CN102866317B - Method and system for quick test of mobile terminal capacitive touch screen - Google Patents
Method and system for quick test of mobile terminal capacitive touch screen Download PDFInfo
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- CN102866317B CN102866317B CN201210356759.4A CN201210356759A CN102866317B CN 102866317 B CN102866317 B CN 102866317B CN 201210356759 A CN201210356759 A CN 201210356759A CN 102866317 B CN102866317 B CN 102866317B
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Abstract
A method for quick test of a mobile terminal capacitive touch screen is applied to mobile terminals, and includes the steps: firstly, setting an upper limit value and a lower limit value of a reference value of a touch screen capacitance matrix and storing the upper limit value and the lower limit value; secondly, giving an order to a touch screen drive IC (integrated circuit) by a CPU (central processing unit) after capacitive touch screen test is started, sending out an order of acquiring the reference value of the touch screen capacitance matrix, reading the reference value of the touch screen capacitance matrix by the touch screen drive IC after receiving the order, and returning data to the CPU after reading is finished; thirdly, comparing the read touch screen reference value data with the upper limit value and the lower limit value; and fourthly, displaying comparison results whether the touch screen is a good product or a defective product. The invention further discloses a system for quick test of the mobile terminal capacitive touch screen, and the system comprises an upper-lower limit setting module, a capacitance matrix reference value acquiring module, a judging module and an execution module. The reference value of each point in the touch screen capacitance matrix is read and judged whether within the normal range or not so as to judge whether the touch screen is normal or not, and the method is high in test speed and accuracy.
Description
Technical field
The present invention relates to a kind of capacitance touch screen, particularly relate to a kind of method for rapidly testing and mobile terminal thereof of mobile terminal capacitance touch screen.
Background technology
Capacitance touch screen is generally to form a capacitance matrix by many sendaisles (X-axis) and many receiving cables (Y-axis) cross-distribution, in the time of finger touch screen, by the scanning of X, Y-axis, the capacitance variations of touch location detected, thereby calculate touch point coordinate.In the time there is no finger touch, there is a reference capacitance value in each point in capacitance matrix.Under normal circumstances, the capacitance matrix reference value of a touch-screen is fixed in a scope, and in matrix, the reference value of each point has a upper and lower bound, if reference value exceeds the upper limit or lower limit, we judge that this point of touch-screen has problem.
At present, for the test of one-body touch screen, generally there is special measurement jig, can fast detecting touch-screen whether normal.But in the time that touch-screen is assembled on complete machine, one-body touch screen measurement jig cannot use.Whether general producer when batch testing complete machine touch-screen, can adopt actual touch operation (such as line) to detect touch-screen normal under production line system test touch-screen or experimental situation.This method of testing test duration is long, and cannot ensure that test is to each point of touch-screen, easily produces the phenomenon such as test leakage, mistake survey.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, a kind of method for rapidly testing and mobile terminal thereof of mobile terminal capacitance touch screen are provided, adopt the way that reads each some electric capacity reference value of touch-screen capacitance matrix at device end, according to the bound setting in complete machine, judge that whether touch-screen is normal, this method test speed is fast, and test accuracy is high.
In order to achieve the above object, the technical solution used in the present invention is, a kind of method for rapidly testing of mobile terminal capacitance touch screen, and described method is applied to mobile terminal, comprises the following steps:
Step 1, the bound numerical value of the reference value of touch-screen capacitance matrix is set, and preserves;
Step 2, enter after capacitance touch screen test, CPU says the word to touch-screen drive IC, sends and obtains the order of touch-screen capacitance matrix reference value, after touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, after having read, again data are returned to CPU;
Step 3, the touch-screen reference value data that read and bound numerical value are compared;
Step 4, demonstration comparative result, touch-screen is non-defective unit or defective products.
Further, the bound numerical value of the reference value of the touch-screen capacitance matrix described in step 1 is matrix form, and be two two-dimensional matrixs, a higher limit matrix, a lower limit matrix, the corresponding capacitance touch screen send and receive of the each value passage infall capacitance upper limit or lower limit in higher limit matrix or lower limit matrix.
Further, the CPU described in step 2 says the word to touch-screen drive IC, and touch-screen drive IC data to be returned to CPU after having read be that CPU passes through the mutual communication of I2C, SPI communication interface and touch-screen drive IC and realizes again.
Further, the touch-screen capacitance matrix reference value reading described in step 2 is two-dimensional matrix, and reads capacitance matrix reference values all on capacitance touch screen.
