CN109813734B - Sheet material electromagnetic parameter testing device and method - Google Patents
Sheet material electromagnetic parameter testing device and method Download PDFInfo
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Abstract
The invention provides a sheet material electromagnetic parameter testing device and a sheet material electromagnetic parameter testing method, and belongs to the technical field of microwave testing. The device comprises two coaxial adapters 1, two parallel conductor walls 2, two microstrip lines 3, a common ground connecting block 4, a sample to be tested 5, a conduction band connecting sheet 6, a flexible foam supporting block 7, a lower pressing block 8, a spring thimble 9, a lower pressing clamp 10, a vertical seat 11, two moving platforms 12, two grooves 17 and a base 13. The two sections of microstrip lines 3 are respectively connected with the two coaxial adapters 1 and are positioned on two equal-height moving platforms 12 in a collinear manner; the sample 5 to be tested is arranged above the common ground connecting block 4 and is located between the two microstrip lines 3 in a common straight line manner; the conduction band connecting sheet 6 is positioned right above the sample to be detected. The sheet material electromagnetic parameter testing device and the sheet material electromagnetic parameter testing method provided by the invention can realize quick picking and placing of a sample to be tested, can execute TRL calibration on two sides of the sample to be tested, reduce the error of a traditional transmission reflection method testing system and improve the testing accuracy.
Description
Technical Field
A sheet material electromagnetic parameter testing device and a method belong to the technical field of microwave material testing, and particularly relate to a sheet material electromagnetic parameter testing device and a method.
Background
Based on the superiority of sheet material structure size and microwave performance, it is widely used in military and civil fields. The relative complex dielectric constant and the relative complex permeability are two electromagnetic parameters for describing the microwave electromagnetic property of the sheet material and are also the main basis for evaluating the electromagnetic performance of the sheet material, so that the measurement of the electromagnetic parameters of the sheet material is particularly important.
At present, a great deal of research work has been carried out on the microwave performance measurement of electromagnetic parameters of sheet materials at home and abroad, and the commonly adopted test methods are a transmission reflection method and a resonance method. The resonance method is a point frequency test method, and cannot reflect the rule that the electromagnetic characteristic of the sheet material continuously changes along with the frequency, so the transmission reflection method is commonly used for testing.
The transmission reflection method is to place the sample to be tested between two sections of transmission lines, and calculate the electromagnetic parameters of the sample to be tested by testing the reflection coefficient and the transmission coefficient of the microwave transmission line on which the sample to be tested is placed. The transmission line types used are: striplines, microstrip lines, waveguides, coaxial lines, etc. The waveguide can carry out transmission reflection method test on the sheet material, but the test covering the ultra-wide frequency band needs a plurality of waveguides with corresponding frequency bands, and the preparation requirement on a sample to be tested is higher; the coaxial line can realize ultra-wideband test on the sheet material, but the coaxial line also has the defect of higher preparation requirement on the sample to be tested, and the sample to be tested is not easy to take and place. Therefore, a method of testing using a microstrip line as a transmission line is receiving more and more attention.
For the test of the electromagnetic parameters of the Microwave sheet material, corresponding microstrip line test systems are respectively constructed according to the documents of Jae-Young Chung, Permitity and Permeability measures of a Thin Film with Patterned Microwave Frequencies, IEEE Transactions on Magnetics, April 2015, Vol.51(4), pp.1-7, and the electromagnetic parameter test technology of the sheet dielectric material is researched. But the method can not realize the simultaneous measurement of complex dielectric constant and complex permeability, and can only calibrate the cable, but can not eliminate the influence of the coaxial adapter and the microstrip line on the test result. The documents "Hinojosa, J. Faucon, L. Quefffect, P. and Huret, F. S-parameter broad measurements of micro strip lines and extraction of the substrate internal properties, Microwave and Optical Technology Letters,30(1) 65-69" use thin sheet materials as dielectric substrates or parts of substrates of microstrip lines for measurement, which can realize simultaneous measurement of complex dielectric constant and complex permeability, but the preparation process and the replacement process of the sample to be measured are complicated.
In summary, although there are studies on the electromagnetic parameter testing technology of sheet materials at home and abroad, the problems of difficulty in preparing test samples, complex testing system, incomplete calibration and the like exist, and the requirements on quick and high-precision testing of the electromagnetic parameters of the sheet materials are difficult to adapt.
