CN109813734A - A kind of sheeting electromagnetic parameter testing device and method - Google Patents
A kind of sheeting electromagnetic parameter testing device and method Download PDFInfo
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Abstract
The present invention provides a kind of sheeting electromagnetic parameter testing device and method, belongs to microwave testing field.Including two 1, two section of coaxial adapter, 2, two sections of parallel conductor wall microstrip lines 3, common ground connection block 4, sample to be tested 5, conduction band connection sheet 6, flexible foam supporting block 7, lower lock block 8, spring thimble 9, fixture under pressure 10, the groove 17 of mobile platform 12, two of stand 11, two and pedestal 13.Two sections of microstrip lines 3 are connected with two coaxial adapters 1 respectively, and are linearly located on two contour mobile platforms 12 altogether；The sample to be tested 5 is placed in 4 top of common ground connection block and is linearly located between two sections of microstrip lines 3 altogether；The conduction band connection sheet 6 is located at right above sample to be tested.Sheeting electromagnetic parameter testing device provided by the invention and method can be realized the quick fetching of sample to be tested, can execute TRL calibration in sample to be tested two sides, reduce the error of conventional transmission bounce technique test macro, improve test accuracy.
Description
Technical field
A kind of sheeting electromagnetic parameter testing device and method, belong to microwave material the field of test technology, in particular to
Sheeting electromagnetic parameter testing device and method.
Background technique
Superiority based on sheeting structure size and microwave property is widely used in military and civil field.
Opposite complex dielectric permittivity and complex permeability are two electromagnetic parameters for describing sheeting microwave electromagnetic characteristic, and evaluation
The main foundation of sheeting electromagnetic performance superiority and inferiority, therefore the electromagnetic parameter for measuring sheeting is particularly important.
Currently, having carried out a lot of research work to the microwave property measurement of sheeting electromagnetic parameter both at home and abroad, usually
The test method used is transmission bounce technique and the resonance method.The resonance method is point-frequency test method, cannot embody sheeting
Electromagnetic property is with the rule of frequency consecutive variations, therefore common transmission bounce technique is tested.
Transmitting bounce technique is placed in sample to be tested between two sections of transmission lines, and the microwave of sample to be tested is placed with by testing
The reflection coefficient and transmission coefficient of transmission line, calculate the electromagnetic parameter of sample to be tested.Used transmission line type has: band-like
Line, microstrip line, waveguide, coaxial line etc..Waveguide can carry out transmission bounce technique test to sheeting, but cover the survey of ultratvide frequency band
Examination needs the waveguide of multiple corresponding bands, and prepares to sample to be tested more demanding；Coaxial line, which can be realized, surpasses sheeting
Broadband test, but equally exist and prepare more demanding disadvantage to sample to be tested, and sample to be tested is not easy to pick and place.Therefore, sharp
The method for using microstrip line to be tested as transmission line is receive more and more attention.
Test for microwave sheeting electromagnetic parameter, document " Jae-Young Chung.Permittivity and
Permeability Measurements of a Thin Film with Patterned Anisotropy at
Microwave Frequencies, IEEE Transactions on Magnetics, April 2015, Vol.51(4),
Pp.1-7 " constructs corresponding microstrip line test macro with complex permeability for complex dielectric permittivity respectively, to laminated dielectric material
Electromagnetic parameter testing technology studied.But it can not achieve complex dielectric permittivity and measurement while complex permeability, and only
Cable can be calibrated, and can not rule out the influence of coaxial adapter and microstrip line to test result.Document " Hinojosa,
J. Faucon,L. Queffelec,P. and Huret,F. S-parameter broadband measurements of
microstrip lines and extraction of the substrate intrinsic properties,
Microwave and Optical Technology Letters, 30 (1) 65-69 " are using sheeting as Jie of microstrip line
A part of matter substrate or substrate measures, survey while although this method is able to achieve complex dielectric permittivity and complex permeability
Amount, but its sample to be tested preparation process and test macro replacement process are complex.