Further, the touch-screen reference value data that read and bound numerical value are compared and are comprised:
The upper limit numerical value that the reference value of capacitance touch screen is set is MAX[X] [Y], lower limit numerical value is MIN[X] [Y], the touch-screen capacitance matrix reference value reading is M[X] [Y], X, Y represent the sending and receiving port number of touch-screen, MAX[X] [Y], MIN[X] [Y] one of them numerical value that is two-dimensional matrix;
MIN[X] [Y] <M[X] [Y] <MAX[X] [Y] be that this capacitance matrix reference value is all in normal range, otherwise not in normal range.
Further, described comparative result comprises:
If all capacitance matrix reference value of touch-screen all, in normal range, judges that touch-screen is non-defective unit, if exist a capacitance matrix reference value not in normal range, judge that touch-screen is defective products.
A fast testing system for described mobile terminal capacitance touch screen, comprising:
Bound arranges module, for the bound numerical value of reference value of touch-screen capacitance matrix is set, and is kept in system CPU;
Capacitance matrix reference value acquisition module, for entering after capacitance touch screen test, CPU says the word to touch-screen drive IC, send and obtain the order of touch-screen capacitance matrix reference value, after touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, after having read, again data are returned to CPU, CPU sends judge module to;
Judge module, for the touch-screen reference value data that read and bound numerical value are compared, and sends result to execution module;
Execution module, for showing comparative result, touch-screen is non-defective unit or defective products.
Compared with prior art, the invention has the beneficial effects as follows: in complete machine testing touch screen item, read the reference value of each point in touch-screen capacitance matrix, judge whether in normal range, thereby judge that whether touch-screen is normal, test speed is fast, and accuracy is high.
Brief description of the drawings
Fig. 1 is method flow diagram of the present invention;
Fig. 2 is two-dimensional matrix distribution plan of the present invention;
Fig. 3 is sending and receiving channel architecture schematic diagram of the present invention.
Embodiment
Be elaborated with reference to accompanying drawing below in conjunction with embodiment, to technical characterictic of the present invention and advantage are interpretated more in-depth.
Method flow diagram of the present invention as shown in Figure 1, a kind of method for rapidly testing of mobile terminal capacitance touch screen, described method is applied to mobile terminal, comprises the following steps:
Step 1, the bound numerical value of the reference value of touch-screen capacitance matrix is set, and preserves;
Step 2, enter after capacitance touch screen test, CPU says the word to touch-screen drive IC, sends and obtains the order of touch-screen capacitance matrix reference value, after touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, after having read, again data are returned to CPU;
Step 3, the touch-screen reference value data that read and bound numerical value are compared;
Step 4, demonstration comparative result, touch-screen is non-defective unit or defective products.
Further, the bound numerical value of the reference value of the touch-screen capacitance matrix described in step 1 is matrix form, and be two two-dimensional matrixs, a higher limit matrix, a lower limit matrix, the corresponding capacitance touch screen send and receive of the each value passage infall capacitance upper limit or lower limit in higher limit matrix or lower limit matrix.
As shown in Figure 2, the bound matrix mentioned here refers to two two-dimensional matrixs, a upper current limiting matrix, a lower current limiting matrix.Sendaisle and the receiving cable of capacitance touch screen are as shown below: (X is sendaisle, and Y is receiving cable).Sendaisle (X-axis) and receiving cable (Y-axis) cross-distribution form a capacitance matrix, the corresponding wherein X-axis of each value in capacitance matrix and the wherein capacitance of a Y-axis point of crossing.For example: in matrix, the tertial numerical value of the second row just represents the capacitance of X2 and Y3 point of crossing.MIN[X] [Y], MAX[X] [Y] be the matrix of the capable N of M row.
As shown in Figure 3, X is sendaisle to sending and receiving channel architecture schematic diagram of the present invention, sends and drives signal, such as sine wave or the square wave of certain frequency; Y is receiving cable, due to the impact of sendaisle driving signal, can there is coupling capacitance in sendaisle and receiving cable infall, receiving cable induction coupling capacitance size, specifically coupling capacitance is converted to voltage or current signal after the inner ADC of IC processes, becomes digital signal.
Further, the CPU described in step 2 says the word to touch-screen drive IC, and touch-screen drive IC data to be returned to CPU after having read be that CPU passes through the mutual communication of I2C, SPI communication interface and touch-screen drive IC and realizes again.
