CN108333147B - Near back scattering optical measurement system - Google Patents
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- CN108333147B CN108333147B CN201711341525.1A CN201711341525A CN108333147B CN 108333147 B CN108333147 B CN 108333147B CN 201711341525 A CN201711341525 A CN 201711341525A CN 108333147 B CN108333147 B CN 108333147B
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
Abstract
The invention belongs to the technical field of optical measurement, and particularly relates to a near back scattering optical measurement system, which comprises a sampling device and a measuring device, and is characterized in that: the sampling device comprises a spherical vacuum target chamber and a system imaging lens, wherein a target point and a scattering plate are arranged in the spherical vacuum target chamber; near back scattering light generated by the incidence target point of the targeting laser is scattered along the targeting reverse direction and then is diffusely reflected by the scattering plate, and the diffusely reflected light passes through a measuring window on the spherical vacuum target chamber and then enters the measuring device through the imaging lens of the system. The invention solves the technical problem that the existing back scattering diagnosis technology has low damage threshold value, so that the near back scattering light measurement requirement of a large-scale laser driving device is difficult to meet.
Description
Technical Field
The invention belongs to the technical field of optical measurement, and particularly relates to a near back scattering optical measurement system.
Background
The laser nuclear fusion is an artificially controllable nuclear fusion which is commonly adopted at present, and has great research significance in civil use and military use: exploring an inexhaustible clean nuclear energy source for human beings; the method is used for developing a 'clean' (no radiation pollution) nuclear weapon and developing a high-energy laser weapon; partial replacement nuclear experiments.
Therefore, laser nuclear fusion is highly valued by the large countries of the world, and the development of high-power laser drivers is successively started in russia, america, sun, law, middley, english and other countries from the last half of the 70 th year of the 20 th century. Research in this area of the united states is leading and formally built into an oversized laser driving device "NIF" containing 192 passes in 2009; the MLF being built in france contains 240 lasers; japan is also planning to build large-scale laser drivers and plan to complete basic technical research applicable to power generation in 2015-2020. China also established a series of laser driving devices (starlight series, nerve light series, etc.), the largest domestic laser driving device "nerve light-iii" that completed construction in 2015 contained 48 laser lines.
However, the ignition of the us NIF in 2010 was unsuccessful, which caused a major shock worldwide. Subsequent studies of NIF found that the theoretical model originally verified on smaller scale laser drivers was no longer applicable on NIF, the back-scattered fraction of NIF targeting laser was greatly exceeded the original expected value, targeting laser energy was greatly diminished, fusion fuel compression symmetry was destroyed, resulting in ignition failure, and thus it was seen that the back-scattered measurement system played an irreplaceable role in recognizing a new laser driver.
Research on backscattering in China starts earlier, and the development of backscattering diagnosis technology is approximately subjected to two stages:
in the first stage, the glass spherical mirror is adopted to sample the near back scattered light and then the near back scattered light is measured, but the object, the mirror body normal direction and the image of the scheme are necessarily in the same straight line, and the arrangement mode is too hard and has no flexibility;
in the second stage, the aluminum off-axis ellipsoidal mirror is adopted to measure after the near-back scattered light is focused, any light path layout can be realized by adjusting the off-axis quantity, the flexibility is extremely high, the focusing is very ideal, but the laser damage threshold of the metal mirror surface is lower (less than 1J/cm) 2 ) Limited application on larger scale laser driving devices.
Disclosure of Invention
The invention aims to provide a near back scattering optical measurement system, which solves the technical problem that the existing back scattering diagnosis technology is difficult to meet the near back scattering optical measurement requirement of a large-scale laser driving device because of low damage threshold.
The technical scheme of the invention is as follows: the utility model provides a near back scattering optical measurement system, includes sampling device and measuring device, its special character lies in: the sampling device comprises a spherical vacuum target chamber and a system imaging lens, wherein a target point and a scattering plate are arranged in the spherical vacuum target chamber; near back scattering light generated by the incidence target point of the targeting laser is scattered along the targeting reverse direction and then is diffusely reflected by the scattering plate, and the diffusely reflected light passes through a measuring window on the spherical vacuum target chamber and then enters the measuring device through the imaging lens of the system.
