CN114252751A - Strip line resonator testing system for complex dielectric constant of high-frequency printed board substrate - Google Patents
Strip line resonator testing system for complex dielectric constant of high-frequency printed board substrate Download PDFInfo
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- CN114252751A CN114252751A CN202111568804.8A CN202111568804A CN114252751A CN 114252751 A CN114252751 A CN 114252751A CN 202111568804 A CN202111568804 A CN 202111568804A CN 114252751 A CN114252751 A CN 114252751A
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Abstract
The invention discloses a strip line resonator testing system for complex dielectric constant of a high-frequency printed board substrate, which comprises: the vector network analyzer, strip line test fixture, high frequency probe, pressurization pressure measurement device and computer, the pressurization pressure measurement device is used for exerting test pressure to strip line test fixture, one end of high frequency probe can be connected with the vector network analyzer through the cable, test fixture includes: the device comprises a lower pressing block, an upper pressing block, a lower pressing plate and an upper pressing plate, wherein the lower pressing block is used for being placed on a loading platform of a pressurization and pressure measurement device, the upper pressing block is located right above the lower pressing block and is used for being in pressing contact with a pressurization screw of the pressurization and pressure measurement device, the lower pressing plate is installed on the upper surface of the lower pressing block, the upper pressing plate is installed on the lower surface of the upper pressing block, and a resonator graphic card and a medium substrate to be measured are placed between the upper pressing plate and the lower pressing plate. The invention can accurately and efficiently measure the complex dielectric constant of the high-frequency printing board base material with different specifications and thicknesses, and can also improve the test precision while protecting the medium substrate to be tested from being damaged.
Description
Technical Field
The invention relates to a stripline resonator testing system for complex dielectric constant of a high-frequency printed board substrate, and belongs to the technical field of new material dielectric property testing.
Background
The urgent requirements of the forthcoming 5G mobile network, such as unmanned driving, smart city, Internet of things and the like on the increase of data storage, calculation and transmission rate increase, and the demand of high-frequency printing plate base materials is increased in an expansion manner in the fields of military industry or aerospace, such as the innovation of technologies of satellite communication, radar detection and the like. However, due to technical blockade and slow start, the domestic medium-high-frequency substrate market is held by large foreign companies for a long time, but with the rapid development and appeal of the localization of basic materials, in recent years, novel domestic high-frequency substrates, such as bamboo shoots after rain, generally enter the market and public vision, on the one hand, more choices are provided for seeking more economic alternative materials, and meanwhile, troubles are brought to people by accurately and effectively evaluating the performance of new materials.
Unlike conventional epoxy system substrates, typical characteristics of high frequency printed board substrates include the following three aspects:
(1) the transmission loss is small, the transmission delay time is short, and the distortion of signal transmission is small;
(2) the precision control of the characteristic impedance () is high;
(3) the electrical properties remain relatively stable under varying frequency, humidity and temperature conditions.
The most important criteria for determining the above-mentioned properties of high-frequency substrates are the complex dielectric constant of the substrate itself, i.e. the relative dielectric constant and the loss tangent, because the dielectric constant determines the transmission speed of signals in the medium and has a direct influence on the structure of the printed circuit board (parameters such as thickness and characteristic impedance), and the dielectric loss of signals increases with the increase of the signal transmission frequency and is proportional to the square root of the dielectric constant and the loss tangent of the dielectric material. Therefore, in the design and use of the high-frequency printed circuit board, how to accurately and efficiently measure the complex dielectric constant of the base material has very important significance on the performance acceptance of the high-frequency base material, the parameter design, the simulation debugging, the production control and the like of the high-frequency printed circuit board.
Disclosure of Invention
The invention aims to provide a stripline resonator test system for complex dielectric constant of a high-frequency printed board substrate, which can accurately and efficiently measure the complex dielectric constant of the high-frequency printed board substrate with different specifications and thicknesses, can ensure that the whole plane of a medium substrate to be tested is soft and uniformly stressed, protects the medium substrate to be tested from being damaged, and improves the test precision.
