CN105911355B - A kind of probe apparatus of impedance detection - Google Patents
A kind of probe apparatus of impedance detection Download PDFInfo
- Publication number
- CN105911355B CN105911355B CN201610380695.XA CN201610380695A CN105911355B CN 105911355 B CN105911355 B CN 105911355B CN 201610380695 A CN201610380695 A CN 201610380695A CN 105911355 B CN105911355 B CN 105911355B
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- Prior art keywords
- fixed
- probe assembly
- fixed structure
- probe
- chassis
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Abstract
The present invention discloses a kind of probe apparatus of impedance detection,Including chassis,The first fixed structure and the second fixed structure of vertical chassis setting,At least one first probe assembly and at least one second probe assembly are separately positioned on the end of first fixed structure and the end of the second fixed structure,Second probe assembly and the first probe assembly correspond impedance opposite and that cooperation is for detecting wiring board,First fixed structure is fixed on chassis,Second fixed structure is movably disposed at by driving device on chassis,And at least two first lifting gear,It is moved up and down for respectively driving the first probe assembly and the second probe assembly,Convenient for when to the impedance detection of different-thickness wiring board,Adjust the height of the first probe assembly and the second probe assembly at any time according to the thickness of wiring board,So that the first probe assembly and the second probe assembly are contacted with the surface of wiring board,And the impedance detection of wiring board is completed under the cooperation of two probe assemblies.
Description
Technical field
The present invention relates to the detection technique fields of wiring board impedance, and in particular to a kind of probe apparatus of impedance detection.
Background technology
In the prior art, it after the circuit for preparing required shape in the circuit board, needs to pop one's head in line using impedance detection
Circuit on the plate of road is detected, and judges whether the circuit on wiring board reaches requirement with this testing result.
Chinese patent literature CN203385768U discloses a kind of impedance detection probe apparatus of wiring board, including has opening
Shell upward, the upper cover being arranged on shell nozzle；Two probe assemblies being arranged in shell, probe assembly include electricity
Probe and connecting terminal in cable ends is arranged in cable, and the end of separate cable one end of probe is located at outside shell, wiring
Terminal is located at outside shell；And the regulating device for adjusting spacing between two probes.
Regulating device includes having positive and negative tooth lead screw, two sliding blocks, two fixed blocks, rotating wheel and locking device.Wherein,
The both ends of forward lead screw are fixed on by a fixed block in inner walls respectively, and a sliding block is arranged in lead screw orthodontic part
On, another sliding block is arranged on the anti-tooth part of lead screw, and two probes are separately fixed on a sliding block；Rotating wheel is fixed on
On lead screw, and between two sliding blocks, locking device is arranged in rotating wheel, the rotation for limiting rotating wheel.
The probe apparatus of the impedance detection of above structure needs people when needing to adjust the spacing between two probes
Manual rotation rotating wheel, so drive lead screw rotation so that be arranged on lead screw sliding block movement, come change two probes it
Between spacing, when the spacing between two probes reaches necessary requirement, with locking device limit rotating wheel rotation so that two
A probe keeps above-mentioned required spacing.But this impedance probe device, between can only realizing between adjusting two probes
Away from if circuit plate thickness to be detected is inconsistent, it is difficult to adjust two spacing between probe and wiring board, and then influence
The testing result of probe apparatus.
Invention content
Therefore, technical problem to be solved by the present invention lies in the impedance detection probe apparatus of wiring board in the prior art is difficult
To adjust the spacing between probe and wiring board.
For this purpose, the present invention provides a kind of probe apparatus of impedance detection, including
Chassis；
First fixed structure is arranged perpendicular to the chassis, and bottom is fixed on the chassis；
At least one first probe assembly, is vertically arranged on the end of the first fixed structure；
Second fixed structure, it is parallel with the first fixed structure, the bottom is movably disposed at by driving device
On disk；
At least one second probe assembly is vertically arranged on the end of second fixed structure, is visited with described first
Head assembly correspondingly with respect to and coordinate impedance for detecting wiring board；Under the movement of second fixed structure, band
Second probe assembly is moved to move towards or away from first probe assembly direction；
At least two first lifting gears, at least one first lifting gear are arranged in the first fixed structure
On end, and at least another described first lifting gear is arranged on the end of second fixed structure, for driving respectively
It moves first probe assembly and the second probe assembly vertically moves up and down.
The probe apparatus of above-mentioned impedance detection further includes at least two first connecting plates, and at least one described first connects
Fishplate bar is fixed on the first fixed structure, and at least another described first connecting plate is fixed on second fixed structure
On；
Wherein, the one end for first connecting plate being fixed on the first fixed structure stretches out in described first and fixes
Structure setting has one end of first probe assembly, forms the first side installation space with the first fixed structure, at least
One first lifting gear is arranged in the installation space of first side, and is fixed on first connecting plate；
The one end for first connecting plate being fixed on second fixed structure stretches out in second fixed structure
It is provided with one end of second probe assembly, the second side installation space is formed with second fixed structure, it is at least another
A first lifting gear is arranged in the installation space of second side, and is fixed on first connecting plate.
