CN114280382A - Test system and test method for automatically correcting spherical near-field antenna - Google Patents
Test system and test method for automatically correcting spherical near-field antenna Download PDFInfo
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Abstract
A test system and a test method for automatically correcting a spherical near-field antenna belong to the technical field of antenna test and solve the problems of low test efficiency, large consumption of human resources and incapability of realizing large-batch product test in the conventional antenna test system and test method; the technical scheme of the invention combines an antenna near-field test system, a general test board and an automatic control extension, wherein the automatic control extension is used as a control center to respectively control the near-field test system to complete the test and the general test board to complete the correction; the automatic correction test system completes the performance test of the antenna to be tested and the correction of partial channel parameters at the same time, and ensures that each set of tested antenna is a qualified product meeting the performance index requirements; only need set up qualified judgement standard, this correction of system automatic completion and test process need not artifical intervention flow, has promoted the automation level of antenna test by a wide margin, satisfies the test demand of big batch antenna.
Description
Technical Field
The invention belongs to the technical field of antenna testing, and relates to a testing system and a testing method for an automatic correction spherical near-field antenna.
Background
The spherical near-field test system is a system for measuring the radiation performance of an antenna, and is disclosed in the 2016 publication of spherical near-field measurement error analysis and diagnosis method research (liu courage, university of electronic science and technology), and generally consists of a near-field test sampling frame and a radio frequency instrument subsystem. The spherical near-field test system can be divided into a single-probe test system and a multi-probe test system, and the single-probe test system completes the sampling work of the whole spherical space by a single microwave probe; the multi-probe test system completes the sampling work of the whole spherical space by a plurality of microwave probes and a matrix switch. Compared with other near-field test systems, the spherical near field can measure the antenna performance of a 4 pi solid angle space, and the test range is wider; meanwhile, the structure is completely symmetrical, so that the probe compensation work is easy to realize, and a broadband probe can be adopted; the spherical near-field test system can improve the test speed by one order of magnitude by matching with a plurality of sampling probes and switching of an electronic switch.
The active antenna test bench is a hardware device, for example, chinese patent application publication No. CN110146861A, published as 2019, 08 and 20, discloses an active phased array system test method and test bench, and discloses an active antenna test bench capable of implementing functions such as control of channel parameters of an active phased array antenna, excitation of timing sequence, and synchronization of receiving and transmitting signals. Because the hardware and the communication control protocol of the microwave component are different, the antenna test bench is divided into a special test bench and a general test bench. The special test board serves single-model products, and has the advantages of simple development process, high test efficiency and no need of secondary development; the universal test board can serve radar products of various models, and has the advantages of multiple service items, strong compatibility and high equipment utilization rate.
In the existing spherical surface near-field antenna test technology, an antenna near-field test system completes antenna radiation performance test and generates antenna far-field directional pattern data; the test board is responsible for parameter control and time sequence generation of the active system, and parameter configuration of the active system to be tested is changed according to instructions of the upper computer. The test bench system can only execute the test task according to the instruction of a test engineer or upper computer software, and cannot autonomously judge the test index conformity and adjust the channel parameters. The test engineer needs to judge whether the antenna performance test result meets the requirement, then adjusts the relevant parameters of the active channel through the upper computer software, and then needs to repeat the process until the test result meets the requirement. Therefore, the existing active antenna testing technology under the spherical near-field condition has the following disadvantages: A. the antenna testing efficiency is low; B. the test consumes a large amount of human resources; C. large-scale product testing cannot be realized.
Disclosure of Invention
The invention aims to design a test system and a test method for automatically correcting a spherical near-field antenna, and aims to solve the problems that the existing antenna test system and test method are low in test efficiency, consume a large amount of human resources and cannot realize large-batch product test.
