CN103336147B - High-frequency vibration clamp device for scanning ion conductance microscope - Google Patents
High-frequency vibration clamp device for scanning ion conductance microscope Download PDFInfo
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- CN103336147B CN103336147B CN201310263763.0A CN201310263763A CN103336147B CN 103336147 B CN103336147 B CN 103336147B CN 201310263763 A CN201310263763 A CN 201310263763A CN 103336147 B CN103336147 B CN 103336147B
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- dither
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- conductance microscope
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Abstract
The invention discloses a high-frequency vibration clamp device for a scanning ion conductance microscope. The clamp device comprises a tubular clamp sleeve for clamping a glass micropipette probe, wherein an annular flange is arranged outside the tubular clamp sleeve; the lower part of the annular flange is connected with an elastic element; the lower end of the elastic element is fixed to a fixing bottom plate; an annular piezoelectric ceramic piece is arranged on the upper surface of the annular flange; the annular piezoelectric ceramic piece is fixedly connected onto a fixing top plate; the fixing bottom plate is fixedly connected with the fixing top plate; the annular piezoelectric ceramic piece vibrates after being communicated with a drive circuit to drive the tubular clamp sleeve and the glass micropipette probe to generate a high-frequency vibration in the vertical direction. According to the clamp device, the independently driven annular piezoelectric ceramic piece is adopted and driven to vibrate for driving the glass micropipette probe to generate the high-frequency vibration in the vertical direction to generate an alternating-current feedback signal so as to effectively overcome the ionic current drift and increase the scanning speed.
Description
Technical field
The invention belongs to scan ion Conductance Microscope technical field of imaging, relate to a kind of dither clamper of scan ion Conductance Microscope.
Background technology
Scan ion Conductance Microscope (Scanning ion conductance microscopy, SICM) as a member in scanning probe microscopy family, be widely used in nano grade biological imaging (imaging as cardiac muscle cell, renal epithelial cell, neuron etc.) in the world, to study a kind of Novel microscope of biological 26S Proteasome Structure and Function at present.Scan ion Conductance Microscope can carry out imaging that is contactless, harmless, nanometer resolution to tested sample under liquid physiological condition, do not require that tested sample has electric conductivity simultaneously, thus in the imaging field of active somatic cell, there is very outstanding advantage.
One of subject matter that scan ion Conductance Microscope exists in scanning process is the drift of gas current.The reason complexity producing drift is various, and such as, in electrolytic cell, the evaporation of electrolytic solution causes the change of ionic strength, thermal drift, and the instability of silver/silver chloride electrode surface potential, glass micro pipette is blocked by the impurity in electrolytic cell, and power supply status changes.Another subject matter is sweep velocity.Affect sweep velocity because have: the complexity of sample surface pattern, imaging size, imaging resolution (number of pixels needed for imaging), the translational speed and track etc. of probe during scanning.Probe vertically movement is driven owing to only using one block of piezoelectric ceramics in prior art, probe, piezoelectric ceramics and other annexes is made to fix as a whole, this makes the resonance frequency of piezoelectric ceramics be limited in about 1kHz, becomes the principal element affecting sweep velocity.In addition, improving the imaging capability of scan ion Conductance Microscope, namely can carry out imaging to the surface of various complexity, is also a very important problem.
