CN105911355A - Probe device for impedance detection - Google Patents
Probe device for impedance detection Download PDFInfo
- Publication number
- CN105911355A CN105911355A CN201610380695.XA CN201610380695A CN105911355A CN 105911355 A CN105911355 A CN 105911355A CN 201610380695 A CN201610380695 A CN 201610380695A CN 105911355 A CN105911355 A CN 105911355A
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- China
- Prior art keywords
- fixed
- probe assembly
- fixed structure
- probe
- chassis
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Abstract
The invention discloses a probe device for impedance detection. The probe device comprises a chassis; a first fixing structure and a second fixing structure vertical to the chassis; at least one first probe assembly and at least one second probe assembly which are respectively arranged on the end part of the first fixing structure and the end part of the second fixing structure, wherein the second probe assembly and the first probe assembly are opposite to each other in one-to-one correspondence and are used for detecting the impedance of a circuit board in a matched manner, the first fixing structure is fixed on the chassis, and the second fixing structure is movably arranged on the chassis through a driving device; and at least two first lifting devices used for respectively driving the first probe assembly and the second probe assembly to move up and down so as to adjust the heights of the first probe assembly and the second probe assembly anytime according to the thickness of a circuit board when the impedance detection is carried out on circuit boards different in thickness. In this way, the first probe assembly and the second probe assembly are enabled to contact the surface of the circuit board, and impedance detection on the circuit board is completed under the cooperation of the two probe assemblies.
Description
Technical field
The present invention relates to the detection technique field of wiring board impedance, be specifically related to the spy of a kind of impedance detection
Head unit.
Background technology
In prior art, after preparing the circuit of required form in the circuit board, need to use impedance inspection
Circuit on wiring board is detected by probing head, judges the circuit on wiring board with this testing result
Whether reach requirement.
Chinese patent literature CN203385768U discloses the impedance detection probe apparatus of a kind of wiring board,
Including having opening up housing, the upper cover being arranged on shell nozzle；Two be arranged in housing
Individual probe assembly, probe assembly includes cable, is arranged on probe and the binding post at cable two ends,
The end away from cable one end of probe is positioned at outside housing, and binding post is positioned at outside housing；And use
In regulating the adjusting means of spacing between two probes.
Adjusting means includes having positive and negative tooth screw mandrel, two slide blocks, two fixed blocks, rotation wheels and lock
Determine device.Wherein, the two ends of forward lead screw are fixed in inner walls by a fixed block respectively,
One slide block is arranged in screw mandrel orthodontic part, and another slide block is arranged in the anti-tooth part of screw mandrel,
Two probes are separately fixed on a slide block；Rotate wheel be fixed on screw mandrel, and be positioned at two slide blocks it
Between, locking device is arranged on rotation wheel, for limiting the rotation rotating wheel.
The probe apparatus of the impedance detection of said structure, adjusts the spacing between two probes needing
Time, need the manual rotation wheel of people, and then drive screw mandrel to rotate so that the cunning being arranged on screw mandrel
Block moves, and changes the spacing between two probes, and the spacing between two probes reaches required
During requirement, limit the rotation rotating wheel with locking device so that two probes keep above-mentioned required
Spacing.But, this impedance probe device, can only realize regulating the spacing between two probes, if
When wiring board variable thickness to be detected causes, it is difficult to adjust two spacing between probe and wiring board,
And then affect the testing result of probe apparatus.
Summary of the invention
Therefore, the impedance detection of wiring board during the technical problem to be solved is prior art
Probe apparatus is difficult to adjust the spacing between probe and wiring board.
To this end, the present invention provides the probe apparatus of a kind of impedance detection, including
Chassis；
First fixed structure, is perpendicular to described chassis and arranges, and bottom is fixed on described chassis；
At least one first probe assembly, is vertically arranged on the end of described first fixed structure；
Second fixed structure, parallel with described first fixed structure, set movably by driving means
Put on described chassis；
At least one second probe assembly, is vertically arranged on the end of described second fixed structure, with
Described first probe assembly correspondingly relative to and coordinate for detecting the impedance of wiring board；Described
Under the movement of the second fixed structure, drive described second probe assembly towards or away from described first probe
Assembly direction is moved；
At least two the first lowering or hoisting gear, at least one described first lowering or hoisting gear is arranged on described first
On the end of fixed structure, and at least another described first lowering or hoisting gear be arranged on described second fix
On the end of structure, for driving described first probe assembly and the second probe assembly along vertically side respectively
To moving up and down.
The probe apparatus of above-mentioned impedance detection, also includes at least two the first connecting plate, at least one
Described first connecting plate is fixed on described first fixed structure, and at least another described first connection
Plate is fixed on described second fixed structure；
Wherein, the one end of described first connecting plate being fixed on described first fixed structure stretches out in institute
State first fixed structure and be provided with one end of described first probe assembly, with described first fixed structure shape
Becoming the first sidepiece installing space, at least one described first lowering or hoisting gear is arranged on described first sidepiece peace
In dress space, and it is fixed on this described first connecting plate；
The one end of described first connecting plate being fixed on described second fixed structure stretches out in described second
Fixed structure is provided with one end of described second probe assembly, forms second with described second fixed structure
Sidepiece installing space, at least another described first lowering or hoisting gear are arranged on described second sidepiece and install sky
In, and be fixed on this described first connecting plate.
The probe apparatus of above-mentioned impedance detection, described first lowering or hoisting gear includes
First track plates, is vertically arranged in described first fixed structure or the end wall of the second fixed structure
On face；
First slide block, is slidably arranged on described first track plates；
Rebound, is vertically arranged, and a sidewall is fixed on described first slide block, fixing on another sidewall
Described first probe assembly or the second probe assembly；
First driver, is fixed on described first connecting plate, and its drive shaft connects through described first
Plate is connected to described rebound.