The invention solves the technical problems through the following technical scheme:
an auto-calibrating spherical near-field antenna test system, comprising: the system comprises a spherical near-field antenna test rack (10), a universal test bench (11), an automatic control extension (12), a vector network analyzer (13) and a router (14); the spherical near-field antenna test jig (10) comprises: the device comprises an azimuth turntable (101), a pitching swing arm (102), a sampling probe (103), a pitching turntable (104) and an antenna array plane (105); the antenna array surface (105) is arranged on an azimuth turntable (101), the pitching swing arm (102) is arranged on a pitching turntable (104), and the sampling probe (103) is arranged at one end of the pitching swing arm (102); a pitching rotary table (104) is arranged in the polarization direction of the sampling probe (103); the first channel of the general test bench (11) is connected with the antenna array surface (105), the second channel of the general test bench (11) is connected with the first channel of the automatic control extension (12), the third channel of the general test bench (11) is connected with the router (14), the third channel of the general test bench (11) is connected with the pitching rotary table (104), the second channel of the automatic control extension (12) is connected with the vector network analyzer (13), the communication end of the automatic control extension (12) is connected with the router (14), the first channel of the vector network analyzer (13) is connected with the antenna array surface (105), the second channel of the vector network analyzer (13) is connected with the pitching swing arm (102), the communication end of the vector network analyzer (13) is connected with the router (14), and the timing control end of the vector network analyzer (13) is connected with the pitching rotary table (104).
The technical scheme of the invention combines an antenna near-field test system, a general test board and an automatic control extension, wherein the automatic control extension is used as a control center to respectively control the near-field test system to complete the test and the general test board to complete the correction; the automatic correction test system not only completes the performance test of the antenna to be tested, but also completes the correction of partial channel parameters and completes a test closed loop, thereby ensuring that each set of antenna which is tested is a qualified product which meets the performance index requirement; the user only needs to set up qualified judgment standard before the test begins, then waits for the system to automatically finish the correction and test process, does not need the manual intervention flow, and test, index study and judge, correction, parameter adjustment are all automatically finished, have promoted the automation level of antenna test by a wide margin, have satisfied the test demand of big batch antennas.
Furthermore, the general test bench (11), the automatic control extension (12) and the vector network analyzer (13) are respectively connected with the router (14) through network links so as to form a local area network, and the automatic control extension (12) in the local area network sends control commands to the general test bench (11) and the vector network analyzer (13) and simultaneously receives feedback information of the general test bench (11) and the vector network analyzer (13); the automatic control extension (12) is connected with the general test bench (11) and the vector network analyzer (13) by a data link, the automatic control extension (12) issues correction data to the general test bench (11), and meanwhile, the automatic control extension (12) reads test data sent by the vector network analyzer (13); the pitching rotary table (104), the general test table (11), the vector network analyzer (13) and the antenna array surface (105) are connected by a time sequence link, and the time sequence link is used for transmitting synchronous working time sequence signals of the pitching rotary table and the general test table; the vector network analyzer (13), the sampling probe (103) and the antenna array surface (105) are connected through a radio frequency link, and the radio frequency link is used for transmitting microwave radio frequency signals.
Further, the data link uses a serial port or RS484 or GPIB interface.
A testing method applied to the automatic correction spherical near-field antenna testing system comprises the following steps:
s1, setting system test parameters, including: testing frequency, testing wave position, size of the antenna to be tested and distribution position of the antenna channel to be tested;
s2, setting a far-field parameter qualification standard in the system, wherein the far-field parameters comprise: the antenna circular polarization axial ratio and the directivity coefficient;
s3, performing near field test and calculating far field parameters to obtain an antenna far field directional diagram;
s4, calculating the antenna circular polarization axial ratio and the directivity coefficient according to the antenna far-field directional diagram, comparing the calculation result with the parameter qualified standard, judging whether the calculation result passes or not, if so, ending the antenna test, and if not, performing the step S5;
s5, calculating antenna aperture field distribution from an antenna far-field directional pattern, and performing antenna aperture inversion;
s6, calculating the channel compensation value according to the electric field distribution under the ideal condition set by the system after the antenna aperture field distribution is obtained by calculation,
and S7, sending the channel compensation value to a general test board, sending the compensation value to the antenna to be measured by the general test board according to the corresponding relation between the position and the port for compensation, measuring the antenna to be measured again after the compensation process is completed, and entering the next cycle.
