CN102866317A - Method and system for quick test of mobile terminal capacitive touch screen - Google Patents
Method and system for quick test of mobile terminal capacitive touch screen Download PDFInfo
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Abstract
A method for quick test of a mobile terminal capacitive touch screen is applied to mobile terminals, and includes the steps: firstly, setting an upper limit value and a lower limit value of a reference value of a touch screen capacitance matrix and storing the upper limit value and the lower limit value; secondly, giving an order to a touch screen drive IC (integrated circuit) by a CPU (central processing unit) after capacitive touch screen test is started, sending out an order of acquiring the reference value of the touch screen capacitance matrix, reading the reference value of the touch screen capacitance matrix by the touch screen drive IC after receiving the order, and returning data to the CPU after reading is finished; thirdly, comparing the read touch screen reference value data with the upper limit value and the lower limit value; and fourthly, displaying comparison results whether the touch screen is a good product or a defective product. The invention further discloses a system for quick test of the mobile terminal capacitive touch screen, and the system comprises an upper-lower limit setting module, a capacitance matrix reference value acquiring module, a judging module and an execution module. The reference value of each point in the touch screen capacitance matrix is read and judged whether within the normal range or not so as to judge whether the touch screen is normal or not, and the method is high in test speed and accuracy.
Description
Technical field
The present invention relates to a kind of capacitance touch screen, particularly relate to a kind of method for rapidly testing and portable terminal thereof of portable terminal capacitance touch screen.
Background technology
Capacitance touch screen generally is to form a capacitance matrix by many sendaisles (X-axis) and many receiving cables (Y-axis) cross-distribution, when the finger touch screen, by the scanning of X, Y-axis, detect the capacitance variations of touch location, thereby calculate the touch point coordinate.When not having finger touch, there is a reference capacitance value in each point in the capacitance matrix.Under normal circumstances, the capacitance matrix reference value of a touch-screen is fixed in the scope, and the reference value of each point has a upper and lower bound in the matrix, if reference value exceeds the upper limit or lower limit, we judge that then this point of touch-screen has problem.
At present for the test of one-body touch screen, special-purpose measurement jig is arranged generally, can the fast detecting touch-screen whether normal.But when touch-screen was assembled on the complete machine, one-body touch screen measurement jig can't use.Whether during batch testing complete machine touch-screen, it is normal to adopt actual touch operation (such as line) to detect touch-screen under production line system test touch-screen or experimental situation in general producer.This method of testing test duration is long, and can't guarantee test to each point of touch-screen, produces easily the phenomenons such as test leakage, mistake survey.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, a kind of method for rapidly testing and portable terminal thereof of portable terminal capacitance touch screen are provided, the way of each some electric capacity reference value of touch-screen capacitance matrix is read in employing at device end, according to the bound that in complete machine, sets, judge whether touch-screen is normal, this method test speed is fast, and test accuracy is high.
In order to achieve the above object, the technical solution used in the present invention is, a kind of method for rapidly testing of portable terminal capacitance touch screen, and described method is applied to portable terminal, may further comprise the steps:
Step 2, enter capacitance touch screen test after, CPU says the word to the touch-screen drive IC, sends and obtains the order of touch-screen capacitance matrix reference value, after the touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, read and again data are returned to CPU after finishing;
Step 3, touch-screen reference value data and the bound numerical value that reads is compared;
Step 4, demonstration comparative result, touch-screen is non-defective unit or defective products.
Further, the bound numerical value of the reference value of the described touch-screen capacitance matrix of step 1 is matrix form, and be two two-dimensional matrixs, a higher limit matrix, a lower limit matrix, each is worth the corresponding capacitance touch screen send and receive passage infall capacitance upper limit or lower limit in higher limit matrix or the lower limit matrix.
Further, the described CPU of step 2 says the word to the touch-screen drive IC, and the touch-screen drive IC reads, and data to be returned to CPU after finishing be that CPU passes through the mutual communication of I2C, SPI communication interface and touch-screen drive IC and realizes again.