Further, the measuring device comprises a beam shrinking mirror and a dichroic mirror which are sequentially arranged along the light path propagation direction; after the spectrum of the dichroic mirror is separated, the long wave is transmitted into the long wave transmission light measuring unit, and the short wave is reflected into the short wave reflection light measuring unit.
Further, the long-wave transmitted light measuring unit comprises a long-wave camera sampling mirror, a long-wave spectrum time sampling mirror and a long-wave energy measuring focusing mirror which are sequentially arranged along the light path propagation direction; the long-wave camera sampling mirror reflects part of the long-wave transmitted light and then images the part of the long-wave transmitted light on the long-wave camera through the long-wave camera imaging lens; after the long-wave spectrum time sampling mirror reflects the other part of long-wave transmitted light, the long-wave spectrum time sampling mirror is coupled to a long-wave spectrum time measurement image surface through a long-wave spectrum time measurement coupling mirror, a long-wave time measurement fast photoelectric tube and a long-wave spectrum sampling optical fiber are arranged on the long-wave spectrum time measurement image surface, and the long-wave spectrum sampling optical fiber is connected with a spectrometer; the long wave energy measuring focusing lens focuses the rest long wave transmitted light on a long wave energy calorie meter probe;
the short-wave reflected light measuring unit comprises a short-wave camera sampling mirror, a short-wave spectrum time sampling mirror and a short-wave energy measuring focusing mirror which are sequentially arranged along the light path propagation direction; after the sampling mirror of the short-wave camera reflects a part of short-wave reflected light, imaging the part of short-wave reflected light on the short-wave camera through the imaging lens of the short-wave camera; after reflecting the other part of short-wave reflected light, the short-wave spectrum time sampling mirror is coupled to a short-wave spectrum time measurement image surface through a short-wave spectrum time measurement coupling mirror, a short-wave time measurement fast photoelectric tube and a short-wave spectrum sampling optical fiber are arranged on the short-wave spectrum time measurement image surface, and the short-wave spectrum sampling optical fiber is connected with a spectrometer; the short wave energy measuring focusing lens focuses the rest short wave reflected light on the short wave energy calorie meter probe.
Further, a long-wave light absorption trap is arranged on the long-wave spectrum time measurement image plane; and a short-wave light absorption trap is arranged on the short-wave spectrum time measurement image plane.
Further, a long-wave camera imaging lens iris diaphragm is arranged between the long-wave camera imaging lens and the long-wave camera sampling lens; and an iris diaphragm of the short-wave camera imaging lens is arranged between the short-wave camera imaging lens and the short-wave camera sampling lens.
Preferably, the system imaging lens images the scattering plate on a primary image plane, and the primary image plane is provided with the stray light filtering device.
Further, a variable total diaphragm of a measuring system is arranged between the imaging lens of the system and a measuring window of the spherical vacuum target chamber.
Further, the diffusion plate is a special diffusion plate with a targeting laser channel.
Further, the special-shaped scattering plate is an ellipsoidal diffuse reflection whiteboard, the target point is located on one focal point of the ellipsoidal diffuse reflection whiteboard, and the center of the variable total diaphragm of the measuring system is located on the other focal point of the ellipsoidal diffuse reflection whiteboard.
Further, the long-wave camera and the short-wave camera are gated ICCD cameras.
The invention has the beneficial effects that:
(1) According to the invention, the scattering plate is arranged between the target shooting rays and the target point, and the near back scattered light is diffusely reflected by the scattering plate, so that the method is used for subsequent scattering energy measurement, scattering spectrum measurement and scattering time measurement. The scattering plate has the advantage of high damage threshold, and can meet the measurement requirement of the near back scattered light of the large-scale laser driving device.
(2) The invention sets a primary image plane in the sampling light path, which is beneficial to removing stray light in other directions by using a spatial filtering method.
(3) The invention records the spatial distribution of scattered light on the scattering plate by using the ICCD camera, and shields stray light outside the scattering period by using the time shutter of the ICCD camera.
(4) The invention uses the intensity of the image on the ICCD camera to calculate the scattering energy, and uses the energy meter to measure the energy for mutual verification.
(5) The system variable total diaphragm is arranged at the front end of the system and is used for controlling the total luminous flux, so that continuous energy attenuation can be realized.
(6) According to the invention, the spectrum sampling optical fiber and the time measurement fast photoelectric tube are simultaneously arranged on the corresponding spectrum time measurement image surfaces of the long-wave measurement unit and the short-wave measurement unit, and two functions are realized by one branch, so that the measurement efficiency is improved.