In order to achieve the purpose, the invention adopts the technical scheme that: a stripline resonator test system for complex dielectric constant of a high frequency printed board substrate, comprising: the testing device comprises a vector network analyzer, a strip line testing clamp, a high-frequency probe, a pressurizing and pressure measuring device and a computer, wherein the pressurizing and pressure measuring device is used for applying testing pressure to the strip line testing clamp, one end of the high-frequency probe can be connected with the vector network analyzer through a cable, and the strip line testing clamp further comprises: the device comprises a lower pressing block, an upper pressing block, a lower pressing plate and an upper pressing plate, wherein the lower pressing block is placed on a loading platform of a pressure and pressure measuring device, the upper pressing block is positioned right above the lower pressing block and is in pressing contact with a pressure screw of the pressure and pressure measuring device, the lower pressing plate is installed on the upper surface of the lower pressing block, the upper pressing plate is installed on the lower surface of the upper pressing block, and a resonator graphic card and a medium substrate to be measured are placed between the upper pressing plate and the lower pressing plate;
the resonator pattern card is characterized in that the same side of the lower pressing plate and the upper pressing plate is correspondingly provided with a lower clamping block and an upper clamping block, two ends of the upper surface of the lower clamping block are respectively provided with a lower groove, the lower surface of the upper clamping block is provided with an upper groove corresponding to the lower groove, 2 high-frequency probes are correspondingly arranged between the lower groove and the upper groove, and one end of the resonator pattern card extends outwards to be embedded between the lower clamping block and the upper clamping block and is electrically contacted with the high-frequency probes.
The further improved scheme in the technical scheme is as follows:
1. in the above scheme, the lower clamping block and the upper clamping block are respectively mounted on the side surfaces of the lower pressing block and the upper pressing block through a support, the support is provided with a strip-shaped hole extending along the vertical direction, and a screw penetrates through the strip-shaped hole to be connected with the lower pressing block or the upper pressing block.
2. In the above scheme, a spherical hole is formed in the center of the upper surface of the upper pressing block, the lower part of a sphere is embedded into the spherical hole, and the upper part of the sphere is embedded into a spherical groove formed in the bottom surface of the pressurizing screw.
3. In the scheme, the center of the lower surface of the carrying platform of the pressure and pressure measuring device is provided with a mounting groove, a plurality of springs are arranged in the mounting groove at intervals, and the vertically arranged springs are connected between the base and the carrying platform of the pressure and pressure measuring device.
4. In the above scheme, a limiting ring is fixedly mounted on the upper surface of the base and positioned outside the carrier, an annular limiting groove is formed on the inner circumferential surface of the limiting ring, and a flange portion matched with the annular limiting groove is formed on the outer circumferential surface of the carrier.
5. In the above scheme, two ends of the side surface of the lower clamping block, which is back to the lower pressing plate, are respectively provided with a probe seat, and one end of the high-frequency probe, which is back to the resonator graphic card, is arranged on the probe seat.
6. In the above scheme, the upper surface of the lower clamping block is higher than the upper surface of the lower pressing plate, and the lower surface of the upper clamping block is lower than the lower surface of the upper pressing plate.
7. In the scheme, the areas of the lower clamping block and the upper clamping block, which are respectively contacted with the high-frequency probe, are provided with insulating layers; or, the upper surface of the lower clamping block and the lower surface of the upper clamping block are respectively provided with an insulating gasket, the insulating gasket is provided with a position avoiding hole matched with the high-frequency probe, and the resonator graphic card is embedded between the two insulating gaskets.
8. In the scheme, 2 dielectric substrates to be tested with consistent thickness are superposed on the upper side and the lower side of the resonator graphic card.
9. In the above scheme, 2 of the high frequency probes are respectively in electrical conduction with a resonance conduction band on the resonator graphic card.
