CN105487952A

CN105487952A - PCIE-SSD automatic testing method based on FIO

Info

Publication number: CN105487952A
Application number: CN201510928968.5A
Authority: CN
Inventors: 韩琳琳
Original assignee: Inspur Electronic Information Industry Co Ltd
Current assignee: Inspur Electronic Information Industry Co Ltd
Priority date: 2015-12-15
Filing date: 2015-12-15
Publication date: 2016-04-13

Abstract

The invention discloses a PCIE-SSD automatic test method based on FIO, belonging to the PCIE-SSD automatic test field, aiming at solving the problem of low quality and efficiency of PCIE-SSD performance and stability test, the adopted technical scheme comprises the following steps: (1) modifying the test script parameters according to the test requirements; (2) the script automatically selects a corresponding test module according to the parameters; (3) the test module automatically starts testing according to the parameters; (4) the test is completed and the result is output to the log. The module variables and parameters are initially defined before step (1).

Description

A kind of PCIE-SSD automated testing method based on FIO

Technical field

The present invention relates to PCIE-SSD automatic test field, specifically a kind of PCIE-SSD automated testing method based on FIO.

Background technology

Along with the high speed development of IT industry, the development of information-based, large data and cloud computing requires more and more higher to server performance.The carrier that PCIE-SSD stores as data, the entirety that performance index directly affect server presents.As domestically leading server hardware supplier, tide is also in the quality improved constantly PCIE-SSD performance test and efficiency.

Shell script is similar to the batch processing under Windows/Dos, namely puts in advance in a file with all kinds of order, facilitates a program file of disposable execution, mainly facilitates keeper to carry out arranging or manage.But it is more powerful than the batch processing under Windows, than higher by the program efficiency of other programs editor.

FIO is the benchmark instrument of a file system, can test the readwrite performance of various operating system file system.The PCIE-SSD performance test under different test block size, different mode can be carried out.But FIO only provides simple parameter, the use of single command has very large test to limit to, and is difficult to performance and the stability test of accomplishing PCIE-SSD to be carried out to comparatively system.

How can pass through the test script of shell language compilation robotization, and the adjustment manually carrying out test parameter makes the technical problem to be solved in the present invention.Greatly will improve quality and the efficiency of PCIE-SSD performance and stability test.

Summary of the invention

Technical assignment of the present invention is for above deficiency, provides a kind of PCIE-SSD automated testing method based on FIO, solves the quality of PCIE-SSD performance and stability test and inefficient problem.

Technical assignment of the present invention realizes in the following manner:

Based on a PCIE-SSD automated testing method of FIO, step is:

(1) according to testing requirement amendment test script parameter;

(2) script selects corresponding test module automatically according to parameter;

(3) test module starts test automatically according to parameter;

(4) complete test and result is outputted to daily record.

Before carrying out step (1), original definition is carried out to module variable and partial parameters.

A kind of PCIE-SSD automated testing method based on FIO of the present invention has the following advantages: be applicable to different PCIE-SSD model and configuration, only needs according to testing requirement amendment parameter.Solve the test limitation using FIO single command.Enrich means of testing, improve testing efficiency and test mass, better achieve PCIE-SSD automatic test.

Accompanying drawing explanation

Below in conjunction with accompanying drawing, the present invention is further described.

Accompanying drawing 1 is a kind of schematic flow sheet of the PCIE-SSD automated testing method based on FIO.

Embodiment

With reference to Figure of description and specific embodiment, a kind of PCIE-SSD automated testing method based on FIO of the present invention is described in detail below.

Embodiment:

A kind of PCIE-SSD automated testing method based on FIO of the present invention, step is:

(1) according to testing requirement amendment test script parameter;

(3) test module starts test automatically according to parameter;

(4) complete test and result is outputted to daily record.