Further, the method for calculating the antenna circular polarization axial ratio according to the antenna far field pattern comprises the following steps:
ma＝abs(ER)
ca＝abs(EL)
AR＝-20*log10((abs(ma)+abs(ca))/(abs(abs(ma)-abs(ca))))
wherein Ex and Ey respectively represent far-field directional patterns in the direction of X, Y, AR represents the circular polarization axial ratio of the antenna to be measured, and ELIs a left-handed wave component, E, in an electromagnetic waveRRefers to the right-handed component, m, of the electromagnetic waveaIs the amplitude value of the right-handed wave component, caIs the amplitude value of the left-handed wave component.
Further, the calculation formula of the directivity coefficient is as follows:
wherein D represents the directivity coefficient, P (theta, phi) represents the far-field radiation power density of the antenna to be measured under the angle of theta and phi, and P (theta, phi)maxRepresents the point of strongest radiation power density, P (theta, phi)avRepresenting the average radiant energy value, d Ω refers to integrating the radiant power density over a solid angle.
Further, the common method for calculating the distribution of the antenna aperture field is as follows:
1) calculating spectral coefficients from the antenna far field pattern:
A＝F/cosθ/k*1i
f represents a far-field directional diagram of the antenna to be detected, A represents a spectral coefficient of a radiation field of the antenna to be detected respectively, and k represents an electromagnetic wave number;
2) calculating aperture field distribution according to the spectral coefficient:
wherein k ismRepresenting the maximum value of the spectrum, integrating the spectrum coefficient to obtain the distribution condition of the aperture field of the antenna to be measured, and x and y represent the position of the electric field distribution, namely, calculating coordinate values;
refers to the electromagnetic wave spectrum function.
Further, the channel compensation value comprises: an amplitude compensation value and a phase compensation value.
Further, the calculation formula of the amplitude compensation value is as follows:
Dx,y＝20*log10(Ec(x,y)/E(x,y))
wherein D isx,yRepresenting the amplitude compensation value.
Further, the calculation formula of the phase compensation value is as follows:
Px,y＝angle(Ec(x,y))-angle(E(x,y))
wherein, Px,yRepresents a phase compensation value, and angle () represents the phase of the calculation result.
The invention has the advantages that:
the technical scheme of the invention combines an antenna near-field test system, a general test board and an automatic control extension, wherein the automatic control extension is used as a control center to respectively control the near-field test system to complete the test and the general test board to complete the correction; the automatic correction test system not only completes the performance test of the antenna to be tested, but also completes the correction of partial channel parameters and completes a test closed loop, thereby ensuring that each set of antenna which is tested is a qualified product which meets the performance index requirement; the user only needs to set up qualified judgment standard before the test begins, then waits for the system to automatically finish the correction and test process, does not need the manual intervention flow, and test, index study and judge, correction, parameter adjustment are all automatically finished, have promoted the automation level of antenna test by a wide margin, have satisfied the test demand of big batch antennas.
Drawings
FIG. 1 is a schematic structural diagram of an auto-calibration spherical near-field antenna test system according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a near field antenna test rack according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a universal test station according to an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of an automatic correction extension according to an embodiment of the present invention;
FIG. 5(a) is a flow chart of a testing method according to an embodiment of the present invention, and FIG. 5(b) is a flow chart of a prior art testing method;
fig. 6 is an antenna far field pattern of an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the embodiments of the present invention, and it is obvious that the described embodiments are some embodiments of the present invention, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The technical scheme of the invention is further described by combining the drawings and the specific embodiments in the specification:
example one
As shown in fig. 1 and 2, an auto-calibration spherical near-field antenna test system includes: the system comprises a spherical near-field antenna test rack 10, a general test board 11, an automatic control extension 12, a vector network analyzer 13 and a router 14, wherein the spherical near-field antenna test rack is installed in a microwave darkroom; the spherical near-field antenna test jig 10 includes: an azimuth turntable 101, a pitching swing arm 102, a sampling probe 103, a pitching turntable 104, and an antenna array 105; the first channel of the general test bench 11 is connected with the antenna array surface 105, the second channel of the general test bench 11 is connected with the first channel of the automatic control extension 12, the third channel of the general test bench 11 is connected with the router 14, the third channel of the general test bench 11 is connected with the pitching rotary table 104, the second channel of the automatic control extension 12 is connected with the vector network analyzer 13, the communication end of the automatic control extension 12 is connected with the router 14, the first channel of the vector network analyzer 13 is connected with the antenna array surface 105, the second channel of the vector network analyzer 13 is connected with the pitching swing arm 102, the communication end of the vector network analyzer 13 is connected with the router 14, and the time sequence control end of the vector network analyzer 13 is connected with the pitching rotary table 104.