Disclosure of Invention
The invention aims to provide a novel sheet material electromagnetic parameter testing device and a novel sheet material electromagnetic parameter testing method aiming at the defects in the existing sheet material electromagnetic parameter testing technology.
In order to achieve the purpose, the technical scheme of the invention is as follows:
a sheet material electromagnetic parameter testing device is shown in figures 1 and 3 and comprises two coaxial adapters 1, two parallel conductor walls 2, two microstrip lines 3, a common ground connecting block 4, a sample to be tested 5, a conduction band connecting sheet 6, a flexible foam supporting block 7, a lower pressing block 8, a spring thimble 9, a lower pressing clamp 10, a vertical seat 11, two moving platforms 12, two grooves 17 and a base 13. The two sections of microstrip lines 3 are respectively connected with the two coaxial adapters 1 and are positioned on two equal-height moving platforms 12 in a collinear manner; the sample 5 to be tested is arranged above the common ground connecting block 4 and is located between the two microstrip lines 3 in a common straight line manner; the common ground connecting block 4 is positioned in the grooves 17 of the two moving platforms 12; the conduction band connecting sheet 6 is positioned right above the sample to be tested and can be pressed down by a spring thimble 9 connected with a pressing clamp 10 and a pressing block 8 below the spring thimble to be in close contact with the microstrip line 3.
Preferably, the two microstrip lines 3 are formed by processing a dielectric substrate having a low dielectric constant and a low loss, and a first metal conduction band 14 is attached to the upper side of the substrate and a metal ground layer 15 is attached to the lower side of the substrate. The two microstrip lines are aligned with the edges of the two corresponding mobile platforms 12, and the two microstrip lines can be close to and separated from each other through the movement of the two mobile platforms 12.
Preferably, the parallel conductor walls 2 are located on both sides of a connection between the coaxial adapter and the microstrip line to suppress radiation loss of electromagnetic waves at high frequencies at the connection.
Preferably, the common ground connection block 4 is made of metal, the length of the common ground connection block is 4-5 mm larger than that of the sample to be detected, the width of the common ground connection block is 1-2 mm smaller than that of the groove 17, and chamfers are formed towards two ends of the groove. The common ground connection block can slide in the grooves of the two moving platforms 12 along with the approaching and separating of the two microstrip lines, and meanwhile, the upper surface of the common ground connection block 4 is in close contact with the metal grounding layer 15 of the microstrip line, so that the good common ground of the two microstrip lines in the test process is ensured.
Preferably, the depth of the groove 17 is between 0.5 and 1 times the length of the common ground connection block 4.
Preferably, the conduction band connecting sheet 6 is a Rogers 5880 flexible dielectric substrate with the thickness of 0.127mm, and the influence of the substrate on the test is negligible due to the small thickness and the low complex dielectric constant of the substrate. The length of the substrate is 4-8 mm larger than the length of the sample, the width of the substrate is 4-6 mm smaller than the width of the microstrip line, one surface of the substrate facing the lower pressing block is free of a metal attached layer, one surface of the substrate facing the sample to be detected is attached with a second metal conduction band 19, and the second metal conduction band 19 is aligned with the first metal conduction band 14 up and down and has the same width.
As a preferable mode, the lower pressing block 8 is a table-shaped structure made of a wave-transparent material, as shown in fig. 2, four legs of the table-shaped structure are connected and fixed with four corners of the conduction band connecting sheet 6, a flexible foam supporting block 7 is filled between the lower pressing block 8 and the conduction band connecting sheet 6, the flexible foam supporting block 7 has electromagnetic parameters equivalent to air, and the thickness of the flexible foam supporting block is 0.5-1 mm greater than the height of the legs of the lower pressing block, so that the flexible foam supporting block can press the conduction band of the conduction band connecting sheet and tightly contact with the conduction bands of two sections of microstrip lines after being pressed.
Preferably, the two sides of the microstrip line are provided with protruding walls 16, and the distance between the two protruding walls is equal to the width of the lower pressing block 8, so as to ensure that the conduction band of the conduction band connecting sheet is aligned with the conduction bands of the two sections of microstrip lines.