Drawings
FIG. 1 is a schematic structural diagram of a sampling device according to a preferred embodiment of the present invention.
FIG. 2 is a schematic structural diagram of a measuring device according to a preferred embodiment of the present invention.
FIG. 3 is a schematic diagram of a portion of a long-wavelength transmitted light measuring unit of the measuring device of the present invention.
Fig. 4 is a schematic diagram of a portion of a short-wave reflected light measuring unit of the measuring device according to the present invention.
Wherein, the reference numerals are as follows: the system comprises a 1-spherical vacuum target chamber, 2-targeting laser, 3-target, 4-near back scattering light, 5-scattering plate, 6-diffuse reflection light, 7-measuring window, 8-system imaging lens, 9-measuring system variable total diaphragm, 10-stray light filtering device, 11-beam shrinking mirror, 12-dichroic mirror, 13-long wave camera sampling mirror, 14-long wave spectrum time sampling mirror, 15-long wave energy measuring focusing mirror, 16-long wave energy card meter probe, 17-long wave camera imaging lens iris diaphragm, 18-long wave camera imaging lens, 19-long wave camera, 20-long wave spectrum time measuring image surface, 21-long wave spectrum time measuring fast-speed photoelectric tube, 22-long wave spectrum sampling optical fiber, 23-long wave light absorption trap, 24-long wave spectrum time measuring coupling mirror, 25-camera sampling mirror, 26-long wave spectrum time sampling mirror, 27-energy measuring focusing mirror, 28-short wave energy card meter probe, 29-short wave energy measuring coupling, 30-long wave camera imaging lens, 19-long wave spectrum time measuring fast-wave optical fiber, 31-long wave spectrum time measuring optical fiber, 31-long wave spectrum optical fiber, 32-long wave spectrum optical fiber imaging lens, and 35-short wave spectrum time measuring optical fiber imaging lens.
Detailed Description
The embodiment is a near back scattering optical measurement system, which structurally comprises a sampling device and a measuring device.
Referring to fig. 1, the sampling device comprises a spherical vacuum target chamber 1 and a system imaging lens 8, wherein a target point 3 and a scattering plate 5 are arranged in the spherical vacuum target chamber 1; near back scattering light 4 generated by an incidence target 3 of the targeting laser 2 is scattered along the targeting reverse direction and then is diffusely reflected by a scattering plate 5, and diffuse reflection light 6 passes through a measuring window 7 on the spherical vacuum target chamber and then enters a measuring device through a system imaging lens 8. A measuring system iris diaphragm 9 is arranged between the system imaging lens 8 and the measuring window 7 of the spherical vacuum target chamber 1 and is used for controlling total light quantity. The diffusion plate 5 is a special diffusion plate with a targeting laser channel. Preferably, in this embodiment, the special-shaped scattering plate may be an ellipsoidal diffuse reflection whiteboard, where the target point 3 is located at one focal point of the ellipsoidal diffuse reflection whiteboard, and the center of the variable iris 9 of the measurement system is located at the other focal point of the ellipsoidal diffuse reflection whiteboard. According to the characteristics of the ellipsoid, each light ray from the target point 3 to the variable total diaphragm 9 of the measuring system is equal in optical path length, so that time-difference-free sampling can be realized.
Referring to fig. 2, the system imaging lens 8 images the diffusion plate on a primary image plane, and a stray light filtering device 10 is disposed on the primary image plane, for shielding interference light scattered by the inner wall of the target chamber outside the diffusion plate.
The measuring device comprises a beam shrinking mirror 11 and a dichroic mirror 12 which are sequentially arranged along the light path propagation direction; the beam-condensing lens 11 is used for controlling the aperture of the light beam, the dichroic mirror 12 is used for performing spectrum separation, long waves (light with the wavelength of 400nm-1000 nm) are transmitted into the long-wave transmission light measuring unit, and short waves (light with the wavelength of 351nm + -5 nm) are reflected into the short-wave reflection light measuring unit.
