CN114280382B - Automatic spherical near field antenna correction test system and test method thereof - Google Patents

Automatic spherical near field antenna correction test system and test method thereof Download PDF

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CN114280382B
CN114280382B CN202111617200.8A CN202111617200A CN114280382B CN 114280382 B CN114280382 B CN 114280382B CN 202111617200 A CN202111617200 A CN 202111617200A CN 114280382 B CN114280382 B CN 114280382B
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antenna
test
field
channel
network analyzer
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CN114280382A (en
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张重阳
孔凡泉
黄文涛
盛永鑫
明章健
张再庆
陈旭
刘浩
魏寅生
燕军
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CETC 38 Research Institute
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Abstract

An automatic correction spherical near field antenna test system and a test method thereof belong to the technical field of antenna test and solve the problems of low test efficiency, consumption of a large amount of human resources and incapability of realizing mass product test existing in the existing antenna test system and test method; according to the technical scheme, an antenna near-field test system, a universal test board and an automatic control extension are combined, the automatic control extension serves as a control center, and the near-field test system is controlled to complete testing and the universal test board is controlled to complete correction respectively; the automatic correction testing system completes the performance test of the antenna to be tested and simultaneously completes the correction of partial channel parameters, so that each set of tested antenna is ensured to be a qualified product meeting the performance index requirement; only the qualification judgment standard is required to be set, the system automatically completes the correction and test process, a manual intervention process is not required, the automation level of antenna test is greatly improved, and the test requirement of a large number of antennas is met.

Description

Automatic spherical near field antenna correction test system and test method thereof
Technical Field
The invention belongs to the technical field of antenna testing, and relates to an automatic correction spherical near-field antenna testing system and an automatic correction spherical near-field antenna testing method.
Background
The spherical near field test system is a system for measuring the radiation performance of an antenna, and is generally composed of a near field test sampling frame and a radio frequency instrument subsystem, as disclosed in 2016 (Liu Yong, university of electronic science and technology) in the literature of research on analysis and diagnosis methods of spherical near field measurement errors. The spherical near field test system can be divided into a single probe test system and a multi-probe test system, wherein the single probe test system is used for completing the sampling work of the whole spherical space by a single microwave probe; the multi-probe test system is characterized in that the sampling work of the whole spherical space is completed by a plurality of microwave probes and a matrix switch. Compared with other near field test systems, the spherical near field can measure the antenna performance in the 4 pi solid angle space, and the test range is wider; meanwhile, the structure is completely symmetrical, so that the probe compensation work is easy to realize, and a broadband probe can be adopted; the spherical near field test system can be matched with a plurality of sampling probes and electronic switches to switch, so that the test speed can be improved by one order of magnitude.
An active antenna test board is a type of hardware equipment, for example, chinese patent application publication No. CN110146861A, application publication No. 2019, U.S. 08 and U.S. 20, discloses an active phased array system test method and test board, and can realize functions of controlling parameters of an active phased array antenna channel, exciting time sequence, receiving and synchronizing transmitting signals and the like. Because the hardware and communication control protocols of the microwave assembly are different, the antenna test bench is divided into a special test bench and a general test bench. The special test bench is used for a single-model product, and has the advantages of simple development process, high test efficiency and no need of secondary development; the universal test bench can serve radar products of various models, and has the advantages of multiple service items, strong compatibility and high equipment utilization rate.
In the existing spherical near-field antenna testing technology, an antenna near-field testing system completes the antenna radiation performance test and generates antenna far-field pattern data; the test board is responsible for the parameter control and time sequence generation of the active system, and the parameter configuration of the active system to be tested is changed according to the upper computer instruction. The test bench system can only execute test tasks according to instructions of a test engineer or upper computer software, and cannot autonomously judge the test index compliance and adjust channel parameters. The test engineer needs to judge whether the antenna performance test result meets the requirement or not, then adjusts the relevant parameters of the active channel through the upper computer software, and then repeats the process until the test result meets the requirement. Therefore, the existing active antenna testing technology under the spherical near field condition has the following defects: A. the antenna test efficiency is low; B. the test consumes a great deal of manpower resources; C. and a large-scale product test cannot be realized.