Preferably, two pin holes 18 are formed on opposite surfaces of the two moving platforms 12, and a pin can be inserted into the pin holes for positioning, so as to ensure that the two microstrip lines can be aligned in a collinear manner.
Preferably, the pogo pin 9 is connected to a pressing jig 10 fixed to the vertical base 11, and the pressing jig can push the pogo pin 9 downward to press the conduction band connection piece 6 below the pressing block 8, so as to ensure good conduction band contact of the two microstrip lines during the test.
As a preferred mode, the thickness of the sample to be measured is the same as the thickness of the two microstrip lines.
In order to achieve the above object, the present invention further provides a method for performing electromagnetic parameter testing on a sheet material by using the above device, comprising the following steps:
step 1: connecting two coaxial adapters with two ports of a vector network analyzer respectively;
step 2: the sample to be measured and the common ground connecting block are not placed, the mobile platform is adjusted to enable the opposite surfaces of the two microstrip lines to be far away from each other by more than 8cm, and open-circuit calibration is carried out;
and step 3: the common-ground connecting block is arranged in the groove without placing a sample to be tested, the moving platform is adjusted to enable the opposite surfaces of the two microstrip lines to be in close contact, and the spring thimble presses down the pressing block to enable the second metal conduction band and the first metal conduction band to be tightly attached to carry out straight-through calibration;
and 4, step 4: a to-be-tested sample is not placed, the common ground connecting block is placed in the groove, a blank substrate which is made of the same material, has the same thickness and the same width as the microstrip lines on the two sides and is 0.25 times of the wavelength corresponding to the central frequency of the testing frequency band is placed above the common ground connecting block, the moving platform is adjusted to enable the opposite surfaces of the two microstrip lines to be in close contact with the two sides of the blank substrate, and the spring thimble presses down the pressing block to enable the second metal conduction band and the first metal conduction band to be in close fit;
and 5: the common-ground connecting block is arranged in the groove, a sample to be tested is arranged above the common-ground connecting block, the mobile platform is adjusted to enable the opposite surfaces of the two microstrip lines to be in close contact with the two sides of the sample to be tested, the press block is pressed down under the spring thimble to enable the second metal conduction band to be tightly attached to the first metal conduction band, and the return loss S of the port of the vector network analyzer is tested and recorded11And transmission loss S21；
Step 6: calculating the electromagnetic parameters of the sample to be measured according to the measured return loss and transmission loss when the sample to be measured is loaded, wherein the calculation process is as follows:
the sample to be tested forms a microstrip transmission line, and the following equation is provided:
wherein:
finally obtaining the equivalent electromagnetic parameters of the microstrip transmission line formed by the sample to be measured, namely the equivalent relative complex permeability
And equivalent relative complex dielectric constant
Comprises the following steps:
wherein
Is a propagation constant of free space and has an expression of
Wherein
Is the wavelength, j is the imaginary unit.
According to the corresponding relationship between the equivalent electromagnetic parameters of the microstrip line and the electromagnetic parameters of the substrate, namely the equations (7) and (8), the real electromagnetic parameters of the sample to be measured, namely the relative complex dielectric constant can be obtained
And relative complex permeability
：
WhereinhIn order to measure the thickness of the sample,wis the width of the conduction band of the second metal. Once the test frequency is determined, the electromagnetic parameters of the sample to be tested, namely the relative complex permeability, can be solved according to the formulas (7) and (8) by the measured return loss and transmission loss
And relative complex dielectric constant
。
The sheet material electromagnetic parameter testing device and the sheet material electromagnetic parameter testing method provided by the invention have the following characteristics and beneficial effects:
on one hand, the detachable microstrip line transmission reflection method test system is adopted, so that the calibration end face is moved from the position of a traditional coaxial adapter to the positions of the end faces on two sides of a sample to be tested, and the calibration accuracy is improved; on the other hand, compared with a transmission reflection method based on a coaxial line and a waveguide, the sample to be tested is easier to take and place, and convenience is provided for testing.
And secondly, the common-ground connecting block 4 is adopted to improve the common-ground continuity of the two microstrip lines 3 and the calibration piece or the sample 5 to be tested in the calibration or test process, so that the problem of magnetic field leakage caused by poor common-ground continuity is avoided, the error of a test system is reduced, and the test accuracy of the electromagnetic parameters is improved.