As shown in fig. 2, the antenna array 105 is mounted on the azimuth turntable 101 and rotates 360 degrees along with the azimuth turntable 101, and the adjustment precision of the azimuth turntable 101 is 0.01 degree; the pitching swing arm 102 is arranged on a pitching rotary table 104, the sampling probe 103 is arranged at one end of the pitching swing arm 102 and rotates along with the positive and negative 120 degrees of the pitching swing arm 102 for sampling, and the precision of the rotary table is 0.01 degree; a pitching rotary table 104 is arranged in the polarization direction of the sampling probe 103, and the polarization can rotate by plus or minus 90 degrees; the spherical near-field antenna test frame 10 is used for completing an antenna parameter measurement task and obtaining main parameters of gain, side lobe level, directivity coefficient, EIS, ERRP, beam width, beam pointing and the like of an antenna to be measured.
Description of the connection link:
a. network link: the router 14 is connected to the general purpose test board 11, the automatic control slave unit 12, and the vector network analyzer 13, respectively, to form a local area network, and in the local area network, the automatic control slave unit 12 transmits a control command to the general purpose test board 11 and the vector network analyzer 13, and receives feedback information of the general purpose test board 11 and the vector network analyzer 13.
b. Data link: the data link uses interfaces such as a serial port, RS484, GPIB, and the like, and is used for automatically controlling the extension 12 to issue correction data to the general test board 11, and simultaneously, automatically controlling the extension 12 to read the test data sent by the vector network analyzer 13.
c. And (3) timing link: the timing chain connects the elevation turret 104, the universal test station 11, the vector network analyzer 13, the antenna array 105 for their operational timing synchronization.
d. And a radio frequency link: the radio frequency link is connected with the vector network analyzer 13, the sampling probe 103 and the antenna array face 105 and is used for transmitting microwave radio frequency signals.
As shown in fig. 3, the general test platform 11 is configured to complete an active channel parameter adjustment task, adjust a channel delay time, a phase code value, and an amplitude code value, and monitor a working state of the antenna array 105, so as to optimize the overall radiation performance of the antenna to be tested. The general test board 11 adopts a CPCI case structure, and a plurality of CPCI plug-in units are installed to realize the connection control function of the active channel of the antenna to be tested. The platform has 8 CPCI slots, wherein the CPCI power supply and the CPCI computer occupy two slots, and the other 6 slots are provided with multi-channel CPCI plug-in units. After the plug-in configuration is completed, the platform can support 96 paths of TTL input, 96 paths of TTL output, 384 paths of RS422 output, 96 paths of RS422 input, 72 paths of optical fiber input and 72 paths of optical fiber output.
As shown in fig. 4, the automatic control extension 12 is a core component of the automatic correction spherical near-field measurement system, and its tasks include sampling frame motion control, near-field data acquisition, near-field data analysis, near-field-aperture field inversion calculation, and active channel parameter calculation. The hardware of the automatic control extension 12 adopts an industrial control computer, and the software adopts a modular design and respectively comprises: the device comprises a data acquisition module, a motion control module, a data processing module, a monitoring feedback module, a channel control module and a caliber inversion module. The design of the automatic correction extension 12 comprises the design of software and algorithms, wherein the algorithms comprise a spherical near field-far field transformation algorithm, a spherical near field-aperture field transformation algorithm and a phased array code value compensation calculation algorithm; the software design considers the data interaction between the automatic control extension set and the near field test system software and the time sequence and parameter interaction between the automatic control extension set and the general test board, and meanwhile, the software design has a GUI user interaction interface, so that a user can monitor the test process and check the final antenna product test report.