In conclusion although there are still surveys both at home and abroad about the research of sheeting electromagnetic parameter testing technology
Test agent is difficult to prepare, test macro complexity, calibrates the problems such as not comprehensive enough, it is difficult to it is quickly high to adapt to sheeting electromagnetic parameter
The requirement of accuracy test.
Summary of the invention
The purpose of the present invention is provide a kind of new for defect present in existing sheeting electromagnetic parameter testing technology
Sheeting electromagnetic parameter testing device and method, what the test device and method can be realized sample to be tested facilitates pick-and-place,
The calibration accuracy for improving conventional transmission bounce technique simultaneously reduces the calibration error of test macro, and then improves test accuracy.
For achieving the above object, technical solution of the present invention is as follows:
A kind of sheeting electromagnetic parameter testing device, as shown in figures 1 and 3, including two 1, two section of coaxial adapter parallel
Conductor wall 2, two sections of microstrip lines 3, common ground connection block 4, sample to be tested 5, conduction band connection sheet 6, flexible foam supporting blocks 7, lower lock block
8, spring thimble 9, fixture under pressure 10, the groove 17 of mobile platform 12, two of stand 11, two and pedestal 13.Two sections of micro-strips
Line 3 is connected with two coaxial adapters 1 respectively, and is linearly located on two contour mobile platforms 12 altogether；It is described to test sample
Product 5 are placed in 4 top of common ground connection block and are linearly located between two sections of microstrip lines 3 altogether；The common ground connection block 4 is located at two shiftings
In the groove 17 of moving platform 12；The conduction band connection sheet 6 is located at right above sample to be tested, can be by connecting with fixture under pressure 10
Spring thimble 9 and lower lock block 8 below are in close contact after pushing with microstrip line 3.
It is preferred that two sections of microstrip lines 3 are process by low-k and low-loss medium substrate, base
Have the first metal conduction band 14 on the upside of plate, has metal ground plane 15 on the downside of substrate.Two sections of microstrip lines with corresponding two
The alignment of 12 edge of mobile platform, and two sections of microstrip lines can pass through the mobile close to each other and separation of two mobile platforms 12.
It is preferred that the parallel conductor wall 2 is located at the two sides of coaxial adapter and microstrip line junction, to inhibit
Radiation loss of the junction electromagnetic wave in high frequency.
It is preferred that the common ground connection block 4 is metal material, length is 4 ~ 5mm bigger than sample to be tested length, width
It is 1 ~ 2mm smaller than the width of groove 17, and make chamfering towards the both ends of groove.Common ground connection block can be close with two sections of microstrip lines
It is slided in the groove of two mobile platforms 12 with separation, while the metallic ground of common ground connection block 4 upper surface and microstrip line
Layer 15 is in close contact, to guarantee that two sections of microstrip lines are good altogether in test process.
It is preferred that the depth of the groove 17 is between 0.5 ~ 1 times of 4 length of common ground connection block.
It is preferred that the conduction band connection sheet 6 is 5880 flexible dielectric substrate of Rogers of thickness 0.127mm, by
In its lesser thickness and lower complex dielectric permittivity, influence of the substrate to test can be ignored.Substrate length is longer than sample
Spend big 4 ~ 8mm, width is 4 ~ 6mm smaller than micro belt line width, towards lower lock block one side without the attached layer of metal, towards sample to be tested
Has the second metal conduction band 19 on one side, the second metal conduction band 19 is equal with 14 consistency from top to bottom of the first metal conduction band and width.
It is preferred that the lower lock block 8 is " table " the shape structure made by electromagnetic wave transparent material, as shown in Fig. 2, its four
" table leg " and four angles of conduction band connection sheet 6 are connected and fixed, and flexible foam branch is filled between lower lock block 8 and conduction band connection sheet 6
Bracer 7, flexible foam supporting block 7 have and the comparable electromagnetic parameter of air, thickness than " table leg " of lower lock block height it is big by 0.5 ~
1mm, so that flexible foam supporting block can compress the conduction band of conduction band connection sheet and tight with the conduction band of two sections of microstrip lines after pushing
Contiguity touching.
It is preferred that the microstrip line two sides have convex wall 16, the distance between two convex walls are equal to the width of lower lock block 8
Degree 20, to guarantee the conduction band alignment of the conduction band and two sections of microstrip lines of conduction band connection sheet.