And thirdly, the conduction band connecting sheet 6 is adopted to improve the conduction band electric continuity of the two sections of microstrip lines 3 in the calibration or test process, and the flexible foam supporting block 7 and the spring thimble 9 are used for realizing the elastic contact of the conduction band connecting sheet with the microstrip lines 3 and the sample 5 to be tested in the same state, so that the test stability is improved.
Drawings
Fig. 1 is a right-side three-dimensional structure schematic diagram of a sheet material electromagnetic parameter testing device provided by the invention.
FIG. 2 is a schematic diagram of a three-dimensional structure of the lower pressing block, the conduction band connecting sheet and the flexible foam supporting block provided by the invention.
Fig. 3 is a front view of an electromagnetic parameter testing device for a sheet material provided by the invention.
The device comprises two coaxial adapters 1, two parallel conductor walls 2, two microstrip lines 3, a common ground connecting block 4, a sample to be tested 5, a conduction band connecting sheet 6, a flexible foam supporting block 7, a lower pressing block 8, a spring thimble 9, a lower pressing clamp 10, a vertical base 11, two moving platforms 12, a base 13, a first metal conduction band 14, a metal grounding layer 15, a convex wall 16, two grooves 17, two pin holes 18, a second metal conduction band 19 and a lower pressing block 20.
Detailed Description
The embodiments of the present invention are described below with reference to specific embodiments, and other advantages and effects of the present invention will be easily understood by those skilled in the art from the disclosure of the present specification.
A sheet material electromagnetic parameter testing device is shown in figures 1 and 3 and comprises two coaxial adapters 1, two parallel conductor walls 2, two microstrip lines 3, a common ground connecting block 4, a sample to be tested 5, a conduction band connecting sheet 6, a flexible foam supporting block 7, a lower pressing block 8, a spring thimble 9, a lower pressing clamp 10, a vertical seat 11, two moving platforms 12, two grooves 17 and a base 13. The two sections of microstrip lines 3 are respectively connected with the two coaxial adapters 1 and are positioned on two equal-height moving platforms 12 in a collinear manner; the sample 5 to be tested is arranged above the common ground connecting block 4 and is located between the two microstrip lines 3 in a common straight line manner; the common ground connecting block 4 is positioned in the grooves 17 of the two moving platforms 12; the conduction band connecting sheet 6 is positioned right above the sample to be tested and can be pressed down by a spring thimble 9 connected with a pressing clamp 10 and a pressing block 8 below the spring thimble to be in close contact with the microstrip line 3.
Furthermore, the two microstrip lines 3 are formed by processing a dielectric substrate with low dielectric constant and low loss, a first metal conduction band 14 is attached to the upper side of the substrate, and a metal grounding layer 15 is attached to the lower side of the substrate. The two microstrip lines are aligned with the edges of the two corresponding mobile platforms 12, and the two microstrip lines can be close to and separated from each other through the movement of the two mobile platforms 12.
Furthermore, the parallel conductor walls 2 are located on two sides of the joint of the coaxial adapter and the microstrip line to suppress the radiation loss of the electromagnetic wave at the high frequency of the joint.
Further, the common ground connecting block 4 is made of metal, the length of the common ground connecting block is 4-5 mm larger than that of a sample to be detected, the width of the common ground connecting block is 1-2 mm smaller than that of the groove 17, and chamfers are formed towards two ends of the groove. The common ground connection block can slide in the grooves of the two moving platforms 12 along with the approaching and separating of the two microstrip lines, and meanwhile, the upper surface of the common ground connection block 4 is in close contact with the metal grounding layer 15 of the microstrip line, so that the good common ground of the two microstrip lines in the test process is ensured.
Further, the depth of the groove 17 is 0.5-1 times of the length of the common ground connecting block 4.
Further, the conduction band connecting sheet 6 is a Rogers 5880 flexible medium substrate with the thickness of 0.127mm, and the influence of the substrate on the test is negligible due to the small thickness and the low complex dielectric constant of the substrate. The length of the substrate is 4-8 mm larger than the length of the sample, the width of the substrate is 4-6 mm smaller than the width of the microstrip line, one surface of the substrate facing the lower pressing block is free of a metal attached layer, one surface of the substrate facing the sample to be detected is attached with a second metal conduction band 19, and the second metal conduction band 19 is aligned with the first metal conduction band 14 up and down and has the same width.