Fig. 5(a) shows a testing method of the auto-calibration spherical near-field antenna testing system of the present embodiment, which includes the following steps:
1. setting system test parameters, including: testing frequency, testing wave position, size of the antenna to be tested, distribution position of the antenna channel to be tested and the like;
2. setting a far-field parameter qualification standard in the system, wherein the far-field parameters comprise: antenna circular polarization axial ratio, directivity coefficient, beam width and beam pointing;
3. performing near field test and calculating far field parameters to obtain an antenna far field directional diagram;
4. calculating the antenna circular polarization axial ratio, the directivity coefficient, the beam width and the beam direction according to the antenna far-field directional diagram, comparing the calculation result with the parameter qualified standard, judging whether the calculation result passes or not, if so, ending the antenna test, and if not, performing the step 5;
4.1, calculating the antenna circular polarization axial ratio: obtaining far-field patterns Ex and Ey (Ex and Ey respectively represent the far-field patterns in the direction of X, Y) by spherical near-field measurement; calculating axial ratio data AR of the antenna to be measured according to the directional diagram;
ma＝abs(ER)
ca＝abs(EL)
AR＝-20*log10((abs(ma)+abs(ca))/(abs(abs(ma)-abs(ca))))
4.2, directivity factor: calculating directivity coefficient D of the antenna to be tested according to directional diagram data, wherein P (theta, phi) represents the far-field radiation power density of the antenna to be tested under the angle theta, phi, and P (theta, phi)maxRepresents the point of strongest radiation power density, P (theta, phi)avRepresenting the average radiant energy value.
And after the axial ratio and the directivity coefficient are obtained through calculation, whether the antenna to be detected meets the standard or not is judged according to a qualified standard criterion. For example, the axial ratio data AR is qualified as 2 or less within the angle range of [ -10 degrees, 10 degrees ], if the calculated AR value is 2 or less within the range, the data is qualified, otherwise the data is unqualified, and the system automatically executes the next step.
4.3, beam width: the angular span required for reducing the power of the point with the strongest radiation energy to a certain level (for example, 3dB, 6dB and 10dB) on the tangent plane of the far-field directional diagram is a general technical parameter and can be easily obtained from the far-field directional diagram. As in fig. 6, the left drop is about-3.8 to 3dB, the right drop is about 3.8 to 3dB, and the 3dB beamwidth is about 7.6.
4.4, beam pointing: the angle value of the point with the strongest radiation energy is also a general technical parameter which can be easily obtained from a far-field directional diagram.
5. Performing antenna aperture inversion
And calculating the electric field distribution condition on the antenna aperture from the antenna far-field directional diagram, and performing aperture inversion calculation and a calculation method.
(1) Formula for calculating spectral coefficient from antenna far field directional diagram
A＝F/cosθ/k*1i
Wherein, F represents the far field directional diagram of the antenna to be measured, and A represents the spectral coefficient of the radiation field of the antenna to be measured respectively.
(2) The antenna aperture field distribution is calculated according to the spectral coefficient as follows:
wherein k ismRepresenting the maximum value of the spectrum, obtaining the distribution condition of the aperture field of the antenna to be measured after integrating the spectrum coefficient, x and y representing the position of the electric field distribution,i.e. the coordinate values are calculated.
6. Calculating channel compensation values
After the E (x, y) distribution is calculated, the electric field distribution E in the ideal case is set according to the systemc(x, y) to obtain channel compensation values, respectively amplitude compensation values Dx,yPhase compensation value Px,y。
The calculation formula of the amplitude compensation value is as follows:
Dx,y＝20*log10(Ec(x,y)/E(x,y))
the calculation formula of the phase compensation value is as follows:
Px,y＝angle(Ec(x,y))-angle(E(x,y))
here, angle () represents the phase of the calculation result.
