CN110659171A - Test method, electronic device and computer readable storage medium - Google Patents
Test method, electronic device and computer readable storage medium Download PDFInfo
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- CN110659171A CN110659171A CN201910911918.4A CN201910911918A CN110659171A CN 110659171 A CN110659171 A CN 110659171A CN 201910911918 A CN201910911918 A CN 201910911918A CN 110659171 A CN110659171 A CN 110659171A
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Abstract
The application discloses a testing method, an electronic device and a computer readable storage medium, the method comprising: setting each target parameter of the device to be tested by utilizing the out-of-band control script; the device to be tested is a device using a PCIe interface, and the target parameters comprise parameters influencing signal integrity; starting an in-band voltage measurement script by using the out-of-band control script so as to carry out in-band voltage measurement on the device to be tested by using the in-band voltage measurement script; in the in-band pressure measurement process, the out-of-band control script is used for monitoring the occurrence frequency of repairable errors of the device to be tested, and the optimal values of all the target parameters are determined based on the occurrence frequency. Therefore, the testing method provided by the application determines the optimal parameters of the PCIe interface in an unattended mode, improves the testing efficiency and improves the communication stability of the PCIe interface.
Description
Technical Field
The present application relates to the field of computer technology, and more particularly, to a test method, an electronic device, and a computer-readable storage medium.
Background
PCIe (Chinese full name: high speed serial computer expansion bus standard, English full name: peripheral component interconnect express) interface has point-to-point transmission characteristics: high transmission rate, large bandwidth, easy expansion and the like. In the development for a long time in the past, a very complete ecosystem has been formed, a large number of peripheral devices adopt the interface, and the PCIe interface is the most important peripheral bus interface in the field of traditional servers at present.
In practical applications, it is necessary to test the stability of devices using PCIe interfaces. In the related art, a waveform diagram of a sending port and a receiving port of a device is generally measured by adopting a mode of internal pressure measurement, when the waveform diagram does not meet the standard requirement, a tester is required to adjust parameters of a PCIe interface in a mode of internal control, manual participation is required for each adjustment, the tester and the device have multiple interactions, and the testing efficiency is low. In addition, in practical inspection, it is found that a large number of repairable errors (hereinafter, referred to as correct Error, abbreviated as CE) still exist on a link due to the fact that the optimal parameters of the PCIe interface cannot be determined through manual adjustment, and the link stability is poor.
Therefore, how to improve the stability test efficiency of the PCIe interface and improve the stability of communication is a technical problem to be solved by those skilled in the art.
Disclosure of Invention
An object of the present application is to provide a testing method, an electronic device, and a computer-readable storage medium, which improve PCIe interface stability testing efficiency and improve communication stability.
To achieve the above object, the present application provides a testing method, comprising:
setting each target parameter of the device to be tested by utilizing the out-of-band control script; the device to be tested is a device using a PCIe interface, and the target parameters comprise parameters influencing signal integrity;
starting an in-band voltage measurement script by using the out-of-band control script so as to carry out in-band voltage measurement on the device to be tested by using the in-band voltage measurement script;
in the in-band pressure measurement process, the out-of-band control script is used for monitoring the occurrence frequency of repairable errors of the device to be tested, and the optimal values of all the target parameters are determined based on the occurrence frequency.
Wherein, the setting each target parameter of the device to be tested by using the out-of-band control script comprises:
determining a candidate value set corresponding to each target parameter, and determining all candidate value sets according to all the candidate value sets; wherein each of the set of candidate values corresponds one-to-one to each of the target parameters;
setting all the target parameters to each candidate value group in sequence;
correspondingly, the starting of the in-band voltage measurement script by using the out-of-band control script includes:
and when the setting is effective each time, starting the in-band voltage testing script by using the out-of-band control script.
When the setting is effective each time, starting an in-band voltage measurement script by using the out-of-band control script, wherein the starting of the in-band voltage measurement script comprises the following steps:
and restarting the device to be tested after all the target parameters are set each time, and starting an in-band voltage testing script by using the out-of-band control script after the restarting is successful.
Wherein, the starting of the in-band voltage measurement script by using the out-of-band control script comprises the following steps:
and determining the device type of the device to be detected, and starting an in-band voltage detection script corresponding to the device type.
Wherein, in the in-band pressure test process, the out-of-band control script is used for monitoring the occurrence frequency of repairable errors of the device to be tested, and the method comprises the following steps:
in the in-band pressure measurement process, the repairable error state register is read at preset time intervals so as to record the occurrence frequency of repairable errors.
