CN113611352A - Solid state disk testing method, device and system and readable storage medium - Google Patents
Solid state disk testing method, device and system and readable storage medium Download PDFInfo
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- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
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Abstract
The application discloses a solid state disk testing method, a solid state disk testing device, a solid state disk testing system and a readable storage medium. The solid state disk test system comprises a main controller (MCU1), a BIOS modification module (BIOS TOOL), a first connection module and a second connection module, wherein a first interface of the first connection module is used for being connected with a solid state disk, a first interface of the second connection module is used for being connected with a solid state disk interface of PC equipment, and the BIOS modification module comprises a slave controller (MCU2) and a restarting unit. The main controller can acquire the preset state of the target parameter; and sending the preset state to the slave controller and controlling the slave controller so as to modify the current state into the preset state and control the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter. According to the method and the device, a professional tester is not needed to modify the target parameters, and the modification speed of the target parameters is improved.
Description
Technical Field
The invention relates to the technical field of solid state disk testing, in particular to a solid state disk testing method, a solid state disk testing device, a solid state disk testing system and a readable storage medium.
Background
The SATA (serial Advanced Technology attachment) interface is a Disk access interface that is standard in the industry, and is also recently applied to Solid State Disk SSD (Solid State Disk or Solid State Drive).
In practical application, some parameters of the SATA interface are configured by a BIOS (basic Input Output system) and stored in the BIOS, the main parameter is a SATA Hot Plug enable parameter (SATA Hot Plug), and the SATA Hot Plug enable parameter determines whether the system enables a Hot Plug function of the SATA, and different requirements are made on whether different operating systems are enabled.
During the process of checking, producing and testing the solid state disk, the operation of modifying the SATA interface parameters in the BIOS is a time-consuming process, and particularly, the operation is not conducive to automation in the process of mass production testing, which results in low efficiency of modifying the SATA interface parameters.
Disclosure of Invention
In view of the foregoing problems, the present application provides a method, an apparatus, a system and a readable storage medium for testing a solid state disk.
The embodiment of the application provides a solid state disk testing method, which is applied to a solid state disk testing system comprising a main controller, a BIOS modification module, a first connection module and a second connection module, wherein a first interface of the first connection module is used for connecting a solid state disk, a first interface of the second connection module is used for connecting a solid state disk interface of PC equipment, and the BIOS modification module comprises a slave controller and a restarting unit; the method comprises the following steps:
the main controller obtains a preset state of a target parameter;
and sending the preset state to the slave controller and controlling the slave controller so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter.
According to the solid state disk testing method, the PC equipment is connected with the main controller; the acquiring of the preset state of the target parameter includes:
and acquiring a preset state of the target parameter sent by the PC equipment, wherein the preset state of the target parameter sent by the PC equipment is sent by a user by using a test program.
In the solid state disk testing method according to the embodiment of the application, the solid state disk testing system further comprises a key modification module, the key modification module comprises a parameter modification key, and the key modification module is connected with the main controller; the acquiring of the preset state of the target parameter includes:
and when the state of the parameter modification key is changed, acquiring a preset state of a target parameter corresponding to the current key state of the parameter modification key.
In the solid state disk testing method according to the embodiment of the application, the solid state disk testing system further includes a power supply control module, the power supply control module includes a current inflow interface, a current outflow interface and a controlled interface, the current inflow interface is connected with a power supply, the current outflow interface is connected with the second interface of the first connection module, and the controlled interface is connected with the main controller; the method further comprises the following steps:
when a test instruction is received, determining whether the test instruction comprises a first instruction for disconnecting the first connection module from the power supply;
if the first instruction is included, the first connection module is disconnected with the power supply by controlling the power supply control module;
if the first instruction is not included, determining whether a second instruction for communicating the first connection module with the power supply is included in the test instruction;
and if the second instruction is included, the first connection module is communicated with the power supply by controlling the power supply control module.