Referring to fig. 3, the long-wave transmitted light measuring unit includes a long-wave camera sampling mirror 13, a long-wave spectrum time sampling mirror 14, and a long-wave energy measuring focusing mirror 15, which are sequentially disposed along the propagation direction of the optical path; after the long-wave camera sampling mirror 13 reflects part of the long-wave transmitted light, the long-wave transmitted light is imaged on the long-wave camera 19 through the long-wave camera imaging lens 18; after the long-wave spectrum time sampling mirror 14 reflects the other part of the long-wave transmitted light, the other part of the long-wave transmitted light is coupled to the long-wave spectrum time measurement image surface 20 through the long-wave spectrum time measurement coupling mirror 24, a long-wave spectrum time measurement fast photoelectric tube 21 and a long-wave spectrum sampling optical fiber 22 are arranged on the long-wave spectrum time measurement image surface 20, the long-wave spectrum sampling optical fiber 22 is connected with a spectrometer for spectrum measurement, and the long-wave spectrum time measurement fast photoelectric tube 21 is used for time measurement; the long wave energy measurement focusing mirror 15 focuses the remaining long wave transmitted light on the long wave energy calorimeter probe 16 for energy measurement.
The fixed ratio distribution is performed with a long-wave camera sampling mirror 13 and a long-wave spectral time sampling mirror 14 according to the energy ratio required by the camera, spectral measurement, energy measurement detector. Because the dynamic range of the long-wave camera 13 is relatively minimum, in order to ensure the normal operation of the camera, a long-wave camera imaging lens iris 17 is arranged between the long-wave camera imaging lens 18 and the long-wave camera sampling mirror 13, and the luminous flux is further controlled.
In the long-wave transmission light measuring unit, a system imaging lens 8, a beam shrinking lens 11 and a long-wave spectrum time measuring coupling lens 24 form an imaging system, the imaging system images a measuring system variable total diaphragm 9 on a long-wave spectrum time measuring image surface 20, the end surfaces of a long-wave time measuring fast photoelectric tube 21 and a long-wave spectrum sampling optical fiber 22 are arranged on the image surface, and the unused part is absorbed by a long-wave light absorbing trap 23 due to the large image surface, so that stray light is avoided.
Referring to fig. 4, the short-wave reflected light measuring unit includes a short-wave camera sampling mirror 25, a short-wave spectrum time sampling mirror 26, and a short-wave energy measuring focusing mirror 27, which are sequentially arranged along the propagation direction of the optical path; after a part of the short-wave reflected light is reflected by the short-wave camera sampling mirror 25, the reflected light is imaged on the short-wave camera 35 through the short-wave camera imaging lens 36; after the other part of the short-wave reflected light is reflected by the short-wave spectrum time sampling mirror 26, the reflected light is coupled to the short-wave spectrum time measurement image surface 30 through the short-wave spectrum time measurement coupling mirror 29, a short-wave spectrum time measurement fast photoelectric tube 33 and a short-wave spectrum sampling optical fiber 32 are arranged on the short-wave spectrum time measurement image surface 30, the short-wave spectrum sampling optical fiber 32 is connected with a spectrometer for spectrum measurement, and the short-wave spectrum time measurement fast photoelectric tube 33 is used for time measurement; the short-wave energy measurement focusing mirror 27 focuses the remaining short-wave reflected light on the short-wave energy calorimeter probe 28 for energy measurement.
Depending on the energy ratio required for the camera, spectral measurement, energy measurement detector, a fixed ratio distribution is performed with a short-wave camera sampling mirror 25 and a short-wave spectral time sampling mirror 26. Because the dynamic range of the short-wave camera 35 is relatively minimum, in order to ensure the normal operation of the camera, a short-wave camera imaging lens iris 34 is arranged between the short-wave camera imaging lens 36 and the short-wave camera sampling mirror 25, and the luminous flux is further controlled.
In the short-wave transmission light measuring unit, a system imaging lens 8, a beam shrinking lens 11 and a short-wave spectrum time measuring coupling lens 29 form an imaging system, the imaging system images a measuring system variable total diaphragm 9 on a short-wave spectrum time measuring image surface 30, and the end surfaces of a short-wave time measuring fast photoelectric tube 33 and a short-wave spectrum sampling optical fiber 32 are arranged on the image surface.
Both the long-wave camera 13 and the short-wave camera 35 may employ gated ICCD cameras for recording the spatial distribution of scattered light on the diffuser plate and shielding stray light outside the scattering period with the time shutter of the camera.