Wherein, in the process of carrying out in-band pressure measurement, reading the repairable error state register at preset time intervals so as to record the occurrence frequency of repairable errors, and the method comprises the following steps:
in the in-band pressure measurement process, reading a repairable error state register at preset time intervals, if the CE state register is 1, adding one to the occurrence frequency of the repairable error, and resetting the CE state register.
Wherein the determining an optimal value for all of the objective parameters based on the number of occurrences comprises:
taking the ratio of the occurrence frequency of the repairable errors to the test time as the occurrence frequency of the repairable errors;
and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
Wherein the determining an optimal value for all of the objective parameters based on the number of occurrences comprises:
and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
Wherein, the setting each target parameter of the device to be tested by using the out-of-band control script comprises:
sending a first target command to a BIOS (basic input/output system) through a BMC (baseboard management controller), so as to set each target parameter of the device to be tested through the first target command; wherein the first target command is a command conforming to an ipmi protocol.
After each target parameter of the device to be tested is set by using the out-of-band control script, the method further comprises the following steps:
judging whether all the target parameters are successfully set or not by using the out-of-band control script;
and if so, executing the step of starting the in-band voltage measurement script by using the out-of-band control script.
Wherein, the judging whether all the target parameters are successfully set by using the out-of-band control script includes:
sending a second target command to the BIOS through the BMC so as to judge whether all the target parameters are successfully set; wherein the second target command is a command conforming to an ipmi protocol.
Wherein the target parameter comprises an equalization parameter and/or a differential output voltage.
The device to be tested comprises any one or a combination of any several of a GPU, an NVME hard disk and a network card.
To achieve the above object, the present application provides an electronic device comprising a memory and a processor, the memory having stored thereon a computer program operable on the processor, the computer program when executed by the processor implementing: setting each target parameter of the device to be tested by utilizing the out-of-band control script; starting an in-band voltage measurement script by using the out-of-band control script so as to carry out in-band voltage measurement on the device to be tested by using the in-band voltage measurement script; in the in-band pressure measurement process, monitoring the occurrence frequency of repairable errors of the device to be tested by using the out-of-band control script, and determining the optimal values of all the target parameters based on the occurrence frequency; the device to be tested is a device using a PCIe interface, and the target parameters comprise parameters influencing signal integrity.
Wherein the computer program when executed by the processor further implements: determining a candidate value set corresponding to each target parameter, and determining all candidate value sets according to all the candidate value sets; setting all the target parameters to each candidate value group in sequence; when the setting is effective each time, starting an in-band voltage measurement script by using the out-of-band control script; wherein each of the set of candidate values corresponds one-to-one to each of the target parameters.
Wherein the computer program when executed by the processor further implements: and determining the device type of the device to be detected, and starting an in-band voltage detection script corresponding to the device type.
Wherein the computer program when executed by the processor further implements: in the in-band pressure measurement process, the repairable error state register is read at preset time intervals so as to record the occurrence frequency of repairable errors.
Wherein the computer program when executed by the processor further implements: taking the ratio of the occurrence frequency of the repairable errors to the test time as the occurrence frequency of the repairable errors; and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
Wherein the computer program when executed by the processor further implements: and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
To achieve the above object, the present application provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the test method as described above.
According to the scheme, the test method provided by the application comprises the following steps: setting each target parameter of the device to be tested by utilizing the out-of-band control script; the device to be tested is a device using a PCIe interface, and the target parameters comprise parameters influencing signal integrity; starting an in-band voltage measurement script by using the out-of-band control script so as to carry out in-band voltage measurement on the device to be tested by using the in-band voltage measurement script; in the in-band pressure measurement process, the out-of-band control script is used for monitoring the occurrence frequency of repairable errors of the device to be tested, and the optimal values of all the target parameters are determined based on the occurrence frequency.
According to the testing method, the out-of-band control script is used for adjusting the target parameters of the to-be-tested device, the out-of-band control script is used for starting the in-band voltage testing script so as to test the to-be-tested device, and the tester can automatically complete the in-band voltage testing of each group of values only by writing each value of the target parameters to be tested into the out-of-band control script, so that the testing efficiency is high. Meanwhile, the optimal parameters of the PCIe interface are determined from the perspective of function test based on the occurrence frequency of repairable errors in each group of value compression, the accuracy is high, and the communication stability of the PCIe interface is improved. Therefore, the testing method provided by the application realizes the unattended determination of the optimal parameters of the PCIe interface by combining the out-of-band control and the in-band voltage testing, improves the testing efficiency and improves the communication stability of the PCIe interface. The application also discloses an electronic device and a computer readable storage medium, which can also achieve the technical effects.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts. The accompanying drawings, which are included to provide a further understanding of the disclosure and are incorporated in and constitute a part of this specification, illustrate embodiments of the disclosure and together with the description serve to explain the disclosure without limiting the disclosure. In the drawings:
FIG. 1 is a flow chart illustrating a testing method according to an exemplary embodiment;
FIG. 2 is a flow diagram illustrating another testing method in accordance with an exemplary embodiment;
FIG. 3 is a flow chart illustrating yet another testing method according to an exemplary embodiment;
FIG. 4 is a block diagram of a test apparatus according to an exemplary embodiment;
FIG. 5 is a block diagram illustrating an electronic device in accordance with an exemplary embodiment.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The embodiment of the application discloses a testing method, which improves the stability testing efficiency of a PCIe interface and improves the stability of communication.