In the solid state disk testing method according to the embodiment of the application, the solid state disk testing system further comprises a disk position detecting module, and the disk position detecting module is connected with the main controller; the method further comprises the following steps:
if the second instruction is not included, determining whether a third instruction for acquiring the disk position information is included in the test instruction;
and if the third instruction is included, receiving the disk position information detected by the disk position detection module, and determining whether the first connection module is connected to the solid state disk according to the disk position information.
In the solid state disk testing method according to the embodiment of the application, the solid state disk testing system further comprises an on-off control module, a first interface of the on-off control module is connected with a third interface of the first connection module, a second interface of the on-off control module is connected with a second interface of the second connection module, and the third interface of the on-off control module is connected with the main controller; the method further comprises the following steps:
if the third instruction is not included, determining whether a fourth instruction for disconnecting the first connection module and the second connection module is included in the test instruction;
if the fourth instruction is included, the first connection module and the second connection module are disconnected by controlling the on-off control module;
and if the fourth instruction is not included, the first connecting module is communicated with the second connecting module by controlling the on-off control module.
In the method for testing a solid state disk according to the embodiment of the present application, the target parameter includes one of a SATA interface hot plug enable parameter, a mSATA interface hot plug enable parameter, and a NGFF interface hot plug enable parameter.
The embodiment of the application further provides a solid state disk testing device, which is applied to a solid state disk testing system comprising a main controller, a BIOS modification module, a first connection module and a second connection module, wherein the first connection module is used for connecting a solid state disk, and the second connection module is used for connecting a solid state disk interface of PC equipment; the BIOS modification module comprises a slave controller and a restart unit, and the device comprises:
the acquisition unit is used for acquiring the preset state of the target parameter;
and the modification unit is used for sending the preset state to the slave controller and controlling the slave controller so as to modify the current state into the preset state and control the restart unit to restart the PC equipment when the preset state is different from the current state of the target parameter.
The embodiment of the application further provides a solid state disk test system, which comprises a main controller, a BIOS modification module, a first connection module, a second connection module and a memory, wherein a first interface of the first connection module is used for connecting a solid state disk, and a first interface of the second connection module is used for connecting a solid state disk interface of PC equipment; the BIOS modification module comprises a slave controller and a restart unit, the memory stores a computer program, and the computer program executes the solid state disk test method of the embodiment when running on the master controller.
The embodiment of the present application further provides a readable storage medium, which stores a computer program, and when the computer program runs on a processor, the method for testing a solid state disk according to the embodiment of the present application is executed.
The solid state disk test system comprises a main controller (MCU1), a BIOS modification module (BIOS TOOL), a first connection module and a second connection module, wherein a first interface of the first connection module is used for connecting a solid state disk, a first interface of the second connection module is used for connecting a solid state disk interface of PC equipment, and the BIOS modification module comprises a slave controller (MCU2) and a restart unit. The main controller can acquire a preset state of a target parameter; and sending the preset state to the slave controller and controlling the slave controller so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter. According to the solid state disk testing system, the solid state disk is tested by the solid state disk testing system, a professional tester does not need to determine a BIOS interface where the target parameter is located from a plurality of BIOS interfaces of the BIOS system and locate the target parameter on the BIOS interface to modify the target parameter, the complex modification process is simplified through the solid state disk testing system, the modification speed of the target parameter is increased, and the solid state disk testing efficiency is further improved.
Drawings
In order to more clearly illustrate the technical solution of the present invention, the drawings required to be used in the embodiments will be briefly described below, and it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope of the present invention. Like components are numbered similarly in the various figures.
Fig. 1 shows a schematic structural diagram of a solid state disk test system according to an embodiment of the present application;
FIG. 2 is a schematic structural diagram of a BIOS modification module according to an embodiment of the present disclosure;
fig. 3 shows a schematic flowchart of a method for testing a solid state disk according to an embodiment of the present application;
fig. 4 shows a schematic structural diagram of another solid state disk test system proposed in the embodiment of the present application;
FIG. 5 is a schematic diagram of a BIOS interface according to an embodiment of the present application;
fig. 6 is a schematic flowchart illustrating another solid state disk testing method according to an embodiment of the present application;
fig. 7 shows a schematic structural diagram of a solid state disk testing apparatus according to an embodiment of the present application.