Disclosure of Invention
The invention aims to design an automatic correction spherical near-field antenna test system and a test method thereof, which are used for solving the problems that the existing antenna test system and test method are low in test efficiency, consume a large amount of manpower resources and cannot realize mass product test.
The invention solves the technical problems through the following technical scheme:
an auto-calibration spherical near field antenna test system comprising: the system comprises a spherical near-field antenna test frame (10), a universal test bench (11), an automatic control extension (12), a vector network analyzer (13) and a router (14); the spherical near field antenna test stand (10) comprises: the device comprises an azimuth rotary table (101), a pitching swing arm (102), a sampling probe (103), a pitching rotary table (104) and an antenna array surface (105); the antenna array surface (105) is arranged on the azimuth turntable (101), the pitching swing arm (102) is arranged on the pitching turntable (104), and the sampling probe (103) is arranged at one end of the pitching swing arm (102); a pitching turntable (104) is arranged in the polarization direction of the sampling probe (103); the first channel of the universal test bench (11) is connected with the antenna array surface (105), the second channel of the universal test bench (11) is connected with the first channel of the automatic control extension (12), the third channel of the universal test bench (11) is connected with the router (14), the third channel of the universal test bench (11) is connected with the pitching turntable (104), the second channel of the automatic control extension (12) is connected with the vector network analyzer (13), the communication end of the automatic control extension (12) is connected with the router (14), the first channel of the vector network analyzer (13) is connected with the antenna array surface (105), the second channel of the vector network analyzer (13) is connected with the pitching swing arm (102), the communication end of the vector network analyzer (13) is connected with the router (14), and the time sequence control end of the vector network analyzer (13) is connected with the pitching turntable (104).
According to the technical scheme, an antenna near-field test system, a universal test board and an automatic control extension are combined, the automatic control extension serves as a control center, and the near-field test system is controlled to complete testing and the universal test board is controlled to complete correction respectively; the automatic correction test system not only completes the performance test of the antenna to be tested, but also completes the correction of partial channel parameters and completes a test closed loop, so that each set of tested antenna is ensured to be a qualified product meeting the performance index requirement; the user only needs to set up qualified judgment standard before the test starts, then waits for the system to automatically complete the correction and test process, does not need manual intervention flow, and automatically completes the test, index research and judgment, correction and parameter adjustment, thereby greatly improving the automation level of antenna test and meeting the test requirements of a large number of antennas.
Further, the universal test bench (11), the automatic control extension (12) and the vector network analyzer (13) are respectively connected with the router (14) through network links so as to form a local area network, wherein the automatic control extension (12) sends control commands to the universal test bench (11) and the vector network analyzer (13) and receives feedback information of the universal test bench (11) and the vector network analyzer (13); the automatic control extension (12) is connected with the universal test bench (11) and the vector network analyzer (13) by adopting a data link, the automatic control extension (12) transmits correction data to the universal test bench (11), and meanwhile, the automatic control extension (12) reads test data transmitted by the vector network analyzer (13); the pitching turntable (104), the universal test bench (11), the vector network analyzer (13) and the antenna array surface (105) are connected by adopting a time sequence link, and the time sequence link is used for transmitting synchronous working time sequence signals of the pitching turntable, the universal test bench and the vector network analyzer; the vector network analyzer (13), the sampling probe (103) and the antenna array surface (105) are connected by a radio frequency link, and the radio frequency link is used for transmitting microwave radio frequency signals.
Further, the data link uses serial ports or RS484 or GPIB interfaces.
The test method applied to the test system for automatically correcting the spherical near-field antenna comprises the following steps:
s1, setting system test parameters, including: test frequency, test wave position, antenna size to be tested, and distribution position of antenna channel to be tested;
s2, setting a far-field parameter qualification standard in the system, wherein the far-field parameters comprise: circular polarization axis ratio and directivity coefficient of the antenna;
s3, performing near field test and calculating far field parameters to obtain an antenna far field pattern;
s4, calculating the circular polarization axis ratio and the directivity coefficient of the antenna according to the far-field pattern of the antenna, comparing the calculation result with the parameter qualification standard, judging whether the calculation result passes or not, ending the antenna test if the calculation result passes, and executing the step S5 if the calculation result does not pass;
s5, calculating antenna aperture field distribution from an antenna far-field pattern, and inverting the antenna aperture;
s6, after the antenna aperture field distribution is obtained through calculation, calculating a channel compensation value according to the electric field distribution under the ideal condition of system setting,
and S7, transmitting the channel compensation value to a universal test bench, transmitting the compensation value to the antenna to be tested by the universal test bench according to the corresponding relation between the position and the port for compensation, measuring the antenna to be tested again after the compensation process is completed, and entering the next cycle.
