WO2023160373A1 - Measurement method and apparatus for touch screen panel - Google Patents

Measurement method and apparatus for touch screen panel Download PDF

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Publication number
WO2023160373A1
WO2023160373A1 PCT/CN2023/074736 CN2023074736W WO2023160373A1 WO 2023160373 A1 WO2023160373 A1 WO 2023160373A1 CN 2023074736 W CN2023074736 W CN 2023074736W WO 2023160373 A1 WO2023160373 A1 WO 2023160373A1
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WIPO (PCT)
Prior art keywords
capacitance
value
row
matrix data
column
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PCT/CN2023/074736
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French (fr)
Chinese (zh)
Inventor
王成龙
向准高
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苏州华兴源创科技股份有限公司
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Publication of WO2023160373A1 publication Critical patent/WO2023160373A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Definitions

  • the invention relates to the technical field of touch screen panels, in particular to a detection method and device for a touch screen panel.
  • each capacitance value of the touch screen panel can be judged. For example, a certain reference value can be used to judge by a certain percentage. When the actual capacitance value exceeds this percentage, it is judged that the capacitance value is abnormal. , the corresponding screen will be judged as defective.
  • a judging method is prone to problems. Specifically, if the specific percentage is set too small, more touch screen panels will be judged as defective products, and there is a problem of over-judgment; otherwise, there is a problem of missed judgment. In order to prevent missed judgment, the problem of over-judgment will appear, and the panels that could have been used are judged as defective products, which increases the production cost of the enterprise.
  • the purpose of the present invention is to provide a detection method and device for a touch screen panel that reasonably judges whether it is a defective product.
  • one embodiment of the present invention provides a detection method for a touch screen panel, including the following steps:
  • the touch screen panel is judged as a defective product.
  • the abnormal capacitance includes an upper limit abnormal capacitance exceeding the upper limit of the first preset range, and the preset quantity condition includes an upper limit quantity condition;
  • the step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" includes:
  • the upper limit quantity condition includes an upper limit row continuous value, an upper limit row discontinuous value, an upper limit column continuous value, and an upper limit column discontinuous value;
  • the touch screen panel is judged as a defective product.
  • the abnormal capacitance includes a lower limit abnormal capacitance lower than the lower limit of the first preset range, and the preset quantity condition includes a lower limit quantity condition;
  • the step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" includes:
  • the lower limit quantity condition includes a lower limit row continuous value, a lower limit row discontinuous value, a lower limit column continuous value, a lower limit column discontinuous value;
  • the touch screen panel is judged as a defective product.
  • the step "obtaining the capacitance matrix data of the touch screen panel" includes:
  • the capacitance collection data set is adjusted to the capacitance matrix data according to the number of rows and the number of columns.
  • the step "comparing whether each capacitance value in the capacitance matrix data is all within the first preset range" includes:
  • described mixed calculation judgment comprises steps:
  • the touch screen panel According to the row difference matrix data and the column sum difference matrix data, and/or the column difference matrix data and row sum difference matrix data, it is judged whether the touch screen panel is a good product.
  • the hybrid calculation judgment also includes the steps of:
  • the touch screen panel is judged as a good product
  • the touch screen panel is judged as a defective product.
  • the step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" includes:
  • the touch screen panel is judged as a defective product.
  • the step "comparing whether each capacitance value of the abnormal capacitance is within the second preset "within scope” includes:
  • the step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" includes:
  • an embodiment of the present invention provides a detection device for a touch screen panel, including:
  • An acquisition module configured to acquire the capacitance matrix data of the touch screen panel
  • the first judging module is used to compare whether each capacitance value in the capacitance matrix data is within the first preset range, and if not, mark the capacitance corresponding to the capacitance value not within the first preset range as Abnormal capacitance;
  • the second judging module is used for judging whether the quantity of the abnormal capacitance meets the preset quantity condition, and if not, judging the touch screen panel as a defective product.
  • an electronic device including:
  • a storage module for storing computer programs
  • the processing module can realize the steps in the above-mentioned detection method of the touch screen panel when executing the computer program.
  • an embodiment of the present invention provides a readable storage medium, which stores a computer program, and when the computer program is executed by the processing module, the steps in the above touch screen panel detection method can be realized.
  • the present invention has the following beneficial effects: using the detection method of the touch screen panel, at least screening from the two dimensions of the capacitance value and the amount of abnormal capacitance can reduce the probability of over-judgment and avoid the failure of good products.
  • the problem that the touch screen panel is judged as a defective product reduces the production cost and improves the production efficiency.
  • Fig. 1 is the flow chart of one embodiment of the detection method of touch screen panel of the present invention
  • Fig. 2 is the flowchart of another embodiment of the detection method of the touch screen panel of the present invention.
  • Fig. 3 is a schematic diagram of an embodiment of capacitance matrix data after marked abnormal capacitance according to an embodiment of the present invention
  • Fig. 4 is a schematic diagram of another embodiment of capacitance matrix data after marked abnormal capacitance according to an embodiment of the present invention.
  • Fig. 5 is a schematic diagram of another embodiment of capacitance matrix data after marked abnormal capacitance according to an embodiment of the present invention.
  • Fig. 6 is the data table of the capacitance matrix data of an embodiment of the present invention.
  • Fig. 7 is the data table of row difference matrix data of an embodiment of the present invention.
  • Fig. 8 is a data table of column difference matrix data according to an embodiment of the present invention.
  • Fig. 9 is a data table of column and difference matrix data of an embodiment of the present invention.
  • Fig. 10 is a data table of row and difference matrix data of an embodiment of the present invention.
  • FIG. 11 is a block diagram of a detection device for a touch screen panel according to an embodiment of the present invention.
  • FIG. 12 is a structural block diagram of a detection device for a touch screen panel according to an embodiment of the present invention.
  • 100 detection device; 10, capacitance detection module; 20, screen information acquisition module; 30, processing module; 40, storage module; 50, communication bus.
  • An embodiment of the present invention provides a detection method, device, and storage medium of a touch screen panel.
  • the detection method and device can avoid the problem that a good product touch screen panel is judged as a defective product, reduce production costs, and improve production efficiency.
  • the detection method of the touch screen panel in this embodiment is based on judging whether the capacitance value of each capacitor on the touch screen panel meets requirements.
  • the method can be formed by detecting the capacitance value by the capacitance detection module 10 , and then screening and analyzing the data of the detected capacitance value.
  • FIG. 1 and FIG. 2 are flow charts of detection methods for touch screen panels in two implementations of the present application, wherein FIG. 2 is a more specific implementation of the entire process.
  • the present application provides the operation steps of the method as described in the following embodiments or flow charts, based on routine or no creative work, in the steps where there is no necessary causal relationship logically in the method, the execution order of these steps is not It is limited to the execution sequence provided in the implementation manner of this application.
  • the detection method of concrete touch screen panel comprises the following steps:
  • Step S1 Obtain the capacitance matrix data of the touch screen panel
  • this step includes:
  • the capacitance collection data set is data of multiple detected capacitance values
  • the number of rows and columns of the capacitance of the touch screen panel corresponds to the actual arrangement on the panel
  • the capacitance acquisition data set is adjusted to the capacitance matrix data, so that the capacitance acquisition data set is changed into matrix data of rows and columns, and the matrix data can be referred to in FIG. 6 shown.
  • the first preset range can be a matrix corresponding to the size of the capacitance matrix data, for example, a matrix of 10 ⁇ 13, combining the 10 ⁇ 13 matrix data of the capacitance matrix data with a first preset range of 10 ⁇ 13 matrix values for comparison.
  • the first preset range may also all be a numerical value, for example, all values in the capacitance matrix data are compared with the same numerical value.
  • the first preset range is to float 20% above and below each value of the 10 ⁇ 13 benchmark matrix, for example, if a certain value is 100, the floating range is 80 at this time All values within ⁇ 120 meet the requirements. Compare each value in the capacitance matrix data with the 20% range of each reference value. If it is within the range, it meets the requirements, and if it is not within the range, it does not meet the requirements.
  • step S3 can be performed, with The body is as follows:
  • the touch screen panel is judged as a defective product.
  • the abnormal capacitance includes an upper limit abnormal capacitance exceeding the upper limit of the first preset range, and the preset quantity condition includes an upper limit quantity condition;
  • the upper limit quantity condition includes an upper limit row continuous value, an upper limit row discontinuous value, an upper limit column continuous value, and an upper limit column discontinuous value;
  • Step S3 includes:
  • the touch screen panel is judged as a defective product.
  • the abnormal capacitance includes a lower limit abnormal capacitance lower than the lower limit of the first preset range, and the preset quantity condition includes a lower limit quantity condition;
  • the lower limit quantity condition includes a lower limit row continuous value, a lower limit row discontinuous value, a lower limit column continuous value, a lower limit column discontinuous value;
  • Step S3 also includes:
  • the touch screen panel is judged as a defective product.
  • step S3 is described in more detail.
  • the continuous value of the upper limit row is 2, the discontinuous value of the upper limit row is 2, the continuous value of the upper limit column is 5, and the discontinuous value of the upper limit column is 5.
  • OK in Figures 3, 4, and 5 means that the capacitance value is within the first preset range
  • the normal capacitance within NG is the upper limit abnormal capacitance that all exceeds the upper limit of the first preset range. For example:
  • the row continuous value is 1
  • the column continuous value is 4, and there is no abnormal capacitance of row non-continuity and column non-continuity, while the upper limit row continuous value is 2, and the upper limit column continuous value is 5, which are all within the requirements. Therefore, The screen meets the requirements in the judgment of step S3;
  • the row continuous value is 2
  • the column continuous value is 2
  • the upper limit row continuous value is 2
  • the upper limit column continuous value is 5, so the row continuous value is not less than the upper limit Row continuous value, so, this screen is directly judged as defective product in step S3;
  • the row continuous value is 2
  • the column continuous value is 4
  • the upper limit row continuous value is 2
  • the upper limit column continuous value is 5
  • the row continuous value is not less than the upper limit row continuous value, so this screen is directly judged as a defective product in step S3.
  • the row continuous value is 1
  • the column continuous value is 4, there is no abnormal capacitance of row discontinuity and column discontinuity, and the upper limit row continuous value is 3, the upper limit column continuous value is 3, and the row continuous value is greater than the upper limit row continuous value, not required. Therefore, the screen is directly judged as a defective product in step S3;
  • the row continuous value is 2
  • the column continuous value is 2
  • there is no abnormal capacitance of non-continuous row and non-continuous column and the upper limit row continuous value is 3, and the upper limit column continuous value is 3, both of which are within the requirements, so,
  • the screen meets the requirements in the judgment of step S3;
  • the row continuous value is 2
  • the column continuous value is 4, there is no abnormal capacitance of row discontinuity and column discontinuity
  • the upper limit row continuous value is 3
  • the upper limit column continuous value is 3
  • the column continuous value is not less than the upper limit Continuous values are listed, so this screen is directly judged as a defective product in step S3.