Further, the touch-screen capacitance matrix reference value reading described in step 2 is two-dimensional matrix, and reads capacitance matrix reference values all on capacitance touch screen.
Further, the touch-screen reference value data that read and bound numerical value are compared and are comprised:
The upper limit numerical value that the reference value of capacitance touch screen is set is MAX[X] [Y], lower limit numerical value is MIN[X] [Y], the touch-screen capacitance matrix reference value reading is M[X] [Y], X, Y represent the sending and receiving port number of touch-screen, MAX[X] [Y], MIN[X] [Y] one of them numerical value that is two-dimensional matrix;
MIN[X] [Y] <M[X] [Y] <MAX[X] [Y] be that this capacitance matrix reference value is all in normal range, otherwise not in normal range.
Further, described comparative result comprises:
If all capacitance matrix reference value of touch-screen all, in normal range, judges that touch-screen is non-defective unit, if exist a capacitance matrix reference value not in normal range, judge that touch-screen is defective products.
A fast testing system for described mobile terminal capacitance touch screen, comprising:
Bound arranges module, for the bound numerical value of reference value of touch-screen capacitance matrix is set, and is kept in system CPU;
Be mainly that the bound numerical value that touch-screen module producer is provided is written in cell phone software, bound numerical value is by a upper limit matrix M AX[X] [Y] and a lower limit matrix M IN[X] [Y] form.
Bound is curing program the inside, when each testing touch screen, all calls this bound numerical matrix.(X, Y represent the sending and receiving port number of touch-screen.MIN[X] [Y], MAX[X] [Y] be the matrix of the capable N of M row)
Capacitance matrix reference value acquisition module, for entering after capacitance touch screen test, CPU says the word to touch-screen drive IC, send and obtain the order of touch-screen capacitance matrix reference value, after touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, after having read, again data are returned to CPU, CPU sends judge module to;
This module is mainly that CPU passes through communication mutually between the communication interface such as I2C, SPI and touch-screen drive IC, obtains the capacitance matrix reference value of capacitance touch screen.Enter after testing touch screen system, CPU says the word to touch-screen drive IC, requires to obtain touch-screen capacitance matrix reference value, after drive IC receives orders, goes to read touch-screen capacitance matrix reference value, after having read, again data is returned to CPU.Capacitance matrix reference value is a matrix M [X] [Y] equally.
Judge module, for the touch-screen reference value data that read and bound numerical value are compared, and sends result to execution module;
For example: M[0] [0] and MIN[0] [0], MAX[0] [0] compare, M[0] [1] and MIN[0] [1], MAX[0] [1] compare, judge whether MIN[0] [0] < M[0] [0] <MAX[0] [0], MIN[0] [1] < M[0] [1] <MAX[0] [1], judge that all reference values of touch-screen are whether within normal range.
Execution module, for showing comparative result, touch-screen is non-defective unit or defective products.
