CN108225740A - A kind of test method of terminal iris production - Google Patents

A kind of test method of terminal iris production Download PDF

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Publication number
CN108225740A
CN108225740A CN201711460286.1A CN201711460286A CN108225740A CN 108225740 A CN108225740 A CN 108225740A CN 201711460286 A CN201711460286 A CN 201711460286A CN 108225740 A CN108225740 A CN 108225740A
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CN
China
Prior art keywords
test
iris
terminal
light source
standard testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201711460286.1A
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Chinese (zh)
Inventor
周海波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZHEJIANG DEJING ELECTRONICS TECHNOLOGY CO LTD
Original Assignee
ZHEJIANG DEJING ELECTRONICS TECHNOLOGY CO LTD
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Publication date
Application filed by ZHEJIANG DEJING ELECTRONICS TECHNOLOGY CO LTD filed Critical ZHEJIANG DEJING ELECTRONICS TECHNOLOGY CO LTD
Priority to CN201711460286.1A priority Critical patent/CN108225740A/en
Publication of CN108225740A publication Critical patent/CN108225740A/en
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The present invention provides a kind of test methods of terminal iris production, belong to iris production test field.The test method of terminal iris production includes test device, test panel and test terminal.Before test starts, standard testing terminal is put in test device side, test panel is put in test device opposite side, by the test scope of one circle iris light source of test panel acquisition, a little error is slightly increased on the basis of test block, marks the standard testing range of iris light source, remove standard testing terminal, it puts other-end to be tested, judgement of the iris light source in the range of standard testing is non-defective unit, and the judgement in the range of standard testing is defective products.The consistency of terminal iris equipment can be improved by the method, ensures production yield.

Description

A kind of test method of terminal iris production
Technical field
The present invention relates to iris production test field, specifically a kind of test method of terminal iris production.
Background technology
In all biological identification technologies including fingerprint, iris recognition is that current application is the most convenient and accurate It is a kind of.Iris recognition technology is widely regarded as 21st century most promising biometrics, following peace The application of the multiple fields such as anti-, national defence, e-commerce, also inevitable meeting are attached most importance to iris recognition technology.This trend is Gradually start to display in the various applications of all parts of the world, market application foreground is boundless.Therefore, high precision is produced Property terminal iris equipment have a vast market prospect.
Invention content
Facilitate a kind of easy and accurate terminal iris for measuring iris light source data the purpose of the present invention is to provide a kind of The test method of production, overcomes the shortcomings of original technology.
To achieve the above object, the present invention provides following scheme:
The used in order to solve the above problem technical solution of the present invention is:It is characterised in that it includes:Test device, test Panel and test terminal, before test starts, standard testing terminal is put in test device side, and it is another that test panel is put in test device Side by m acquisition iris light source data of test panel, is finally averaged to obtain test scope x~y of iris light source, A little error delta n is slightly increased on the basis of test block, marks standard testing range x ± Δ n~y ± Δs n of iris light source;
Standard testing terminal is removed, other-end is put and is tested, judgement of the iris light source in the range of standard testing For non-defective unit, the judgement in the range of standard testing is defective products.
Further, the test panel acquires iris light source data m times, and m is the bigger the better in principle, according to actual conditions Answer m≤10.
Further, the test panel is finally averaged to obtain iris test of light source range x~y, answers rejected in advance It is evident that caused by human error and deviates the larger data of normal zone of reasonableness.
The present invention compared with prior art, has the advantages that:The easy and accurate iris light source for measuring product Test scope, and then compared with standard testing range, so as to quickly determine whether non-defective unit, substantially increase production efficiency.
Description of the drawings
Fig. 1 is the flow chart of the present invention.
Specific embodiment
The present invention is described in more detail with reference to the accompanying drawings and detailed description.
As shown in Figure 1, a kind of test method of terminal iris production provided by the invention, including:Test device, test surfaces Plate and test terminal, before test starts, standard testing terminal is put in test device side, and it is another that test panel is put in test device Side by m acquisition iris light source data of test panel, is finally averaged to obtain test scope x~y of iris light source, A little error delta n is slightly increased on the basis of test block, marks standard testing range x ± Δ n~y ± Δs n of iris light source;
Standard testing terminal is removed, other-end is put and is tested, surveys iris light source data in standard testing range Interior judgement is non-defective unit, and the judgement in the range of standard testing is defective products.
The test panel acquires iris light source data m times, and m is the bigger the better in principle, and m≤10, m are answered according to actual conditions Numerical value is bigger, can more reduce the error of acquisition iris light source data standard testing range, so as to improve the accuracy of follow-up test.
The test panel is finally averaged to obtain iris test of light source range x~y, and rejected in advance is answered to be evident that Deviate the larger data of normal zone of reasonableness caused by other errors such as artificial, with the science of data required by raising and accurately Property.
It should be pointed out that the detailed description carried out above by preferred embodiment to technical scheme of the present invention is to show Meaning property and not restrictive.Those of ordinary skill in the art can be to specific real on the basis of description of the invention is read The technical solution recorded in mode is applied to modify or carry out which part technical characteristic equivalent replacement, and these are changed Or it replaces, the range for specific embodiment of the invention scheme that it does not separate the essence of the corresponding technical solution.

