the first ejector piece is close to a chip through descending, the vacuum chuck acts and sucks the chip; the first ejection part is compactly connected with the transmission part, namely, the first ejection part and the transmission part are combined together, the occupied space is smaller, the feeding disc is rotatably arranged on the transmission part, the first ejection part can swing the feeding disc by means of the transmission part and is matched with the chip to grab the chip, so that the feeding disc swings to one side when the chip is grabbed, and after the grabbing is finished, the feeding disc is positioned below the vacuum chuck, so that after the chip is loosened by the vacuum chuck, the chip can enter the feeding disc, the chip can swing along with the swinging action of the feeding disc, and the posture of the feeding disc in the swinging process can be adjusted by the posture adjusting rod, the feeding disc can present a blanking posture, and when the blanking posture of the feeding disc, the chip in the feeding disc can slide into the test component by taking the gravity of the chip into consideration; when the feeding tray is in the reset swing process, due to the existence of the other posture adjusting rod, the posture of the feeding tray can be adjusted again, the feeding tray enters the material containing posture, the feeding tray under the material containing posture is horizontal, and the feeding tray under the blanking state is inclined. Because compact connection relation exists among the feeding agencies to feeding agencies logic rear is accredited testing organization and sorting mechanism, greatly reduced the complexity of equipment, because whole equipment relates to higher automation, consequently, to the chip of small batch production, it is more simple and convenient to test.
Drawings
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
FIG. 1 is an isometric illustration of the overall exterior provided by the present invention;
FIG. 2 is a schematic view of the structure of FIG. 1 at another angle;
FIG. 3 is a schematic view of the structure of FIG. 1 with the housing hidden;
FIG. 4 is a schematic view of the structure of FIG. 3 at another angle;
FIG. 5 is a top view of FIG. 1;
FIG. 6 is a schematic view of a portion of a material extracting mechanism according to the present invention;
FIG. 7 is a front view of FIG. 6;
FIG. 8 is a schematic view of a part of the structure of a material taking mechanism of the feeding tray in a material containing posture;
FIG. 9 is a schematic view of a chip positioned at a connecting portion of a sorting channel according to the present invention;
FIG. 10 is a schematic view of a feed tray according to the present invention;
in the figure:
1. the device comprises a bottom plate, 2, a shell, 3, a material taking mechanism, 4, a testing component, 5, a sorting mechanism, 6, a first ejector piece, 7, a first support, 8, a vacuum chuck, 9, a feeding disc, 10, a posture adjusting rod, 11, a rotary column, 12, a torsion spring, 13, a transmission rod, 14, a push plate, 15, a first driven rod, 16, a second driven rod, 17, a driving piece, 18, a lead screw, 19, a sliding plate, 20, a sliding block, 21, a supporting plate, 22, a traction rod, 23, a transition channel, 24, a support leg, 25, a detector, 26, a second support, 27, a sorting channel, 28, a supporting table, 29, a first discharging channel, 30, a second discharging channel, 31, a second ejector piece, 32, an operation panel, 33 and an observation window.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall relate to the scope of protection of the present invention.
As shown in fig. 1 to 5, the present embodiment provides a desktop-level small chip testing and sorting apparatus, including a bottom plate 1, a housing 2, a material taking mechanism 3, a testing component 4, a sorting mechanism 5 and a controller, where the bottom plate 1 and the housing 2 form a containing cavity, the material taking mechanism 3 and the sorting mechanism 5 are both disposed in the containing cavity, the material taking mechanism 3, the testing component 4 and the sorting mechanism 5 are both electrically connected to the controller, the material taking mechanism 3 includes a first ejector 6, a first bracket 7, a vacuum chuck 8, a transmission member, a feeding tray 9 and a posture adjusting rod 10, the first bracket 7 is disposed on the bottom plate 1, the first ejector 6 is disposed on the first bracket 7, the vacuum chuck 8 is disposed on a pushing top end of the first ejector 6, the pushing top end of the first ejector 6 moves in a vertical direction, the first ejector 6 pushes the feeding tray 9 to swing back and forth in a horizontal plane by means of the transmission member compactly connected to itself, the feeding tray 9 is rotatably connected to the transmission member, the two posture adjusting rods 10 are disposed on the bottom plate 1, the feeding tray 9 is adjusted to realize a sliding state of the feeding tray under gravity test of chips under the gravity state.