Below the upper lower limit value numerical value of experiment touch-screen: this touch-screen has 15*12 passage, and higher limit matrix and lower limit matrix are respectively MAX[15] [12], MIN[15] [12].
MAX[12][15]：
| 3.93 | 3.94 | 3.96 | 3.96 | 3.95 | 3.97 | 3.92 | 3.9 | 3.9 | 3.91 | 3.03 | 3.05 | 3.04 | 3 | 3 |
| 3.39 | 3.4 | 3.42 | 3.4 | 3.37 | 3.34 | 3.33 | 3.32 | 3.31 | 3.31 | 2.93 | 2.93 | 2.92 | 2.91 | 2.89 |
| 3.53 | 3.57 | 3.58 | 3.58 | 3.53 | 3.52 | 3.5 | 3.47 | 3.47 | 3.45 | 3.17 | 3.18 | 3.17 | 3.16 | 3.13 |
| 3.5 | 3.55 | 3.54 | 3.54 | 3.5 | 3.48 | 3.47 | 3.44 | 3.43 | 3.41 | 3.19 | 3.19 | 3.19 | 3.18 | 3.15 |
| 3.2 | 3.23 | 3.22 | 3.25 | 3.18 | 3.13 | 3.11 | 3.08 | 3.06 | 3.06 | 2.91 | 2.91 | 2.91 | 2.9 | 2.87 |
| 3.42 | 3.53 | 3.53 | 3.57 | 3.47 | 3.4 | 3.38 | 3.35 | 3.32 | 3.33 | 3.26 | 3.24 | 3.25 | 3.25 | 3.22 |
| 3.4 | 3.48 | 3.46 | 3.45 | 3.5 | 3.37 | 3.34 | 3.32 | 3.3 | 3.3 | 3.29 | 3.28 | 3.29 | 3.28 | 3.25 |
| 3.39 | 3.45 | 3.44 | 3.41 | 3.41 | 3.43 | 3.34 | 3.3 | 3.27 | 3.28 | 3.34 | 3.32 | 3.34 | 3.32 | 3.3 |
| 3.36 | 3.42 | 3.42 | 3.4 | 3.35 | 3.4 | 3.36 | 3.37 | 3.25 | 3.27 | 3.37 | 3.36 | 3.38 | 3.36 | 3.34 |
| 3.34 | 3.39 | 3.39 | 3.37 | 3.33 | 3.39 | 3.29 | 3.3 | 3.23 | 3.25 | 3.41 | 3.41 | 3.43 | 3.42 | 3.39 |
| 3.32 | 3.39 | 3.38 | 3.36 | 3.32 | 3.33 | 3.35 | 3.28 | 3.23 | 3.24 | 3.49 | 3.47 | 3.49 | 3.46 | 3.46 |
| 3.26 | 3.3 | 3.27 | 3.27 | 3.22 | 3.24 | 3.31 | 3.21 | 3.14 | 3.16 | 3.9 | 3.9 | 3.87 | 3.84 | 3.85 |
MIN[12][15]
| 2.36 | 2.36 | 2.38 | 2.37 | 2.37 | 2.38 | 2.35 | 2.34 | 2.34 | 2.35 | 1.82 | 1.83 | 1.82 | 1.8 | 1.8 |
| 2.03 | 2.04 | 2.05 | 2.04 | 2.02 | 2 | 2 | 1.99 | 1.99 | 1.98 | 1.76 | 1.76 | 1.75 | 1.74 | 1.73 |
| 2.12 | 2.14 | 2.15 | 2.15 | 2.12 | 2.11 | 2.1 | 2.08 | 2.08 | 2.07 | 1.9 | 1.91 | 1.9 | 1.9 | 1.88 |
| 2.1 | 2.13 | 2.12 | 2.13 | 2.1 | 2.09 | 2.08 | 2.06 | 2.06 | 2.05 | 1.91 | 1.92 | 1.91 | 1.91 | 1.89 |
| 1.92 | 1.94 | 1.93 | 1.95 | 1.91 | 1.88 | 1.87 | 1.85 | 1.84 | 1.84 | 1.75 | 1.74 | 1.74 | 1.74 | 1.72 |
| 2.05 | 2.12 | 2.12 | 2.14 | 2.08 | 2.04 | 2.03 | 2.01 | 1.99 | 2 | 1.95 | 1.95 | 1.95 | 1.95 | 1.93 |
| 2.04 | 2.09 | 2.08 | 2.07 | 2.1 | 2.02 | 2.01 | 1.99 | 1.98 | 1.98 | 1.97 | 1.97 | 1.97 | 1.97 | 1.95 |
| 2.04 | 2.07 | 2.07 | 2.05 | 2.05 | 2.06 | 2.01 | 1.98 | 1.96 | 1.97 | 2 | 1.99 | 2 | 1.99 | 1.98 |
| 2.01 | 2.05 | 2.05 | 2.04 | 2.01 | 2.04 | 2.02 | 2.02 | 1.95 | 1.96 | 2.02 | 2.02 | 2.03 | 2.02 | 2.01 |
| 2.01 | 2.04 | 2.04 | 2.02 | 2 | 2.04 | 1.98 | 1.98 | 1.94 | 1.95 | 2.05 | 2.05 | 2.06 | 2.05 | 2.03 |
| 1.99 | 2.03 | 2.03 | 2.02 | 1.99 | 2 | 2.01 | 1.97 | 1.94 | 1.94 | 2.09 | 2.08 | 2.1 | 2.08 | 2.08 |
| 1.95 | 1.98 | 1.96 | 1.96 | 1.93 | 1.94 | 1.99 | 1.92 | 1.88 | 1.9 | 2.34 | 2.34 | 2.32 | 2.3 | 2.31 |
While supposing to have a testing touch screen, under the capacitance matrix reference value that CPU gets is:
M[12][15]：
| 3.09 | 3.08 | 3.06 | 3.05 | 3.05 | 3.09 | 3.06 | 3.05 | 3.05 | 3.04 | 2.51 | 2.5 | 2.48 | 2.45 | 2.42 |
| 2.85 | 2.85 | 2.85 | 2.83 | 2.83 | 2.8 | 2.79 | 2.79 | 2.79 | 2.78 | 2.57 | 2.56 | 2.54 | 2.51 | 2.48 |
| 2.8 | 2.83 | 2.81 | 2.8 | 2.8 | 2.81 | 2.78 | 2.76 | 2.76 | 2.73 | 2.57 | 2.56 | 2.55 | 2.51 | 2.49 |
| 2.79 | 2.82 | 2.8 | 2.79 | 2.79 | 2.79 | 2.77 | 2.75 | 2.74 | 2.71 | 2.59 | 2.57 | 2.56 | 2.52 | 2.5 |