It is preferred that the opposite face of described two mobile platforms 12 is opened there are two pin hole 18, can be inserted into pin into
Row positioning, to guarantee that two sections of microstrip lines can be linearly aligned altogether.
It is preferred that the spring thimble 9 is connected with the fixture under pressure 10 being fixed on stand 11, fixture under pressure can
The conduction band connection sheet 6 that spring thimble 9 stresses on the lower section of lower lock block 8 is pushed down on, to guarantee in test process two sections of microstrip lines
Conduction band contact is good.
It is preferred that the sample to be tested thickness is identical as two sections of microstrip line thickness.
For achieving the above object, the survey of sheeting electromagnetic parameter is carried out using above-mentioned apparatus the present invention also provides a kind of
The method of examination, includes the following steps:
Step 1: two coaxial adapters are separately connected to two ports of vector network analyzer；
Step 2: do not place sample to be tested link block together, adjust mobile platform make the opposite face of two sections of microstrip lines far to
8cm or more carries out open circuit calibration；
Step 3: not placing sample to be tested, common ground connection block is placed in groove, and adjusting mobile platform makes the opposite of two sections of microstrip lines
Face is in close contact, and spring thimble, which pushes lower lock block, fits closely the second metal conduction band and the first metal conduction band, carries out straight-through school
It is quasi-；
Step 4: not placing sample to be tested, common ground connection block is placed in groove, is placed and two sides microstrip line above common ground connection block
Same material, thickness and width, 0.25 times of blank substrate of a length of test frequency range centre frequency corresponding wavelength, adjust movement
Platform is in close contact the opposite face of two sections of microstrip lines and blank substrate two sides, and spring thimble, which pushes lower lock block, leads the second metal
Band and the first metal conduction band fit closely, and carry out transmission line calibration；
Step 5: common ground connection block is placed in groove, places sample to be tested above common ground connection block, and adjusting mobile platform makes two
The opposite face of section microstrip line and sample to be tested two sides are in close contact, and spring thimble, which pushes lower lock block, makes the second metal conduction band and first
Metal conduction band fits closely, and tests and records vector network analyzer reflection coefficient of port loss S11With transmission loss S21；
Step 6: the electricity of sample to be tested is calculated in return loss and transmission loss when according to measured load sample to be tested
Magnetic parameter, calculating process are as follows:
Sample to be tested constitutes microstrip transmission line, there is following equation:
(1)
(2)
Wherein:
(3)
For the complex reflection coefficient at microstrip line and sample to be tested interface, pass through for electromagnetic wave a length oflSample to be tested multiple biography
The complex propagation constant of defeated coefficient, the microstrip transmission line that sample to be tested is constituted is writeable are as follows:
(4)
The effective electromagnetic parameter of the microstrip transmission line of sample to be tested composition can be finally obtained:
(5)
(6)
It is wherein the propagation constant in free space, has, it is wavelength；
According to the corresponding relationship of microstrip line effective electromagnetic parameter and substrate electromagnetic parameter, the true electromagnetism ginseng of sample to be tested can be obtained
Number and:
(7)
(8)
WhereinhFor sample to be tested thickness,wFor the width of the second metal conduction band.After test frequency determines, obtained by measurement
Return loss and transmission loss can solve the electromagnetic parameter of sample to be tested according to formula (7) and (8), i.e., answer magnetic conductance relatively
Rate and opposite complex dielectric permittivity.
A kind of sheeting electromagnetic parameter testing device provided by the invention and method have following features and the utility model has the advantages that
One, bounce technique test macro is transmitted using detachable microstrip line, on the one hand, realize calibration end face from traditional same
Axis adapter position is moved to sample to be tested both sides of the face position, improves the accuracy of calibration；On the other hand, compared to being based on
The transmission bounce technique of coaxial line and waveguide, sample to be tested are easier to pick and place, and provide convenience for test.
Two, common ground connection block 4 is used to improve two sections of microstrip lines 3 and calibration component or sample to be tested in calibration or test process
5 total ground continuity avoids the problem of leading to leakage magnetic field since total ground continuity is bad, reduces the mistake of test macro
Difference improves the test accuracy of electromagnetic parameter.