In the embodiment, the shell 2 is arranged on the bottom plate 1, the shell 2 and the bottom plate 1 are combined to form an accommodating cavity, the material taking mechanism 3 is used for taking a chip and then transmitting the chip to the testing assembly 4, and the testing assembly 4 is used for testing the function of the chip to judge whether the chip is a qualified product; the sorting mechanism 5 is arranged behind the logic of the testing component 4, namely chips passing through the testing component 4 enter the sorting mechanism 5, and the sorting mechanism 5 is used for screening qualified products and defective products; the material taking mechanism 3, the testing component 4 and the sorting mechanism 5 are all electrically connected with the controller, so that only the chips are put into the material taking mechanism 3, and qualified products and defective products can be automatically distinguished from a small number of placed chips; the material taking mechanism 3 comprises a first ejector 6, a first support 7, a vacuum chuck 8, a transmission part, a feeding plate 9 and a posture adjusting rod 10, the first ejector 6 is arranged at the top end of the first support 7, the bottom end of the first support 7 is arranged on the bottom plate 1, the ejector end of the first ejector 6 can lift along the vertical direction, the vacuum chuck 8 is arranged on the ejector end of the first ejector 6, a power source of the vacuum chuck 8 is electrically connected with the controller, when the first ejector 6 is lowered to be close to a chip, the vacuum chuck 8 acts and sucks the chip, and by adopting the material taking methods, the damage to the surface of the chip is avoided; the first ejection part 6 is compactly connected with the transmission part, namely, the space occupied by the first ejection part 6 and the transmission part after being combined together is small, the feeding disc 9 is rotatably arranged on the transmission part, the first ejection part 6 can swing the feeding disc 9 by means of the transmission part and is matched with the chip to grab the chip, so that when the chip is grabbed, the feeding disc 9 swings to one side, after the grabbing is finished, the feeding disc 9 is positioned below the vacuum chuck 8, so that after the chip is loosened by the vacuum chuck 8, the chip can enter the feeding disc 9 and can slide into the testing component 4 by taking the gravity of the chip in the feeding disc 9 into consideration along with the swinging action of the feeding disc 9 and the posture adjustment of the posture adjusting rod 10 in the swinging process of the feeding disc 9, the feeding disc 9 can be in a blanking posture, and when the feeding disc 9 is in the blanking posture, the chip in the feeding disc 9 can slide into the testing component 4 by taking the gravity of the self; when the feeding tray 9 is in the reset swing process, due to the existence of the other posture adjusting rod 10, the posture of the feeding tray 9 can be adjusted again, the feeding tray enters the material containing posture, the feeding tray 9 in the material containing posture is horizontal, and the feeding tray 9 in the blanking state is inclined. Because there is compact relation of connection in the extracting mechanism 3 to extracting mechanism 3 logic rear is accredited testing organization and sorting mechanism 5, greatly reduced the complexity of equipment, because whole equipment relates to higher automation, consequently, to the chip of small batch production, it is more simple and convenient to test.
In this embodiment, in order to avoid feeding tray 9 random rotating, can set up the rotation between feeding tray 9 and the driving medium into the damping form of rotating, promptly under the effect that does not have the external force, feeding tray 9 can not appear rotating for the driving medium, only under the intervention of transferring appearance pole 10, and damping force can be overcome to feeding tray 9, appears rotating to finally realize the adjustment in the gesture.
The desktop-level small chip testing and sorting equipment provided by the invention has the advantages of simple structure and convenience in manufacturing, and the internal mechanisms are connected in a compact connection mode, so that the occupied area is small, and the manufacturing cost is low.
In the invention, in order to avoid the chip from being damaged in the sliding process, the four corners of the chip can be provided with corner protectors. The corner protector is made of a material with a small surface friction coefficient.
It should be noted that the testing of the chip is prior art, and since the testing component 4 does not belong to the core concept of the present invention, the testing component 4 is only used for its principle in the present invention, and the excessive principle and structural discussion is not repeated.