Further, the lower pressing block 8 is a table-shaped structure made of a wave-transmitting material, as shown in fig. 2, four table legs of the lower pressing block are fixedly connected with four corners of the conduction band connecting sheet 6, a flexible foam supporting block 7 is filled between the lower pressing block 8 and the conduction band connecting sheet 6, the flexible foam supporting block 7 has electromagnetic parameters equivalent to air, and the thickness of the flexible foam supporting block is 0.5-1 mm greater than the height of the table legs of the lower pressing block, so that the flexible foam supporting block can compress the conduction band of the conduction band connecting sheet and is in close contact with the conduction bands of the two sections of microstrip lines after being pressed down.
Furthermore, protruding walls 16 are arranged on two sides of the microstrip line, and the distance between the two protruding walls is equal to the width of the lower pressing block 8, so that the conduction band of the conduction band connecting sheet is aligned with the conduction bands of the two microstrip lines.
Furthermore, two pin holes 18 are formed in the opposite surfaces of the two moving platforms 12, and pins can be inserted into the pin holes for positioning, so that the two microstrip lines can be aligned in a collinear manner.
Furthermore, the pogo pin 9 is connected to a hold-down fixture 10 fixed on the vertical base 11, and the hold-down fixture can push the pogo pin 9 downward to press the conduction band connection piece 6 below the hold-down block 8, so as to ensure good conduction band contact of the two microstrip lines during the test process.
Furthermore, the thickness of the sample to be measured is the same as the thickness of the two microstrip lines.
In order to achieve the above object, the present invention further provides a method for performing electromagnetic parameter testing on a sheet material by using the above device, comprising the following steps:
step 1: connecting two coaxial adapters with two ports of a vector network analyzer respectively;
step 2: the sample to be measured and the common ground connecting block are not placed, the mobile platform is adjusted to enable the opposite surfaces of the two microstrip lines to be far away from each other by more than 8cm, and open-circuit calibration is carried out;
and step 3: the common-ground connecting block is arranged in the groove without placing a sample to be tested, the moving platform is adjusted to enable the opposite surfaces of the two microstrip lines to be in close contact, and the spring thimble presses down the pressing block to enable the second metal conduction band and the first metal conduction band to be tightly attached to carry out straight-through calibration;
and 4, step 4: a to-be-tested sample is not placed, the common ground connecting block is placed in the groove, a blank substrate which is made of the same material, has the same thickness and the same width as the microstrip lines on the two sides and is 0.25 times of the wavelength corresponding to the central frequency of the testing frequency band is placed above the common ground connecting block, the moving platform is adjusted to enable the opposite surfaces of the two microstrip lines to be in close contact with the two sides of the blank substrate, and the spring thimble presses down the pressing block to enable the second metal conduction band and the first metal conduction band to be in close fit;
and 5: the common-ground connecting block is arranged in the groove, a sample to be tested is arranged above the common-ground connecting block, the mobile platform is adjusted to enable the opposite surfaces of the two microstrip lines to be in close contact with the two sides of the sample to be tested, the press block is pressed down under the spring thimble to enable the second metal conduction band to be tightly attached to the first metal conduction band, and the return loss S of the port of the vector network analyzer is tested and recorded11And transmission loss S21；
Step 6: calculating the electromagnetic parameters of the sample to be measured according to the measured return loss and transmission loss when the sample to be measured is loaded, wherein the calculation process is as follows:
the sample to be tested forms a microstrip transmission line, and the following equation is provided:
wherein:
finally obtaining the equivalent electromagnetic parameters of the microstrip transmission line formed by the sample to be measured, namely the equivalent relative complex permeability
And equivalent relative complex dielectric constant
Comprises the following steps:
wherein
Is a propagation constant of free space and has an expression of
Wherein
Is the wavelength, j is the imaginary unit.