Further, the described touch-screen capacitance matrix reference value that reads of step 2 is two-dimensional matrix, and reads capacitance matrix reference values all on the capacitance touch screen.
Further, the touch-screen reference value data that read and bound numerical value compared comprise:
The upper limit numerical value that the reference value of capacitance touch screen is set is MAX[X] [Y], lower limit numerical value is MIN[X] [Y], the touch-screen capacitance matrix reference value that reads is M[X] [Y], X, Y represent the sending and receiving port number of touch-screen, MAX[X] [Y], MIN[X] [Y] be one of them numerical value of two-dimensional matrix;
MIN[X] [Y]＜M[X] [Y]＜MAX[X] [Y] then be that this capacitance matrix reference value is all in normal range, otherwise not in normal range.
Further, described comparative result comprises:
If all capacitance matrix reference value of touch-screen all in normal range, judges that then touch-screen is non-defective unit, if exist a capacitance matrix reference value not in normal range, judge that then touch-screen is defective products.
A kind of fast testing system of described portable terminal capacitance touch screen comprises:
Bound arranges module, for the bound numerical value of the reference value that the touch-screen capacitance matrix is set, and is kept in the system CPU;
Capacitance matrix reference value acquisition module, be used for after entering the capacitance touch screen test, CPU says the word to the touch-screen drive IC, send and obtain the order of touch-screen capacitance matrix reference value, after the touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, read and again data are returned to CPU after finishing, CPU sends judge module to;
Judge module is used for touch-screen reference value data and the bound numerical value that reads is compared, and sends the result to execution module;
Execution module is used for showing comparative result that touch-screen is non-defective unit or defective products.
Compared with prior art, the invention has the beneficial effects as follows: in complete machine testing touch screen item, read the reference value of each point in the touch-screen capacitance matrix, judge whether in normal range, thereby judge whether touch-screen is normal, and test speed is fast, accuracy is high.
Description of drawings
Fig. 1 is method flow diagram of the present invention;
Fig. 2 is two-dimensional matrix distribution plan of the present invention;
Fig. 3 is sending and receiving channel architecture synoptic diagram of the present invention.
Embodiment
Be elaborated with reference to accompanying drawing below in conjunction with embodiment, in order to technical characterictic of the present invention and advantage are carried out more deep annotation.
Method flow diagram of the present invention as shown in Figure 1, a kind of method for rapidly testing of portable terminal capacitance touch screen, described method is applied to portable terminal, may further comprise the steps:
Step 2, enter capacitance touch screen test after, CPU says the word to the touch-screen drive IC, sends and obtains the order of touch-screen capacitance matrix reference value, after the touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, read and again data are returned to CPU after finishing;
Step 3, touch-screen reference value data and the bound numerical value that reads is compared;
Step 4, demonstration comparative result, touch-screen is non-defective unit or defective products.
Further, the bound numerical value of the reference value of the described touch-screen capacitance matrix of step 1 is matrix form, and be two two-dimensional matrixs, a higher limit matrix, a lower limit matrix, each is worth the corresponding capacitance touch screen send and receive passage infall capacitance upper limit or lower limit in higher limit matrix or the lower limit matrix.
As shown in Figure 2, the bound matrix of mentioning here refers to two two-dimensional matrixs, a upper current limiting matrix, a lower current limiting matrix.Sendaisle and the receiving cable of capacitance touch screen are as shown below: (X is sendaisle, and Y is receiving cable).Sendaisle (X-axis) and receiving cable (Y-axis) cross-distribution form a capacitance matrix, the corresponding wherein X-axis of each value in the capacitance matrix and the capacitance of a Y-axis point of crossing wherein.For example: the tertial numerical value of the second row just represents the capacitance of X2 and Y3 point of crossing in the matrix.MIN[X] [Y], MAX[X] [Y] be the matrix of the capable N of M row.