Further, the method for calculating the circular polarization axis ratio of the antenna according to the far-field pattern of the antenna is as follows:
Figure BDA0003436937470000031
Figure BDA0003436937470000032
m a =abs(E R )
c a =abs(E L )
AR=-20*log10((abs(ma)+abs(ca))/(abs(abs(ma)-abs(ca))))
wherein Ex and Ey respectively represent far-field patterns in X, Y direction, AR represents circular polarization axial ratio of antenna to be tested, E L Refers to the left-hand wave component, E, in electromagnetic waves R Refers to the right-handed wave component, m in electromagnetic wave a Is the amplitude value of the right-hand wave component, c a Is the magnitude of the left-hand wave component.
Further, the calculation formula of the directivity coefficient is as follows:
Figure BDA0003436937470000041
wherein D represents a directivity coefficient, P (theta, phi) represents the far-field radiation power density condition of the antenna to be tested under the angles theta, phi, and P (theta, phi) max Representing the point of highest radiation power density, P (θ, φ) av Representing the average radiant energy value dΩ means integrating the radiant power density over the solid angle.
Further, the method for calculating the antenna aperture field distribution comprises the following steps:
1) Calculating spectral coefficients from the antenna far field pattern:
A=F/cosθ/k*1i
wherein F represents a far-field pattern of an antenna to be detected, A represents a spectrum coefficient of a radiation field of the antenna to be detected, and k represents wave number of electromagnetic waves;
2) Calculating aperture field distribution according to the spectrum coefficient:
Figure BDA0003436937470000042
wherein k is m The maximum value of the spectrum is represented, the aperture field distribution condition of the antenna to be measured is obtained after the spectrum coefficient is integrated, and x and y represent the position of the electric field distribution, namely the calculated coordinate value;
Figure BDA0003436937470000043
refers to electromagnetic wave spectrum functions.
Further, the channel compensation value includes: amplitude compensation values and phase compensation values.
Further, the calculation formula of the amplitude compensation value is as follows:
D x,y =20*log10(E c (x,y)/E(x,y))
wherein D is x,y Representing the amplitude compensation value.
Further, the calculation formula of the phase compensation value is as follows:
P x,y =angle(E c (x,y))-angle(E(x,y))
wherein P is x,y Representing the phase compensation value, angle () represents the phase of the calculation result.
The invention has the advantages that:
according to the technical scheme, an antenna near-field test system, a universal test board and an automatic control extension are combined, the automatic control extension serves as a control center, and the near-field test system is controlled to complete testing and the universal test board is controlled to complete correction respectively; the automatic correction test system not only completes the performance test of the antenna to be tested, but also completes the correction of partial channel parameters and completes a test closed loop, so that each set of tested antenna is ensured to be a qualified product meeting the performance index requirement; the user only needs to set up qualified judgment standard before the test starts, then waits for the system to automatically complete the correction and test process, does not need manual intervention flow, and automatically completes the test, index research and judgment, correction and parameter adjustment, thereby greatly improving the automation level of antenna test and meeting the test requirements of a large number of antennas.