As shown in fig. 3 to 8, further, the transmission part includes a rotary column 11, a torsion spring 12, a transmission rod 13 and a push plate 14, the bottom end of the rotary column 11 is rotatably disposed on the bottom plate 1, an axis of the rotary column 11 is perpendicular to a horizontal plane, a top end of the rotary column 11 is provided with a first driven rod 15 and a second driven rod 16, an axis of the first driven rod 15 is perpendicular to an axis plane of the second driven rod 16, the second driven rod 16 is rotatably connected with the feeding tray 9, one end of the transmission rod 13 is fixedly connected with a pushing shaft of the first pushing member 6, the other end of the transmission rod is connected with the push plate 14, the push plate 14 has an inclined surface, the inclined surface is always in contact with the first driven rod 15, the transmission rod 13 is located above the feeding tray 9, the torsion spring 12 is sleeved outside the rotary column 11, one end of the torsion spring 12 is connected with the bottom plate 1, and the other end of the torsion spring 12 is connected with the second driven rod 16.
In this embodiment, in order to reduce the complexity of the whole and further improve the miniaturization degree of the whole, the transmission component includes a rotary column 11, a torsion spring 12, a transmission rod 13 and a push plate 14, the bottom end of the rotary column 11 is rotatably disposed on the bottom plate 1, the top end of the rotary column 11 is provided with a first driven rod 15 and a second driven rod 16, both the first driven rod 15 and the second driven rod 16 are cylindrical rods, the axes of the first driven rod 15 and the second driven rod 16 are perpendicular to each other, the height of the second driven rod 16 is lower than that of the first driven rod 15, the end of the second driven rod 16 is rotatably connected with the feed plate 9, that is, a rotary hole is formed in the feed plate 9, the second driven rod 16 penetrates into the rotary hole, in order to realize the damping rotation between the second driven rod 16 and the feed plate 9, a rotary damper may be disposed between the second driven rod 16 and the feed plate 9, one end of the transmission rod 13 is connected with the push shaft of the first push piece 6, the other end is connected with the push plate 14, the push plate 14 has an inclined surface, and the outer edge of the first driven rod 15 is always in contact with the inclined surface; as shown in fig. 6, when the transmission rod 13 moves downward along with the pushing of the first pushing member 6, the push plate 14 moves downward, the push plate 14 pushes the first driven rod 15 to rotate by means of the inclined surface, so that the rotating column 11 rotates counterclockwise, and the feeding tray 9 swings counterclockwise along with the inclined surface, in the swinging process, the feeding tray 9 contacts the posture adjusting rod 10, so that the posture adjusting rod 10 adjusts the posture of the feeding tray 9 until the final draft presents a blanking posture, and at the moment, the torsion spring 12 is stressed; when the transmission rod 13 moves upwards, as shown in fig. 8, the push plate 14 moves upwards, the inclined surface avoids the first driven rod 15, the first driven rod 15 is still in contact with the inclined surface all the time under the drive of the reset of the torsion spring 12, at the moment, the rotary column 11 rotates clockwise in the drawing, the feeding tray 9 swings clockwise, and in the process, the feeding tray 9 contacts the other posture adjusting rod 10 until the posture adjusting rod 10 enables the feeding tray 9 to present the material containing posture. When the feeding tray 9 is in the feeding posture, the transmission rod 13 is at the lowest position, as shown in fig. 6, and the vacuum chuck 8 takes materials at the moment; on the contrary, when the feeding tray 9 is in the material containing posture, the transmission rod 13 is at the highest position, and as shown in fig. 8, the vacuum chuck 8 discharges materials; the material taking and placing actions of the vacuum chuck 8 are related with the material feeding and containing actions of the material feeding disc 9, the linkage is structurally realized, the number of induction devices and power transposition is reduced, the compactness of the whole structure is improved, and the failure rate caused by an electric device is greatly reduced.
