CN108132264A - A kind of wave filter finished product defect inspection method method - Google Patents
A kind of wave filter finished product defect inspection method method Download PDFInfo
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- CN108132264A CN108132264A CN201711367832.7A CN201711367832A CN108132264A CN 108132264 A CN108132264 A CN 108132264A CN 201711367832 A CN201711367832 A CN 201711367832A CN 108132264 A CN108132264 A CN 108132264A
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- detector
- wave filter
- gripper jaw
- ray
- filtering body
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/03—Investigating materials by wave or particle radiation by transmission
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/646—Specific applications or type of materials flaws, defects
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention discloses a kind of wave filter finished product defect inspection method methods, include the following steps：A, filtering body is mounted on the gripper jaw in detector cavity, sealing cover is covered to and opened the LED light source of detector inside cavity；B, it takes pictures using the intrinsic removable camera of detector is comprehensive to filtering body progress, gripper jaw is slowly rotated while taking pictures；C, the internal LED light source of detector cavity is closed, and filtering body is scanned on each surface using X ray, and light sensor receives X ray；D, control system receives the picture data detected, X-ray line transmission data, and carries out data analysis recombination to the data of acquisition and export；E, the specific data conversion of detection is shown into image by display, the present invention is adopted carries out visual examination and internal check to detector ontology, the external, internal of detector ontology is comprehensively detected in the case where not needing to disassemble, and is capable of detecting when the undetectable product defects of naked eyes.
Description
Technical field
The present invention relates to wave filter manufacturing process technology field, specially a kind of wave filter finished product defect inspection method method.
Background technology
Wave filter is the device being filtered to wave as its name suggests." wave " is a very extensive physical concept,
Electronic technology field, " wave " are narrowly confined to the process of the value for refering in particular to describe various physical quantitys fluctuations at any time.
The process is converted into the function of time of voltage or electric current by the effect of various kinds of sensors, referred to as various physical quantitys when
Between waveform or referred to as signal.
With the fast development of the communication technology, the electric property and stability of communication class device are more and more important, including chamber
Communication class device including fluid filter, combiner and coupler needs metal cover board being fixed on above cavity, forms sealing
Inner cavity avoids the signal leakage in cavity between different single-chambers from causing the electric property of device abnormal.
Invention content
It is adopted the purpose of the present invention is to provide one kind and visual examination and internal check is carried out to detector ontology, be not required to
The external, internal of detector ontology is comprehensively detected in the case of disassembling, and is capable of detecting when that naked eyes can not be examined
A kind of wave filter finished product defect inspection method method of the product defects of survey, to solve the problems mentioned in the above background technology.
To achieve the above object, the present invention provides following technical solution：A kind of wave filter finished product defect inspection method method,
It is characterized in that：Include the following steps：
A, filtering body is mounted on the gripper jaw in detector cavity, sealing cover is covered and is opened in detector cavity
The LED light source in portion；
B, it takes pictures using the intrinsic removable camera of detector is comprehensive to filtering body progress, is pressed from both sides while taking pictures
Pawl is held slowly to be rotated；
C, the internal LED light source of detector cavity is closed, and filtering body is scanned on each surface using X ray, light
Line inductor receives X ray；
D, control system receives the picture data detected, X-ray line transmission data, and carries out data analysis weight to the data of acquisition
Group simultaneously exports；
E, the specific data conversion of detection is shown into image by display.
Preferably, by wave filter be mounted on gripper jaw on, gripper jaw clamps the fixed edge of detector both sides, make gripper jaw with
The contact surface of wave filter reaches minimum.
Preferably, the intrinsic removable camera of the detector is fully open, and the LED light source in detector cavity inclines
For oblique illumination on the surface of filter detection, light irradiation and the angle in filter detection face are 45 °, and video camera is from one side to another
One surface of the slow motion scan filtering body in side, when camera-scanning terminates a surface of wave filter, gripper jaw delays
The one side that slow rotation does not shoot wave filter is directed at camera lens, the slow motion scan of video camera, according to this program by filtering body
All sides all shoot.
Preferably, the LED light source in the detector cavity is closed, and the sealing cover of detector ontology is in detection process
Closed state starts x ray generator, and a face of x ray generator irradiation filtering body is then shut off, and gripper jaw will be filtered
Another of wave device turns to x ray generator for detection faces, is shone by each of x ray generator by wave filter
It penetrates.
Preferably, the control system shoots video camera image, the data of x ray generator irradiation, data conversion
Device is recombinated by digital signal recombination module, is shown by display into digital signal.
Compared with prior art, the beneficial effects of the invention are as follows：
（1）The present invention is adopted carries out visual examination and internal check to detector ontology, will inspection in the case where not needing to disassemble
It surveys the external, internal of device ontology comprehensively to be detected, and is capable of detecting when the undetectable product defects of naked eyes；
（2）It is 45 ° that light, which is irradiated with the angle in filter detection face, and the LED light source in detection process is avoided to be radiated at wave filter
Upper surface appearance is reflective to cause video camera shooting unclear；
（3）One face of x ray generator irradiation filtering body is then shut off, and X ray is avoided to damage human body.