Sending and receiving channel architecture synoptic diagram of the present invention as shown in Figure 3, X is sendaisle, send to drive signal, such as sine wave or the square wave of certain frequency; Y is receiving cable, because sendaisle drives the impact of signal, can there be coupling capacitance in sendaisle and receiving cable infall, receiving cable induction coupling capacitance size, specifically coupling capacitance is converted to voltage or current signal after the inner ADC of IC processes, becomes digital signal.
Further, the described CPU of step 2 says the word to the touch-screen drive IC, and the touch-screen drive IC reads, and data to be returned to CPU after finishing be that CPU passes through the mutual communication of I2C, SPI communication interface and touch-screen drive IC and realizes again.
Further, the described touch-screen capacitance matrix reference value that reads of step 2 is two-dimensional matrix, and reads capacitance matrix reference values all on the capacitance touch screen.
Further, the touch-screen reference value data that read and bound numerical value compared comprise:
The upper limit numerical value that the reference value of capacitance touch screen is set is MAX[X] [Y], lower limit numerical value is MIN[X] [Y], the touch-screen capacitance matrix reference value that reads is M[X] [Y], X, Y represent the sending and receiving port number of touch-screen, MAX[X] [Y], MIN[X] [Y] be one of them numerical value of two-dimensional matrix;
MIN[X] [Y]＜M[X] [Y]＜MAX[X] [Y] then be that this capacitance matrix reference value is all in normal range, otherwise not in normal range.
Further, described comparative result comprises:
If all capacitance matrix reference value of touch-screen all in normal range, judges that then touch-screen is non-defective unit, if exist a capacitance matrix reference value not in normal range, judge that then touch-screen is defective products.
A kind of fast testing system of described portable terminal capacitance touch screen comprises:
Bound arranges module, for the bound numerical value of the reference value that the touch-screen capacitance matrix is set, and is kept in the system CPU;
Mainly be that the bound numerical value that touch-screen module producer provides is written in the cell phone software, bound numerical value is by a upper limit matrix M AX[X] [Y] and a lower limit matrix M IN[X] [Y] form.
Bound is inside the program of solidifying, and during each testing touch screen, all calls this bound numerical matrix.(X, Y represent the sending and receiving port number of touch-screen.MIN[X] [Y], MAX[X] [Y] be the matrix of the capable N of M row)
Capacitance matrix reference value acquisition module, be used for after entering the capacitance touch screen test, CPU says the word to the touch-screen drive IC, send and obtain the order of touch-screen capacitance matrix reference value, after the touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, read and again data are returned to CPU after finishing, CPU sends judge module to;
This module mainly is that CPU passes through mutually communication between the communication interface such as I2C, SPI and the touch-screen drive IC, obtains the capacitance matrix reference value of capacitance touch screen.After entering the testing touch screen system, CPU says the word to the touch-screen drive IC, requires to obtain touch-screen capacitance matrix reference value, after drive IC receives orders, then goes to read touch-screen capacitance matrix reference value, reads again data to be returned to CPU after finishing.The capacitance matrix reference value is a matrix M [X] [Y] equally.
Judge module is used for touch-screen reference value data and the bound numerical value that reads is compared, and sends the result to execution module;
For example: M[0] [0] and MIN[0] [0], MAX[0] [0] compare, M[0] [1] and MIN[0] [1], MAX[0] [1] compare, judge whether MIN[0] [0]＜M[0] [0]＜MAX[0] [0], MIN[0] [1]＜M[0] [1]＜MAX[0] [1], judge that all reference values of touch-screen are whether within normal range.
Execution module is used for showing comparative result that touch-screen is non-defective unit or defective products.
Below be the upper lower limit value numerical value of experiment touch-screen: this touch-screen has 15*12 passage, and higher limit matrix and lower limit matrix are respectively MAX[15] [12], MIN[15] [12].