As shown in fig. 3 to fig. 5, further, the material taking mechanism 3 further includes a driving member 17, a screw rod 18 and a sliding plate 19, the driving member 17 is disposed on the bottom plate 1, the power output end of the driving member is connected to the screw rod 18, the sliding plate 19 is slidably disposed on the bottom plate 1 and is provided with a threaded hole, the screw rod 18 is disposed in the threaded hole in a penetrating manner, the housing 2 is provided with a material inlet, and the sliding plate 19 slides to the material inlet to receive the chip.
In this embodiment, in order to further improve the automation of whole equipment, extracting mechanism 3 still includes driving piece 17, lead screw 18 and slide 19, driving piece 17 sets up on bottom plate 1, lead screw 18 is connected to driving piece 17's power take off end, set up the recess that is used for the direction on bottom plate 1, slide 19 slides with the help of the recess and sets up on bottom plate 1, lead screw 18 is located the recess, guarantee that the outer fringe highest point of lead screw 18 is less than the plane of bottom plate 1, avoid lead screw 18 and other spare parts to appear interfering like this, set up the screw hole on the slide 19, lead screw 18 wears to establish in the screw hole, lead screw 18 realizes slide 19's removal with the help of screw hole and slide 19 threaded connection, just so can guarantee that driving piece 17 drives the removal of lead screw 18 pivoted while, driving piece 17 is connected with the controller electricity, just so can realize automatic control through the controller. The operator only needs to stack the chip to be tested on the slide plate 19, and then moves the chip on the slide plate 19 to a designated position through the controller.
As shown in fig. 3 to 5 and 10, the material taking mechanism 3 further includes a slider 20 and a support plate 21, the slider 20 is slidably disposed on the bottom plate 1, the support plate 21 is disposed on the slider 20, the posture adjusting rods 10 are disposed on the support plate 21, the two posture adjusting rods 10 are disposed in parallel, the feed tray 9 is connected with a traction rod 22, and the feed tray 9 is in contact with the two posture adjusting rods 10 by means of the traction rod 22 to adjust the posture thereof.
In this embodiment, for different chips, sometimes the material discharge tray needs to be tilted by a larger angle in the material discharge posture to smoothly slide into the test assembly 4, and therefore, the posture of the material discharge tray needs to be adjusted, and the posture tilt angle of the material discharge tray needs to be adjusted by the posture adjustment rod 10, so that the material taking mechanism 3 is further provided with a slider 20 and a support plate 21, the slider 20 is slidably arranged on the bottom plate 1, the position of the slider 20 on the bottom plate 1 can be fixed, and the support plate 21 is arranged on the slider 20, so that the position of the posture adjustment rod 10 can be adjusted by setting the position of the adjustment slider 20.
In this embodiment, in order that the posture adjusting rods 10 do not interfere with the material taking action of the vacuum chuck 8, the draw bar 22 may be disposed on the feeding tray 9, and the draw bar 22 extends between the two posture adjusting rods 10, so that the posture adjusting rods 10 can be ensured to be smaller in size, and the feeding tray 9 is linked with the material taking action of the vacuum chuck 8, so that the feeding tray 9 is more easily prevented from interfering.
As shown in fig. 3 to 5 and 9, the testing assembly 4 further includes a transition channel 23, a leg 24, a detector 25 and a second support 26, the transition channel 23 is disposed in an inclined manner, and the feeding end faces the discharging port of the feeding tray 9 in the blanking posture, one end of the leg 24 is disposed on the bottom plate 1, the other end of the leg is connected to the transition channel 23, the second support 26 is disposed on the bottom plate 1, the detector 25 is disposed on the second support 26 and electrically connected to the controller, the detector 25 is used for detecting the chip, and the signal is transmitted to the controller.