Three, conduction band connection sheet 6 is used to improve the conduction band electric continuity of two sections of microstrip lines 3 in calibration or test process, and
Same state between conduction band connection sheet and microstrip line 3, sample to be tested 5 is realized by flexible foam supporting block 7 and spring thimble 9
Elastic Contact improves measuring stability.
Detailed description of the invention
Fig. 1 is a kind of right half side three dimensional structure diagram of sheeting electromagnetic parameter testing device provided by the invention.
Fig. 2 is the three dimensional structure diagram of lower lock block provided by the invention, conduction band connection sheet and flexible foam supporting block.
Fig. 3 is a kind of sheeting electromagnetic parameter testing device front view provided by the invention.
Wherein, 1 be two coaxial adapters, 2 for two sections of parallel conductor walls, 3 be two sections of microstrip lines, 4 be common ground connection block,
5 be sample to be tested, 6 be conduction band connection sheet, 7 be flexible foam supporting block, 8 be lower lock block, 9 be spring thimble, 10 be push folder
Tool, 11 be stand, 12 be two mobile platforms, 13 be pedestal, 14 be the first metal conduction band, 15 be metal ground plane, 16 be convex
Wall, 17 for two grooves, 18 be two pin holes, 19 be the second metal conduction band, 20 be lower lock block width.
Specific embodiment
Illustrate embodiments of the present invention below by way of specific specific example, those skilled in the art can be by this specification
Other advantages and efficacy of the present invention can be easily understood for disclosed content.
A kind of sheeting electromagnetic parameter testing device, as shown in figures 1 and 3, including two 1, two section of coaxial adapters
2, two sections of microstrip lines 3 of parallel conductor wall, common ground connection block 4, sample to be tested 5, conduction band connection sheet 6, flexible foam supporting block 7, under
Briquetting 8, spring thimble 9, fixture under pressure 10, the groove 17 of mobile platform 12, two of stand 11, two and pedestal 13.Described two sections
Microstrip line 3 is connected with two coaxial adapters 1 respectively, and is linearly located on two contour mobile platforms 12 altogether；It is described to
Sample 5 is placed in 4 top of common ground connection block and is linearly located between two sections of microstrip lines 3 altogether；The common ground connection block 4 is located at two
In the groove 17 of a mobile platform 12；The conduction band connection sheet 6 is located at right above sample to be tested, can be by connecting with fixture under pressure 10
The spring thimble 9 that connects and lower lock block 8 below are in close contact after pushing with microstrip line 3.
Further, two sections of microstrip lines 3 are process by low-k and low-loss medium substrate, on substrate
Side has the first metal conduction band 14, has metal ground plane 15 on the downside of substrate.Two sections of microstrip lines and corresponding two movements
The alignment of 12 edge of platform, and two sections of microstrip lines can pass through the mobile close to each other and separation of two mobile platforms 12.
Further, the parallel conductor wall 2 is located at the two sides of coaxial adapter and microstrip line junction, to inhibit the company
Place's electromagnetic wave is connect in the radiation loss of high frequency.
Further, the common ground connection block 4 is metal material, and length is 4 ~ 5mm bigger than sample to be tested length, and width is than recessed
Small 1 ~ the 2mm of the width of slot 17, and make chamfering towards the both ends of groove.Common ground connection block can with the close of two sections of microstrip lines and point
From and being slided in the groove of two mobile platforms 12, while the metal ground plane 15 of 4 upper surface of common ground connection block and microstrip line
It is in close contact, to guarantee that two sections of microstrip lines are good altogether in test process.
Further, the depth of the groove 17 is between 0.5 ~ 1 times of 4 length of common ground connection block.
Further, the conduction band connection sheet 6 is 5880 flexible dielectric substrate of Rogers of thickness 0.127mm, due to it
Lesser thickness and lower complex dielectric permittivity, influence of the substrate to test can be ignored.Substrate length is bigger than sample length by 4
~ 8mm, width is 4 ~ 6mm smaller than micro belt line width, towards lower lock block one side without the attached layer of metal, towards the one side of sample to be tested
With the second metal conduction band 19, the second metal conduction band 19 is equal with 14 consistency from top to bottom of the first metal conduction band and width.