The probe apparatus of above-mentioned impedance detection, described first probe assembly is two, and described second visits
Head assembly is two, and two described first probe assemblies are separately fixed at the two of described first fixed structure
On end；Two described second probe assemblies are separately fixed on the both ends of described second fixed structure.
The probe apparatus of above-mentioned impedance detection, described second fixed structure includes
Horizontal plate, described first connecting plate is fixed on horizontal plate；
Two cant boards, are separately fixed on the both ends of described horizontal plate, and are perpendicular to described level
Plate downwardly extends, and described second probe assembly is arranged on the wall outer surface of described cant board.
The probe apparatus of above-mentioned impedance detection, described driving means includes
Installing plate, parallel with described horizontal plate, bottom is fixed on described chassis；
Screw component, is positioned at the side relative with described first fixed structure of described second fixed structure,
Including screw mandrel and the nut block being set on described screw mandrel, described nut block is fixed on the lower section of horizontal plate,
Described screw mandrel sequentially passes through described installing plate, the lower section of described horizontal plate, and end and stretches into and be opened in institute
State in the through hole on first fixed structure；
Second driver, is fixed on described installing plate, is used for driving described screw mandrel to rotate；
Rotate limiter assembly, rotate in a circumferential direction under the drive of described screw mandrel for limiting nut block.
The probe apparatus of above-mentioned impedance detection, described rotation limiter assembly includes
Two the second track plates, are vertically arranged and are parallel to described screw mandrel, two described second track plates
Bottom be fixed on described chassis, and be positioned at the both sides of described screw mandrel；
At least two the second slide block, at least one described second slide block is slidably arranged in one described second
On track plates, bottom the two ends of the lower section of described horizontal plate, it is respectively fixed with at least one described second cunning
Block.
The probe apparatus of above-mentioned impedance detection, described chassis is offered at least two the first through hole；
The two ends, bottom of described first fixed structure have the projection downwardly extended, and two described projections are divided
It is not positioned at described first through hole, so that described first probe assembly is positioned at described first through hole；
Two described cant boards of described second fixed structure lay respectively in described first through hole；
So that described second probe assembly is positioned at described first through hole.
The probe apparatus of above-mentioned impedance detection, also includes rotary apparatus, is used for driving described chassis band
Dynamic described first probe assembly and the second probe assembly rotate in the horizontal direction.
The probe apparatus of above-mentioned impedance detection, described rotary apparatus includes
Rotating disk, parallel with described chassis；
At least one connects post, and bottom is fixed on described chassis, and top is fixed on described rotating disk
On bottom；
Fixed block；
3rd driver, is fixed on described fixed block, and its rotary shaft is connected to through described fixed block
Described rotating disk.
The probe apparatus of above-mentioned impedance detection, also includes the second lowering or hoisting gear, is used for driving described solid
Determining block drives described chassis to move up and down.
The probe apparatus of above-mentioned impedance detection, described second lowering or hoisting gear includes
3rd track plates, is two, is vertically arranged；
3rd slide block, is two, is slidably arranged in respectively on described 3rd track plates；
3rd fixed structure, is vertically arranged, and side is fixed on described 3rd slide block, and opposite side is fixed
On described fixed block；
Fourth drive, is used for driving described 3rd fixed structure to slide on described 3rd track plates.
The technical scheme that the present invention provides, has the advantage that
1. the probe apparatus of the impedance detection that the present invention provides, including chassis, is vertically arranged on chassis
First fixed structure and the second fixed structure, at least one first probe assembly and at least one the second spy
Head assembly is separately positioned on the end of first fixed structure and the end of the second fixed structure, and second visits
Head assembly and the first probe assembly one_to_one corresponding are relatively and cooperation is for detecting the impedance of wiring board, and first
Fixed structure is fixed on chassis, and the second fixed structure is movably disposed at chassis by driving means
On, and at least two the first lowering or hoisting gear, for driving the first probe assembly and the second probe respectively
Assembly moves up and down, it is simple to when to the impedance detection of different-thickness wiring board, according to wiring board
Thickness adjusts the first probe assembly and the height of the second probe assembly at any time so that the first probe assembly and
Second probe assembly contacts with the surface of wiring board, and completes circuit under the cooperation of two probe assemblies
The impedance detection of plate.
2. the probe apparatus of the impedance detection that the present invention provides, also includes at least two the first connecting plate, point
It is not fixed on first fixed structure and the second fixed structure, first be fixed on first fixed structure
One end of connecting plate stretches out in first fixed structure and is provided with one end of the first probe assembly, solid with first
Fixed structure forms the first sidepiece installing space, and at least one first lowering or hoisting gear is arranged on the first sidepiece peace
In dress space, and it is fixed on this first connecting plate；The first connection being fixed on the second fixed structure
One end of plate stretches out in the second fixed structure and is provided with one end of the second probe assembly, with the second fixed knot
It is configured to the second sidepiece installing space, at least another first lowering or hoisting gear and is arranged on the second sidepiece installation
In space, and it is fixed on this first connecting plate.
The setting of at least two the first connecting plate so that the first connection being fixed on first fixed structure
The first lowering or hoisting gear on plate is positioned at the top of the first probe assembly, is fixed on the second fixed structure
The first lowering or hoisting gear on first connecting plate is positioned at the top of the second probe assembly, it is simple to the first lifting dress
Put driving the first probe assembly or the second probe assembly moves up and down.