7. Universal test stand compensation
The amplitude compensation value D is obtained through calculationx,yPhase compensation value Px,yAnd then, sending the information to a general test board, sending the compensation value to the antenna to be tested by the general test board according to the corresponding relation between the position and the port, and then carrying out amplitude and phase compensation. After the compensation process is completed, the antenna to be measured is measured again, and then the next cycle is started.
In the design of the existing test system, manufacturers only consider the functional design of the near-field test system, and add some antenna automatic test functions in the test system, which can only give the antenna test result. The automatic correction test method of the invention comprises the following steps: the antenna near field test system, the general test board and the automatic control extension set are combined together, the automatic control extension set serves as a core, and the antenna near field test system is controlled to complete testing and the general test board is controlled to complete correction respectively. Therefore, the automatic correction test system not only completes the performance test of the antenna to be tested, but also completes the correction of partial channel parameters and completes a test closed loop, and ensures that each set of antenna after test is a qualified product meeting the performance index requirements.
Fig. 5(a) shows the flow of the test system of the present invention, fig. 5(b) shows the test flow of the existing test system, the whole test flow of the present invention is automatically completed under the control of a computer, a user only needs to set some qualified judgment standards before the test starts, and then waits for the system to automatically complete the correction and test process, and the test, index study and judgment, correction and parameter adjustment are automatically completed without manual intervention flow, so that the automation level of the antenna test is greatly improved, the test and correction flow which can be realized only by manual intervention in the past is replaced, and the present invention has high use value; for the requirement of mass antenna test, the invention can quickly establish an antenna test production line, and can automatically complete the processes of antenna erection, antenna test, antenna correction and antenna withdrawal by combining the operation of the mechanical arm. Finally, the yield problem encountered by the existing antenna batch production test can be completely solved. Compared with the existing near-field antenna measurement technology, the method has two outstanding advantages: the test and correction process is automatic and suitable for batch test.
The above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. An auto-calibration spherical near-field antenna test system, comprising: the system comprises a spherical near-field antenna test rack (10), a universal test bench (11), an automatic control extension (12), a vector network analyzer (13) and a router (14); the spherical near-field antenna test jig (10) comprises: the device comprises an azimuth turntable (101), a pitching swing arm (102), a sampling probe (103), a pitching turntable (104) and an antenna array plane (105); the antenna array surface (105) is arranged on an azimuth turntable (101), the pitching swing arm (102) is arranged on a pitching turntable (104), and the sampling probe (103) is arranged at one end of the pitching swing arm (102); a pitching rotary table (104) is arranged in the polarization direction of the sampling probe (103); the first channel of the general test bench (11) is connected with the antenna array surface (105), the second channel of the general test bench (11) is connected with the first channel of the automatic control extension (12), the third channel of the general test bench (11) is connected with the router (14), the third channel of the general test bench (11) is connected with the pitching rotary table (104), the second channel of the automatic control extension (12) is connected with the vector network analyzer (13), the communication end of the automatic control extension (12) is connected with the router (14), the first channel of the vector network analyzer (13) is connected with the antenna array surface (105), the second channel of the vector network analyzer (13) is connected with the pitching swing arm (102), the communication end of the vector network analyzer (13) is connected with the router (14), and the timing control end of the vector network analyzer (13) is connected with the pitching rotary table (104).
2. The system for testing the auto-calibration spherical near-field antenna according to claim 1, wherein the universal test station (11), the auto-control extension (12) and the vector network analyzer (13) are respectively connected with the router (14) through network links, so as to form a local area network, and the auto-control extension (12) in the local area network sends control commands to the universal test station (11) and the vector network analyzer (13) and simultaneously receives feedback information of the universal test station (11) and the vector network analyzer (13); the automatic control extension (12) is connected with the general test bench (11) and the vector network analyzer (13) by a data link, the automatic control extension (12) issues correction data to the general test bench (11), and meanwhile, the automatic control extension (12) reads test data sent by the vector network analyzer (13); the pitching rotary table (104), the general test table (11), the vector network analyzer (13) and the antenna array surface (105) are connected by a time sequence link, and the time sequence link is used for transmitting synchronous working time sequence signals of the pitching rotary table and the general test table; the vector network analyzer (13), the sampling probe (103) and the antenna array surface (105) are connected through a radio frequency link, and the radio frequency link is used for transmitting microwave radio frequency signals.
