CN104133302A - Intense laser sampling attenuator - Google Patents

Intense laser sampling attenuator Download PDF

Info

Publication number
CN104133302A
CN104133302A CN201410354915.2A CN201410354915A CN104133302A CN 104133302 A CN104133302 A CN 104133302A CN 201410354915 A CN201410354915 A CN 201410354915A CN 104133302 A CN104133302 A CN 104133302A
Authority
CN
China
Prior art keywords
sampling
plate
hole
diffuse reflection
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201410354915.2A
Other languages
Chinese (zh)
Other versions
CN104133302B (en
Inventor
庞淼
张卫
胡晓阳
周文超
高学燕
周山
何均章
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Applied Electronics of CAEP
Original Assignee
Institute of Applied Electronics of CAEP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Applied Electronics of CAEP filed Critical Institute of Applied Electronics of CAEP
Priority to CN201410354915.2A priority Critical patent/CN104133302B/en
Publication of CN104133302A publication Critical patent/CN104133302A/en
Application granted granted Critical
Publication of CN104133302B publication Critical patent/CN104133302B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Lasers (AREA)

Abstract

The invention discloses an intense laser sampling attenuator. A diffuse reflection sampling plate is arranged on the upper portion of the interior of the sampling attenuator, and the lower portion of the diffuse reflection sampling plate is sequentially and fixedly connected with an attenuation cavity plate, a sampling laser scattering plate and an attenuation base plate. Diffuse transmission materials are arranged between the sampling laser scattering plate and the attenuation base plate. The diffuse reflection sampling plate is used for conducting diffuse reflection on non-sampled intense lasers and has a high damage threshold, a through hole in the diffuse reflection sampling plate is used for conducting space sampling on laser beams, the sampling laser scattering plate is used for conducting diffuse reflection on sampled intense lasers, an attenuation cavity is used for conducting attenuation and homogenization on the sampled lasers, the diffuse transmission materials are used for sampling the scattered and homogenized lasers again, and a through hole in the attenuation base plate is used for conducting attenuation on the diffuse transmission sampled lasers again. By means of the intense laser sampling attenuator, the problem that the intense lasers which last for about tens of seconds and are 10 Kw/cm<2> in power density cannot be directly sampled and attenuated by an existing sampling attenuator is solved, and the important promoting effect on intense laser parameter measurement is achieved.