Due to the application of the technical scheme, compared with the prior art, the invention has the following advantages:
the stripline resonator test system for the complex dielectric constant of the high-frequency printed board substrate can accurately and efficiently measure the complex dielectric constant of the high-frequency printed board substrate with different specifications and thicknesses, can ensure the uniformity and stability of pressure applied on the clamp by the pressurizing screw rod and avoid the condition of overvoltage, further ensure that the whole plane of the medium substrate to be tested is soft and uniformly stressed, protect the medium substrate to be tested from being damaged and improve the test precision.
Drawings
FIG. 1 is a schematic diagram of a test system of the present invention;
FIG. 2 is a schematic exploded view of a local structure of the test system of the present invention;
FIG. 3 is a schematic view of a pressure measurement device with a test fixture installed in the test system of the present invention;
FIG. 4 is a cross-sectional view of the structure of FIG. 3;
FIG. 5 is a schematic structural diagram of a test fixture in the test system of the present invention;
FIG. 6 is an exploded view of a test fixture in the test system of the present invention.
In the above drawings: 100. a vector network analyzer; 200. a strip line test fixture; 300. a high-frequency probe; 301. a probe base; 400. a pressure test device; 401. a stage; 402. a pressurizing screw; 403. mounting grooves; 404. a base; 500. a computer; 600. a resonator graphics card; 700. a medium substrate to be tested; 1. pressing the block; 2. pressing the blocks; 21. a spherical pore; 3. a lower pressing plate; 4. an upper pressure plate; 5. a lower clamping block; 6. a tightening block is arranged; 7. an insulating spacer; 8. a support; a strip-shaped hole; 9. a sphere; 10. a spring; 11. a limit ring.
Detailed Description
Example 1: the invention provides a strip line resonator testing system for complex dielectric constant of a high-frequency printed board substrate, which comprises: a vector network analyzer 100, a strip line test jig 200, a high frequency probe 300, a pressure measuring device 400 and a computer 500, wherein the pressure measuring device 400 is used for applying a test pressure to the strip line test jig 200, one end of the high frequency probe 300 is connected to the vector network analyzer 100 through a cable, and the strip line test jig 200 further comprises: the device comprises a lower pressing block 1, an upper pressing block 2, a lower pressing plate 3 and an upper pressing plate 4, wherein the lower pressing block 1 is used for being placed on a carrying platform 401 of a pressure and pressure measuring device 400, the upper pressing block 2 is located right above the lower pressing block 1 and is used for being in pressing contact with a pressure screw 402 of the pressure and pressure measuring device 400, the lower pressing plate 3 is installed on the upper surface of the lower pressing block 1, the upper pressing plate 4 is installed on the lower surface of the upper pressing block 2, and a resonator graphic card 600 and a medium substrate 700 to be measured are placed between the upper pressing plate 4 and the lower pressing plate 3;
the resonator pattern card 600 is characterized in that a lower clamping block 5 and an upper clamping block 6 are correspondingly arranged on the same side of the lower pressing plate 3 and the upper pressing plate 4, a lower groove is formed in each of two ends of the upper surface of the lower clamping block 5, an upper groove corresponding to the lower groove is formed in the lower surface of the upper clamping block 6, 2 high-frequency probes 300 are correspondingly arranged between the lower groove and the upper groove, and one end of the resonator pattern card 600 extends outwards to be embedded between the lower clamping block 5 and the upper clamping block 6 and is electrically contacted with the high-frequency probes 300.
The lower clamping block 5 and the upper clamping block 6 are respectively arranged on the side surfaces of the lower pressing block 1 and the upper pressing block 2 through a bracket 8, the bracket 8 is provided with a strip-shaped hole 81 extending along the vertical direction, a screw passes through the strip-shaped hole 81 to be connected with the lower pressing block 1 or the upper pressing block 2, and the bracket further comprises a horizontal part used for being connected with the clamping blocks and a vertical part provided with the strip-shaped hole;
a spherical hole 21 is formed in the center of the upper surface of the upper press block 2, the lower portion of a sphere 9 is inserted into the spherical hole 21, and the upper portion of the sphere 9 is inserted into a spherical groove formed in the bottom surface of the pressure screw 402;
a mounting groove 403 is formed in the center of the lower surface of the carrier 401 of the pressure and pressure measuring device 400, a plurality of springs 10 are arranged in the mounting groove 403 at intervals, the vertically arranged springs 10 are connected between the base 404 of the pressure and pressure measuring device 400 and the carrier 401, grooves for embedding the ends of the springs are formed in the upper surface of the base and the inner wall of the mounting groove, and the springs are arranged at equal intervals along a circumferential room;
a limiting ring 11 is fixedly mounted on the upper surface of the base 404 and positioned outside the carrier 401, an annular limiting groove is formed on the inner circumferential surface of the limiting ring 11, a flange part matched with the annular limiting groove is formed on the outer circumferential surface of the carrier 401, and the flange part embedded in the annular limiting groove can reciprocate in the vertical direction;
the lower clamp block 5 and the upper clamp block 6 each have an insulating layer in a region in contact with the high-frequency probe 300.