Description of the main element symbols:
10-a solid state disk testing device; 11-an acquisition unit; 12-a modification unit.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present invention without making any creative effort, shall fall within the protection scope of the present invention.
Hereinafter, the terms "including", "having", and their derivatives, which may be used in various embodiments of the present invention, are only intended to indicate specific features, numbers, steps, operations, elements, components, or combinations of the foregoing, and should not be construed as first excluding the existence of, or adding to, one or more other features, numbers, steps, operations, elements, components, or combinations of the foregoing.
Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which various embodiments of the present invention belong. The terms (such as those defined in commonly used dictionaries) should be interpreted as having a meaning that is consistent with their contextual meaning in the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein in various embodiments of the present invention.
Referring to fig. 1, an embodiment of the present application provides a solid state disk test system including a master controller (MCU1), a BIOS modification module (BIOS TOOl), a first connection module and a second connection module, wherein a first interface of the first connection module is used for connecting a solid state disk, a first interface of the second connection module is used for connecting a solid state disk interface of a PC device, and the BIOS modification module includes a slave controller (MCU2) and a reboot unit.
Exemplarily, referring to fig. 2, the BIOS modification module (BIOS TOOl) includes a slave controller (MCU2) and a restart unit for controlling the PC device to restart, where the restart unit includes a power supply terminal VCC, a diode VD, a relay K, a transistor T, a first resistor R1, and a second resistor R2, and the relay K is connected in parallel with a restart Button of the PC device. The power supply terminal VCC is a BIOS TOOL power supply, wherein the relay K can be a passive relay, and the diode VD can play a role of follow current; the triode T is an NPN type bipolar triode and can be replaced by an NMosfet, the first resistor R1 plays a role in limiting current, and the second resistor R2 is used for preventing misoperation.
The slave controller (MCU2) of the BIOS modification module (BIOS TOOL) receives the Protocol through the serial port COM, and the slave controller (MCU2) analyzes the Protocol. VGA _ In of the slave controller (MCU2) is a VGA signal or HDMI signal input interface, and can also be converted to a communicable signal input by a video, such as I2C, SPI, UART, etc. The USB Device of the slave controller (MCU2) is a USB port operating in USB Device mode, and mainly functions as a Mouse and Keyboard Simulator (Mouse & Keyboard Simulator).
It should be noted that the flash memory of the BIOS modification module stores identification information of each BIOS interface in advance, and each BIOS interface has unique identification information, such as pictures, video frames, colors, and characters. When a certain parameter information of a certain interface is modified, the BIOS interface comprising the parameter information can be positioned from each BIOS interface through the picture or video frame or color or text corresponding to the parameter information, so that the parameter information is modified through the BIOS interface comprising the parameter information.
Example 1
An embodiment of the present application, please refer to fig. 3, which provides a method for testing a solid state disk, including the following steps S100 and S200:
s100: and acquiring the preset state of the target parameter.
The target parameter comprises one of SATA interface hot plug enabling parameter, mSATA interface hot plug enabling parameter and NGFF interface hot plug enabling parameter.
Exemplarily, referring to fig. 4, the solid state disk testing system further includes a key modification module, where the key modification module includes a parameter modification key (K1), and the key modification module is connected to a KI _ In pin of the main controller (MCU 1); the main controller (MCU1) can acquire the preset state of the target parameter corresponding to the current key state of the parameter modification key (K1) when the state of the parameter modification key (K1) is changed.
Exemplarily, a COM1 pin of the main controller (MCU1) is connected to the PC device, and the main controller (MCU1) may obtain the preset state of the target parameter sent by the user by using the test program through the COM1, that is, the PC device sends the preset state of the target parameter to the main controller (MCU1) through the COM 1.
S200: and sending the preset state to the slave controller and controlling the slave controller so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter.