Drawings
FIG. 1 is a schematic diagram of a system for testing an auto-calibration spherical near field antenna according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a structure of a near field antenna test rack according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a generic test stand according to an embodiment of the present invention;
FIG. 4 is a schematic view of the structure of an automatic correction extension according to an embodiment of the present invention;
FIG. 5 (a) is a flow chart of a testing method according to an embodiment of the present invention, and FIG. 5 (b) is a flow chart of a conventional testing method;
fig. 6 is an antenna far field pattern of an embodiment of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions in the embodiments of the present invention will be clearly and completely described in the following in conjunction with the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The technical scheme of the invention is further described below with reference to the attached drawings and specific embodiments:
example 1
As shown in fig. 1 and 2, a test system for automatically correcting a spherical near field antenna includes: a spherical near field antenna test frame 10, a universal test bench 11, an automatic control extension 12, a vector network analyzer 13 and a router 14 which are arranged in a microwave darkroom; the spherical near field antenna test stand 10 includes: azimuth turntable 101, pitching swing arm 102, sampling probe 103, pitching turntable 104, antenna array surface 105; the first channel of the universal test bench 11 is connected with the antenna array surface 105, the second channel of the universal test bench 11 is connected with the first channel of the automatic control extension 12, the third channel of the universal test bench 11 is connected with the router 14, the third channel of the universal test bench 11 is connected with the pitching turntable 104, the second channel of the automatic control extension 12 is connected with the vector network analyzer 13, the communication end of the automatic control extension 12 is connected with the router 14, the first channel of the vector network analyzer 13 is connected with the antenna array surface 105, the second channel of the vector network analyzer 13 is connected with the pitching swing arm 102, the communication end of the vector network analyzer 13 is connected with the router 14, and the time sequence control end of the vector network analyzer 13 is connected with the pitching turntable 104.
As shown in fig. 2, the antenna array plane 105 is mounted on the azimuth rotary table 101, and rotates 360 degrees along with the azimuth rotary table 101, and the adjustment accuracy of the azimuth rotary table 101 is 0.01 degree; the pitching swing arm 102 is arranged on the pitching turntable 104, the sampling probe 103 is arranged at one end of the pitching swing arm 102, and the sampling probe is rotated and sampled by 120 degrees along with positive and negative degrees of the pitching swing arm 102, and the turntable precision is 0.01 degree; a pitching turntable 104 is arranged in the polarization direction of the sampling probe 103, and the polarization can rotate by plus or minus 90 degrees; the spherical near field antenna test frame 10 is used for completing an antenna parameter measurement task and obtaining main parameters such as gain, side lobe level, directivity coefficient, EIS, ERRP, beam width, beam direction and the like of an antenna to be tested.
Connection link description:
a. network link: the router 14 is respectively connected with the universal test bench 11, the automatic control extension 12 and the vector network analyzer 13, so as to form a local area network, and the automatic control extension 12 sends control commands to the universal test bench 11 and the vector network analyzer 13 in the local area network, and receives feedback information of the universal test bench 11 and the vector network analyzer 13.
b. Data link: the data link uses interfaces such as serial ports, RS484, GPIB, etc. for automatically controlling the slave unit 12 to issue correction data to the universal test board 11, and simultaneously automatically controlling the slave unit 12 to read test data sent by the vector network analyzer 13.
c. Timing chain: the timing chain connects the pitching turntable 104, the universal test bench 11, the vector network analyzer 13, the antenna array plane 105 for their operation timing synchronization.
d. Radio frequency link: the radio frequency link is connected with the vector network analyzer 13, the sampling probe 103 and the antenna array surface 105 and is used for transmitting microwave radio frequency signals.
As shown in fig. 3, the universal test bench 11 is used for completing the active channel parameter adjustment task, adjusting the channel delay time, the phase code value, the amplitude code value, and monitoring the working state of the antenna array plane 105 to optimize the overall radiation performance of the antenna to be tested. The universal test board 11 adopts a CPCI case structure, and a plurality of CPCI plug-ins are installed to realize the connection control function of the active channel of the antenna to be tested. The platform has 8 CPCI slots, wherein CPCI power supply and CPCI computer occupy two slots, and the other 6 slots are provided with multi-channel CPCI plug-in units. After the plug-in configuration is completed, the platform can support 96 TTL inputs, 96 TTL outputs, 384 RS422 outputs, 96 RS422 inputs, 72 optical fiber inputs and 72 optical fiber outputs.