  • step S4 when each capacitance value in the capacitance matrix data is all within the first preset range, step S4 can be performed:
  • the touch screen panel According to the row difference matrix data and the column sum difference matrix data, and/or the column difference matrix data and row sum difference matrix data, it is judged whether the touch screen panel is a good product.
  • step S4 is described in more detail:
  • Fig. 6 is the data table of the capacitance matrix data of an embodiment of the present invention, and this data table has listed the size of all capacitance values of capacitance matrix data, and Fig. 6 is the matrix of 10 * 13;
  • Fig. 7 is the data table of the row difference matrix data of an embodiment of the present invention, after subtracting two adjacent rows in Fig. 6, take the absolute value to obtain Fig. 7, and Fig. 7 is a matrix of 9 * 13;
  • Fig. 8 is the data table of the column difference matrix data of an embodiment of the present invention, after subtracting two adjacent columns in Fig. 6, take the absolute value to obtain Fig. 8, and Fig. 8 is a matrix of 10 * 12;
  • Fig. 9 is a data table of the column sum difference matrix data of an embodiment of the present invention, and Fig. 9 is obtained by adding and summing all columns in Fig. 7, and Fig. 9 is a matrix of 9 ⁇ 1;
  • Fig. 10 is a data table of the row and difference matrix data according to an embodiment of the present invention.
  • Fig. 10 is obtained by summing all the rows in Fig. 8, and
  • Fig. 10 is a 1 ⁇ 12 matrix.
  • step S4 also includes the steps of:
  • the touch screen panel is judged as a good product
  • the touch screen panel is judged as a defective product.
  • the preset row difference matrix range, the preset column difference matrix range, the preset column and difference matrix range, the preset row and difference matrix range can all be a matrix of a corresponding size, and the value of each position in the matrix is equal to A corresponding comparison, for example, comparing the 9 ⁇ 13 matrix data of the row difference matrix with the value of a 9 ⁇ 13 preset row difference matrix.
  • the preset row difference matrix range, the preset column difference matrix range, the preset column and difference matrix range, the preset row and difference matrix range can all be a value, for example, all the values in the row difference matrix data and Compare with the same value.
  • the judgment in step S4 takes into account the uniformity of the capacitance difference between adjacent points of the touch screen panel and the uniformity of the capacitance difference of the entire touch screen panel, so the problems of missed detection and missed judgment are avoided.
  • step S5 On the basis of step S3, when the quantity of the abnormal capacitance meets the preset quantity condition, then proceed to step S5, one implementation of step S5 is as follows:
  • each capacitance value of the abnormal capacitance is within a second preset range, wherein the second preset range
  • the lower limit is lower than the lower limit of the first preset range, and/or, the upper limit of the second preset range is higher than the upper limit of the first preset range;
  • the touch screen panel is judged as a defective product.
  • the first preset range is, for example, floating up and down by 20%, and the reference value is 100.
  • the capacitance value within the range of 80 to 120 meets the requirements
  • the second preset range is, for example, floating up and down 40%, at this time, the capacitance value within 60-140 meets the requirements, which is equivalent to relaxing the requirements on the capacitance value on the basis of the quantity judgment meeting the requirements. If it still cannot be satisfied under the relaxed conditions, the touch screen panel It is judged as a defective product.
  • the premise of relaxing from the first preset range to the second preset range is based on the quantity meeting the requirements, so it also avoids missing inspections and judging defective products as good products. The problem.
  • step of "comparing whether each capacitance value of the abnormal capacitance is within the second preset range” includes:
  • step S4 If all capacitance values are within the second preset range, the hybrid calculation judgment is performed, that is, the judgment of step S4 is performed.
  • step S4 is used to screen again to further judge whether it is a good product.
  • step S5 another implementation manner of step S5 is as follows:
  • the hybrid calculation judgment is performed, that is, the judgment of step S4 is directly performed.
  • the capacitance value of some screens may be 0 in one row and one column, even if the second preset range is judged at this time, it still cannot pass, but it may be normal for the capacitance value of this row and column to be 0, such as camera position,
  • the capacitance of the position of the light sensor may be very small or even 0, so the judgment of the second preset range is not performed at this time, and the judgment of step S4 is directly performed.
  • this embodiment has the following beneficial effects:
  • Using the detection method of the touch screen panel can reduce the probability of over-judgment, and at least screen from the two dimensions of capacitance value and abnormal capacitance, avoiding the problem of a good product touch screen panel being judged as a defective product, and reducing production costs. , improving production efficiency.
  • FIG. 11 it is a block diagram of a detection device 100 for a touch screen panel provided by an embodiment of the present invention.
  • the detection device 100 for a touch screen panel includes:
  • An acquisition module configured to acquire the capacitance matrix data of the touch screen panel
  • the first judging module is used to compare whether each capacitance value in the capacitance matrix data is within the first preset range, and if not, mark the capacitance corresponding to the capacitance value not within the first preset range as Abnormal capacitance;
  • the second judging module is used for judging whether the quantity of the abnormal capacitance meets the preset quantity condition, and if not, judging the touch screen panel as a defective product.
  • the second judging module is further used for judging whether the quantity of the upper limit abnormal capacitance meets the upper limit quantity condition.
  • the second judging module is also used to judge whether the number of the upper limit abnormal capacitance is less than the upper limit line Continuous Values, Upper Row Discontinuous Values, Upper Column Continuous Values, and Upper Column Discontinuous Values;
  • the touch screen panel is judged as a defective product.
  • the second judging module is further used for judging whether the quantity of the lower limit abnormal capacitance meets the condition of the lower limit quantity.
  • the second judging module is also used to judge whether the quantity of the lower limit abnormal capacitance is smaller than the lower limit row continuous value, the lower limit row discontinuous value, the lower limit column continuous value, and the lower limit column discontinuous value;
  • the touch screen panel is judged as a defective product.
  • the detection device 100 of the touch screen panel further includes a processing module 30, and the acquisition module includes a capacitance detection module 10 and a screen information acquisition module 20, and the capacitance detection module 10 is used to obtain the capacitance collection data group;
  • the screen information acquisition module 20 acquires the number of rows and the number of columns of the capacitance of the touch screen panel
  • the processing module 30 adjusts the capacitance collection data set to the capacitance matrix data according to the number of rows and the number of columns.
  • the processing module 30 may also perform mixed calculation judgment, and the mixed calculation judgment includes:
  • the detection device 100 of the touch screen panel also includes a third judging module, and the third judging module is used for determining the difference based on the row difference matrix data and the column sum difference matrix data, and/or the column difference matrix data and the row sum difference matrix data. matrix data to determine whether the touch screen panel is a good product.
  • the third judging module is also used for:
  • the touch screen panel is judged as a good product
  • the touch screen panel is judged as a defective product.
  • the detection device 100 of the touch screen panel further includes a fourth judging module, and the fourth judging module compares whether each capacitance value of the abnormal capacitance is within a second preset range, wherein the second preset the lower limit of the range is lower than the lower limit of the first predetermined range, and/or the upper limit of the second predetermined range is higher than the upper limit of the first predetermined range;
  • the touch screen panel is judged as a defective product.
  • the fourth judging module is further configured to forward it to the processing module 30 for the hybrid calculation judging when all capacitance values are within the second preset range.
  • the third judging module is further configured to forward it to the processing module 30 for the hybrid calculation judging when the quantity of the abnormal capacitance meets the preset quantity condition.
  • the probability of over-judgment can be reduced, at least from the two dimensions of capacitance value and abnormal capacitance, avoiding the problem of a good product touch screen panel being judged as a defective product, reducing the The production cost is improved, and the production efficiency is improved.
  • the detection device 100 for the touch screen panel may also include computing devices such as computers, notebooks, palmtop computers, and cloud servers.
  • computing devices such as computers, notebooks, palmtop computers, and cloud servers.
  • the schematic diagram is only an example of the detection device 100 of the touch screen panel, and does not constitute a limitation on the terminal equipment of the detection device 100 of the touch screen panel, and may include more or less components than those shown in the figure, or Combining certain components, or different components, for example, the detection device 100 of the touch screen panel may also include input and output devices, network access devices, buses, and the like.
  • the detection device 100 of the touch screen panel also includes a processing module 30, a storage module 40, and a computer program stored in the storage module 40 and operable on the processing module 30, such as the detection of the above-mentioned touch screen panel. method of procedure.
  • the processing module 30 executes the computer program, it implements the steps in the above embodiments of the detection method for each touch screen panel, such as the steps shown in FIG. 1 and FIG. 2 .
  • the capacitance detection module 10 obtains the capacitance collection data set
  • the screen information acquisition module 20 obtains the relevant parameters of the touch screen panel, such as obtaining the row number M and the column number N of the capacitance of the touch screen panel
  • the processing module 30 adjusts the capacitance collection data set For the capacitance matrix data of M*N, the above-mentioned judging method is adopted for it, and the calculation is performed in the processing module 30, and compared with each preset range value in the storage module 40, thereby judging the quality of the touch screen panel.
  • the detection device 100 of the touch screen panel may also include a communication bus 50, which is used to establish a connection between the capacitance detection module 10, the screen information acquisition module 20, the processing module 30, and the storage module 40.
  • the communication bus 50 may include a path for transmitting information among the above-mentioned capacitance detection module 10 , screen information acquisition module 20 , processing module 30 and storage module 40 .

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Abstract

A measurement method and apparatus for a touch screen panel. The method comprises: comparing whether each capacitance value in capacitance matrix data is within a first preset range; if not, marking a capacitor corresponding to the capacitance value that is not within the first preset range as an anomalous capacitor; and if the number of anomalous capacitors does not satisfy a preset number condition, determining a touch screen panel to be a defective product. According to the measurement method for the touch screen panel, it can be avoided that a good touch screen panel is determined to be a defective product.

Description

触摸屏面板的检测方法及装置Method and device for detecting touch screen panel 技术领域technical field
本发明涉及触摸屏面板技术领域，尤其涉及一种触摸屏面板的检测方法及装置。The invention relates to the technical field of touch screen panels, in particular to a detection method and device for a touch screen panel.
背景技术Background technique
在对触摸屏面板检测时，可以对触摸屏面板的各个电容值进行判断，例如以某一基准值，上下浮动一定的百分比进行判断，当实际的电容值超过该百分比时，判断为电容值的大小异常，会将对应的屏幕判定为不良品。但这样的判断方式容易出现问题，具体地，若具体的百分比设置得过小，会使更多的触摸屏面板被判断为不良品，存在过度判断的问题，反之则存在漏判断的问题。为了防止漏判断，则会出现过判断的问题，将本来可以使用的面板判断为不良品，增大了企业生产的成本。When detecting the touch screen panel, each capacitance value of the touch screen panel can be judged. For example, a certain reference value can be used to judge by a certain percentage. When the actual capacitance value exceeds this percentage, it is judged that the capacitance value is abnormal. , the corresponding screen will be judged as defective. However, such a judging method is prone to problems. Specifically, if the specific percentage is set too small, more touch screen panels will be judged as defective products, and there is a problem of over-judgment; otherwise, there is a problem of missed judgment. In order to prevent missed judgment, the problem of over-judgment will appear, and the panels that could have been used are judged as defective products, which increases the production cost of the enterprise.
发明内容Contents of the invention
为解决现有技术中触摸屏面板的良品判断存在过度判断的问题，本发明的目的在于提供一种合理判断是否为不良品的触摸屏面板的检测方法及装置。In order to solve the problem of over-judgment in the good product judgment of the touch screen panel in the prior art, the purpose of the present invention is to provide a detection method and device for a touch screen panel that reasonably judges whether it is a defective product.
为实现上述发明目的，本发明一实施方式提供一种触摸屏面板的检测方法，包括如下步骤：In order to achieve the purpose of the above invention, one embodiment of the present invention provides a detection method for a touch screen panel, including the following steps:
获取所述触摸屏面板的电容矩阵数据；Obtain the capacitance matrix data of the touch screen panel;
比较所述电容矩阵数据中的每个电容值是否全部在第一预设范围内；comparing whether each capacitance value in the capacitance matrix data is within a first preset range;
若否，则进行如下步骤：If not, proceed as follows:
将不在所述第一预设范围内的电容值对应的电容标记为异常电容；marking the capacitance corresponding to the capacitance value not within the first preset range as an abnormal capacitance;
判断所述异常电容的数量是否符合预设数量条件；judging whether the quantity of the abnormal capacitance meets a preset quantity condition;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
作为本发明的进一步改进，其中，所述异常电容包括超过所述第一预设范围上限的上限异常电容，所述预设数量条件包括上限数量条件；As a further improvement of the present invention, wherein the abnormal capacitance includes an upper limit abnormal capacitance exceeding the upper limit of the first preset range, and the preset quantity condition includes an upper limit quantity condition;
所述步骤“判断所述异常电容的数量是否符合预设数量条件”包括：The step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" includes:
判断所述上限异常电容的数量是否符合上限数量条件。It is judged whether the quantity of the upper limit abnormal capacitor meets the upper limit quantity condition.
作为本发明的进一步改进，所述上限数量条件包括上限行连续值、上限行非连续值、上限列连续值、上限列非连续值；As a further improvement of the present invention, the upper limit quantity condition includes an upper limit row continuous value, an upper limit row discontinuous value, an upper limit column continuous value, and an upper limit column discontinuous value;
还包括步骤：Also includes steps:
判断所述上限异常电容的数量是否小于上限行连续值、上限行非连续值、上限列连续值、以及上限列非连续值；Judging whether the number of the upper limit abnormal capacitance is less than the upper limit row continuous value, the upper limit row discontinuous value, the upper limit column continuous value, and the upper limit column discontinuous value;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
作为本发明的进一步改进，其中，所述异常电容包括低于所述第一预设范围下限的下限异常电容，所述预设数量条件包括下限数量条件；As a further improvement of the present invention, wherein the abnormal capacitance includes a lower limit abnormal capacitance lower than the lower limit of the first preset range, and the preset quantity condition includes a lower limit quantity condition;
所述步骤“判断所述异常电容的数量是否符合预设数量条件”包括：The step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" includes:
判断下限异常电容的数量是否符合下限数量条件。 It is judged whether the quantity of the lower limit abnormal capacitor meets the condition of the lower limit quantity.
作为本发明的进一步改进，所述下限数量条件包括下限行连续值、下限行非连续值、下限列连续值、下限列非连续值；As a further improvement of the present invention, the lower limit quantity condition includes a lower limit row continuous value, a lower limit row discontinuous value, a lower limit column continuous value, a lower limit column discontinuous value;
还包括步骤：Also includes steps:
判断所述下限异常电容的数量是否小于下限行连续值、下限行非连续值、下限列连续值、以及下限列非连续值；Judging whether the quantity of the lower limit abnormal capacitance is smaller than the lower limit row continuous value, the lower limit row discontinuous value, the lower limit column continuous value, and the lower limit column discontinuous value;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
作为本发明的进一步改进，所述步骤“获取所述触摸屏面板的电容矩阵数据”包括：As a further improvement of the present invention, the step "obtaining the capacitance matrix data of the touch screen panel" includes:
获取电容采集数据组；Obtain the capacitance collection data set;
获取所述触摸屏面板的电容的行数和列数；Obtain the row number and column number of the capacitance of the touch screen panel;
根据所述行数和所述列数，将所述电容采集数据组调整为所述电容矩阵数据。The capacitance collection data set is adjusted to the capacitance matrix data according to the number of rows and the number of columns.
作为本发明的进一步改进，所述步骤“比较所述电容矩阵数据中的每个电容值是否全部在第一预设范围内”包括：As a further improvement of the present invention, the step "comparing whether each capacitance value in the capacitance matrix data is all within the first preset range" includes:
比较所述电容矩阵数据中的每个电容值是否全部在第一预设范围内；comparing whether each capacitance value in the capacitance matrix data is within a first preset range;
若是，则进行混合计算判断，所述混合计算判断包括步骤：If so, then carry out mixed calculation judgment, described mixed calculation judgment comprises steps:
计算所述电容矩阵数据中相邻两行电容值的差值，生成行差值矩阵数据，计算所述行差值矩阵数据中每一列差值的和，生成列和差矩阵数据，和/或，Calculate the difference between the capacitance values of two adjacent rows in the capacitance matrix data, generate row difference matrix data, calculate the sum of each column difference in the row difference matrix data, and generate column sum difference matrix data, and/or ,
计算所述电容矩阵数据中相邻两列电容值的差值，生成列差值矩阵数据，计算所述列差值矩阵数据中每一行差值的和，生成行和差矩阵数据；Calculate the difference between two adjacent columns of capacitance values in the capacitance matrix data, generate column difference matrix data, calculate the sum of each row difference in the column difference matrix data, and generate row sum difference matrix data;
根据所述行差值矩阵数据及所述列和差矩阵数据、和/或所述列差值矩阵数据及行和差矩阵数据，判断所述触摸屏面板是否为良品。According to the row difference matrix data and the column sum difference matrix data, and/or the column difference matrix data and row sum difference matrix data, it is judged whether the touch screen panel is a good product.
作为本发明的进一步改进，所述混合计算判断还包括步骤：As a further improvement of the present invention, the hybrid calculation judgment also includes the steps of:
比较所述行差值矩阵数据中的全部数据是否全部在预设行差值矩阵范围内，和/或，compare whether all the data in the row difference matrix data are all within the range of the preset row difference matrix, and/or,
比较所述列差值矩阵数据中的全部数据是否全部在预设列差值矩阵范围内，和/或，comparing whether all the data in the column difference matrix data are all within the range of the preset column difference matrix, and/or,
比较所述列和差矩阵数据中的全部数据是否全部在预设列和差矩阵范围内，和/或，Comparing whether all the data in the column and difference matrix data are all within the range of the preset column and difference matrix, and/or,
比较所述行和差矩阵数据中的全部数据是否全部在预设行和差矩阵范围内；Comparing whether all the data in the row and difference matrix data are all within the range of the preset row and difference matrix;
若是，则将所述触摸屏面板判断为良品；If so, then the touch screen panel is judged as a good product;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
作为本发明的进一步改进，所述步骤“判断所述异常电容的数量是否符合预设数量条件”包括：As a further improvement of the present invention, the step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" includes:
判断所述异常电容的数量是否符合预设数量条件；judging whether the quantity of the abnormal capacitance meets a preset quantity condition;
若是，则进行如下步骤：If yes, proceed as follows:
比较所述异常电容的每个电容值是否在第二预设范围内，其中，所述第二预设范围的下限低于所述第一预设范围的下限，和/或，所述第二预设范围的上限高于所述第一预设范围的上限；Comparing whether each capacitance value of the abnormal capacitance is within a second preset range, wherein the lower limit of the second preset range is lower than the lower limit of the first preset range, and/or, the second the upper limit of the predetermined range is higher than the upper limit of the first predetermined range;
若至少一个电容值不在所述第二预设范围内，则将所述触摸屏面板判断为不良品。If at least one capacitance value is not within the second preset range, the touch screen panel is judged as a defective product.
作为本发明的进一步改进，所述步骤“比较所述异常电容的每个电容值是否在第二预 设范围内”包括：As a further improvement of the present invention, the step "comparing whether each capacitance value of the abnormal capacitance is within the second preset "within scope" includes:
比较所述异常电容的每个电容值是否在第二预设范围内；comparing whether each capacitance value of the abnormal capacitance is within a second preset range;
若全部电容值均在第二预设范围内，则进行所述混合计算判断。If all the capacitance values are within the second preset range, the mixed calculation judgment is performed.
作为本发明的进一步改进，所述步骤“判断所述异常电容的数量是否符合预设数量条件”包括：As a further improvement of the present invention, the step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" includes:
判断所述异常电容的数量是否符合预设数量条件；judging whether the quantity of the abnormal capacitance meets a preset quantity condition;
若是，则进行所述混合计算判断。If yes, perform the hybrid calculation judgment.
为实现上述发明目的之一，本发明一实施例提供了一种触摸屏面板的检测装置，包括：In order to achieve one of the objectives of the above invention, an embodiment of the present invention provides a detection device for a touch screen panel, including:
获取模块，用于获取所述触摸屏面板的电容矩阵数据；An acquisition module, configured to acquire the capacitance matrix data of the touch screen panel;
第一判断模块，用于比较所述电容矩阵数据中的每个电容值是否全部在第一预设范围内，若否，将不在所述第一预设范围内的电容值对应的电容标记为异常电容；The first judging module is used to compare whether each capacitance value in the capacitance matrix data is within the first preset range, and if not, mark the capacitance corresponding to the capacitance value not within the first preset range as Abnormal capacitance;
第二判断模块，用于判断所述异常电容的数量是否符合预设数量条件，若否，则将所述触摸屏面板判断为不良品。The second judging module is used for judging whether the quantity of the abnormal capacitance meets the preset quantity condition, and if not, judging the touch screen panel as a defective product.
为实现上述发明目的之一，本发明一实施例提供了一种电子设备，包括：To achieve one of the objectives of the above invention, an embodiment of the present invention provides an electronic device, including:
存储模块，存储计算机程序；A storage module for storing computer programs;
处理模块，执行所述计算机程序时可实现上述的触摸屏面板的检测方法中的步骤。The processing module can realize the steps in the above-mentioned detection method of the touch screen panel when executing the computer program.
为实现上述发明目的之一，本发明一实施例提供了一种可读存储介质，其存储有计算机程序，该计算机程序被处理模块执行时可实现上述的触摸屏面板的检测方法中的步骤。To achieve one of the objectives of the above invention, an embodiment of the present invention provides a readable storage medium, which stores a computer program, and when the computer program is executed by the processing module, the steps in the above touch screen panel detection method can be realized.
与现有技术相比，本发明具有以下有益效果：运用该触摸屏面板的检测方法，至少从电容值的大小、异常电容的量的两个维度筛选，可以减小过度判断的几率，避免了良品触摸屏面板被判定不良品的问题，降低了生产的成本，提高了生产效率。Compared with the prior art, the present invention has the following beneficial effects: using the detection method of the touch screen panel, at least screening from the two dimensions of the capacitance value and the amount of abnormal capacitance can reduce the probability of over-judgment and avoid the failure of good products. The problem that the touch screen panel is judged as a defective product reduces the production cost and improves the production efficiency.
附图说明Description of drawings
图1是本发明的触摸屏面板的检测方法的其一实施例的流程图；Fig. 1 is the flow chart of one embodiment of the detection method of touch screen panel of the present invention;
图2是本发明的触摸屏面板的检测方法的另一实施例的流程图；Fig. 2 is the flowchart of another embodiment of the detection method of the touch screen panel of the present invention;
图3是本发明一实施例的标记出的异常电容后的电容矩阵数据的其一实施例的示意图；Fig. 3 is a schematic diagram of an embodiment of capacitance matrix data after marked abnormal capacitance according to an embodiment of the present invention;
图4是本发明一实施例的标记出的异常电容后的电容矩阵数据的另一实施例的示意图；Fig. 4 is a schematic diagram of another embodiment of capacitance matrix data after marked abnormal capacitance according to an embodiment of the present invention;
图5是本发明一实施例的标记出的异常电容后的电容矩阵数据的另一实施例的示意图；Fig. 5 is a schematic diagram of another embodiment of capacitance matrix data after marked abnormal capacitance according to an embodiment of the present invention;
图6是本发明一实施例的电容矩阵数据的数据表；Fig. 6 is the data table of the capacitance matrix data of an embodiment of the present invention;
图7是本发明一实施例的行差值矩阵数据的数据表；Fig. 7 is the data table of row difference matrix data of an embodiment of the present invention;
图8是本发明一实施例的列差值矩阵数据的数据表；Fig. 8 is a data table of column difference matrix data according to an embodiment of the present invention;
图9是本发明一实施例的列和差矩阵数据的数据表；Fig. 9 is a data table of column and difference matrix data of an embodiment of the present invention;
图10是本发明一实施例的行和差矩阵数据的数据表； Fig. 10 is a data table of row and difference matrix data of an embodiment of the present invention;
图11是本发明一实施例的触摸屏面板的检测装置的模块示意图；11 is a block diagram of a detection device for a touch screen panel according to an embodiment of the present invention;
图12是本发明一实施例的触摸屏面板的检测装置的结构框图；12 is a structural block diagram of a detection device for a touch screen panel according to an embodiment of the present invention;
其中，100、检测装置；10、电容检测模块；20、屏幕信息获取模块；30、处理模块；40、存储模块；50、通信总线。Wherein, 100, detection device; 10, capacitance detection module; 20, screen information acquisition module; 30, processing module; 40, storage module; 50, communication bus.
具体实施方式Detailed ways
以下将结合附图所示的具体实施方式对本发明进行详细描述。但这些实施方式并不限制本发明，本领域的普通技术人员根据这些实施方式所做出的结构、方法、或功能上的变换均包含在本发明的保护范围内。The present invention will be described in detail below in conjunction with specific embodiments shown in the accompanying drawings. However, these embodiments do not limit the present invention, and any structural, method, or functional changes made by those skilled in the art according to these embodiments are included in the protection scope of the present invention.
本发明一实施例提供一种触摸屏面板的检测方法、装置及存储介质，该检测方法和装置可以避免良品触摸屏面板被判定不良品的问题，降低了生产的成本，提高了生产效率。An embodiment of the present invention provides a detection method, device, and storage medium of a touch screen panel. The detection method and device can avoid the problem that a good product touch screen panel is judged as a defective product, reduce production costs, and improve production efficiency.
本实施例的触摸屏面板的检测方法，是基于对触摸屏面板上的每个电容的电容值的大小是否符合要求的判断。可以由电容检测模块10对电容值进行检测，再对检测到的电容值的数据进行筛选和分析，从而形成该方法。The detection method of the touch screen panel in this embodiment is based on judging whether the capacitance value of each capacitor on the touch screen panel meets requirements. The method can be formed by detecting the capacitance value by the capacitance detection module 10 , and then screening and analyzing the data of the detected capacitance value.
图1和图2分别为本申请两种实施方式的触摸屏面板的检测方法的流程图，其中图2为全部流程的更具体的实施方式。虽然本申请提供了如下述实施方式或流程图所述的方法操作步骤，但是基于常规或者无需创造性的劳动，所述方法在逻辑性上不存在必要因果关系的步骤中，这些步骤的执行顺序不限于本申请实施方式中所提供的执行顺序。FIG. 1 and FIG. 2 are flow charts of detection methods for touch screen panels in two implementations of the present application, wherein FIG. 2 is a more specific implementation of the entire process. Although the present application provides the operation steps of the method as described in the following embodiments or flow charts, based on routine or no creative work, in the steps where there is no necessary causal relationship logically in the method, the execution order of these steps is not It is limited to the execution sequence provided in the implementation manner of this application.
具体的触摸屏面板的检测方法，包括如下步骤：The detection method of concrete touch screen panel comprises the following steps:
步骤S1：获取所述触摸屏面板的电容矩阵数据；Step S1: Obtain the capacitance matrix data of the touch screen panel;
具体地，该步骤包括：Specifically, this step includes:
获取电容采集数据组，其中，电容采集数据组为检测到的多个电容值的数据；Obtaining a capacitance collection data set, wherein the capacitance collection data set is data of multiple detected capacitance values;
获取所述触摸屏面板的电容的行数和列数，行数和列数对应着面板上的实际的排布；Obtaining the number of rows and columns of the capacitance of the touch screen panel, the number of rows and columns corresponds to the actual arrangement on the panel;
根据所述行数和所述列数，将所述电容采集数据组调整为所述电容矩阵数据，这样，将电容采集数据组变为一行行、一列列的矩阵数据，矩阵数据可参图6所示。According to the number of rows and the number of columns, the capacitance acquisition data set is adjusted to the capacitance matrix data, so that the capacitance acquisition data set is changed into matrix data of rows and columns, and the matrix data can be referred to in FIG. 6 shown.
步骤S2：Step S2:
比较所述电容矩阵数据中的每个电容值是否全部在第一预设范围内；comparing whether each capacitance value in the capacitance matrix data is within a first preset range;
第一预设范围可以是一个与所述电容矩阵数据对应大小的矩阵，例如都为10×13的矩阵，将电容矩阵数据的10×13的矩阵数据与一个10×13的第一预设范围矩阵的数值进行比较。第一预设范围也可以全部为一个数值，例如将电容矩阵数据中的所有值与同一个数值进行比较。The first preset range can be a matrix corresponding to the size of the capacitance matrix data, for example, a matrix of 10×13, combining the 10×13 matrix data of the capacitance matrix data with a first preset range of 10×13 matrix values for comparison. The first preset range may also all be a numerical value, for example, all values in the capacitance matrix data are compared with the same numerical value.
例如，先确定一个10×13的基准的矩阵，第一预设范围是在该10×13的基准的矩阵的每个数值上下浮动20％，例如某个值为100，此时浮动范围在80～120内均为符合要求，将电容矩阵数据中的每个值与每个基准值浮动20％的范围进行比较，若在范围内则符合要求，若不在范围内则不符合要求。For example, first determine a 10×13 benchmark matrix, and the first preset range is to float 20% above and below each value of the 10×13 benchmark matrix, for example, if a certain value is 100, the floating range is 80 at this time All values within ~120 meet the requirements. Compare each value in the capacitance matrix data with the 20% range of each reference value. If it is within the range, it meets the requirements, and if it is not within the range, it does not meet the requirements.
步骤S3：Step S3:
当所述电容矩阵数据中的每个电容值不全在第一预设范围内时，可以进行步骤S3，具 体如下：When each capacitance value in the capacitance matrix data is not all within the first preset range, step S3 can be performed, with The body is as follows:
将不在所述第一预设范围内的电容值对应的电容标记为异常电容；marking the capacitance corresponding to the capacitance value not within the first preset range as an abnormal capacitance;
判断所述异常电容的数量是否符合预设数量条件；judging whether the quantity of the abnormal capacitance meets a preset quantity condition;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
具体地，所述异常电容包括超过所述第一预设范围上限的上限异常电容，所述预设数量条件包括上限数量条件；Specifically, the abnormal capacitance includes an upper limit abnormal capacitance exceeding the upper limit of the first preset range, and the preset quantity condition includes an upper limit quantity condition;
所述上限数量条件包括上限行连续值、上限行非连续值、上限列连续值、上限列非连续值；The upper limit quantity condition includes an upper limit row continuous value, an upper limit row discontinuous value, an upper limit column continuous value, and an upper limit column discontinuous value;
步骤S3包括：Step S3 includes:
步骤S311：Step S311:
判断所述上限异常电容的数量是否符合上限数量条件。It is judged whether the quantity of the upper limit abnormal capacitor meets the upper limit quantity condition.
步骤S312：Step S312:
判断所述上限异常电容的数量是否小于上限行连续值、上限行非连续值、上限列连续值、以及上限列非连续值；Judging whether the number of the upper limit abnormal capacitance is less than the upper limit row continuous value, the upper limit row discontinuous value, the upper limit column continuous value, and the upper limit column discontinuous value;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
进一步地，所述异常电容包括低于所述第一预设范围下限的下限异常电容，所述预设数量条件包括下限数量条件；Further, the abnormal capacitance includes a lower limit abnormal capacitance lower than the lower limit of the first preset range, and the preset quantity condition includes a lower limit quantity condition;
所述下限数量条件包括下限行连续值、下限行非连续值、下限列连续值、下限列非连续值；The lower limit quantity condition includes a lower limit row continuous value, a lower limit row discontinuous value, a lower limit column continuous value, a lower limit column discontinuous value;
步骤S3还包括：Step S3 also includes:
步骤S321：Step S321:
判断下限异常电容的数量是否符合下限数量条件。It is judged whether the quantity of the lower limit abnormal capacitor meets the condition of the lower limit quantity.
步骤S322：Step S322:
判断所述下限异常电容的数量是否小于下限行连续值、下限行非连续值、下限列连续值、以及下限列非连续值；Judging whether the quantity of the lower limit abnormal capacitance is smaller than the lower limit row continuous value, the lower limit row discontinuous value, the lower limit column continuous value, and the lower limit column discontinuous value;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
以图3、4、5为例，对上述步骤S3进行更具体地说明。Taking FIGS. 3 , 4 , and 5 as examples, the above step S3 is described in more detail.
以上限行连续值是2、上限行非连续值是2、上限列连续值是5、上限列非连续值是5，图3、4、5中的OK为电容值在所述第一预设范围内的正常电容，NG为全部超过所述第一预设范围上限的上限异常电容为例：The continuous value of the upper limit row is 2, the discontinuous value of the upper limit row is 2, the continuous value of the upper limit column is 5, and the discontinuous value of the upper limit column is 5. OK in Figures 3, 4, and 5 means that the capacitance value is within the first preset range The normal capacitance within NG is the upper limit abnormal capacitance that all exceeds the upper limit of the first preset range. For example:
图3中的行连续值为1，列连续值为4，没有行非连续和列非连续的异常电容，而上限行连续值是2，上限列连续值是5，均在要求内，所以，该屏幕在步骤S3的判断中符合要求；In Figure 3, the row continuous value is 1, the column continuous value is 4, and there is no abnormal capacitance of row non-continuity and column non-continuity, while the upper limit row continuous value is 2, and the upper limit column continuous value is 5, which are all within the requirements. Therefore, The screen meets the requirements in the judgment of step S3;
图4中的行连续值为2，列连续值为2，没有行非连续和列非连续的异常电容，而上限行连续值是2，上限列连续值是5，所以行连续值没有小于上限行连续值，所以，该屏幕在步骤S3中直接被判断为不良品； In Figure 4, the row continuous value is 2, the column continuous value is 2, there is no abnormal capacitance of row discontinuity and column discontinuity, and the upper limit row continuous value is 2, the upper limit column continuous value is 5, so the row continuous value is not less than the upper limit Row continuous value, so, this screen is directly judged as defective product in step S3;
图5中的行连续值为2，列连续值为4，没有行非连续和列非连续的异常电容，而上限行连续值是2，上限列连续值是5，行连续值并没有小于上限行连续值，所以，该屏幕在步骤S3中直接被判断为不良品。In Figure 5, the row continuous value is 2, the column continuous value is 4, there is no abnormal capacitance of row discontinuity and column discontinuity, and the upper limit row continuous value is 2, the upper limit column continuous value is 5, and the row continuous value is not less than the upper limit row continuous value, so this screen is directly judged as a defective product in step S3.
另外，再以上限行连续值是3、上限行非连续值是3、上限列连续值是3、上限列非连续值是3为例进行解释：In addition, take the continuous value of the upper limit row as 3, the discontinuous value of the upper limit row as 3, the continuous value of the upper limit column as 3, and the discontinuous value of the upper limit column as 3 for example to explain:
图3中的行连续值为1，列连续值为4，没有行非连续和列非连续的异常电容，而上限行连续值是3，上限列连续值是3，行连续值大于上限行连续值，不在要求内。所以，该屏幕在步骤S3中直接被判断为不良品；In Figure 3, the row continuous value is 1, the column continuous value is 4, there is no abnormal capacitance of row discontinuity and column discontinuity, and the upper limit row continuous value is 3, the upper limit column continuous value is 3, and the row continuous value is greater than the upper limit row continuous value, not required. Therefore, the screen is directly judged as a defective product in step S3;
图4中的行连续值为2，列连续值为2，没有行非连续和列非连续的异常电容，而上限行连续值是3，上限列连续值是3，均在要求内，所以，该屏幕在步骤S3的判断中符合要求；In Figure 4, the row continuous value is 2, the column continuous value is 2, there is no abnormal capacitance of non-continuous row and non-continuous column, and the upper limit row continuous value is 3, and the upper limit column continuous value is 3, both of which are within the requirements, so, The screen meets the requirements in the judgment of step S3;
图5中的行连续值为2，列连续值为4，没有行非连续和列非连续的异常电容，而上限行连续值是3，上限列连续值是3，列连续值并没有小于上限列连续值，所以，该屏幕在步骤S3中直接被判断为不良品。In Figure 5, the row continuous value is 2, the column continuous value is 4, there is no abnormal capacitance of row discontinuity and column discontinuity, and the upper limit row continuous value is 3, the upper limit column continuous value is 3, and the column continuous value is not less than the upper limit Continuous values are listed, so this screen is directly judged as a defective product in step S3.
同样的，当图3、4、5中的NG为部分为超过所述第一预设范围上限的上限异常电容、部分为小于所述第一预设范围下限的下限异常电容时，以及或者全部为小于所述第一预设范围下限的下限异常电容时，也可以参上述方法进行判断。Similarly, when NG in Figures 3, 4, and 5 is partly an upper limit abnormal capacitance exceeding the upper limit of the first preset range, and partly a lower limit abnormal capacitance less than the lower limit of the first preset range, and or all When it is a lower limit abnormal capacitance smaller than the lower limit of the first preset range, it can also be judged by referring to the above method.
通过上述的判断，找屏幕中异常电容的组成的单个或者多个矩形，有些异常电容比如是摄像头所在位置、光线传感器所在区域、或者一些特定的区域、或者可以修复的区域，存在这些矩形区域时不意味着屏幕直接为不良品，所以根据需求调整上限行连续值、上限行非连续值、上限列连续值、以及上限列非连续值，和/或，下限行连续值、下限行非连续值、下限列连续值、下限列非连续值的不同的参数，可满足不同矩形大小和数量筛选的需求，当大小和数量超过这些矩形的要求时，再判定为不良品。Through the above judgment, look for single or multiple rectangles composed of abnormal capacitances in the screen. Some abnormal capacitances are the location of the camera, the area where the light sensor is located, or some specific areas, or areas that can be repaired. When these rectangular areas exist It does not mean that the screen is directly defective, so adjust the continuous value of the upper limit row, the discontinuous value of the upper limit row, the continuous value of the upper limit column, and the discontinuous value of the upper limit column, and/or, the continuous value of the lower limit row, the discontinuous value of the lower limit row Different parameters of , lower limit column continuous value, and lower limit column discontinuous value can meet the needs of different rectangle sizes and quantity screening. When the size and quantity exceed the requirements of these rectangles, it will be judged as a defective product.
步骤S4：Step S4:
在步骤S2中，当所述电容矩阵数据中的每个电容值全部在第一预设范围内时，可以进行步骤S4：In step S2, when each capacitance value in the capacitance matrix data is all within the first preset range, step S4 can be performed:
进行混合计算判断，所述混合计算判断包括步骤：Carry out mixed calculation judgment, described mixed calculation judgment comprises the steps:
计算所述电容矩阵数据中相邻两行电容值的差值，生成行差值矩阵数据，计算所述行差值矩阵数据中每一列差值的和，生成列和差矩阵数据，和/或，Calculate the difference between the capacitance values of two adjacent rows in the capacitance matrix data, generate row difference matrix data, calculate the sum of each column difference in the row difference matrix data, and generate column sum difference matrix data, and/or ,
计算所述电容矩阵数据中相邻两列电容值的差值，生成列差值矩阵数据，计算所述列差值矩阵数据中每一行差值的和，生成行和差矩阵数据；Calculate the difference between two adjacent columns of capacitance values in the capacitance matrix data, generate column difference matrix data, calculate the sum of each row difference in the column difference matrix data, and generate row sum difference matrix data;
根据所述行差值矩阵数据及所述列和差矩阵数据、和/或所述列差值矩阵数据及行和差矩阵数据，判断所述触摸屏面板是否为良品。According to the row difference matrix data and the column sum difference matrix data, and/or the column difference matrix data and row sum difference matrix data, it is judged whether the touch screen panel is a good product.
具体地，以图6～10中的表格为例，对上述步骤S4进行更具体地说明：Specifically, taking the tables in FIGS. 6-10 as examples, the above step S4 is described in more detail:
图6是本发明一实施例的电容矩阵数据的数据表，该数据表列出了电容矩阵数据的全部电容值的大小，图6是10×13的矩阵； Fig. 6 is the data table of the capacitance matrix data of an embodiment of the present invention, and this data table has listed the size of all capacitance values of capacitance matrix data, and Fig. 6 is the matrix of 10 * 13;
图7是本发明一实施例的行差值矩阵数据的数据表，将图6中相邻的两行相减后取绝对值得到图7，图7是9×13的矩阵；Fig. 7 is the data table of the row difference matrix data of an embodiment of the present invention, after subtracting two adjacent rows in Fig. 6, take the absolute value to obtain Fig. 7, and Fig. 7 is a matrix of 9 * 13;
图8是本发明一实施例的列差值矩阵数据的数据表，将图6中相邻的两列相减后取绝对值得到图8，图8是10×12的矩阵；Fig. 8 is the data table of the column difference matrix data of an embodiment of the present invention, after subtracting two adjacent columns in Fig. 6, take the absolute value to obtain Fig. 8, and Fig. 8 is a matrix of 10 * 12;
图9是本发明一实施例的列和差矩阵数据的数据表，将图7中所有列相加求和得到图9，图9是9×1的矩阵；Fig. 9 is a data table of the column sum difference matrix data of an embodiment of the present invention, and Fig. 9 is obtained by adding and summing all columns in Fig. 7, and Fig. 9 is a matrix of 9 × 1;
图10是本发明一实施例的行和差矩阵数据的数据表，将图8中所有行相加求和得到图10，图10是1×12的矩阵。Fig. 10 is a data table of the row and difference matrix data according to an embodiment of the present invention. Fig. 10 is obtained by summing all the rows in Fig. 8, and Fig. 10 is a 1×12 matrix.
进一步地，步骤S4还包括步骤：Further, step S4 also includes the steps of:
比较所述行差值矩阵数据中的全部数据是否全部在预设行差值矩阵范围内，和/或，compare whether all the data in the row difference matrix data are all within the range of the preset row difference matrix, and/or,
比较所述列差值矩阵数据中的全部数据是否全部在预设列差值矩阵范围内，和/或，comparing whether all the data in the column difference matrix data are all within the range of the preset column difference matrix, and/or,
比较所述列和差矩阵数据中的全部数据是否全部在预设列和差矩阵范围内，和/或，Comparing whether all the data in the column and difference matrix data are all within the range of the preset column and difference matrix, and/or,
比较所述行和差矩阵数据中的全部数据是否全部在预设行和差矩阵范围内；Comparing whether all the data in the row and difference matrix data are all within the range of the preset row and difference matrix;
若是，则将所述触摸屏面板判断为良品；If so, then the touch screen panel is judged as a good product;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
预设行差值矩阵范围、预设列差值矩阵范围、预设列和差矩阵范围、预设行和差矩阵范围都可以是一个对应大小的矩阵，将矩阵中每个位置的数值大小一一对应的比较，例如将行差值矩阵的9×13的矩阵数据与一个9×13的预设行差值矩阵的数值进行比较。预设行差值矩阵范围、预设列差值矩阵范围、预设列和差矩阵范围、预设行和差矩阵范围也可以全部为一个数值，例如将行差值矩阵数据中的所有值与同一个数值进行比较。The preset row difference matrix range, the preset column difference matrix range, the preset column and difference matrix range, the preset row and difference matrix range can all be a matrix of a corresponding size, and the value of each position in the matrix is equal to A corresponding comparison, for example, comparing the 9×13 matrix data of the row difference matrix with the value of a 9×13 preset row difference matrix. The preset row difference matrix range, the preset column difference matrix range, the preset column and difference matrix range, the preset row and difference matrix range can all be a value, for example, all the values in the row difference matrix data and Compare with the same value.
上述的比较可以只比较任一项，也可以全部比较，当全部比较时效果更好，比较的意义在于：The above comparison can only compare any item, or all of them. When all of them are compared, the effect is better. The significance of the comparison lies in:
在测试中存在一个问题，某个被测点的电容值接近正常值的上限，相邻其他被测点的电容值接近正常值的下限，在实际生产中，这种现象一般会整行或者整列发生，那么这种情况用以往的检测方法是可以通过的，但由于相邻两个电容值的差值过大，实际上此类屏幕是不合格的，也就是说现有的判断中，存在漏判断的问题，使不良品变成了良品。There is a problem in the test. The capacitance value of a certain measured point is close to the upper limit of the normal value, and the capacitance values of other adjacent measured points are close to the lower limit of the normal value. In actual production, this phenomenon generally occurs in the entire row or column. occurs, then this situation can be passed by the previous detection method, but because the difference between two adjacent capacitance values is too large, in fact this type of screen is unqualified, that is to say, in the existing judgment, there are The problem of missing judgment makes defective products become good products.
所以，通过比较行差值矩阵数据、列差值矩阵数据、行和差矩阵数据和列和差矩阵数据，可以将相邻行的电容、相邻列的电容、全部行的电容、全部列的电容之间建立关系，例如图9中，如果要求列和差矩阵数据中的所有值在2000以下，则可以判断该所述触摸屏面板为不良品。Therefore, by comparing row difference matrix data, column difference matrix data, row sum difference matrix data and column sum difference matrix data, the capacitance of adjacent rows, the capacitance of adjacent columns, the capacitance of all rows, the capacitance of all columns A relationship is established between the capacitances. For example, in FIG. 9 , if all the values in the column and difference matrix data are required to be below 2000, it can be judged that the touch screen panel is a defective product.
步骤S4的判断考虑到触摸屏面板各相邻点之间的电容值差值均匀性、以及整块触摸屏面板的电容值差值均匀性，所以避免了漏检、漏判断的问题。The judgment in step S4 takes into account the uniformity of the capacitance difference between adjacent points of the touch screen panel and the uniformity of the capacitance difference of the entire touch screen panel, so the problems of missed detection and missed judgment are avoided.
步骤S5：Step S5:
在步骤S3的基础上，当所述异常电容的数量符合预设数量条件时，则进行步骤S5，步骤S5的其一实施方式如下：On the basis of step S3, when the quantity of the abnormal capacitance meets the preset quantity condition, then proceed to step S5, one implementation of step S5 is as follows:
比较所述异常电容的每个电容值是否在第二预设范围内，其中，所述第二预设范围的 下限低于所述第一预设范围的下限，和/或，所述第二预设范围的上限高于所述第一预设范围的上限；comparing whether each capacitance value of the abnormal capacitance is within a second preset range, wherein the second preset range The lower limit is lower than the lower limit of the first preset range, and/or, the upper limit of the second preset range is higher than the upper limit of the first preset range;
若至少一个电容值不在所述第二预设范围内，则将所述触摸屏面板判断为不良品。If at least one capacitance value is not within the second preset range, the touch screen panel is judged as a defective product.
举例来说，在步骤S2中，第一预设范围例如是上下浮动20％，基准值是100，此时电容值在80～120内均为符合要求，而第二预设范围例如是上下浮动40％，此时电容值在60～140内均为符合要求，相当于在数量判断符合要求的基础上，点电容值的要求放宽，若在放宽条件下仍无法满足，则将所述触摸屏面板判断为不良品。For example, in step S2, the first preset range is, for example, floating up and down by 20%, and the reference value is 100. At this time, the capacitance value within the range of 80 to 120 meets the requirements, and the second preset range is, for example, floating up and down 40%, at this time, the capacitance value within 60-140 meets the requirements, which is equivalent to relaxing the requirements on the capacitance value on the basis of the quantity judgment meeting the requirements. If it still cannot be satisfied under the relaxed conditions, the touch screen panel It is judged as a defective product.
这样避免了一部分屏幕的过检的问题，同时从第一预设范围放宽到第二预设范围的前提，是在数量符合要求的基础上，所以也避免了漏检、将不良品判断为良品的问题。This avoids the problem of over-inspection of some screens. At the same time, the premise of relaxing from the first preset range to the second preset range is based on the quantity meeting the requirements, so it also avoids missing inspections and judging defective products as good products. The problem.
进一步地，所述步骤“比较所述异常电容的每个电容值是否在第二预设范围内”包括：Further, the step of "comparing whether each capacitance value of the abnormal capacitance is within the second preset range" includes:
比较所述异常电容的每个电容值是否在第二预设范围内；comparing whether each capacitance value of the abnormal capacitance is within a second preset range;
若全部电容值均在第二预设范围内，则进行所述混合计算判断，也就是进行步骤S4的判断。If all capacitance values are within the second preset range, the hybrid calculation judgment is performed, that is, the judgment of step S4 is performed.
此时部分电容在第二预设范围的要求内，由于不确定相邻电容的均匀性、整体的均匀性，所以通过步骤S4再进行筛选，对是否为良品做进一步判断。At this time, part of the capacitance is within the second preset range. Since the uniformity of adjacent capacitances and the overall uniformity are not sure, step S4 is used to screen again to further judge whether it is a good product.
步骤S5的其他实施例中，步骤S5的另一实施方式如下：In other embodiments of step S5, another implementation manner of step S5 is as follows:
进行所述混合计算判断，也就是说，直接进行步骤S4的判断。The hybrid calculation judgment is performed, that is, the judgment of step S4 is directly performed.
如果某些屏幕可能一行、一列的电容值均为0，此时哪怕再进行第二预设范围的判断还是无法通过，但可能该行该列的电容值为0是正常的，例如摄像头位置、光线传感器的位置的电容可能很小甚至为0，所以此时不在进行第二预设范围的判断，直接进行步骤S4的判断。If the capacitance value of some screens may be 0 in one row and one column, even if the second preset range is judged at this time, it still cannot pass, but it may be normal for the capacitance value of this row and column to be 0, such as camera position, The capacitance of the position of the light sensor may be very small or even 0, so the judgment of the second preset range is not performed at this time, and the judgment of step S4 is directly performed.
与现有技术相比，本实施例具有以下有益效果：Compared with the prior art, this embodiment has the following beneficial effects:
运用该触摸屏面板的检测方法，可以降低出现过判断的几率，至少从电容值的大小、异常电容的量的两个维度筛选，避免了良品触摸屏面板被判定不良品的问题，降低了生产的成本，提高了生产效率。Using the detection method of the touch screen panel can reduce the probability of over-judgment, and at least screen from the two dimensions of capacitance value and abnormal capacitance, avoiding the problem of a good product touch screen panel being judged as a defective product, and reducing production costs. , improving production efficiency.
在一个实施例中，如图11所示，是本发明一实施例提供的触摸屏面板的检测装置100的模块示意图，触摸屏面板的检测装置100包括：In one embodiment, as shown in FIG. 11 , it is a block diagram of a detection device 100 for a touch screen panel provided by an embodiment of the present invention. The detection device 100 for a touch screen panel includes:
获取模块，用于获取所述触摸屏面板的电容矩阵数据；An acquisition module, configured to acquire the capacitance matrix data of the touch screen panel;
第一判断模块，用于比较所述电容矩阵数据中的每个电容值是否全部在第一预设范围内，若否，将不在所述第一预设范围内的电容值对应的电容标记为异常电容；The first judging module is used to compare whether each capacitance value in the capacitance matrix data is within the first preset range, and if not, mark the capacitance corresponding to the capacitance value not within the first preset range as Abnormal capacitance;
第二判断模块，用于判断所述异常电容的数量是否符合预设数量条件，若否，则将所述触摸屏面板判断为不良品。The second judging module is used for judging whether the quantity of the abnormal capacitance meets the preset quantity condition, and if not, judging the touch screen panel as a defective product.
在一个实施例中，第二判断模块还用于判断所述上限异常电容的数量是否符合上限数量条件。In one embodiment, the second judging module is further used for judging whether the quantity of the upper limit abnormal capacitance meets the upper limit quantity condition.
在一个实施例中，第二判断模块还用于判断所述上限异常电容的数量是否小于上限行 连续值、上限行非连续值、上限列连续值、以及上限列非连续值；In one embodiment, the second judging module is also used to judge whether the number of the upper limit abnormal capacitance is less than the upper limit line Continuous Values, Upper Row Discontinuous Values, Upper Column Continuous Values, and Upper Column Discontinuous Values;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
在一个实施例中，第二判断模块还用于判断下限异常电容的数量是否符合下限数量条件。In one embodiment, the second judging module is further used for judging whether the quantity of the lower limit abnormal capacitance meets the condition of the lower limit quantity.
在一个实施例中，第二判断模块还用于判断所述下限异常电容的数量是否小于下限行连续值、下限行非连续值、下限列连续值、以及下限列非连续值；In one embodiment, the second judging module is also used to judge whether the quantity of the lower limit abnormal capacitance is smaller than the lower limit row continuous value, the lower limit row discontinuous value, the lower limit column continuous value, and the lower limit column discontinuous value;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
在一个实施例中，触摸屏面板的检测装置100还包括处理模块30，获取模块包括电容检测模块10和屏幕信息获取模块20，电容检测模块10用于获取电容采集数据组；In one embodiment, the detection device 100 of the touch screen panel further includes a processing module 30, and the acquisition module includes a capacitance detection module 10 and a screen information acquisition module 20, and the capacitance detection module 10 is used to obtain the capacitance collection data group;
屏幕信息获取模块20获取所述触摸屏面板的电容的行数和列数；The screen information acquisition module 20 acquires the number of rows and the number of columns of the capacitance of the touch screen panel;
处理模块30根据所述行数和所述列数，将所述电容采集数据组调整为所述电容矩阵数据。The processing module 30 adjusts the capacitance collection data set to the capacitance matrix data according to the number of rows and the number of columns.
在一个实施例中，处理模块30还可以进行混合计算判断，所述混合计算判断包括：In one embodiment, the processing module 30 may also perform mixed calculation judgment, and the mixed calculation judgment includes:
计算所述电容矩阵数据中相邻两行电容值的差值，生成行差值矩阵数据，计算所述行差值矩阵数据中每一列差值的和，生成列和差矩阵数据，和/或，Calculate the difference between the capacitance values of two adjacent rows in the capacitance matrix data, generate row difference matrix data, calculate the sum of each column difference in the row difference matrix data, and generate column sum difference matrix data, and/or ,
计算所述电容矩阵数据中相邻两列电容值的差值，生成列差值矩阵数据，计算所述列差值矩阵数据中每一行差值的和，生成行和差矩阵数据；Calculate the difference between two adjacent columns of capacitance values in the capacitance matrix data, generate column difference matrix data, calculate the sum of each row difference in the column difference matrix data, and generate row sum difference matrix data;
触摸屏面板的检测装置100还包括第三判断模块，第三判断模块用于根据所述行差值矩阵数据及所述列和差矩阵数据、和/或所述列差值矩阵数据及行和差矩阵数据，判断所述触摸屏面板是否为良品。The detection device 100 of the touch screen panel also includes a third judging module, and the third judging module is used for determining the difference based on the row difference matrix data and the column sum difference matrix data, and/or the column difference matrix data and the row sum difference matrix data. matrix data to determine whether the touch screen panel is a good product.
在一个实施例中，第三判断模块还用于：In one embodiment, the third judging module is also used for:
比较所述行差值矩阵数据中的全部数据是否全部在预设行差值矩阵范围内，和/或，compare whether all the data in the row difference matrix data are all within the range of the preset row difference matrix, and/or,
比较所述列差值矩阵数据中的全部数据是否全部在预设列差值矩阵范围内，和/或，comparing whether all the data in the column difference matrix data are all within the range of the preset column difference matrix, and/or,
比较所述列和差矩阵数据中的全部数据是否全部在预设列和差矩阵范围内，和/或，Comparing whether all the data in the column and difference matrix data are all within the range of the preset column and difference matrix, and/or,
比较所述行和差矩阵数据中的全部数据是否全部在预设行和差矩阵范围内；Comparing whether all the data in the row and difference matrix data are all within the range of the preset row and difference matrix;
若是，则将所述触摸屏面板判断为良品；If so, then the touch screen panel is judged as a good product;
若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
在一个实施例中，触摸屏面板的检测装置100还包括第四判断模块，第四判断模块比较所述异常电容的每个电容值是否在第二预设范围内，其中，所述第二预设范围的下限低于所述第一预设范围的下限，和/或，所述第二预设范围的上限高于所述第一预设范围的上限；In one embodiment, the detection device 100 of the touch screen panel further includes a fourth judging module, and the fourth judging module compares whether each capacitance value of the abnormal capacitance is within a second preset range, wherein the second preset the lower limit of the range is lower than the lower limit of the first predetermined range, and/or the upper limit of the second predetermined range is higher than the upper limit of the first predetermined range;
若至少一个电容值不在所述第二预设范围内，则将所述触摸屏面板判断为不良品。If at least one capacitance value is not within the second preset range, the touch screen panel is judged as a defective product.
在一个实施例中，第四判断模块还用于当全部电容值均在第二预设范围内时，将其转交处理模块30进行所述混合计算判断。In one embodiment, the fourth judging module is further configured to forward it to the processing module 30 for the hybrid calculation judging when all capacitance values are within the second preset range.
在一个实施例中，第三判断模块还用于当所述异常电容的数量符合预设数量条件时，将其转交处理模块30进行所述混合计算判断。 In one embodiment, the third judging module is further configured to forward it to the processing module 30 for the hybrid calculation judging when the quantity of the abnormal capacitance meets the preset quantity condition.
根据本发明的触摸屏面板的检测装置100，可以降低出现过判断的几率，至少从电容值的大小、异常电容的量的两个维度筛选，避免了良品触摸屏面板被判定不良品的问题，降低了生产的成本，提高了生产效率。According to the detection device 100 of the touch screen panel of the present invention, the probability of over-judgment can be reduced, at least from the two dimensions of capacitance value and abnormal capacitance, avoiding the problem of a good product touch screen panel being judged as a defective product, reducing the The production cost is improved, and the production efficiency is improved.
所述触摸屏面板的检测装置100还可以包括计算机、笔记本、掌上电脑及云端服务器等计算设备。本领域技术人员可以理解，所述示意图仅仅是触摸屏面板的检测装置100的示例，并不构成对触摸屏面板的检测装置100终端设备的限定，可以包括比图示更多或更少的部件，或者组合某些部件，或者不同的部件，例如所述触摸屏面板的检测装置100还可以包括输入输出设备、网络接入设备、总线等。The detection device 100 for the touch screen panel may also include computing devices such as computers, notebooks, palmtop computers, and cloud servers. Those skilled in the art can understand that the schematic diagram is only an example of the detection device 100 of the touch screen panel, and does not constitute a limitation on the terminal equipment of the detection device 100 of the touch screen panel, and may include more or less components than those shown in the figure, or Combining certain components, or different components, for example, the detection device 100 of the touch screen panel may also include input and output devices, network access devices, buses, and the like.
需要说明的是，本发明实施例的触摸屏面板的检测装置100中未披露的细节，请参照本发明实施例的触摸屏面板的检测方法中所披露的细节。It should be noted that for details not disclosed in the touch screen panel detection device 100 of the embodiment of the present invention, please refer to the details disclosed in the touch screen panel detection method of the embodiment of the present invention.
除了上述模块，触摸屏面板的检测装置100还包括处理模块30、存储模块40、以及存储在所述存储模块40中并可在所述处理模块30上运行的计算机程序，例如上述的触摸屏面板的检测方法的程序。所述处理模块30执行所述计算机程序时实现上述各个触摸屏面板的检测方法实施例中的步骤，例如图1和图2所示的步骤。In addition to the above-mentioned modules, the detection device 100 of the touch screen panel also includes a processing module 30, a storage module 40, and a computer program stored in the storage module 40 and operable on the processing module 30, such as the detection of the above-mentioned touch screen panel. method of procedure. When the processing module 30 executes the computer program, it implements the steps in the above embodiments of the detection method for each touch screen panel, such as the steps shown in FIG. 1 and FIG. 2 .
电容检测模块10获取电容采集数据组，屏幕信息获取模块20获取触摸屏面板的相关参数，例如获取所述触摸屏面板的电容的行数M和列数N，处理模块30将所述电容采集数据组调整为M*N的所述电容矩阵数据，在对其采用上述的判断方法，在处理模块30中运算，与存储模块40中的各个预设范围值进行比较，从而判断触摸屏面板的优劣。The capacitance detection module 10 obtains the capacitance collection data set, and the screen information acquisition module 20 obtains the relevant parameters of the touch screen panel, such as obtaining the row number M and the column number N of the capacitance of the touch screen panel, and the processing module 30 adjusts the capacitance collection data set For the capacitance matrix data of M*N, the above-mentioned judging method is adopted for it, and the calculation is performed in the processing module 30, and compared with each preset range value in the storage module 40, thereby judging the quality of the touch screen panel.
参图12所示，触摸屏面板的检测装置100还可以包括通信总线50，通信总线50用于将电容检测模块10、屏幕信息获取模块20、处理模块30与存储模块40之间建立连接，通信总线50可包括一通路，在上述的电容检测模块10、屏幕信息获取模块20、处理模块30与存储模块40之间传送信息。As shown in FIG. 12, the detection device 100 of the touch screen panel may also include a communication bus 50, which is used to establish a connection between the capacitance detection module 10, the screen information acquisition module 20, the processing module 30, and the storage module 40. The communication bus 50 may include a path for transmitting information among the above-mentioned capacitance detection module 10 , screen information acquisition module 20 , processing module 30 and storage module 40 .
应当理解，虽然本说明书按照实施方式加以描述，但并非每个实施方式仅包含一个独立的技术方案，说明书的这种叙述方式仅仅是为清楚起见，本领域技术人员应当将说明书作为一个整体，各实施方式中的技术方案也可以经适当组合，形成本领域技术人员可以理解的其他实施方式。It should be understood that although this description is described according to implementation modes, not each implementation mode only contains an independent technical solution, and this description in the description is only for clarity, and those skilled in the art should take the description as a whole, and each The technical solutions in the embodiments can also be properly combined to form other embodiments that can be understood by those skilled in the art.
上文所列出的一系列的详细说明仅仅是针对本发明的可行性实施方式的具体说明，它们并非用以限制本发明的保护范围，凡未脱离本发明技艺精神所作的等效实施方式或变更均应包含在本发明的保护范围之内。 The series of detailed descriptions listed above are only specific descriptions for feasible implementations of the present invention, and they are not intended to limit the protection scope of the present invention. Any equivalent implementation or implementation that does not depart from the technical spirit of the present invention All changes should be included within the protection scope of the present invention.

Claims (12)

  1. 一种触摸屏面板的检测方法，其特征在于，包括如下步骤：A detection method of a touch screen panel, characterized in that, comprising the steps of:
    获取所述触摸屏面板的电容矩阵数据；Obtain the capacitance matrix data of the touch screen panel;
    比较所述电容矩阵数据中的每个电容值是否全部在第一预设范围内；comparing whether each capacitance value in the capacitance matrix data is within a first preset range;
    若否，则进行如下步骤：If not, proceed as follows:
    将不在所述第一预设范围内的电容值对应的电容标记为异常电容；marking the capacitance corresponding to the capacitance value not within the first preset range as an abnormal capacitance;
    判断所述异常电容的数量是否符合预设数量条件；judging whether the quantity of the abnormal capacitance meets a preset quantity condition;
    若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
  2. 根据权利要求1所述的检测方法，其特征在于，其中，所述异常电容包括超过所述第一预设范围上限的上限异常电容，所述预设数量条件包括上限数量条件；The detection method according to claim 1, wherein the abnormal capacitance includes an upper limit abnormal capacitance exceeding the upper limit of the first preset range, and the preset number condition includes an upper limit number condition;
    所述步骤“判断所述异常电容的数量是否符合预设数量条件”包括：The step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" includes:
    判断所述上限异常电容的数量是否符合上限数量条件。It is judged whether the quantity of the upper limit abnormal capacitor meets the upper limit quantity condition.
  3. 根据权利要求2所述的检测方法，其特征在于，所述上限数量条件包括上限行连续值、上限行非连续值、上限列连续值、上限列非连续值；The detection method according to claim 2, wherein the upper limit quantity condition includes an upper limit row continuous value, an upper limit row discontinuous value, an upper limit column continuous value, and an upper limit column discontinuous value;
    还包括步骤：Also includes steps:
    判断所述上限异常电容的数量是否小于上限行连续值、上限行非连续值、上限列连续值、以及上限列非连续值；Judging whether the number of the upper limit abnormal capacitance is less than the upper limit row continuous value, the upper limit row discontinuous value, the upper limit column continuous value, and the upper limit column discontinuous value;
    若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
  4. 根据权利要求1所述的检测方法，其特征在于，其中，所述异常电容包括低于所述第一预设范围下限的下限异常电容，所述预设数量条件包括下限数量条件；The detection method according to claim 1, wherein the abnormal capacitance includes a lower limit abnormal capacitance lower than the lower limit of the first preset range, and the preset quantity condition includes a lower limit quantity condition;
    所述步骤“判断所述异常电容的数量是否符合预设数量条件”包括：The step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" includes:
    判断下限异常电容的数量是否符合下限数量条件。It is judged whether the quantity of the lower limit abnormal capacitor meets the condition of the lower limit quantity.
  5. 根据权利要求4所述的检测方法，其特征在于，所述下限数量条件包括下限行连续值、下限行非连续值、下限列连续值、下限列非连续值；The detection method according to claim 4, wherein the lower limit quantity condition includes a lower limit row continuous value, a lower limit row discontinuous value, a lower limit column continuous value, a lower limit column discontinuous value;
    还包括步骤：Also includes steps:
    判断所述下限异常电容的数量是否小于下限行连续值、下限行非连续值、下限列连续值、以及下限列非连续值；Judging whether the quantity of the lower limit abnormal capacitance is smaller than the lower limit row continuous value, the lower limit row discontinuous value, the lower limit column continuous value, and the lower limit column discontinuous value;
    若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
  6. 根据权利要求1所述的检测方法，其特征在于，所述步骤“获取所述触摸屏面板的电容矩阵数据”包括：The detection method according to claim 1, wherein the step "obtaining the capacitance matrix data of the touch screen panel" comprises:
    获取电容采集数据组；Obtain the capacitance collection data set;
    获取所述触摸屏面板的电容的行数和列数；Obtain the row number and column number of the capacitance of the touch screen panel;
    根据所述行数和所述列数，将所述电容采集数据组调整为所述电容矩阵数据。The capacitance collection data set is adjusted to the capacitance matrix data according to the number of rows and the number of columns.
  7. 根据权利要求1所述的检测方法，其特征在于，所述步骤“比较所述电容矩阵数据中的每个电容值是否全部在第一预设范围内”包括：The detection method according to claim 1, wherein the step "comparing whether each capacitance value in the capacitance matrix data is all within the first preset range" comprises:
    比较所述电容矩阵数据中的每个电容值是否全部在第一预设范围内； comparing whether each capacitance value in the capacitance matrix data is within a first preset range;
    若是，则进行混合计算判断，所述混合计算判断包括步骤：If so, then carry out mixed calculation judgment, described mixed calculation judgment comprises steps:
    计算所述电容矩阵数据中相邻两行电容值的差值，生成行差值矩阵数据，计算所述行差值矩阵数据中每一列差值的和，生成列和差矩阵数据，和/或，Calculate the difference between the capacitance values of two adjacent rows in the capacitance matrix data, generate row difference matrix data, calculate the sum of each column difference in the row difference matrix data, and generate column sum difference matrix data, and/or ,
    计算所述电容矩阵数据中相邻两列电容值的差值，生成列差值矩阵数据，计算所述列差值矩阵数据中每一行差值的和，生成行和差矩阵数据；Calculate the difference between two adjacent columns of capacitance values in the capacitance matrix data, generate column difference matrix data, calculate the sum of each row difference in the column difference matrix data, and generate row sum difference matrix data;
    根据所述行差值矩阵数据及所述列和差矩阵数据、和/或所述列差值矩阵数据及行和差矩阵数据，判断所述触摸屏面板是否为良品。According to the row difference matrix data and the column sum difference matrix data, and/or the column difference matrix data and row sum difference matrix data, it is judged whether the touch screen panel is a good product.
  8. 根据权利要求7所述的检测方法，其特征在于，所述混合计算判断还包括步骤：The detection method according to claim 7, wherein the hybrid calculation judgment further comprises the steps of:
    比较所述行差值矩阵数据中的全部数据是否全部在预设行差值矩阵范围内，和/或，compare whether all the data in the row difference matrix data are all within the range of the preset row difference matrix, and/or,
    比较所述列差值矩阵数据中的全部数据是否全部在预设列差值矩阵范围内，和/或，comparing whether all the data in the column difference matrix data are all within the range of the preset column difference matrix, and/or,
    比较所述列和差矩阵数据中的全部数据是否全部在预设列和差矩阵范围内，和/或，Comparing whether all the data in the column and difference matrix data are all within the range of the preset column and difference matrix, and/or,
    比较所述行和差矩阵数据中的全部数据是否全部在预设行和差矩阵范围内；Comparing whether all the data in the row and difference matrix data are all within the range of the preset row and difference matrix;
    若是，则将所述触摸屏面板判断为良品；If so, then the touch screen panel is judged as a good product;
    若否，则将所述触摸屏面板判断为不良品。If not, the touch screen panel is judged as a defective product.
  9. 根据权利要求7所述的检测方法，其特征在于，所述步骤“判断所述异常电容的数量是否符合预设数量条件”包括：The detection method according to claim 7, wherein the step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" comprises:
    判断所述异常电容的数量是否符合预设数量条件；judging whether the quantity of the abnormal capacitance meets a preset quantity condition;
    若是，则进行如下步骤：If yes, proceed as follows:
    比较所述异常电容的每个电容值是否在第二预设范围内，其中，所述第二预设范围的下限低于所述第一预设范围的下限，和/或，所述第二预设范围的上限高于所述第一预设范围的上限；Comparing whether each capacitance value of the abnormal capacitance is within a second preset range, wherein the lower limit of the second preset range is lower than the lower limit of the first preset range, and/or, the second the upper limit of the predetermined range is higher than the upper limit of the first predetermined range;
    若至少一个电容值不在所述第二预设范围内，则将所述触摸屏面板判断为不良品。If at least one capacitance value is not within the second preset range, the touch screen panel is judged as a defective product.
  10. 根据权利要求9所述的检测方法，其特征在于，所述步骤“比较所述异常电容的每个电容值是否在第二预设范围内”包括：The detection method according to claim 9, wherein the step of "comparing whether each capacitance value of the abnormal capacitance is within the second preset range" comprises:
    比较所述异常电容的每个电容值是否在第二预设范围内；comparing whether each capacitance value of the abnormal capacitance is within a second preset range;
    若全部电容值均在第二预设范围内，则进行所述混合计算判断。If all the capacitance values are within the second preset range, the mixed calculation judgment is performed.
  11. 根据权利要求7所述的检测方法，其特征在于，所述步骤“判断所述异常电容的数量是否符合预设数量条件”包括：The detection method according to claim 7, wherein the step "judging whether the quantity of the abnormal capacitance meets the preset quantity condition" comprises:
    判断所述异常电容的数量是否符合预设数量条件；judging whether the quantity of the abnormal capacitance meets a preset quantity condition;
    若是，则进行所述混合计算判断。If yes, perform the hybrid calculation judgment.
  12. 一种触摸屏面板的检测装置，其特征在于，包括：A detection device for a touch screen panel, characterized in that it comprises:
    获取模块，用于获取所述触摸屏面板的电容矩阵数据；An acquisition module, configured to acquire the capacitance matrix data of the touch screen panel;
    第一判断模块，用于比较所述电容矩阵数据中的每个电容值是否全部在第一预设范围内，若否，将不在所述第一预设范围内的电容值对应的电容标记为异常电容；The first judging module is used to compare whether each capacitance value in the capacitance matrix data is within the first preset range, and if not, mark the capacitance corresponding to the capacitance value not within the first preset range as Abnormal capacitance;
    第二判断模块，用于判断所述异常电容的数量是否符合预设数量条件，若否，则将所述触摸屏面板判断为不良品。 The second judging module is used for judging whether the quantity of the abnormal capacitance meets the preset quantity condition, and if not, judging the touch screen panel as a defective product.
PCT/CN2023/074736 2022-02-23 2023-02-07 Measurement method and apparatus for touch screen panel WO2023160373A1 (en)

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110050617A1 (en) * 2009-08-25 2011-03-03 Avago Technologies Ecbu (Singapore) Pte. Ltd. Method and Apparatus for Detecting Defective Traces in a Mutual Capacitance Touch Sensing Device
CN102866317A (en) * 2012-09-24 2013-01-09 广东欧珀移动通信有限公司 Method and system for quick test of mobile terminal capacitive touch screen
US9733293B1 (en) * 2012-09-21 2017-08-15 Qualcomm Incorporated Differential pixel test for capacitive touch screens
CN109976588A (en) * 2019-04-04 2019-07-05 广州视源电子科技股份有限公司 Data correction method and device applied to intelligent interactive panel
CN112596628A (en) * 2020-12-16 2021-04-02 南昌欧菲显示科技有限公司 Method and device for detecting uniformity of touch screen and computer readable storage medium
CN113406429A (en) * 2021-07-30 2021-09-17 佛山市墨纳森智能科技有限公司 Electronic metering device detection method and device, storage medium and electronic equipment
CN114740284A (en) * 2022-02-23 2022-07-12 苏州华兴源创科技股份有限公司 Method and device for detecting touch screen panel

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110050617A1 (en) * 2009-08-25 2011-03-03 Avago Technologies Ecbu (Singapore) Pte. Ltd. Method and Apparatus for Detecting Defective Traces in a Mutual Capacitance Touch Sensing Device
US9733293B1 (en) * 2012-09-21 2017-08-15 Qualcomm Incorporated Differential pixel test for capacitive touch screens
CN102866317A (en) * 2012-09-24 2013-01-09 广东欧珀移动通信有限公司 Method and system for quick test of mobile terminal capacitive touch screen
CN109976588A (en) * 2019-04-04 2019-07-05 广州视源电子科技股份有限公司 Data correction method and device applied to intelligent interactive panel
CN112596628A (en) * 2020-12-16 2021-04-02 南昌欧菲显示科技有限公司 Method and device for detecting uniformity of touch screen and computer readable storage medium
CN113406429A (en) * 2021-07-30 2021-09-17 佛山市墨纳森智能科技有限公司 Electronic metering device detection method and device, storage medium and electronic equipment
CN114740284A (en) * 2022-02-23 2022-07-12 苏州华兴源创科技股份有限公司 Method and device for detecting touch screen panel

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