It is understood that the COM pin of the master controller (MCU1) is connected to the COM pin of the slave controller (MCU2), and the master controller (MCU1) transmits the preset state to the slave controller through the COM pin. The slave controller (MCU2) will determine whether the preset state is the same as the current state, if the preset state is the same as the current state, the current state of the target parameter is maintained, if the preset state is not the same as the current state, a BIOS interface corresponding to the target parameter is determined (as shown in fig. 5), the current state is modified to the preset state at the BIOS interface corresponding to the target parameter, and the restart unit is controlled to restart the PC device. After the state of the target parameter is modified, the PC device needs to be restarted to enable the modified preset state to take effect.
It should be noted that the BIOS modification module (BIOS TOOl) may select an interface where the target parameter is located from the plurality of BIOS interfaces according to information acquired from the main controller (MCU1), and determine a location where the target parameter is located on the interface where the target parameter is located.
It is understood that steps S100 and S200 are performed by a main controller of the solid state disk test system.
It should be noted that, when the user modifies the target parameter into the preset state through the test program, the test program receives the instruction of the user to modify the target parameter into the preset state and then receives the current state of the target parameter through the BIOS specification interface, further, determines whether the preset state is the same as the current state, and when the preset state is not the same as the current state, sends a protocol including the preset state to the main controller (MCU1) through the COM1, and the main controller (MCU1) executes step S200 after receiving the protocol.
It should be noted that, because the program update frequency in the master controller is high, the program in the master controller needs to be updated according to the test requirement, and the program in the slave controller generally does not need to be updated. If the solid state disk test system only uses one controller and burns the programs in the master controller and the slave controller into one controller, the frequently updated programs affect the stability of the programs which do not need to be updated. Therefore, the main controller and the slave controller are utilized, the influence of the high-frequency updating program on the program which does not need to be updated is avoided, and the stability of the program which does not need to be updated is ensured.
The solid state disk test system of including main control unit (MCU1), BIOS modification module (BIOS TOOL), first connection module and second connection module that this application embodiment provided, the first interface of first connection module is used for connecting solid state disk, the first interface of second connection module is used for connecting the solid state disk interface of PC equipment, BIOS modification module includes from controller (MCU2) and restart the unit. The main controller can acquire a preset state of a target parameter; and sending the preset state to the slave controller and controlling the slave controller so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter. In the embodiment, the solid state disk test system is used for testing the solid state disk, so that a professional tester does not need to determine the BIOS interface where the target parameter is located from a plurality of BIOS interfaces of the BIOS system and locate the target parameter on the BIOS interface to modify the target parameter, the complex modification process is simplified through the solid state disk test system, the modification speed of the target parameter is increased, and the test efficiency of the solid state disk is further improved.
Further, referring to fig. 4, the solid state disk test system further includes a power control module, where the power control module includes a current inflow interface, a current outflow interface, and a controlled interface, the current inflow interface is connected to the power supply, the current outflow interface is connected to the second interface of the first connection module, and the controlled interface is connected to the main controller (MCU 1). The current inflow interface comprises six power supply ends (3 VCC power supply ends, 3.3v power supply ends, 5v power supply ends and 12v power supply ends), the current outflow interface comprises 3 output ends (3.3v output ends, 5v output ends and 12v output ends), the controlled interface comprises 3 controlled ends, and the controlled interface is respectively connected with a K3.3 pin, a K5 pin and a K12 pin of a main controller (MCU 1).
The solid state disk test system further comprises a disk position detection module, and the disk position detection module is connected with the main controller (MCU 1). The Touch Spot is a mechanical switch contact and is linked with the K0 switch action, when the solid state disk is inserted into the first interface of the first connection module, the K0 is closed, otherwise, the K0 is opened. The main controller (MCU1) can receive the closing and opening information of K0 through the K0_ In pin, and can detect the disc position according to the closing and opening information of K0.
The solid state disk test system further comprises an on-off control module, a first interface of the on-off control module is connected with a third interface of the first connection module, a second interface of the on-off control module is connected with a second interface of the second connection module, and the third interface of the on-off control module is connected with the main controller (MCU 1). The first interface of the on-off control module comprises four ports which are respectively connected with four ports of the third interface of the first connecting module, the second interface of the on-off control module comprises four ports which are respectively connected with four ports of the second interface of the second connecting module, and the third interface of the on-off control module is connected with an EN _ Out pin of a controller (MCU 1).