Example 2: the invention provides a strip line resonator testing system for complex dielectric constant of a high-frequency printed board substrate, which comprises: a vector network analyzer 100, a strip line test jig 200, a high frequency probe 300, a pressure measuring device 400 and a computer 500, wherein the pressure measuring device 400 is used for applying a test pressure to the strip line test jig 200, one end of the high frequency probe 300 is connected to the vector network analyzer 100 through a cable, and the strip line test jig 200 further comprises: the device comprises a lower pressing block 1, an upper pressing block 2, a lower pressing plate 3 and an upper pressing plate 4, wherein the lower pressing block 1 is used for being placed on a carrying platform 401 of a pressure and pressure measuring device 400, the upper pressing block 2 is located right above the lower pressing block 1 and is used for being in pressing contact with a pressure screw 402 of the pressure and pressure measuring device 400, the lower pressing plate 3 is installed on the upper surface of the lower pressing block 1, the upper pressing plate 4 is installed on the lower surface of the upper pressing block 2, and a resonator graphic card 600 and a medium substrate 700 to be measured are placed between the upper pressing plate 4 and the lower pressing plate 3;
the resonator pattern card 600 is characterized in that a lower clamping block 5 and an upper clamping block 6 are correspondingly arranged on the same side of the lower pressing plate 3 and the upper pressing plate 4, a lower groove is formed in each of two ends of the upper surface of the lower clamping block 5, an upper groove corresponding to the lower groove is formed in the lower surface of the upper clamping block 6, 2 high-frequency probes 300 are correspondingly arranged between the lower groove and the upper groove, and one end of the resonator pattern card 600 extends outwards to be embedded between the lower clamping block 5 and the upper clamping block 6 and is electrically contacted with the high-frequency probes 300.
Two ends of the side surface of the lower clamping block 5 opposite to the lower pressing plate 3 are respectively provided with a probe holder 301, and one end of the high-frequency probe 300 opposite to the resonator graphic card 600 is arranged on the probe holder 301;
the upper surface of the lower clamping block 5 is higher than the upper surface of the lower pressing plate 3, and the lower surface of the upper clamping block 6 is lower than the lower surface of the upper pressing plate 4;
the upper surface of the lower clamping block 5 and the lower surface of the upper clamping block 6 are respectively provided with an insulating gasket 7, the insulating gasket 7 is provided with a position avoiding hole matched with the high-frequency probe 300, and the resonator graphic card 600 is embedded between the two insulating gaskets 7;
2 dielectric substrates 700 to be tested with consistent thickness are superposed on the upper side and the lower side of the resonator graphic card 600;
2 of the above-described high-frequency probes 300 are each in electrical communication with a resonant conduction band 601 on the resonator pattern card 600.
