CN103631688B - A kind of method and system of test interface signal - Google Patents
A kind of method and system of test interface signal Download PDFInfo
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- CN103631688B CN103631688B CN201310656645.6A CN201310656645A CN103631688B CN 103631688 B CN103631688 B CN 103631688B CN 201310656645 A CN201310656645 A CN 201310656645A CN 103631688 B CN103631688 B CN 103631688B
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Abstract
The invention discloses a kind of method and system of test interface signal, it is related to data communication technology field, when testing line card backplane interface signal, solve the problems, such as that in existing test process, test job amount is big, significantly improve testing efficiency.The specific embodiment of the present invention includes：Online card logic control unit simulates the test signal of measured signal group, and this test signal is sent to line card interface testing unit；Then line card interface testing unit is processed to described test signal according to preset requirement, and the test signal after processing is sent to the testing backboard including measured signal group loopback, and then the new test signal through above-mentioned loopback is returned to line card logic control element by this testing backboard, by judging to complete interface signal test.Technical solution of the present invention is mainly used in line card production test flow process.
Description
Technical field
The present invention relates to data communication technology field, more particularly, to a kind of method and system of test interface signal.
Background technology
At present, machine frame communication device adopts the design of more common platforms so that same type of line card（LPU card,
Line Processing Unit）Can apply to different machine frame communication equipments, thus meeting machine frame communication device
Difference in functionality demand and upgrading demand.Because the function of machine frame, performance are different, the backboard often inserting different machine frames connects
Message number is also different, be so accomplished by line card is carried out with production test to determine the backplane interface signal of line card with machine frame be
No coupling.At present, line card production test is carried out by the way of insertion machine frame carries out system test.Because line card can apply to
Different machine frame communication equipments, when line card is only inserted in and is tested on a kind of machine frame, arises that backplane interface signal test leakage
Situation, and then it may appear that the situation of cisco unity malfunction when this line card can be caused to apply on other machine frame communication equipment.
And above-mentioned test leakage problem will be avoided, it is necessary for line card is tested one by one on all machine frames mating, so certainly will
Test job amount can be increased, lead to that testing efficiency is low, high cost problem, thus more simple, easily in the urgent need to finding one kind
The detection method of operation is solving the above problems.
Content of the invention
Embodiments of the invention provide a kind of method and system of test interface signal, in test line card backplane interface signal
When, solve the problems, such as that the test job amount in existing test process is big, significantly improve testing efficiency.
For reaching above-mentioned purpose, embodiments of the invention adopt the following technical scheme that：
A kind of method of test interface signal, is applied to the machine frame communication device containing testing backboard, line card to be measured with
Described testing backboard is connected by back panel connector, and described line card to be measured at least includes：Line card logic control element, line card interface
Test cell；Methods described includes：
Described line card logic control element simulates the test signal of measured signal group, and described test signal is sent to institute
State line card interface testing unit；
Described line card interface testing unit is processed to described test signal according to preset requirement, and by process after survey
Trial signal is sent to described testing backboard, and described testing backboard is included for by the TCH test channel of measured signal group loopback；
Described line card logic control element receives the new test signal that described testing backboard returns.
A kind of system of test interface signal, described system includes the machine frame communication device containing testing backboard and to be measured
Line card, described line card to be measured is connected by back panel connector with described testing backboard, and described line card to be measured at least includes line card and patrols
Collect control unit, line card interface testing unit；
Described line card logic control element, for simulating the test signal of measured signal group, and described test signal is sent out
Give described line card interface testing unit；
Described line card interface testing unit, for processing to described test signal according to preset requirement, and will be processed
Test signal afterwards is sent to described testing backboard, and described testing backboard is included for leading to the test of measured signal group loopback
Road；
Described line card logic control element, is additionally operable to receive the new test signal that described testing backboard returns.
The method and system of test interface signal provided in an embodiment of the present invention, online card logic control unit simulation is to be measured
The test signal of signal group, and this test signal is sent to line card interface testing unit；And then line card interface testing unit presses
According to preset requirement, test signal is processed, and the test signal after processing is sent to the survey including measured signal group loopback
Examination backboard, and then the new test signal through above-mentioned loopback is returned to line card to be measured by this testing backboard, by judging to complete
Interface signal is tested.With in prior art it is necessary to line card to be measured is surveyed on all machine frame type equipments mating one by one
Examination is compared, and the test job amount solving prior art presence is big, the low problem of testing efficiency, in test line card backplane interface letter
Number when, significantly improve testing efficiency.