Before carrying out step (1), carry out original definition to module variable and partial parameters, running IOengine as acquiescence is libaio pattern, and code is:

IS_FRAG=false

IS_STRESS=false

IS_BASE=false

IS_FILESYSTEM=false

IS_IOPS=false

IO_ENGINE=libaio

FILE_SIZE=100%

Usage illustrates, is described the available parameter of script, and perform iotest.sh – h meeting screen print, code is:

usage(){

echo"$0[-f][-s][-eio_engine][-h][-b][-ddev_name][-m][-ppartion][-wworkdir][-r][-iiops]"

echo"-ffragment"

echo"-sstresstest"

echo"-eioenginetype,defaulttypeislibaio"

echo"-brawdevicebasetest"

…

echo"example:"

echo"rawdevicefragment:nohup&>/dev/nullshiotest.sh-f-d/dev/sda&"

echo"rawdevicebasetest:nohup&>/dev/nullshiotest.sh-b-d/dev/sda&"

…

echo"Ifyouhaveanyquestion,contactwithme:miaoywinspur.com"

exit

Apply mechanically getopts mode, define script command line parameter, such as performing iotest.sh – b can automatically by " IS_BASE=true ", and code is:

whilegetopts"hsfbe:d:mp:w:ri:"arg

do

case$argin

h)

usage;;

s)

IS_STRESS=true;;

f)

IS_FRAG=true;;

b)

IS_BASE=true;;

…

w)

workdir=${OPTARG};;

r)

IS_IOPS=true;;

i)

define_iops=${OPTARG};;

esac

done

According to the judgement of if statement, call base_test test module, code is:

if${IS_FRAG};then

fragment

fi

if${IS_BASE};then

base_test

fi

…

if${IS_IOPS};then

fixed_iops_test

fi

Utilize for loop nesting, also Output rusults is to log shelves to adopt the tactful different pieces of information block size of different threads difference read-write to carry out test, and code is:

base_test(){

forRWinwriterandwritereadrandread

do

forBSin4k16k64k512k

do

forTHREADSin128163264256

do

if[$THREADS-le32];then

fio--readwrite=${RW}--bs=${BS}--numjobs=${THREADS}--runtime=300s${PARA_LINE}--filename=${DEV_LIST}--name=${RW}_${BS}_${THREADS}|tee-a${RW}.log

else

iodepth=$(($THREADS/32))

PARA_LINE2="--end_fsync=0--group_reporting--direct=1--ioengine=${IO_ENGINE}--iodepth=$iodepth--time_based--invalidate=1--norandommap--randrepeat=0--exitall--size=${FILE_SIZE}"

fio--readwrite=${RW}--bs=${BS}--numjobs=32--runtime=300s${PARA_LINE2}--filename=${DEV_LIST}--name=${RW}_${BS}_${THREADS}|tee-a${RW}.log

fi

done

sleep60s

done

Run bandwidth test according to parameters, code is:

fio--readwrite=read--bs=512k--direct=1--runtime=300s--end_fsync=0--ioengine=${IO_ENGINE}--time_based--invalidate=1--norandommap--randrepeat=0--group_reporting--numjobs=1--size=${FILE_SIZE}--filename=${DEV_LIST}--name=BW_read|tee-aBW_read.log

sleep60s

…

fio--readwrite=write--bs=512k--direct=1--runtime=300s--end_fsync=0--ioengine=${IO_ENGINE}--time_based--invalidate=1--norandommap--randrepeat=0--group_reporting--numjobs=1--size=${FILE_SIZE}--filename=${DEV_LIST}--name=BW_write|tee-aBW_write.log

sleep60s

Utilize the tactful operation stability test of different pieces of information block size, different threads and different read-write, code is:

#steady

iostat-xm1>4k_rw_iops&

fio--readwrite=randrw--rwmixread=70--bs=4k--runtime=3000s--numjobs=32${PARA_LINE}--filename=${DEV_LIST}--name=4k_rw_iops|tee-a4k_rw_iops.log

kill`pidofiostat`>/dev/null

sleep30s

…

iostat-xm1>16k_w_iops&

fio--readwrite=randwrite--bs=16k--runtime=3000s--numjobs=32${PARA_LINE}--filename=${DEV_LIST}--name=16k_w_iops|tee-a16k_w_iops.log

kill`pidofiostat`>/dev/null

By embodiment above, described those skilled in the art can be easy to realize the present invention.But should be appreciated that the present invention is not limited to above-mentioned embodiment.On the basis of disclosed embodiment, described those skilled in the art can the different technical characteristic of combination in any, thus realizes different technical schemes.Except the technical characteristic described in instructions, be the known technology of those skilled in the art.

Claims

1., based on a PCIE-SSD automated testing method of FIO, it is characterized in that step is:

(1) according to testing requirement amendment test script parameter;

(3) test module starts test automatically according to parameter;

(4) complete test and result is outputted to daily record.

2. a kind of PCIE-SSD automated testing method based on FIO according to claim 1, is characterized in that carrying out original definition to module variable and partial parameters before carrying out step (1).