3. the probe apparatus of the impedance detection that the present invention provides, the first probe assembly is two, the second probe
Assembly is two, and two described first probe assemblies are separately fixed at the two ends of described first fixed structure
In portion；Two described second probe assemblies are separately fixed on the both ends of described second fixed structure.
When detecting the impedance of wiring board, first probe assembly coordinates one second probe
Assembly completes the testing impedance of a location point on wiring board, arranges two second spies in this embodiment
Head assembly and two the first probe assemblies, it is achieved on wiring board 2 of various location are carried out simultaneously
Testing impedance, improves testing efficiency；Meanwhile, driving means drive the second fixed structure move time,
Drive two the second probe assemblies simultaneously towards or move away from the first probe assembly direction, it is simple to adjust
Whole two the second probe assemblies spacing respectively and between each self-corresponding first probe assembly.
4. the probe apparatus of impedance detection that the present invention improves, the second fixed structure includes horizontal plate and two
Cant board, the first connecting plate is fixed on horizontal plate, and two cant boards are separately fixed at the two of horizontal plate
On end, and being perpendicular to horizontal plate and downwardly extend, the second probe assembly is arranged on outside the sidewall of cant board
On surface.That is, horizontal plate and two cant boards form " several " font, at the two of "Ji" type
Second probe assembly it is respectively mounted on the outer surface of cant board.
When driving means drives horizontal plate to move on chassis, drive and be arranged on two cant board sidewalls
The second probe assembly entirety on outer surface moves towards or away from the first probe assembly direction, thus
In the confined space on chassis, drive multiple second probe assembly to move on chassis to visit simultaneously
Head unit carries out impedance detection simultaneously to location points multiple on wiring board, improves the detection effect of probe apparatus
Rate, and make the compact conformation of whole probe apparatus, shared space is less.
5. the probe apparatus of the impedance detection that the present invention provides, chassis starts at least two the first through hole,
The two ends, bottom of first fixed structure have the projection downwardly extended, and two projections lay respectively at one
In one through hole, so that the first probe assembly is positioned at the first through hole；Two of second fixed structure edge-on
Plate lays respectively in first through hole；So that the second probe assembly is positioned at the first through hole.Driving
When device drives the second fixed structure to move, the moving range of the second probe assembly is limited in first and leads to
In hole；Meanwhile, the first probe assembly and the second probe assembly through the first through hole and then touch to be checked
Surveying the surface of wiring board, the impedance to wiring board detects so that the first probe assembly and second
It is more compact that probe assembly is arranged on chassis 1, and the space taken is less.
6. the probe apparatus of the impedance detection that the present invention provides, also includes rotary apparatus, is used for driving chassis
Rotate in the horizontal direction with the first probe assembly and the second probe assembly, further, rotate dress
Putting and include rotating disk, connection post, fixed block and the 3rd driver, wherein rotating disk is parallel with chassis,
The top connecting post is fixing on the rotating pan, and bottom is fixed on chassis, and the 3rd driver is fixed on
Determining on block, its rotary shaft connects and rotating disk through fixed block.3rd driver drives rotating disk drives
The first probe assembly and the second probe assembly that arrange at the end and chassis rotate in the horizontal direction, it is achieved right
On wiring board, the location point of various location carries out testing impedance.
Accompanying drawing explanation
In order to be illustrated more clearly that the specific embodiment of the invention or technical scheme of the prior art, under
The accompanying drawing used required in detailed description of the invention or description of the prior art will be briefly described by face,
It should be evident that the accompanying drawing in describing below is some embodiments of the present invention, general for this area
From the point of view of logical technical staff, on the premise of not paying creative work, it is also possible to obtain according to these accompanying drawings
Obtain other accompanying drawing.
Fig. 1 is the perspective view of the probe apparatus of the impedance detection provided in embodiment 1；
Fig. 2 is the perspective view of the probe apparatus of the impedance detection provided in embodiment 1；
Fig. 3 is that the perspective view of the probe apparatus of the impedance detection provided in embodiment 1 (is gone
Fall the second fixed structure)；
Fig. 4 is the structural representation of the second fixed structure provided in embodiment 1；
Fig. 5 is the structural representation of the first fixed structure provided in embodiment 1；
Rotary apparatus and in the probe apparatus of the impedance detection that Fig. 6 is provided by the embodiment of the present invention 1
The perspective view of two lowering or hoisting gears；
Description of reference numerals: 1-chassis；11-the first through hole；2-first fixed structure；21-is protruding；3-
First probe assembly；4-the second fixed structure；41-horizontal plate；42-cant board；5-the second probe assembly；
6-the first lowering or hoisting gear；61-the first track plates；62-the first slide block；63-rebound；64-first drives
Device；7-the first connecting plate；8-driving means；81-installing plate；821-screw mandrel；822-nut block；83-
Second track plates；84-the second slide block；85-the second driver；91-rotating disk；92-connects post；93-
3rd driver；94-fixed block；10-the second lowering or hoisting gear；101-the 3rd fixed structure；102-the 3rd
Track plates；103-the 3rd slide block；104-fourth drive；12-casing；13-lid；14-probe；15-
Binding post；16-the second through hole；17-the second connecting plate.
Detailed description of the invention
Below in conjunction with accompanying drawing, technical scheme is clearly and completely described, it is clear that
Described embodiment is a part of embodiment of the present invention rather than whole embodiments.Based on this
Embodiment in bright, those of ordinary skill in the art are obtained under not making creative work premise
Every other embodiment, broadly fall into the scope of protection of the invention.