The probe apparatus of above-mentioned impedance detection, first lifting gear include
First track plates are vertically arranged on the end wall surface of the first fixed structure or the second fixed structure；
First sliding block is slidably arranged on first track plates；
Rebound is vertically arranged, and one side wall is fixed on first sliding block, and first probe is fixed on another side wall
Component or the second probe assembly；
First driver is fixed on first connecting plate, and drive shaft is connected to institute across first connecting plate
State rebound.
The probe apparatus of above-mentioned impedance detection, first probe assembly are two, and second probe assembly is two
A, two first probe assemblies are separately fixed on the both ends of the first fixed structure；Two second probes
Component is separately fixed on the both ends of second fixed structure.
The probe apparatus of above-mentioned impedance detection, second fixed structure include
Level board, first connecting plate are fixed on level board；
Two cant boards, are separately fixed on the both ends of the level board, and are extended downwardly perpendicular to the level board,
Second probe assembly is mounted on the wall outer surface of the cant board.
The probe apparatus of above-mentioned impedance detection, the driving device include
Mounting plate, vertical with the level board and outside the level board, bottom is fixed on the chassis；
Screw component is located at the side opposite with the first fixed structure of second fixed structure, including lead screw
With the nut block being set on the lead screw, the nut block is fixed on the lower section of level board, and the lead screw sequentially passes through described
The lower section of mounting plate, the level board, and end is stretched into the through-hole being opened on the first fixed structure；
Second driver is fixed on the mounting plate, for driving the lead screw to rotate；
Rotation limitation component, rotates in a circumferential direction for limiting nut block under the drive of the lead screw.
The probe apparatus of above-mentioned impedance detection, the rotation limitation component include
Two the second track plates, are vertically arranged and are parallel to the lead screw, and the bottom of two second track plates is fixed
On the chassis, and positioned at the both sides of the lead screw；
At least two second sliding blocks, at least one second sliding block are slidably arranged on second track plates,
The both ends bottom of the lower section of the level board is respectively fixed at least one second sliding block.
The probe apparatus of above-mentioned impedance detection opens up at least two first through hole on the chassis；
There is the protrusion extended downwardly, two protrusions to be located at one at the bottom both ends of the first fixed structure
In the first through hole, so that first probe assembly is located in the first through hole；
Two cant boards of second fixed structure are located in a first through hole；So that described
Two probe assemblies are located in the first through hole.
The probe apparatus of above-mentioned impedance detection further includes rotating device, for driving the chassis to drive described first
Probe assembly and the second probe assembly rotate in the horizontal direction.
The probe apparatus of above-mentioned impedance detection, the rotating device include
Rotating disk, it is parallel with the chassis；
At least one connecting pole, bottom are fixed on the chassis, and top is fixed on the bottom of the rotating disk；
Fixed block；
Third driver is fixed on the fixed block, and rotation axis is connected to the rotating disk across the fixed block.
The probe apparatus of above-mentioned impedance detection further includes the second lifting gear, for driving the fixed block to drive institute
Chassis is stated to move up and down.
The probe apparatus of above-mentioned impedance detection, second lifting gear include
Third track plates are two, are vertically arranged；
Third sliding block is two, is slidably arranged in respectively on the third track plates；
Third fixed structure, is vertically arranged, and side is fixed on the third sliding block, and the other side is fixed on the fixed block
On；
Fourth drive, for driving the third fixed structure to be slided on the third track plates.
Technical solution provided by the invention, has the following advantages that：
1. the probe apparatus of impedance detection provided by the invention, including chassis, first be vertically arranged on chassis is fixed
It is solid that structure and the second fixed structure, at least one first probe assembly and at least one second probe assembly are separately positioned on first
Determine on the end of structure and the end of the second fixed structure, the second probe assembly corresponds opposite and matches with the first probe assembly
It shares in the impedance of detection wiring board, first fixed structure is fixed on chassis, and the second fixed structure is removable by driving device
It is arranged on chassis dynamicly and at least two first lifting gears, for respectively driving the first probe assembly and the second probe
Component moves up and down, and convenient for when to the impedance detection of different-thickness wiring board, the is adjusted at any time according to the thickness of wiring board
The height of one probe assembly and the second probe assembly so that the first probe assembly and the surface of the second probe assembly and wiring board connect
It touches, and completes the impedance detection of wiring board under the cooperation of two probe assemblies.
2. the probe apparatus of impedance detection provided by the invention further includes at least two first connecting plates, is separately fixed at
On first fixed structure and the second fixed structure, the one end for the first connecting plate being fixed on first fixed structure stretches out in first
Fixed structure is provided with one end of the first probe assembly, and the first side installation space is formed with first fixed structure, at least one
First lifting gear is arranged in the first side installation space, and is fixed on first connecting plate；It is fixed on the second fixed knot
One end of the first connecting plate on structure stretches out in one end that the second fixed structure is provided with the second probe assembly, with the second fixed knot
It is configured to the second side installation space, at least another first lifting gear is arranged in the second side installation space, and fixed
On first connecting plate.
The setting of at least two first connecting plates so that first be fixed on the first connecting plate on first fixed structure
Lifting gear is located at the top of the first probe assembly, the first lifting dress being fixed on the first connecting plate on the second fixed structure
Setting in the top of the second probe assembly, the first probe assembly or the second probe assembly is driven to lift convenient for the first lifting gear
Movement.
3. the probe apparatus of impedance detection provided by the invention, the first probe assembly is two, and the second probe assembly is two
A, two first probe assemblies are separately fixed on the both ends of the first fixed structure；Two second probes
Component is separately fixed on the both ends of second fixed structure.