Description of the drawings
Fig. 1 is detector body construction schematic diagram of the present invention；
Fig. 2 is detector containment portion structure diagram of the present invention；
Fig. 3 is detector inside cavity structure diagram of the present invention.
In figure：1st, detector ontology；2nd, sealing cover；3rd, detector cavity；4th, gripper jaw；5th, light sensor；6th, it shows
Device；7th, control system.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other without making creative work
Embodiment shall fall within the protection scope of the present invention.
It please refers to Fig.1, Fig. 2 or Fig. 3, the present invention provide a kind of technical solution：A kind of wave filter finished product defect inspection method,
Include the following steps：
A, filtering body is mounted on the gripper jaw in detector cavity, sealing cover 2 is covered and opens detector cavity 3
Internal LED light source；
B, it takes pictures using the removable camera in detector ontology 1 is comprehensive to filtering body progress, while taking pictures
Gripper jaw 4 is slowly rotated；
C, the internal LED light source of detector cavity 3 is closed, and filtering body is scanned on each surface using X ray, light
Line inductor receives X ray；
D, control system 7 receives the picture data detected, X-ray line transmission data, and carries out data analysis to the data of acquisition
It recombinates and exports；
E, the specific data conversion of detection is shown into image by display 6.
Wave filter is mounted on gripper jaw 4, gripper jaw 4 clamps the fixed edge of detector both sides, makes gripper jaw 4 and filtering
The contact surface of device reaches minimum.
Removable camera in detector ontology 1 is fully open, and the LED light source oblique illumination in detector cavity 3 exists
The surface of filter detection, light irradiation and the angle in filter detection face are 45 °, and the LED light source in detection process is avoided to shine
Penetrate wave filter upper surface occur it is reflective cause video camera shooting it is unclear, video camera is from one side to the slow motion scan in another side
One surface of filtering body, when camera-scanning terminates a surface of wave filter, gripper jaw 4 is slowly rotated wave filter
The one side alignment camera lens not shot, the slow motion scan of video camera are whole by all sides of filtering body according to this program
Shooting.
LED light source in detector cavity 3 is closed, and the sealing cover 2 of detector ontology 1, which is in, in detection process closes shape
State avoids X ray from damaging human body, starts x ray generator, and x ray generator irradiates a face of filtering body
Be then shut off, gripper jaw 4 by wave filter another for detection faces turn to x ray generator, by x ray generator will filter
Each of wave device is irradiated, by comprehensive irradiation to filtering body come Fault detection filter internal structure, external structure
With the presence or absence of defect.
Image that control system 7 shoots video camera, the data of x ray generator irradiation, data converter are believed into number
Number, recombinated by digital signal recombination module, by display show 6 show come, by by the data conversion detected into more
Intuitive image is presented.
In conclusion the present invention is adopted carries out visual examination and internal check to detector ontology, do not needing to what is disassembled
In the case of the external, internal of detector ontology is comprehensively detected, and be capable of detecting when the undetectable product of naked eyes
Defect.
The beneficial effects of the invention are as follows：
（1）The present invention is adopted carries out visual examination and internal check to detector ontology, will inspection in the case where not needing to disassemble
It surveys the external, internal of device ontology comprehensively to be detected, and is capable of detecting when the undetectable product defects of naked eyes；
（2）It is 45 ° that light, which is irradiated with the angle in filter detection face, and the LED light source in detection process is avoided to be radiated at wave filter
Upper surface appearance is reflective to cause video camera shooting unclear；
（3）One face of x ray generator irradiation filtering body is then shut off, and X ray is avoided to damage human body.
It although an embodiment of the present invention has been shown and described, for the ordinary skill in the art, can be with
Understanding without departing from the principles and spirit of the present invention can carry out these embodiments a variety of variations, modification, replace
And modification, the scope of the present invention is defined by the appended.
Claims (5)
1. a kind of wave filter finished product defect inspection method, it is characterised in that：Include the following steps：
A, filtering body is mounted on the gripper jaw in detector cavity, by sealing cover（2）It covers and opens detector chamber
Body（3）Internal LED light source；
B, using detector ontology（1）Interior removable camera is comprehensive to filtering body progress to take pictures, and that takes pictures is same
When gripper jaw（4）Slowly rotated；
C, detector cavity（3）Internal LED light source close, filtering body is scanned on each surface using X ray,
Light sensor receives X ray；
D, control system（7）The picture data detected, X-ray line transmission data are received, and data point are carried out to the data of acquisition
Analysis is recombinated and is exported；
E, pass through display（6）The specific data conversion of detection is shown into image.