Referring to fig. 1, a flow diagram of a testing method, as shown in fig. 1, is shown in accordance with an exemplary embodiment, including:
s101: setting each target parameter of the device to be tested by utilizing the out-of-band control script; the device to be tested is a device using a PCIe interface, and the target parameters comprise parameters influencing signal integrity;
the execution main body of the embodiment may be a testing device, and the testing device is connected to the device to be tested and is used for performing a stability test on the device to be tested. It should be noted that the dut herein is a device that includes a PCIe interface and supports parameter modification, such as a GPU (Graphics processing unit), an NVME (Non-volatile memory host controller interface specification), a network card, and the like.
In this step, the tester writes the parameters to be tested into the out-of-band control script and stores the parameters in the test equipment. The test equipment can modify the parameter value of the target parameter in an out-of-band control mode.
S102: starting an in-band voltage measurement script by using the out-of-band control script so as to carry out in-band voltage measurement on the device to be tested by using the in-band voltage measurement script;
in this step, after the parameter value of the target parameter is modified each time, the pressure measurement script in the device to be tested is started to perform pressure measurement on the device to be tested, that is, the in-band pressure measurement script is used to perform in-band pressure measurement on the device to be tested. The PCIe communication protocol itself has an error correction function, wherein the error correction function biased to the hardware layer includes CRC (cyclic redundancy Check code, full name of chinese) added in a transport layer (transport layer) and a physical layer (physical layer), respectively, and an ack/nak mechanism (a mechanism implemented by hardware and fully automatic to ensure effective and reliable transmission of TLP) in a Data Link Layer (DLL), and these errors mean that the link is not stable enough, CE occurs, and an out-of-band control script can record them.
It is understood that the in-band voltage test script in this step is related to the type of the device to be tested, that is, the step of starting the in-band voltage test script by using the out-of-band control script includes: and determining the device type of the device to be detected, and starting an in-band voltage detection script corresponding to the device type. In a specific implementation, the in-band voltage testing script differs according to different types of the devices to be tested, for example, if the device to be tested is an NVME hard disk, the device to be tested may be tested by fio, and if the device to be tested is a GPU, the in-band voltage testing script may be a dedicated program in NV.
It should be noted that, the number and the type of the target parameters are not limited in this embodiment, and the parameters are all within the protection scope of this embodiment as long as the parameters can affect the integrity of the signal and further affect the stability of the PCIe interface communication. For example, the target parameters may include an equalization parameter (EQ), a differential output Voltage (VOD), and the like. If the out-of-band control script defines that the value of EQ can be 1, 2 and 3, the value of VOD can be 3,4 and 5, two target parameters, and each target parameter has three value conditions, so that the band-in-band voltage measurement needs to be carried out for 9 times.
It can be understood that, as to the manner of setting the target parameter, this embodiment is not particularly limited, and preferably, the step of the testing device sending an ipmi (Intelligent Platform Management Interface, full chinese name: Intelligent Platform Management Interface) command to the BIOS through the BMC in the device to be tested to set the target parameter, that is, the step of setting each target parameter of the device to be tested by using the out-of-band control script includes: sending a first target command to a BIOS (basic input/output system) through a BMC (baseboard management controller), so as to set each target parameter of the device to be tested through the first target command; wherein the first target command is a command conforming to an ipmi protocol.
Preferably, after each target parameter of the device under test is set by using the out-of-band control script, the method further includes: judging whether all the target parameters are successfully set or not by using the out-of-band control script; and if so, executing the step of starting the in-band voltage measurement script by using the out-of-band control script. In specific implementation, in order to improve the testing efficiency and avoid repeated testing of the same parameter value, whether the target parameter is successfully modified or not is detected after the parameter value of the target parameter is modified each time, in-band pressure testing is performed if the target parameter is successfully modified, and the step of setting the target parameter of the device to be tested by using the out-of-band control script can be repeated if the target parameter is not successfully modified until the target parameter is successfully set or the preset number of times is reached for abnormal alarm. It is understood that, here, it is also possible to determine whether the setting is successful by sending an ipmi command to the BIOS, that is, the step of determining whether all of the target parameters are successfully set by using the out-of-band control script includes: sending a second target command to the BIOS through the BMC so as to judge whether all the target parameters are successfully set; wherein the second target command is a command conforming to an ipmi protocol.