When being detected to the impedance of wiring board, first probe assembly completes line with the second probe assembly of unification
The testing impedance of a location point on the plate of road, two the second probe assemblies of setting and two the first probe groups in this embodiment
Part is realized simultaneously to 2 points of progress testing impedances at different location on wiring board, improves testing efficiency；Meanwhile driving device
When driving the movement of the second fixed structure, drive two the second probe assemblies simultaneously towards or far from the first probe assembly direction
It is mobile, it is conveniently adjusted spacing of two the second probe assemblies respectively between corresponding first probe assembly.
4. the probe apparatus for the impedance detection that the present invention improves, the second fixed structure includes level board and two cant boards,
First connecting plate is fixed on level board, and two cant boards are separately fixed on the both ends of level board, and perpendicular to level board
It extends downwardly, the second probe assembly is mounted on the wall outer surface of cant board.That is, level board and two cant boards are formed
" several " font installs second probe assembly respectively on the outer surface of the vertical plates on both sides of "Ji" type.
Drive level board when being moved on chassis in driving device, drive is arranged on two cant board wall outer surfaces
Second probe assembly is whole to be moved towards or away from the first probe assembly direction, in the confined space on chassis, drive
Multiple second probe assemblies move on chassis simultaneously so that probe apparatus carries out impedance to multiple location points on wiring board simultaneously
Detection improves the detection efficiency of probe apparatus, and makes compact-sized, the occupied space smaller of entire probe apparatus.
5. the probe apparatus of impedance detection provided by the invention, start at least two first through hole on chassis, first fixes
There is the protrusion extended downwardly, two protrusions to be located in a first through hole at the bottom both ends of structure, so that the first probe
Component is located in first through hole；Two cant boards of the second fixed structure are located in a first through hole；So that second visits
Head assembly is located in first through hole.When driving device drives the movement of the second fixed structure, the moving range of the second probe assembly
It is limited in first through hole；Meanwhile first probe assembly and the second probe assembly pass through first through hole and then touch to be checked
The surface for surveying wiring board, to be detected to the impedance of wiring board so that the first probe assembly and the second probe assembly are on chassis 1
More compact, the space occupied smaller of upper arrangement.
6. the probe apparatus of impedance detection provided by the invention further includes rotating device, for driving chassis with first
Probe assembly and the second probe assembly rotate in the horizontal direction, and further, rotating device includes rotating disk, connecting pole, consolidates
Determine block and third driver, wherein rotating disk is parallel with chassis, and the top of connecting pole is fixed on the rotating pan, and bottom is fixed on bottom
On disk, third driver is fixed on fixed block, and rotation axis passes through fixed block connection and rotating disk.The driving rotation of third driver
The first probe assembly and the second probe assembly being arranged on driven by rotary disc bottom and chassis rotate in the horizontal direction, realize to wiring board
Location point at upper different location carries out testing impedance.
Description of the drawings
It, below will be to specific in order to illustrate more clearly of the specific embodiment of the invention or technical solution in the prior art
Embodiment or attached drawing needed to be used in the description of the prior art are briefly described, it should be apparent that, in being described below
Attached drawing is some embodiments of the present invention, for those of ordinary skill in the art, before not making the creative labor
It puts, other drawings may also be obtained based on these drawings.
Fig. 1 is the dimensional structure diagram of the probe apparatus of the impedance detection provided in embodiment 1；
Fig. 2 is the dimensional structure diagram of the probe apparatus of the impedance detection provided in embodiment 1；
Fig. 3 is that the dimensional structure diagram of the probe apparatus of the impedance detection provided in embodiment 1 (removes the second fixation
Structure)；
Fig. 4 is the structural schematic diagram of the second fixed structure provided in embodiment 1；
Fig. 5 is the structural schematic diagram of the first fixed structure provided in embodiment 1；
Rotating device and the second lifting gear in the probe apparatus for the impedance detection that Fig. 6 is provided by the embodiment of the present invention 1
Dimensional structure diagram；
Reference sign：The chassis 1-；11- first through hole；2- first fixed structures；21- protrusions；3- the first probe groups
Part；The second fixed structures of 4-；41- level boards；42- cant boards；The second probe assemblies of 5-；The first lifting gears of 6-；The first rails of 61-
Guidance tape；The first sliding blocks of 62-；63- rebounds；The first drivers of 64-；The first connecting plates of 7-；8- driving devices；81- mounting plates；
821- lead screws；822- nut blocks；The second track plates of 83-；The second sliding blocks of 84-；The second drivers of 85-；91- rotating disks；92- connections
Column；93- third drivers；94- fixed blocks；The second lifting gears of 10-；101- third fixed structures；102- third track plates；
103- third sliding blocks；104- fourth drives；12- babinets；13- lids；14- probes；15- connecting terminals；The second through-holes of 16-；
The second connecting plates of 17-.