In this embodiment, the test assembly 4 includes a transition channel 23, legs 24, a detector 25, and a second support 26; in order to ensure that the chips can stably slide into the transition channel 23 from the feeding tray 9, the transition channel 23 can be obliquely arranged, and the feeding end of the transition channel 23 faces the discharging port of the feeding tray 9 in the discharging posture, that is, the plane contacted by the chips in the transition channel 23 and the plane contacted by the chips in the feeding tray 9 are in the same plane; the legs 24 are arranged on the bottom plate 1, the tops of the legs 24 are connected with the transition channel 23, and the legs 24 are used for providing support for the transition channel 23; the second bracket 26 is arranged on the bottom plate 1, the detector 25 is arranged on the second bracket 26, the detector 25 is electrically connected with the controller, and the detector 25 is used for detecting the chip in the transition channel 23 and transmitting the detection result to the controller. During normal operation, after the detector 25 senses the chip, the detector 25 gives a signal to the controller firstly, the controller stops the action on the first ejector 6 after receiving the signal, and after the detector 25 detects the chip, the detector transmits another signal to the controller, after receiving the signal, the controller enables the sorting mechanism 5 to work to receive the chip, and the controller sends a signal to the first ejector 6 to enable the first ejector 6 to act, so that a new round of material taking, material placing and detection is completed.
As shown in fig. 5, the transition channel 23 is further spaced from the feeding tray 9 in the blanking position.
In this embodiment, since the feeding tray 9 needs to rotate, in order to avoid interference between the transition channel 23 and the feeding tray 9, a gap needs to be formed between the transition channel 23 and the feeding tray 9 in the blanking posture, and the width of the gap is 0.5 to 0.85 times of the thickness of the feeding tray 9.
As shown in fig. 3 to 5 and 9, further, the sorting mechanism 5 includes a sorting channel 27, a support table 28, a first discharging channel 29, a second discharging channel 30 and a second ejector 31, the support table 28 is disposed on the bottom plate 1, the sorting channel 27 is slidably disposed on the support table 28, a sliding direction of the sorting channel 27 is perpendicular to a moving direction of the chip, the sorting channel 27 has two sub-channels, a connecting portion is disposed between the two sub-channels, the connecting portion is used for positioning the chip and is hinged to an ejector end of the second ejector 31, the second ejector 31 is electrically connected to the controller, the second ejector 31 ejects the sorting channel 27 to move reciprocally, the two sub-channels can be respectively communicated with the first discharging channel 29 and the second discharging channel 30 by sliding, the housing 2 is provided with a first discharging port and a second discharging port, the first discharging channel 29 is communicated with the first discharging port, and the second discharging channel 30 is communicated with the second discharging port.
In this embodiment, the sorting mechanism 5 includes a sorting channel 27, a supporting table 28, a first discharging channel 29, a second discharging channel 30 and a second ejector 31, the supporting table 28 is disposed on the bottom plate 1, the sorting channel 27 is disposed on the top end of the supporting table 28, the sorting channel 27 can slide on the supporting table 28, the sorting channel 27 has two sub-channels, the two sub-channels are respectively used for conveying qualified products and defective products, a connecting portion is disposed between the two sub-channels, the ejector end of the second ejector 31 is connected with the connecting portion, the second ejector 31 provides power for the sorting channel 27 to slide on the supporting table 28, the second ejector 31 is electrically connected with the controller, therefore, the controller can realize that the two sub-channels are respectively communicated with the transition channel 23, the sorting channel 27 can respectively communicate with the first discharging channel 29 and the second discharging channel 30 by sliding in two directions, the first discharging channel 29 and the second discharging channel 30 are both disposed on the bottom plate 1, a first discharging port and a second discharging port are disposed on the housing 2, the end of the first discharging channel 29 is communicated with the second discharging port, the end of the qualified nameplate is conveniently attached to the housing, and the discharging port, the discharging port is not attached to the housing, and the qualified nameplate, the discharging port is attached to the discharging port, and not attached to the housing.
During normal work, sorting channel 27's connecting portion keep off at sorting channel 27's discharge end, the chip enters into transition passageway 23 in with the connecting portion contact, connecting portion are used for playing the effect of location for the chip, detector 25 detects the chip, only when the signal that the controller transmission was given to the chip is that the feedback chip is qualified product or defective products, the controller just can give second ejector part 31 signal, and second ejector part 31 is according to the signal selection ejection that the transmission comes or withdraws, and then realize that the chip enters into first discharging channel 29 or second discharging channel 30, the automatic separation of chip has been realized to this kind of structure, and operating personnel is in the outside of device, just can judge whether qualified product is to the chip according to the discharge gate of difference, can not cause the confusion.