S103: in the in-band pressure measurement process, the out-of-band control script is used for monitoring the occurrence frequency of repairable errors of the device to be tested, and the optimal values of all the target parameters are determined based on the occurrence frequency.
In the process of each in-band pressure test, the out-of-band control script monitors the occurrence frequency of the repairable errors of the test, and determines the optimal value of the target parameter from the perspective of the function test based on the occurrence frequency. When the test time is constant, the target value with the lowest occurrence frequency of the repairable errors is determined as the optimal value, and when the test time is different, the target value with the lowest occurrence frequency of the repairable errors is determined as the optimal value. That is, as a possible implementation, the step of determining the optimal values of all the objective parameters based on the number of occurrences includes: taking the ratio of the occurrence frequency of the repairable errors to the test time as the occurrence frequency of the repairable errors; and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters. As another possible implementation, the step of determining the optimal values of all the target parameters based on the occurrence number comprises: and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
In a specific implementation, the step of determining the number of occurrences of repairable errors through a repairable error status register (CE register) of a device under test, that is, during in-band voltage testing, monitoring the number of occurrences of repairable errors of the device under test by using the out-of-band control script includes: in the in-band pressure measurement process, the repairable error state register is read at preset time intervals so as to record the occurrence frequency of repairable errors. Specifically, in the in-band pressure measurement process, the repairable error status register is read at preset time intervals, and if the CE status register is 1, the number of times of occurrence of the repairable error is increased by one, and the CE status register is cleared. It can be understood that if CE occurs, the CE status register in the device to be detected is 1, so in this step, the out-of-band control script reads the CE status register at preset time intervals, and if it is 1, the CE error is recorded once. In a specific implementation, an lspci command (a command of a Linux system) is used to read the value of the CE status register, and if the value is 1, the CE status register is written and cleared, and a polling mechanism is adopted for the entire monitoring, for example, the value of the CE status register may be read every 5s, where the preset time interval is not specifically limited.
According to the testing method provided by the embodiment of the application, the out-of-band control script is used for adjusting the target parameters of the to-be-tested device, the out-of-band control script is used for starting the in-band voltage testing script so as to test the to-be-tested device, a tester only needs to write each value of the target parameters to be tested into the out-of-band control script, the in-band voltage testing of each group of values can be automatically completed, and the testing efficiency is high. Meanwhile, the optimal parameters of the PCIe interface are determined from the perspective of function test based on the occurrence frequency of repairable errors in each group of value compression, the accuracy is high, and the communication stability of the PCIe interface is improved. Therefore, the testing method provided by the application realizes the unattended determination of the optimal parameters of the PCIe interface by combining the out-of-band control and the in-band voltage testing, improves the testing efficiency and improves the communication stability of the PCIe interface.
The embodiment of the application discloses a test method, and compared with the previous embodiment, the embodiment further explains and optimizes the technical scheme. Specifically, the method comprises the following steps:
referring to fig. 2, a flow diagram of another testing method according to an exemplary embodiment is shown, as shown in fig. 2, including:
s201: determining a candidate value set corresponding to each target parameter, and determining all candidate value sets according to all the candidate value sets; wherein each of the set of candidate values corresponds one-to-one to each of the target parameters;
in this embodiment, in the out-of-band control script, the parameter values to be tested are set by setting a candidate value set for the target parameters, each target parameter corresponds to one candidate value set, and the candidate value set may include all the selectable values of the target parameter provided by the manufacturer. For example, EQ corresponds to a set of candidate values {1, 2, 3} and VOD corresponds to a set of candidate values {3, 4, 5 }.
And randomly combining the candidate values in the candidate value set of all the target parameters to obtain a candidate value group, wherein the number of values in the candidate value group is the same as that of the target parameters, and each value is a candidate value of one target parameter. In the above example, there are two target parameters, so each candidate set contains two values, the first value being chosen from the candidate set corresponding to EQ and the second value being chosen from the candidate set corresponding to VOD, all of the candidate sets being (1,3), (1,4), (1,5), (2,3), (2,4), (2,5), (3,3), (3,4) and (3, 5).