In describing the invention, it should be noted that term " " center ", " on ", D score, " left ",
The orientation of the instruction such as " right ", " vertically ", " level ", " interior ", " outward " or position relationship are for based on accompanying drawing institute
The orientation shown or position relationship, be for only for ease of the description present invention and simplify description rather than instruction
Hint indication device or element must have specific orientation, with specific azimuth configuration and operation,
Therefore it is not considered as limiting the invention.Additionally, term " first ", " second ", " the 3rd " only use
In describing purpose, and it is not intended that indicate or hint relative importance.
In describing the invention, it should be noted that unless otherwise clearly defined and limited, art
Language " is installed ", " being connected ", " connection " should be interpreted broadly, and connects for example, it may be fixing, it is also possible to
It is to removably connect, or is integrally connected；Can be to be mechanically connected, it is also possible to be electrical connection；Permissible
It is to be joined directly together, it is also possible to be indirectly connected to by intermediary, can be the connection of two element internals.
For the ordinary skill in the art, above-mentioned term can be understood in the present invention with concrete condition
Concrete meaning.
As long as additionally, technical characteristic involved in invention described below difference embodiment that
The conflict of not constituting between this just can be combined with each other.
Embodiment 1
As it is shown in figure 1, the present embodiment provides the probe apparatus of a kind of impedance detection, including
Chassis 1；
First fixed structure 2, is perpendicular to chassis 1 and arranges, and bottom is fixed on chassis 1；
One the first probe assembly 3, is vertically arranged on the end of first fixed structure 2；
Second fixed structure 4, parallel with first fixed structure 2, set movably by driving means 8
Put on chassis 1；
One the second probe assembly 5, is vertically arranged on the end of the second fixed structure 4, visits with first
Head assembly 3 relatively and coordinates the impedance for detecting wiring board, under the movement of the second fixed structure 4,
The second probe assembly 5 is driven to move towards or away from the first probe assembly 3 direction；
Two the first lowering or hoisting gears 6, are separately positioned on first fixed structure 2 and the second fixed structure 4
On end, for driving the first probe assembly 3 and the second probe assembly 5 vertically to rise respectively
Fall motion.
The probe apparatus of said structure, arranges two the first lowering or hoisting gears 6 for driving the first spy respectively
Head assembly 3 and the second probe assembly 5 in the vertical direction move up and down, it is simple to different-thickness
During the impedance detection of wiring board, adjust the first probe assembly 3 and second at any time according to the thickness of wiring board
The height of probe assembly 5 so that the first probe assembly 3 and the second probe assembly 5 and the table of wiring board
Face contacts, and completes the impedance detection of wiring board under the cooperation of two probe assemblies.
As deformation, as in figure 2 it is shown, the first probe assembly 3 is two, the second probe group accordingly
Part 5 is two, and two the first probe assemblies 3 are separately fixed on the both ends of first fixed structure 2,
Two the second probe assemblies 5 are separately fixed on the both ends of the second fixed structure 4.To wiring board
Impedance when detecting, first probe assembly 3 coordinates second probe assembly 5 to complete line
The testing impedance of a location point on the plate of road, arranges two the second probe assembly 5 Hes in this embodiment
Two the first probe assemblies 3, it is achieved simultaneously carry out impedance survey on wiring board 2 of various location
Examination, improves testing efficiency；Meanwhile, driving means 8, when driving the second fixed structure 4 to move, carries
Dynamic two the second probe assemblies 5 simultaneously towards or move away from the first probe assembly 3 direction, it is simple to
Adjust two the second probe assemblies 5 spacing respectively and between each self-corresponding first probe assembly 3.
As deformation, the first probe assembly 3 can also be three or four etc., second visits accordingly
Head assembly 5 is three or four etc., specifically arrange number according to actually used situation depending on, but the
Two probe assemblies 5 and the first probe assembly 3 must one_to_one corresponding being oppositely arranged, thus can be with shape
Become to organize detection components more, respectively the diverse location point on wiring board is carried out impedance detection, improve probe
The work efficiency of device.
As the deformation of the first lowering or hoisting gear 6, the first lowering or hoisting gear 6 can also be three, four,
Five etc., in a word, at least first lowering or hoisting gear 6 is arranged on the end of first fixed structure 2
In portion, one or more first probe assembly 3 is driven to move up and down；At least another first
Lowering or hoisting gear 6 is arranged on the end of the second fixed structure 4, drives one or more second probe
Assembly 5 moves up and down.
As preferred embodiment, as it is shown in figure 1, also include two the first connecting plates 7, solid respectively
It is scheduled on first fixed structure 2 and the second fixed structure 4；
The one end of the first connecting plate 7 being fixed on first fixed structure 2 stretches out in first fixed structure 2
It is provided with one end of the first probe assembly 3, forms the first sidepiece installing space with first fixed structure 2,
One the first lowering or hoisting gear 6 is arranged in the first sidepiece installing space, and is fixed on this first connecting plate 7
On；
The one end of the first connecting plate 7 being fixed on the second fixed structure 4 stretches out in the second fixed structure 4
It is provided with one end of the second probe assembly 5, forms the second sidepiece installing space with the second fixed structure 4,
Another first lowering or hoisting gear 6 is arranged in the second sidepiece installing space, and is fixed on this first connection
On plate 7.
In this embodiment, first fixed structure 2 and the second fixed structure 4 are respectively provided with one
First connecting plate 7, it is solid that the one end of the first connecting plate 7 being arranged on first fixed structure 2 stretches out first
Fixed structure 2 is provided with one end of the first probe assembly 3 so that be arranged on first on the first connecting plate 7
Lowering or hoisting gear 6 is positioned at the top of the first probe assembly 3, it is simple to the first lowering or hoisting gear 6 drives the first spy
Head assembly 3 moves up and down.Similarly, the first connecting plate 7 being arranged on the second fixed structure 4
One end stretch out the second fixed structure 4 and be provided with one end of the second probe assembly 5 so that be arranged on this
The first lowering or hoisting gear 6 on a plate 7 is positioned at the top of the second probe assembly 5, it is simple to drive the
Two probe assemblies 5 move up and down.