As shown in fig. 4, the automatic control extension 12 is a core component of the automatic correction spherical near field measurement system, and its tasks include sample frame motion control, near field data acquisition, near field data analysis, near field-aperture field inversion calculation, and active channel parameter calculation. An industrial control computer is adopted on the hardware of the automatic control extension 12, and the software adopts a modularized design and comprises the following components: the system comprises a data acquisition module, a motion control module, a data processing module, a monitoring feedback module, a channel control module and a caliber inversion module. The design of the automatic correction extension 12 comprises the design of software and algorithms, wherein the algorithms comprise a spherical near field-far field conversion algorithm, a spherical near field-caliber field conversion algorithm and a phased array code value compensation calculation algorithm; the design of the software considers the data interaction between the automatic control extension and the near-field test system software and the time sequence and parameter interaction between the automatic control extension and the universal test bench, and meanwhile, the design of the software is provided with a GUI user interaction interface, so that a user can monitor the test process and check the test report of the final antenna product.
Fig. 5 (a) shows a test method of the automatic calibration spherical near field antenna test system according to the present embodiment, which includes the following steps:
1. setting system test parameters, including: test frequency, test wave position, antenna size to be tested, antenna channel distribution position to be tested and the like;
2. setting a far-field parameter qualification standard in the system, wherein the far-field parameters comprise: circular polarization axial ratio, directivity coefficient, beam width and beam direction of the antenna;
3. performing near field test and calculating far field parameters to obtain an antenna far field pattern;
4. calculating the circular polarization axial ratio, the directivity coefficient, the beam width and the beam direction of the antenna according to the far-field pattern of the antenna, comparing the calculation result with the parameter qualification standard, judging whether the calculation result passes or not, ending the antenna test if the calculation result passes, and executing the step 5 if the calculation result does not pass;
4.1, calculating the circular polarization axial ratio of the antenna: obtaining far field patterns Ex and Ey (Ex and Ey respectively represent far field patterns in the X, Y direction) by spherical near field measurement; calculating the antenna axial ratio data AR to be measured according to the directional diagram;
Figure BDA0003436937470000071
Figure BDA0003436937470000072
m a =abs(E R )
c a =abs(E L )
AR=-20*log10((abs(ma)+abs(ca))/(abs(abs(ma)-abs(ca))))
4.2, directivity coefficient: calculating the directivity coefficient D, P (theta, phi) of the antenna to be measured according to the pattern data, wherein the directivity coefficient P (theta, phi) represents the far-field radiation power density condition of the antenna to be measured under the angles theta, phi max Representing the point of highest radiation power density, P (θ, φ) av Representing the average radiant energy value.
Figure BDA0003436937470000081
And after the shaft ratio is calculated, judging whether the antenna to be tested meets the standard according to the standard criterion after the directivity coefficient. For example, the shaft ratio data AR is 2 or less within the angle range of-10 degrees and 10 degrees, if the calculated AR value is 2 or less within the angle range, the result is that the result is qualified, otherwise, the result is that the result is unqualified, and the system automatically executes the next step.
4.3, beam width: the angle span required by the power of the strongest point of the radiation energy to be reduced to a certain level (such as 3dB, 6dB and 10 dB) on the section of the far-field pattern is a general technical parameter, and can be easily obtained from the far-field pattern. The left hand side drops to about-3.8 deg. in fig. 6 and the right hand side drops to about 3.8 deg. in 3dB, so the 3dB beamwidth is about 7.6 deg..
4.4, beam pointing: the angle value of the point with the strongest radiation energy is also a common technical parameter, and can be easily obtained from a far-field pattern.
5. Antenna aperture inversion is performed
The electric field distribution condition on the antenna port surface is calculated from the antenna far-field pattern, and the following is a caliber inversion calculation process and a caliber inversion calculation method.
(1) Formula for calculating spectral coefficients from antenna far field patterns
A=F/cosθ/k*1i
Wherein F represents a far-field pattern of the antenna to be measured, and A represents spectral coefficients of a radiation field of the antenna to be measured respectively.
(2) The antenna aperture field distribution is calculated according to the spectrum coefficient as follows:
Figure BDA0003436937470000082
wherein k is m And (3) representing the maximum value of the spectrum, integrating the spectrum coefficient to obtain the distribution condition of the aperture field of the antenna to be measured, wherein x and y represent the positions of the electric field distribution, namely calculating coordinate values.