The above examples are further illustrated as follows:
the upper pressure plate is connected with the upper pressure block through 4 screws, the lower pressure plate is connected with the lower pressure block through 4 screws, and during testing, the strip line resonator is arranged between the upper pressure plate and the lower pressure plate and is in tight contact with the upper pressure plate and the lower pressure plate to realize good grounding;
the upper bracket and the lower bracket are respectively matched with the bracket sliding block in the strip-shaped hole and are fixed on the upper pressing block and the lower pressing block through 2 screws, and the sliding block is fixed on the pressing block and can move up and down relative to the bracket, so that the distance between the upper pressing block and the lower pressing block can be changed by adjusting the position of the sliding block so as to adapt to the test requirements of samples with different thicknesses;
the high-frequency probe is fixed on the lower clamping block, and the head of the probe extends into the space between the two insulating gaskets;
the upper clamping block and the lower clamping block realize accurate alignment through 2 groups of positioning pins and positioning holes; finally, fixing the upper clamping block and the lower clamping block together by using 2 screws to form a set of complete test fixture;
a probe seat of the high-frequency probe is fixed on the lower clamping block through 2 screws, and the head of the probe extends into the two insulating gaskets;
the pressing plate is made of a material with excellent conductivity, such as brass or oxygen-free copper, so as to ensure that the upper surface and the lower surface of the strip line resonator are both grounded well, and if the pressing plate is made of an aluminum material or a stainless steel material, two thin copper sheets can be respectively padded at the two ends of the strip line resonator during testing so as to increase the conductivity;
the bracket, the clamping block and the pressing block have enough mechanical strength, and the material can be selected from stainless steel, aluminum and the like;
the material of the insulating gasket can be selected from insulating resin;
the size of the strip line resonator clamp is closely related to the size of the resonator graphic card and the size of the dielectric substrate to be tested, in order to ensure that the two ends of the resonator are well grounded, the length of the pressing plate is 65-75 mm (preferably 68.6 mm), the width of the pressing plate is 40-60 mm (preferably 50.8 mm), and the thickness of the pressing plate is 5-7 mm (preferably 6.35 mm); the length and width of the pressing block are consistent with those of the pressing plate, and the thickness of the pressing block is 20-25 mm;
the effective maximum test frequency of the high-frequency probe is not less than 13.0 GHz;
the width of the opening at the rear end of the probe slot of the insulating gasket is 0.5-1 mm larger than the outer diameter of the high-frequency probe; the thickness of the two insulating gaskets is 2 times larger than the core diameter of the high-frequency probe, and the opening width of the rear end of the probe groove is 0.2-0.3 mm larger than the core diameter of the high-frequency probe, so as to ensure that the head part of the extending end of the high-frequency probe is wrapped in a relatively closed insulating space;
the movable distance of the bracket sliding block relative to the bracket is not less than 3 mm;
the length and width of the resonator graphic card are the same as those of the pressing plate, and the thickness of the resonator graphic card is 0.20-0.25 mm (typical value is 0.22 mm);
the material of the resonator graphic card is completely the same as that of the measured dielectric substrate, and the dielectric constant of the dielectric substrate is different from 2.0-11.0, the size of each graphic in the corresponding resonator graphic card is correspondingly changed, wherein the length of a resonance conduction band is 17-38 mm, the width of the resonance conduction band is 2.5-6.3 mm, the width of a probe conduction band is 0.4-2.7 mm, and the probe gap is 2.0-2.55 mm;
the dielectric substrate to be tested is manufactured by etching the copper foil on the surface of a copper foil-clad substrate and cutting the copper foil-clad substrate according to the required size; the length and width of the dielectric substrate to be measured are the same as those of the resonator graphic card, the thickness range is 1.3 mm-2.0 mm, and a sample with insufficient thickness can be superposed to meet the specified thickness requirement.
The specific test procedure is as follows:
firstly, placing a resonator graphic card shown in FIG. 2 in a strip line resonator clamp, inserting one end of the resonator graphic card with a resonant conduction band between an upper insulating spacer and a lower insulating spacer, adjusting the position of the resonator graphic card to enable the resonant conduction band to be in contact with a high-frequency probe, and then screwing an upper clamping block and a lower clamping block together through screws to fix the resonator graphic card in the resonator clamp;
respectively placing medium substrates to be tested with the same thickness at the upper side and the lower side of the resonator graphic card, wherein the material of the medium substrates to be tested is the same as that of the resonator graphic card;
the whole strip line resonator clamp is placed in a pressurizing and pressure measuring device shown in figure 3, pressure not lower than 4.5KN is applied to the clamp (sample) through the pressurizing and pressure measuring device, then a high-frequency probe and a vector network analyzer are connected through a high-frequency test cable, the vector network analyzer excites the resonator to generate resonance, and finally the complex dielectric constant (relative dielectric constant and loss tangent) of the dielectric substrate to be measured is calculated by measuring the resonant frequency f and the quality factor Q of each resonant peak in the vector network analyzer and combining a mathematical model.