As deformation, the first above-mentioned connecting plate 7 can also be three, four or five etc.,
Such as, the both ends of the second fixed structure 4 are respectively provided with the second probe assembly 5, first fix accordingly
The first probe assembly 3 it is respectively provided with, for driving two the second probe assemblies 5 respectively on the both ends of structure 2
Move up and down with two the first probe assemblies 3, at the two ends, top and first of the second fixed structure 4
The two ends, top of fixed structure 2 are respectively provided with the first connecting plate 7.
As deformation, it is also possible to only drive first probe assembly 3 and the second probe assembly 5 perpendicular
Nogata upwards moves up and down, or the first probe assembly 3 and the second probe assembly 5 of only drive part
Move up and down, but must be the first probe assembly 3 and the second probe assembly 5 being oppositely arranged.
As the preferred implementation of the first lowering or hoisting gear 6, as in figure 2 it is shown, the first lowering or hoisting gear 6
Including
First track plates 61, is vertically arranged in first fixed structure 2 or the end of the second fixed structure 4
On wall；
First slide block 62, is slidably arranged on the first track plates 61；
Rebound 63, is vertically arranged, and a sidewall is fixed on the first slide block 62, fixing on another sidewall
First probe assembly 3 or the second probe assembly 5；
First driver 64, is fixed on the first connecting plate 7, and its drive shaft passes the first connecting plate 7
It is connected to rebound 63.
First lowering or hoisting gear 6 of this structure, is positioned at the upper of the first probe assembly 3 or the second probe assembly 5
Side, the 3rd driver 93 directly drives rebound 63 to drive and is fixed on the first probe assembly 3 or the second
The first slide block 62 on probe assembly 5 slides on the first track plates 61, and then realizes the first probe
Assembly 3 or the second probe assembly 5 are in the motion of vertical direction.
It is further preferred that the first driver 64 is cylinder, or other driving of the prior art
Device.
As the deformation of the first lowering or hoisting gear 6, the first lowering or hoisting gear 6 can also be in prior art its
His lowering or hoisting gear, only need to meet driving the first probe assembly 3 or the second probe assembly 5 in vertically side
To moving up and down.
As the preferred implementation of the second fixed structure 4, as shown in Figure 4, the second fixed structure 4
Including horizontal plate 41 and two cant boards 42, two cant boards 42 are separately fixed at the two of horizontal plate 41
On end, and being perpendicular to horizontal plate 41 and downwardly extend, the first connecting plate 7 is fixed on horizontal plate 41,
Second probe assembly 5 is arranged on the wall outer surface of cant board 42.That is, this horizontal plate 41 He
Two cant boards 42 form "Ji" type.
Second fixed structure 4 of this structure, driving means 8 drives horizontal plate 41 to move on chassis 1
Time, drive the second probe assembly 5 entirety of being arranged on two cant board 42 wall outer surface towards or
Move away from the first probe assembly 3 direction, thus in the One On The Chassis confined space, drive multiple
Second probe assembly 5 moves on chassis simultaneously so that probe apparatus is simultaneously to positions multiple on wiring board
Put and a little carry out impedance detection, improve the detection efficiency of probe apparatus, and make the knot of whole probe apparatus
Structure is compact, and shared space is less.
As deformation, the second above-mentioned fixed structure 4 can also be inverted U-shaped, or other shapes,
Only need to realize fixing the function of the second probe assembly 5 on the both ends of the second fixed structure 4.
It is further preferred that as it is shown on figure 3, driving means 8 includes installing plate 81, screw mandrel 821 groups
Part and the second driver 85；Installing plate 81 be arranged in parallel with horizontal plate 41, and bottom is fixed on chassis 1
On；Screw mandrel 821 assembly is positioned at relative with first fixed structure 2 layer of the second fixed structure 4,
Including screw mandrel 821 and the nut block 822 being set on screw mandrel 821, nut block 822 is fixed on horizontal plate
The lower section of 41, screw mandrel 821 sequentially passes through installing plate 81, the lower section of horizontal plate 41, and end and stretches into
It is opened in the through hole on first fixed structure 2；Second driver 85 is fixed on installing plate 81,
For driving screw mandrel 821 to rotate.
When second driver drives screw mandrel 821 rotates, drive nut block 822 along screw mandrel 821 axis side
To moving along a straight line, and then horizontal plate 41 is driven to move towards or away from the first probe assembly 3 direction,
Realize the spacing between the second probe assembly 5 and the first probe assembly 3 to adjust.
It is further preferred that the second driver 85 is motor, or of the prior art other drive dress
Put, only need to realize the function driving screw mandrel 821 to rotate.
It is further preferred that driving means 8 also includes rotating limiter assembly, it is used for limiting nut block 822
Rotate in a circumferential direction under the drive of screw mandrel 821.Owing to screw mandrel 821 rotation can drive nut block 822 in week
To there being rotation, so that nut block 822 can not merely move along a straight line, the second spy can be affected
The accuracy that between head assembly 5 and the first probe assembly 3, spacing adjusts, then arranges rotary spacing group
Part, limits screw mandrel 821 and drives the circumferential movement of nut block 822, so that nut block 822 is only
Axis direction along screw mandrel 821 moves along a straight line, and improves the second probe assembly 5 and the first probe group
The accuracy that between part 3, spacing adjusts, improves the accuracy of detection of probe apparatus.
It is further preferred that rotary stopper assembly includes two the second track plates 83 and two the second slide blocks
84, two the second track plates 83 are vertically arranged and are parallel to screw mandrel 821, and the bottom of two track plates is solid
It is scheduled on chassis 1, and is positioned at the both sides of screw mandrel 821；Two the second slide blocks 84 are slidably arranged in respectively
On one the second track plates 83, bottom the two ends of the lower section of horizontal plate 41, fix one second cunning respectively
Block 84.
In this embodiment, when screw mandrel 821 rotates, owing to two cant boards 42 are positioned at the second track
The outer surface of plate 83, the second track plates 83 will limit the rotation of two cant boards 42, and then limits
Nut block 822 rotates along with screw mandrel 821 so that nut block 822 is only in the axis side of screw mandrel 821
Upwards move along a straight line；Meanwhile, the setting of the second track plates 83, screw mandrel 821 is born second and fixes
The bearing capacity of structure 4 is transferred on the second track plates 83, reduces the active force that screw mandrel 821 itself bears,
Thus screw mandrel 821 is played a protective role；Additionally also allow for horizontal plate 41 on the second track plates 83
Slide, it is easier to realize the movement towards or away from the first probe assembly 3 direction of second probe assembly 5.
As deformation, the quantity of the second slide block 84 can be two, three, four or five etc.,
Specifically arrange number according to actually used situation depending on, but at least provided with one on second track plates 83
Individual second slide block 84.
As further preferred embodiment, as shown in Figure 2 and Figure 5, chassis 1 offers two
First through hole 11, the two ends, bottom of first fixed structure 2 have the projection 21 downwardly extended, and two convex
Play 21 to lay respectively in first through hole 11, so that the first probe assembly 3 is positioned at the first through hole 11
In；Two cant boards 42 of the second fixed structure 4 lay respectively in first through hole 11；So that
Second probe assembly 5 is positioned at the first through hole 11.
In this embodiment, two the first through holes 11 that chassis 1 is offered so that be fixed on first solid
First probe assembly 3 and the second probe group being fixed on the second fixed structure 4 end of fixed structure 2
Part 5 is respectively positioned in the first through hole 11.When driving means 8 drives the second fixed structure 4 to move, the
The moving range of two probe assemblies 5 is limited in the first through hole 11；Meanwhile, the first probe assembly 3
Passing the first through hole 11 with the second probe assembly 5 and then touch the surface of wiring board to be detected, it is right to come
The impedance of wiring board detects so that the first probe assembly 3 and the second probe assembly 5 are on chassis 1
Upper layout more compact, the space taken is less.
It is further preferred that the profile of the first through hole 11 is rectangle, or square, or circular,
Or other shapes can.
As deformation, the number of above-mentioned first through hole 11 can be two, three, four fire five etc.
Deng, specifically arrange number according to actually used situation depending on.
As further preferred embodiment, above-mentioned probe apparatus also includes rotary apparatus, is used for
Chassis 1 is driven to drive the first probe assembly 3 and the second probe assembly 5 to rotate in the horizontal direction, with
Change the first probe assembly 3 and the second probe assembly 5 angle in the horizontal direction, convenient to circuit
On plate, the location point of various location carries out testing impedance.
As preferably, rotary apparatus include rotating disk 91, at least one connect post 92, fixed block 94
With the 3rd driver 93.Wherein, rotating disk 91 is parallel with chassis 1；The top connecting post 92 is fixed
In rotating disk 91, bottom is fixed on chassis 1；3rd driver 93 is fixed on fixed block 94,
Its rotary shaft is connected to rotating disk 91 through fixed block 94.3rd driver 93 drives rotating disk 91 to carry
The first probe assembly 3 and the second probe assembly 5 that arrange on dynamic chassis 1 and chassis turn in the horizontal direction
Dynamic, it is achieved the location point of various location on wiring board is carried out testing impedance.
Further, as in figure 2 it is shown, start two the second through holes 16 on chassis 1, connecting post 92 is
Two, rotating disk 91 correspondingly offers two third through-holes, connect the bottom of post 92 and be fixed on the
On two through holes 16, top is fixed on third through-hole.More preferably, connecting post 92 is screw rod, screw rod
Top is located on third through-hole, and bottom is located on the second through hole 16, then with nut by the end of screw rod
Portion and top are locked on the second through hole 16 and third through-hole respectively.
As deformation, rotary apparatus can also for prior art can drive chassis 1 rotates other
Device.
As the most preferred embodiment, above-mentioned probe apparatus also includes the second lowering or hoisting gear 10,
For driving fixed block 94 to drive chassis 1 to move up and down.
Preferred as the second lowering or hoisting gear 10, as shown in Figure 6, the second lowering or hoisting gear 10 includes erecting
Straight two the 3rd track plates 102 arranged, are slidably arranged in two on two the 3rd track plates 102 respectively
Individual 3rd slide block 103, the 3rd fixed structure 101 being vertically arranged, the 3rd fixed structure 101 side is solid
Being scheduled on the 3rd slide block 103, opposite side is fixed on fixed block 94；For driving the 3rd fixed structure
101 fourth drives 104 slided on the 3rd track plates 102.
Under the effect of fourth drive 104, the 3rd fixed structure 101 is driven to drive fixed block 94 to exist
Slide on 3rd track plates 102, and then dish 91, chassis 1 and the One On The Chassis first spy are rotated
Head assembly 3 and the second probe assembly 5 entirety move up and down on vertically.
It is further preferred that arrange block piece on the top and bottom of the 3rd track plates 102 so that
The scope that 3rd slide block 103 in the vertical direction slides is limited in the space between two block pieces.