Description

A kind of light laser sampling attenuator
Technical field
The invention belongs to laser parameter measurement technical field, be specifically related to a kind of light laser sampling attenuator.
Background technology
Measure in application in light laser, conventionally need to first carry out space samples and decay with sampling attenuator to laser beam, the sampling attenuator of prior art can bear certain energy density, but can not the light laser of tens of seconds duration be sampled and be decayed.
Summary of the invention
In order to overcome the deficiency that in prior art, laser sampling attenuator can not sample and decay the light laser of tens of seconds duration, the invention provides a kind of light laser sampling attenuator, can reach 10kW/cm to power density 2light laser carry out tens of seconds time samplings and decay.
The present invention is achieved by the following technical solution:
A kind of light laser sampling attenuator of the present invention, is characterized in, described sampling attenuator profile is column, comprises diffuse reflection sampling plate, damping chamber plate, sampling light diffuser plate, diffuse transmission material, decay base plate.
Described diffuse reflection sampling plate is for carrying out 95% above diffuse reflection to non-sampling light laser;
On described diffuse reflection sampling plate, be provided with through hole for incoming laser beam is carried out to spatial intensity distribution sampling;
On described damping chamber plate, be provided with damping chamber for decay and homogenize sampling light laser, can adjust decay multiplying power by the physical dimension that changes damping chamber;
Described sampling light diffuser plate is for carrying out diffuse reflection to sampling light laser;
Described diffuse transmission material is for again sampling the sampling light of dispersing after homogenize;
On described decay base plate, be provided with through hole for diffuse transmission sampling laser is decayed again, can adjust decay multiplying power by adjusting through hole length;
The top of described sampling attenuator is provided with diffuse reflection sampling plate, and diffuse reflection sampling plate bottom is fixedly connected with damping chamber plate, sampling light diffuser plate, decay base plate successively; Diffuse reflection sampling plate is axially provided with circular through hole I; The upper axial of damping chamber plate is provided with circular through hole II, and lower shaft is to being provided with damping chamber; Described sampling light diffuser plate be axially provided with manhole III; Described decay base plate be axially provided with manhole IV; Through hole II, through hole III communicate with damping chamber respectively, and through hole II and through hole III be axially parallel setting, (being that the projection on sampling light diffuser plate of through hole II and through hole III is non-intersect).Described diffuse transmission material is placed in the through hole III of sampling light diffuser plate, and the upper surface of diffuse transmission material is concordant with the step in the through hole III sampling on light diffuser plate, and the lower surface of diffuse transmission material is concordant with the upper surface of decay base plate.
Described through hole I and through hole II are concentric setting.
Described through hole III and through hole IV are concentric setting.
Being shaped as of described damping chamber is circular or square.
The diameter of described diffuse transmission material is greater than the diameter of through hole III, through hole IV.
Described diffuse reflection sampling plate material adopts the red copper through special process processing, and special process is the first sandblast of sensitive surface, and rear gold-plated, remaining surface is gold-plated.
Described damping chamber plate material is graphite or blackout aluminium.
Described sampling light diffuser plate material adopts red copper or the aluminium through special process processing, and special process is the first sandblast of sensitive surface, rear gold-plated.
Described diffuse transmission material is opal glass or diffuse transmission pottery.
The material of described decay base plate is blackout aluminium.
The present invention carries out 95% above diffuse reflection with the diffuse reflection sampling plate with high damage thresholding to non-sampling light laser, use aperture to carry out space samples to incoming laser beam, with the sampling light diffuser plate with high damage thresholding, high power density is sampled to light and carry out diffuse reflection, and disperse and homogenize sampling laser with the cylindricality damping chamber of graphite or blackout aluminum, use diffuse transmission material and decay passage to carry out again sub-sampling and decay to the laser of dispersing after homogenize, thereby realize sampling and decay to light laser.