In order to solve gas current drifting problem, improve the imaging capability of sweep velocity and scan ion Conductance Microscope, researchers development goes out the multiple method utilizing FEEDBACK CONTROL to regulate probe motion track, is called for short scan pattern (scanning mode).Document (1) Hansma P K, Drake B, et al, The scanning ion-conductance microscope, Science, 1989,243 (4891): 641-643 be scan ion Conductance Microscope be born mark, employing be DC mode (DC mode), DC mode easily produce gas current drift, and be not suitable for the very large sample of surface elevation fluctuating, very easily cause probe to rupture, document (2) Shevchuk A I, Gorelik J, Eet al.Simultaneous measurementof Ca2+and cellular dynamics:Combined scanning ion conductance and opticalmicroscopy to study contracting cardiac myocytes.Biophysical Journal, 2001, 81 (3): 1759-1764. propose AC mode (AC mode), AC mode AC signal is fed back, effectively can overcome the drift of gas current, and response speed is than fast by direct current signal feedback, but this pattern is only applicable to surface elevation and rises and falls the sample of less or intermediate complex, document (3) Novak P, Li C, et al.Nanoscale live-cell imaging using hopping probe ionconductance microscopy.Nature Methods, 2009,6 (12): 935. propose dancing mode (Hopping mode), the imaging capability of dancing mode is the strongest, namely imaging can be carried out by the very large sample of effects on surface height relief, but sweep velocity is relatively slow, and because use direct current signal feedback, must upgrade once with reference to gas current so often detect a pixel, otherwise be easy to produce DC shift, document (4) Zhukov A, Richards O, et al.A hybrid scanning mode for fast scanning ionconductance microscopy (SICM) imaging.Ultramicroscopy, 2012,121:1-7. propose FSICM pattern, its sweep velocity is exceedingly fast, and a large amount of pixel can be obtained, but it is comparatively smooth that FSICM is only applicable to effects on surface, and there is a large amount of suitable with probe tip internal diameter size or less characteristic imaging, simultaneously along with the increase of single row scan scope, gas current drift phenomenon will be more remarkable.
From above-mentioned document, AC mode effectively can overcome the drift of gas current, and dancing mode can carry out imaging by the very large sample of effects on surface height relief, drives the resonance frequency of the piezoelectric ceramics of probe motion to be the key factor of restriction sweep velocity.Method described in above-mentioned document is all solely study from the scan pattern aspect of probe, pays close attention to less to Design of Mechanical Structure aspect.
Summary of the invention
The problem that the present invention solves is the dither clamper providing a kind of scan ion Conductance Microscope, to solve the gas current drifting problem that scan ion Conductance Microscope occurs in scanning process, improve sweep velocity and the imaging capability of scan ion Conductance Microscope simultaneously.
The present invention is achieved through the following technical solutions:
A kind of dither clamper of scan ion Conductance Microscope, comprise the tubular grip cover of clamping glass micro pipette probe, described tubular grip cover outside is provided with annular flange flange, and be connected with flexible member below annular flange flange, flexible member lower end is fixed on fixed base plate; The upper surface of described annular flange flange is placed with ring-shaped piezo ceramic sheet, and ring-shaped piezo ceramic sheet is fixedly connected on fixing top board, and fixed base plate is fixedly connected with fixing top board; Ring-shaped piezo ceramic sheet is communicated with after vibration with driving circuit, drives tubular grip cover and glass micro pipette probe to make dither in the vertical direction.
After described glass micro pipette probe makes dither in the vertical direction, the signal that the data acquisition unit of scan ion Conductance Microscope receives is AC signal.
Described data acquisition unit gathers AC signal by micro current amplifier.
Described dither clamper is fixed on Z-direction piezoelectric ceramics, after Z-direction piezoelectric ceramics is communicated with controller, can regulate the movement in vertical direction of glass micro pipette probe.
By the vibration frequency and the amplitude that regulate the excited frequency of annular piezoelectric ceramic piece to regulate glass micro pipette probe.
The inwall of described tubular grip cover is also attached with elastic coating.
Maximize as objective function using the resonance frequency of described dither clamper, the parameters of basic dimensions of overlapping using described tubular grip and material parameter are as variable, after being optimized analysis by limited element analysis technique, the optimal value of the dimensional parameters that tubular grip is overlapped and material parameter can be determined.
Described fixing top board is connected by bolt, nut with fixed base plate.
Compared with prior art, the present invention has following useful technique effect:
The dither clamper of scan ion Conductance Microscope provided by the invention, by carrying out Optimization of Mechanical Design to the clamp structure of glass micro pipette probe, and adopt the ring-shaped piezo ceramic sheet driven separately, drive annular piezoelectric ceramic piece to produce vibrate and drive glass micro pipette probe to make dither in the vertical direction, AC regeneration signal can be produced, shorten data acquisition time simultaneously, thus effectively overcome gas current drift, and contribute to the sweep velocity and the imaging capability that improve scan ion Conductance Microscope.