| 2.81 | 2.82 | 2.81 | 2.82 | 2.8 | 2.76 | 2.74 | 2.74 | 2.71 | 2.68 | 2.6 | 2.57 | 2.56 | 2.53 | 2.52 |
| 2.75 | 2.8 | 2.81 | 2.84 | 2.8 | 2.75 | 2.73 | 2.73 | 2.71 | 2.66 | 2.61 | 2.6 | 2.57 | 2.55 | 2.54 |
| 2.72 | 2.77 | 2.75 | 2.76 | 2.83 | 2.74 | 2.72 | 2.72 | 2.71 | 2.64 | 2.63 | 2.62 | 2.6 | 2.56 | 2.56 |
| 2.71 | 2.76 | 2.74 | 2.73 | 2.75 | 2.8 | 2.72 | 2.7 | 2.71 | 2.66 | 2.67 | 2.65 | 2.62 | 2.59 | 2.59 |
| 2.7 | 2.74 | 2.72 | 2.72 | 2.72 | 2.79 | 2.73 | 2.75 | 2.69 | 2.66 | 2.71 | 2.68 | 2.65 | 2.62 | 2.6 |
| 2.69 | 2.74 | 2.72 | 2.7 | 2.71 | 2.79 | 2.69 | 2.7 | 2.67 | 2.65 | 2.76 | 2.72 | 2.68 | 2.65 | 2.64 |
| 2.68 | 2.74 | 2.72 | 2.7 | 2.7 | 2.74 | 2.74 | 2.69 | 2.67 | 2.64 | 2.8 | 2.77 | 2.73 | 2.69 | 2.67 |
| 1.47 | 2.7 | 2.68 | 2.66 | 2.66 | 2.68 | 2.73 | 2.66 | 2.63 | 2.6 | 3.15 | 3.14 | 3.06 | 3.02 | 3.01 |
Find M[11] numerical value 1.47 of [0] this point is less than the lower limit MIN[11 of this point] [0] 1.95, judge that this touch-screen is defective products.
Above content is in conjunction with concrete optimal way further description made for the present invention, should not assert that specific embodiment of the invention is confined to above explanation.For those skilled in the art, without departing from the inventive concept of the premise, can also make some simple deduction or replace, within the definite protection domain of the claim that all should be considered as being submitted to by the present invention.
Claims (4)
1. a method for rapidly testing for mobile terminal capacitance touch screen, described method is applied to mobile terminal, comprises the following steps:
Step 1, the bound numerical value of the reference value of touch-screen capacitance matrix is set, and preserves; The bound numerical value of the reference value of described touch-screen capacitance matrix is matrix form, and be two two-dimensional matrixs, a higher limit matrix, a lower limit matrix, the corresponding capacitance touch screen send and receive of the each value passage infall capacitance upper limit or lower limit in higher limit matrix or lower limit matrix;
Step 2, enter after capacitance touch screen test, CPU says the word to touch-screen drive IC, sends and obtains the order of touch-screen capacitance matrix reference value, after touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, after having read, again data are returned to CPU; The described touch-screen capacitance matrix reference value reading is two-dimensional matrix, and reads capacitance matrix reference values all on capacitance touch screen;
Step 3, the touch-screen reference value data that read and bound numerical value are compared, specifically comprise: the upper limit numerical value that the reference value of capacitance touch screen is set is MAX[X] [Y], lower limit numerical value is MIN[X] [Y], the touch-screen capacitance matrix reference value reading is M[X] [Y], X, Y represent the sending and receiving port number of touch-screen, MAX[X] [Y], MIN[X] [Y] one of them numerical value that is two-dimensional matrix; MIN[X] [Y] <M[X] [Y] <MAX[X] [Y] be that this capacitance matrix reference value is all in normal range, otherwise not in normal range;
Step 4, demonstration comparative result, touch-screen is non-defective unit or defective products.