Light laser sampling attenuator of the present invention has solved tens of seconds of duration, power density arrives 10kW/cm 2light laser conventional method cannot direct sample and the problem of decay, there is important facilitation for light laser parameter measurement.
Brief description of the drawings
Fig. 1 is the structural representation of light laser sampling attenuator of the present invention;
In figure, 1. diffuse reflection sampling plate 2. damping chamber plates 3. sample the light diffuser plate 4. diffuse transmission materials 5. base plate 6. through hole I 7. through hole II 8. damping chamber 9. through hole III 10. through hole IV that decay.
Embodiment
Below in conjunction with accompanying drawing and specific embodiment, the present invention is described in detail.
Embodiment 1
Fig. 1 is the structural representation of light laser sampling attenuator of the present invention.In Fig. 1, light laser sampling attenuator profile of the present invention is square, comprises diffuse reflection sampling plate 1, damping chamber plate 2, sampling light diffuser plate 3, diffuse transmission material 4, decay base plate 5;
Described diffuse reflection sampling plate 1 is for carrying out 95% above diffuse reflection to non-sampling light laser;
On described diffuse reflection sampling plate 1, be provided with through hole for incoming laser beam is carried out to spatial intensity distribution sampling;
On described damping chamber plate 2, be provided with damping chamber for decay and homogenize sampling light laser, can adjust decay multiplying power by the physical dimension that changes damping chamber;
Described sampling light diffuser plate 3 is for carrying out diffuse reflection to sampling light laser;
Described diffuse transmission material 4 is for again sampling the sampling light of dispersing after homogenize;
On described decay base plate 5, be provided with through hole for diffuse transmission sampling laser is decayed again, can adjust decay multiplying power by adjusting through hole length;
The top of described sampling attenuator is provided with diffuse reflection sampling plate 1, and diffuse reflection sampling plate 1 bottom is fixedly connected with damping chamber plate 2, sampling light diffuser plate 3, decay base plate 5 successively; Diffuse reflection sampling plate 1 is axially provided with circular through hole I 6; The upper axial of damping chamber plate 2 is provided with circular through hole II 7, and lower shaft is to being provided with damping chamber 8; Described sampling light diffuser plate 3 be axially provided with manhole III 9; Described decay base plate 5 be axially provided with manhole IV 10; Through hole II 7, through hole III 9 communicate with damping chamber 8 respectively, and through hole II 7 be axially parallel setting with through hole III 9, (are through hole II 7 with through hole III 9 to sample projection on light diffuser plate 3 non-intersect; Described diffuse transmission material 4 is placed in the through hole III 9 of sampling light diffuser plate 3, and the upper surface of diffuse transmission material 4 is concordant with the step in the through hole III 9 sampling on light diffuser plate 3, and the lower surface of diffuse transmission material 4 is concordant with the upper surface of decay base plate 5.
Described through hole I 6 is concentric setting with through hole II 7.
Described through hole III 9 is concentric setting with through hole IV 10.
Being shaped as of described damping chamber 8 is circular or square.
The diameter of described diffuse transmission material 4 is greater than the diameter of through hole III 9, through hole IV 10.
Described diffuse reflection sampling plate 1 material adopts the red copper through special process processing, and special process is the first sandblast of sensitive surface, and rear gold-plated, remaining surface is gold-plated.
Described sampling light diffuser plate 3 materials adopt red copper or the aluminium through special process processing, and special process is the first sandblast of sensitive surface, rear gold-plated.
In the present embodiment, described damping chamber plate 2 materials are graphite; Described diffuse transmission material 4 is opal glass; The material of described decay base plate 5 is blackout aluminium; Damping chamber 8 be shaped as circle.
Embodiment 2
The present embodiment is identical with the structure of embodiment 1, and difference is that the profile of described light laser sampling attenuator is circular; Described damping chamber plate material is blackout aluminium; Described diffuse transmission material is diffuse transmission pottery; Being shaped as of damping chamber is square.
It should be noted last that, above embodiment is only unrestricted in order to the present invention to be described, although the present invention is had been described in detail with reference to preferred embodiment, those of ordinary skill in the art is to be understood that, can modify or be equal to replacement the present invention, and not departing from the spirit and scope of the present invention, it all should be encompassed in the middle of franchise claimed range of the present invention.