MAX[12][15]：
| 3.93 | 3.94 | 3.96 | 3.96 | 3.95 | 3.97 | 3.92 | 3.9 | 3.9 | 3.91 | 3.03 | 3.05 | 3.04 | 3 | 3 |
| 3.39 | 3.4 | 3.42 | 3.4 | 3.37 | 3.34 | 3.33 | 3.32 | 3.31 | 3.31 | 2.93 | 2.93 | 2.92 | 2.91 | 2.89 |
| 3.53 | 3.57 | 3.58 | 3.58 | 3.53 | 3.52 | 3.5 | 3.47 | 3.47 | 3.45 | 3.17 | 3.18 | 3.17 | 3.16 | 3.13 |
| 3.5 | 3.55 | 3.54 | 3.54 | 3.5 | 3.48 | 3.47 | 3.44 | 3.43 | 3.41 | 3.19 | 3.19 | 3.19 | 3.18 | 3.15 |
| 3.2 | 3.23 | 3.22 | 3.25 | 3.18 | 3.13 | 3.11 | 3.08 | 3.06 | 3.06 | 2.91 | 2.91 | 2.91 | 2.9 | 2.87 |
| 3.42 | 3.53 | 3.53 | 3.57 | 3.47 | 3.4 | 3.38 | 3.35 | 3.32 | 3.33 | 3.26 | 3.24 | 3.25 | 3.25 | 3.22 |
| 3.4 | 3.48 | 3.46 | 3.45 | 3.5 | 3.37 | 3.34 | 3.32 | 3.3 | 3.3 | 3.29 | 3.28 | 3.29 | 3.28 | 3.25 |
| 3.39 | 3.45 | 3.44 | 3.41 | 3.41 | 3.43 | 3.34 | 3.3 | 3.27 | 3.28 | 3.34 | 3.32 | 3.34 | 3.32 | 3.3 |
| 3.36 | 3.42 | 3.42 | 3.4 | 3.35 | 3.4 | 3.36 | 3.37 | 3.25 | 3.27 | 3.37 | 3.36 | 3.38 | 3.36 | 3.34 |
| 3.34 | 3.39 | 3.39 | 3.37 | 3.33 | 3.39 | 3.29 | 3.3 | 3.23 | 3.25 | 3.41 | 3.41 | 3.43 | 3.42 | 3.39 |
| 3.32 | 3.39 | 3.38 | 3.36 | 3.32 | 3.33 | 3.35 | 3.28 | 3.23 | 3.24 | 3.49 | 3.47 | 3.49 | 3.46 | 3.46 |
| 3.26 | 3.3 | 3.27 | 3.27 | 3.22 | 3.24 | 3.31 | 3.21 | 3.14 | 3.16 | 3.9 | 3.9 | 3.87 | 3.84 | 3.85 |
MIN[12][15]
| 2.36 | 2.36 | 2.38 | 2.37 | 2.37 | 2.38 | 2.35 | 2.34 | 2.34 | 2.35 | 1.82 | 1.83 | 1.82 | 1.8 | 1.8 |
| 2.03 | 2.04 | 2.05 | 2.04 | 2.02 | 2 | 2 | 1.99 | 1.99 | 1.98 | 1.76 | 1.76 | 1.75 | 1.74 | 1.73 |
| 2.12 | 2.14 | 2.15 | 2.15 | 2.12 | 2.11 | 2.1 | 2.08 | 2.08 | 2.07 | 1.9 | 1.91 | 1.9 | 1.9 | 1.88 |
| 2.1 | 2.13 | 2.12 | 2.13 | 2.1 | 2.09 | 2.08 | 2.06 | 2.06 | 2.05 | 1.91 | 1.92 | 1.91 | 1.91 | 1.89 |
| 1.92 | 1.94 | 1.93 | 1.95 | 1.91 | 1.88 | 1.87 | 1.85 | 1.84 | 1.84 | 1.75 | 1.74 | 1.74 | 1.74 | 1.72 |
| 2.05 | 2.12 | 2.12 | 2.14 | 2.08 | 2.04 | 2.03 | 2.01 | 1.99 | 2 | 1.95 | 1.95 | 1.95 | 1.95 | 1.93 |
| 2.04 | 2.09 | 2.08 | 2.07 | 2.1 | 2.02 | 2.01 | 1.99 | 1.98 | 1.98 | 1.97 | 1.97 | 1.97 | 1.97 | 1.95 |