According to the corresponding relationship between the equivalent electromagnetic parameters of the microstrip line and the electromagnetic parameters of the substrate, i.e. the equations (7) and (8), the equivalent electromagnetic parameters of the microstrip line can be obtainedObtaining the true electromagnetic parameters, i.e. the relative complex dielectric constant, of the sample to be measured
And relative complex permeability
。
WhereinhIn order to measure the thickness of the sample,wis the width of the conduction band of the second metal. Once the test frequency is determined, the electromagnetic parameters of the sample to be tested, namely the relative complex permeability, can be solved according to the formulas (7) and (8) by the measured return loss and transmission loss
And relative complex dielectric constant
。
The foregoing embodiments are merely illustrative of the principles and utilities of the present invention and are not intended to limit the invention. Any person skilled in the art can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical spirit of the present invention be covered by the claims of the present invention.
Claims (9)
1. A slice material electromagnetic parameter testing device comprises two coaxial adapters (1), two parallel conductor walls (2), two microstrip lines (3), a common ground connecting block (4), a sample to be tested (5), a conduction band connecting sheet (6), a flexible foam supporting block (7), a lower pressing block (8), a spring thimble (9), a lower pressing clamp (10), a vertical seat (11), two moving platforms (12), two grooves (17) and a base (13); the two microstrip lines (3) are respectively connected with the two coaxial adapters (1) and are positioned on the two equal-height moving platforms (12) in a collinear manner; the sample (5) to be tested is arranged above the common ground connecting block (4) and is located between the two microstrip lines (3) in a common straight line manner; the common ground connecting block (4) is positioned in the grooves (17) of the two mobile platforms (12); the conduction band connecting sheet (6) is positioned right above a sample to be tested and can be pressed down by a spring thimble (9) connected with a pressing clamp (10) and a pressing block (8) below the spring thimble to be tightly contacted with the microstrip line (3); the lower pressing block (8) is of a table-shaped structure made of wave-transmitting materials, four table legs of the lower pressing block are fixedly connected with four corners of the conduction band connecting sheet (6), a flexible foam supporting block (7) is filled between the lower pressing block (8) and the conduction band connecting sheet (6), the flexible foam supporting block (7) has electromagnetic parameters equivalent to air, and the thickness of the flexible foam supporting block is 0.5-1 mm greater than the height of the table legs of the lower pressing block; the parallel conductor walls (2) are positioned on two sides of the joint of the coaxial adapter and the microstrip line; protruding walls (16) are arranged on two sides of the microstrip line, and the distance between the two protruding walls is equal to the width of the lower pressing block (8).
2. The electromagnetic parameter testing device for the sheet material as claimed in claim 1, wherein the two microstrip lines (3) are formed by processing a dielectric substrate with low dielectric constant and low loss, a first metal conduction band (14) is attached to the upper side of the substrate, and a metal grounding layer (15) is attached to the lower side of the substrate; the two sections of microstrip lines are aligned with the edges of the two corresponding mobile platforms (12), and the two sections of microstrip lines can be close to and separated from each other through the movement of the two mobile platforms (12).
3. The sheet material electromagnetic parameter testing device according to claim 1, wherein the common ground connection block (4) is made of metal, the length of the common ground connection block is 4-5 mm larger than that of a sample to be tested, the width of the common ground connection block is 1-2 mm smaller than that of the groove (17), and chamfers are formed towards two ends of the groove; the common ground connection block can slide in the grooves of the two moving platforms (12) along with the approaching and separating of the two microstrip lines, and meanwhile, the upper surface of the common ground connection block (4) is in close contact with the metal grounding layer (15) of the microstrip lines.
4. The sheet material electromagnetic parameter testing device of claim 1, wherein the depth of the groove (17) is between 0.5 and 1 times the length of the common ground connection block (4).
5. The thin sheet material electromagnetic parameter testing device according to claim 1, wherein the conduction band connecting sheet (6) is a Rogers 5880 flexible medium substrate with the thickness of 0.127mm, the length is 4-8 mm larger than the length of the sample, the width is 4-6 mm smaller than the width of the microstrip line, one surface of the conduction band connecting sheet facing the lower pressing block is free of metal attached layers, one surface facing the sample to be tested is attached with a second metal conduction band (19), and the second metal conduction band (19) is vertically aligned with the first metal conduction band (14) and has the same width.
6. The sheet material electromagnetic parameter testing device of claim 1, wherein the two moving platforms (12) are provided with two pin holes (18) on opposite sides thereof, and pins can be inserted for positioning.