6. Calculating channel compensation values
After the E (x, y) distribution is calculated, the electric field distribution E under ideal conditions is set according to the system c (x, y) to obtain channel compensation values, respectively amplitude compensation value D x,y Phase compensation value P x,y
The calculation formula of the amplitude compensation value is as follows:
D x,y =20*log10(E c (x,y)/E(x,y))
the calculation formula of the phase compensation value is as follows:
P x,y =angle(E c (x,y))-angle(E(x,y))
where angle () represents the phasing of the calculation result.
7. Universal test stand compensation
In the process of calculating the amplitude compensation value D x,y Phase compensation value P x,y And then, the information is sent to a universal test board, the universal test board sends the compensation value to the antenna to be tested according to the corresponding relation between the position and the port, and then amplitude and phase compensation is carried out. After the compensation process is completed, the antenna to be measured is measured again, and then the next cycle is started.
In the design of the existing test system, manufacturers only consider the functional design of the near-field test system, and some antenna automatic test functions are added in the test system, so that only antenna test results can be given. The automatic correction testing method of the invention is as follows: the antenna near field test system, the universal test bench and the automatic control extension are combined, the automatic control extension is used as a core, and the near field test system is controlled to complete testing and the universal test bench is controlled to complete correction respectively. Therefore, the automatic correction testing system not only completes the performance test of the antenna to be tested, but also completes the correction of partial channel parameters, completes one test closed loop, and ensures that each set of tested antenna is a qualified product meeting the performance index requirement.
FIG. 5 (a) shows the flow of the test system of the invention, FIG. 5 (b) shows the test flow of the existing test system, the whole test flow of the invention is automatically completed by computer control, a user only needs to set some qualification judging standards before the test starts, then waits for the system to automatically complete the correction and test process, and the test, index research, correction and parameter adjustment are automatically completed without manual intervention, thereby greatly improving the automation level of the antenna test, replacing the test and correction flow which can be realized by manual intervention in the past, and having high use value; for the requirement of mass antenna test, the invention can quickly establish an antenna test production line, work in combination with a mechanical arm, and automatically complete the processes of antenna erection, antenna test, antenna correction and antenna withdrawal. Finally, the problem of yield in the current antenna mass production test can be completely solved. Compared with the existing near field antenna measurement technology, the method has two outstanding advantages: the test correction flow is automatic and is suitable for batch production test.
The above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims (3)

1. A test method applied to an auto-calibration spherical near field antenna test system, the test system comprising: the system comprises a spherical near-field antenna test frame (10), a universal test bench (11), an automatic control extension (12), a vector network analyzer (13) and a router (14); the spherical near field antenna test stand (10) comprises: the device comprises an azimuth rotary table (101), a pitching swing arm (102), a sampling probe (103), a pitching rotary table (104) and an antenna array surface (105); the antenna array surface (105) is arranged on the azimuth turntable (101), the pitching swing arm (102) is arranged on the pitching turntable (104), and the sampling probe (103) is arranged at one end of the pitching swing arm (102); a pitching turntable (104) is arranged in the polarization direction of the sampling probe (103); the first channel of the universal test bench (11) is connected with the antenna array surface (105), the second channel of the universal test bench (11) is connected with the first channel of the automatic control extension (12), the third channel of the universal test bench (11) is connected with the router (14), the third channel of the universal test bench (11) is connected with the pitching turntable (104), the second channel of the automatic control extension (12) is connected with the vector network analyzer (13), the communication end of the automatic control extension (12) is connected with the router (14), the first channel of the vector network analyzer (13) is connected with the antenna array surface (105), the second channel of the vector network analyzer (13) is connected with the pitching swing arm (102), the communication end of the vector network analyzer (13) is connected with the router (14), and the time sequence control end of the vector network analyzer (13) is connected with the pitching turntable (104);
the testing method is characterized by comprising the following steps of:
s1, setting system test parameters, including: test frequency, test wave position, antenna size to be tested, and distribution position of antenna channel to be tested;