| 2.04 | 2.07 | 2.07 | 2.05 | 2.05 | 2.06 | 2.01 | 1.98 | 1.96 | 1.97 | 2 | 1.99 | 2 | 1.99 | 1.98 |
| 2.01 | 2.05 | 2.05 | 2.04 | 2.01 | 2.04 | 2.02 | 2.02 | 1.95 | 1.96 | 2.02 | 2.02 | 2.03 | 2.02 | 2.01 |
| 2.01 | 2.04 | 2.04 | 2.02 | 2 | 2.04 | 1.98 | 1.98 | 1.94 | 1.95 | 2.05 | 2.05 | 2.06 | 2.05 | 2.03 |
| 1.99 | 2.03 | 2.03 | 2.02 | 1.99 | 2 | 2.01 | 1.97 | 1.94 | 1.94 | 2.09 | 2.08 | 2.1 | 2.08 | 2.08 |
| 1.95 | 1.98 | 1.96 | 1.96 | 1.93 | 1.94 | 1.99 | 1.92 | 1.88 | 1.9 | 2.34 | 2.34 | 2.32 | 2.3 | 2.31 |
When supposing to have a testing touch screen, the capacitance matrix reference value that CPU gets access to is lower:
M[12][15]：
| 3.09 | 3.08 | 3.06 | 3.05 | 3.05 | 3.09 | 3.06 | 3.05 | 3.05 | 3.04 | 2.51 | 2.5 | 2.48 | 2.45 | 2.42 |
| 2.85 | 2.85 | 2.85 | 2.83 | 2.83 | 2.8 | 2.79 | 2.79 | 2.79 | 2.78 | 2.57 | 2.56 | 2.54 | 2.51 | 2.48 |
| 2.8 | 2.83 | 2.81 | 2.8 | 2.8 | 2.81 | 2.78 | 2.76 | 2.76 | 2.73 | 2.57 | 2.56 | 2.55 | 2.51 | 2.49 |
| 2.79 | 2.82 | 2.8 | 2.79 | 2.79 | 2.79 | 2.77 | 2.75 | 2.74 | 2.71 | 2.59 | 2.57 | 2.56 | 2.52 | 2.5 |
| 2.81 | 2.82 | 2.81 | 2.82 | 2.8 | 2.76 | 2.74 | 2.74 | 2.71 | 2.68 | 2.6 | 2.57 | 2.56 | 2.53 | 2.52 |
| 2.75 | 2.8 | 2.81 | 2.84 | 2.8 | 2.75 | 2.73 | 2.73 | 2.71 | 2.66 | 2.61 | 2.6 | 2.57 | 2.55 | 2.54 |
| 2.72 | 2.77 | 2.75 | 2.76 | 2.83 | 2.74 | 2.72 | 2.72 | 2.71 | 2.64 | 2.63 | 2.62 | 2.6 | 2.56 | 2.56 |
| 2.71 | 2.76 | 2.74 | 2.73 | 2.75 | 2.8 | 2.72 | 2.7 | 2.71 | 2.66 | 2.67 | 2.65 | 2.62 | 2.59 | 2.59 |
| 2.7 | 2.74 | 2.72 | 2.72 | 2.72 | 2.79 | 2.73 | 2.75 | 2.69 | 2.66 | 2.71 | 2.68 | 2.65 | 2.62 | 2.6 |
| 2.69 | 2.74 | 2.72 | 2.7 | 2.71 | 2.79 | 2.69 | 2.7 | 2.67 | 2.65 | 2.76 | 2.72 | 2.68 | 2.65 | 2.64 |
| 2.68 | 2.74 | 2.72 | 2.7 | 2.7 | 2.74 | 2.74 | 2.69 | 2.67 | 2.64 | 2.8 | 2.77 | 2.73 | 2.69 | 2.67 |
| 1.47 | 2.7 | 2.68 | 2.66 | 2.66 | 2.68 | 2.73 | 2.66 | 2.63 | 2.6 | 3.15 | 3.14 | 3.06 | 3.02 | 3.01 |
Find M[11] numerical value 1.47 of [0] this point is less than the lower limit MIN[11 of this point] [0] 1.95, judge that then this touch-screen is defective products.