2. a kind of wave filter finished product defect inspection method according to claim 1, it is characterised in that：Further include following step
Suddenly：Wave filter is mounted on gripper jaw（4）On, gripper jaw（4）The fixed edge of detector both sides is clamped, makes gripper jaw（4）With filter
The contact surface of wave device reaches minimum.
3. a kind of wave filter finished product defect inspection method according to claim 1, it is characterised in that：The detector ontology
（1）Interior removable camera is fully open, detector cavity（3）Interior LED light source oblique illumination is in the table of filter detection
Face, light irradiation and the angle in filter detection face are 45 °, and video camera is from one side to the slow motion scan wave filter sheet in another side
One surface of body, when camera-scanning terminates a surface of wave filter, gripper jaw（4）Slowly rotation does not shoot wave filter
One side alignment camera lens, the slow motion scan of video camera all shoots all sides of filtering body according to this program.
4. a kind of wave filter finished product defect inspection method according to claim 1, it is characterised in that：The detector cavity
（3）Interior LED light source is closed, detector ontology in detection process（1）Sealing cover（2）It is closed, starts X ray hair
Raw device, a face of x ray generator irradiation filtering body are then shut off, gripper jaw（4）Another by wave filter be
Detection faces turn to x ray generator, are irradiated by each of x ray generator by wave filter.
5. a kind of wave filter finished product defect inspection method according to claim 1, it is characterised in that：The control system
（7）By the image of video camera shooting, the data of x ray generator irradiation, data converter is believed into digital signal by number
The recombination of number recombination module, is shown by display（6）It shows to come.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711367832.7A CN108132264A (en) | 2017-12-19 | 2017-12-19 | A kind of wave filter finished product defect inspection method method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711367832.7A CN108132264A (en) | 2017-12-19 | 2017-12-19 | A kind of wave filter finished product defect inspection method method |
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| Publication Number | Publication Date |
|---|---|
| CN108132264A true CN108132264A (en) | 2018-06-08 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711367832.7A Pending CN108132264A (en) | 2017-12-19 | 2017-12-19 | A kind of wave filter finished product defect inspection method method |
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07294450A (en) * | 1994-04-27 | 1995-11-10 | Oki Electric Ind Co Ltd | Soldering inspection method for high density surface mounting substrate |
| CN102589441A (en) * | 2012-01-11 | 2012-07-18 | 华中科技大学 | Fully-automatic nondestructive measurement system and measurement method for phenotype parameters of potted rice |
| JP5351925B2 (en) * | 2011-04-05 | 2013-11-27 | 株式会社日立製作所 | Inspection device and inspection method for long member for transfer mechanism including steel cord |
| CN104458753A (en) * | 2014-11-04 | 2015-03-25 | 航天科工防御技术研究试验中心 | Method for analyzing physical characteristics of semiconductor device |
| CN104655573A (en) * | 2015-01-22 | 2015-05-27 | 浙江大学 | High-spectrum scanning system for canopy of side surface of plant |
| CN104730079A (en) * | 2015-03-10 | 2015-06-24 | 盐城市圣泰阀门有限公司 | Defect detection system |
| CN106796179A (en) * | 2014-09-05 | 2017-05-31 | 株式会社斯库林集团 | Check device and inspection method |
| CN107024475A (en) * | 2016-02-02 | 2017-08-08 | 意力(广州)电子科技有限公司 | Touch panel automatic checkout equipment based on automatic optics inspection program |
-
2017
- 2017-12-19 CN CN201711367832.7A patent/CN108132264A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07294450A (en) * | 1994-04-27 | 1995-11-10 | Oki Electric Ind Co Ltd | Soldering inspection method for high density surface mounting substrate |
| JP5351925B2 (en) * | 2011-04-05 | 2013-11-27 | 株式会社日立製作所 | Inspection device and inspection method for long member for transfer mechanism including steel cord |
| CN102589441A (en) * | 2012-01-11 | 2012-07-18 | 华中科技大学 | Fully-automatic nondestructive measurement system and measurement method for phenotype parameters of potted rice |
| CN106796179A (en) * | 2014-09-05 | 2017-05-31 | 株式会社斯库林集团 | Check device and inspection method |
| CN104458753A (en) * | 2014-11-04 | 2015-03-25 | 航天科工防御技术研究试验中心 | Method for analyzing physical characteristics of semiconductor device |
| CN104655573A (en) * | 2015-01-22 | 2015-05-27 | 浙江大学 | High-spectrum scanning system for canopy of side surface of plant |
| CN104730079A (en) * | 2015-03-10 | 2015-06-24 | 盐城市圣泰阀门有限公司 | Defect detection system |
| CN107024475A (en) * | 2016-02-02 | 2017-08-08 | 意力(广州)电子科技有限公司 | Touch panel automatic checkout equipment based on automatic optics inspection program |
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Application publication date: 20180608 |