When the stripline resonator testing system for the complex dielectric constant of the high-frequency printed board substrate is adopted, the complex dielectric constant of the high-frequency printed board substrate with different specifications and thicknesses can be accurately and efficiently measured, the uniformity and stability of pressure applied to the clamp through the pressurizing screw can be ensured, the condition of overvoltage cannot be generated, the whole plane of the medium substrate to be tested is ensured to be soft and uniformly stressed, the medium substrate to be tested is protected from being damaged, and the testing precision is improved.
The above embodiments are merely illustrative of the technical ideas and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered within the protection scope of the present invention.
Claims (10)
1. A stripline resonator test system for complex dielectric constant of a high frequency printed board substrate, comprising: the vector network analyzer (100), a strip line test fixture (200), a high-frequency probe (300), a pressurizing and pressure measuring device (400) and a computer (500), wherein the pressurizing and pressure measuring device (400) is used for applying test pressure to the strip line test fixture (200), one end of the high-frequency probe (300) can be connected with the vector network analyzer (100) through a cable, and the vector network analyzer is characterized in that: the stripline test fixture (200) further comprises: the device comprises a lower pressing block (1) placed on a carrying platform (401) of a pressure and pressure measuring device (400), an upper pressing block (2) located right above the lower pressing block (1) and used for being in pressing contact with a pressure screw (402) of the pressure and pressure measuring device (400), a lower pressing plate (3) installed on the upper surface of the lower pressing block (1) and an upper pressing plate (4) installed on the lower surface of the upper pressing block (2), wherein a resonator graphic card (600) and a medium substrate (700) to be measured are placed between the upper pressing plate (4) and the lower pressing plate (3);
the resonator pattern card is characterized in that a lower clamping block (5) and an upper clamping block (6) are correspondingly arranged on the same side of the lower pressing plate (3) and the upper pressing plate (4), two ends of the upper surface of the lower clamping block (5) are respectively provided with a lower groove, an upper groove corresponding to the lower groove is formed in the lower surface of the upper clamping block (6), 2 high-frequency probes (300) are correspondingly arranged between the lower groove and the upper groove, and one end of the resonator pattern card (600) extends outwards to be embedded between the lower clamping block (5) and the upper clamping block (6) and is electrically contacted with the high-frequency probes (300).
2. The stripline resonator test system for complex permittivity of a high-frequency printed board substrate according to claim 1, characterized in that: the lower clamping block (5) and the upper clamping block (6) are respectively installed on the side surfaces of the lower pressing block (1) and the upper pressing block (2) through a support (8), a strip-shaped hole (81) extending along the vertical direction is formed in the support (8), and a screw penetrates through the strip-shaped hole (81) to be connected with the lower pressing block (1) or the upper pressing block (2).
3. The stripline resonator test system for complex permittivity of a high-frequency printed board substrate according to claim 1 or 2, characterized in that: the center of the upper surface of the upper pressing block (2) is provided with a spherical hole (21), the lower part of a sphere (9) is embedded into the spherical hole (21), and the upper part of the sphere (9) is used for being embedded into a spherical groove arranged on the bottom surface of the pressurizing screw (402).
4. The stripline resonator test system for complex permittivity of a high-frequency printed board substrate according to claim 3, characterized in that: the center of the lower surface of a carrier (401) of the pressure and pressure measuring device (400) is provided with an installation groove (403), a plurality of springs (10) are arranged in the installation groove (403) at intervals, and the vertically arranged springs (10) are connected between a base (404) of the pressure and pressure measuring device (400) and the carrier (401).
