BRPI0922338A2 - método para calibrar um dispositivo sensor de revestimento para medir a quantidade de material de revestimento em um substrato de folha revestido, dispositivo sensor de resvestimento, e método para controlar a formação de um substrato de folha revestido - Google Patents

método para calibrar um dispositivo sensor de revestimento para medir a quantidade de material de revestimento em um substrato de folha revestido, dispositivo sensor de resvestimento, e método para controlar a formação de um substrato de folha revestido

Info

Publication number
BRPI0922338A2
BRPI0922338A2 BRPI0922338A BRPI0922338A BRPI0922338A2 BR PI0922338 A2 BRPI0922338 A2 BR PI0922338A2 BR PI0922338 A BRPI0922338 A BR PI0922338A BR PI0922338 A BRPI0922338 A BR PI0922338A BR PI0922338 A2 BRPI0922338 A2 BR PI0922338A2
Authority
BR
Brazil
Prior art keywords
coating
sensing device
sheet substrate
coated sheet
calibrating
Prior art date
Application number
BRPI0922338A
Other languages
English (en)
Inventor
Gertjan Hofman
Reena Meijer Dress
Original Assignee
Honeywell Asca Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Asca Inc filed Critical Honeywell Asca Inc
Publication of BRPI0922338A2 publication Critical patent/BRPI0922338A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/48—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using wave or particle radiation means
    • G01D5/50—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using wave or particle radiation means derived from a radioactive source

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
BRPI0922338A 2008-12-19 2009-12-14 método para calibrar um dispositivo sensor de revestimento para medir a quantidade de material de revestimento em um substrato de folha revestido, dispositivo sensor de resvestimento, e método para controlar a formação de um substrato de folha revestido BRPI0922338A2 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13938608P 2008-12-19 2008-12-19
US12/621,508 US8394449B2 (en) 2008-12-19 2009-11-19 Differential coat weight measurement by means of nuclear or X-ray gauges
PCT/CA2009/001824 WO2010069051A1 (en) 2008-12-19 2009-12-14 Improved differential coat weight measurement by means of nuclear or x-ray gauges

Publications (1)

Publication Number Publication Date
BRPI0922338A2 true BRPI0922338A2 (pt) 2016-09-20

Family

ID=42266516

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0922338A BRPI0922338A2 (pt) 2008-12-19 2009-12-14 método para calibrar um dispositivo sensor de revestimento para medir a quantidade de material de revestimento em um substrato de folha revestido, dispositivo sensor de resvestimento, e método para controlar a formação de um substrato de folha revestido

Country Status (6)

Country Link
US (1) US8394449B2 (pt)
EP (1) EP2359105B1 (pt)
JP (1) JP5702298B2 (pt)
BR (1) BRPI0922338A2 (pt)
CA (1) CA2747215C (pt)
WO (1) WO2010069051A1 (pt)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104048977B (zh) * 2013-03-14 2017-04-12 湘南科力远能源株式会社 多孔质体的重量测定方法、重量测定装置
US9612213B2 (en) 2014-05-08 2017-04-04 Honeywell Asca Inc. Automatic z-correction for basis weight sensors
JP6592281B2 (ja) * 2015-06-11 2019-10-16 住友化学株式会社 目付量測定方法、積層フィルム製造方法、及び目付量測定装置
CN105424074B (zh) * 2015-12-30 2018-01-02 珠海格力电器股份有限公司 一种传感器校准***及其控制方法、装置
US11879765B2 (en) * 2018-09-26 2024-01-23 Honeywell International Inc. Apparatus for composite sheet weight determinations
US11333544B2 (en) * 2019-06-17 2022-05-17 Honeywell International Inc. Apparatus for simultaneously determining weights of composite sheets
US11519867B2 (en) 2019-12-09 2022-12-06 Honeywell International Inc. X-ray-based determining of weights for coated substrates
US11826773B2 (en) * 2021-03-29 2023-11-28 Honeywell International Inc. Correlate thermographic image data to online scanning basis weight measurement
US11982523B2 (en) 2021-10-13 2024-05-14 Honeywell International Inc. Lib anode coating measurement with dual x-ray