Specific implementation mode
Technical scheme of the present invention is clearly and completely described below in conjunction with attached drawing, it is clear that described implementation
Example is a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, ordinary skill
The every other embodiment that personnel are obtained without making creative work, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that term "center", "upper", "lower", "left", "right", "vertical",
The orientation or positional relationship of the instructions such as "horizontal", "inner", "outside" be based on the orientation or positional relationship shown in the drawings, merely to
Convenient for the description present invention and simplify description, do not indicate or imply the indicated device or element must have a particular orientation,
With specific azimuth configuration and operation, therefore it is not considered as limiting the invention.In addition, term " first ", " second ",
" third " is used for description purposes only, and is not understood to indicate or imply relative importance.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " installation ", " phase
Even ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected；It can
Can also be electrical connection to be mechanical connection；It can be directly connected, can also indirectly connected through an intermediary, Ke Yishi
Connection inside two elements.For the ordinary skill in the art, above-mentioned term can be understood at this with concrete condition
Concrete meaning in invention.
As long as in addition, technical characteristic involved in invention described below different embodiments non-structure each other
It can be combined with each other at conflict.
Embodiment 1
As shown in Figure 1, the present embodiment provides a kind of probe apparatus of impedance detection, including
Chassis 1；
First fixed structure 2 is arranged perpendicular to chassis 1, and bottom is fixed on chassis 1；
One the first probe assembly 3, is vertically arranged on the end of first fixed structure 2；
Second fixed structure 4, it is parallel with first fixed structure 2, it is movably disposed on chassis 1 by driving device 8；
One the second probe assembly 5, is vertically arranged on the end of the second fixed structure 4, opposite with the first probe assembly 3
And coordinate impedance for detecting wiring board, under the movement of the second fixed structure 4, drive the second probe assembly 5 towards or it is remote
It is moved from 3 direction of the first probe assembly；
Two the first lifting gears 6, are separately positioned on the end of first fixed structure 2 and the second fixed structure 4, are used for
It respectively drives the first probe assembly 3 and the second probe assembly 5 vertically moves up and down.
Two the first lifting gears 6 are arranged for respectively driving the first probe assembly 3 and the in the probe apparatus of above structure
Two probe assemblies 5 move up and down in the vertical direction, convenient for when to the impedance detection of different-thickness wiring board, according to circuit
The thickness of plate adjusts the height of the first probe assembly 3 and the second probe assembly 5 at any time so that the first probe assembly 3 and second is visited
Head assembly 5 is contacted with the surface of wiring board, and the impedance detection of wiring board is completed under the cooperation of two probe assemblies.
As deformation, as shown in Fig. 2, the first probe assembly 3 is two, accordingly the second probe assembly 5 is two, two
First probe assembly 3 is separately fixed on the both ends of first fixed structure 2, and two the second probe assemblies 5 are separately fixed at
On the both ends of two fixed structures 4.When being detected to the impedance of wiring board, first probe assembly 3 is with unification the
Two probe assemblies 5 complete the testing impedance of a location point on wiring board, and two the second probe assemblies 5 are arranged in this embodiment
With two the first probe assemblies 3, realizes simultaneously to 2 points of progress testing impedances at different location on wiring board, improve test effect
Rate；Meanwhile driving device 8 drive the second fixed structure 4 movement when, drive two the second probe assemblies 5 simultaneously towards or
Far from 3 direction of the first probe assembly move, be conveniently adjusted two the second probe assemblies 5 respectively with corresponding first probe group
Spacing between part 3.
As deformation, the first probe assembly 3 can also be three or four etc., and accordingly the second probe assembly 5 is three
A or four etc., the specific number that is arranged is depending on actual use situation, but the second probe assembly 5 and the first probe assembly 3
It must correspond and be oppositely arranged, can thus form multigroup detection components, respectively to the different location point on wiring board
Impedance detection is carried out, the working efficiency of probe apparatus is improved.
As the deformation of the first lifting gear 6, the first lifting gear 6 can also be three, four, five etc., in short,
At least one first lifting gear 6 is arranged on the end of first fixed structure 2, to drive one or more first probe groups
Part 3 moves up and down；At least another first lifting gear 6 is arranged on the end of the second fixed structure 4, to drive one
Or multiple second probe assemblies 5 move up and down.
As preferred embodiment, as shown in Figure 1, further including two the first connecting plates 7, it is separately fixed at the first fixation
In structure 2 and the second fixed structure 4；
The one end for the first connecting plate 7 being fixed on first fixed structure 2 stretches out in first fixed structure 2 and is provided with first
One end of probe assembly 3 forms the first side installation space with first fixed structure 2, and the setting of first lifting gear 6 is the
In one side installation space, and it is fixed on first connecting plate 7；
The one end for the first connecting plate 7 being fixed on the second fixed structure 4 stretches out in the second fixed structure 4 and is provided with second
One end of probe assembly 5 forms the second side installation space with the second fixed structure 4, and the setting of another first lifting gear 6 exists
In second side installation space, and it is fixed on first connecting plate 7.
In this embodiment, first connecting plate 7 is respectively set on first fixed structure 2 and the second fixed structure 4,
The one end for the first connecting plate 7 being arranged on first fixed structure 2 stretches out first fixed structure 2 and is equipped with the first probe assembly 3
One end so that the first lifting gear 6 being arranged on the first connecting plate 7 is located at the top of the first probe assembly 3, is convenient for first liter
Falling unit 6 drives the first probe assembly 3 to move up and down.Similarly, the first connecting plate 7 on the second fixed structure 4 is set
One end stretch out one end that the second fixed structure 4 is equipped with the second probe assembly 5 so that the be arranged on first connecting plate 7
One lifting gear 6 is located at the top of the second probe assembly 5, is moved up and down convenient for the second probe assembly 5 of driving.
As deformation, the first above-mentioned connecting plate 7 can also be three, four or five etc., for example, second fixes
It is respectively provided with the second probe assembly 5 on the both ends of structure 4, is accordingly respectively provided with the first spy on the both ends of first fixed structure 2
Head assembly 3 moves up and down to respectively drive two the second probe assemblies 5 and two the first probe assemblies 3, in the second fixed knot
The top both ends of structure 4 and the top both ends of first fixed structure 2 are respectively provided with the first connecting plate 7.
As deformation, only first probe assembly 3 and the second probe assembly 5 can also be driven to rise in the vertical direction
Drop movement, or only the first probe assembly 3 of drive part and the second probe assembly 5 move up and down, but must be opposite set
The first probe assembly 3 and the second probe assembly 5 set.
As the preferred embodiment of the first lifting gear 6, as shown in Fig. 2, the first lifting gear 6 includes
First track plates 61 are vertically arranged on the end wall surface of first fixed structure 2 or the second fixed structure 4；
First sliding block 62 is slidably arranged on the first track plates 61；
Rebound 63, is vertically arranged, and one side wall is fixed on the first sliding block 62, and the first probe assembly is fixed on another side wall
3 or second probe assembly 5；
First driver 64 is fixed on the first connecting plate 7, and drive shaft is connected to rebound across the first connecting plate 7
63。
First lifting gear 6 of this structure is located at the top of the first probe assembly 3 or the second probe assembly 5, third driving
Device 93, which directly drives rebound 63 and drives, is fixed on the first sliding block 62 on the first probe assembly 3 or the second probe assembly 5 the
It is slided on one track plates 61, and then realizes the movement of the first probe assembly 3 or the second probe assembly 5 in vertical direction.
It is further preferred that the first driver 64 is cylinder or other drivers in the prior art.
As the deformation of the first lifting gear 6, the first lifting gear 6 can also be that other liftings fill in the prior art
It sets, need to only meet the first probe assembly 3 of driving or the second probe assembly 5 is moved up and down in vertical direction.
As the preferred embodiment of the second fixed structure 4, as shown in figure 4, the second fixed structure 4 includes 41 He of level board
Two cant boards 42, two cant boards 42 are separately fixed on the both ends of level board 41, and perpendicular to level board 41 to downward
It stretches, the first connecting plate 7 is fixed on level board 41, and the second probe assembly 5 is mounted on the wall outer surface of cant board 42.?
That is, this level board 41 and two cant boards 42 form "Ji" type.
Second fixed structure 4 of this structure, driving device 8 drive level board 41 when being moved on chassis 1, and setting is driven to exist
5 entirety of the second probe assembly on two 42 wall outer surfaces of cant board is moved towards or away from 3 direction of the first probe assembly, from
And in the One On The Chassis confined space, drive multiple second probe assemblies 5 to be moved on chassis simultaneously so that probe apparatus is same
When impedance detection is carried out to multiple location points on wiring board, improve the detection efficiency of probe apparatus, and make entire probe apparatus
Compact-sized, occupied space smaller.
As deformation, the second above-mentioned fixed structure 4 can also be inverted U-shaped or other shapes, need to only realize second
The function of the second probe assembly 5 is fixed on the both ends of fixed structure 4.
It is further preferred that as shown in figures 1 and 3, driving device 8 includes mounting plate 81,821 component of lead screw and the second drive
Dynamic device 85；Mounting plate 81 is vertical with level board 41 and outside the level board 41, and the bottom of mounting plate 81 is fixed on chassis 1
On；821 component of lead screw is located at one layer opposite with first fixed structure 2 of the second fixed structure 4, including lead screw 821 and is arranged
Nut block 822 on lead screw 821, nut block 822 are fixed on the lower section of level board 41, lead screw 821 sequentially pass through mounting plate 81,
The lower section of level board 41, and end is stretched into the through-hole being opened on first fixed structure 2；Second driver 85 is fixed on installation
On plate 81, for driving lead screw 821 to rotate.
When second driver drives lead screw 821 to rotate, nut block 822 is driven to be moved in a straight line along 821 axis direction of lead screw,
And then level board 41 is driven to be moved towards or away from 3 direction of the first probe assembly, realize the second probe assembly 5 and the first probe group
Spacing adjustment between part 3.
It is further preferred that the second driver 85 is motor or other driving devices in the prior art, only need to realize
The function of driving lead screw 821 to rotate.
It is further preferred that driving device 8 further includes rotation limitation component, for limiting nut block 822 in lead screw 821
It rotates in a circumferential direction under drive.Since the rotation of lead screw 821 can drive nut block 822 circumferentially having rotation, so that nut block 822 is not
It can merely move in a straight line, the accuracy that spacing adjusts between the second probe assembly 5 and the first probe assembly 3 can be influenced,
Rotary spacing component is then set, to limit the circumferential movement that lead screw 821 drives nut block 822, so that nut block 822 is only
It is moved in a straight line along the axis direction of lead screw 821, improves spacing between the second probe assembly 5 and the first probe assembly 3 and adjust
Accuracy, improve the accuracy of detection of probe apparatus.
It is further preferred that rotary stopper component includes two the second track plates 83 and two the second sliding blocks 84, two the
Two track plates 83 are vertically arranged and are parallel to lead screw 821, and the bottom of two track plates is fixed on chassis 1, and are located at lead screw 821
Both sides；Two the second sliding blocks 84 are slidably arranged in respectively on second track plates 83, the both ends bottom of the lower section of level board 41
Second sliding block 84 is fixed in portion respectively.
In this embodiment, when lead screw 821 rotates, since two cant boards 42 are located at the outer surface of the second track plates 83
Place, the second track plates 83 will limit the rotation of two cant boards 42, and then limit nut block 822 as lead screw 821 rotates, and make
Nut block 822 is obtained only to move in a straight line on the axis direction of lead screw 821；Meanwhile second track plates 83 setting, by lead screw
821 bearing capacities for bearing the second fixed structure 4 are transferred on the second track plates 83, reduce the active force that lead screw 821 is born in itself,
To play a protective role to lead screw 821；In addition it also allows for level board 41 to slide on the second track plates 83, it is easier to realize
Movement of two probe assemblies 5 towards or away from 3 direction of the first probe assembly.
As deformation, the quantity of the second sliding block 84 can be two, three, four or five etc., and number is specifically arranged
Depending on actual use situation, but second sliding block 84 is at least set on second track plates 83.
Two first through hole are opened up on chassis 1 as shown in Figure 1, Figure 2 and shown in Fig. 5 as further preferred embodiment
11, there is the protrusion 21 extended downwardly, two protrusions 21 to be located at a first through hole at the bottom both ends of first fixed structure 2
In 11, so that the first probe assembly 3 is located in first through hole 11；Two cant boards 42 of the second fixed structure 4 are located at one
In a first through hole 11；So that the second probe assembly 5 is located in first through hole 11.
In this embodiment, two first through hole 11 being opened up on chassis 1 so that be fixed on the of first fixed structure 2
One probe assembly 3 and the second probe assembly 5 being fixed on 4 end of the second fixed structure are respectively positioned in first through hole 11.It is driving
When dynamic device 8 drives the movement of the second fixed structure 4, the moving range of the second probe assembly 5 is limited in first through hole 11；Together
When, the first probe assembly 3 and the second probe assembly 5 pass through first through hole 11 and then touch the surface of wiring board to be detected, come
The impedance of wiring board is detected so that the first probe assembly 3 and the second probe assembly 5 arranged on chassis 1 it is more compact,
The space occupied smaller.
It is further preferred that the shape of first through hole 11 is rectangle, either square is either round or other shapes
Shape can.
As deformation, the number of above-mentioned first through hole 11 can be two, three, four fire five etc., specific to be arranged
Number is depending on actual use situation.
As further preferred embodiment, above-mentioned probe apparatus further includes rotating device, for driving 1 band of chassis
Dynamic first probe assembly 3 and the second probe assembly 5 rotate in the horizontal direction, to change the first probe assembly 3 and second probe
The angle of component 5 in the horizontal direction, the convenient location point at different location on wiring board carry out testing impedance.
Preferably, rotating device includes rotating disk 91, at least one connecting pole 92, fixed block 94 and third driver
93.Wherein, rotating disk 91 is parallel with chassis 1；The top of connecting pole 92 is fixed in rotating disk 91, and bottom is fixed on chassis 1；
Third driver 93 is fixed on fixed block 94, and rotation axis is connected to rotating disk 91 across fixed block 94.Third driver 93
Driving rotating disk 91 drives the first probe assembly 3 being arranged on chassis 1 and chassis and the second probe assembly 5 to turn in the horizontal direction
It is dynamic, it realizes and testing impedance is carried out to the location point at different location on wiring board.
Further, as shown in Fig. 2, starting two the second through-holes 16 on chassis 1, connecting pole 92 is two, rotating disk 91
On correspondingly open up two third through-holes, the bottom of connecting pole 92 is fixed on the second through-hole 16, and top is fixed on third through-hole
On.More preferably, connecting pole 92 is screw rod, and screw tip is threaded through on third through-hole, and bottom is threaded through on the second through-hole 16, then is used
The bottom and top of screw rod are locked on the second through-hole 16 and third through-hole by nut respectively.
As deformation, rotating device can also be other devices that chassis 1 can be driven to rotate in the prior art.
As more preferably preferred embodiment, above-mentioned probe apparatus further includes the second lifting gear 10, solid for driving
Determining block 94 drives chassis 1 to move up and down.
As the preferred of the second lifting gear 10, as shown in fig. 6, the second lifting gear 10 includes be vertically arranged two the
Three track plates 102, two third sliding blocks 103 being slidably arranged in respectively on two third track plates 102, the third being vertically arranged
Fixed structure 101,101 side of third fixed structure are fixed on third sliding block 103, and the other side is fixed on fixed block 94；With
In the fourth drive 104 that driving third fixed structure 101 slides on third track plates 102.
Under the action of fourth drive 104, driving third fixed structure 101 drives fixed block 94 in third track plates
It is slided on 102, and then drives rotating disk 91, chassis 1 and the whole edge of the One On The Chassis first probe assembly, 3 and second probe assembly 5
It is moved up and down on vertical direction.
It is further preferred that block piece is arranged on the top and bottom of third track plates 102 so that third sliding block 103
The range slided in the vertical direction is limited in the space between two block pieces.