S202: setting all the target parameters to each candidate value group in sequence;
s203: when the setting is effective each time, starting an in-band voltage testing script by using the out-of-band control script so as to carry out in-band voltage testing on the device to be tested by using the in-band voltage testing script;
in specific implementation, the out-of-band control script sets the target parameter as each candidate value set, and after each setting is generated, the in-band pressure measurement script performs in-band pressure measurement on the device to be tested. It should be noted that, because the types of the devices to be tested are different, the target parameters are different in the effective mode, some devices to be tested are effective immediately after the parameters are modified, and some devices to be tested need to be restarted to be effective, at this time, step S203 includes restarting the devices to be tested after all the target parameters are set each time, and starting the in-band voltage testing script by using the out-of-band control script after the restart is successful.
S204: in the in-band pressure measurement process, the out-of-band control script is used for monitoring the occurrence frequency of repairable errors of the device to be tested, and the optimal values of all the target parameters are determined based on the occurrence frequency.
Therefore, in the embodiment, all the selectable values of the target parameter are automatically traversed in an out-of-band control and in-band test mode to determine the most stable target parameter of the link, so that the stability and reliability of the PCIe communication link are improved.
The embodiment of the application discloses a test method, and compared with the previous embodiment, the embodiment further explains and optimizes the technical scheme. Specifically, the method comprises the following steps:
referring to fig. 3, a flow chart of yet another testing method is shown according to an exemplary embodiment, as shown in fig. 3, including:
s301: determining a candidate value set corresponding to each target parameter, and determining all candidate value sets according to all the candidate value sets; wherein each of the set of candidate values corresponds one-to-one to each of the target parameters;
s302: sending a first target command to the BIOS through the BMC so as to set all the target parameters to each candidate value group in sequence through the first target command;
s303: sending a second target command to the BIOS through the BMC so as to judge whether the target parameter is set successfully; if yes, entering S304;
s304: restarting the device to be tested, and determining the device type of the device to be tested after the restart is successful;
s305: starting the corresponding in-band voltage testing script by using the out-of-band control script so as to carry out in-band voltage testing on the device to be tested by using the in-band voltage testing script;
s306: in the in-band pressure measurement process, reading a repairable error state register at preset time intervals, if the CE state register is 1, adding one to the occurrence frequency of the repairable error, and resetting the CE state register;
s307: when the test time is reached, taking the ratio of the occurrence frequency of the repairable errors to the test time as the occurrence frequency of the repairable errors;
s308: and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
Therefore, the target parameters are adjusted by sending the command to the BIOS and whether the adjustment is successful is judged, and the efficiency is high. And automatically traversing all selectable values of the target parameter by using a mode of combining out-band control and in-band test to determine the most stable target parameter of the link, thereby improving the stability and reliability of the PCIe communication link.
In the following, a test apparatus provided by an embodiment of the present application is described, and a test apparatus described below and a test method described above may be referred to each other.
Referring to fig. 4, a block diagram of a test apparatus according to an exemplary embodiment is shown, as shown in fig. 4, including:
a setting module 401, configured to set each target parameter of the device to be tested by using the out-of-band control script; the device to be tested is a device using a PCIe interface, and the target parameters comprise parameters influencing signal integrity;
a starting module 402, configured to start an in-band voltage measurement script by using the out-of-band control script, so as to perform in-band voltage measurement on the device to be tested by using the in-band voltage measurement script;
a determining module 403, configured to monitor, by using the out-of-band control script, occurrence times of repairable errors of the device to be tested during in-band voltage testing, and determine optimal values of all the target parameters based on the occurrence times.
The test device provided by the embodiment of the application utilizes the out-of-band control script to adjust the target parameters of the device to be tested, and utilizes the out-of-band control script to start the in-band voltage test script so as to test the device to be tested, and a tester only needs to write each value of the target parameters to be tested into the out-of-band control script, so that the in-band voltage test of each group of values can be automatically completed, and the test efficiency is higher. Meanwhile, the optimal parameters of the PCIe interface are determined from the perspective of function test based on the occurrence frequency of repairable errors in each group of value compression, the accuracy is high, and the communication stability of the PCIe interface is improved. Therefore, the testing method provided by the application realizes the unattended determination of the optimal parameters of the PCIe interface by combining the out-of-band control and the in-band voltage testing, improves the testing efficiency and improves the communication stability of the PCIe interface.
On the basis of the above embodiment, as a preferred implementation, the setting module 401 includes:
the first determining unit is used for determining a candidate value set corresponding to each target parameter and determining all candidate value sets according to all the candidate value sets; wherein each of the set of candidate values corresponds one-to-one to each of the target parameters;
a setting unit configured to set all the target parameters to each of the candidate value groups in turn;
correspondingly, the starting module 402 is specifically a module that starts an in-band voltage measurement script by using the out-of-band control script when the setting is in effect, so as to perform an in-band voltage measurement on the device to be tested by using the in-band voltage measurement script.