2. the method for rapidly testing of mobile terminal capacitance touch screen according to claim 1, it is characterized in that: the CPU described in step 2 says the word to touch-screen drive IC, and touch-screen drive IC data to be returned to CPU after having read be that CPU passes through the mutual communication of I2C, SPI communication interface and touch-screen drive IC and realizes again.
3. the method for rapidly testing of mobile terminal capacitance touch screen according to claim 2, is characterized in that, described comparative result comprises:
If all capacitance matrix reference value of touch-screen all, in normal range, judges that touch-screen is non-defective unit, if exist a capacitance matrix reference value not in normal range, judge that touch-screen is defective products.
4. according to a fast testing system for the mobile terminal capacitance touch screen described in any one in claim 1-3, it is characterized in that, comprising:
Bound arranges module, for the bound numerical value of reference value of touch-screen capacitance matrix is set, and is kept in system CPU;
Capacitance matrix reference value acquisition module, for entering after capacitance touch screen test, CPU says the word to touch-screen drive IC, send and obtain the order of touch-screen capacitance matrix reference value, after touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, after having read, again data are returned to CPU, CPU sends judge module to;
Judge module, for the touch-screen reference value data that read and bound numerical value are compared, and sends result to execution module;
Execution module, for showing comparative result, touch-screen is non-defective unit or defective products.
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| CN103197173A (en) * | 2013-03-11 | 2013-07-10 | 广东欧珀移动通信有限公司 | Test method of capacitance touch screen |
| CN104569727B (en) * | 2015-01-23 | 2017-12-08 | 珠海隆芯电子科技有限公司 | The method of testing of contactless electronic circuit test device |
| CN104881174B (en) * | 2015-06-04 | 2018-01-23 | 广东欧珀移动通信有限公司 | A kind of method and device of dynamic adjustment sensitivity of touch screen |
| CN107102210B (en) * | 2016-02-22 | 2019-08-30 | 深圳市汇顶科技股份有限公司 | A kind of capacitance determining method and device based on capacitive touch chip |
| CN107238788B (en) * | 2016-03-29 | 2019-12-27 | 深圳市汇顶科技股份有限公司 | Touch chip test system based on matrix capacitor plate and test method thereof |
| CN107621579B (en) * | 2017-09-05 | 2021-02-02 | 华显光电技术（惠州）有限公司 | Touch debugging method of touch screen |
| CN108225740A (en) * | 2017-12-28 | 2018-06-29 | 浙江德景电子科技有限公司 | A kind of test method of terminal iris production |
| CN108388387B (en) * | 2018-01-18 | 2021-08-13 | 深圳市万普拉斯科技有限公司 | Information processing method, information processing device, computer equipment and storage medium |
| WO2019153343A1 (en) * | 2018-02-12 | 2019-08-15 | 深圳市汇顶科技股份有限公司 | Matrix capacitor board and chip test method |
| TWI724742B (en) | 2020-01-09 | 2021-04-11 | 華碩電腦股份有限公司 | Diagnostic system |
| CN114740284A (en) * | 2022-02-23 | 2022-07-12 | 苏州华兴源创科技股份有限公司 | Method and device for detecting touch screen panel |
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| WO2011121862A1 (en) * | 2010-03-29 | 2011-10-06 | 株式会社アイテス | Inspection device of capacitive touch panel and method of inspection |
| CN101846712B (en) * | 2010-04-01 | 2012-08-29 | 苏州崴展电子科技有限公司 | ITO (Indium Tin Oxide) electrical characteristic detecting method and detecting system of capacitance type touch screen |
| CN201754171U (en) * | 2010-04-01 | 2011-03-02 | 苏州崴展电子科技有限公司 | ITO electrical characteristics detecting system of capacitive touch screen |
| CN101976161A (en) * | 2010-07-27 | 2011-02-16 | 苏州瀚瑞微电子有限公司 | Method for detecting capacitive touch screen |
| CN102121956A (en) * | 2010-11-26 | 2011-07-13 | 苏州佳世达电通有限公司 | Detection method and system of capacitance-type touch screen |
| CN102654543B (en) * | 2012-05-23 | 2014-07-30 | 东莞通华液晶有限公司 | Method for testing capacitive touch screens and testing equipment thereof |
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