As shown in fig. 9, further, the sorting channel 27 is arranged obliquely, the first discharging channel 29 and the second discharging channel 30 are both arranged in a bent manner, the ends of the first discharging end and the second discharging end are both arranged horizontally, and the front ends of the first discharging channel 29 and the second discharging channel 30 are both arranged flush with the sorting channel 27 after sliding.
In this embodiment, since the transition channel 23 is obliquely arranged, in order to ensure that the chips stably enter the sorting channel 27, the sorting channel 27 may be arranged in an oblique manner, and the first discharging channel 29 and the second discharging channel 30 are both arranged in a bent manner, that is, the first discharging channel 29 has an oblique portion for abutting against the sorting channel 27 and a horizontal portion for abutting against the first discharging port, and similarly, the structure and arrangement of the second discharging channel 30.
As shown in fig. 9, further, the sub-channels are arranged in an S-turn.
In this embodiment, since the transition channel 23 and the sorting channel 27 are arranged in alignment, in order to reduce the speed of the chip entering the first discharging channel 29 or the second discharging channel 30, the sub-channels in the sorting channel 27 can be arranged in an S-turn form, so that the sliding speed of the chip can be reduced, and the S-turn form is provided with a round corner at the turn, so that the chip can smoothly pass through the S-turn form.
As shown in fig. 1, an operation panel 32 is further connected to the housing 2, the operation panel 32 has a display screen and is electrically connected to the controller, and a viewing window 33 is further provided on the top of the housing 2.
In this embodiment, in order to facilitate setting of operations and parameters and monitoring of results, the operation panel 32 is connected to the outside of the housing 2, the operation panel 32 is electrically connected to the controller, and the operation panel 32 is also provided with a display screen. In order to allow the operator to observe the working conditions inside the housing 2, an observation window 33 may be provided at the top of the housing 2.
The present invention is not limited to the above preferred embodiments, and any modifications, equivalent substitutions, improvements, etc. within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. The utility model provides a small-size chip testing sorting facilities of desktop level, includes bottom plate (1), casing (2), extracting mechanism (3), test subassembly (4), sorting mechanism (5) and controller, bottom plate (1) with casing (2) form and hold the chamber, extracting mechanism (3) with sorting mechanism (5) all locate hold the intracavity, extracting mechanism (3), test subassembly (4) and sorting mechanism (5) all electricity connect the controller, extracting mechanism (3) include first ejecting (6), first support (7), vacuum chuck (8), driving medium, feed table (9) and accent appearance pole (10), first support (7) are located on bottom plate (1), first ejecting (6) are located on first support (7), vacuum chuck (8) are located the ejecting end of first ejecting (6), the ejecting end of first ejecting (6) moves along vertical direction, its characterized in that, first ejecting (6) with the help of self compact ejecting (6) with the help of self the driving medium of self swing with the help of the rotation of first ejecting (9) the drive medium swing feed table (9) and the feed table (10) all set up in the swing feed table (10) and the feed table (10) is the swing, and the drive medium is the adjusting the feed table (9) is the swing in the horizontal direction, and the feed table (10) is connected in the adjusting, the back is the compact (9) The feeding disc (9) enables the chips to slide into the testing assembly (4) under the self gravity when in a feeding state.
2. The table-top-level small chip testing and sorting device according to claim 1, wherein the transmission member comprises a rotary column (11), a torsion spring (12), a transmission rod (13) and a push plate (14), the bottom end of the rotary column (11) is rotatably arranged on the bottom plate (1), the axis of the rotary column (11) is perpendicular to the horizontal plane, a first driven rod (15) and a second driven rod (16) are arranged at the top end of the rotary column (11), the axis of the first driven rod (15) is perpendicular to the axis plane of the second driven rod (16), the second driven rod (16) is rotatably connected with the feeding plate (9), one end of the transmission rod (13) is fixedly connected with the ejection shaft of the first ejection member (6), the other end of the transmission rod is connected with the push plate (14), the push plate (14) has an inclined surface, the inclined surface is always in contact with the first driven rod (15), the transmission rod (13) is located above the feeding plate (9), the torsion spring (12) is sleeved outside the rotary column (11), one end of the bottom plate (12) is connected with the second driven rod (16).