In addition, the third track plates 102 in the second above-mentioned lifting gear 10 are fixed on rack by the second connecting plate 17
On；Four-drive device 8 is arranged on the second connecting plate 17, and drive shaft is connected to third fixed knot across the second connecting plate 17
Structure 101；Either third track plates 102 are fixed on the spy on other holders or with impedance detection by the second connecting plate 17
On the other component that head device matches, the support element as entire probe apparatus.
As deformation, the second lifting gear 10 can also be the lifting gear of other structures in the prior art.
As preferred embodiment, as shown in Fig. 2, the first probe assembly 3 or second probe in the above embodiment
Component 5 includes babinet 12, lid 13, probe 14, connecting terminal 15 and cable.Babinet 12 is vertically arranged, the one side wall of babinet 12
It is fixed on rebound 63, another side wall is opening, and the setting of lid 13 is herein in opening；Probe 14 is threaded through on babinet 12,
One end is located in babinet 12, and the other end is located at outside babinet 12, and extends downwardly；Connecting terminal 15 is arranged at the top of babinet 12
On, and outside babinet 12 and it is connected to test equipment；Cable is located in babinet 12, and bottom is connected to one end of probe 14, top
Portion is connected to connecting terminal 15.
As deformation, the first probe assembly 3 or the second probe assembly 5 can also be that impedance detection in the prior art is visited
Head.
Obviously, the above embodiments are merely examples for clarifying the description, and does not limit the embodiments.It is right
For those of ordinary skill in the art, can also make on the basis of the above description it is other it is various forms of variation or
It changes.There is no necessity and possibility to exhaust all the enbodiments.And it is extended from this it is obvious variation or
It changes still within the protection scope of the invention.
Claims (12)
1. a kind of probe apparatus of impedance detection, which is characterized in that including
Chassis (1)；
First fixed structure (2) is arranged perpendicular to the chassis (1), and bottom is fixed on the chassis (1)；
At least one first probe assembly (3), is vertically arranged on the end of the first fixed structure (2)；
Second fixed structure (4), it is parallel with the first fixed structure (2), institute is movably disposed at by driving device (8)
It states on chassis (1)；
At least one second probe assembly (5) is vertically arranged on the end of second fixed structure (4), with described first
Probe assembly (3) correspondingly with respect to and coordinate impedance for detecting wiring board；In the shifting of second fixed structure (4)
Under dynamic, second probe assembly (5) is driven to be moved towards or away from the first probe assembly (3) direction；
At least two first lifting gears (6), at least one first lifting gear (6) are arranged in the first fixed structure
(2) on end, and at least another described first lifting gear (6) is arranged on the end of second fixed structure (4),
It is vertically moved up and down for respectively driving first probe assembly (3) and the second probe assembly (5).
2. the probe apparatus of impedance detection according to claim 1, it is characterised in that：Further include at least two first connections
Plate (7), at least one first connecting plate (7) are fixed on the first fixed structure (2), and at least another described
One connecting plate (7) is fixed on second fixed structure (4)；
Wherein, it is solid that the one end for first connecting plate (7) being fixed on the first fixed structure (2) stretches out in described first
Determine one end that structure (2) is provided with first probe assembly (3), the first side peace is formed with the first fixed structure (2)
Space is filled, at least one first lifting gear (6) is arranged in the installation space of first side, and it is described to be fixed on this
On first connecting plate (7)；
The one end for first connecting plate (7) being fixed on second fixed structure (4) stretches out in second fixed knot
Structure (4) is provided with one end of second probe assembly (5), and it is empty to form the installation of the second side with second fixed structure (4)
Between, at least another described first lifting gear (6) is arranged in the installation space of second side, and be fixed on this described the
On one connecting plate (7).
3. the probe apparatus of impedance detection according to claim 2, it is characterised in that：First lifting gear (6) packet
It includes
First track plates (61) are vertically arranged in the end wall surface of the first fixed structure (2) or the second fixed structure (4)
On；
First sliding block (62) is slidably arranged on first track plates (61)；
Rebound (63), is vertically arranged, and one side wall is fixed on first sliding block (62), and described first is fixed on another side wall
Probe assembly (3) or the second probe assembly (5)；
First driver (64) is fixed on first connecting plate (7), and drive shaft connects across first connecting plate (7)
It is connected to the rebound (63).
4. the probe apparatus of impedance detection according to any one of claim 1-3, it is characterised in that：First probe
Component (3) is two, and second probe assembly (5) is two, and two first probe assemblies (3) are separately fixed at described
On the both ends of first fixed structure (2)；Two second probe assemblies (5) are separately fixed at second fixed structure
(4) on both ends.
5. the probe apparatus of impedance detection according to claim 2 or 3, it is characterised in that：Second fixed structure (4)
Including
Level board (41), first connecting plate (7) are fixed on level board (41)；
Two cant boards (42), are separately fixed on the both ends of the level board (41), and perpendicular to the level board (41)
It extends downwardly, second probe assembly (5) is mounted on the wall outer surface of the cant board (42).