Brief description
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
Have technology description in required use accompanying drawing be briefly described it should be apparent that, drawings in the following description be only this
Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, acceptable
Other accompanying drawings are obtained according to these accompanying drawings.
A kind of method flow diagram of test interface signal that Fig. 1 provides for one embodiment of the invention；
A kind of method flow diagram of test interface signal that Fig. 2 provides for another embodiment of the present invention；
A kind of method flow of test interface signal based on instantiation that Fig. 3 provides for another embodiment of the present invention
Figure;
A kind of composition schematic diagram of test interface signaling system that Fig. 4-1 provides for another embodiment of the present invention；
The composition schematic diagram of the line card a kind of to be measured that Fig. 4-2 provides for another embodiment of the present invention；
The composition schematic diagram of another kind of test interface signaling system that Fig. 4-3 provides for another embodiment of the present invention.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation description is it is clear that described embodiment is only a part of embodiment of the present invention, rather than whole embodiments.It is based on
Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under the premise of not making creative work
Embodiment, broadly falls into the scope of protection of the invention.
One embodiment of the invention provides a kind of method of test interface signal it is preferred that the method is applied to containing survey
The machine frame communication device of examination backboard, line card to be measured is connected by back panel connector with testing backboard, and this line card to be measured at least wraps
Include：Line card logic control element, line card interface testing unit.
As shown in figure 1, the method includes：
101st, line card logic control element simulates the test signal of measured signal group, and this test signal is sent to line card
Interface testing unit.
Preferably,
Line card logic control element, is CPLD（Complex Programmable Logic Device, complex programmable
Logical device）, the logic control device such as single-chip microcomputer, send or receive the test signal of measured signal group for simulation.This line card
Logic control element can be using existing on line card or for realizing the control device that the test purpose of the present invention is added.
Line card interface testing unit, is the new device for test interface signal adding and circuit on line card to be measured,
Preferably, it is the analog interface for signal testing defining on the back panel connector of line card to be measured, and the buffering of signal, lock
The device such as deposit, being mainly used in the connection for the test signal between line card logic control element and testing backboard provides interface and letter
Number passage.
102nd, line card interface testing unit is processed to test signal according to preset requirement, and will process after test letter
Number it is sent to testing backboard.
Wherein, testing backboard is included for by the passage of measured signal group loopback, in this backplane interface, compatibility defines together
All variety classes backplane interface signals that a kind of line card to be measured is supported, line card so to be measured can be complete on this testing backboard
Become the test of total interface signal.
What deserves to be explained is, wherein according to preset requirement, test signal is processed, be so that line card interface is surveyed
The test signal that examination unit sends can tested backboard be received.
103rd, line card logic control element receives the new test signal that testing backboard returns.
Wherein, new test signal refers to the test signal of simulation measured signal group in treating in testing backboard
Survey the test signal after signal group passage loopback.
The method of test interface signal provided in an embodiment of the present invention, online card logic control unit simulates measured signal group
Test signal, and this test signal is sent to line card interface testing unit；And then line card interface testing unit is according to default
Require test signal is processed, and the test signal after processing is sent to the test back of the body including measured signal group loopback
Plate, and then the new test signal through above-mentioned loopback is returned to line card by this testing backboard, by judging to complete interface signal
Test.With in prior art it is necessary to compared with line card is carried out test on all machine frames mating one by one, solve existing skill
The test job amount that art exists is big, and the low problem of testing efficiency, when testing line card backplane interface signal, significantly improves test
Efficiency.
Further, another embodiment of the present invention provides a kind of method of test interface signal, in this embodiment
The method describing more complete test interface signal, as shown in Fig. 2 the method includes:
201st, line card logic control element receives test command.
Wherein, at least include measured signal group mark in test command, will be right for indicatrix card logic control unit
Which kind of signal is simulated.
202nd, line card logic control element simulates the test signal of measured signal group, and this test signal is sent to line card
Interface testing unit
203rd, line card interface testing unit is processed to test signal according to preset requirement, and will process after test letter
Number it is sent to testing backboard.
204th, line card logic control element receives the new test signal that testing backboard returns.
205th, line card logic control element is compared to this new test signal and the test signal sending, new to determine
Test signal whether consistent with test signal.