s2, setting a far-field parameter qualification standard in the system, wherein the far-field parameters comprise: circular polarization axis ratio and directivity coefficient of the antenna;
s3, performing near field test and calculating far field parameters to obtain an antenna far field pattern;
s4, calculating the circular polarization axis ratio and the directivity coefficient of the antenna according to the far-field pattern of the antenna, comparing the calculation result with the parameter qualification standard, judging whether the calculation result passes or not, ending the antenna test if the calculation result passes, and executing the step S5 if the calculation result does not pass;
the method for calculating the circular polarization axial ratio of the antenna according to the far-field pattern of the antenna comprises the following steps:
Figure FDA0004243369820000011
Figure FDA0004243369820000012
m a =abs(E R )
c a =abs(E L )
AR=-20*log10((abs(ma)+abs(ca))/(abs(abs(ma)-abs(ca))))
wherein Ex and Ey respectively represent far-field patterns in X, Y direction, AR represents circular polarization axial ratio of antenna to be tested, E L Refers to the left-hand wave component, E, in electromagnetic waves R Refers to the right-handed wave component, m in electromagnetic wave a Is the amplitude value of the right-hand wave component, c a Is the magnitude of the left-hand wave component;
the calculation formula of the directivity coefficient is as follows:
Figure FDA0004243369820000021
wherein D represents a directivity coefficient, P (theta, phi) represents the far-field radiation power density condition of the antenna to be tested under the angles theta, phi, and P (theta, phi) max Representing the point of highest radiation power density, P (θ, φ) av Representing the average radiant energy value dΩ means integrating the radiant power density over the solid angle;
s5, calculating antenna aperture field distribution from an antenna far-field pattern, and inverting the antenna aperture;
the common method for calculating the antenna aperture field distribution is as follows:
1) Calculating spectral coefficients from the antenna far field pattern:
A=F/cosθ/k*1i
wherein F represents a far-field pattern of an antenna to be detected, A represents a spectrum coefficient of a radiation field of the antenna to be detected, and k represents wave number of electromagnetic waves;
2) Calculating aperture field distribution from spectral coefficients
Figure FDA0004243369820000022
Wherein k is m The maximum value of the spectrum is represented, the aperture field distribution condition of the antenna to be measured is obtained after the spectrum coefficient is integrated, and x and y represent the position of the electric field distribution, namely the calculated coordinate value;
Figure FDA0004243369820000023
refers to electromagnetic wave spectrum functions;
s6, after the antenna aperture field distribution is obtained through calculation, calculating a channel compensation value according to the electric field distribution under the ideal condition of system setting, wherein the channel compensation value comprises the following components: amplitude compensation values and phase compensation values;
the calculation formula of the amplitude compensation value is as follows:
D x, =20*log10(E c (x,y)/E(x,y))
wherein D is x, Representing amplitude compensation value, electric field distribution E in ideal case c (x,y);
The calculation formula of the phase compensation value is as follows:
P x, =angle(E c (x,y))-angle(E(x,y))
wherein P is x, Representing the phase compensation value, angle () represents the phase of the calculation result;
and S7, transmitting the channel compensation value to a universal test bench, transmitting the compensation value to the antenna to be tested by the universal test bench according to the corresponding relation between the position and the port for compensation, measuring the antenna to be tested again after the compensation process is completed, and entering the next cycle.
2. The testing method according to claim 1, wherein the universal test bench (11), the automatic control extension (12) and the vector network analyzer (13) are respectively connected with the router (14) through network links, so as to form a local area network, and the automatic control extension (12) sends control commands to the universal test bench (11) and the vector network analyzer (13) in the local area network, and receives feedback information of the universal test bench (11) and the vector network analyzer (13); the automatic control extension (12) is connected with the universal test bench (11) and the vector network analyzer (13) by adopting a data link, the automatic control extension (12) transmits correction data to the universal test bench (11), and meanwhile, the automatic control extension (12) reads test data transmitted by the vector network analyzer (13); the pitching turntable (104), the universal test bench (11), the vector network analyzer (13) and the antenna array surface (105) are connected by adopting a time sequence link, and the time sequence link is used for transmitting synchronous working time sequence signals of the pitching turntable, the universal test bench and the vector network analyzer; the vector network analyzer (13), the sampling probe (103) and the antenna array surface (105) are connected by a radio frequency link, and the radio frequency link is used for transmitting microwave radio frequency signals.
3. The method of claim 2, wherein the data link uses a serial port or RS484 or GPIB interface.
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