Referring to fig. 6, based on the solid state disk testing system disclosed in fig. 4, the solid state disk testing method provided in the embodiment of the present application further includes the following steps:
s10: when a test instruction is received, whether the test instruction comprises a first instruction for disconnecting the first connection module from the power supply is determined.
If the first instruction is included, go to step S20, otherwise go to step S30.
S20: the first connection module and the power supply are disconnected by controlling the power supply control module.
S30: determining whether a second instruction for communicating the first connection module with the power supply is included in the test instruction.
If the second instruction is included, step S40 is executed, and if the second instruction is not included, step S50 is executed.
S40: the first connection module is communicated with the power supply by controlling the power supply control module.
S50: and determining whether a third instruction for acquiring the disk position information is included in the test instruction.
If the third instruction is included, go to step S60, otherwise go to step S70.
S60: receiving the disk position information detected by the disk position detection module, and determining whether the first connection module is connected to the solid state disk according to the disk position information.
S70: determining whether a fourth instruction for disconnecting the first connection module and the second connection module is included in the test instruction.
If the fourth instruction is included, go to step S80, otherwise go to step S90.
S80: and the first connecting module and the second connecting module are disconnected by controlling the on-off control module.
S90: and the first connecting module is communicated with the second connecting module by controlling the on-off control module.
It can be understood that the power supply control module can be used for independently controlling the power supply of the solid state disk so as to test the on and off functions of the power supply of the solid state disk. The on-off control module can be used for controlling the on-off of the solid state disk and the PC equipment, so that the plugging state of the solid state disk can be conveniently simulated, the plugging times of the solid state disk are reduced when the on-off function of the solid state disk and the PC equipment is tested, and the damage of a solid state disk interface caused by excessive plugging times is avoided. The disk position detection module can be used for detecting the disk position information so as to quickly determine whether the solid state disk is inserted into the first interface of the first connection module or not through the detected disk position information.
Example 2
In another embodiment of the present application, please refer to fig. 7, which provides a solid state disk testing apparatus 10, applied to a solid state disk testing system including a main controller, a BIOS modification module, a first connection module and a second connection module, where the first connection module is used to connect a solid state disk, and the second connection module is used to connect a solid state disk interface of a PC device; the BIOS modification module comprises a slave controller and a restart unit. The solid state disk testing device 10 includes: an acquisition unit 11 and a modification unit 12.
An obtaining unit 11, configured to obtain a preset state of a target parameter; and the modification unit 12 is configured to send the preset state to the slave controller and control the slave controller, so that when the preset state is different from the current state of the target parameter, the slave controller modifies the current state into the preset state and controls the restart unit to restart the PC device.
The solid state disk testing apparatus 10 disclosed in this embodiment is used to execute the solid state disk testing method described in the above embodiment by matching the obtaining unit 11 and the modifying unit 12, and the implementation scheme and the beneficial effect related to the above embodiment are also applicable in this embodiment, and are not described again here.
It can be understood that the solid state disk test system disclosed in the present application further includes a memory, where the memory stores a computer program, and the computer program executes the solid state disk test method described in the present application embodiment when running on the main controller.
It is to be understood that the present application also discloses a readable storage medium, which stores a computer program, and the computer program executes the solid state disk testing method according to the embodiment of the present application when running on a processor.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus and method can be implemented in other ways. The apparatus embodiments described above are merely illustrative and, for example, the flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
In addition, each functional module or unit in each embodiment of the present invention may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.
The functions, if implemented in the form of software functional modules and sold or used as a stand-alone product, may be stored in a readable storage medium. Based on such understanding, the technical solution of the present invention or a part of the technical solution that contributes to the prior art in essence can be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a smart phone, a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned readable storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and all the changes or substitutions should be covered within the scope of the present invention.
Claims (10)
1. A solid state disk testing method is characterized by being applied to a solid state disk testing system comprising a main controller, a BIOS modification module, a first connection module and a second connection module, wherein a first interface of the first connection module is used for connecting a solid state disk, a first interface of the second connection module is used for connecting a solid state disk interface of PC equipment, and the BIOS modification module comprises a slave controller and a restarting unit; the method comprises the following steps:
the main controller obtains a preset state of a target parameter;
and sending the preset state to the slave controller and controlling the slave controller so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter.