On the basis of the foregoing embodiment, as a preferred implementation manner, the starting module 402 is specifically a module that restarts the device to be tested after all the target parameters are set each time, and starts an in-band voltage test script by using the out-of-band control script after the restart is successful, so as to perform an in-band voltage test on the device to be tested by using the in-band voltage test script.
On the basis of the above embodiment, as a preferred implementation, the starting module 402 includes:
the second determining unit is used for determining the device type of the device to be detected;
and the starting unit is used for starting the in-band voltage testing script corresponding to the device type by using the out-of-band control script so as to carry out in-band voltage testing on the device to be tested by using the in-band voltage testing script.
On the basis of the foregoing embodiment, as a preferred implementation, the determining module 403 includes:
the monitoring unit is used for reading the repairable error state register at intervals of preset time in the in-band pressure measurement process so as to record the occurrence frequency of repairable errors;
a third determining unit for determining the optimal values of all the target parameters based on the occurrence number.
On the basis of the above embodiment, as a preferred implementation manner, the monitoring unit is specifically a unit that reads a repairable error status register at preset time intervals during in-band pressure measurement, and if the CE status register is 1, adds one to the number of occurrences of the repairable error and clears the CE status register.
On the basis of the above embodiment, as a preferred implementation, the third determining unit includes:
the calculating subunit is used for taking the ratio of the occurrence frequency of the repairable errors to the test time as the occurrence frequency of the repairable errors;
and the determining subunit is used for determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
On the basis of the foregoing embodiment, as a preferred implementation manner, the third determining unit is specifically a unit that determines a candidate value group corresponding to a minimum number of times among all the occurrence numbers as an optimal value of all the target parameters.
On the basis of the foregoing embodiment, as a preferred implementation manner, the setting module 401 is specifically a module that sends a first target command to the BIOS through the BMC, so as to set each target parameter of the dut through the first target command; wherein the first target command is a command conforming to an ipmi protocol.
On the basis of the above embodiment, as a preferred implementation, the method further includes:
the judging module is used for judging whether all the target parameters are successfully set by using the out-of-band control script; if yes, the workflow of the start module 402 is started.
On the basis of the foregoing embodiment, as a preferred implementation manner, the determining module is specifically a module that sends a second target command to the BIOS through the BMC, so as to determine whether all the target parameters are successfully set; wherein the second target command is a command conforming to an ipmi protocol.
On the basis of the above-mentioned embodiments, as a preferred implementation, the target parameter includes an equalization parameter and/or a differential output voltage.
On the basis of the above embodiments, as a preferred implementation manner, the device under test includes any one or a combination of any several items of a GPU, an NVME hard disk, and a network card.
With regard to the apparatus in the above-described embodiment, the specific manner in which each module performs the operation has been described in detail in the embodiment related to the method, and will not be elaborated here.
The present application further provides an electronic device, and referring to fig. 5, a structure diagram of an electronic device 500 provided in an embodiment of the present application may include a processor 11 and a memory 12, as shown in fig. 5. The electronic device 500 may also include one or more of a multimedia component 13, an input/output (I/O) interface 14, and a communication component 15.
The memory 12 has stored thereon a computer program executable on the processor, which when executed by the processor implements: setting each target parameter of the device to be tested by utilizing the out-of-band control script; starting an in-band voltage measurement script by using the out-of-band control script so as to carry out in-band voltage measurement on the device to be tested by using the in-band voltage measurement script; in the in-band pressure measurement process, monitoring the occurrence frequency of repairable errors of the device to be tested by using the out-of-band control script, and determining the optimal values of all the target parameters based on the occurrence frequency; the device to be tested is a device using a PCIe interface, and the target parameters comprise parameters influencing signal integrity.
Preferably, the computer program when executed by the processor further implements: determining a candidate value set corresponding to each target parameter, and determining all candidate value sets according to all the candidate value sets; setting all the target parameters to each candidate value group in sequence; when the setting is effective each time, starting an in-band voltage measurement script by using the out-of-band control script; wherein each of the set of candidate values corresponds one-to-one to each of the target parameters.
Preferably, the computer program when executed by the processor further implements: and restarting the device to be tested after all the target parameters are set each time, and starting an in-band voltage testing script by using the out-of-band control script after the restarting is successful.
Preferably, the computer program when executed by the processor further implements: and determining the device type of the device to be tested, and carrying out in-band pressure test on the device to be tested by using an in-band pressure test script corresponding to the device type.