Further, the lower lock block 8 is " table " the shape structure made by electromagnetic wave transparent material, as shown in Fig. 2, its four " tables
Leg " and four angles of conduction band connection sheet 6 are connected and fixed, and flexible foam supporting block is filled between lower lock block 8 and conduction band connection sheet 6
7, flexible foam supporting block 7 has and the comparable electromagnetic parameter of air, and thickness is 0.5 ~ 1mm bigger than " table leg " of lower lock block height,
So that flexible foam supporting block can compress the conduction band of conduction band connection sheet and closely connect with the conduction band of two sections of microstrip lines after pushing
Touching.
Further, the microstrip line two sides have convex wall 16, and the distance between two convex walls are equal to the width of lower lock block 8
20, to guarantee the conduction band alignment of the conduction band and two sections of microstrip lines of conduction band connection sheet.
Further, the opposite face of described two mobile platforms 12 is opened there are two pin hole 18, and pluggable pin is determined
Position, to guarantee that two sections of microstrip lines can be linearly aligned altogether.
Further, the spring thimble 9 is connected with the fixture under pressure 10 being fixed on stand 11, and fixture under pressure can be downward
Push the spring thimble 9 stresses on the conduction band connection sheet 6 of 8 lower section of lower lock block, to guarantee the conduction band of two sections of microstrip lines in test process
Contact is good.
Further, the sample to be tested thickness is identical as two sections of microstrip line thickness.
For achieving the above object, the survey of sheeting electromagnetic parameter is carried out using above-mentioned apparatus the present invention also provides a kind of
The method of examination, includes the following steps:
Step 1: two coaxial adapters are separately connected to two ports of vector network analyzer；
Step 2: do not place sample to be tested link block together, adjust mobile platform make the opposite face of two sections of microstrip lines far to
8cm or more carries out open circuit calibration；
Step 3: not placing sample to be tested, common ground connection block is placed in groove, and adjusting mobile platform makes the opposite of two sections of microstrip lines
Face is in close contact, and spring thimble, which pushes lower lock block, fits closely the second metal conduction band and the first metal conduction band, carries out straight-through school
It is quasi-；
Step 4: not placing sample to be tested, common ground connection block is placed in groove, is placed and two sides microstrip line above common ground connection block
Same material, thickness and width, 0.25 times of blank substrate of a length of test frequency range centre frequency corresponding wavelength, adjust movement
Platform is in close contact the opposite face of two sections of microstrip lines and blank substrate two sides, and spring thimble, which pushes lower lock block, leads the second metal
Band and the first metal conduction band fit closely, and carry out transmission line calibration；
Step 5: common ground connection block is placed in groove, places sample to be tested above common ground connection block, and adjusting mobile platform makes two
The opposite face of section microstrip line and sample to be tested two sides are in close contact, and spring thimble, which pushes lower lock block, makes the second metal conduction band and first
Metal conduction band fits closely, and tests and records vector network analyzer reflection coefficient of port loss S11With transmission loss S21；
Step 6: the electricity of sample to be tested is calculated in return loss and transmission loss when according to measured load sample to be tested
Magnetic parameter, calculating process are as follows:
Sample to be tested constitutes microstrip transmission line, there is following equation:
(1)
(2)
Wherein:
(3)
For the complex reflection coefficient at microstrip line and sample to be tested interface, pass through for electromagnetic wave a length oflSample to be tested multiple biography
The complex propagation constant of defeated coefficient, the microstrip transmission line that sample to be tested is constituted is writeable are as follows:
(4)
The effective electromagnetic parameter of the microstrip transmission line of sample to be tested composition can be finally obtained:
(5)
(6)
It is wherein the propagation constant in free space, has, it is wavelength；
According to the corresponding relationship of microstrip line effective electromagnetic parameter and substrate electromagnetic parameter, the true electromagnetism ginseng of sample to be tested can be obtained
Number and:
(7)
(8)
WhereinhFor sample to be tested thickness,wFor the width of the second metal conduction band.After test frequency determines, obtained by measurement
Return loss and transmission loss can solve the electromagnetic parameter of sample to be tested according to formula (7) and (8), i.e., answer magnetic conductance relatively
Rate and opposite complex dielectric permittivity.