Above content is the further description of the present invention being done in conjunction with concrete optimal way, should not assert that implementation of the present invention is confined to above explanation.For those skilled in the art, without departing from the inventive concept of the premise, can also make some simple deduction or replace, within the protection domain that the claim that all should be considered as being submitted to by the present invention is determined.
Claims (7)
1. the method for rapidly testing of a portable terminal capacitance touch screen, described method is applied to portable terminal, may further comprise the steps:
Step 1, the bound numerical value of the reference value of touch-screen capacitance matrix is set, and preserves;
Step 2, enter capacitance touch screen test after, CPU says the word to the touch-screen drive IC, sends and obtains the order of touch-screen capacitance matrix reference value, after the touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, read and again data are returned to CPU after finishing;
Step 3, touch-screen reference value data and the bound numerical value that reads is compared;
Step 4, demonstration comparative result, touch-screen is non-defective unit or defective products.
2. the method for rapidly testing of portable terminal capacitance touch screen according to claim 1, it is characterized in that: the bound numerical value of the reference value of the described touch-screen capacitance matrix of step 1 is matrix form, and be two two-dimensional matrixs, a higher limit matrix, a lower limit matrix, each is worth the corresponding capacitance touch screen send and receive passage infall capacitance upper limit or lower limit in higher limit matrix or the lower limit matrix.
3. the method for rapidly testing of portable terminal capacitance touch screen according to claim 2, it is characterized in that: the described CPU of step 2 says the word to the touch-screen drive IC, and the touch-screen drive IC reads, and data to be returned to CPU after finishing be that CPU passes through the mutual communication of I2C, SPI communication interface and touch-screen drive IC and realizes again.
4. the method for rapidly testing of portable terminal capacitance touch screen according to claim 3, it is characterized in that: the described touch-screen capacitance matrix reference value that reads of step 2 is two-dimensional matrix, and reads capacitance matrix reference values all on the capacitance touch screen.
5. the method for rapidly testing of portable terminal capacitance touch screen according to claim 4 is characterized in that, the touch-screen reference value data that read and bound numerical value is compared comprise:
The upper limit numerical value that the reference value of capacitance touch screen is set is MAX[X] [Y], lower limit numerical value is MIN[X] [Y], the touch-screen capacitance matrix reference value that reads is M[X] [Y], X, Y represent the sending and receiving port number of touch-screen, MAX[X] [Y], MIN[X] [Y] be one of them numerical value of two-dimensional matrix;
MIN[X] [Y]＜M[X] [Y]＜MAX[X] [Y] then be that this capacitance matrix reference value is all in normal range, otherwise not in normal range.
6. the method for rapidly testing of portable terminal capacitance touch screen according to claim 5 is characterized in that, described comparative result comprises:
If all capacitance matrix reference value of touch-screen all in normal range, judges that then touch-screen is non-defective unit, if exist a capacitance matrix reference value not in normal range, judge that then touch-screen is defective products.
One kind according to claim 1-6 in the fast testing system of each described portable terminal capacitance touch screen, it is characterized in that, comprising:
Bound arranges module, for the bound numerical value of the reference value that the touch-screen capacitance matrix is set, and is kept in the system CPU;
Capacitance matrix reference value acquisition module, be used for after entering the capacitance touch screen test, CPU says the word to the touch-screen drive IC, send and obtain the order of touch-screen capacitance matrix reference value, after the touch-screen drive IC receives orders, read touch-screen capacitance matrix reference value, read and again data are returned to CPU after finishing, CPU sends judge module to;
Judge module is used for touch-screen reference value data and the bound numerical value that reads is compared, and sends the result to execution module;
Execution module is used for showing comparative result that touch-screen is non-defective unit or defective products.
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