2. The method for testing the solid state disk of claim 1, wherein the PC device is connected with the main controller; the acquiring of the preset state of the target parameter includes:
and acquiring a preset state of the target parameter sent by the PC equipment, wherein the preset state of the target parameter sent by the PC equipment is sent by a user by using a test program.
3. The method for testing the solid state disk according to claim 1, wherein the solid state disk testing system further comprises a key modification module, the key modification module comprises a parameter modification key, and the key modification module is connected with the main controller; the acquiring of the preset state of the target parameter includes:
and when the state of the parameter modification key is changed, acquiring a preset state of a target parameter corresponding to the current key state of the parameter modification key.
4. The method for testing the solid state disk according to claim 1, wherein the solid state disk testing system further comprises a power control module, the power control module comprises a current inflow interface, a current outflow interface and a controlled interface, the current inflow interface is connected with a power supply, the current outflow interface is connected with the second interface of the first connection module, and the controlled interface is connected with the main controller; the method further comprises the following steps:
when a test instruction is received, determining whether the test instruction comprises a first instruction for disconnecting the first connection module from the power supply;
if the first instruction is included, the first connection module is disconnected with the power supply by controlling the power supply control module;
if the first instruction is not included, determining whether a second instruction for communicating the first connection module with the power supply is included in the test instruction;
and if the second instruction is included, the first connection module is communicated with the power supply by controlling the power supply control module.
5. The method for testing the solid state disk according to claim 4, wherein the solid state disk testing system further comprises a disk position detecting module, and the disk position detecting module is connected with the main controller; the method further comprises the following steps:
if the second instruction is not included, determining whether a third instruction for acquiring the disk position information is included in the test instruction;
and if the third instruction is included, receiving the disk position information detected by the disk position detection module, and determining whether the first connection module is connected to the solid state disk according to the disk position information.
6. The method for testing the solid state disk according to claim 5, wherein the solid state disk testing system further comprises an on-off control module, a first interface of the on-off control module is connected with a third interface of the first connection module, a second interface of the on-off control module is connected with a second interface of the second connection module, and the third interface of the on-off control module is connected with the main controller; the method further comprises the following steps:
if the third instruction is not included, determining whether a fourth instruction for disconnecting the first connection module and the second connection module is included in the test instruction;
if the fourth instruction is included, the first connection module and the second connection module are disconnected by controlling the on-off control module;
and if the fourth instruction is not included, the first connecting module is communicated with the second connecting module by controlling the on-off control module.
7. The method for testing the solid state disk according to any one of claims 1 to 6, wherein the target parameter comprises one of a SATA interface hot plug enable parameter, a mSATA interface hot plug enable parameter, and a NGFF interface hot plug enable parameter.
8. A solid state disk testing device is characterized by being applied to a solid state disk testing system comprising a main controller, a BIOS modification module, a first connection module and a second connection module, wherein the first connection module is used for connecting a solid state disk, and the second connection module is used for connecting a solid state disk interface of PC equipment; the BIOS modification module comprises a slave controller and a restart unit, and the device comprises:
the acquisition unit is used for acquiring the preset state of the target parameter;
and the modification unit is used for sending the preset state to the slave controller and controlling the slave controller so as to modify the current state into the preset state and control the restart unit to restart the PC equipment when the preset state is different from the current state of the target parameter.
9. A solid state disk test system is characterized by comprising a main controller, a BIOS modification module, a first connection module, a second connection module and a memory, wherein a first interface of the first connection module is used for connecting a solid state disk, and a first interface of the second connection module is used for connecting a solid state disk interface of PC equipment; the BIOS modification module comprises a slave controller and a restart unit, the memory storing a computer program which, when run on the master controller, performs the solid state disk testing method of any one of claims 1 to 7.
10. A readable storage medium, characterized in that it stores a computer program which, when run on a processor, performs the method of testing a solid state disk of any of claims 1 to 7.
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