Preferably, the computer program when executed by the processor further implements: in the in-band pressure measurement process, the repairable error state register is read at preset time intervals so as to record the occurrence frequency of repairable errors.
Preferably, the computer program when executed by the processor further implements: in the in-band pressure measurement process, reading a repairable error state register at preset time intervals, if the CE state register is 1, adding one to the occurrence frequency of the repairable error, and resetting the CE state register.
Preferably, the computer program when executed by the processor further implements: taking the ratio of the occurrence frequency of the repairable errors to the test time as the occurrence frequency of the repairable errors; and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
Preferably, the computer program when executed by the processor further implements: and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
Preferably, the computer program when executed by the processor further implements: sending a first target command to a BIOS (basic input/output system) through a BMC (baseboard management controller), so as to set each target parameter of the device to be tested through the first target command; wherein the first target command is a command conforming to an ipmi protocol.
Preferably, the computer program when executed by the processor further implements: and judging whether all the target parameters are successfully set or not by using the out-of-band control script.
Preferably, the computer program when executed by the processor further implements: sending a second target command to the BIOS through the BMC so as to judge whether all the target parameters are successfully set; wherein the second target command is a command conforming to an ipmi protocol.
The processor 11 is configured to control the overall operation of the electronic device 500, so as to complete all or part of the steps in the above-mentioned testing method. The memory 12 is used to store various types of data to support operation at the electronic device 500, such as instructions for any application or method operating on the electronic device 500, and application-related data, such as contact data, messaging, pictures, audio, video, and so forth. The Memory 12 may be implemented by any type of volatile or non-volatile Memory device or combination thereof, such as Static Random Access Memory (SRAM), electrically Erasable Programmable Read-Only Memory (EEPROM), Erasable Programmable Read-Only Memory (EPROM), Programmable Read-Only Memory (PROM), Read-Only Memory (ROM), magnetic Memory, flash Memory, magnetic disk or optical disk. The multimedia component 13 may include a screen and an audio component. Wherein the screen may be, for example, a touch screen and the audio component is used for outputting and/or inputting audio signals. For example, the audio component may include a microphone for receiving external audio signals. The received audio signal may further be stored in the memory 12 or transmitted via the communication component 15. The audio assembly also includes at least one speaker for outputting audio signals. The I/O interface 14 provides an interface between the processor 11 and other interface modules, such as a keyboard, mouse, buttons, etc. These buttons may be virtual buttons or physical buttons. The communication component 15 is used for wired or wireless communication between the electronic device 500 and other devices. Wireless communication, such as Wi-Fi, bluetooth, Near Field Communication (NFC), 2G, 3G or 4G, or a combination of one or more of them, so that the corresponding communication component 15 may include: Wi-Fi module, bluetooth module, NFC module.
In an exemplary embodiment, the electronic Device 500 may be implemented by one or more Application Specific Integrated Circuits (ASICs), Digital Signal Processors (DSPs), Digital Signal Processing Devices (DSPDs), Programmable Logic Devices (PLDs), Field Programmable Gate Arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components for performing the above-described test methods.
In another exemplary embodiment, a computer readable storage medium comprising program instructions which, when executed by a processor, implement the steps of the above-described testing method is also provided. For example, the computer readable storage medium may be the memory 12 described above comprising program instructions executable by the processor 11 of the electronic device 500 to perform the test method described above.
The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description. It should be noted that, for those skilled in the art, it is possible to make several improvements and modifications to the present application without departing from the principle of the present application, and such improvements and modifications also fall within the scope of the claims of the present application.
It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Claims (20)
1. A method of testing, comprising:
setting each target parameter of the device to be tested by utilizing the out-of-band control script; the device to be tested is a device using a PCIe interface, and the target parameters comprise parameters influencing signal integrity;
starting an in-band voltage measurement script by using the out-of-band control script so as to carry out in-band voltage measurement on the device to be tested by using the in-band voltage measurement script;
in the in-band pressure measurement process, the out-of-band control script is used for monitoring the occurrence frequency of repairable errors of the device to be tested, and the optimal values of all the target parameters are determined based on the occurrence frequency.
2. The method of claim 1, wherein setting each target parameter of the devices under test using an out-of-band control script comprises:
determining a candidate value set corresponding to each target parameter, and determining all candidate value sets according to all the candidate value sets; wherein each of the set of candidate values corresponds one-to-one to each of the target parameters;
setting all the target parameters to each candidate value group in sequence;
correspondingly, the starting of the in-band voltage measurement script by using the out-of-band control script includes:
and when the setting is effective each time, starting the in-band voltage testing script by using the out-of-band control script.
