BRPI0922338A2 - método para calibrar um dispositivo sensor de revestimento para medir a quantidade de material de revestimento em um substrato de folha revestido, dispositivo sensor de resvestimento, e método para controlar a formação de um substrato de folha revestido - Google Patents
método para calibrar um dispositivo sensor de revestimento para medir a quantidade de material de revestimento em um substrato de folha revestido, dispositivo sensor de resvestimento, e método para controlar a formação de um substrato de folha revestidoInfo
- Publication number
- BRPI0922338A2 BRPI0922338A2 BRPI0922338A BRPI0922338A BRPI0922338A2 BR PI0922338 A2 BRPI0922338 A2 BR PI0922338A2 BR PI0922338 A BRPI0922338 A BR PI0922338A BR PI0922338 A BRPI0922338 A BR PI0922338A BR PI0922338 A2 BRPI0922338 A2 BR PI0922338A2
- Authority
- BR
- Brazil
- Prior art keywords
- coating
- sensing device
- sheet substrate
- coated sheet
- calibrating
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/48—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using wave or particle radiation means
- G01D5/50—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using wave or particle radiation means derived from a radioactive source
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13938608P | 2008-12-19 | 2008-12-19 | |
US12/621,508 US8394449B2 (en) | 2008-12-19 | 2009-11-19 | Differential coat weight measurement by means of nuclear or X-ray gauges |
PCT/CA2009/001824 WO2010069051A1 (en) | 2008-12-19 | 2009-12-14 | Improved differential coat weight measurement by means of nuclear or x-ray gauges |
Publications (1)
Publication Number | Publication Date |
---|---|
BRPI0922338A2 true BRPI0922338A2 (pt) | 2016-09-20 |
Family
ID=42266516
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BRPI0922338A BRPI0922338A2 (pt) | 2008-12-19 | 2009-12-14 | método para calibrar um dispositivo sensor de revestimento para medir a quantidade de material de revestimento em um substrato de folha revestido, dispositivo sensor de resvestimento, e método para controlar a formação de um substrato de folha revestido |
Country Status (6)
Country | Link |
---|---|
US (1) | US8394449B2 (pt) |
EP (1) | EP2359105B1 (pt) |
JP (1) | JP5702298B2 (pt) |
BR (1) | BRPI0922338A2 (pt) |
CA (1) | CA2747215C (pt) |
WO (1) | WO2010069051A1 (pt) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104048977B (zh) * | 2013-03-14 | 2017-04-12 | 湘南科力远能源株式会社 | 多孔质体的重量测定方法、重量测定装置 |
US9612213B2 (en) | 2014-05-08 | 2017-04-04 | Honeywell Asca Inc. | Automatic z-correction for basis weight sensors |
JP6592281B2 (ja) * | 2015-06-11 | 2019-10-16 | 住友化学株式会社 | 目付量測定方法、積層フィルム製造方法、及び目付量測定装置 |
CN105424074B (zh) * | 2015-12-30 | 2018-01-02 | 珠海格力电器股份有限公司 | 一种传感器校准***及其控制方法、装置 |
US11879765B2 (en) * | 2018-09-26 | 2024-01-23 | Honeywell International Inc. | Apparatus for composite sheet weight determinations |
US11333544B2 (en) * | 2019-06-17 | 2022-05-17 | Honeywell International Inc. | Apparatus for simultaneously determining weights of composite sheets |
US11519867B2 (en) | 2019-12-09 | 2022-12-06 | Honeywell International Inc. | X-ray-based determining of weights for coated substrates |
US11826773B2 (en) * | 2021-03-29 | 2023-11-28 | Honeywell International Inc. | Correlate thermographic image data to online scanning basis weight measurement |