Claims (3)

1. a kind of test method of terminal iris production, which is characterized in that including:Test device, test panel and test terminal, Before test starts, standard testing terminal is put in test device side, and test panel is put in test device opposite side, passes through test surfaces M acquisition iris light source data of plate, is finally averaged to obtain test scope x~y of iris light source, on the basis of test block A little error delta n is slightly increased, marks standard testing range x ± Δ n~y ± Δs n of iris light source;
Standard testing terminal is removed, other-end is put and is tested, judgement of the iris light source in the range of standard testing is good Product, the judgement in the range of standard testing are defective products.
2. a kind of test method of terminal iris production according to claim 1, it is characterised in that:The test panel is adopted Collect iris light source data m times, m is the bigger the better in principle, and m≤10 are answered according to actual conditions.
3. a kind of test method of terminal iris production according to claim 1, it is characterised in that:The test panel is most After be averaged to obtain iris test of light source range x~y, rejected in advance is answered to be evident that caused by human error and is deviateed just The larger data of normal zone of reasonableness.
CN201711460286.1A 2017-12-28 2017-12-28 A kind of test method of terminal iris production Withdrawn CN108225740A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711460286.1A CN108225740A (en) 2017-12-28 2017-12-28 A kind of test method of terminal iris production

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201711460286.1A CN108225740A (en) 2017-12-28 2017-12-28 A kind of test method of terminal iris production

Publications (1)

Publication Number Publication Date
CN108225740A true CN108225740A (en) 2018-06-29

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201711460286.1A Withdrawn CN108225740A (en) 2017-12-28 2017-12-28 A kind of test method of terminal iris production

Country Status (1)

Country Link
CN (1) CN108225740A (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006048204A (en) * 2004-08-02 2006-02-16 Matsushita Electric Ind Co Ltd Pupil detecting device and pupil authenticating device
CN102866317A (en) * 2012-09-24 2013-01-09 广东欧珀移动通信有限公司 Method and system for quick test of mobile terminal capacitive touch screen
CN104866839A (en) * 2015-06-03 2015-08-26 北京释码大华科技有限公司 Test device and method for testing performance of iris recognition equipment
CN106446827A (en) * 2016-09-21 2017-02-22 北京小米移动软件有限公司 Iris identification function detecting method and device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006048204A (en) * 2004-08-02 2006-02-16 Matsushita Electric Ind Co Ltd Pupil detecting device and pupil authenticating device
CN102866317A (en) * 2012-09-24 2013-01-09 广东欧珀移动通信有限公司 Method and system for quick test of mobile terminal capacitive touch screen
CN104866839A (en) * 2015-06-03 2015-08-26 北京释码大华科技有限公司 Test device and method for testing performance of iris recognition equipment
CN106446827A (en) * 2016-09-21 2017-02-22 北京小米移动软件有限公司 Iris identification function detecting method and device

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Application publication date: 20180629