3. The auto-calibrating spherical near-field antenna test system according to claim 2, wherein the data link uses a serial port or RS484 or GPIB interface.
4. A testing method applied to the auto-calibration spherical near-field antenna testing system of any one of claims 1 to 3, characterized by comprising the following steps:
s1, setting system test parameters, including: testing frequency, testing wave position, size of the antenna to be tested and distribution position of the antenna channel to be tested;
s2, setting a far-field parameter qualification standard in the system, wherein the far-field parameters comprise: the antenna circular polarization axial ratio and the directivity coefficient;
s3, performing near field test and calculating far field parameters to obtain an antenna far field directional diagram;
s4, calculating the antenna circular polarization axial ratio and the directivity coefficient according to the antenna far-field directional diagram, comparing the calculation result with the parameter qualified standard, judging whether the calculation result passes or not, if so, ending the antenna test, and if not, performing the step S5;
s5, calculating antenna aperture field distribution from an antenna far-field directional pattern, and performing antenna aperture inversion;
s6, calculating the channel compensation value according to the electric field distribution under the ideal condition set by the system after the antenna aperture field distribution is obtained by calculation,
and S7, sending the channel compensation value to a general test board, sending the compensation value to the antenna to be measured by the general test board according to the corresponding relation between the position and the port for compensation, measuring the antenna to be measured again after the compensation process is completed, and entering the next cycle.
5. The test method according to claim 4, wherein the method for calculating the antenna circular polarization axial ratio according to the antenna far field pattern comprises the following steps:
ma＝abs(ER)
ca＝abs(EL)
AR＝-20*log10((abs(ma)+abs(ca))/(abs(abs(ma)-abs(ca))))
wherein Ex and Ey respectively represent far-field directional patterns in the direction of X, Y, AR represents the circular polarization axial ratio of the antenna to be measured, and ELIs a left-handed wave component, E, in an electromagnetic waveRRefers to the right-handed component, m, of the electromagnetic waveaIs the amplitude value of the right-handed wave component, caIs the amplitude value of the left-handed wave component.
6. The test method according to claim 5, wherein the directivity factor is calculated as follows:
wherein D represents the directivity coefficient, P (theta, phi) represents the far-field radiation power density of the antenna to be measured under the angle of theta and phi, and P (theta, phi)maxRepresents the point of strongest radiation power density, P (theta, phi)avRepresenting the average radiant energy value, d Ω refers to integrating the radiant power density over a solid angle.
7. The test method of claim 6, wherein the antenna aperture field distribution is calculated by the following method:
1) calculating spectral coefficients from the antenna far field pattern:
A＝F/cosθ/k*1i
f represents a far-field directional diagram of the antenna to be detected, A represents a spectral coefficient of a radiation field of the antenna to be detected respectively, and k represents an electromagnetic wave number;
2) calculating aperture field distribution from spectral coefficients
Wherein k ismRepresenting the maximum value of the spectrum, integrating the spectrum coefficient to obtain the distribution condition of the aperture field of the antenna to be measured, and x and y represent the position of the electric field distribution, namely, calculating coordinate values;
refers to the electromagnetic wave spectrum function.
8. The test method of claim 7, wherein the channel compensation value comprises: an amplitude compensation value and a phase compensation value.
9. The test method of claim 8, wherein the amplitude compensation value is calculated as follows:
Dx,y＝20*log10(Ec(x,y)/E(x,y))
wherein D isx,yRepresenting the amplitude compensation value.
10. The test method of claim 8, wherein the phase compensation value is calculated as follows:
Px,y＝angle(Ec(x,y))-angle(E(x,y))
wherein, Px,yRepresents a phase compensation value, and angle () represents the phase of the calculation result.
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