Claims (9)

1. a light laser sampling attenuator, is characterized in that: described sampling attenuator profile is column, comprises diffuse reflection sampling plate (1), damping chamber plate (2), sampling light diffuser plate (3), diffuse transmission material (4), decay base plate (5);
Described diffuse reflection sampling plate (1) is for carrying out diffuse reflection to non-sampling light laser;
On described diffuse reflection sampling plate (1), be provided with through hole for incoming laser beam is carried out to spatial intensity distribution sampling;
On described damping chamber plate (2), be provided with damping chamber for decay and homogenize sampling light laser;
Described sampling light diffuser plate (3) is for carrying out diffuse reflection to sampling light laser;
Described diffuse transmission material (4) is for again sampling the sampling light of dispersing after homogenize;
On described decay base plate (5), be provided with through hole for diffuse transmission sampling laser is decayed again;
The top of described sampling attenuator is provided with diffuse reflection sampling plate (1), and diffuse reflection sampling plate (1) bottom is fixedly connected with damping chamber plate (2), sampling light diffuser plate (3), decay base plate (5) successively; Diffuse reflection sampling plate (1) is axially provided with circular through hole I (6); The upper axial of damping chamber plate (2) is provided with circular through hole II (7), and lower shaft is to being provided with damping chamber (8); Described sampling light diffuser plate (3) be axially provided with manhole III (9); Described decay base plate (5) be axially provided with manhole IV (10); Through hole II (7), through hole III (9) communicate with damping chamber (8) respectively, and through hole II (7) is axially parallel setting with through hole III (9); Described diffuse transmission material (4) is placed in the through hole III (9) of sampling light diffuser plate (3), the upper surface of diffuse transmission material (4) is concordant with the step in the through hole III (9) sampling on light diffuser plate (3), and the lower surface of diffuse transmission material (4) is concordant with the upper surface of decay base plate (5).
2. light laser sampling attenuator according to claim 1, is characterized in that: described through hole I (6) is concentric setting with through hole II (7).
3. light laser sampling attenuator according to claim 1, is characterized in that: described through hole III (9) is concentric setting with through hole IV (10).
4. light laser sampling attenuator according to claim 1, is characterized in that: being shaped as of described damping chamber (8) is circular or square.
5. light laser sampling attenuator according to claim 1, is characterized in that: described diffuse reflection sampling plate (1) material adopts red copper, and in the first sandblast of red copper sensitive surface, rear gold-plated, remaining surface is gold-plated.
6. light laser sampling attenuator according to claim 1, is characterized in that: described damping chamber plate (2) material adopts graphite or blackout aluminium.
7. light laser sampling attenuator according to claim 1, is characterized in that: described sampling light diffuser plate (3) material adopts red copper or aluminium, in the first sandblast of sensitive surface of red copper or aluminium, rear gold-plated.
8. light laser sampling attenuator according to claim 1, is characterized in that: described diffuse transmission material (4) is opal glass or diffuse transmission pottery.
9. light laser sampling attenuator according to claim 1, is characterized in that: the material of described decay base plate (5) is blackout aluminium.
CN201410354915.2A 2014-07-24 2014-07-24 A kind of light laser sampling attenuator Active CN104133302B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410354915.2A CN104133302B (en) 2014-07-24 2014-07-24 A kind of light laser sampling attenuator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410354915.2A CN104133302B (en) 2014-07-24 2014-07-24 A kind of light laser sampling attenuator

Publications (2)

Publication Number Publication Date
CN104133302A true CN104133302A (en) 2014-11-05
CN104133302B CN104133302B (en) 2016-10-05

Family

ID=51806040

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410354915.2A Active CN104133302B (en) 2014-07-24 2014-07-24 A kind of light laser sampling attenuator

Country Status (1)

Country Link
CN (1) CN104133302B (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105953914A (en) * 2016-06-13 2016-09-21 中科同德(厦门)物联网科技有限公司 Illumination detection method
CN106768310A (en) * 2017-01-22 2017-05-31 中国工程物理研究院应用电子学研究所 A kind of superlaser detector array sampling attenuating device
CN108181674A (en) * 2016-12-08 2018-06-19 高利通科技(深圳)有限公司 A kind of general strong optical attenuator and its strong light spectral measurement system
CN108333147A (en) * 2017-12-14 2018-07-27 中国科学院西安光学精密机械研究所 Nearly backscattering optics measuring system
CN109579983A (en) * 2018-12-27 2019-04-05 西北核技术研究所 Beam sampling device for superlaser light distribution parameter measurement
CN109579984A (en) * 2018-12-27 2019-04-05 西北核技术研究所 A kind of laser beam homogenizes attenuator
CN114674425A (en) * 2022-03-25 2022-06-28 西北核技术研究所 Cascade attenuation structure based on light pipe sampling, installation method and detection array

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201053898Y (en) * 2007-06-21 2008-04-30 北京光电技术研究所 Uneven light removing device and laser detector
CN102706446A (en) * 2012-05-18 2012-10-03 中国工程物理研究院应用电子学研究所 Large-angle used sampling attenuation device of array detector
CN103644967A (en) * 2013-11-29 2014-03-19 西北核技术研究所 High-energy laser homogenizing cavity attenuator
CN203982016U (en) * 2014-07-24 2014-12-03 中国工程物理研究院应用电子学研究所 A kind of light laser sampling attenuator