Additionally, the 3rd track plates 102 in the second above-mentioned lowering or hoisting gear 10 is by the second connecting plate 17
It is fixed in frame；Four-drive device 8 is arranged on the second connecting plate 17, and its drive shaft is through the
Two connecting plates 17 are connected to the 3rd fixed structure 101；Or the 3rd track plates 102 is by the second connection
Plate 17 is fixed on other support, or the miscellaneous part matched with the probe apparatus of impedance detection
On, as the support member of whole probe apparatus.
As deformation, the second lowering or hoisting gear 10 can also be the lowering or hoisting gear of other structures in prior art.
As preferred embodiment, as in figure 2 it is shown, the first probe assembly 3 in above-mentioned embodiment
Or second probe assembly 5 include casing 12, lid 13, probe 14, binding post 15 and cable.
Casing 12 is vertically arranged, and a sidewall of casing 12 is fixed on rebound 63, and another sidewall is opening,
Lid 13 is arranged on this opening；Probe 14 is located on casing 12, and its one end is positioned at casing 12
In, the other end is positioned at outside casing 12, and downwardly extends；Binding post 15 is arranged on the top of casing 12
In portion, and it is positioned at outside casing 12 and is connected to test instrunment；Cable is positioned at casing 12, and bottom connects
Being connected to one end of probe 14, top is connected to binding post 15.
As deformation, the first probe assembly 3 or the second probe assembly 5 can also be of the prior art
Impedance detection is popped one's head in.
Obviously, above-described embodiment is only for clearly demonstrating example, and not to embodiment party
The restriction of formula.For those of ordinary skill in the field, the most also may be used
To make other changes in different forms.Here without also all of embodiment being given
With exhaustive.And the obvious change thus extended out or variation are still in the guarantor of the invention
Protect among scope.
Claims (12)
1. the probe apparatus of an impedance detection, it is characterised in that include
Chassis (1)；
First fixed structure (2), is perpendicular to described chassis (1) and arranges, and bottom is fixed on described chassis
(1) on；
At least one first probe assembly (3), is vertically arranged in the end of described first fixed structure (2)
In portion；
Second fixed structure (4), parallel with described first fixed structure (2), by driving means (8)
It is movably disposed on described chassis (1)；
At least one second probe assembly (5), is vertically arranged in the end of described second fixed structure (4)
In portion, with described first probe assembly (3) correspondingly relative to and coordinate for detecting wiring board
Impedance；Under the movement of described second fixed structure (4), drive described second probe assembly (5)
Move towards or away from described first probe assembly (3) direction；
At least two the first lowering or hoisting gear (6), at least one described first lowering or hoisting gear (6) is arranged on
On the end of described first fixed structure (2), and at least another described first lowering or hoisting gear (6)
It is arranged on the end of described second fixed structure (4), for driving described first probe assembly respectively
(3) and the second probe assembly (5) vertically moves up and down.
The probe apparatus of impedance detection the most according to claim 1, it is characterised in that: also include to
Few two the first connecting plates (7), it is solid that at least one described first connecting plate (7) is fixed on described first
On fixed structure (2), and at least another described first connecting plate (7) be fixed on described second fix
In structure (4)；
Wherein, the one of described first connecting plate (7) being fixed on described first fixed structure (2)
End stretches out in described first fixed structure (2) and is provided with one end of described first probe assembly (3),
The first sidepiece installing space is formed, at least one described first lifting with described first fixed structure (2)
Device (6) is arranged in described first sidepiece installing space, and is fixed on this described first connecting plate (7)
On；
The one end of described first connecting plate (7) being fixed on described second fixed structure (4) is stretched out
One end of described second probe assembly (5) it is provided with, with described in described second fixed structure (4)
Second fixed structure (4) forms the second sidepiece installing space, at least another described first lowering or hoisting gear
(6) it is arranged in described second sidepiece installing space, and is fixed on this described first connecting plate (7)
On.
The probe apparatus of impedance detection the most according to claim 2, it is characterised in that: described first
Lowering or hoisting gear (6) includes
First track plates (61), is vertically arranged in described first fixed structure (2) or the second fixed knot
On the end wall of structure (4)；
First slide block (62), is slidably arranged on described first track plates (61)；
Rebound (63), is vertically arranged, and a sidewall is fixed on described first slide block (62), another
Described first probe assembly (3) or the second probe assembly (5) is fixed on sidewall；
First driver (64), is fixed on described first connecting plate (7), and its drive shaft passes institute
State the first connecting plate (7) and be connected to described rebound (63).
4. according to the probe apparatus of the impedance detection according to any one of claim 1-3, it is characterised in that:
Described first probe assembly (3) is two, and described second probe assembly (5) is two, two institutes
State the first probe assembly (3) to be separately fixed on the both ends of described first fixed structure (2)；Two
Individual described second probe assembly (5) is separately fixed on the both ends of described second fixed structure (4).
5. according to the probe apparatus of the impedance detection according to any one of claim 1-3, it is characterised in that:
Described second fixed structure (4) includes
Horizontal plate (41), described first connecting plate (7) is fixed on horizontal plate (41)；
Two cant boards (42), are separately fixed on the both ends of described horizontal plate (41), and vertically
Downwardly extending in described horizontal plate (41), described second probe assembly (5) is arranged on described cant board
(42) on wall outer surface.