Relative to the jump scanning pattern adopting direct current signal feedback, the present invention more effectively can overcome the drift phenomenon of gas current.
Further, the dither clamper of scan ion Conductance Microscope provided by the invention, Z-direction piezoelectric ceramics can also be connected, so just have employed ring-shaped piezo ceramic and Z-direction piezoelectric ceramics two blocks of piezoelectric ceramics, be respectively used to drive the dither of probe and the movement of probe vertical direction, effectively improve the sweep velocity of probe, make scan ion Conductance Microscope have the imaging capability of jump scanning pattern simultaneously.
And Optimization of Mechanical Design theory, limited element analysis technique can also be had complementary advantages with the scan pattern of scan ion Conductance Microscope by the present invention, the basis of superperformance retaining prior art further increases the combination property of scan ion Conductance Microscope, and not to go to covet the lifting of performance on the other hand seriously to sacrifice performance in a certain respect for cost.
Can also maximize as objective function using the resonance frequency of described dither clamper, using the parameters of basic dimensions of described dither clamper and material parameter as design variable, be optimized analysis; So theoretical for Optimization of Mechanical Design, limited element analysis technique is had complementary advantages with the ac sweep pattern of scan ion Conductance Microscope, jump scanning pattern, co-design, the dither clamper that just can be optimized.
Accompanying drawing explanation
Fig. 1 is the structural representation (axonometric drawing) of the dither clamper of scan ion Conductance Microscope, in order to the inner structure of clear display dither clamper, cuts open except 1/4th around its central symmetry axis.
In figure: 1 is tubular grip cover, 2 is glass micro pipette probe, and 3 is elastic coating, and 4 is annular flange flange, and 5 is flexible member, and 6 is fixed base plate, and 7 is ring-shaped piezo ceramic sheet, and 8 is fixing top board, and 9 is bolt, and 10 is nut, and 11 is Z-direction piezoelectric ceramics.
Embodiment
Below in conjunction with specific embodiment, the present invention is described in further detail, and the explanation of the invention is not limited.
See Fig. 1, a dither clamper for scan ion Conductance Microscope, comprise the tubular grip cover 1 of clamping glass micro pipette probe 2, described tubular grip is overlapped 1 outside and is provided with annular flange flange 4, be connected with flexible member 5 below annular flange flange 4, flexible member 5 lower end is fixed on fixed base plate 6; The upper surface of described annular flange flange 4 is placed with ring-shaped piezo ceramic sheet 7, and ring-shaped piezo ceramic sheet 7 is fixedly connected on the top that fixing top board 8(is arranged on ring-shaped piezo ceramic sheet 7) on, fixed base plate 6 is fixedly connected with fixing top board 8; Ring-shaped piezo ceramic sheet 7 is communicated with after vibration with driving circuit, drives tubular grip cover 1 and glass micro pipette probe 2 to make dither in the vertical direction, to produce AC signal, thus effectively overcomes gas current drift, raising sweep velocity.
And after glass micro pipette probe 2 makes dither in the vertical direction, the signal that the data acquisition unit of scan ion Conductance Microscope receives is AC signal.Described data acquisition unit gathers AC signal by micro current amplifier.
Described dither clamper is fixed on Z-direction piezoelectric ceramics 11, after Z-direction piezoelectric ceramics 11 is communicated with controller, can be used for regulating glass micro pipette probe 2 movement in vertical direction, make scan ion Conductance Microscope have the imaging capability of jump scanning pattern.
By the vibration frequency and the amplitude that regulate the excited frequency of annular piezoelectric ceramic piece 7 can regulate glass micro pipette probe 2.
Concrete, the inwall of described tubular grip cover 1 is also attached with elastic coating 3, for providing clamping force.
Described flexible member 5, for supporting described annular flange flange 4, can be spring or other resilient materials, and flexible member 5 one aspect can be used for regulating the system stiffness of dither clamper, can provide restoring force on the other hand for tubular grip cover.
Described fixing top board 8 is connected by bolt 9, nut 10 with fixed base plate 6.