The above-described embodiments merely illustrate the principles and effects of the present invention, and is not intended to limit the present invention.It is any ripe
The personage for knowing this technology all without departing from the spirit and scope of the present invention, carries out modifications and changes to above-described embodiment.Cause
This, institute is complete without departing from the spirit and technical ideas disclosed in the present invention by those of ordinary skill in the art such as
At all equivalent modifications or change, should be covered by the claims of the present invention.
Claims (12)
1. a kind of sheeting electromagnetic parameter testing device, including two 1, two section of coaxial adapter, 2, two sections of parallel conductor walls are micro-
Band line 3, common ground connection block 4, sample to be tested 5, conduction band connection sheet 6, flexible foam supporting block 7, lower lock block 8, spring thimble 9, under
Press fixture 10, the groove 17 of mobile platform 12, two of stand 11, two and pedestal 13；Two sections of microstrip lines 3 are same with two respectively
Axis adapter 1 is connected, and is linearly located on two contour mobile platforms 12 altogether；The sample to be tested 5 is placed in common ground connection
Above block 4 and it is total to linearly between two sections of microstrip lines 3；The common ground connection block 4 is located at the groove of two mobile platforms 12
In 17；The conduction band connection sheet 6 is located at right above sample to be tested, can pass through the spring thimble 9 connecting with fixture under pressure 10 and its
The lower lock block 8 of lower section is in close contact after pushing with microstrip line 3.
2. a kind of sheeting electromagnetic parameter testing device according to claim 1, characterized in that two sections of microstrip lines
3 are process by low-k and low-loss medium substrate, have the first metal conduction band 14 on the upside of substrate, and substrate downside is attached
There is metal ground plane 15；Two sections of microstrip lines are aligned with 12 edge of corresponding two mobile platforms, and two sections of microstrip lines can lead to
Cross the mobile and close to each other of two mobile platforms 12 and separation.
3. a kind of sheeting electromagnetic parameter testing device according to claim 1, characterized in that the parallel conductor wall
2 are located at the two sides of coaxial adapter and microstrip line junction.
4. a kind of sheeting electromagnetic parameter testing device according to claim 1, characterized in that the common ground connection block
4 be metal material, and length is 4 ~ 5mm bigger than sample to be tested length, and width is 1 ~ 2mm smaller than the width of groove 17, and towards groove
Make chamfering in both ends；Common ground connection block can be sliding in the groove of two mobile platforms 12 with the close and separation of two sections of microstrip lines
It is dynamic, while the metal ground plane 15 of 4 upper surface of common ground connection block and microstrip line is in close contact.
5. a kind of sheeting electromagnetic parameter testing device according to claim 1, characterized in that the depth of the groove 17
Degree is between 0.5 ~ 1 times of 4 length of common ground connection block.
6. a kind of sheeting electromagnetic parameter testing device according to claim 1, characterized in that the conduction band connection sheet
6 be 5880 flexible dielectric substrate of Rogers of thickness 0.127mm, and length is 4 ~ 8mm bigger than sample length, and width compares micro belt line width
Small 4 ~ 6mm, towards lower lock block one side without the attached layer of metal, have the second metal conduction band 19 towards the one side of sample to be tested, the
Two metal conduction bands 19 are equal with 14 consistency from top to bottom of the first metal conduction band and width.
7. a kind of sheeting electromagnetic parameter testing device according to claim 1, characterized in that the lower lock block 8 is
Four angles of " table " the shape structure made by electromagnetic wave transparent material, four " table leg " and conduction band connection sheet 6 are connected and fixed, lower lock block 8
Flexible foam supporting block 7 is filled between conduction band connection sheet 6, flexible foam supporting block 7 has and the comparable electromagnetism ginseng of air
Number, thickness are 0.5 ~ 1mm bigger than " table leg " of lower lock block height.