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3681595A (en) * 1970-04-03 1972-08-01 Measurex Corp Basis weight gauge standardizing system
JPS5348702Y1 (pt) * 1975-09-30 1978-11-21
US4599514A (en) * 1982-12-13 1986-07-08 Accuray Corporation Isotopic radiation method and apparatus for measuring the resinous binder applied to a mat of glass fibers
US4692616A (en) * 1984-03-14 1987-09-08 Measurex Corporation Basis weight gauge standardizing method and system
IE58982B1 (en) * 1985-12-30 1993-12-15 Measurex Corp A system for determining the basis weight of cord reinforced tire fabric
US4732776A (en) * 1987-02-24 1988-03-22 Measurex Corporation Apparatus and method for controlling the thickness of coatings on paper or other materials
US4879471A (en) * 1987-03-25 1989-11-07 Measurex Corporation Rapid-scanning infrared sensor
US5014288A (en) * 1989-04-20 1991-05-07 Measurex Corporation X-ray coating weight controller and sensor
US5094535A (en) * 1989-10-06 1992-03-10 Measurex Corporation Scanning sensor system including an FT-IR interferometer
US5166748A (en) * 1989-10-06 1992-11-24 Measurex Corporation Scanning interferometer sensor system
US5338361A (en) * 1991-11-04 1994-08-16 Measurex Corporation Multiple coat measurement and control apparatus and method
JP2591911Y2 (ja) * 1991-11-15 1999-03-10 横河電機株式会社 塗工量計
US5315124A (en) * 1992-03-20 1994-05-24 Measurex Corporation Nuclear gauge
US5795394A (en) * 1997-06-02 1998-08-18 Honeywell-Measurex Coating weight measuring and control apparatus
JPH1114336A (ja) * 1997-06-18 1999-01-22 Futec Inc 厚さ及び厚さ換算単重測定方法
US7399971B2 (en) * 2005-12-23 2008-07-15 Honeywell International Inc. Single-point measurement of high-Z additives in sheets
US20070227447A1 (en) * 2006-04-04 2007-10-04 Honeywell International, Inc. Control of a coating process

Also Published As

Publication number Publication date
US8394449B2 (en) 2013-03-12
EP2359105B1 (en) 2013-01-16
CA2747215C (en) 2015-03-31
EP2359105A1 (en) 2011-08-24
US20100159121A1 (en) 2010-06-24
WO2010069051A1 (en) 2010-06-24
EP2359105A4 (en) 2012-05-23
CA2747215A1 (en) 2010-06-24
JP5702298B2 (ja) 2015-04-15
JP2012512397A (ja) 2012-05-31

Similar Documents

Publication Publication Date Title
BRPI0922338A2 (pt) método para calibrar um dispositivo sensor de revestimento para medir a quantidade de material de revestimento em um substrato de folha revestido, dispositivo sensor de resvestimento, e método para controlar a formação de um substrato de folha revestido
FI20155193A (fi) Rainan paksuuden mittauslaite
HUE038881T2 (hu) Eljárás és eszköz egy futószalagon lévõ bevonóréteg vastagságának folyamatos mérésére
BRPI0913994A2 (pt) sobretampa e um método de atuação de um dispensador de material volátil
EP2438394A4 (en) Wet paint coating thickness measurement and instrument
BRPI0919419A2 (pt) dispositivo de análise da superfície de um substrato
BRPI0907410A2 (pt) Copo de um material de papel, e método e dispositivo para a sua fabricação
PL2323775T3 (pl) Narzędzie powlekające do nanoszenia warstwy cieczy na substrat
EP2257218A4 (en) MANAGING THE CALIBRATION OF AN ANALYTE DETECTOR
ZA201001717B (en) Coating formulation for an offset paper and paper coated therewith
GB2470620B (en) Method of measuring deposition onto a substrate
EP2041020A4 (en) SYSTEMS AND METHOD FOR APPLYING A LIQUID COATING MATERIAL TO A SUBSTRATE
BRPI1006183A2 (pt) método para revestir um substrato e substrato
BR112012013636A2 (pt) método, substrato, revestimento polímerico em um substrato, composição, e material
ZA201001746B (en) Coating formulation for offset paper and paper coated therewith
FI20060636A0 (fi) Pinnoitettu tela
GB0801918D0 (en) Method and apparatus for measuring the temperature of a sheet material
FR2931513B1 (fr) Procede de controle de la plausibilite d'un capteur de temperature
BRPI0719712A2 (pt) Método e dispositivo para revestimento de substratos
BRPI0912744A2 (pt) composição aquosa de revestimento, substrato de metal revestido, e, método para revestir um substrato de metal
EP2419697A4 (en) System and method of measuring the thickness of a layer of coating
PL2213465T3 (pl) Sposób i urządzenie do pokrywania co najmniej części podłoża
GB0709272D0 (en) Sensor coating
BRPI0819558A2 (pt) "método para aplicação de um material revestidor"
BRPI0815257A2 (pt) Método para revestir um substrato

Legal Events

Date Code Title Description
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06T Formal requirements before examination [chapter 6.20 patent gazette]
B15K Others concerning applications: alteration of classification

Free format text: AS CLASSIFICACOES ANTERIORES ERAM: G01G 23/01 , D21H 19/02 , G01G 17/02

Ipc: G01B 15/02 (1968.09), G01D 5/50 (1968.09)

B11E Dismissal acc. art. 34 of ipl - requirements for examination incomplete
B11T Dismissal of application maintained [chapter 11.20 patent gazette]
B350 Update of information on the portal [chapter 15.35 patent gazette]