The probe apparatus of impedance detection the most according to claim 5, it is characterised in that: described driving
Device (8) includes
Installing plate (81), parallel with described horizontal plate (41), bottom is fixed on described chassis (1)
On；
Screw mandrel (821) assembly is that be positioned at described second fixed structure (4) with described first fixed knot
The side that structure (2) is relative, including screw mandrel (821) and the nut that is set on described screw mandrel (821)
Block (822), described nut block (822) is fixed on the lower section of horizontal plate (41), described screw mandrel (821)
Sequentially pass through described installing plate (81), the lower section of described horizontal plate (41), and end to stretch into and be opened in
In through hole on described first fixed structure (2)；
Second driver (85), is fixed on described installing plate (81), is used for driving described screw mandrel (821)
Rotate；
Rotate limiter assembly, be used for limiting nut block (822) under the drive of described screw mandrel (821)
Rotate in a circumferential direction.
The probe apparatus of impedance detection the most according to claim 6, it is characterised in that described rotation
Limiter assembly includes
Two the second track plates (83), are vertically arranged and are parallel to described screw mandrel (821), described in two
The bottom of the second track plates (83) is fixed on described chassis (1), and is positioned at described screw mandrel (821)
Both sides；
At least two the second slide block (84), at least one described second slide block (84) is slidably arranged in one
On individual described second track plates (83), solid respectively bottom the two ends of the lower section of described horizontal plate (41)
Surely there is at least one described second slide block (84).
8. according to the probe apparatus of the impedance detection according to any one of claim 1-7, it is characterised in that:
At least two the first through hole (11) is offered on described chassis (1)；
The two ends, bottom of described first fixed structure (2) have a projection (21) downwardly extended, two
Described projection (21) lays respectively in described first through hole (11), so that described first probe
Assembly (3) is positioned at described first through hole (11)；
Two described cant boards (42) of described second fixed structure (4) lay respectively at one described
In one through hole (11)；So that described second probe assembly (5) is positioned at described first through hole (11).
9. according to the probe apparatus of the impedance detection according to any one of claim 1-3, it is characterised in that:
Also include rotary apparatus, be used for driving described chassis (1) drive described first probe assembly (3) and
Second probe assembly (5) rotates in the horizontal direction.
The probe apparatus of impedance detection the most according to claim 9, it is characterised in that: described rotation
Rotary device includes
Rotating disk (91), parallel with described chassis (1)；
At least one connects post (92), and bottom is fixed on described chassis (1), and top is fixed on institute
State on the bottom of rotating disk (91)；
Fixed block (94)；
3rd driver (93), is fixed on described fixed block (94), and its rotary shaft is through described solid
Determine block (94) and be connected to described rotating disk (91).
The probe apparatus of 11. impedance detection according to claim 10, it is characterised in that: also include
Second lowering or hoisting gear (10), is used for driving described fixed block (94) to drive described chassis (1) to rise
Fall motion.
The probe apparatus of 12. impedance detection according to claim 11, it is characterised in that: described
Two lowering or hoisting gears (10) include
3rd track plates (102), is two, is vertically arranged；
3rd slide block (103), is two, is slidably arranged in described 3rd track plates (102) respectively
On；
3rd fixed structure (101), is vertically arranged, and side is fixed on described 3rd slide block (103),
Opposite side is fixed on described fixed block (94)；
Fourth drive (104), is used for driving described 3rd fixed structure (101) at described 3rd rail
Guidance tape (102) is upper to slide.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610380695.XA CN105911355B (en) | 2016-05-31 | 2016-05-31 | A kind of probe apparatus of impedance detection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610380695.XA CN105911355B (en) | 2016-05-31 | 2016-05-31 | A kind of probe apparatus of impedance detection |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105911355A true CN105911355A (en) | 2016-08-31 |
| CN105911355B CN105911355B (en) | 2018-11-09 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610380695.XA Expired - Fee Related CN105911355B (en) | 2016-05-31 | 2016-05-31 | A kind of probe apparatus of impedance detection |
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| Country | Link |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020133791A1 (en) * | 2018-12-27 | 2020-07-02 | 南京协辰电子科技有限公司 | Double probe system and printed circuit board detecting device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0974845A1 (en) * | 1998-07-08 | 2000-01-26 | Christian Leth Petersen | Apparatus for testing electric properties using a multi-point probe |
| CN102288826A (en) * | 2011-09-08 | 2011-12-21 | 南京工业职业技术学院 | Impedance probe head with two-in-one characteristic |
| CN203385768U (en) * | 2013-07-15 | 2014-01-08 | 广东正业科技股份有限公司 | Characteristic impedance type probe |
| CN205049621U (en) * | 2015-10-20 | 2016-02-24 | 肖体春 | Probe station |
| CN205898897U (en) * | 2016-05-31 | 2017-01-18 | 南京协辰电子科技有限公司 | Impedance detection's probe unit |
-
2016
- 2016-05-31 CN CN201610380695.XA patent/CN105911355B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0974845A1 (en) * | 1998-07-08 | 2000-01-26 | Christian Leth Petersen | Apparatus for testing electric properties using a multi-point probe |
| CN102288826A (en) * | 2011-09-08 | 2011-12-21 | 南京工业职业技术学院 | Impedance probe head with two-in-one characteristic |
| CN203385768U (en) * | 2013-07-15 | 2014-01-08 | 广东正业科技股份有限公司 | Characteristic impedance type probe |
| CN205049621U (en) * | 2015-10-20 | 2016-02-24 | 肖体春 | Probe station |
| CN205898897U (en) * | 2016-05-31 | 2017-01-18 | 南京协辰电子科技有限公司 | Impedance detection's probe unit |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020133791A1 (en) * | 2018-12-27 | 2020-07-02 | 南京协辰电子科技有限公司 | Double probe system and printed circuit board detecting device |
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| Publication number | Publication date |
|---|---|
| CN105911355B (en) | 2018-11-09 |
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