8. a kind of sheeting electromagnetic parameter testing device according to claim 1, characterized in that the microstrip line two sides
With convex wall 16, the distance between two convex walls are equal to the width 20 of lower lock block 8.
9. a kind of sheeting electromagnetic parameter testing device according to claim 1, characterized in that described two movements are flat
The opposite face of platform 12 is opened there are two pin hole 18, and pluggable pin is positioned.
10. a kind of sheeting electromagnetic parameter testing device according to claim 1, characterized in that the spring thimble 9
It is connected with the fixture under pressure 10 being fixed on stand 11, fixture under pressure can push down on spring thimble 9 and stress on 8 lower section of lower lock block
Conduction band connection sheet 6.
11. a kind of sheeting electromagnetic parameter testing device according to claim 1, characterized in that the sample to be tested
Thickness is identical as two sections of microstrip line thickness.
12. according to claim 1 to the method that 11 any one described devices carry out sheeting electromagnetic parameter testing, feature
It is, includes the following steps:
Step 1: two coaxial adapters are separately connected to two ports of vector network analyzer；
Step 2: do not place sample to be tested link block together, adjust mobile platform make the opposite face of two sections of microstrip lines far to
8cm or more carries out open circuit calibration；
Step 3: not placing sample to be tested, common ground connection block is placed in groove, and adjusting mobile platform makes the opposite of two sections of microstrip lines
Face is in close contact, and spring thimble, which pushes lower lock block, fits closely the second metal conduction band and the first metal conduction band, carries out straight-through school
It is quasi-；
Step 4: not placing sample to be tested, common ground connection block is placed in groove, is placed and two sides microstrip line above common ground connection block
Same material, thickness and width, 0.25 times of blank substrate of a length of test frequency range centre frequency corresponding wavelength, adjust movement
Platform is in close contact the opposite face of two sections of microstrip lines and blank substrate two sides, and spring thimble, which pushes lower lock block, leads the second metal
Band and the first metal conduction band fit closely, and carry out transmission line calibration；
Step 5: common ground connection block is placed in groove, places sample to be tested above common ground connection block, and adjusting mobile platform makes two
The opposite face of section microstrip line and sample to be tested two sides are in close contact, and spring thimble, which pushes lower lock block, makes the second metal conduction band and first
Metal conduction band fits closely, and tests and records vector network analyzer reflection coefficient of port loss S11With transmission loss S21；
Step 6: the electricity of sample to be tested is calculated in return loss and transmission loss when according to measured load sample to be tested
Magnetic parameter, calculating process are as follows:
Sample to be tested constitutes microstrip transmission line, there is following equation:
(1)
(2)
Wherein:
(3)
For the complex reflection coefficient at microstrip line and sample to be tested interface, pass through for electromagnetic wave a length oflSample to be tested multiple biography
The complex propagation constant of defeated coefficient, the microstrip transmission line that sample to be tested is constituted is writeable are as follows:
(4)
The effective electromagnetic parameter of the microstrip transmission line of sample to be tested composition can be finally obtained:
(5)
(6)
It is wherein the propagation constant in free space, has, it is wavelength；
According to the corresponding relationship of microstrip line effective electromagnetic parameter and substrate electromagnetic parameter, the true electromagnetism ginseng of sample to be tested can be obtained
Number and:
(7)
(8)
WhereinhFor sample to be tested thickness,wFor the width of the second metal conduction band；After test frequency determines, obtained by measurement
Return loss and transmission loss can solve the electromagnetic parameter of sample to be tested according to formula (7) and (8), i.e., answer magnetic conductance relatively
Rate and opposite complex dielectric permittivity.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113281572A (en) * | 2021-05-20 | 2021-08-20 | 华中科技大学 | Method and system for testing microwave complex dielectric constant and complex permeability of material |
| CN113504454A (en) * | 2021-06-07 | 2021-10-15 | 深圳市时代速信科技有限公司 | Calibration method of analyzer and chip test method and system |
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| CN113504454A (en) * | 2021-06-07 | 2021-10-15 | 深圳市时代速信科技有限公司 | Calibration method of analyzer and chip test method and system |
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