What deserves to be explained is, when confirming that comparative result is consistent, determine that line card to be measured is normal in this interface signal group to be measured.
At present, illustrate, this line card A both can use on backboard A, can use on backboard B again taking line card A as a example,
But during due to using on backboard A and backboard B, the function of line card A is distinguishing, and then use on backboard A and backboard B
When, the backplane interface signal of this line card A uses and also differs.Such as, the backplane interface signal of line card A defines 3 groups of signals altogether,
I.e. signal group A, signal group B and signal group C.When this line card A uses on backboard A, only used signal group A and signal group B,
And the LPU groove position of backboard A also only defines signal group A and two groups of backplane interface signals of signal group B；When line card A makes on backboard B
Used time, only used signal group A and signal group C, and the LPU groove position of backboard A also only defines signal group A and two groups of signal group C
Backplane interface signal.Produce in detection process carrying out LPU line card according to existing solution, when this line card A is only in backboard A
On when being detected, then just cannot detect whether backplane interface signal group C normal, in this case, when this line card A is in backboard
Will there is risk when using on B.In the same manner, if this line card A is only detected on backboard B, backplane interface cannot be detected
Whether signal group B is normal, also cannot guarantee that this line card A normally uses on backboard A.Or this line card A is respectively in backboard A
Tested with backboard B, also arisen that test job amount is big, the low problem of testing efficiency.
In order to solve the above problems, the technical scheme that another embodiment of the present invention provides can apply to test as follows line card
In backplane interface signal configuration, this framework at least includes the machine frame communication device containing testing backboard, by line card to be measured and survey
Examination backboard is connected by back panel connector, and this line card to be measured at least includes：Line card logic control element, line card interface testing list
Unit.Based on above-mentioned framework, as shown in figure 3, the method for test interface signal provided in an embodiment of the present invention includes：
301st, the test command of line card logic control element receipt signal group C.
Wherein, line card logic control element is the devices such as CPLD or the single-chip microcomputer on line card to be measured.
302nd, line card logic control element is according to the test command receiving, the test signal of analogue signal group C, and should
Test signal is sent to line card interface testing unit.
Preferably, this line card logic control element simulates the test letter of signal group C to be sent according to the frame format of signal group C
Number.
303rd, line card interface testing unit is processed to this test signal according to preset requirement, then passes through backplane interface
The signal handled well is sent to testing backboard by adapter.
Wherein, preset requirement is the type set according to line card, and such as, for the line card for Dynamic Signal, this is pre-
If requirement can pass through the upper level default of this line card, and better simply for function or for stationary singnal line card,
This preset requirement is to be set by manufacturer is unified.The process herein being related to includes, but are not limited to, and carries out electricity to test signal
Flat turn is changed, signal latch etc. is processed, so that the test signal form that sends of this line card interface testing unit and survey to be measured
The signal of examination backboard receives form and matches.Specifically, if the test signal sending is 5V, and can only connect in testing backboard
Receive the signal of 3.3V, then need to carry out level conversion to signal.
Wherein, testing backboard is the interface signal incorporating backboard B on the basis of backboard A, and proprietary by backboard B connects
Mouth signal group C with the addition of the C signal group loopback passage of a test, other signals at the adapter of line card A groove position to be measured
Do not need to change, and this signal group loopback does not affect normal use on this testing backboard for the line card A.That is, normal
During use, the function of this testing backboard is same with the function phase of backboard A, and this testing backboard is not newly-increased outside backboard A, backboard B
Plus a kind of backboard, but the upgrading carrying out on the basis of backboard A, backboard A can be substituted completely and used.In the test back of the body
The loopback of the C signal group added on plate is a TCH test channel, newly-generated at this such that it is able to the method for testing using the present invention
Testing backboard on compatibility test backboard B C signal group interface signal, on this backboard original backboard A interface signal test
Method is directly tested according to existing conventional method.
304th, the test signal of the simulation receiving is carried out loopback by testing backboard, and by back panel connector by this signal
Return to line card to be measured.
305th, the analog test signal that line card to be measured returns is judged.
What deserves to be explained is, the judgement herein carrying out is for determining on line card A whether are this partial function and back panel connector
Normally, the circuit of so far whole signal group C and the simulation test of function complete.