3. The desktop-level small chip testing and sorting device according to claim 2, wherein the material taking mechanism (3) further comprises a driving member (17), a lead screw (18) and a sliding plate (19), the driving member (17) is disposed on the bottom plate (1) and a power output end of the driving member is connected with the lead screw (18), the sliding plate (19) is slidably disposed on the bottom plate (1) and is provided with a threaded hole, the lead screw (18) is disposed in the threaded hole in a penetrating manner, the housing (2) is provided with a material inlet, and the sliding plate (19) slides to the material inlet to receive a chip.
4. The desktop-level small chip testing and sorting equipment as claimed in claim 3, wherein the material taking mechanism (3) further comprises a sliding block (20) and a supporting plate (21), the sliding block (20) is slidably arranged on the bottom plate (1), the supporting plate (21) is arranged on the sliding block (20), the posture adjusting rods (10) are arranged on the supporting plate (21), the two posture adjusting rods (10) are arranged in parallel, the feeding tray (9) is connected with a traction rod (22), and the feeding tray (9) is in contact with the two posture adjusting rods (10) by means of the traction rod (22) to adjust the posture of the feeding tray.
5. The table-top small chip testing and sorting device of claim 4, wherein the testing assembly (4) comprises a transition channel (23), a leg (24), a detector (25) and a second support (26), the transition channel (23) is obliquely arranged, a feeding end of the transition channel faces a discharging port of the feeding tray (9) in a discharging posture, one end of the leg (24) is arranged on the bottom plate (1), the other end of the leg is connected with the transition channel (23), the second support (26) is arranged on the bottom plate (1), the detector (25) is arranged on the second support (26) and is electrically connected with the controller, the detector (25) is used for detecting chips, and signals are transmitted to the controller.
6. The bench-top microchip testing and sorting apparatus of claim 5, wherein the transition channel (23) is spaced from the feed tray (9) in the blanking position.
7. The device for testing and sorting desktop-level small chips according to claim 5, wherein the sorting mechanism (5) comprises a sorting channel (27), a supporting table (28), a first discharging channel (29), a second discharging channel (30) and a second ejector (31), the supporting table (28) is disposed on the bottom plate (1), the sorting channel (27) is slidably disposed on the supporting table (28), the sliding direction of the sorting channel (27) is perpendicular to the moving direction of the chips, the sorting channel (27) has two sub-channels, a connecting portion is disposed between the two sub-channels, the connecting portion is used for positioning the chips and is hinged to the ejector end of the second ejector (31), the second ejector (31) is electrically connected to the controller, the second ejector (31) ejects the sorting channel (27) to move in a reciprocating manner, the two sub-channels are respectively communicated with the first discharging channel (29) and the second discharging channel (30) by means of sliding, the housing (2) is provided with a first discharging port and a second discharging port, the first discharging channel (29) is communicated with the second discharging port, and the second discharging port (30) is communicated with the second discharging port.
8. The table-top small chip testing and sorting device according to claim 7, wherein the sorting channel (27) is obliquely arranged, the first discharging channel (29) and the second discharging channel (30) are both bent, the ends of the first discharging end and the second discharging end are both horizontally arranged, and the front ends of the first discharging channel (29) and the second discharging channel (30) are both flush with the sorting channel (27) after sliding.
9. The apparatus as claimed in claim 8, wherein the sub-channels are S-shaped.
10. The desktop-level small chip testing and sorting device according to any one of claims 1-9, wherein an operation panel (32) is connected to the housing (2), the operation panel (32) has a display screen and is electrically connected to the controller, and a viewing window (33) is further disposed on the top of the housing (2).
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| CN202211049685.XA CN115338132B (en) | 2022-08-30 | 2022-08-30 | Desktop-level small-sized chip test sorting equipment |
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| CN202211049685.XA CN115338132B (en) | 2022-08-30 | 2022-08-30 | Desktop-level small-sized chip test sorting equipment |
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| CN115338132B (en) | 2023-05-26 |
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