Maximize as objective function using the resonance frequency of described dither clamper, using the parameters of basic dimensions of described tubular grip cover 1 and material parameter as design variable, after being optimized analysis by limited element analysis technique, the tubular grip cover dimensional parameters of 1 and the optimal value of material parameter can be determined.
Concrete, utilize the optimal design module (Design Explorer module) of ANSYS, import the 3-D geometric model of dither clamper, the parameters of basic dimensions of input tubulose retaining sleeve and the variation range of material parameter, maximize as objective function using the resonance frequency of described dither clamper, after being optimized analysis, just can obtain the optimal value of each parameter.
Claims (7)
1. the dither clamper of a scan ion Conductance Microscope, it is characterized in that, comprise the tubular grip cover (1) of clamping glass micro pipette probe (2), described tubular grip cover (1) outside is provided with annular flange flange (4), annular flange flange (4) below is connected with flexible member (5), and flexible member (5) lower end is fixed on fixed base plate (6); The upper surface of described annular flange flange (4) is placed with ring-shaped piezo ceramic sheet (7), ring-shaped piezo ceramic sheet (7) is fixedly connected on fixing top board (8), and fixed base plate (6) is fixedly connected with fixing top board (8); Ring-shaped piezo ceramic sheet (7) is communicated with after vibration with driving circuit, drives tubular grip cover (1) and glass micro pipette probe (2) to make dither in the vertical direction;
Maximize as objective function using the resonance frequency of described dither clamper, (1) parameters of basic dimensions of overlapping using described tubular grip and material parameter are as design variable, after being optimized analysis by limited element analysis technique, the dimensional parameters of tubular grip cover (1) and the optimal value of material parameter can be determined.
2. the dither clamper of scan ion Conductance Microscope as claimed in claim 1, it is characterized in that, after glass micro pipette probe (2) makes dither in the vertical direction, the signal that the data acquisition unit of scan ion Conductance Microscope receives is AC signal.
3. the dither clamper of scan ion Conductance Microscope as claimed in claim 2, it is characterized in that, described data acquisition unit gathers AC signal by micro current amplifier.
4. the dither clamper of scan ion Conductance Microscope as claimed in claim 1, it is characterized in that, described dither clamper is fixed on Z-direction piezoelectric ceramics (11), after Z-direction piezoelectric ceramics (11) is communicated with controller, glass micro pipette probe (2) movement in vertical direction can be regulated.
5. the dither clamper of scan ion Conductance Microscope as claimed in claim 1, is characterized in that, by the vibration frequency and the amplitude that regulate the excited frequency of annular piezoelectric ceramic piece (7) to regulate glass micro pipette probe (2).
6. the dither clamper of scan ion Conductance Microscope as claimed in claim 1, it is characterized in that, the inwall of described tubular grip cover (1) is also attached with elastic coating (3).
7. the dither clamper of scan ion Conductance Microscope as claimed in claim 1, it is characterized in that, described fixing top board (8) is connected by bolt (9), nut (10) with fixed base plate (6).
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| CN201310263763.0A CN103336147B (en) | 2013-06-27 | 2013-06-27 | High-frequency vibration clamp device for scanning ion conductance microscope |
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| CN201310263763.0A CN103336147B (en) | 2013-06-27 | 2013-06-27 | High-frequency vibration clamp device for scanning ion conductance microscope |
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| CN103336147B true CN103336147B (en) | 2015-05-27 |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104155479B (en) * | 2014-07-15 | 2016-08-17 | 大连理工大学 | Modular scanning probe microscopy probe carriage |
| CN105445499B (en) * | 2015-12-16 | 2017-11-24 | 四川大学 | Scan the clamping of Ion Conductance Microscope glass probe and lighting device |
| CN105842485B (en) * | 2016-03-21 | 2019-01-18 | 西安交通大学 | Double probe scanning Ion Conductance Microscope systems and its imaging method based on balanced bridge |
| CN107015031A (en) * | 2017-05-22 | 2017-08-04 | 西安交通大学 | Dither objective table and SICM systems and scan method based on the objective table |
| CN110530942B (en) * | 2019-07-31 | 2021-02-02 | 西安交通大学 | Clamping and fixing device for electrochemical experiment platform microprobe |
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