5. The stripline resonator test system for complex permittivity of a high-frequency printed board substrate according to claim 4, characterized in that: a limiting ring (11) is fixedly mounted on the upper surface of the base (404) and positioned outside the carrier (401), an annular limiting groove is formed in the inner circumferential surface of the limiting ring (11), and a flange portion matched with the annular limiting groove is formed in the outer circumferential surface of the carrier (401).
6. The stripline resonator test system for complex permittivity of a high-frequency printed board substrate according to claim 1, characterized in that: the two ends of the side surface, back to the lower pressing plate (3), of the lower clamping block (5) are respectively provided with a probe seat (301), and one end, back to the resonator graphic card (600), of the high-frequency probe (300) is arranged on the probe seat (301).
7. The stripline resonator test system for complex permittivity of a high-frequency printed board substrate according to claim 1, characterized in that: the upper surface of the lower clamping block (5) is higher than the upper surface of the lower pressing plate (3), and the lower surface of the upper clamping block (6) is lower than the lower surface of the upper pressing plate (4).
8. The stripline resonator test system for complex permittivity of a high-frequency printed board substrate according to claim 1, characterized in that: the regions of the lower clamping block (5) and the upper clamping block (6) which are respectively contacted with the high-frequency probe (300) are provided with insulating layers; or, the upper surface of the lower clamping block (5) and the lower surface of the upper clamping block (6) are respectively provided with an insulating gasket (7), the insulating gasket (7) is provided with a clearance hole matched with the high-frequency probe (300), and the resonator graphic card (600) is embedded between the two insulating gaskets (7).
9. The stripline resonator test system for complex permittivity of a high-frequency printed board substrate according to claim 1, characterized in that: 2 dielectric substrates (700) to be tested with consistent thickness are superposed on the upper side and the lower side of the resonator graphic card (600).
10. The stripline resonator test system for complex permittivity of a high-frequency printed board substrate according to claim 1, characterized in that: 2 of said high frequency probes (300) are each in electrical communication with a resonant conduction band (601) on the resonator graphics card (600).
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118091260A (en) * | 2024-04-23 | 2024-05-28 | 深圳市鑫龙通信技术有限公司 | Strip line resonance method dielectric constant test equipment and test method |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006177866A (en) * | 2004-12-24 | 2006-07-06 | Kyocera Corp | Dielectric constant measuring method |
| JP2014190717A (en) * | 2013-03-26 | 2014-10-06 | Oki Printed Circuits Co Ltd | Strip line resonator |
| CN104569616A (en) * | 2015-01-29 | 2015-04-29 | 无锡江南计算技术研究所 | System for testing dielectric properties by using strip line testing method |
| DE102016206362A1 (en) * | 2016-04-15 | 2017-10-19 | Conti Temic Microelectronic Gmbh | MEASURING DEVICE AND METHOD FOR MEASURING THE DIELECTRIC PERMITTIVENESS OF A DIELECTRIC MEDIUM |
-
2021
- 2021-12-21 CN CN202111568804.8A patent/CN114252751B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006177866A (en) * | 2004-12-24 | 2006-07-06 | Kyocera Corp | Dielectric constant measuring method |
| JP2014190717A (en) * | 2013-03-26 | 2014-10-06 | Oki Printed Circuits Co Ltd | Strip line resonator |
| CN104569616A (en) * | 2015-01-29 | 2015-04-29 | 无锡江南计算技术研究所 | System for testing dielectric properties by using strip line testing method |
| DE102016206362A1 (en) * | 2016-04-15 | 2017-10-19 | Conti Temic Microelectronic Gmbh | MEASURING DEVICE AND METHOD FOR MEASURING THE DIELECTRIC PERMITTIVENESS OF A DIELECTRIC MEDIUM |
Non-Patent Citations (1)
| Title |
|---|
| 张永华等: "带状线法测试高频印制板基材复介电常数研究", 《印制电路信息》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118091260A (en) * | 2024-04-23 | 2024-05-28 | 深圳市鑫龙通信技术有限公司 | Strip line resonance method dielectric constant test equipment and test method |
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