6. the probe apparatus of impedance detection according to claim 5, it is characterised in that：The driving device (8) includes
Mounting plate (81), it is vertical with the level board (41) and positioned at the level board (41) outside, bottom is fixed on the bottom
On disk (1)；
Lead screw (821) component is located at the side opposite with the first fixed structure (2) of second fixed structure (4), packet
The nut block (822) for including lead screw (821) and being set on the lead screw (821), the nut block (822) are fixed on level board
(41) lower section, the lead screw (821) sequentially passes through the lower section of the mounting plate (81), the level board (41), and end is stretched
Enter to be opened in the through-hole on the first fixed structure (2)；
Second driver (85) is fixed on the mounting plate (81), for driving the lead screw (821) to rotate；
Rotation limitation component, rotates in a circumferential direction for limiting nut block (822) under the drive of the lead screw (821).
7. the probe apparatus of impedance detection according to claim 6, which is characterized in that the rotation limits component and includes
Two the second track plates (83), are vertically arranged and are parallel to the lead screw (821), two second track plates (83)
Bottom is fixed on the chassis (1), and positioned at the both sides of the lead screw (821)；
At least two second sliding blocks (84), at least one second sliding block (84) are slidably arranged in second track plates
(83) on, the both ends bottom of the lower section of the level board (41) is respectively fixed at least one second sliding block (84).
8. the probe apparatus of impedance detection according to claim 5, it is characterised in that：It is opened up at least on the chassis (1)
Two first through hole (11)；
The bottom both ends of the first fixed structure (2) have the protrusion (21) extended downwardly, two raised (21) difference
In a first through hole (11), so that first probe assembly (3) is located in the first through hole (11)；
Two cant boards (42) of second fixed structure (4) are located in a first through hole (11)；With
Second probe assembly (5) is set to be located in the first through hole (11).
9. the probe apparatus of impedance detection according to any one of claim 1-3, it is characterised in that：It further include rotating dress
It sets, for driving the chassis (1) that first probe assembly (3) and the second probe assembly (5) is driven to revolve in the horizontal direction
Turn.
10. the probe apparatus of impedance detection according to claim 9, it is characterised in that：The rotating device includes
Rotating disk (91), it is parallel with the chassis (1)；
At least one connecting pole (92), bottom are fixed on the chassis (1), and top is fixed on the bottom of the rotating disk (91)
On；
Fixed block (94)；
Third driver (93) is fixed on the fixed block (94), and rotation axis is connected to institute across the fixed block (94)
State rotating disk (91).
11. the probe apparatus of impedance detection according to claim 10, it is characterised in that：It further include the second lifting gear
(10), for driving the fixed block (94) that the chassis (1) is driven to move up and down.
12. the probe apparatus of impedance detection according to claim 11, it is characterised in that：Second lifting gear (10)
Including
Third track plates (102) are two, are vertically arranged；
Third sliding block (103) is two, is slidably arranged in respectively on a third track plates (102)；
Third fixed structure (101), is vertically arranged, and side is fixed on the third sliding block (103), and the other side is fixed on described
On fixed block (94)；
Fourth drive (104), for driving the third fixed structure (101) to be slided on the third track plates (102).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610380695.XA CN105911355B (en) | 2016-05-31 | 2016-05-31 | A kind of probe apparatus of impedance detection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610380695.XA CN105911355B (en) | 2016-05-31 | 2016-05-31 | A kind of probe apparatus of impedance detection |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105911355A CN105911355A (en) | 2016-08-31 |
| CN105911355B true CN105911355B (en) | 2018-11-09 |
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ID=56741877
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610380695.XA Expired - Fee Related CN105911355B (en) | 2016-05-31 | 2016-05-31 | A kind of probe apparatus of impedance detection |
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| Country | Link |
|---|---|
| CN (1) | CN105911355B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109581007A (en) * | 2018-12-27 | 2019-04-05 | 南京协辰电子科技有限公司 | Double probe system and printed circuit board detection device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0974845A1 (en) * | 1998-07-08 | 2000-01-26 | Christian Leth Petersen | Apparatus for testing electric properties using a multi-point probe |
| CN102288826A (en) * | 2011-09-08 | 2011-12-21 | 南京工业职业技术学院 | Impedance probe head with two-in-one characteristic |
| CN203385768U (en) * | 2013-07-15 | 2014-01-08 | 广东正业科技股份有限公司 | Characteristic impedance type probe |
| CN205049621U (en) * | 2015-10-20 | 2016-02-24 | 肖体春 | Probe station |
| CN205898897U (en) * | 2016-05-31 | 2017-01-18 | 南京协辰电子科技有限公司 | Impedance detection's probe unit |
-
2016
- 2016-05-31 CN CN201610380695.XA patent/CN105911355B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0974845A1 (en) * | 1998-07-08 | 2000-01-26 | Christian Leth Petersen | Apparatus for testing electric properties using a multi-point probe |
| CN102288826A (en) * | 2011-09-08 | 2011-12-21 | 南京工业职业技术学院 | Impedance probe head with two-in-one characteristic |
| CN203385768U (en) * | 2013-07-15 | 2014-01-08 | 广东正业科技股份有限公司 | Characteristic impedance type probe |
| CN205049621U (en) * | 2015-10-20 | 2016-02-24 | 肖体春 | Probe station |
| CN205898897U (en) * | 2016-05-31 | 2017-01-18 | 南京协辰电子科技有限公司 | Impedance detection's probe unit |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105911355A (en) | 2016-08-31 |
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