Specifically, this judgement can be that the default test item to signal judges, if return test signal with send out
The test signal of signal group C going out is identical in the numerical value of this default detection, then this semiotic function of explanation line card A and the back of the body
Connector for substrate is normal, and that is, this line card A normally can use on backboard A and backboard B, conversely, when the test signal returning
Different from the test signal sending before, such as, the signal value of the test signal that line card logic testing unit sends out is 1000,
The signal value of the return receiving is 800, then there is risk when illustrating that this line card A uses on backboard B.
Further, what deserves to be explained is, the present embodiment is taking include one group of signal group loopback on testing backboard as a example to carry out
Illustrate, but when line card to be measured can use on multiple backboards simultaneously, then now can wrap accordingly on testing backboard
Include multi-signal group loopback, further, when testing to these signal groups on testing backboard, need according to these
The function of signal group, to test, when they are function uncorrelated signal group completely, can test these signal groups simultaneously.If
The function of these signal groups to be measured is that logic is related, then be accomplished by being tested according to its logical relation.
To sum up to the present invention carry into execution a plan and existing example description that is to say, that this line card to be measured can be two
Plant and use on different backboards, and so that semiotic function to be tested is uncorrelated as a example, if using traditional method of testing, if
Complete the detection of the backplane interface to this line card, need a functional test is carried out respectively on two kinds of backboards.And using this
Inventive embodiments provide above-mentioned method of testing, this line card to be measured only need to carry out on a kind of backboard test just can complete all of
Backplane interface signal testing, the efficiency so producing detection is just doubled, and detection time only has the half of traditional method.With
Reason, when a kind of line card to be measured is applied to three kinds of different backboards, detection time can be shorten to only tradition inspection by this patent
The 1/3 of survey method.Simultaneously as avoiding multiple plug on different backboards for the LPU line card and switch electricity, the life-span to line card
Loss also play certain reduction effect.
Another embodiment of the present invention provides a kind of system of test interface signal, and as shown in Fig. 4-1, this system includes containing
There are machine frame communication device 01 and the line card to be measured 02 of testing backboard 43, line card 02 to be measured is connected by backboard with testing backboard 43
Device 03 connects.As shown in the Fig. 4-2, this line card 02 to be measured includes：Line card logic control element 41, line card interface testing unit 42.
Line card logic control element 41, for simulating the test signal of measured signal group, and this test signal is sent to
Line card interface testing unit 42.
Line card interface testing unit 42, for processing to test signal according to preset requirement, and by process after survey
Trial signal is sent to testing backboard 43.
Wherein, testing backboard 43 is included for by the TCH test channel of measured signal group loopback.
Line card logic control element 41, is additionally operable to receive the new test signal stating testing backboard 43 return.
Optionally, new test signal, refers to the test signal simulating measured signal group in testing backboard 43
Test signal after measured signal group passage loopback.
Optionally, as shown in Fig. 4-3, machine frame communication device 01 also includes main control card 44.
Main control card 44, for sending test command to line card logic control element 41.
Further alternative, line card logic control element 41, it is additionally operable to before the test signal of simulation measured signal group,
Receive the test command that main control card 44 sends；Be additionally operable to after receiving new test signal, to this new test signal with
The test signal before sending is compared, to determine whether new test signal is consistent with the test signal of simulation.
Wherein, at least include measured signal group mark in test command.
Optionally, line card interface testing unit 42, is additionally operable to as between line card logic control element 41 and testing backboard 43
The connection of test signal interface and signalling channel are provided.
A kind of system of test interface signal provided in an embodiment of the present invention, online card logic control unit simulates letter to be measured
The test signal of number group, and after this test signal is sent to line card interface testing unit；Line card interface testing unit according to
Preset requirement is processed to test signal, and the test signal after processing is sent to the test including measured signal group loopback
Backboard, and then the new test signal through above-mentioned loopback is returned to line card logic control element by this testing backboard, by sentencing
The disconnected interface signal that completes is tested.With in prior art it is necessary to by line card on all machine frames mating one by one carry out test phase
The test job amount solving prior art presence is big, the low problem of testing efficiency, in test line card backplane interface signal for ratio
When, significantly improve testing efficiency.
Through the above description of the embodiments, those skilled in the art can be understood that the present invention can borrow
Help software to add the mode of necessary common hardware to realize naturally it is also possible to pass through hardware, but the former is more preferably in many cases
Embodiment.Based on such understanding, the portion that technical scheme substantially contributes to prior art in other words
Divide and can be embodied in the form of software product, this computer software product is stored in the storage medium that can read, such as count
The floppy disk of calculation machine, hard disk or CD etc., including some instructions with so that a computer equipment（Can be personal computer,
Server, or the network equipment etc.）Method described in execution each embodiment of the present invention.