7. The sheet material electromagnetic parameter testing device of claim 1, wherein the pogo pins (9) are connected to hold-down clamps (10) fixed to the stand (11), the hold-down clamps being adapted to push the pogo pins (9) downward to press the guide strip connecting piece (6) below the hold-down block (8).
8. The device for testing the electromagnetic parameters of a sheet material as claimed in claim 1, wherein the thickness of the sample to be tested is the same as the thickness of the two microstrip lines.
9. Method for the electromagnetic parametric testing of sheet materials with a device according to any of claims 1 to 8, comprising the following steps
Step 1: connecting two coaxial adapters with two ports of a vector network analyzer respectively;
step 2: the sample to be measured and the common ground connecting block are not placed, the mobile platform is adjusted to enable the opposite surfaces of the two microstrip lines to be far away from each other by more than 8cm, and open-circuit calibration is carried out;
and step 3: the common-ground connecting block is arranged in the groove without placing a sample to be tested, the moving platform is adjusted to enable the opposite surfaces of the two microstrip lines to be in close contact, and the spring thimble presses down the pressing block to enable the second metal conduction band and the first metal conduction band to be tightly attached to carry out straight-through calibration;
and 4, step 4: a to-be-tested sample is not placed, the common ground connecting block is placed in the groove, a blank substrate which is made of the same material, has the same thickness and the same width as the microstrip lines on the two sides and is 0.25 times of the wavelength corresponding to the central frequency of the testing frequency band is placed above the common ground connecting block, the moving platform is adjusted to enable the opposite surfaces of the two microstrip lines to be in close contact with the two sides of the blank substrate, and the spring thimble presses down the pressing block to enable the second metal conduction band and the first metal conduction band to be in close fit;
and 5: the common-ground connecting block is arranged in the groove, a sample to be tested is arranged above the common-ground connecting block, the mobile platform is adjusted to enable the opposite surfaces of the two microstrip lines to be in close contact with the two sides of the sample to be tested, the press block is pressed down under the spring thimble to enable the second metal conduction band to be tightly attached to the first metal conduction band, and the return loss S of the port of the vector network analyzer is tested and recorded11And transmission loss S21；
Step 6: calculating the electromagnetic parameters of the sample to be measured according to the measured return loss and transmission loss when the sample to be measured is loaded, wherein the calculation process is as follows:
the sample to be tested forms a microstrip transmission line, and the following equation is provided:
wherein:
finally obtaining the equivalent electromagnetic parameters of the microstrip transmission line formed by the sample to be measured, namely the equivalent relative complex permeability
And equivalent relative complex dielectric constant
Comprises the following steps:
wherein
For transmission in free spaceA broadcast constant expressed as
Wherein
Is the wavelength, j is the imaginary unit;
according to the corresponding relationship between the equivalent electromagnetic parameters of the microstrip line and the electromagnetic parameters of the substrate, namely the equations (7) and (8), the real electromagnetic parameters of the sample to be measured, namely the relative complex dielectric constant can be obtained
And relative complex permeability
；
WhereinhIn order to measure the thickness of the sample,wis the width of the second metal conduction band; once the test frequency is determined, the electromagnetic parameters of the sample to be tested, namely the relative complex permeability, can be solved according to the formulas (7) and (8) by the measured return loss and transmission loss
And relative complex dielectric constant
。
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| DE3722619A1 (en) * | 1987-07-09 | 1989-01-19 | Licentia Gmbh | Device for measuring the stray parameters of a planar structure in the millimetre wave range |
| JP2006266944A (en) * | 2005-03-24 | 2006-10-05 | Kyocera Corp | Dielectric property measuring method, and dielectric property measuring tool |
| CN101196545A (en) * | 2006-12-07 | 2008-06-11 | 中国科学院半导体研究所 | Device for measuring dielectric characteristics of dielectric material |
| CN202421344U (en) * | 2011-12-20 | 2012-09-05 | 安徽华东光电技术研究所 | X-band circulator test device |
| CN104849593A (en) * | 2015-05-12 | 2015-08-19 | 电子科技大学 | Microstrip device test system |
| CN105548771A (en) * | 2016-01-19 | 2016-05-04 | 深圳振华富电子有限公司 | LTCC filter testing board and testing clamping tool |
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