3. The method of claim 2, wherein initiating an in-band voltage test script with the out-of-band control script each time a setting is in effect comprises:
and restarting the device to be tested after all the target parameters are set each time, and starting an in-band voltage testing script by using the out-of-band control script after the restarting is successful.
4. The method of claim 1, wherein initiating an in-band voltage test script using the out-of-band control script comprises:
and determining the device type of the device to be detected, and starting an in-band voltage detection script corresponding to the device type.
5. The method of claim 1, wherein monitoring the number of repairable errors of the device under test using the out-of-band control script during in-band testing comprises:
in the in-band pressure measurement process, the repairable error state register is read at preset time intervals so as to record the occurrence frequency of repairable errors.
6. The method as claimed in claim 5, wherein the reading the repairable error status register at preset time intervals in the in-band test to record the occurrence number of repairable errors comprises:
in the in-band pressure measurement process, reading a repairable error state register at preset time intervals, if the CE state register is 1, adding one to the occurrence frequency of the repairable error, and resetting the CE state register.
7. The method of claim 1, wherein said determining an optimal value for all of said target parameters based on said number of occurrences comprises:
taking the ratio of the occurrence frequency of the repairable errors to the test time as the occurrence frequency of the repairable errors;
and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
8. The method of claim 1, wherein said determining an optimal value for all of said target parameters based on said number of occurrences comprises:
and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
9. The method of claim 1, wherein setting each target parameter of the devices under test using an out-of-band control script comprises:
sending a first target command to a BIOS (basic input/output system) through a BMC (baseboard management controller), so as to set each target parameter of the device to be tested through the first target command; wherein the first target command is a command conforming to an ipmi protocol.
10. The testing method of claim 1, wherein after setting each target parameter of the devices under test using the out-of-band control script, further comprising:
judging whether all the target parameters are successfully set or not by using the out-of-band control script;
and if so, executing the step of starting the in-band voltage measurement script by using the out-of-band control script.
11. The method according to claim 10, wherein the determining whether all of the target parameters are successfully set by using the out-of-band control script comprises:
sending a second target command to the BIOS through the BMC so as to judge whether all the target parameters are successfully set; wherein the second target command is a command conforming to an ipmi protocol.
12. The test method according to claim 1, wherein the target parameters comprise equalization parameters and/or differential output voltages.
13. The testing method of claim 1, wherein the device under test comprises any one or a combination of any of a GPU, an NVME hard disk, and a network card.
14. An electronic device comprising a memory and a processor, the memory having stored thereon a computer program operable on the processor, the computer program when executed by the processor, to implement: setting each target parameter of the device to be tested by utilizing the out-of-band control script; starting an in-band voltage measurement script by using the out-of-band control script so as to carry out in-band voltage measurement on the device to be tested by using the in-band voltage measurement script; in the in-band pressure measurement process, monitoring the occurrence frequency of repairable errors of the device to be tested by using the out-of-band control script, and determining the optimal values of all the target parameters based on the occurrence frequency; the device to be tested is a device using a PCIe interface, and the target parameters comprise parameters influencing signal integrity.
15. The electronic device of claim 14, wherein the computer program when executed by the processor further implements: determining a candidate value set corresponding to each target parameter, and determining all candidate value sets according to all the candidate value sets; setting all the target parameters to each candidate value group in sequence; when the setting is effective each time, starting an in-band voltage measurement script by using the out-of-band control script; wherein each of the set of candidate values corresponds one-to-one to each of the target parameters.
16. The electronic device of claim 14, wherein the computer program when executed by the processor further implements: and determining the device type of the device to be detected, and starting an in-band voltage detection script corresponding to the device type.
17. The electronic device of claim 14, wherein the computer program when executed by the processor further implements: in the in-band pressure measurement process, the repairable error state register is read at preset time intervals so as to record the occurrence frequency of repairable errors.
18. The electronic device of claim 14, wherein the computer program when executed by the processor further implements: taking the ratio of the occurrence frequency of the repairable errors to the test time as the occurrence frequency of the repairable errors; and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
19. The electronic device of claim 14, wherein the computer program when executed by the processor further implements: and determining the candidate value group corresponding to the minimum frequency in all the occurrence frequencies as the optimal value of all the target parameters.
20. A computer-readable storage medium, characterized in that a computer program is stored on the computer-readable storage medium, which computer program, when being executed by a processor, carries out the steps of the test method according to one of claims 1 to 13.
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| CN201910911918.4A CN110659171A (en) | 2019-09-25 | 2019-09-25 | Test method, electronic device and computer readable storage medium |
| PCT/CN2019/108458 WO2021056393A1 (en) | 2019-09-25 | 2019-09-27 | Test method, electronic device and computer-readable storage medium |
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