The above, the only specific embodiment of the present invention, but protection scope of the present invention is not limited thereto, and any
Those familiar with the art the invention discloses technical scope in, change or replacement can be readily occurred in, all should contain
Cover within protection scope of the present invention.Therefore, protection scope of the present invention should be defined by described scope of the claims.
Claims (10)
1. a kind of method of test interface signal, methods described is applied to the machine frame communication device containing testing backboard, and it is special
Levy and be, line card to be measured is connected by back panel connector with described testing backboard, described line card to be measured at least includes：Line card is patrolled
Collect control unit, line card interface testing unit, described testing backboard includes at least two backboards that described line card to be measured is supported
Signal group；Methods described includes：
Described line card logic control element simulates the test signal of measured signal group, and described test signal is sent to described line
Card interface test cell；
Described line card interface testing unit is processed to described test signal according to preset requirement, and will process after test letter
Number it is sent to described testing backboard, described testing backboard is included for by the TCH test channel of measured signal group loopback；
Described line card logic control element receives the new test signal that described testing backboard returns.
2. the method for test interface signal according to claim 1 is it is characterised in that in described line card logic control element
Before the test signal of simulation measured signal group, also include：
Described line card logic control element receives test command, at least includes described measured signal group mark in described test command
Know.
3. the method for test interface signal according to claim 2 is it is characterised in that receive in described line card logical block
To after described new test signal, also include：
The test signal of described new test signal and described simulation is compared, to determine described new test signal and institute
Whether the test signal stating simulation is consistent.
4. the method for the test interface signal according to claims 1 to 3 any one is it is characterised in that described new survey
Trial signal, the test signal referring to described simulation measured signal group is after the measured signal group passage loopback in testing backboard
Test signal.
5. a kind of system of test interface signal is it is characterised in that described system includes the communication of the machine frame formula containing testing backboard
Equipment and line card to be measured, described line card to be measured is connected by back panel connector with described testing backboard, and described line card to be measured is at least
Including line card logic control element, line card interface testing unit, described testing backboard include described line card to be measured supported to
The signal group of few two kinds of backboards；
Described line card logic control element, for simulating the test signal of measured signal group, and described test signal is sent to
Described line card interface testing unit；
Described line card interface testing unit, for processing to described test signal according to preset requirement, and will process after
Test signal is sent to described testing backboard, and described testing backboard is included for by the TCH test channel of measured signal group loopback；
Described line card logic control element, is additionally operable to receive the new test signal that described testing backboard returns.
6. test interface signal according to claim 5 system it is characterised in that
Described line card logic control element, is additionally operable to, before the test signal of simulation measured signal group, receive test command, institute
State and in test command, at least include described measured signal group mark.
7. test interface signal according to claim 6 system it is characterised in that
Described line card logic control element, is additionally operable to after receiving described new test signal, to described new test letter
Number be compared with the test signal of described simulation, with determine described new test signal and described simulation test signal whether
Unanimously.
8. the system of the test interface signal according to any one claim of claim 5 to 7 is it is characterised in that institute
State new test signal, refer to that the test signal of described simulation measured signal group is led in the measured signal group in testing backboard
Test signal after road loopback.
9. the system of test interface signal according to claim 8 is it is characterised in that described machine frame communication device also wraps
Include main control card, described main control card is used for sending test command to described line card logic control element.
10. the system of test interface signal according to claim 8 is it is characterised in that described line card interface testing unit,
Being additionally operable to the connection for the test signal between line card logic control element and testing backboard provides interface and signalling channel.
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| CN104601255B (en) * | 2014-12-31 | 2017-07-07 | 曙光信息产业(北京)有限公司 | The method of testing and device of line card |
| CN105095037A (en) * | 2015-09-11 | 2015-11-25 | 北京星网锐捷网络技术有限公司 | Wire card, backboard of wire card and wire card test method |
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| CN108111367A (en) * | 2017-10-30 | 2018-06-01 | 深圳市风云实业有限公司 | Performance test methods and device |
| CN109839548A (en) * | 2017-11-24 | 2019-06-04 | 深圳市科比特航空科技有限公司 | Interface test method, apparatus and system |
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