US11982523B2 (en) | 2021-10-13 | 2024-05-14 | Honeywell International Inc. | Lib anode coating measurement with dual x-ray |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3681595A (en) * | 1970-04-03 | 1972-08-01 | Measurex Corp | Basis weight gauge standardizing system |
JPS5348702Y1 (pt) * | 1975-09-30 | 1978-11-21 | ||
US4599514A (en) * | 1982-12-13 | 1986-07-08 | Accuray Corporation | Isotopic radiation method and apparatus for measuring the resinous binder applied to a mat of glass fibers |
US4692616A (en) * | 1984-03-14 | 1987-09-08 | Measurex Corporation | Basis weight gauge standardizing method and system |
IE58982B1 (en) * | 1985-12-30 | 1993-12-15 | Measurex Corp | A system for determining the basis weight of cord reinforced tire fabric |
US4732776A (en) * | 1987-02-24 | 1988-03-22 | Measurex Corporation | Apparatus and method for controlling the thickness of coatings on paper or other materials |
US4879471A (en) * | 1987-03-25 | 1989-11-07 | Measurex Corporation | Rapid-scanning infrared sensor |
US5014288A (en) * | 1989-04-20 | 1991-05-07 | Measurex Corporation | X-ray coating weight controller and sensor |
US5094535A (en) * | 1989-10-06 | 1992-03-10 | Measurex Corporation | Scanning sensor system including an FT-IR interferometer |
US5166748A (en) * | 1989-10-06 | 1992-11-24 | Measurex Corporation | Scanning interferometer sensor system |
US5338361A (en) * | 1991-11-04 | 1994-08-16 | Measurex Corporation | Multiple coat measurement and control apparatus and method |
JP2591911Y2 (ja) * | 1991-11-15 | 1999-03-10 | 横河電機株式会社 | 塗工量計 |
US5315124A (en) * | 1992-03-20 | 1994-05-24 | Measurex Corporation | Nuclear gauge |
US5795394A (en) * | 1997-06-02 | 1998-08-18 | Honeywell-Measurex | Coating weight measuring and control apparatus |
JPH1114336A (ja) * | 1997-06-18 | 1999-01-22 | Futec Inc | 厚さ及び厚さ換算単重測定方法 |
US7399971B2 (en) * | 2005-12-23 | 2008-07-15 | Honeywell International Inc. | Single-point measurement of high-Z additives in sheets |
US20070227447A1 (en) * | 2006-04-04 | 2007-10-04 | Honeywell International, Inc. | Control of a coating process |
-
2009
- 2009-11-19 US US12/621,508 patent/US8394449B2/en active Active
- 2009-12-14 WO PCT/CA2009/001824 patent/WO2010069051A1/en active Application Filing
- 2009-12-14 BR BRPI0922338A patent/BRPI0922338A2/pt not_active Application Discontinuation
- 2009-12-14 EP EP09832765A patent/EP2359105B1/en not_active Not-in-force
- 2009-12-14 CA CA2747215A patent/CA2747215C/en not_active Expired - Fee Related
- 2009-12-14 JP JP2011541040A patent/JP5702298B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US8394449B2 (en) | 2013-03-12 |
EP2359105B1 (en) | 2013-01-16 |
CA2747215C (en) | 2015-03-31 |
EP2359105A1 (en) | 2011-08-24 |
US20100159121A1 (en) | 2010-06-24 |
WO2010069051A1 (en) | 2010-06-24 |
EP2359105A4 (en) | 2012-05-23 |
CA2747215A1 (en) | 2010-06-24 |
JP5702298B2 (ja) | 2015-04-15 |
JP2012512397A (ja) | 2012-05-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B06F | Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette] | ||
B06T | Formal requirements before examination [chapter 6.20 patent gazette] | ||
B15K | Others concerning applications: alteration of classification |
Free format text: AS CLASSIFICACOES ANTERIORES ERAM: G01G 23/01 , D21H 19/02 , G01G 17/02 Ipc: G01B 15/02 (1968.09), G01D 5/50 (1968.09) |
|
B11E | Dismissal acc. art. 34 of ipl - requirements for examination incomplete | ||
B11T | Dismissal of application maintained [chapter 11.20 patent gazette] | ||
B350 | Update of information on the portal [chapter 15.35 patent gazette] |