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201053898Y (en) * 2007-06-21 2008-04-30 北京光电技术研究所 Uneven light removing device and laser detector
CN102706446A (en) * 2012-05-18 2012-10-03 中国工程物理研究院应用电子学研究所 Large-angle used sampling attenuation device of array detector
CN103644967A (en) * 2013-11-29 2014-03-19 西北核技术研究所 High-energy laser homogenizing cavity attenuator
CN203982016U (en) * 2014-07-24 2014-12-03 中国工程物理研究院应用电子学研究所 A kind of light laser sampling attenuator

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105953914A (en) * 2016-06-13 2016-09-21 中科同德(厦门)物联网科技有限公司 Illumination detection method
CN108181674A (en) * 2016-12-08 2018-06-19 高利通科技(深圳)有限公司 A kind of general strong optical attenuator and its strong light spectral measurement system
CN106768310A (en) * 2017-01-22 2017-05-31 中国工程物理研究院应用电子学研究所 A kind of superlaser detector array sampling attenuating device
CN106768310B (en) * 2017-01-22 2018-04-10 中国工程物理研究院应用电子学研究所 A kind of superlaser detector array sampling attenuating device
CN108333147A (en) * 2017-12-14 2018-07-27 中国科学院西安光学精密机械研究所 Nearly backscattering optics measuring system
CN108333147B (en) * 2017-12-14 2024-04-12 中国科学院西安光学精密机械研究所 Near back scattering optical measurement system
CN109579983A (en) * 2018-12-27 2019-04-05 西北核技术研究所 Beam sampling device for superlaser light distribution parameter measurement
CN109579984A (en) * 2018-12-27 2019-04-05 西北核技术研究所 A kind of laser beam homogenizes attenuator
CN114674425A (en) * 2022-03-25 2022-06-28 西北核技术研究所 Cascade attenuation structure based on light pipe sampling, installation method and detection array

Also Published As

Publication number Publication date
CN104133302B (en) 2016-10-05

Similar Documents

Publication Publication Date Title
CN104133302A (en) Intense laser sampling attenuator
Tian et al. Femtosecond-laser-driven wire-guided helical undulator for intense terahertz radiation
Mourou et al. Single cycle thin film compressor opening the door to Zeptosecond-Exawatt physics
Liu et al. High-power wavelength-tunable photonic-crystal-fiber-based oscillator-amplifier-frequency-shifter femtosecond laser system and its applications for material microprocessing
CN203337576U (en) Multifunctional secondary electronic emission coefficient analyzing and testing device
Wang et al. Setup of a photomultiplier tube test bench for LHAASO-KM2A
Ni et al. Study on quantitative analysis of slag based on spectral normalization of laser-induced plasma image
CN102706446A (en) Large-angle used sampling attenuation device of array detector
CN203982016U (en) A kind of light laser sampling attenuator
WO2009028506A1 (en) Plasma processing apparatus, plasma processing method and end point detecting method
CN105067572A (en) Method and device for enhancing laser-induced plasma signal
CN204807403U (en) Steel pipe concrete member draws and presses tired real -time supervision device under high temperature
CN109283447A (en) Photomultiplier tube linear measuring system and method
Hugenschmidt et al. Surface and bulk investigations at the high intensity positron beam facility NEPOMUC
CN103808747B (en) A kind of X-ray spectrometer measuring full element
Liu et al. Enhancement of multi-filament generation and filament-induced fluorescence by turbulence
CN103639600B (en) Method for changing grating structure period by utilizing electronic dynamic regulation and control
CN204044069U (en) Micro-confocal fluorescent system
Trevitt et al. Calibration of a quadrupole ion trap for particle mass spectrometry
CN202582721U (en) Photometric measurement integrating sphere in which lamp can be rapidly installed
Ma et al. Damage growth characteristics of different initial damage sites of fused silica under 355 nm small laser beam irradiation
GB201208183D0 (en) Apparatus and method for measuring particle size distribution by light scattering
CN204085533U (en) A kind of device of X-ray pulse detector test calibration light source
CN204596442U (en) Scattering-low dosage-rotation energetic ion irradiation device
CN112051131A (en) Method for preparing total alpha and total beta detection sample source in water

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant