CH581886A5 - - Google Patents

Info

Publication number: CH581886A5
Authority: CH; Switzerland

Application number

CH796575A

Original Assignee

Ibm

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1974-06-26

Filing date

1975-06-19

Publication date

1976-11-15

1975-06-19 Application filed by Ibm filed Critical Ibm

1976-11-15 Publication of CH581886A5 publication Critical patent/CH581886A5/xx

Links

Classifications

- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/14—Implementation of control logic, e.g. test mode decoders
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing

CH796575A 1974-06-26 1975-06-19 CH581886A5 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US05/483,268 US3995215A (en)	1974-06-26	1974-06-26	Test technique for semiconductor memory array

Publications (1)

Publication Number	Publication Date
CH581886A5 true CH581886A5 (de)	1976-11-15

Family

ID=23919404

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
CH796575A CH581886A5 (de)	1974-06-26	1975-06-19

Country Status (10)

Country	Link
US (1)	US3995215A (de)
JP (1)	JPS5114238A (de)
CA (1)	CA1048645A (de)
CH (1)	CH581886A5 (de)
DE (1)	DE2527486C3 (de)
FR (1)	FR2276661A1 (de)
GB (1)	GB1476040A (de)
IT (1)	IT1037604B (de)
NL (1)	NL7506539A (de)
SE (1)	SE406829B (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4208730A (en) *	1978-08-07	1980-06-17	Rca Corporation	Precharge circuit for memory array
JPS5914838B2 (ja) *	1978-11-25	1984-04-06	富士通株式会社	フィ−ルドプログラマブル素子
JPS5693189A (en)	1979-12-18	1981-07-28	Fujitsu Ltd	Field programable element
JPS57105897A (en) *	1980-12-23	1982-07-01	Fujitsu Ltd	Semiconductor storage device
JPS57105898A (en) *	1980-12-23	1982-07-01	Fujitsu Ltd	Field programmable element
US4430735A (en)	1981-05-26	1984-02-07	Burroughs Corporation	Apparatus and technique for testing IC memories
DE3313441A1 (de) *	1983-04-13	1984-10-18	Siemens AG, 1000 Berlin und 8000 München	Halbleiterspeicher
US4719418A (en) *	1985-02-19	1988-01-12	International Business Machines Corporation	Defect leakage screen system
EP0195839B1 (de) *	1985-03-29	1989-08-09	Ibm Deutschland Gmbh	Stabilitätsprüfung für Halbleiterspeicher
US5208530A (en) *	1986-09-19	1993-05-04	Actel Corporation	Testability architecture and techniques for programmable interconnect architecture
US5223792A (en) *	1986-09-19	1993-06-29	Actel Corporation	Testability architecture and techniques for programmable interconnect architecture
US5341092A (en) *	1986-09-19	1994-08-23	Actel Corporation	Testability architecture and techniques for programmable interconnect architecture
US4768167A (en) *	1986-09-30	1988-08-30	International Business Machines Corporation	High speed CMOS latch with alternate data storage and test functions
US4801869A (en) *	1987-04-27	1989-01-31	International Business Machines Corporation	Semiconductor defect monitor for diagnosing processing-induced defects
US4779043A (en) *	1987-08-26	1988-10-18	Hewlett-Packard Company	Reversed IC test device and method
JPH0268796A (ja) *	1988-09-02	1990-03-08	Fujitsu Ltd	半導体記憶装置
US5072175A (en) *	1990-09-10	1991-12-10	Compaq Computer Corporation	Integrated circuit having improved continuity testability and a system incorporating the same
US5528600A (en) *	1991-01-28	1996-06-18	Actel Corporation	Testability circuits for logic arrays
US5166608A (en) *	1991-11-07	1992-11-24	Advanced Micro Devices, Inc.	Arrangement for high speed testing of field-effect transistors and memory cells employing the same
US5646547A (en) *	1994-04-28	1997-07-08	Xilinx, Inc.	Logic cell which can be configured as a latch without static one's problem
US5561367A (en) *	1992-07-23	1996-10-01	Xilinx, Inc.	Structure and method for testing wiring segments in an integrated circuit device
US5538141A (en) *	1994-09-27	1996-07-23	Intel Corporation	Test flow assurance using memory imprinting
GB2370126B (en)	2000-07-18	2004-01-21	Sgs Thomson Microelectronics	Memory testing
US8046655B2 (en) *	2005-05-18	2011-10-25	Stmicroelectronics Pvt. Ltd.	Area efficient memory architecture with decoder self test and debug capability
CN100495057C (zh) *	2005-12-22	2009-06-03	中芯国际集成电路制造(上海)有限公司	利用阵列与解码器进行器件表征的方法与***

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3795859A (en) *	1972-07-03	1974-03-05	Ibm	Method and apparatus for determining the electrical characteristics of a memory cell having field effect transistors

1974
- 1974-06-26 US US05/483,268 patent/US3995215A/en not_active Expired - Lifetime
1975
- 1975-04-17 CA CA75225123A patent/CA1048645A/en not_active Expired
- 1975-04-24 IT IT22703/75A patent/IT1037604B/it active
- 1975-04-25 GB GB1715375A patent/GB1476040A/en not_active Expired
- 1975-05-21 FR FR7516532A patent/FR2276661A1/fr active Granted
- 1975-06-03 NL NL7506539A patent/NL7506539A/xx not_active Application Discontinuation
- 1975-06-16 SE SE7506873A patent/SE406829B/xx unknown
- 1975-06-17 JP JP50072775A patent/JPS5114238A/ja active Granted
- 1975-06-19 CH CH796575A patent/CH581886A5/xx not_active IP Right Cessation
- 1975-06-20 DE DE2527486A patent/DE2527486C3/de not_active Expired

Also Published As

Publication number	Publication date
FR2276661A1 (fr)	1976-01-23
JPS5114238A (en)	1976-02-04
SE7506873L (sv)	1975-12-29
FR2276661B1 (de)	1977-12-02
DE2527486B2 (de)	1982-09-16
IT1037604B (it)	1979-11-20
US3995215A (en)	1976-11-30
AU8067975A (en)	1976-11-04
SE406829B (sv)	1979-02-26
USB483268I5 (de)	1976-03-09
NL7506539A (nl)	1975-12-30
CA1048645A (en)	1979-02-13
DE2527486C3 (de)	1983-05-26
GB1476040A (en)	1977-06-10
JPS5415383B2 (de)	1979-06-14
DE2527486A1 (de)	1976-01-15

Legal Events

Date	Code	Title	Description
1985-02-28	PL	Patent ceased

Publication	Publication Date	Title
FR2276661B1 (de)	1977-12-02
FR2270249A1 (de)	1975-12-05
FR2262588B1 (de)	1976-12-10
DK126275A (de)	1975-09-27
FR2271087B1 (de)	1979-04-06
FR2287175B1 (de)	1977-03-18
JPS50104696U (de)	1975-08-28
JPS50115442A (de)	1975-09-10
JPS50111435U (de)	1975-09-11
CH570049A5 (de)	1975-11-28
CH564254A5 (de)	1975-07-15
DD110851A5 (de)	1975-01-12
CH591089A5 (de)	1977-09-15
CH590734A5 (de)	1977-08-31
CH574847A5 (de)	1976-04-30
CH574201A5 (de)	1976-04-15
CH573571A5 (de)	1976-03-15
CH573044A5 (de)	1976-02-27
CH572784A5 (de)	1976-02-27
CH572242A5 (de)	1976-01-30
CH571443A5 (de)	1976-01-15
CH570325A5 (de)	1975-12-15
CH573783A5 (de)	1976-03-31
BG20855A2 (de)	1976-01-20
CH567726A5 (de)	1975-10-15