Claims (6)
1. The utility model provides a nearly back scattering optical measurement system, includes sampling device and measuring device, its characterized in that: the sampling device comprises a spherical vacuum target chamber and a system imaging lens, wherein a target point and a scattering plate are arranged in the spherical vacuum target chamber; near back scattered light generated by a target laser incidence target point is scattered along a target shooting reverse direction and then is diffusely reflected by a scattering plate, the diffusely reflected light passes through a measuring window on a spherical vacuum target chamber, and the diffusely reflected light enters a measuring device after being imaged on a primary image surface by a system imaging lens; the primary image surface is provided with a stray light filter device;
the measuring device comprises a beam shrinking mirror and a dichroic mirror which are sequentially arranged along the light path propagation direction; after the spectrum of the dichroic mirror is separated, long waves are transmitted into a long-wave transmission light measuring unit, and short waves are reflected into a short-wave reflection light measuring unit;
the long-wave transmitted light measuring unit comprises a long-wave camera sampling mirror, a long-wave spectrum time sampling mirror and a long-wave energy measuring focusing mirror which are sequentially arranged along the light path propagation direction; the long-wave camera sampling mirror reflects part of the long-wave transmitted light and then images the part of the long-wave transmitted light on the long-wave camera through the long-wave camera imaging lens; after the long-wave spectrum time sampling mirror reflects the other part of long-wave transmitted light, the long-wave spectrum time sampling mirror is coupled to a long-wave spectrum time measurement image surface through a long-wave spectrum time measurement coupling mirror, a long-wave time measurement fast photoelectric tube and a long-wave spectrum sampling optical fiber are arranged on the long-wave spectrum time measurement image surface, and the long-wave spectrum sampling optical fiber is connected with a spectrometer; the long wave energy measuring focusing lens focuses the rest long wave transmitted light on a long wave energy calorie meter probe;
the short-wave reflected light measuring unit comprises a short-wave camera sampling mirror, a short-wave spectrum time sampling mirror and a short-wave energy measuring focusing mirror which are sequentially arranged along the light path propagation direction; after the sampling mirror of the short-wave camera reflects a part of short-wave reflected light, imaging the part of short-wave reflected light on the short-wave camera through the imaging lens of the short-wave camera; after reflecting the other part of short-wave reflected light, the short-wave spectrum time sampling mirror is coupled to a short-wave spectrum time measurement image surface through a short-wave spectrum time measurement coupling mirror, a short-wave time measurement fast photoelectric tube and a short-wave spectrum sampling optical fiber are arranged on the short-wave spectrum time measurement image surface, and the short-wave spectrum sampling optical fiber is connected with a spectrometer; the short-wave energy measuring focusing lens focuses the residual short-wave reflected light on a short-wave energy calorimeter probe;
the long-wave camera and the short-wave camera are gated ICCD cameras, stray light outside a scattering period is shielded by a time shutter of the ICCD cameras, scattered energy is calculated by the intensity of an image on the ICCD cameras, and energy is measured by an energy meter to perform mutual verification.
2. The near back-scattering optical measurement system of claim 1, wherein: the long-wave spectrum time measurement image surface is provided with a long-wave light absorption trap; and a short-wave light absorption trap is arranged on the short-wave spectrum time measurement image plane.
3. The near back-scattering optical measurement system of claim 2, wherein: a long-wave camera imaging lens iris diaphragm is arranged between the long-wave camera imaging lens and the long-wave camera sampling lens; and an iris diaphragm of the short-wave camera imaging lens is arranged between the short-wave camera imaging lens and the short-wave camera sampling lens.
4. A near back-scattering optical measurement system according to any of claims 1-3, characterized in that: and a measuring system iris diaphragm is arranged between the system imaging lens and a measuring window of the spherical vacuum target chamber.
5. The near back-scattering optical measurement system of claim 4, wherein: the scattering plate is a special-shaped scattering plate with a targeting laser channel.
6. The near back-scattering optical measurement system of claim 5, wherein: the special-shaped scattering plate is an ellipsoidal diffuse reflection whiteboard, the target point is located on one focal point of the ellipsoidal diffuse reflection whiteboard, and the center of the variable total diaphragm of the measuring system is located on the other focal point of the ellipsoidal diffuse reflection whiteboard.
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| CN111426654B (en) * | 2019-01-09 | 2022-10-11 | 中国科学院上海光学精密机械研究所 | Backward interference filtering method in reflective scattered light field imaging and imaging system |
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